903 - Comparator, High Speed

903
High Speed Comparator
VCC 1
8 VDD
IN+ 2
+
7 OUT
IN- 3
-
6 GND
VEE 4
5 LATCH
DESCRIPTION:
• High-speed, low-power voltage comparator
• RAD-PAK® radiation-hardened against
natural space radiation
• Total dose hardness: 100 krad (Si) typical;
dependent upon orbit
• 8ns typ propagation delay
• 18mW power consumption (typ at +5V)
• Separate analog and digital supplies
• Flexible analog supply: +5V to +10V or ±5V
• Input range includes negative supply rail
• TTL compatible outputs
• TTL compatible latch inputs
Maxwell Technologies’ 903 high-speed, lowpower voltage comparator features differential
analog inputs and TTL logic outputs with
active internal pull-ups. The 903 can be powered from separate analog and digital power
supplies or from a single combined supple
voltage. The analog input common-mode
range includes the negative rail, allowing
ground sensing when powered from a single
supply. When powered from +5V, the 903 consumes 18mW. The 903 is equipped with a TTL
compatible latch input. The comparator output
is latched when the latch input is driven low.
Capable of surviving space environments, the
903 is ideal for satellite, spacecraft, and space
probe missions. Maxwell Technologies’ patented RAD-PAK® packaging technology incorporates radiation shielding in the microcircuit
package. It eliminates box shielding while providing lifetime in orbit or space mission. In
GEO orbit, RAD-PAK® provides greater than
100 krad(Si) radiation dose rate. This product
is available with screening up to Class S.
09.12.02 REV 1
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All rights reserved.
Memory
FEATURES:
903
High-Speed Comparator
TABLE 1. PINOUT DESCRIPTION
PIN
NAME
FUNCTION
1
VCC
Positive Analog Supply
2
IN+
Positive input
3
IN-
Negative input
4
VEE
Negative analog supply and substrate
5
LATCH
6
GND
Ground terminal
7
OUT
Output
8
VDD
Positive digital supply
Latch input
TABLE 2. ABSOLUTE MAXIMUM RATINGS
MIN
MAX
UNITS
Analog Supply Voltage (VCC to VEE)
--
+12
V
Digital Supply Voltage (VDD to GND)
--
+7
V
Differential Input Voltage
VEE - 0.2
VCC + 0.2
V
Common-mode Input Voltage
VEE - 0.2
VCC + 0.2
V
-0.2
VDD + 0.2
V
Latch Input Voltage
Output Short-circuit Duration to GND
Output Short-circuit Duration to VDD
Memory
PARAMETER
Indefinite
--
1
min.
Operating Temperature Ranges
-55
+125
°C
Junction Temperature (Tj)
-65
+160
°C
Storage Temperature Range
-65
+150
°C
TABLE 3. AC ELECTRICAL CHARACTERISTICS
(VCC = +5V, VEE = -5V, LATCH = LOGIC HIGH, TA = TMIN TO TMAX, UNLESS OTHERWISE SPECIFIED)
PARAMETER
SYMBOL
TEST
CONDITIONS
SUBGROUPS
MIN
TYP
MAX
UNITS
Input-to-output High Response Time
tpd+
VOD = 5mV,
CL = 15pF,
IO = 2mA1
9, 10, 11
--
10
15
ns
Input-to-output Low Response Time
tpd-
VOD = 5mV,
CL = 15pF,
IO = 2mA1
9, 10, 11
--
10
15
ns
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903
High-Speed Comparator
TABLE 3. AC ELECTRICAL CHARACTERISTICS
(VCC = +5V, VEE = -5V, LATCH = LOGIC HIGH, TA = TMIN TO TMAX, UNLESS OTHERWISE SPECIFIED)
SYMBOL
TEST
CONDITIONS
SUBGROUPS
Latch Disable to
Output High Delay
tpd+
2
9, 10, 11
10
ns
Latch Disable to
Output Low Delay
tpd-
2
9, 10, 11
12
ns
Minimum Setup Time
ts
2
9, 10, 11
2
ns
Minimum Hold Time
th
2
9, 10, 11
1
ns
Minimum Latch
Disable Pulse Width
tpw
2
9, 10, 11
10
ns
PARAMETER
MIN
TYP
MAX
UNITS
1. Guaranteed by design.
Memory
2. Owing to the difficult and critical nature of switching measurements involving the latch, these parameters cannot
be tested in a production environment. Typical specifications listed are taken from measurements using a highspeed test fixture.
TABLE 4. DC ELECTRICAL CHARACTERISTICS
(VCC = +5V, VEE = -5V, LATCH = LOGIC HIGH, TA = TMIN TO TMAX UNLESS OTHERWISE SPECIFIED)
PARAMETER
Input Offset Voltage
SYMBO
L
TEST CONDITIONS
SUBGROUP
S
MIN
TYP
MAX
UNITS
VOS
VCM = 0V,
VO = 1.4V
1, 2, 3
--
2
6
mV
Input Bias Current
IB
IIN+ or IIN-
1, 2, 3
--
6
15
µA
Input Offset Current
IOS
VCM = 0V,
VO = 1.4V
1, 2, 3
--
200
800
nA
Input Voltage Range
VCM
1
1, 2, 3
VEE 0.1
--
VCC 2.25
V
Common-mode Rejection Ratio
CMRR
-5V < VCM <
+2.75,
VO = 1.4V,2
1, 2, 3
--
120
500
µV/V
Power-supply Rejection Ratio
PSRR
2
1, 2, 3
--
150
500
µV/V
Output High Voltage
VOH
VIN > 250mV,
ISRC = 1mA
1, 2, 3
2.4
3.5
--
V
Output Low Voltage
VOL
VIN > 250mV,
ISINK = 8mA
1, 2, 3
--
0.3
0.4
V
Latch Input Voltage High
VLH
1, 2, 3
--
1.4
2.0
V
Latch Input Voltage Low
VLL
1, 2, 3
0.8
1.4
--
V
Latch Input Current High
ILH
VLH = 3.0V
1, 2, 3
--
1
20
µA
Latch Input Current Low
ILL
VLL = 0.3V
1, 2, 3
--
1
20
µA
09.12.02 REV 1
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3
©2002 Maxwell TechnologiesAll
rights reserved.
903
High-Speed Comparator
TABLE 4. DC ELECTRICAL CHARACTERISTICS
(VCC = +5V, VEE = -5V, LATCH = LOGIC HIGH, TA = TMIN TO TMAX UNLESS OTHERWISE SPECIFIED)
PARAMETER
SYMBO
L
TEST CONDITIONS
SUBGROUP
S
MIN
TYP
MAX
UNITS
Positive Analog Supply Current
ICC
1, 2, 3
--
2.5
6
mA
Negative Analog Supply Current
IEE
1, 2, 3
--
2
5
mA
Digital Supply Current
IDD
1, 2, 3
--
1
2.5
mA
Power Dissipation
PD
1, 2, 3
--
18
28
mW
VCC = VDD = +5V,
VEE = 0V
1. The input common-mode voltage or either input signal voltage should not be allowed to go negative by
more than 0.2V below VEE. The upper end of the common-mode voltage range is typically VCC -0.2V, but
either or both inputs can go to a maximum of VCC +0.2V without damage.
2. Tested for +4.75V<VCC<+5.25V, and -5.25V<VEE<-4.75V with VDD = +5V, although permissible analog
power-supply range is +4.75V<VCC<+10.5V for single-supply operation with VEE grounded.
Memory
09.12.02 REV 1
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903
High-Speed Comparator
FIGURE 1. INPUT OFFSET VOLTAGE VS. TEMPERATURE
Memory
FIGURE 2. INPUT BIAS CURRENT VS. TEMPERATURE
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903
High-Speed Comparator
FIGURE 3. OUTPUT LOW VOLTAGE (VOL) VS. LOAD CURRENT
Memory
FIGURE 4. ICC SUPPLY CURRENT (PER COMPARATOR) VS. VCC SUPPLY VOLTAGE (VDD = +5V)
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903
High-Speed Comparator
FIGURE 5. INPUT OVERDRIVE VS. tpd+ RESPONSE TIME
Memory
FIGURE 6. INPUT OVERDRIVE VS. tpd- RESPONSE TIME
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rights reserved.
903
High-Speed Comparator
FIGURE 7. RESPONSE TIME VS. TEMPERATURE (5MV OVERDRIVE)
Memory
FIGURE 8. RESPONSE TIME VS. LOAD CAPACITANCE
(5MV OVERDRIVE, RLOAD = 2.4KΩ)
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903
High-Speed Comparator
FIGURE 9. TIMING DIAGRAM
Memory
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903
High-Speed Comparator
FIGURE 10. tpd+ RESPONSE TIME TO 5mV OVERDRIVE
Memory
09.12.02 REV 1
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903
High-Speed Comparator
FIGURE 11. tpd- RESPONSE TIME TO 5mV O
Memory
09.12.02 REV 1
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903
High-Speed Comparator
FIGURE 12. RESPONSE-TIME SETUP
Memory
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©2002 Maxwell TechnologiesAll
rights reserved.
903
High-Speed Comparator
e
D
b
S1
E1
A
Q
L
E3
E2
Memory
TABLE 13. 8 LEAD RAD-PAK FLAT PACKAGE
SYMBOL
DIMENSIONS
MIN
NOM
MAX
A
.209
.227
.245
b
.015
.017
.019
c
.004
.005
.006
D
.250
.255
.260
E
.250
.255
.260
E1
.290
E2
.140
.145
.150
E3
.045
.055
--
e
.050 BSC
L
.338
.348
.358
Q
.066
.070
.074
S1
.005
.044
--
N
8
09.12.02 REV 1
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13
©2002 Maxwell TechnologiesAll
rights reserved.
903
High-Speed Comparator
Important Notice:
These data sheets are created using the chip manufacturer’s published specifications. Maxwell Technologies verifies
functionality by testing key parameters either by 100% testing, sample testing or characterization.
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.
Product Ordering Information
903 RP F X
FEATURE
OPTION DETAILS
MONOLYTHIC
S = MAXWELL CLASS S
B = MAXWELL CLASS B
I = INDUSTRIAL (-55C TO +125C)
E = ENGINEERING (+25C)
PACKAGE
F = FLAT PACKAGE
RADIATION FEATURE
RP = RAD-PAK PACKAGE
BASE PRODUCT
NOMENCLATURE
HIGH SPEED COMPARATOR
09.12.02 REV 1
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Memory
SCREENING FLOW
14
©2002 Maxwell TechnologiesAll
rights reserved.
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