FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16867 Generic Copy Issue Date: 20-Jun-2012 TITLE: Final Notification of Qualification of SP Semiconductor site at Korea for the Assembly and Test of Bipolar Power Transistors in TO-264 package PROPOSED FIRST SHIP DATE: 20-Sep-2012 AFFECTED CHANGE CATEGORY(S): ON Semiconductor Assembly & Test Site FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or Jose Ramirez <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Farrah Awang Omar <[email protected]> ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers < [email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: This is to announce the planned capacity expansion of ON Semiconductor assembly and test operations for Bipolar Power Transistors in TO-264 package, currently build at the PSI Manila facility, to SP Semiconductor’s Korea facility. Upon the expiration of this FPCN, these devices may be processed at either location. The SP Semiconductor facility is ISO/TS 16949:2002 certified. Issue Date: 20-Jun-2012 Rev. 06-Jan-2010 Page 1 of 2 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16867 RELIABILITY DATA SUMMARY: Reliability Test Results: MJL1302AG Test: HTRB Autoclave H3TRB IOL TC RSH Conditions: Ta=150°C,80% Rated Voltage Ta=121°C RH=100% ~15 psig Ta=85°C RH=85% bias=80% rated V or100V Max Ta=25°C, Delta TJ = 100°C, Ton/off = 2 min. Ta= -65°C to 150°C Ta=260C, 10 sec dwell Interval: 1008 hrs 96 hrs 1008 hrs Results 0/80 0/80 0/80 6000 cycles 0/80 1000 cycles 0/80 0/30 Conditions: Ta=150°C,80% Rated Voltage Ta=121°C RH=100% ~15 psig Ta=85°C RH=85% bias=80% rated V or100V Max Ta=25°C, Delta TJ = 100°C, Ton/off = 2 min. Interval: 1008 hrs 96 hrs 1008 hrs Results 0/80 0/80 0/80 6000 cycles 0/80 Conditions: Ta=150°C,80% Rated Voltage Ta=121°C RH=100% ~15 psig Ta=85°C RH=85% bias=80% rated V or100V Max Ta=25°C, Delta TJ = 100°C, Ton/off = 2 min. Interval: 1008 hrs 96 hrs 1008 hrs Results 0/80 0/80 0/80 6000 cycles 0/80 MJL21193G Test: HTRB Autoclave H3TRB IOL MJL21194G Test: HTRB Autoclave H3TRB IOL ELECTRICAL CHARACTERISTIC SUMMARY: There is no change in electrical characteristics. Characterization Data is available upon request. CHANGED PART IDENTIFICATION: Product from SP Semiconductor will be identified by SP site code marking. List of affected General Parts: MJL4302AG MJL4281AG MJL3281AG MJL21196G Issue Date: 20-Jun-2012 MJL21195G MJL21194G MJL21193G MJL1302AG Rev. 06-Jan-2010 Page 2 of 2