FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20244 Generic Copy Issue Date: 24-Sep-2013 TITLE: Final Notification of Qualification of SP Semiconductor Korea for Assembly and Test of Bipolar Power ThermalTrak™Transistors packaged in TO-264 5L. PROPOSED FIRST SHIP DATE: 24-Dec-2013 AFFECTED CHANGE CATEGORY(S): ON Semiconductor Assembly & Test FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or Farrah Omar <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: ON Semiconductor announces the qualification of SP Semiconductor Korea for Assembly and Testing of Bipolar Power ThermalTrak™ Transistors packaged in TO-264 5L, previously built at PSI Manila. SP Semiconductor facility is ISO/TS 16949:2002 certified. Issue Date: 24-Sep-2013 Rev. 06-Jan-2010 Page 1 of 2 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20244 RELIABILITY DATA SUMMARY: Reliability Test Results: Device NJL3281DG Test: Conditions: Interval: HTRB Autoclave+PC H3TRB+PC Ta=150C,80% Rated Voltage Ta=121C RH=100% ~15 psig Ta=85C RH=85% bias=80% rated V or100V Max Ta= -65 C to 150 C Ta=260C, 10 sec dwell 1008 hrs 96 hrs 1008 hrs 0/160 0/160 0/160 1000 cyc 0/160 0/20 TC+PC RSH Results Device NJL1302DG Test: Conditions: Interval: HTRB H3TRB+PC Ta=150C,80% Rated Voltage Ta=85C RH=85% bias=80% rated V or100V Max 1008 hrs 1008 hrs Results 0/240 0/159 ELECTRICAL CHARACTERISTIC SUMMARY: There are no changes in electrical characteristics; product performance meets data sheet specifications. Characterization data is available upon request. CHANGED PART IDENTIFICATION: Product from SP Semiconductor will be identified by SP site code marking. List of affected General Parts: NJL1302DG NJL3281DG NJL0281DG NJL0302DG Issue Date: 24-Sep-2013 Rev. 06-Jan-2010 Page 2 of 2