FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 30-MAR-2004 SUBJECT: ON Semiconductor Final Product/Process Change Notification #13388 TITLE: Addition of Tower Semiconductor Fab for Minigate(TM) Logic Products EFFECTIVE DATE: 30-May-2004 AFFECTED CHANGE CATEGORY: Subcontractor Fab Site AFFECTED PRODUCT DIVISION: Logic Products ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Representative or Ken Fergus <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Representative or Nilda Lopez <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Representative or Nilda Lopez <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: ON Semiconductor is pleased to announce expanded wafer capacity for MiniGate(TM) Logic products utilizing Tower Semiconductor. ON Semiconductor will implement this increase in capacity to support rapidly growing demand for these Logic products in an effort to assure our customers of ON Semiconductor's continued commitment to assured supply, on time delivery and continuous quality improvement. The products will be redesigned using Tower Semiconductor's 0.6um design rules for their double layer metal, single polysilicon gate standard CMOS process. No performance changes are expected for the MiniGate(TM) products. All product performance will meet the current datasheet specifications. Tower Semiconductor is a high volume Silicon supplier for flash memory, image sensors, mixed signal and standard CMOS products. They are located in Migdal Haemek, Israel, and are an ISO9001/QS9000 certified facility. Issue Date: 30 Mar, 2004 Page 1 of 2 Final Product/Process Change Notification #13388 RELIABILITY DATA SUMMARY: Reliability Test Results: SC88A package, 1 lot ea. of 74VHC1GT00, 74VHC1G00, 74VHC1GT08: Test Conditions Results (#fail/total SS) High Temp Op Life TA=150C for 504hrs 0/77, 0/77, 0/77 High Temp Bake 150C for 504 hrs 0/77, 0/77, 0/77 RSH 260C, 10 seconds 0/30, 0/30, 0/30 PC-Temp Cycle -65/+150C for 500 cyc 0/77, 0/77, 0/77 PC-Autoclave 121C/100%RH/15psig for 96hrs 0/77, 0/77, 0/77 PC-HAST 131C/80%RH for 96 hrs 0/77, 0/77, 0/77 PC 168hrs 85C/85%, 3 IR at 260C 0/231, 0/231, 0/231 ELECTRICAL CHARACTERISTIC SUMMARY: All product performance meets current datasheet specifications. Data is available upon request. CHANGED PART IDENTIFICATION: Devices shipped after WW21 2004 may come from either site. AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART M74VHC1GT126DF1G MC74VHC1G09DFT1 MC74VHC1G09DFT1G MC74VHC1G09DFT2 MC74VHC1G09DTT1 MC74VHC1G126DFT1 MC74VHC1G126DFT2 MC74VHC1G126DTT1 MC74VHC1G135DFT1 MC74VHC1G135DFT2 MC74VHC1G135DTT1 MC74VHC1G86DFT1 MC74VHC1G86DFT1G MC74VHC1G86DFT2 MC74VHC1G86DFT2G MC74VHC1G86DTT1 MC74VHC1GT126DF1 MC74VHC1GT126DF2 MC74VHC1GT126DT1 MC74VHC1GT86DFT1 MC74VHC1GT86DFT2 MC74VHC1GT86DTT1 NL17SZ04DFT2 NL17SZ04DFT2G NL17SZ14DFT2 NL17SZ14DFT2G NL17SZ16DFT2 NLVVHC1G86DFT2 NLVVHC1GT126DF1 NLVVHC1GT126DF2 Issue Date: 30 Mar, 2004 Page 2 of 2