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ZR01F-HR
Screening Procedure
Inverted Series Diode
High-reliability discrete products
and engineering services since 1977
ZR01F-HR SCREENING PROCEDURES
All ZR01F-HR procured shall be 100% screened in accordance with the following procedures, as
applicable. Unless otherwise noted, all testing is performed at room temperature.
REFERENCE: MIL-PRF-19500 and Leach 002-4692-XXX-000 AG
TEST/PROCESS
SPEC/METHOD
CONDITIONS
1
Temperature Cycle
MIL-STD-750/Methond 1051
Condition C, 20 cycles from -55°C to
+175°C. Minimum 10 minute dwell at
each extreme.
2
Impact Ambient
002-4692-XXX-000
TA = 25°C. Perform electrical testing per
Table I, Group A, Subgroup 2.
Data by attributes.
MIL-STD-750
Load parts on Digitron programmable
burn-in boards. Ensure all parts are loaded
with positive polarity to the green dot
(Zener end).
3
Burn-in Load
4
Power Burn-in
MIL-STD-750/Method 1038B
Power burn shall be 96 hours minimum.
IZ = 0.5 mA, TA = 125°C minimum.
Parts shall be tested within 96 hours of
removal of burn-in bias.
5
Burn-in Unload
MIL-STD-750
Remove parts from burn-in boards.
Inspect parts for damage.
6
Impact Ambient
002-4692-XXX-000
TA = 25°C. Perform electrical testing per
Table I, Group A, Subgroup 2.
Data by attributes.
7
PDA Calculation
MIL-PRF-19500
Calculate PDA. 10% maximum for burnin and post burn-in electrical test failures.
Rev. 20140114
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