INTERSIL ISL57612IB

ISL5761
TM
Data Sheet
November 2001
10-bit, +3.3V, 130/210+MSPS, CommLinkTM
High Speed D/A Converter
The ISL5761 is a 10-bit,
130/210+MSPS (Mega Samples
Per Second), CMOS, high speed,
low power, D/A (digital to analog) converter, designed
specifically for use in high performance communication
systems such as base transceiver stations utilizing 2.5G or
3G cellular protocols.
This device complements the CommLink ISL5x61 family of
high speed converters, which include 10, 12, and 14-bit
devices.
TEMP.
RANGE
(oC)
PKG.
NO.
PACKAGE
-40 to 85
28 Ld SOIC
ISL5761IA
-40 to 85
28 Ld TSSOP M28.173 130MHz
ISL5761/2IB
-40 to 85
28 Ld SOIC
ISL5761/2IA
-40 to 85
28 Ld TSSOP M28.173 210MHz
25
M28.3
CLOCK
SPEED
ISL5761IB
ISL5761EVAL1
6009.2
Features
• Speed Grades . . . . . . . . . . . . . . . . 130M and 210+MSPS
• Low Power . . . . . 103mW with 20mA Output at 130MSPS
• Adjustable Full Scale Output Current . . . . . 2mA to 20mA
• +3.3V Power Supply
• 3V LVCMOS Compatible Inputs
• Excellent Spurious Free Dynamic Range
(71dBc to Nyquist, f S = 130MSPS, fOUT = 10MHz)
• UMTS Adjacent Channel Power = 65dB at 19.2MHz
• EDGE/GSM SFDR = 83dBc at 11MHz in 20MHz Window
• Pin compatible, 3.3V, Lower Power Replacement For The
AD9750 and HI5760
Ordering Information
PART
NUMBER
File Number
M28.3
SOIC Evaluation
Platform
130MHz
210MHz
210MHz
Applications
• Cellular Infrastructure - Single or Multi-Carrier: IS-136, IS95, GSM, EDGE, CDMA2000, WCDMA, TDS-CDMA
• BWA Infrastructure
• Medical/Test Instrumentation
• Wireless Communication Systems
• High Resolution Imaging Systems
• Arbitrary Waveform Generators
Pinout
ISL5761
TOP VIEW
D9 (MSB) 1
28 CLK
D8 2
27 DVDD
D7 3
26 DCOM
D6 4
25 NC
D5 5
24 AVDD
D4 6
23 COMP
D3 7
22 IOUTA
D2 8
21 IOUTB
D1 9
20 ACOM
19 NC
D0 (LSB) 10
DCOM 11
18 FSADJ
DCOM 12
17 REFIO
DCOM 13
16 REFLO
DCOM 14
15 SLEEP
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil and Design is a trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2001, All Rights Reserved
ISL5761
Typical Applications Circuit
ISL5761
ONE CONNECTION
(25, 19) NC
(15) SLEEP
(16) REFLO
DCOM
ACOM
(17) REFIO
D9
D9 (1)
D8
D8 (2)
D7
D7 (3)
D6
D6 (4)
D5
D5 (5)
D4
D4 (6)
D3
D3 (7)
D2
D2 (8)
D1
D1 (9)
D0
D0 (LSB) (10)
0.1µF
(18) FSADJ
RSET
1:1, Z1:Z2
(21) IOUTB
(50Ω)
50Ω
REPRESENTS
ANY 50Ω LOAD
(23) COMP
CLK (28)
DCOM (26, 11-14)
50Ω
0.1µF
(20) ACOM
BEAD
+
10µF
FERRITE
BEAD
(24) AVDD
DVDD (27)
10µH
+
10µH
0.1µF
0.1µF
10µF
Functional Block Diagram
IOUTA
IOUTB
CASCODE
(LSB) D0
CURRENT
SOURCE
INPUT
LATCH
D1
36
D2
SWITCH
MATRIX
D3
36
5 LSBs
+
31 MSB
SEGMENTS
D4
D5
D6
D7
D8
UPPER
5-BIT
DECODER
(MSB) D9
COMP
CLK
INT/EXT
VOLTAGE
BIAS
GENERATION
REFERENCE
REFLO REFIO
2
1.91kΩ
(22) IOUTA
FSADJ
SLEEP
+3.3V (VDD)
ISL5761
Pin Descriptions
PIN NO.
PIN NAME
DESCRIPTION
1-10
D9 (MSB) Through
D0 (LSB)
15
SLEEP
Control Pin for Power-Down mode. Sleep Mode is active high; Connect to ground for Normal Mode. Sleep pin
has internal 20µA active pulldown current.
16
REFLO
Connect to analog ground to enable internal 1.2V reference or connect to AVDD to disable internal reference.
17
REFIO
Reference voltage input if internal reference is disabled. Reference voltage output if internal reference is
enabled. Use 0.1µF cap to ground when internal reference is enabled.
18
FSADJ
Full Scale Current Adjust. Use a resistor to ground to adjust full scale output current. Full Scale Output Current
= 32 x VFSADJ/RSET.
19, 25
NC
21
IOUTB
The complementary current output of the device. Full scale output current is achieved when all input bits are
set to binary 0.
22
IOUTA
Current output of the device. Full scale output current is achieved when all input bits are set to binary 1.
23
COMP
Connect 0.1µF capacitor to ACOM.
24
AVDD
Analog Supply (+3.0V to +3.6V).
20
ACOM
Connect to Analog Ground.
26, 11-14
DCOM
Connect to Digital Ground.
27
DVDD
Digital Supply (+3.0V to +3.6V).
28
CLK
Digital Data Bit 9, (Most Significant Bit) through Digital Data Bit 0, (Least Significant Bit).
No Connect. These should be grounded, but can be left disconnected.
Clock Input.
3
ISL5761
Absolute Maximum Ratings
Thermal Information
Digital Supply Voltage DVDD to DCOM . . . . . . . . . . . . . . . . . . +3.6V
Analog Supply Voltage AVDD to ACOM . . . . . . . . . . . . . . . . . . +3.6V
Grounds, ACOM TO DCOM. . . . . . . . . . . . . . . . . . . . -0.3V to +0.3V
Digital Input Voltages (D9-D0, CLK, SLEEP) . . . . . . . . DVDD + 0.3V
Reference Input Voltage Range . . . . . . . . . . . . . . . . . . AVDD + 0.3V
Analog Output Current (IOUT) . . . . . . . . . . . . . . . . . . . . . . . . . 24mA
Thermal Resistance (Typical, Note 1)
θJA(oC/W)
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
75
TSSOP Package . . . . . . . . . . . . . . . . . . . . . . . . . . .
110
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
Operating Conditions
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
AVDD = DVDD = +3.3V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25oC for All Typical Values
Electrical Specifications
TA = -40oC TO 85oC
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
10
-
-
Bits
-0.5
±0.1
+0.5
LSB
-0.5
±0.1
SYSTEM PERFORMANCE
Resolution
Integral Linearity Error, INL
“Best Fit” Straight Line (Note 7)
Differential Linearity Error, DNL
(Note 7)
Offset Error, IOS
IOUTA (Note 7)
Offset Drift Coefficient
(Note 7)
-
Full Scale Gain Error, FSE
With External Reference (Notes 2, 7)
Full Scale Gain Drift
With Internal Reference (Note 7)
+0.5
LSB
+0.006
% FSR
0.1
-
ppm
FSR/oC
-3
±0.5
+3
% FSR
With Internal Reference (Notes 2, 7)
-3
±0.5
+3
% FSR
With External Reference (Note 7)
-
±50
-
ppm
FSR/oC
-
±100
-
ppm
FSR/oC
2
-
20
mA
(Note 3)
-1.0
-
1.25
V
Maximum Clock Rate, fCLK
ISL5761/2IA, ISL5761/2IB
210
250
-
MHz
Maximum Clock Rate, fCLK
ISL5761IA, ISL5761IB
130
150
-
MHz
Output Rise Time
Full Scale Step
-
1.5
-
ns
Output Fall Time
Full Scale Step
-
1.5
-
ns
-
10
-
pF
IOUTFS = 20mA
-
50
-
pA/ √Hz
IOUTFS = 2mA
-
30
-
pA/ √Hz
fCLK = 210MSPS, fOUT = 80.8MHz, 30MHz Span (Notes 4, 7)
-
72
-
dBc
fCLK = 210MSPS, fOUT = 40.4MHz, 30MHz Span (Notes 4, 7)
-
75
-
dBc
fCLK = 130MSPS, fOUT = 20.2MHz, 20MHz Span (Notes 4, 7)
-
77
-
dBc
Full Scale Output Current, IFS
Output Voltage Compliance Range
-0.006
DYNAMIC CHARACTERISTICS
Output Capacitance
Output Noise
AC CHARACTERISTICS (Using Figure 13 with RDIFF = 50Ω and RLOAD= 50Ω, Full Scale Output = -2.5dBm)
Spurious Free Dynamic Range,
SFDR Within a Window
4
ISL5761
AVDD = DVDD = +3.3V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25oC for All Typical Values (Continued)
Electrical Specifications
TA = -40oC TO 85oC
MIN
TYP
MAX
UNITS
fCLK = 210MSPS, fOUT = 80.8MHz (Notes 4, 7)
-
50
-
dBc
fCLK = 210MSPS, fOUT = 40.4MHz (Notes 4, 7, 9)
PARAMETER
TEST CONDITIONS
Spurious Free Dynamic Range,
SFDR to Nyquist (fCLK/2)
-
58
-
dBc
fCLK = 200MSPS, fOUT
= 20.2MHz, T = 25oC (Notes 4, 7)
58
60
-
dBc
fCLK = 200MSPS, fOUT
= 20.2MHz, T = -40oC to 85oC (Notes 4, 7)
56
-
-
dBc
fCLK = 130MSPS, fOUT = 50.5MHz (Notes 4, 7)
-
55
-
dBc
fCLK = 130MSPS, fOUT = 40.4MHz (Notes 4, 7)
-
60
-
dBc
fCLK = 130MSPS, fOUT = 20.2MHz (Notes 4, 7)
-
68
-
dBc
fCLK = 130MSPS, fOUT = 10.1MHz (Notes 4, 7)
-
70
-
dBc
fCLK = 130MSPS, fOUT
= 5.05MHz, T = 25oC (Notes 4, 7)
68
75
-
dBc
fCLK = 130MSPS, fOUT
= 5.05MHz, T = -40oC to 85oC (Notes 4, 7)
66
-
-
dBc
fCLK = 100MSPS, fOUT = 40.4MHz (Notes 4, 7)
-
58
-
dBc
fCLK = 80MSPS, fOUT = 30.3MHz (Notes 4, 7)
-
61
-
dBc
fCLK = 80MSPS, fOUT = 20.2MHz (Notes 4, 7)
-
67
-
dBc
fCLK = 80MSPS, fOUT = 10.1MHz (Notes 4, 7, 9)
-
69
-
dBc
fCLK = 80MSPS, fOUT = 5.05MHz (Notes 4, 7)
-
74
-
dBc
fCLK = 50MSPS, fOUT = 20.2MHz (Notes 4, 7)
-
66
-
dBc
fCLK = 50MSPS, fOUT = 10.1MHz (Notes 4, 7)
-
72
-
dBc
fCLK = 50MSPS, fOUT = 5.05MHz (Notes 4, 7)
-
75
-
dBc
fCLK = 210MSPS, fOUT = 28.3MHz to 45.2MHz, 2.1MHz Spacing,
50MHz Span (Notes 4, 7, 9)
-
63
-
dBc
fCLK = 130MSPS, fOUT =17.5MHz to 27.9MHz, 1.3MHz Spacing,
35MHz Span (Notes 4, 7)
-
66
-
dBc
fCLK = 80MSPS, fOUT = 10.8MHz to 17.2MHz, 811kHz Spacing,
15MHz Span (Notes 4, 7)
-
73
-
dBc
fCLK = 50MSPS, fOUT = 6.7MHz to 10.8MHz, 490kHz Spacing,
10MHz Span (Notes 4, 7)
-
75
-
dBc
Spurious Free Dynamic Range,
fCLK = 78MSPS, fOUT = 11MHz, in a 20MHz Window, RBW=30kHz
SFDR in a Window with EDGE or GSM (Notes 4, 7, 9)
-
83
-
dBc
Adjacent Channel Power Ratio,
ACPR with UMTS
-
65
-
dB
1.2
1.23
1.3
V
-
±40
-
ppm/oC
-
0
-
µA
Reference Input Impedance
-
1
-
MΩ
Reference Input Multiplying Bandwidth (Note 7)
-
1.0
-
MHz
Spurious Free Dynamic Range,
SFDR in a Window with Eight Tones
fCLK = 76.8MSPS, fOUT = 19.2MHz, RBW=30kHz (Notes 4, 7, 9)
VOLTAGE REFERENCE
Internal Reference Voltage, VFSADJ
Pin 18 Voltage with Internal Reference
Internal Reference Voltage Drift
Internal Reference Output Current
Sink/Source Capability
Reference is not intended to be externally loaded (REFIO pin)
DIGITAL INPUTS D9-D0, CLK
Input Logic High Voltage with
3.3V Supply, VIH
(Note 3)
2.3
3.3
-
V
Input Logic Low Voltage with
3.3V Supply, VIL
(Note 3)
-
0
1.0
V
-25
-
+25
µA
Sleep Input Current, IIH
5
ISL5761
AVDD = DVDD = +3.3V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25oC for All Typical Values (Continued)
Electrical Specifications
TA = -40oC TO 85oC
MIN
TYP
MAX
UNITS
Input Logic Current, IIH, IL
-20
-
+20
µA
Clock Input Current, IIH, IL
-10
-
+10
µA
-
5
-
pF
PARAMETER
TEST CONDITIONS
Digital Input Capacitance, CIN
TIMING CHARACTERISTICS
Data Setup Time, tSU
See Figure 15
-
1.5
-
ns
Data Hold Time, tHLD
See Figure 15
-
1.5
-
ns
Propagation Delay Time, tPD
See Figure 15
-
1
-
Clock
Cycles
CLK Pulse Width, tPW1 , tPW2
See Figure 15 (Note 3)
2
-
-
ns
POWER SUPPLY CHARACTERISTICS
AVDD Power Supply
(Note 8)
2.7
3.3
3.6
V
DVDD Power Supply
(Note 8)
2.7
3.3
3.6
V
Analog Supply Current (IAVDD)
3.3V, IOUTFS = 20mA
-
27.5
28.5
mA
3.3V, IOUTFS = 2mA
-
10
-
mA
3.3V (Note 5)
-
3.7
5
mA
3.3V (Note 6)
-
6.5
8
mA
Digital Supply Current (IDVDD)
Supply Current (IAVDD) Sleep Mode
3.3V, IOUTFS = Don’t Care
-
1.5
-
mA
Power Dissipation
3.3V, IOUTFS = 20mA (Note 5)
-
103
111
mW
3.3V, IOUTFS = 20mA (Note 6)
-
110
120
mW
3.3V, IOUTFS = 2mA (Note 5)
-
45
-
mW
-0.125
-
+0.125
%FSR/V
Power Supply Rejection
Single Supply (Note 7)
NOTES:
2. Gain Error measured as the error in the ratio between the full scale output current and the current through RSET (typically 625µA). Ideally the
ratio should be 32.
3. Parameter guaranteed by design or characterization and not production tested.
4. Spectral measurements made with differential transformer coupled output and no external filtering. For multitone testing, the same pattern was
used at different clock rates, producing different output frequencies but at the same ratio to the clock rate.
5. Measured with the clock at 130MSPS and the output frequency at 5MHz.
6. Measured with the clock at 200MSPS and the output frequency at 20MHz.
7. See “Definition of Specifications”.
8. Recommended operation is from 3.0V to 3.6V. Operation below 3.0V is possible with some degradation in spectral performance. Reduction in
analog output current may be necessary to maintain spectral performance.
9. See Typical Performance Plots.
6
ISL5761
Typical Performance (+3.3V Supply, Using Figure 13 with RDIFF = 100Ω and RLOAD= 50Ω)
SPECTRAL MASK FOR
GSM900/DCS1800/PCS1900
P>43dBm NORMAL BTS
WITH 30kHz RBW
FIGURE 1. EDGE AT 11MHz, 78MSPS CLOCK
(83+dBc @ ∆f = +6MHz)
FIGURE 2. EDGE AT 11MHz, 78MSPS CLOCK (75dBc NYQUIST, 6dB PAD)
SPECTRAL MASK FOR
GSM900/DCS1800/PCS1900
P>43dBm NORMAL BTS
WITH 30kHz RBW
FIGURE 3. GSM AT 11MHz, 78MSPS CLOCK
(86+dBc @ ∆f = +6MHz, 3dB PAD)
FIGURE 4. GSM AT 11MHz, 78MSPS CLOCK (78dBc NYQUIST, 9dB PAD)
FIGURE 5. FOUR EDGE CARRIERS AT 12.4-15.6MHz, 800kHz
SPACING, 78MSPS (67dBc - 20MHz WINDOW)
FIGURE 6. FOUR GSM CARRIERS AT 12.4-15.6MHz, 78MSPS
(71dBc - 20MHz WINDOW, 6dB PAD)
7
ISL5761
Typical Performance (+3.3V Supply, Using Figure 13 with RDIFF = 100Ω and RLOAD= 50Ω)
(Continued)
SPECTRAL MASK
UMTS TDD
P>43dBm BTS
FIGURE 7. UMTS AT 19.2MHz, 76.8MSPS (65dB 1stACPR,
64dB 2ndACPR)
FIGURE 9. ONE TONE AT 40.4MHz, 210MSPS CLOCK (61dBc
- NYQUIST, 6dB PAD)
FIGURE 11. TWO TONES (CF=6) AT 8.5MHz, 50MSPS CLOCK,
500kHz SPACING (80dBc - 10MHz WINDOW,
6dB PAD)
8
FIGURE 8. ONE TONE AT 10.1MHz, 80MSPS CLOCK (71dBc NYQUIST, 6dB PAD)
FIGURE 10. EIGHT TONES (CREST FACTOR=8.9) AT 37MHz,
210MSPS CLOCK, 2.1MHz SPACING
(64dBc - NYQUIST)
FIGURE 12. FOUR TONES (CF=8.1) AT 14MHz, 80MSPS
CLOCK, 800kHz SPACING (70dBc - NYQUIST,
6dB PAD)
ISL5761
Definition of Specifications
Adjacent Channel Power Ratio, ACPR, is the ratio of the
average power in the adjacent frequency channel (or offset)
to the average power in the transmitted frequency channel.
Differential Linearity Error, DNL, is the measure of the
step size output deviation from code to code. Ideally the step
size should be 1 LSB. A DNL specification of 1 LSB or less
guarantees monotonicity.
EDGE, Enhanced Data for Global Evolution, a TDMA
standard for cellular applications which uses 200kHz BW, 8PSK modulated carriers.
Full Scale Gain Drift, is measured by setting the data inputs
to be all logic high (all 1s) and measuring the output voltage
through a known resistance as the temperature is varied
from TMIN to TMAX . It is defined as the maximum deviation
from the value measured at room temperature to the value
measured at either TMIN or TMAX . The units are ppm of FSR
(full scale range) per oC.
Full Scale Gain Error, is the error from an ideal ratio of 32
between the output current and the full scale adjust current
(through RSET).
GSM, Global System for Mobile Communication, a TDMA
standard for cellular applications which uses 200kHz BW,
GMSK modulated carriers.
Integral Linearity Error, INL, is the measure of the worst
case point that deviates from a best fit straight line of data
values along the transfer curve.
Internal Reference Voltage Drift, is defined as the
maximum deviation from the value measured at room
temperature to the value measured at either TMIN or TMAX .
The units are ppm per oC.
Offset Drift, is measured by setting the data inputs to all
logic low (all 0s) and measuring the output voltage at IOUTA
through a known resistance as the temperature is varied
from TMIN to TMAX . It is defined as the maximum deviation
from the value measured at room temperature to the value
measured at either TMIN or TMAX . The units are ppm of FSR
(full scale range) per degree oC.
Offset Error, is measured by setting the data inputs to all
logic low (all 0s) and measuring the output voltage of IOUTA
through a known resistance. Offset error is defined as the
maximum deviation of the IOUTA output current from a value
of 0mA.
Output Voltage Compliance Range, is the voltage limit
imposed on the output. The output impedance should be
chosen such that the voltage developed does not violate the
compliance range.
Power Supply Rejection, is measured using a single power
supply. The nominal supply voltage is varied ±10% and the
change in the DAC full scale output is noted.
9
Reference Input Multiplying Bandwidth, is defined as the
3dB bandwidth of the voltage reference input. It is measured
by using a sinusoidal waveform as the external reference
with the digital inputs set to all 1s. The frequency is
increased until the amplitude of the output waveform is 0.707
(-3dB) of its original value.
Spurious Free Dynamic Range, SFDR, is the amplitude
difference from the fundamental signal to the largest
harmonically or non-harmonically related spur within the
specified frequency window.
Total Harmonic Distortion, THD, is the ratio of the RMS
value of the fundamental output signal to the RMS sum of
the first five harmonic components.
UMTS, Universal Mobile Telecommunications System, a
W-CDMA standard for cellular applications which uses
3.84MHz modulated carriers.
Detailed Description
The ISL5761 is a 10-bit, current out, CMOS, digital to analog
converter. The maximum update rate is at least 210+MSPS
and can be powered by a single power supply in the
recommended range of +3.0V to +3.6V. Operation with clock
rates higher than 210MSPS is possible; please contact the
factory for more information. It consumes less than 120mW
of power when using a +3.3V supply, the maximum 20mA of
output current, and the data switching at 210MSPS. The
architecture is based on a segmented current source
arrangement that reduces glitch by reducing the amount of
current switching at any one time. In previous architectures
that contained all binary weighted current sources or a
binary weighted resistor ladder, the converter might have a
substantially larger amount of current turning on and off at
certain, worst-case transition points such as midscale and
quarter scale transitions. By greatly reducing the amount of
current switching at these major transitions, the overall glitch
of the converter is dramatically reduced, improving settling
time, transient problems, and accuracy.
Digital Inputs and Termination
The ISL5761 digital inputs are guaranteed to 3V LVCMOS
levels. The internal register is updated on the rising edge of
the clock. To minimize reflections, proper termination should
be implemented. If the lines driving the clock and the digital
inputs are long 50Ω lines, then 50Ω termination resistors
should be placed as close to the converter inputs as possible
connected to the digital ground plane (if separate grounds
are used). These termination resistors are not likely needed
as long as the digital waveform source is within a few inches
of the DAC. For pattern drivers with very high speed edge
rates, it is recommended that the user consider series
termination (50-200Ω) prior to the DAC’s inputs in order to
reduce the amount of noise.
ISL5761
Power Supply
Separate digital and analog power supplies are
recommended. The allowable supply range is +2.7V to
+3.6V. The recommended supply range is +3.0 to 3.6V
(nominally +3.3V) to maintain optimum SFDR. However,
operation down to +2.7V is possible with some degradation
in SFDR. Reducing the analog output current can help the
SFDR at +2.7V. The SFDR values stated in the table of
specifications were obtained with a +3.3V supply.
Ground Planes
Separate digital and analog ground planes should be used.
All of the digital functions of the device and their
corresponding components should be located over the
digital ground plane and terminated to the digital ground
plane. The same is true for the analog components and the
analog ground plane.
Noise Reduction
To minimize power supply noise, 0.1µF capacitors should be
placed as close as possible to the converter’s power supply
pins, AVDD and DVDD . Also, the layout should be designed
using separate digital and analog ground planes and these
capacitors should be terminated to the digital ground for
DVDD and to the analog ground for AVDD . Additional filtering
of the power supplies on the board is recommended.
Voltage Reference
The internal voltage reference of the device has a nominal
value of +1.23V with a ±40ppm/ oC drift coefficient over the
full temperature range of the converter. It is recommended
that a 0.1µF capacitor be placed as close as possible to the
REFIO pin, connected to the analog ground. The REFLO pin
(16) selects the reference. The internal reference can be
selected if pin 16 is tied low (ground). If an external
reference is desired, then pin 16 should be tied high (the
analog supply voltage) and the external reference driven into
REFIO, pin 17. The full scale output current of the converter
is a function of the voltage reference used and the value of
RSET . IOUT should be within the 2mA to 20mA range,
though operation below 2mA is possible, with performance
degradation.
If the internal reference is used, VFSADJ will equal
approximately 1.2V (pin 18). If an external reference is used,
VFSADJ will equal the external reference. The calculation for
IOUT (Full Scale) is:
IOUT(Full Scale) = (VFSADJ/RSET) X 32.
If the full scale output current is set to 20mA by using the
internal voltage reference (1.2V) and a 1.91kΩ RSET
resistor, then the input coding to output current will resemble
the following:
10
TABLE 1. INPUT CODING vs OUTPUT CURRENT WITH
INTERNAL REFERENCE AND RSET=1.91KΩ
INPUT CODE (D9-D0)
IOUTA (mA)
IOUTB (mA)
11111 11111
20
0
10000 00000
10
10
00000 00000
0
20
Analog Output
IOUTA and IOUTB are complementary current outputs. The
sum of the two currents is always equal to the full scale
output current minus one LSB. If single ended use is
desired, a load resistor can be used to convert the output
current to a voltage. It is recommended that the unused
output be either grounded or equally terminated. The voltage
developed at the output must not violate the output voltage
compliance range of -1.0V to 1.25V. ROUT (the impedance
loading each current output) should be chosen so that the
desired output voltage is produced in conjunction with the
output full scale current. If a known line impedance is to be
driven, then the output load resistor should be chosen to
match this impedance. The output voltage equation is:
VOUT = IOUT X ROUT.
The most effective method for reducing the power
consumption is to reduce the analog output current, which
dominates the supply current. The maximum recommended
output current is 20mA.
Differential Output
IOUTA and IOUTB can be used in a differential-to-singleended arrangement to achieve better harmonic rejection.
With RDIFF= 50Ω and RLOAD=50Ω, the circuit in Figure 13
will provide a 500mV (-2.5dBm) signal at the output of the
transformer if the full scale output current of the DAC is set to
20mA (used for the electrical specifications table). Values of
RDIFF= 100Ω and RLOAD=50Ω were used for the typical
performance curves. The center tap in Figure 13 must be
grounded.
In the circuit in Figure 14, the user is left with the option to
ground or float the center tap. The DC voltage that will exist
at either IOUTA or IOUTB if the center tap is floating is
IOUTDC x (RA//RB) V because RDIFF is DC shorted by the
transformer. If the center tap is grounded, the DC voltage is
0V. Recommended values for the circuit in Figure 14 are
RA=RB=50Ω, RDIFF=100Ω, assuming RLOAD=50Ω. The
performance of Figure 13 and Figure 14 is basically the
same, however leaving the center tap of Figure 14 floating
allows the circuit to find a more balanced virtual ground,
theoretically improving the even order harmonic rejection,
but likely reducing the signal swing available due to the
output voltage compliance range limitations.
ISL5761
Propagation Delay
REQ = 0.5 x (RLOAD // RDIFF)
AT EACH OUTPUT
The converter requires two clock rising edges for data to be
represented at the output. Each rising edge of the clock
captures the present data word and outputs the previous
data. The propagation delay is therefore 1/CLK, plus <2ns of
processing. See Figure 15.
VOUT = (2 x IOUTA x REQ)V
1:1
IOUTB
PIN 21
PIN 22
ISL5761
RDIFF
RLOAD
IOUTA
Test Service
Intersil offers customer-specific testing of CommLink
converters with a service called Testdrive. To submit a
request, fill out the Testdrive form. The form can be found by
doing an ‘entire site search’ at www.intersil.com on the
words ‘DAC Testdrive’. Or, send a request to the technical
support center.
RLOAD REPRESENTS THE
LOAD SEEN BY THE TRANSFORMER
FIGURE 13. OUTPUT LOADING FOR DATASHEET
MEASUREMENTS
REQ = 0.5 x (RLOAD // RDIFF// RA), WHERE RA=RB
AT EACH OUTPUT
RA
VOUT = (2 x IOUTA x REQ)V
IOUTB
PIN 21
RDIFF
PIN 22
ISL5761
IOUTA
RLOAD
RB
RLOAD REPRESENTS THE
LOAD SEEN BY THE TRANSFORMER
FIGURE 14. ALTERNATIVE OUTPUT LOADING
Timing Diagram
tPW1
tPW2
50%
CLK
tSU
tSU
tHLD
D9-D0
W0
tSU
tHLD
tHLD
W1
W2
W3
tPD
tPD
OUTPUT=W0
IOUT
OUTPUT=W-1
OUTPUT=W1
FIGURE 15. PROPAGATION DELAY, SETUP TIME, HOLD TIME AND MINIMUM PULSE WIDTH DIAGRAM
11
ISL5761
Small Outline Plastic Packages (SOIC)
M28.3 (JEDEC MS-013-AE ISSUE C)
28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
N
INDEX
AREA
0.25(0.010) M
H
B M
INCHES
E
SYMBOL
-B-
1
2
3
L
SEATING PLANE
-A-
h x 45o
A
D
µα
e
A1
B
0.25(0.010) M
C
0.10(0.004)
C A M
B S
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2
of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010
inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual
index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch)
10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact.
12
MAX
MILLIMETERS
MIN
MAX
NOTES
A
0.0926
0.1043
2.35
2.65
-
A1
0.0040
0.0118
0.10
0.30
-
B
0.013
0.0200
0.33
0.51
9
C
0.0091
0.0125
0.23
0.32
-
D
0.6969
0.7125
17.70
18.10
3
E
0.2914
0.2992
7.40
7.60
4
e
-C-
MIN
0.05 BSC
h
0.01
0.029
0.25
0.75
5
L
0.016
0.050
0.40
1.27
6
8o
0o
α
10.00
28
0o
10.65
-
0.394
N
0.419
1.27 BSC
H
28
-
7
8o
Rev. 0 12/93
ISL5761
Thin Shrink Small Outline Plastic Packages (TSSOP)
M28.173
N
INDEX
AREA
E
0.25(0.010) M
E1
2
INCHES
GAUGE
PLANE
-B1
28 LEAD THIN SHRINK SMALL OUTLINE PLASTIC
PACKAGE
B M
3
L
0.05(0.002)
-A-
0.25
0.010
SEATING PLANE
A
D
-C-
α
e
b
0.10(0.004) M
A2
A1
C A M
SYMBOL
MIN
MAX
MIN
MAX
NOTES
A
-
0.047
-
1.20
-
A1
0.002
0.006
0.05
0.15
-
A2
0.031
0.051
0.80
1.05
-
b
0.0075
0.0118
0.19
0.30
9
c
0.0035
0.0079
0.09
0.20
-
D
0.378
0.386
9.60
9.80
3
E1
0.169
0.177
4.30
4.50
4
e
c
0.10(0.004)
B S
0.026 BSC
E
0.246
L
0.0177
N
NOTES:
1. These package dimensions are within allowable dimensions of
JEDEC MO-153-AE, Issue E.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm
(0.006 inch) per side.
4. Dimension “E1” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.15mm (0.006 inch) per
side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. Dimension “b” does not include dambar protrusion. Allowable dambar
protrusion shall be 0.08mm (0.003 inch) total in excess of “b” dimension at maximum material condition. Minimum space between protrusion and adjacent lead is 0.07mm (0.0027 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact. (Angles in degrees)
MILLIMETERS
α
0.65 BSC
0.256
6.25
0.0295
0.45
28
0o
-
0.75
6
28
8o
0o
-
6.50
7
8o
Rev. 0 6/98
All Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice.
Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable.
However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its
use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
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