Catalog

Electroformed Probe Pins
XP3B
Highly Reliable Electroformed Probe Pins.
Outer spring type.
• Plunger structure to ensure stable contact.
• High durability due to the smooth end surfaces achieved
with electroforming.
■Feature
●Plunger structure to ensure stable contact.
Standard Probe Pin
●Plunger structure ensures stable and constant plunger
contact.
Electroformed Probe Pin
Upper machined
plunger
Tube
Upper
electroformed
plunger
Spring
Spring
Lower machined
plunger
Lower
electroformed
plunger
(Cross-section
diagram)
Conductive Path
Upper plunger
Tube
Lower plunger
Contact
sections
(Contact Sections
Enlarged)
Conductive Path
Upper plunger
Lower plunger
●Plunger Tip Shapes.
Plunger tip shapes other than those shown below can also be
manufactured.
D
R
S
■Usage Example
Device
Solder ball
IC test socket
Electroformed probe
PCB
1
XP3B
■Model Number List
XP3B-@@@@-@@@@-@-@/@
− −− −− − − −
1
2
3
4
5
6
7
8
2 Diameter
4 Upper contact length
3 Overall length
5 Lower contact length
2
1
Series
Diameter
38
3
4
5
Overall length
Upper contact
length
Lower contact
length
6
7
8
Plating specification
Upper contact
shape
Lower contact
shape
2.85 mm
50
0.5 mm
50
0.5 mm
XP3B
1
30
D
S
S
R
R
S
S
0.38 dia.
29
30
D
Gold
0.30 dia.
0.30 dia.
12
1.18 mm
30
0.3 mm
15
0.15 mm
■Ratings and Specifications
Diameter
Model
0.38 dia.
XP3B-3829-5050-1-@/@
Rated current
0.30 dia.
XP3B-3029-5050-1-@/@
XP3B-3012-3015-1-@/@
25 gf
8 gf
2A
Contact force
33 gf
2A
Recommended stroke
0.4 mm
0.2 mm
Maximum stroke
0.5 mm
0.25 mm
Contact resistance
50 mΩ max.
Mechanical durability
60 mΩ max.
1,000,000 operations min.
■Materials and Finish
2
0.30 dia.
Plunger
Nickel alloy/gold plating
Spring
SWP/gold plating
100 mΩ max.
XP3B
XP3B-38 0.38 Diameter for 0.5-mm Pitch
■Dimensions
■Recommended Mounting Dimensions
(Unit: mm)
0.09
0.35
Upper contact
length protrusion
0.2
(Unit: mm)
0.41 dia.
0.23 dia.
0.5
2.85
1.85
0.5
0.2
0.38 dia.
0.09
0.23 dia.
0.1
Lower contact
length protrusion
0.5
■Ordering Information
Upper contact shape
D
R
Lower contact shape
Model
D
XP3B-3829-5050-1-D/D
R
XP3B-3829-5050-1-D/R
S
XP3B-3829-5050-1-D/S
R
XP3B-3829-5050-1-R/R
R
XP3B-3829-5050-1-S/R
S
XP3B-3829-5050-1-S/S
Minimum ordering quantity (pieces)
50
S
Note: Either upper or lower contact can be set for contact with the inspection target.
3
XP3B
XP3B-30 0.30 Diameter for 0.4-mm Pitch
■Dimensions
(Unit: mm)
■Recommended Mounting Dimensions
0.35
Upper contact
length protrusion
0.2
0.06
(Unit: mm)
0.33 dia.
0.23 dia.
0.5
2.85
1.85
0.5
0.2
0.3 dia.
0.09
0.23 dia.
0.1
Lower contact
length protrusion
0.4
■Ordering Information
Upper contact shape
D
R
S
Lower contact shape
D
XP3B-3029-5050-1-D/D
R
XP3B-3029-5050-1-D/R
S
XP3B-3029-5050-1-D/S
D
XP3B-3029-5050-1-R/D
R
XP3B-3029-5050-1-R/R
S
XP3B-3029-5050-1-R/S
D
XP3B-3029-5050-1-S/D
R
XP3B-3029-5050-1-S/R
S
XP3B-3029-5050-1-S/S
Note: Set the lower contact for contact with the inspection target.
4
Model
Minimum ordering quantity (pieces)
50
XP3B
XP3B-3012 0.30 Diameter for High-frequency Applications
■Dimensions
(Unit: mm)
0.08
■Recommended Mounting Dimensions(Unit: mm)
0.33 dia.
0.2
Upper contact
length protrusion
0.2
0.23 dia.
0.3
1.18
0.73
0.15
0.2
0.120
0.23 dia.
0.05
Lower contact
length protrusion
0.3 dia.
0.4
■Ordering Information
Upper contact shape
Lower contact shape
Model
D
Minimum ordering quantity (pieces)
XP3B-3012-3015-1-D/S
S
50
S
XP3B-3012-3015-1-S/S
Note: Set the lower contact for contact with the inspection target.
Return loss
Insertion Loss
0
0
S12
S21
2
Return loss [dB]
Insertion Loss [dB]
S11
5
1
3
4
5
6
S22
10
15
20
25
30
35
7
40
8
45
0
10
20
Frequency [GHz]
30
40
0
10
20
30
40
Frequency [GHz]
5
XP3B
■Safety Precautions
Precautions for Correct Use
●General Environmental Conditions
(1) Use the Probe Pins in an ambient atmosphere that does not
contain dust, dirt, corrosive gas, or oil so that the Probe Pins
do not get contaminated.
●Stroke Conditions
(1) Apply a load to the Probe Pins only in the axial direction.
Never apply a lateral load.
(2) The life of the Probe Pins will be drastically reduced if the
recommended stroke is exceeded.
●Current Application Conditions
(1) Apply current when the Probe Pins are stationary after
they come into contact with the target at the
recommended stroke position.
(2) If a current is applied during the stroke, at a position other
than the recommended stroke, or when the Probe Pins are
not in contact with the target, the life of the Probe Pins will
be drastically reduced.
(3) The catalog value of the carrying capacity may not be met
due to Probe Pin deterioration or other factors.
Allow sufficient leeway when you design the actual
application.
●Voltage Application Conditions
(1) Apply voltage when the Probe Pins are stationary after
they come into contact with the target at the
recommended stroke position.
(2) Do not apply a voltage when the Probe Pins are not in
contact with the target. The Probe Pins will be damaged due
to discharge immediately before they come into contact.
(3) When a high voltage is applied to the contact probe, strictly
observe the current and voltage application conditions. Also,
take measures to prevent discharge or other large
instantaneous currents.
6
●Carrying Capacity
(1) The rated current that is given in the catalog is the maximum
continuous current for 1 minute for inspection of gold pads
under the conditions given on the left (general environment,
recommended stroke, current application, and voltage application).
●Resistance
(1) If a large current is applied, the resistance may increase due
to deterioration of the contacts and internal components.
(2) As the number of strokes increases, the resistance may
increase due to deterioration of the contacts and internal
components.
●Durability
(1) The durability that is given in the catalog is a guideline for
the number of times that the Probe Pins can be used without
problems at 10 mA for gold pads under the conditions given
on the left (general environment, recommended stroke, current application, and voltage application).
(2) Depending on the operating environment and conditions,
the Probe Pins may need to be replaced sooner than the
specified limit in the datasheet due to increased resistance,
reduced
contact force, or other factors. Replace the Probe Pins as
required by the actual application.
●Contact Force
(1) If the current is increased, heat generated by the Probe Pins
will reduce the contact force.
●Recommended Mounting Dimensions
(1) The dimensions are reference values. Actual values will
depend on the material and thickness of the resin plate.
●Handling Precautions
Observe the following precautions when you are handling the
Probe Pins. Otherwise, the Probe Pins may be damaged.
• Do not apply excessive force to the contact sections of the
electroformed plungers.
• Do not apply excessive force to the coil spring section.
MEMO
• Application examples provided in this document are for reference only. In actual applications, confirm equipment functions and safety before using the product.
• Consult your OMRON representative before using the product under conditions which are not described in the manual or applying the product to nuclear control systems, railroad
systems, aviation systems, vehicles, combustion systems, medical equipment, amusement machines, safety equipment, and other systems or equipment that may have a serious
influence on lives and property if used improperly. Make sure that the ratings and performance characteristics of the product provide a margin of safety for the system or
equipment, and be sure to provide the system or equipment with double safety mechanisms.
Note: Do not use this document to operate the Unit.
OMRON Corporation
Electronic and Mechanical Components Company
Contact: www.omron.com/ecb
Cat. No. G088-E1-04
0616(0414)(O)
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