AEROFLEX DATA EXCHANGE PROGRAM TRANSMITTAL PRODUCT CHANGE NOTICE 1. TITLE 2. DOCUMENT NUMBER MICROCIRCUIT, MEMORY, DIGITAL,CMOS, 1MEG X 39-BIT (40M), RADIATION-HARDENED DUAL VOLATGE, SRAM, MULTICHIP MODULE SPO-2012-PCN-0009 3. DATE (Year, Month, Date) 2012, OCTOBER, 04 4. MANUFACTURER NAME AND ADDRESS 5. MANUFACTURER POINT OF CONTACT NAME AEROFLEX COLORADO SPRINGS, INC. Mike Leslie 4350 CENTENNIAL BOULEVARD COLORADO SPRINGS, COLORADO 80907-3486 6. MANUFACTURER POINT OF CONTACT TELEPHONE (719) 594-8148 7. MANUFACTURER POINT OF CONTACT EMAIL [email protected] 8. CAGE CODE 9. EFFECTIVE DATE 10. PRODUCT IDENTIFICATION CODE 11. BASE PART 65342 2010, April, 08 QS13 UT8R1M39 12. BLANK 13. SMD NUMBER 14. DEVICE TYPE DESIGNATOR 5962-10205 01, 02 15. RHA LEVELS 16. QML LEVEL R Q, Q+, V 17. NON QML LEVEL 18. BLANK HiRel, Protos 19. PRODUCT CHANGE Aeroflex is working in coordination with DLA Land and Maritime to revise SMD 5962-10205, revision level B, for the following changes: Section 1.5 Radiation features (sheet 3) PREVIOUS: 1.5 Radiation features Maximum total dose available (effective dose rate = 1 rads(Si)/s) ...................... 10.0 x 104 rads(Si) 5/ Single event phenomenon (SEP) effective linear energy threshold (LET) with no upsets.................................................... 1 MeV – cm2/mg 2 with no latch-up................................................................................................. > 111 MeV-cm /mg CORRECTED: 1.5 Radiation features Maximum total dose available (effective dose rate = 1 rads(Si)/s) ...................... 100 K rads(Si) 5/ Single event phenomenon (SEP): 2 Effective linear energy transfer (LET) with no upsets (see 4.4.4.3)................... 0.8 MeV - cm /mg 6/ Effective LET with no latch-up (see 4.4.4.2)...................................................... ≤ 110 MeV-cm2/mg -7 Single event upset (SEU) error rate (Adam’s 90% worst case environment)....... 7.3 x 10 errors/bit-day 14 Neutron irradiation test (Displacement damage test) .......................................... 3.0 x 10 n/cm2 7/ ADDED: Notes /6 and /7 (bottom of sheet 3) 0.8 MeV-cm2/mg is the estimated onset LET with no errors based on SEU testing where the minimum heavy ion LET available at the test facility was 0.9 MeV-cm2/mg. At 0.9 MeV-cm2/mg the cross-section is three orders of magnitude lower than the saturated cross-section and will therefore be close to the onset LET with no upsets. 7/ Parameter is guaranteed to the limit shown but not specifically tested. 6/ 20. DISPOSITIONARY RECOMMENDATION: 21. ADEPT REPRESENTATIVE Timothy L. Meade ADEPT FORM F##### REV - USE AS IS 22. ☐ SIGNATURE CONTACT MANUFACTURER ☐ REMOVE & REPLACE ☐ CHECK & ☒ USE AS IS 23. DATE 2012, October, 04 RELEASE DATE: 11/11/11 ADDED: Table 1B SEP test limits and corresponding notes (sheet 9 ) ≤ 110 1/ For SEP test conditions, see 4.4.4.4 herein. 2/ Technology characterization and model verification supplemented by in-line data may be used in lieu of end-of-line testing. Test plan must be approved by TRB and qualifying activity. 3/ Test temperature TA = +25°C ±10°C. 4/ Soft error rate = 7.3 x 10-7 error/bit-day assuming Adam’s 90% worst case environment, geosynchronous orbit, and 100 mil aluminum shielding. Contact the device manufacturer for detailed information. 5/ Worst case test temperature TA = +125°C ±10°C. 6/ Memory patterns are as specified in Appendix A, Algorithm A herein. 7/ 0.8 MeV-cm2/mg is the estimated onset LET with no errors based on SEU testing where the minimum heavy ion LET available at the test facility was 0.9 MeV-cm2/mg. At 0.9 MeV-cm2/mg the cross-section is three orders of magnitude lower than the saturated cross-section and will therefore be close to the onset LET with no upsets. ADDED: Alternative marking as package pin one indenifier to FIGURE 1. Case outline (sheet 11). CORRECTED: Drawing of original pin one identifier corrected and detail B drawing added. PREVIOUS: CORRECTED: (SEE NOTE 9) ADDED: Note 9 (sheet 12): 9/. A dot may be marked on lid to indicate pin 1 index within area shown. ADEPT FORM F##### REV - RELEASE DATE: 11/11/11 CORRECTED: FIGURE 2. Terminal connections (sheet 13). Terminal Number 100 101 PREVIOUS: Terminal Symbol TOP_DQ36 BOT_DQ36 ADEPT FORM F##### REV - Terminal Number 100 101 CORRECTED: Terminal Symbol BOT_DQ36 TOP_DQ36 RELEASE DATE: 11/11/11