DATASHEET

ISL12008
I2C Real Time Clock with Battery Backup
®
Data Sheet
September 26, 2008
FN6690.1
Low Power RTC with Battery ReSeal™
Function
Features
The ISL12008 device is a low power real time clock/calendar
that is pin compatible and functionally equivalent to the
ST M41T00S and Maxim DS1340 with timing and crystal
compensation. The device additionally provides power-fail
indicator, software alarm and intelligent battery backup.
• Functionality Equivalent to ST M41T00S and Maxim
DS1340
The oscillator uses an external, low-cost 32.768kHz crystal.
The real time clock tracks time with separate registers for
hours, minutes, and seconds. The device has calendar
registers for date, month, year and day of the week. The
calendar is accurate through 2099, with automatic leap year
correction.
Pinout
• Pin Compatible to ST M41T00S and Maxim DS1340
• Real Time Clock/Calendar
- Tracks Time in Hours, Minutes, Seconds and
Sub-seconds
- Day of the Week, Day, Month, and Year
• 512Hz Frequency Outputs for On-Chip Crystal
Compensation
• Software Alarm
- Settable to the Second, Minute, Hour, Day of the Week,
Day, or Month
• Automatic Low-Drop Battery Switch for Longest Backup
Life
ISL12008
(8 LD SOIC)
TOP VIEW
• Power Failure Detection
X1
1
8
VDD
• Battery ReSeal™ for Long Shelf Life
• I2C Bus™
- 400kHz Data Transfer Rate
X2
2
7
FT/OUT
VBAT
3
6
SCL
GND
4
5
SDA
• 800nA Battery Supply Current
• Small Package Option
- 8 Ld SOIC
Ordering Information
PART
NUMBER
(Note)
ISL12008IB8Z
VDD
PART
RANGE
MARKING
(V)
TEMP.
RANGE PACKAGE PKG.
(°C)
(Pb-free) DWG. #
12008 IBZ 2.7 to 5.5 -40 to +85 8 Ld SOIC M8.15
• Pb-Free (RoHS Compliant)
Applications
ISL12008IB8Z-T* 12008 IBZ 2.7 to 5.5 -40 to +85 8 Ld SOIC M8.15
• Utility Meters
*Please refer to TB347 for details on reel specifications.
• HVAC Equipment
NOTE: These Intersil Pb-free plastic packaged products employ special
Pb-free material sets, molding compounds/die attach materials, and
100% matte tin plate plus anneal (e3 termination finish, which is RoHS
compliant and compatible with both SnPb and Pb-free soldering
operations). Intersil Pb-free products are MSL classified at Pb-free peak
reflow temperatures that meet or exceed the Pb-free requirements of
IPC/JEDEC J STD-020.
• Audio/Video Components
• Set-Top Box/Television
• Modems
• Network Routers, Hubs, Switches, Bridges
• Cellular Infrastructure Equipment
• Fixed Broadband Wireless Equipment
• Pagers/PDA
• POS Equipment
• Test Meters/Fixtures
• Office Automation (Copiers, Fax)
• Home Appliances
• Computer Products
• Other Industrial/Medical/Automotive
.
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.
ReSeal™ is a trademark owned byIntersil Americas Inc.Copyright Intersil Americas Inc. 2008. All Rights Reserved
I2C Bus™ is a trademark owned by NXP Semiconductors Netherlands, B.V.
All other trademarks mentioned are the property of their respective owners.
ISL12008
Block Diagram
SDA
SDA
BUFFER
SCL
SCL
BUFFER
I2C
INTERFACE
SECONDS
RTC
CONTROL
LOGIC
MINUTES
HOURS
DAY OF WEEK
X1
CRYSTAL
OSCILLATOR
X2
RTC
DIVIDER
DATE
MONTH
VDD
POR
YEAR
FREQUENCY
OUT
CONTROL
REGISTERS
VTRIP
SWITCH
FT/OUT
INTERNAL
SUPPLY
VBAT
Pin Descriptions
PIN
NUMBER SYMBOL
DESCRIPTION
1
X1
The X1 pin is the input of an inverting amplifier and is intended to be connected to one pin of an external 32.768kHz quartz
crystal. X1 can also be driven directly from a 32.768kHz source.
2
X2
The X2 pin is the output of an inverting amplifier and is intended to be connected to one pin of an external 32.768kHz quartz
crystal.
3
VBAT
This input provides a backup supply voltage to the device. VBAT supplies power to the device in the event that the VDD supply
fails. This pin should be tied to ground if not used.
4
GND
Ground
5
SDA
Serial Data (SDA) is a bidirectional pin used to transfer serial data into and out of the device. It has an open drain output and
may be wire OR’ed with other open drain or open collector outputs.
6
SCL
The Serial Clock (SCL) input is used to clock all serial data into and out of the device.
7
FT/OUT
8
VDD
512Hz Frequency Output or digital output pin. The function is set via the configuration register. This pin is open drain and
requires an external pull-up resistor.
Power supply
2
FN6690.1
September 26, 2008
ISL12008
Absolute Maximum Ratings
Thermal Information
Voltage on VDD, VBAT, SCL, SDA, and FT/OUT Pins
(Respect to GND). . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 6.5V
Voltage on X1 and X2 Pins
(Respect to GND)
VDD Mode. . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VDD + 0.5
VBAT Mode . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VBAT + 0.5
Thermal Resistance (Typical, Note 1)
θJA (°C/W)
8 Lead SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
115
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTE:
1. θJA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
DC Operating Characteristics – RTC Temperature = -40°C to +85°C. Recommended Operating Conditions, unless
otherwise specified.
SYMBOL
PARAMETER
VDD
Main Power Supply
VBAT
Battery Supply Voltage
IDD1
Supply Current
IDD2
Supply Current With I2C Active
IDD3
IBAT
CONDITIONS
MIN
(Note 8)
TYP
(Note 5)
MAX
(Note 8)
UNITS
5.5
V
2.7
1.8
5.5
V
VDD = 5V
2.8
6
µA
VDD = 3V
1.6
4
µA
VDD = 5V
40
120
µA
2, 3
Supply Current (Low Power Mode)
VDD = 5V, LPMODE = 1
2.3
5
µA
2
Battery Supply Current
VBAT = 3V, +25°C
800
950
nA
2
ILI
Input Leakage Current on SCL
-1
0.1
+1
µA
ILO
I/O Leakage Current on SDA
-1
0.1
+1
µA
VBAT Mode Threshold
2.3
2.6
2.9
VTRIP
NOTES
2, 3
V
VTRIPHYS
VTRIP Hysteresis
36
mV
6
VBATHYS
VBAT Hysteresis
53
mV
6
FT/OUT
VOL
Output Low Voltage
Power-Down Timing
0.02
0.4
V
VDD = 2.7V
IOL = 1mA
0.02
0.4
V
Temperature = -40°C to +85°C. Recommended Operating Conditions unless otherwise specified.
SYMBOL
VDD SR-
VDD = 5V
IOL = 3mA
PARAMETER
CONDITIONS
MIN
(Note 8)
TYP
(Note 5)
MAX
(Note 8)
UNITS
NOTES
5
V/ms
4
VDD Negative Slewrate
Serial Interface Specifications Recommended Operating Conditions. Unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 8)
TYP
(Note 5)
MAX
(Note 8)
UNITS NOTES
SERIAL INTERFACE SPECS
VIL
SDA and SCL Input Buffer LOW Voltage
-0.3
0.3 x VDD
V
VIH
SDA and SCL Input Buffer HIGH Voltage
0.7 x VDD
VDD + 0.3
V
Hysteresis SDA and SCL Input Buffer Hysteresis
VOL
SDA Output Buffer LOW Voltage, Sinking 3mA
Cpin
SDA and SCL Pin Capacitance
3
V
0.05 x
VDD
0
TA = +25°C, f = 1MHz, VDD = 5V,
VIN = 0V, VOUT = 0V
0.02
0.4
V
10
pF
6, 7
6, 7
FN6690.1
September 26, 2008
ISL12008
Serial Interface Specifications Recommended Operating Conditions. Unless otherwise specified. (Continued)
SYMBOL
fSCL
PARAMETER
TEST CONDITIONS
MIN
(Note 8)
SCL Frequency
TYP
(Note 5)
MAX
(Note 8)
UNITS NOTES
400
kHz
tIN
Pulse width Suppression Time at SDA and
SCL Inputs
Any pulse narrower than the max
spec is suppressed.
50
ns
tAA
SCL Falling Edge to SDA Output Data Valid
SCL falling edge crossing 30% of
VDD, until SDA exits the 30% to
70% of VDD window.
900
ns
tBUF
Time the Bus Must be Free Before the Start
of a New Transmission
SDA crossing 70% of VDD during
a STOP condition, to SDA
crossing 70% of VDD during the
following START condition.
1300
ns
tLOW
Clock LOW Time
Measured at the 30% of VDD
crossing.
1300
ns
tHIGH
Clock HIGH Time
Measured at the 70% of VDD
crossing.
600
ns
tSU:STA
START Condition Setup Time
SCL rising edge to SDA falling
edge. Both crossing 70% of VDD.
600
ns
tHD:STA
START Condition Hold Time
From SDA falling edge crossing
30% of VDD to SCL falling edge
crossing 70% of VDD.
600
ns
tSU:DAT
Input Data Setup Time
From SDA exiting the 30% to 70%
of VDD window, to SCL rising edge
crossing 30% of VDD.
100
ns
tHD:DAT
Input Data Hold Time
From SCL falling edge crossing
30% of VDD to SDA entering the
30% to 70% of VDD window.
20
tSU:STO
STOP Condition Setup Time
From SCL rising edge crossing
70% of VDD, to SDA rising edge
crossing 30% of VDD.
600
ns
tHD:STO
STOP Condition Hold Time
From SDA rising edge to SCL
falling edge. Both crossing 70% of
VDD.
600
ns
Output Data Hold Time
From SCL falling edge crossing
30% of VDD, until SDA enters the
30% to 70% of VDD window.
0
ns
tR
SDA and SCL Rise Time
From 30% to 70% of VDD
20 +
0.1 x Cb
300
ns
6, 7
tF
SDA and SCL Fall Time
From 70% to 30% of VDD
20 +
0.1 x Cb
300
ns
6, 7
Cb
Capacitive Loading of SDA or SCL
Total on-chip and off-chip
10
400
pF
6, 7
Rpu
SDA and SCL Bus Pull-Up Resistor Off-Chip Maximum is determined by tR
and tF.
For Cb = 400pF, max is about
2kΩ to~2.5kΩ.
For Cb = 40pF, max is about 15kΩ
to ~20kΩ.
kΩ
6, 7
tDH
900
ns
1
NOTES:
2. FT/OUT inactive.
3. LPMODE = 0 (default).
4. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
5. Typical values are for T = +25°C and 3.3V supply voltage.
6. Limits should be considered typical and are not production tested.
7. These are I2C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate specification.
8. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by
characterization and are not production tested.
4
FN6690.1
September 26, 2008
ISL12008
SDA vs SCL Timing
tHIGH
tF
SCL
tLOW
tR
tSU:DAT
tSU:STA
tHD:DAT
tSU:STO
tHD:STA
SDA
(INPUT TIMING)
tAA
tDH
tBUF
SDA
(OUTPUT TIMING)
Symbol Table
WAVEFORM
INPUTS
OUTPUTS
Must be steady
Will be steady
May change
from LOW
to HIGH
Will change
from LOW
to HIGH
May change
from HIGH
to LOW
Will change
from HIGH
to LOW
Don’t Care:
Changes Allowed
Changing:
State Not Known
N/A
Center Line is
High Impedance
5
FN6690.1
September 26, 2008
ISL12008
Temperature is +25°C, unless otherwise specified.
0.2
1.00
1.8
0.95
1.6
0.90
1.4
0.85
1.2
0.80
IBAT (µA)
IBAT (µA)
Typical Performance Curves
1.0
0.8
0.75
0.70
0.6
0.65
0.4
0.60
0.2
0.55
0
1.8
2.3
2.8
3.3
3.8
VBAT (V)
4.3
4.8
0.50
-40
5.3
FIGURE 1. IBAT vs VBAT
-20
0
20
40
TEMPERATURE (°C)
60
80
FIGURE 2. IBAT vs TEMPERATURE AT VBAT = 3V
3.5
3.5
VDD = 5V
3.0
3.0
ICC (µA)
IDD (µA)
2.5
2.5
2.0
LP MODE OFF
2.0
1.5
LP MODE ON
VDD = 3.3V
1.5
1.0
1.0
-40
-20
0
20
40
TEMPERATURE (°C)
60
80
0.5
1.8
2.3
2.8
3.3
3.8
VDD (V)
4.3
4.8
5.3
FIGURE 3. IDD1 vs TEMPERATURE
FIGURE 4. IDD1 vs VDD WITH LPMODE ON AND OFF
EQUIVALENT AC OUTPUT LOAD CIRCUIT FOR VDD = 5V
The calendar is accurate through 2099, with automatic leap
year correction.
5.0V
1533Ω
FOR VOL= 0.4V
AND IOL = 3mA
SDA
AND
FT/OUT
100pF
FIGURE 5. STANDARD OUTPUT LOAD FOR TESTING THE
DEVICE WITH VDD = 5.0V
General Description
The ISL12008 device is a low power real time clock with
timing and crystal compensation, clock/calendar, power fail
indicator, software alarm, and intelligent battery backup
switching.
The oscillator uses an external, low-cost 32.768kHz crystal.
The real time clock tracks time with separate registers for
hours, minutes, seconds, and sub-seconds. The device has
calendar registers for date, month, year and day of the week.
6
The ISL12008's powerful alarm can be set to any
clock/calendar value for a match. For example, every
minute, every Tuesday or at 5:23 AM on March 21. The
alarm status is available by checking the Status Register.
The device also offers a backup power input pin. This VBAT
pin allows the device to be backed up by battery or super
capacitor with automatic switchover from VDD to VBAT. The
entire ISL12008 device is fully operational from 2.7V to 5.5V
and the clock/calendar portion of the device remains fully
operational down to 1.8V in battery mode.
Pin Descriptions
X1, X2
The X1 and X2 pins are the input and output, respectively, of
an inverting amplifier. An external 32.768kHz quartz crystal is
used with the ISL12008 to supply a timebase for the real time
clock. Internal compensation circuitry provides high accuracy
over the operating temperature range from -40°C to +85°C.
This oscillator compensation network can be used to calibrate
FN6690.1
September 26, 2008
ISL12008
the crystal timing accuracy over-temperature either during
manufacturing or with an external temperature sensor and
microcontroller for active compensation (see Figure 6).
X1
X2
FIGURE 6. RECOMMENDED CRYSTAL CONNECTION
VBAT
This input provides a backup supply voltage to the device.
VBAT supplies power to the device in the event that the VDD
supply fails. This pin can be connected to a battery, a super
capacitor or tied to ground if not used.
FT/OUT (512Hz Frequency Output/Logic Output)
This dual function pin can be used as a 512Hz frequency
output pin for on-chip crystal compensation or a simple
digital output control via I2C. The FT/OUT mode is selected
via the OUT and FT control bits of the control/status register
(address 07h). This pin is an open drain output requires the
use of a pull-up resistor.
Serial Clock (SCL)
The SCL input is used to clock all serial data into and out of
the device. The input buffer on this pin is always active (not
gated). It is disabled when the backup power supply on the
VBAT pin is activated to minimize power consumption.
Serial Data (SDA)
up to a month. See “Application Section” on page 16 for
more information.
Normal Mode (VDD) to Battery Backup Mode
(VBAT)
To transition from the VDD to VBAT mode, both of the
following conditions must be met:
Condition 1:
VDD < VBAT - VBATHYS
where VBATHYS ≈ 50mV
Condition 2:
VDD < VTRIP
where VTRIP ≈ 2.6V
Battery Backup Mode (VBAT) to Normal Mode
(VDD)
The ISL12008 device will switch from the VBAT to VDD mode
when one of the following conditions occurs:
Condition 1:
VDD > VBAT + VBATHYS
where VBATHYS ≈ 50mV
Condition 2:
VDD > VTRIP + VTRIPHYS
where VTRIPHYS ≈ 30mV
These power control situations are illustrated in Figures 7
and 8.
BATTERY BACKUP
MODE
VDD
SDA is a bidirectional pin used to transfer data into and out
of the device. It has an open drain output and may be ORed
with other open drain or open collector outputs. The input
buffer is always active (not gated) in normal mode.
VTRIP
2.6V
VBAT
1.8V
VBAT + VBATHYS
VBAT - VBATHYS
An open drain output requires the use of a pull-up resistor.
The output circuitry controls the fall time of the output signal
with the use of a slope controlled pull-down. The circuit is
designed for 400kHz I2C bus speeds. It is disabled when the
backup power supply on the VBAT pin is activated.
FIGURE 7. BATTERY SWITCHOVER WHEN VBAT < VTRIP
VDD, GND
Chip power supply and ground pins. The device will operate
with a power supply from 2.7V to 5.5VDC. A 0.1µF
decoupling capacitor is recommended on the VDD pin to
ground.
Functional Description
BATTERY BACKUP
MODE
VDD
VBAT
3.0V
VTRIP
2.6V
VTRIP
VTRIP + VTRIPHYS
Power Control Operation
The power control circuit accepts a VDD and a VBAT input.
Many types of batteries can be used with Intersil RTC
products. For example, 3.0V or 3.6V Lithium batteries are
appropriate, and battery sizes are available that can power
the ISL12008 for up to 10 years. Another option is to use a
super capacitor for applications where VDD is interrupted for
7
FIGURE 8. BATTERY SWITCHOVER WHEN VBAT > VTRIP
FN6690.1
September 26, 2008
ISL12008
The I2C bus is deactivated in battery backup mode to provide
lower power. Aside from this, all RTC functions are
operational during battery backup mode. Except for SCL and
SDA, all the inputs and outputs of the ISL12008 are active
during battery backup mode unless disabled via the control
register.
Power Failure Detection
The ISL12008 provides a Real Time Clock Failure Bit (RTCF,
address 0Bh) to detect total power failure. It allows users to
determine if the device has powered up after having lost all
power to the device (both VDD and VBAT).
Low Power Mode
The normal power switching of the ISL12008 is designed to
switch into battery backup mode only if the VDD power is
lost. This will ensure that the device can accept a wide range
of backup voltages from many types of sources while reliably
switching into backup mode. Another mode, called Low
Power Mode, is available to allow direct switching from VDD
to VBAT without requiring VDD to drop below VTRIP. Since
the additional monitoring of VDD vs VTRIP is no longer
needed, that circuitry is shut down and less power is used
while operating from VDD. Power savings are typically
600nA at VDD = 5V. Low Power Mode is activated via the
LPMODE bit (address 08h, bit 5) in the control and status
registers.
Real Time Clock Operation
The Real Time Clock (RTC) uses an external 32.768kHz
quartz crystal to maintain an accurate internal representation
of sub-second, second, minute, hour, day of week, date,
month, and year. The RTC has leap-year correction, and
corrects for months having fewer than 31 days. The RTC
hours is in 24-hour format only. When the ISL12008 powers
up after the loss of both VDD and VBAT, the RTC will not
begin incrementing until at least one byte is written to the
RTC registers. The sub-second register will increment after
power up but it will not casue the other RTC registers to
incremnent until at least one byte is written to the RTC
registers.
Accuracy of the Real Time Clock
The accuracy of the Real Time Clock depends on the
frequency of the quartz crystal that is used as the time base
for the RTC. Since the resonant frequency of a crystal is
temperature dependent, the RTC performance will also be
dependent upon temperature. The frequency deviation of
the crystal is a function of the turnover temperature of the
crystal from the crystal’s nominal frequency. For example, a
~20ppm frequency deviation translates into an accuracy of
~1 minute per month. These parameters are available from
the crystal manufacturer. The ISL12008 provides on-chip
crystal compensation networks to adjust load capacitance to
tune oscillator frequency from -97.0695ppm to
+206.139ppm. For more detailed information. See
“Application Section” on page 16.
Low Power Mode is useful in systems where VDD is normally
higher than VBAT at all times. The device will switch from
VDD to VBAT when VDD drops below VBAT, with about 50mV
of hysteresis to prevent any switchback of VDD after
switchover. In a system with a VDD = 5V and backup lithium
battery of VBAT = 3V, Low Power Mode can be used.
However, it is not recommended to use Low Power Mode in
a system with VDD = 3.3V ±10%, VBAT ≥ 3.0V, and when
there is a finite I-R voltage drop in the VDD line.
The ISL12008 has an I2C serial bus interface that provides
access to the control and status registers and the user
SRAM. The I2C serial interface is compatible with other
industry I2C serial bus protocols using a bidirectional data
signal (SDA) and a clock signal (SCL).
InterSeal™ and ReSeal™ Battery Saver
Oscillator Compensation
The ISL12008 has the InterSeal Battery Saver, which
prevents initial battery current drain before it is first used. For
example, battery-backed RTCs are commonly packaged on
a board with a battery connected. In order to preserve
battery life, the ISL12008 will not draw any power from the
battery source until after the device is first powered up from
the VDD source. Thereafter, the device will switchover to
battery backup mode whenever VDD power is lost.
The ISL12008 provides the option of timing correction due to
temperature variation of the crystal oscillator for either
manufacturing calibration or active calibration. The total
possible compensation is typically -97.0695ppm to
+206.139ppm. Two compensation mechanisms that are
available are as follows:
The ISL12008 has the ReSeal function, which allows the
device to enter into the InterSeal Battery Saver mode after
manufacture testing for board functionality. To use the
ReSeal function, simply set RESEAL bit to “1” (address 0Bh)
after the testing is completed. It will enable the InterSeal
Battery Saver mode and prevents battery current drain
before it is first used.
8
I2C Serial Interface
1. An analog trimming (ATR) register that can be used to
adjust individual on-chip digital capacitors for oscillator
capacitance trimming. The individual digital capacitor is
selectable from a range of 4.5pF to 20.25pF (based upon
32.758kHz). This translates to a calculated
compensation of approximately -34ppm to +80ppm (see
ATR description on page 16).
2. A digital trimming register (DTR) that can be used to
adjust the timing counter by -63.0696ppm to
+126.139ppm (see DTR description on page 16).
FN6690.1
September 26, 2008
ISL12008
Also provided is the ability to adjust the crystal capacitance
when the ISL12008 switches from VDD to battery backup
mode. See “Battery Backup Mode (VBAT) to Normal Mode
(VDD)” on page 7.
Register Descriptions
The battery-backed registers are accessible following a
slave byte of “1101000x” and reads or writes to addresses
[00h:1Fh]. The defined addresses and default values are
described in Table 1. Address 12h to 1Eh are not used.
Reads or writes to 12h to 1Eh will not affect operation of the
device but should be avoided.
REGISTER ACCESS
The contents of address 00h to 07h can be modified by
performing a byte or a page write operation directly to any
register address. In a page write operation to address 00h to
07h, the address will wrap around from 07h to 00h. All the
other registers (Address 08h to 11h and 1Fh) can be
modified by performing a byte write operation.
The registers are divided into 3 sections. These are:
1. Real Time Clock (8 bytes): Address 00h to 06h, and 1Fh.
Address 1Fh is Sub-Second register and it is a read-only.
2. Control and Status (4 bytes): Address 07h to 0Bh.
3. Alarm (6 bytes): Address 0Ch to 11h.
There are no addresses above 1Fh.
Address 12h to 1Eh are not used. Reads or writes to 12h to
1Eh will not affect operation of the device but should be
avoided.
A register can be read by performing a random read at any
address at any time. This returns the contents of that register
location. Additional registers are read by performing a
sequential read. For the RTC and Alarm registers, the read
operation latches all clock registers into a buffer, so an
update of the clock does not change the time being read. A
sequential read will not result in the output of data from the
memory array. At the end of a read, the master supplies a
stop condition to end the operation and free the bus. After a
read, the address remains at the previous address +1 so the
user can execute a current address read and continue
reading the next register. In a sequential read, the address
will warp around at address 07h to 00h; therefore, please
use byte read operation to read the registers after
address 07h.
9
FN6690.1
September 26, 2008
ISL12008
Real Time Clock Registers
TABLE 1. REGISTER MEMORY MAP
BIT
REG
REG
NAME
7
6
5
4
3
2
1
0
SC
ST
SC22
SC21
SC20
SC13
SC12
SC11
SC10
0 to 59
00h
01h
MN
OF
MN22
MN21
MN20
MN13
MN12
MN11
MN10
0 to 59
80h
02h
HR
CEB
CB
HR21
HR20
HR13
HR12
HR11
HR10
0 to 23
00h
03h
DW
0
0
0
0
0
DW12
DW11
DW10
1 to 7
00h
04h
DT
0
0
DT21
DT20
DT13
DT12
DT11
DT10
1 to 31
00h
05h
MO
0
0
0
MO20
MO13
MO12
MO11
MO10
1 to 12
00h
06h
YR
YR23
YR22
YR21
YR20
YR13
YR12
YR11
YR10
0 to 99
00h
DTR
OUT
FT
DTR5
DTR4
DTR3
DTR2
DTR1
DTR0
N/A
80h
08h
INT
0
ALME
LPMODE
0
0
0
0
0
N/A
00h
09h
OF
OF
0
0
0
0
0
0
0
N/A
80h
0Ah
ATR
BMATR1
BMATR0
ATR5
ATR4
ATR3
ATR2
ATR1
ATR0
N/A
00h
ADDR. SECTION
00h
07h
RTC
Control
RTC
RANGE DEFAULT
0Bh
Status
SR
ARST
XSTOP
RESEAL
0
0
ALM
BAT
RTCF
N/A
03h
0Ch
Alarm0
SCA
ESCA
ASC22
ASC21
ASC20
ASC13
ASC12
ASC11
ASC10
00 to 59
00h
0Dh
MNA
EMNA
AMN22
AMN21
AMN20
AMN13
AMN12
AMN11
AMN10
00 to 59
00h
0Eh
HRA
EHRA
0
AHR21
AHR20
AHR13
AHR12
AHR11
AHR10
0 to 23
00h
0Fh
DTA
EDTA
0
ADT21
ADT20
ADT13
ADT12
ADT11
ADT10
1 to 31
00h
10h
MOA
EMOA
0
0
AMO20
AMO13
AMO12
AMO11
AMO10
1 to 12
00h
11h
DWA
EDWA
0
0
0
0
ADW12
ADW11
ADW10
1 to 7
00h
SS
SS23
SS22
SS21
SS20
SS13
SS12
SS11
SS10
0 to 99
00h
1Fh
(ReadOnly)
RTC
NOTE: 0 = must be set to‘0’
Addresses [00h to 06h, and 1Fh]
RTC REGISTERS (SC, MN, HR, DW, DT, MO, YR, SS)
These registers depict BCD representations of the time. As
such, SC (Seconds, address 00h) and MN (Minutes,
address 01h) range from 0 to 59, HR (Hour, address 02h) is
in 24-hour mode with a range from 0 to 23, DW (Day of the
Week, address 03h) is 1 to 7, DT (Date, address 04h) is 1 to
31, MO (Month, address 05h) is 1 to 12, YR (Year, address
06h) is 0 to 99, and SS (Sub-Seconds/Hundredths of
Seconds, address 1Fh) is 0 to 99. The default for all the time
keeping bits are set to “0” at power up.
Bit D7 of SC register contain the crystal enable/disable bit
(ST). Setting ST to “1” will disable the crystal from oscillating
and stop the counting in RTC register. When the ST bit is set
to “1”, it will casue the OF bit to set to “1” due to no crystal
oscillation on the X1 pin. The ST bit is set to “0” on power-up
for normal operation.
oscillation. This bit can be reset when the X1 has crystal
oscillation and a write to “0”. This bit can only be written as
“0” and not as a “1”. The OF bit is set to “1” at power-up from
a complete power down (VDD and VBAT are removed).
Address 9, bit 7 is also used as the OF bit for DS1340
compatibility, and the two OF bits are interchangable.
Bits D6 and D7 of HR register (century/hours register)
contain the century enable bit (CEB) and the century bit
(CB). Setting CEB to a '1' will cause CB to toggle, either from
'0' to '1' or from '1' to '0' at the turn of the century (depending
upon its initial state). If CEB is set to a '0', CB will not toggle.
The DW register provides a Day of the Week status and uses
three bits DW2 to DW0 to represent the seven days of the
week. The counter advances in the cycle 1-2-3-4-5-6-7-1-2… The assignment of a numerical value to a specific day of
the week is arbitrary and may be decided by the system
software designer.
Bit D7 of MN register contain the Oscillator Fail Indicator bit
(OF). This bit is set to a “1” when the X1 pin has no
10
FN6690.1
September 26, 2008
ISL12008
LEAP YEARS
ReSeal (RESEAL)
Leap years add the day February 29 and are defined as those
years that are divisible by 4. Years divisible by 100 are not leap
years, unless they are also divisible by 400. This means that
the year 2000 is a leap year, the year 2100 is not. The
ISL12008 does not correct for the leap year in the year 2100.
The ReSeal™ enables the device enter into the InterSeal™
Battery Saver mode after manufacture testing for board
functionality. The factory default setting of this bit is “0”. The
RESEAL must be set to “0” to enable the battery function
during normal operation or full functional testing. To use the
ReSeal function, simply set RESEAL bit to “1” after the
testing is completed. It will enable the InterSeal™ Battery
Saver mode and prevents battery current drain before it is
first used.
Control and Status Registers
Addresses [07h to 0Bh]
The Control and Status Registers consist of the Status
Register, Interrupt and Alarm Register, Analog Trimming and
Digital Trimming Registers.
Status Register (SR) [Address 0Bh]
The Status Register is located in the memory map at
address 0Bh. This is a volatile register that provides either
control or status of RTC failure, battery mode, alarm trigger,
crystal oscillator status, ReSeal™ and auto reset of status
bits.
AUTO RESET ENABLE BIT (ARST)
This bit enables/disables the automatic reset of the BAT,
ALM and TMR status bits only. When ARST bit is set to “1”,
these status bits are reset to “0” after a valid read of the
respective status register (with a valid STOP condition).
When the ARST is cleared to “0”, the user must manually
reset the BAT and ALM bits.
Interrupt Control Register (INT) [Address 08h]
TABLE 3. INTERRUPT CONTROL REGISTER (INT)
TABLE 2. STATUS REGISTER (SR)
ADDR
7
6
5
4
3
0Bh
ARST
0
RESEAL
0
0
Default
0
0
0
0
0
2
1
0
ALM BAT RTCF
0
1
1
ADDR
7
08h
0
Default
0
6
5
ALME LPMODE
0
0
4
3
2
1
0
0
0
0
0
0
0
0
0
0
0
REAL TIME CLOCK FAIL BIT (RTCF)
LOW POWER MODE BIT (LPMODE)
This bit is set to a “1” after a total power failure. This is a read
only bit that is set by hardware (ISL12008 internally) when
the device powers up after having lost all power to the device
(both VDD and VBAT go to 0V). The bit is set regardless of
whether VDD or VBAT is applied first. The loss of only one of
the supplies does not set the RTCF bit to “1”. On power-up
after a total power failure, all registers are set to their default
states and the clock will not increment until at least one byte
is written to the clock register. The first valid write to the RTC
section after a complete power failure resets the RTCF bit to
“0” (writing one byte is sufficient).
This bit enables/disables low power mode. With
LPMODE = “0”, the device will be in normal mode and the
VBAT supply will be used when VDD < VBAT - VBATHYS and
VDD < VTRIP. With LPMODE = “1”, the device will be in low
power mode and the VBAT supply will be used when
VDD < VBAT - VBATHYS. There is a supply current saving of
about 600nA when using LPMODE = “1” with VDD = 5V.
(See “Typical Performance Curves” on page 6: IDD vs VCC
with LPMODE ON and OFF.)
BATTERY BIT (BAT)
This bit is set to a “1” when the device enters battery backup
mode. This bit can be reset either manually by the user or
automatically reset by enabling the auto-reset bit (see ARST
bit). A write to this bit in the SR can only set it to “0”, not “1”.
ALARM BIT (ALM)
ALARM ENABLE BIT (ALME)
This bit enables/disables the alarm function. When the ALME
bit is set to “1”, the alarm function is enabled. When the ALME
bit is cleared to “0”, the alarm function is disabled. ALME bit is
set to “0” at power-up.
Oscillator Fail Register (OF) [Address 09h]
TABLE 4. INTERRUPT CONTROL REGISTER (INT)
ADDR
These bits announce if the alarm matches the real time
clock. If there is a match, the respective bit is set to “1”. This
bit can be manually reset to “0” by the user or automatically
reset by enabling the auto-reset bit (see ARST bit). A write to
this bit in the SR can only set it to “0”, not “1”.
NOTE: An alarm bit that is set by an alarm occurring during an SR
read operation will remain set after the read operation is complete.
11
09h
Default
7
6
5
4
3
2
1
0
OF
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
OSCILLATOR FAIL BIT (OF)
This bit is set to a “1” when the X1 pin has no oscillation.
This bit can be reset when the X1 has crystal oscillation and
a write to “0”. This bit can only be written as “0” and not as a
“1”. The OF bit is set to “1” at power up from a complete
power down (VDD and VBAT are removed). Address 1, bit 7
FN6690.1
September 26, 2008
ISL12008
is also used as the OF bit for M41T00S compatibility, and the
two OF bits are interchangable.
of load capacitance goes from 4.5pF to 20.25pF in 0.25pF
steps. Note that these are typical values.
Analog Trimming Register (ATR) [Address 0Ah]
BATTERY MODE ATR SELECTION (BMATR <1:0>)
TABLE 5. ANALOG TRIMMING REGISTER (ATR)
ADDR
0Ah
7
6
5
4
3
2
1
0
BMATR1 BMATR0 ATR5 ATR4 ATR3 ATR2 ATR1 ATR0
Default
0
0
0
0
0
0
0
Since the accuracy of the crystal oscillator is dependent on
the VDD/VBAT operation, the ISL12008 provides the
capability to adjust the capacitance between VDD and VBAT
when the device switches between power sources.
0
DELTA
CAPACITANCE
(CBAT TO CVDD)
ANALOG TRIMMING REGISTER (ATR<5:0>)
BMATR1
BMATR0
0
0
0pF
0
1
-0.5pF (≈ +2ppm)
1
0
+0.5pF (≈ -2ppm)
1
1
+1pF (≈ -4ppm)
X1
CX1
CRYSTAL
OSCILLATOR
X2
CX2
Digital Trimming Register (DTR) [Address 07h]
TABLE 6. DIGITAL TRIMMING REGISTER (DTR)
ADDR
FIGURE 9. DIAGRAM OF ATR
Six analog trimming bits, ATR0 to ATR5, are provided in
order to adjust the on-chip load capacitance value for
frequency compensation of the RTC. Each bit has a different
weight for capacitance adjustment. For example, using a
Citizen CFS-206 crystal with different ATR bit combinations
provides an estimated ppm adjustment range from -34ppm
to +80ppm to the nominal frequency compensation. The
combination of analog and digital trimming can give up to
-97.0695ppm to +206.139ppm of total adjustment.
The effective on-chip series load capacitance, CLOAD,
ranges from 9pF to 40.5pF with a mid-scale value of 12.5pF
(default). CLOAD is changed via two digitally controlled
capacitors, CX1 and CX2, connected from the X1 and X2
pins to ground (see Figure 9). The value of CX1 and CX2 are
given in Equation 1:
C X = ( 16 ⋅ b 5 + 8 ⋅ b 4 + 4 ⋅ b3 + 2 ⋅ b2 + 1 ⋅ b1 + 0.5 ⋅ b0 + 9 )pF (EQ. 1)
The effective series load capacitance is the combination of
CX1 and CX2 in Equation 2:
C
LOAD
07h
Default
7
6
OUT
FT
0
0
5
4
3
2
1
0
DTR5 DTR4 DTR3 DTR2 DTR1 DTR0
0
0
0
0
0
0
DIGITAL TRIMMING REGISTER (DTR<5:0>)
Six digital trimming bits, DTR0 to DTR5, are provided to
adjust the average number of counts per second and
average the ppm error to achieve better accuracy.
• DTR5 is a sign bit. DTR5 = “0” means frequency
compensation is < 0. DTR5 = “1” means frequency
compensation is > 0.
• DTR<4:0> are scale bits. With DTR5 = “0”, DTR<4:0>
gives -2.0345ppm adjustment per step. With DTR5 = “1”,
DTR<4:0> gives +4.0690ppm adjustment per step.
A range from -63.0696ppm to +126.139ppm can be
represented by using these 3 bits.
For example, with DTR = 11111, the digital adjustment is
(1111b[15d]*4.0690) = +126.139ppm. With DTR = 01111, the
digital adjustment is (-(1111b[15d]*2.0345)) = -63.0696ppm.
512HZ FREQUENCY OUTPUT ENABLE BIT (FT)
1
1
1
⎛ ---------- + -----------⎞
⎝C
⎠
X1 C X2
= -----------------------------------
(EQ. 2)
16 ⋅ b5 + 8 ⋅ b4 + 4 ⋅ b3 + 2 ⋅ b2 + 1 ⋅ b1 + 0.5 ⋅ b 0 + 9
C LOAD = ⎛ ------------------------------------------------------------------------------------------------------------------------------⎞ pF
⎝
2
⎠
where b5 is ATR5 bit, b4 is ATR4 bit, b3 is ATR3 bit, b2 is
ATR1 bit, and b0 is ATR0 bit.
For example, CLOAD(ATR = 000000b [0d]) = 12.5pF, CLOAD
(ATR = 100000b [32d]) = 4.5pF and CLOAD (ATR = 011111b
[31d]) = 20.25pF. The entire range for the series combination
12
This bit enables/disables the 512Hz frequency output on the
FT/OUT pin. When the FT is set to “1”, the FT/OUT pin
outputs the 512Hz frequency, regardless of the Digital Output
selection bit (OUT). The 512Hz frequency output is used for
crystal compensation with ATR and DTR registers. When the
FT is set to “0”, the 512Hz frequency is disabled and the
function of FT/OUT pin is selected by the Digital Output
selection bit (OUT). The FT bit is set to “0” on power-up. The
FT/OUT pin is an open drain output requires the use of a
pull-up resistor.
FN6690.1
September 26, 2008
ISL12008
DIGITAL OUTPUT SELECTION BIT (OUT)
This bit selects the output status of the FT/OUT. 512Hz
Frequency Output Enable bit (FT) must be set to “0”
(disable) for OUT to take effect on FT/OUT pin. When the
OUT is set to “1” and FT is set to “0”, the FT/OUT pin is set
to logic level high. The FT/OUT pin voltage level is controlled
by the voltage of the pull-up resistor on FT/OUT pin. When
the OUT is set to “0” and FT is set to “0”, the FT/OUT pin is
set to logic level low. The voltage level of FT/OUT is set to
VOL level. The OUT bit is set to “1” on power-up. The
FT/OUT pin is an open drain output requires the use of a
pull-up resistor.
Alarm Registers
Addresses [0Ch to 11h]
The Alarm register bytes are set up identical to the RTC
register bytes, except that the MSB of each byte functions as
an enable bit (enable = “1”). These enable bits specify which
alarm registers (seconds, minutes, etc.) are used to make
the comparison. Note that there is no alarm byte for year and
sub-second, and the register order for Alarm register is not a
100% matching to the RTC register so please take caution
on programming the alarm function.
The alarm function works as a comparison between the
alarm registers and the RTC registers. As the RTC
advances, the alarm will be triggered once a match occurs
between the alarm registers and the RTC registers. Any one
alarm register, multiple registers, or all registers can be
enabled for a match.
To clear an alarm, the ALM status bit must be set to “0” with
a write. Note that if the ARST bit is set to “1” (address 0Bh,
bit 7), the ALM bit will automatically be cleared when the
status register is read.
I2C Serial Interface
The ISL12008 supports a bidirectional bus oriented protocol.
The protocol defines any device that sends data onto the
bus as a transmitter and the receiving device as the receiver.
The device controlling the transfer is the master and the
device being controlled is the slave. The master always
initiates data transfers and provides the clock for both
transmit and receive operations. Therefore, the ISL12008
operates as a slave device in all applications.
All communication over the I2C bus is conducted by sending
the MSB of each byte of data first.
Protocol Conventions
Data states on the SDA line can change only during SCL
LOW periods. SDA state changes during SCL HIGH are
reserved for indicating START and STOP conditions (see
Figure 10). On power-up of the ISL12008, the SDA pin is in
the input mode.
All I2C bus operations must begin with a START condition,
which is a HIGH to LOW transition of SDA while SCL is
HIGH. The ISL12008 continuously monitors the SDA and
SCL lines for the START condition and does not respond to
any command until this condition is met (see Figure 10). A
START condition is ignored during the power-up sequence.
All I2C bus operations must be terminated by a STOP
condition, which is a LOW to HIGH transition of SDA while
SCL is HIGH (see Figure 10). A STOP condition at the end
of a read operation or at the end of a write operation to
memory only places the device in its standby mode.
An acknowledge (ACK) is a software convention used to
indicate a successful data transfer. The transmitting device,
either master or slave, releases the SDA bus after
transmitting 8 bits. During the ninth clock cycle, the receiver
pulls the SDA line LOW to acknowledge the reception of the
8 bits of data (see Figure 11).
The ISL12008 responds with an ACK after recognition of a
START condition followed by a valid Identification Byte, and
once again after successful receipt of an Address Byte. The
ISL12008 also responds with an ACK after receiving a Data
Byte of a write operation. The master must respond with an
ACK after receiving a Data Byte of a read operation.
SCL
SDA
START
DATA
STABLE
DATA
CHANGE
DATA
STABLE
STOP
FIGURE 10. VALID DATA CHANGES, START, AND STOP CONDITIONS
13
FN6690.1
September 26, 2008
ISL12008
SCL FROM
MASTER
1
8
9
SDA OUTPUT FROM
TRANSMITTER
HIGH IMPEDANCE
HIGH IMPEDANCE
SDA OUTPUT FROM
RECEIVER
START
ACK
FIGURE 11. ACKNOWLEDGE RESPONSE FROM RECEIVER
WRITE
SIGNALS FROM
THE MASTER
SIGNAL AT SDA
SIGNALS FROM
THE ISL12008
S
T
A
R
T
ADDRESS
BYTE
IDENTIFICATION
BYTE
S
T
O
P
DATA
BYTE
1 1 0 1 0 0 0 0
A
C
K
A
C
K
A
C
K
FIGURE 12. BYTE WRITE SEQUENCE
14
FN6690.1
September 26, 2008
ISL12008
Device Addressing
Write Operation
Following a start condition, the master must output a Slave
Address Byte. The 7 MSBs are the device identifiers. These
bits are “1101000”.
A Write operation requires a START condition, followed by a
valid Identification Byte, a valid Address Byte, a Data Byte,
and a STOP condition. After each of the three bytes, the
ISL12008 responds with an ACK. After received the STOP
condition, the ISL12008 writes the data into the memory,
then the I2C bus enters a standby state. After a Write
operation, the internal address pointer will remain at the
address for the last data byte written.
The last bit of the Slave Address Byte defines a read or write
operation to be performed. When this R/W bit is a “1”, then a
read operation is selected (refer to Figure 16). When this
R/W bit is a “0” , then a write operation (refer to Figure 12).
After loading the entire Slave Address Byte from the SDA
bus, the ISL12008 compares the Slave bit and device select
bits with “1101000”. Upon a correct compare, the device
outputs an acknowledge on the SDA line.
Following the Slave Byte is a one byte word address. The
word address is either supplied by the master device or
obtained from an internal counter. On power-up, the internal
address counter is set to address 0h, so a current address
read of the CCR array starts at address 0h. When required,
as part of a random read, the master must supply the 1 Word
Address Bytes, as shown in Figure 14.
In a random read operation, the slave byte in the “dummy
write” portion must match the slave byte in the “read”
section. For a random read of the Clock/Control Registers,
the slave byte must be “1101000x” in both places.
R/W
SLAVE
ADDRESS BYTE
A1
A0
WORD ADDRESS
D1
D0
DATA BYTE
1
1
0
1
0
0
0
A7
A6
A5
A4
A3
A2
D7
D6
D5
D4
D3
D2
Read Operation
A Read operation consists of a three byte instruction
followed by one or more Data Bytes (see Figure 14). The
master initiates the operation issuing the following
sequence: a START, the Identification byte with the R/W bit
set to “0”, an Address Byte, a second START, and a second
Identification byte with the R/W bit set to “1”. After each of
the three bytes, the ISL12008 responds with an ACK. Then
the ISL12008 transmits Data Bytes as long as the master
responds with an ACK during the SCL cycle following the
eighth bit of each byte. The master terminates the read
operation (issuing a STOP condition) following the last bit of
the last Data Byte (see Figure 14).
The Data Bytes are from the memory location indicated by
an internal address pointer. This internal address pointer
initial value is determined by the Address Byte in the Read
operation instruction, and increments by one during
transmission of each Data Byte.
FIGURE 13. SLAVE ADDRESS, WORD ADDRESS, AND DATA
BYTES
SIGNALS
FROM THE
MASTER
S
T
A
R
T
SIGNAL AT
SDA
IDENTIFICATION
BYTE WITH
R/W = 0
S
T IDENTIFICATION
A
BYTE WITH
R
R/W = 1
T
ADDRESS
BYTE
S
T
O
P
A
C
K
1 1 0 1 0 0 0 1
1 1 0 1 0 0 0 0
A
C
K
SIGNALS FROM
THE SLAVE
A
C
K
A
C
K
A
C
K
FIRST READ
DATA BYTE
LAST READ
DATA BYTE
FIGURE 14. READ SEQUENCE
15
FN6690.1
September 26, 2008
ISL12008
Oscillator Crystal Requirements
The ISL12008 uses a standard 32.768kHz crystal. Either
through hole or surface mount crystals can be used. Table 7
lists some recommended surface mount crystals and the
parameters of each. This list is not exhaustive and other
surface mount devices can be used with the ISL12008 if
their specifications are very similar to the devices listed.
The crystal should have a required parallel load capacitance
of 12.5pF and an equivalent series resistance of less than
50k. The crystal’s temperature range specification should
match the application. Many crystals are rated for -10°C to
+60°C (especially through-hole and tuning fork types), so an
appropriate crystal should be selected if extended
temperature range is required.
TABLE 7. SUGGESTED SURFACE MOUNT CRYSTALS
MANUFACTURER
PART NUMBER
Citizen
CM200S
Epson
MC-405, MC-406
Raltron
RSM-200S
SaRonix
32S12
Ecliptek
ECPSM29T-32.768K
ECS
ECX-306
Fox
FSM-327
Crystal Oscillator Frequency Adjustment
The ISL12008 device contains circuitry for adjusting the
frequency of the crystal oscillator. This circuitry can be used
to trim oscillator initial accuracy as well as adjust the
frequency to compensate for temperature changes.
The Analog Trimming Register (ATR) is used to adjust the
load capacitance seen by the crystal. There are 6 bits of ATR
control, with linear capacitance increments available for
adjustment. Since the ATR adjustment is essentially “pulling”
the frequency of the oscillator, the resulting frequency
changes will not be linear with incremental capacitance
changes. The equations (which govern pulling) show that
lower capacitor values of ATR adjustment will provide larger
increments. Also, the higher values of ATR adjustment will
produce smaller incremental frequency changes. The range
afforded by the ATR adjustment with a typical surface mount
crystal is typically -34ppm to +80ppm around the ATR = 0
default setting because of this property. The user should note
this when using the ATR for calibration. The temperature drift
of the capacitance used in the ATR control is extremely low,
so this feature can be used for temperature compensation
with good accuracy.
Digital Trimming Register (DTR). The range provided is
-63.0695ppm to +126.139ppm. DTR operates by adding or
skipping pulses in the clock counter. It is very useful for
coarse adjustments of frequency drift over temperature or
extending the adjustment range available with the ATR
register.
Initial accuracy is best adjusted by enabling the 512Hz
frequency output (using the FT bit, address 08h bit 6), and
monitoring the FT/OUT pin with a calibrated frequency
counter. The gating time should be set long enough to
ensure accuracy to at least 1ppm. To calculate the ppm on
the measured 512Hz, simply divide the measured 512Hz by
512, then subtract 1 from the result and mulitple by
1,000,000. Please see Equation 3 for the formula:
(EQ. 3)
ppm = (FT/512 - 1)*1E6
The ATR should be set to the center position, or 00000b, to
begin with. Once the initial measurement is made, then the
ATR register can be changed to adjust the frequency. Note
for a range of 0 to 31 for the ATR register will increased
capacitance and lower the frequency with 31 for the
maximum negative correction, and for a range of 32 to 63 for
the ATR register will decreased capacitance and increase
the frequency with 32 for the maximum positive correction. If
the initial measurement shows the frequency is far off, it will
be necessary to use the DTR register to do a coarse
adjustment. Note that most all crystals will have tight enough
initial accuracy at room temperature so that a small ATR
register adjustment should be all that is needed.
Temperature Compensation
The ATR and DTR controls can be combined to provide
crystal drift temperature compensation. The typical
32.768kHz crystal has a drift characteristic that is similar to
that shown in Figure 15. There is a turnover temperature
(T0) where the drift is very near zero. The shape is parabolic
as it varies with the square of the difference between the
actual temperature and the turnover temperature.
0
-20
-40
-60
PPM
Application Section
-80
-100
-120
-140
-160
-40 -30 -20 -10 0
10 20 30 40 50 60 70 80
TEMPERATURE (°C)
FIGURE 15. RTC CRYSTAL TEMPERATURE DRIFT
In addition to the analog compensation afforded by the
adjustable load capacitance, a digital compensation feature
is available for the ISL12008. There are 6 bits known as the
16
FN6690.1
September 26, 2008
ISL12008
If full industrial temperature compensation is desired in an
ISL12008 circuit, then both the DTR and ATR registers will
need to be utilized (total correction range = -97.0695ppm to
+206.139ppm).
A system to implement temperature compensation would
consist of the ISL12008, a temperature sensor, and a
microcontroller. These devices may already be in the system
so the function will just be a matter of implementing software
and performing some calculations. Fairly accurate
temperature compensation can be implemented just by
using the crystal manufacturer’s specifications for the
turnover temperature T0 and the drift coefficient (β). The
formula for calculating the oscillator adjustment necessary is
Equation 4:
Adjustment(ppm) = ( T – T 0 )2 ∗ β
Figure 17 shows a suggested layout for the ISL12008 device
using a surface mount crystal. Two main precautions should
be followed:
1. Do not run the serial bus lines or any high speed logic
lines in the vicinity of the crystal. These logic level lines
can induce noise in the oscillator circuit to cause
misclocking.
2. Add a ground trace around the crystal with one end
terminated at the chip ground. This will provide
termination for emitted noise in the vicinity of the RTC
device.
(EQ. 4)
Once the temperature curve for a crystal is established, then
the designer should decide at what discrete temperatures
the compensation will change. Since drift is higher at
extreme temperatures, the compensation may not be
needed until the temperature is greater than +20°C from T0.
A sample curve of the ATR setting vs Frequency Adjustment
for the ISL12008 and a typical RTC crystal is given in
Figure 16. This curve may vary with different crystals, so it is
good practice to evaluate a given crystal in an ISL12008
circuit before establishing the adjustment values.
PPM ADJUSTMENT
RTC circuit will avoid noise pickup and insure accurate
clocking.
90
80
70
60
50
40
30
20
10
0
-10
-20
-30
-40
FIGURE 17. SUGGESTED LAYOUT FOR ISL12008 AND
CRYSTAL
In addition, it is a good idea to avoid a ground plane under
the X1 and X2 pins and the crystal, as this will affect the load
capacitance and therefore the oscillator accuracy of the
circuit. If the FT/OUT pin is used as a clock, it should be
routed away from the RTC device as well. The traces for the
VBAT and VCC pins can be treated as a ground, and should
be routed around the crystal.
Super Capacitor Backup
0
5
10 15 20 25 30 35 40 45 50 55 60
ATR SETTING
FIGURE 16. ATR SETTING vs OSCILLATOR FREQUENCY
ADJUSTMENT
This curve is then used to figure what ATR and DTR settings
are used for compensation. The results would be placed in a
lookup table for the microcontroller to access.
Layout Considerations
The crystal input at X1 has a very high impedance, and
oscillator circuits operating at low frequencies (such as
32.768kHz) are known to pick up noise very easily if layout
precautions are not followed. Most instances of erratic
clocking or large accuracy errors can be traced to the
susceptibility of the oscillator circuit to interference from
adjacent high speed clock or data lines. Careful layout of the
17
The ISL12008 device provides a VBAT pin which is used for
a battery backup input. A super capacitor can be used as an
alternative to a battery in cases where shorter backup times
are required. Since the battery backup supply current
required by the ISL12008 is extremely low, it is possible to
get months of backup operation using a super capacitor.
Typical capacitor values are a few µF to 1F or more,
depending on the application.
If backup is only needed for a few minutes, then a small
inexpensive electrolytic capacitor can be used. For extended
periods, a low leakage, high capacity super capacitor is the
best choice. These devices are available from such vendors
as Panasonic and Murata. The main specifications include
working voltage and leakage current. If the application is for
charging the capacitor from a +5V ±5% supply with a signal
diode, then the voltage on the capacitor can vary from ~4.5V
to slightly over 5.0V. A capacitor with a rated WV of 5.0V
may have a reduced lifetime if the supply voltage is slightly
high. The leakage current should be as small as possible.
For example, a super capacitor should be specified with
leakage of well below 1µA. A standard electrolytic capacitor
with DC leakage current in the microamps will have a
severely shortened backup time.
FN6690.1
September 26, 2008
ISL12008
Following are some examples with equations to assist with
calculating backup times and required capacitance for the
ISL12008 device. The backup supply current plays a major
part in these equations, and a typical value was chosen for
example purposes. For a robust design, a margin of 30%
should be included to cover supply current and capacitance
tolerances over the results of the calculations. Even more
margin should be included if periods of very warm
temperature operation are expected.
EXAMPLE 1: CALCULATING BACKUP TIME GIVEN
VOLTAGES AND CAPACITOR VALUE
where:
CBAT = 0.47F
VBAT2 = 4.7V
VBAT1 = 1.8V
ILKG = 0 (assumed minimal)
t BACKUP = 0.47 • ( 2.9 ) ⁄ 4.38E – 7 = 3.107E6s
VBAT
VCC
tBACKUP = CBAT*(VBAT2 - VBAT1) / (IBATAVG + ILKG)
seconds
(EQ. 9)
Solving Equation 8 for this example (IBATAVG = 4.387E-7A)
yields Equation 10:
1N4148
2.7V TO 5.5V
Combining with Equation 6 gives the equation for backup
time in Equation 9:
CBAT
Since there are 86,400 seconds in a day, this corresponds to
35.96 days. If the 30% tolerance is included for capacitor
and supply current tolerances, then worst case backup time
would be represented in Equation 11:
GND
FIGURE 18. SUPERCAPACITOR CHARGING CIRCUIT
In Figure 18, use CBAT = 0.47F and VCC = 5V. With VCC = 5V,
the voltage at VBAT will approach 4.7V as the diode turns off
completely. The ISL12008 is specified to operate down to
VBAT = 1.8V. The capacitance charge/discharge in Equation 5
is used to estimate the total backup time as follows:
(EQ. 5)
I = CBAT*dV/dT
Rearranging gives Equation 6:
dT = CBAT*dV/ITOT to solve for backup time.
(EQ. 6)
CBAT is the backup capacitance and dV is the change in
voltage from fully charged to loss of operation. Note that
ITOT is the total of the supply current of the ISL12008 (IBAT)
plus the leakage current of the capacitor and the diode, ILKG.
In these calculations, ILKG is assumed to be extremely small
and will be ignored. If an application requires extended
operation at temperatures over +50°C, these leakages will
increase and hence reduce backup time.
Note that IBAT changes with VBAT almost linearly (see
“Typical Performance Curves” on page 6). This allows us to
make an approximation of IBAT, using a value midway
between the two endpoints. The typical linear equation for
IBAT vs VBAT is shown in Equation 7:
IBAT = 1.031E-7*(VBAT) + 1.036E-7A
(EQ. 10)
(EQ. 7)
Using Equation 7 to solve for the average current given 2
voltage points gives Equation 8:
C BAT = 0.70 • 35.96 = 25.2 days
(EQ. 11)
EXAMPLE 2: CALCULATING A CAPACITOR VALUE FOR
A GIVEN BACKUP TIME
Referring to Figure 18 again, the capacitor value needs to be
calculated to give 2 months (60 days) of backup time, given
VCC = 5.0V. As in Example 1, the VBAT voltage will vary from
4.7V down to 1.8V. We will need to rearrange Equation 6 to
solve for capacitance in Equation 12:
(EQ. 12)
CBAT = dT*I/dV
Using the terms previously described, Equation 12 becomes
Equation 13:
CBAT = tBACKUP*(IBATAVG + ILKG)/(VBAT2 – VBAT1)
(EQ. 13)
where:
tBACKUP = 60 days*86,400 sec/day = 5.18 E6 seconds
IBATAVG = 4.387 E-7A (same as Example 1)
ILKG = 0 (assumed)
VBAT2 = 4.7V
VBAT1 = 1.8VSolving gives
CBAT = 5.18 E6*(4.387 E-7)/(2.9) = 0.784F
If the 30% tolerance is included for tolerances, then worst
case capacitor value would be:
C BAT = 1.3 • 0.784 = 1.02F
(EQ. 14)
IBATAVG = 5.155E-8*(VBAT2 + VBAT1) + 1.036E-7A
(EQ. 8)
18
FN6690.1
September 26, 2008
ISL12008
Small Outline Plastic Packages (SOIC)
M8.15 (JEDEC MS-012-AA ISSUE C)
N
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
INDEX
AREA
H
0.25(0.010) M
B M
INCHES
E
SYMBOL
-B-
1
2
3
L
SEATING PLANE
-A-
A
D
h x 45°
-C-
e
A1
B
0.25(0.010) M
C
0.10(0.004)
C A M
MIN
MAX
MIN
MAX
NOTES
A
0.0532
0.0688
1.35
1.75
-
A1
0.0040
0.0098
0.10
0.25
-
B
0.013
0.020
0.33
0.51
9
C
0.0075
0.0098
0.19
0.25
-
D
0.1890
0.1968
4.80
5.00
3
E
0.1497
0.1574
3.80
4.00
4
e
α
B S
0.050 BSC
1.27 BSC
-
H
0.2284
0.2440
5.80
6.20
-
h
0.0099
0.0196
0.25
0.50
5
L
0.016
0.050
0.40
1.27
6
N
α
NOTES:
MILLIMETERS
8
0°
8
8°
0°
7
8°
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
Rev. 1 6/05
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per
side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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19
FN6690.1
September 26, 2008