CYP15G0101DXB Evaluation Board User’s Guide Cypress Semiconductor Corporation • 3901 North First Street • San Jose, CA 95134 • 408-943-2600 August 12, 2003 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table of Contents 1. Overview ................................................................................................................................................................................. 5 2. Kit Contents ............................................................................................................................................................................ 5 3. Features of the CYP15G0101DXB ........................................................................................................................................ 5 4. Functional Description of CYP15G0101DXB ....................................................................................................................... 6 5. Board Layout, Photograph and Pin Descriptions ............................................................................................................... 8 6. Test Modes ........................................................................................................................................................................... 13 6.1 Adjusting Settings on the Board .......................................................................................................................................14 6.2 BIST Test Set-up .................................................................................................................................................................15 6.2.1 BIST Internal Loopback Mode ....................................................................................................................................... 15 6.2.1.1 Equipment Required .................................................................................................................................................... 15 6.2.1.2 Test Equipment Set-up .................................................................................................................................................16 6.2.1.3 Test Set-up ................................................................................................................................................................... 16 6.2.2 BIST External Loopback Mode ...................................................................................................................................... 18 6.2.2.1 Equipment Required .................................................................................................................................................... 18 6.2.2.2 Test Set-up ................................................................................................................................................................... 18 6.3 Parallel Data In – Parallel Data Out Mode .........................................................................................................................19 6.3.1 Encoded Mode ................................................................................................................................................................ 19 6.3.1.1 Equipment Required .................................................................................................................................................... 19 6.3.1.2 Test Set-up ................................................................................................................................................................... 19 6.3.1.3 Result Verification ....................................................................................................................................................... 20 6.3.2 Unencoded Mode (Parallel-In – Parallel-Out) ............................................................................................................... 20 6.3.2.1 Equipment Required .................................................................................................................................................... 20 6.3.2.2 Test Set-up ................................................................................................................................................................... 20 6.3.2.3 Result Verification ....................................................................................................................................................... 22 6.3.3 Operational Variations for Parallel-In–Parallel-Out Mode ........................................................................................... 22 6.3.3.1 Equipment Required .................................................................................................................................................... 22 6.3.3.2 Test Set-up and Result Verification ........................................................................................................................... 22 7. Schematic Diagram, PCB Layout, and Bill of Materials (BOM) ....................................................................................... 23 Appendix A. Schematic Diagram of CYP15G0101DXB Evaluation Board .......................................................................... 24 Appendix B. PCB Layout for CYP15G0101DXB Evaluation Board ..................................................................................... 30 Appendix C. Bill Of Materials (BOM) CYP15G0101DXB Evaluation Board ......................................................................... 39 2 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide List of Figures Figure 1. CYP15G0101DXB Transmitter Section Block Diagram .......................................................................................... 6 Figure 2. CYP15G0101DXB HOTLink II™ Block Diagram ...................................................................................................... 6 Figure 3. CYP15G0101DXB Receiver Section Block Diagram ............................................................................................... 7 Figure 4. CYP15G0101DXB-EVAL Skeletal View ..................................................................................................................... 8 Figure 5. Pin Description of CYP15G0101DXB-EVAL ............................................................................................................. 9 Figure 6. The BIST Mode Operation ....................................................................................................................................... 13 Figure 7. Control Switches for Test Set-up ........................................................................................................................... 14 Figure 8. Controlling REFCLK Settings ................................................................................................................................. 14 Figure 9. Controlling SWT1 Dip Switches Settings .............................................................................................................. 15 Figure 10. Controlling JT7 Pins Settings ............................................................................................................................... 15 Figure 11. Pictorial Representation of the Internal BIST Set-up ......................................................................................... 16 Figure 12. Signal on RXST1 when BIST is Successful ......................................................................................................... 17 Figure 13. The Eye Diagram through the Signal Analyzer ................................................................................................... 18 Figure 14. Coaxial Cable Connection for External BIST Mode ............................................................................................ 18 Figure 15. Generated Clock, Data and Control Signal from DG2020 .................................................................................. 19 Figure 16. Adding Two Framing Characters to Data Stream ............................................................................................... 22 Figure 17. CYP15G0101DXB-EVAL Top Level Schematics .................................................................................................. 25 Figure 18. CYP15G0101DXB-EVAL Terminated Transmitter & Receiver Blocks ............................................................... 26 Figure 19. CYP15G0101DXB-EVAL Terminated Control Signals Block .............................................................................. 27 Figure 20. CYP15G0101DXB-EVAL Transmit and Receive Clock Schematics .................................................................. 28 Figure 21. CYP15G0101DXB-EVAL Input Power Schematics .............................................................................................. 29 Figure 22. CYP15G0101DXB-EVAL Top Layout .................................................................................................................... 31 Figure 23. CYP15G0101DXB-EVAL Bottom Layout .............................................................................................................. 32 Figure 24. CYP15G0101DXB-EVAL Top Layer Silk Layout .................................................................................................. 33 Figure 25. CYP15G0101DXB-EVAL Bottom Layer Silk Layout ............................................................................................ 34 Figure 26. CYP15G0101DXB-EVAL Top Layer Solder Mask Layout ................................................................................... 35 Figure 27. CYP15G0101DXB-EVAL Bottom Layer Solder Mask Layout ............................................................................. 36 Figure 28. CYP15G0101DXB-EVAL Power Plane Layout ..................................................................................................... 37 Figure 29. CYP15G0101DXB-EVAL Ground Plane Layout ................................................................................................... 38 3 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide List of Tables Table 1. Description of Connectors of the CYP15G0101DXB Evaluation Board ............................................................... Table 2. Description of Control Pins in JT7 ........................................................................................................................... Table 3. The High, Mid, and Low Levels on JT32 .................................................................................................................. Table 4. The Levels of Different Static Signals on JT7 for BIST Mode ............................................................................... Table 5. Channel Enabling Controls ...................................................................................................................................... Table 6. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Encoded) ............................................ Table 7. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Unencoded) ........................................ Table 8. Output Register Bit Assignments ............................................................................................................................ Table 9. Input Register Bit Assignments ............................................................................................................................... Table 10. Operation Specification of CYP15G0101DXB Eval Board ................................................................................... Table 11. CYP15G0101DXB Eval Board Bill Of Materials ..................................................................................................... 10 11 15 16 17 20 21 21 21 23 40 4 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 1. Overview The CYP15G0101DXB single-channel HOTLink II™ Transceiver is a point-to-point or point-to-multipoint communications building block allowing the transfer of data over high-speed serial links at signaling speeds ranging from 195 to 1500 MBaud. This document describes the operation and interface of the CYP15G0101DXB evaluation board. The evaluation board allows users to become familiar with the functionality of the CYP15G0101DXB. Figure 4 gives a skeletal view of the evaluation board. 2. Kit Contents • CYP15G0101DXB evaluation board (CYP15G0101DXB-EVAL) • Dear Customer letter • a CD containing — CYP15G0101DXB data sheet — CYP15G0101DXB-EVAL user’s guide — HOTLink II application notes — BSDL model — CYP15G0101_EVAL.PDA. 3. Features of the CYP15G0101DXB • Second-generation HOTLink® technology • GbE-, FC-, ESCON-®, DVB-ASI-, SMPTE259-, and SMPTE292-compliant • 8B/10B-coded or 10-bit unencoded • Selectable parity check/generate • Selectable input clocking options • Selectable output clocking options • MultiFrame™ receive framer provides alignment to — Bit, byte, half-word, word, multi-word — COMMA or Full K28.5 detect — Single or multi-byte framer for byte alignment — Low-latency option • Skew alignment support for multiple bytes of offset • Synchronous LVTTL parallel input interface • Synchronous LVTTL parallel output interface • 195-to-1500 MBaud serial signaling rate • Internal PLLs with no external PLL components • Dual differential PECL-compatible serial inputs • Dual differential PECL-compatible serial outputs • JTAG Boundary Scan • Built In Self Testing (BIST) for at-speed link testing • Link Quality Indicator • Low power (1W typical) • 100-ball BGA • 0.25µ BICMOS technology 5 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 4. Functional Description of CYP15G0101DXB Figure 2 shows the block diagram of CYP15G0101DXB, which has a pair of transmit and receive channels. Figure 1 shows the transmitter section of CYP15G0101DXB. CHARACTER-RATE TRANSMIT PLL CLOCK MULTIPLIER TXRATE BIT-RATE CLOCK BISTLE SPDSEL 2 TXOP TXCT[1:0] 8 2 OELE 8 12 12 BIST LFSR 8B/10B TXD[7:0] 12 OUTPUT ENABLE LATCH 4 PARITY CHECK SCSEL INPUT REGISTER TXCKSEL TXPER BOE[7:0] RBIST BIST ENABLE LATCH TRANSMIT MODE PHASE-ALIGN BUFFER TXMODE[1:0] CLOCK 10 SHIFTER CHARACTER-RATE TXCLKO+ TXCLKO– CLOCK OUT1+ OUT1– OUT2+ OUT2– H M L TXLB TXCLK TXRST PARITY CONTROL PARCTL RXST[2:0] RXD[7:0] TXCT[1:0] TXD[7:0] Figure 1. CYP15G0101DXB Transmitter Section Block Diagram X10 x11 Phase-Align Buffer Elasticity Buffer Encoder 8B/10B Decoder 8B/10B Framer Deserializer Serializer IN1± OUT2± OUT1± IN2± RX TX Figure 2. CYP15G0101DXB HOTLink II™ Block Diagram 6 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 3 shows the receive section of the CYP15G0101DXB. The serial data input passes through the framer (where the recovered bit stream is framed to framing character), the 10B/8B Decoder and the elasticity buffer. RX-PLL Enable LATCH PARITY CONTROL CLOCK & DATA RECOVERY PLL TXLBA FRAMCHAR RFEN RFMODE 10B/8B BIST IN2+ IN2– FRAMER IN1+ IN1– SHIFTER RECEIVE SIGNAL MONITOR CLOCK SELECT TDO LFI ELASTICITY BUFFER SDASEL LPEN INSEL TMS TCLK TDI JTAG BOUNDARY SCAN CONTROLLER CHARACTER RATE CLOCK OUTPUT REGISTER RXLE BOE[7:0] .. 2 8 3 RXD[7:0] RXOP RXST[2:0] RXCLK+ RXCLK– RBIST DECMODE RXCKSEL RXMODE RXRATE Figure 3. CYP15G0101DXB Receiver Section Block Diagram 7 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 5. Board Layout, Photograph and Pin Descriptions Figure 4 shows the skeletal view of the CYP15G0101DX board. Figure 4. CYP15G0101DXB-EVAL Skeletal View 8 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 5 shows the different connectors and pins of the evaluation board for CYP15G0101DXB. Figure 5. Pin Description of CYP15G0101DXB-EVAL 9 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 1 gives a brief description of the connectors of the evaluation board. Table 1. Description of Connectors of the CYP15G0101DXB Evaluation Board Connectors JT1, JT2 Signals SERIN1+ Description SMA Connectors for SERIN± (one pair per primary input) • PECL compatible primary differential serial data inputs • Routed through 50-ohm Impedance • AC coupling capacitors present • 100-ohm differential Load present JT3, JT4 SEROUT1+ SMA connectors for SEROUT+ (one pair per primary output) • CML compatible primary differential serial data outputs • Routed through 50-ohm Impedance • AC coupling capacitors present JT7 RX and TX side Control Signals Please refer to Table 2: Description of Control Pins in JT7 on page 11. JT8 VCC Banana Jack JT13 GND Banana Jack DT1 Power On Indicator Indicates if the power supply is ON. The LED glows when the power supply goes ON. JT11 JTAG Interface Note: For CYP15G0101DXB, there is no dedicated JTAG reset. The JTAG logic will be reset on power-on. JT10 TXD[7:0] TXCT[1:0] TXOP LVTTL Input TXD[7:0] Power Supply • +3.3 V DC • Ground • Transmit Data Input • 50 Ohms Impedance terminated to 50 ohms load TXCT[1:0] • Transmit control signals TXOP • Transmit Path Odd parity JT9 Clock Outputs and Controls • TXPER • RXCLK* • RXCLK • TXCLK • XTAL_EN — A shunt across this implies that the onboard crystal clock is disabled. • XTAL_OUT — A shunt across this implies that the crystal clock on the board is used as REFCLK. • REFCLK — A shunt across this implies that external REFCLK is used. The external REFCLK inputs are JT12 and JT14. • REFCLK* • TXCLKO • TXCLKO* 10 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 1. Description of Connectors of the CYP15G0101DXB Evaluation Board (continued) Connectors Signals Description JT12 REFCLK JT14 REFCLK* External differential Reference clock. For single ended REFCLK input, apply an LVTTL clock signal to REFCLK input in JT12. DT2 LFI LED Indicator SWT1 BOE[1:0] RXLE OELE BISTLE TRSTZ BOE • BIST, serial output, and receive channel enables. • LVTTL Input RXLE (Receive channel enable latch enable) • Active HIGH OELE (Serial output driver enable latch enable) • Active HIGH BISTLE (Transmit and Receive BIST Latch Enable) • Active HIGH TRSTZ • Active LOW JT5 Optical Controls Controls for optical modules XT1 The optical Interface Options for small form factor pluggable (SFP) optical modules. JT6 RXD[7:0] RXST[2:0] RXOP LVTTL Output RXD[7:0] • Receive Data output RXST[2:0] • Receive Parallel Status output RXOP • Receive Path Odd parity UT1 CYP15G0101DXB Table 2 gives a detailed description of all the control pins in JT7. Many of the static control signals are of 3-level select. This means that they operate at three voltage levels, which are termed as • HIGH (Direct connection to VCC) • MID (Open or allowed to float) • LOW (Direct connection to VSS, i.e., GND). In JT7 on the Eval board, these levels are implemented as follows: • HIGH – Place a shunt across columns 1 and 2 • MID – Don’t place any shunt • LOW – Place a shunt across columns 2 and 3. Table 2. Description of Control Pins in JT7 Pin Name TXMODE0, TXMODE1 Characteristics Transmit mode (two inputs) 3-Level Select • Configure LL for Encoder bypass • LM and LH are reserved for testing (we will be using LM in our tests) • All other combinations along with the selection of SCSEL are for encoder control. (Please refer to the data sheet for more details.) TXCKSEL Transmit Clock Select (1 input) 3-Level Select • When L, REFCLK is used by all the input registers. • When M or H, TXCLK is used. 11 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 2. Description of Control Pins in JT7 (continued) Pin Name TXRATE Characteristics LVTTL Input • When H, the transmit PLL multiplies REFCLK by 20 to generate the bit rate clock. • When L, the transmit PLL multiplies REFCLK by 10 to generate the bit rate clock. SCSEL Special Character Select LVTTL Input Used with the TXMODE[1:0] to • Either encode special characters • Or initiate a word sync sequence TXRST* Transmit Clock Phase Align Buffer Reset Active LOW • L: the Phase-Align Buffer is allowed to adjust its data transfer timing. • H: the internal phase relationship between the TXCLK and the internal character-rate clock is fixed. SPDSEL Serial Rate Select 3-level select • LOW = 195–400 MBd • MID = 400–800 MBd • HIGH = 800–1500 MBd SDASEL Signal Detect Amplitude Level Select 3-Level Select • LOW = 140 mV peak-peak differential • MID = 280 mV peak-peak differential • HIGH = 420 mV peak-peak differential PARCTL Parity check/generate control 3-Level Select • LOW = Parity checking is disabled • MID = If encoder/decoder is enabled, inputs are checked for odd parity • HIGH = If encoder/decoder is enabled, inputs are checked for odd parity RXMODE Receive Operating Mode. This input selects one of two RXST channel status reporting modes. • L: Status A selected • M: Reserved for Test • H: Status B selected This input is interpreted only when DECMODE is not LOW. RXCKSEL Receive Clock Mode. 3-Level Select • L: Output register is clocked by REFCLK. — RXCLK± presents a buffered/delayed form of REFCLK. • M: Output register is clocked by the recovered clock. — RXCLK+ follows the recovered clock as selected by RXRATE. — The elasticity buffer is bypassed. • H: Invalid State. RFMODE Reframe Mode Select. 3-Level Select Please refer to the data sheet for CYP15G0101DXB for detailed information. FRAMCHAR Framing Character Select. 3-Level select. Please refer to the data sheet for CYP15G0101DXB for detailed information. 12 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 2. Description of Control Pins in JT7 (continued) Pin Name DECMODE Characteristics Decoder Mode Select. 3-Level Select • L: Decoder bypassed • M: Cypress decoder table for special code characters is used. • H: Alternate decoder table for special code characters is used. RXRATE Receive Clock Rate Select. 2-Level Select LVTTL Input • L: RXCLK+ operates at the recovered channel clock rate • H: RXCLK+ operates at HALF the recovered channel clock rate LPEN All-Channel Loop-Back-Enable. LVTTL Input Active HIGH. When HIGH • Transmit serial data is internally routed to receive serial data • All external serial data inputs are ignored When LOW, the transmit data is not looped back to the receive side. RFEN Reframe Enable for all channels. Active HIGH. INSEL Receive Input Channel Selector. LVTTL Input. • HIGH - IN1± input is passed into the CDR circuit • LOW - IN2± input is passed into the CDR circuit For example, if INSEL is selected as HIGH, IN1± input will be passed into the receiver. 6. Test Modes The different test modes discussed in this document are as follows: 1. BIST mode CYP15G0101DXB has the Built-In Self-Test (BIST) capability. The transmit and receive channel contain the BIST Pattern Generator and Checker respectively. Figure 6 shows the BIST mode operation. TX BIST LFSR RX BIST LFSR Int. BIST Parallel Inputs Ignored Ext. BIST Figure 6. The BIST Mode Operation The modes described in this document are: — BIST internal loopback mode — BIST external loopback mode 13 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 2. Parallel Data In and Parallel Data Out mode — Encoded Mode — Unencoded Mode The variations discussed in this document, for this mode are — Parallel-In – Serial-Out Mode. (testing the transmit side) — Different Clock Source (i.e., internal vs. external; different frequency mode, etc.) The detailed description will be comprised of — Equipment required (equipment, cable, etc.) — Test Set-up — Result Verification — Operational Variations 6.1 Adjusting Settings on the Board To successfully run any test, the REFCLK, SWT1(BOE[0:1]), JT7 and the REFCLK INT/EXT selector (JT9) on the board must be correctly configured. This section of the user guide gives some directions on how to read the settings on the board. Shown in Figure 7 is a review of the control switches that you may use in the test set-up. JT7 pins (3-levels) SWT1 dip switches JT9 REFCLK INT/EXT selector Figure 7. Control Switches for Test Set-up To run the board either on the internal or the external clock, configure XTAL_EN, XTAL_OUT and REFCLK pins on JT9 shown in Figure 8 accordingly. Shunting XTAL_OUT routes the device clock input to the on-board crystal clock. Ensure the on-board clock is ON by removing any shunts on the XTAL_EN pins. Shunting REFCLK routes the device clock input to the external clock input. To switch from one clock mode to another, simply remove the shunt on the REFCLK pin and replace it onto the desired pin. Ensure the board does not run on both internal and external clock at the same time. (Note: External clock input is located at JT12 or JT14. For single ended REFCLK apply an LVTTL clock signal to REFCLK input in JT12 and leave REFCLK*(JT14) input floating.) shunt here to power down on-board crystal clock shunt here for internal clock shunt here for external clock Figure 8. Controlling REFCLK Settings 14 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide The 2-level dip switches on SWT1 are configured high or low as illustrated in Figure 9. Push this side to set HIGH Push this side to set LOW Figure 9. Controlling SWT1 Dip Switches Settings JT7 pins have 3-level inputs. Identify the column of the JT7 pins using column numbers on the silkscreen. A HIGH setting is achieved by placing a shunt across columns 1 and 2. A LOW setting is achieved by placing a shunt across columns 2 and 3. A MID setting is achieved when there is no shunt placed and the pins are left open. To change settings on a pin, remove the shunt from the original position and follow the instructions in Table 3. This is illustrated in Figure 10. LOW Row number MID (no shunt) HIGH Figure 10. Controlling JT7 Pins Settings Table 3. The High, Mid, and Low Levels on JT32 Instruction High Place a shunt across column 1 and 2 Mid Do not place any shunt Low Place a shunt across column 2 and 3 6.2 BIST Test Set-up 6.2.1 BIST Internal Loopback Mode 6.2.1.1 Equipment Required Equipment needed: • CYP15G0101DXB-EVAL • Instrument-grade power supply 1 Amp @ 3.3V • Oscilloscope (500 MHz or better) • Digital Signal Analyzer. • Multimeter Cable Needed: • SMA-to-SMA coaxial cables • Power supply cables. 15 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 6.2.1.2 Test Equipment Set-up Figure 11 shows the test set-up of BIST. The signal analyzer in the diagram is optional. Signal Analyzer Ext Trigger TXCLKO Input A Input B 3.3V 1.0A Power Supply 3.3V Gnd SEROUT SEROUT* CYP15G0101DX Evaluation Board Oscilloscope Input RXST1 3.3V GND Figure 11. Pictorial Representation of the Internal BIST Set-up 6.2.1.3 Test Set-up The intention of this set-up is to test CYP15G0101DXB in BIST mode. Follow the procedure below for the test set-up. 1. Connect the clock input to the internal clock by placing a shunt across the XTAL_OUT on JT9. 2. Configure the JT7 pins using the following settings in Table 4 by adjusting their shunt position:. Table 4. The Levels of Different Static Signals on JT7 for BIST Mode Signal Level Signal Level Signal Level TXMODE0 LOW SPDSEL HIGH FRAMCHAR HIGH TXMODE1 MID SDASEL LOW DECMODE HIGH TXCKSEL LOW PARCTL LOW RXRATE LOW TXRATE LOW RXMODE LOW LPEN HIGH SCSEL LOW RXCKSEL LOW RFEN HIGH TXRST* HIGH RFMODE MID INSEL HIGH The values of the TXMODE[1:0] have been selected for TX Mode 3. The FRAMECHAR value is HIGH to select K28.5 characters as the framing character. RFMODE is set MID which means that the Cypress-mode multibyte framer is selected. RFEN is HIGH which implies that the framer selected by the RFMODE is enabled. Parity Generation is disabled as PARCTL is LOW. LPEN is HIGH, which indicates that the internal loopback mode is enabled. INSEL is HIGH, which means that the IN1+ are selected. 3. Ensure that RXLE, OELE and BISTLE are all pushed to LOW and all BOEs to HIGH. (SWT1 – Red dip switches) 4. Check that TRSTZ* is pushed to HIGH. (the right most button of the SWT1) 5. Adjust the power supply to 3.3V and 1 amps limit. 6. Apply power on the board. 7. Verify that the power supply LED (DT1) is on. 16 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 8. Toggle TRSTZ* to LOW for a short moment and toggle to HIGH again, which will reset the board. 9. Push RXLE and OELE HIGH and BISTLE to LOW 10.Enable necessary transmit and receive channels by keeping the corresponding BOEs HIGH as shown in Table 5. To perform BIST, enable all channels. Table 5. Channel Enabling Controls Output Controlled (OELE) BIST Channel Enable (BISTLE) BOE[1] OUT2± Transmit X BOE[0] OUT1± Receive Receive BOE Input Receive PLL Channel Enable (RXLE) 11.Push RXLE and OELE to LOW. The corresponding transmit and receive channels should be enabled at this point. 12.At this point, the RXLE, OELE, and BISTLE will be closed (pushed LOW). Now pull the BISTLE HIGH. 13.Then close (LOW) the corresponding BOEs switches for those channels in which BIST is desired. To perform BIST, all the BOEs must set to LOW now. Please refer to Table 5 for details. 14.Push the BISTLE switch to LOW. 15.Verify that the LFI LED (DT2) for the corresponding channels are OFF while the power supply LED (DT1) is still on. 16.The board should already in BIST mode at this time. Verify the oscilloscope display on RXST1 matches with the waveform in Figure 12. Figure 12. Signal on RXST1 when BIST is Successful 17.Verify that RXST2 is always at logic-0 to indicate that there is no BIST error. RXST2 pin is next to the RXST1 pin. 18.With the completion of the above, BIST is successful. The following steps are optional. 19.Check the Serial Out in the BIST mode by following the procedure below. • Change LPEN to LOW on the JT7. Notice that the LFI LED will go ON. • Connect a pair of serial outputs (SEROUTx1/SEROUTx1*) to the digital signal analyzer using SMA cable. • Trigger the signal analyzer by connecting a jumper-to-SMA cable from TXCLKO on JT9 to the trigger input on the analyzer. • Verify on the signal analyzer that the eye diagram looks as shown in Figure 13. Make sure that the eye width is equal to 1-bit period. 17 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 13. The Eye Diagram through the Signal Analyzer 6.2.2 BIST External Loopback Mode 6.2.2.1 Equipment Required Equipment needed is the same as mentioned in Section 6.2.1.1 on page 15. 6.2.2.2 Test Set-up Retain the initial set-up for the Internal BIST set-up as described in Section 6.2.1.3 and then follow the procedures below. 1. Before performing the test, loop a coaxial cable from INx1± to OUTx1± as shown in Figure 14. 2. Continue with the step 1 mentioned in Section 6.2.1.3. 3. Configure the JT32 pins using the same settings mentioned in step 2 of Section 6.2.1.3, except for the following change. Change LPEN from HIGH to LOW in Table 4. 4. Continue with all other subsequent steps in Section 6.2.1.3. Figure 14. Coaxial Cable Connection for External BIST Mode 18 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 6.3 Parallel Data In – Parallel Data Out Mode The intention of this set-up is to test CYP15G0101DXB in parallel-in and parallel-out mode for encoded and unencoded data. 6.3.1 Encoded Mode 6.3.1.1 Equipment Required Equipment needed: • CYP15G0101DXB evaluation board • Instrument-grade power supply 1 Amp @ 3.3V • Parallel Data Generator: DG2020 from Tektronix (settings will be provided by Cypress) • Logic Analyzer: TLA700 series from Tektronix or equivalent • Multimeter. Cable needed: • Two SMA-to-SMA coaxial cables • Power supply cables • DG2020 cables with right connectors • Logic Analyzer cables with right connectors. 6.3.1.2 Test Set-up Follow the procedure below for the test set-up. 1. Load the file CYP15G0101_EVAL.PDA into the DG2020. If you are using your own data generator, use a similar waveform as shown in Figure 15. REFCLK (100 MHz.) [0:7] TXDATA(0.7) 00 01 02 04 08 10 20 40 80 00 FF FE FD FB F7 EF DF BF 7F FF 00 AA 55 AA 55 TXCT0 Figure 15. Generated Clock, Data and Control Signal from DG2020 Note: The CYP15G0101_EVAL.PDA file will be included in the kit. The outputs of the DG2020 for this PDA file are mapped to POD-A bits 0–11. The outputs may need to be remapped for particular test set-ups. Consult the users manual for setting up the DG2020. 2. Connect the TXDATA lines, i.e., TXDATA[7:0] of the data generator to JT10 TXD[7:0] in the proper order. Connect TXCT0 on the data generator to TXCT0 on JT10 on the board. 3. Ground TXCT1 and TXOP on JT10 on the board by shunting them. 4. On the JT9 place shunts across • XTAL_EN (Pin 11 – Pin 12): The on-board crystal clock will be disabled. • REFCLK (Pin 17 – Pin 18): The clock input to JT12 will be used as the clock for the board. 5. Connect the REFCLK output of the DG2020 to the REFCLK input on the board (JT12). 6. Connect the Logic Analyzer TLA700 to read the following receive data lines on JT6, RXD[7:0] and RXST[2:0]. 7. Connect a clock input of the logic analyzer to RXCLK on JT9. The clocking of the logic analyzer needs to set to external. On the TLA 700 series logic analyzer this is done in the “SETUP” window. After selecting external clocking press the “MORE” button to customize your clock's settings. The clock definition needs to be changed to the clock input that you are using. 8. Configure the shunts on JT7 as listed on Table 6. 19 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 6. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Encoded) Signal Level Signal TXMODE0 LOW SPDSEL TXMODE1 MID SDASEL TXCKSEL LOW PARCTL TXRATE LOW RXMODE SCSEL LOW RXCKSEL TXRST* HIGH RFMODE Level HIGH Signal Level FRAMCHAR HIGH LOW DECMODE HIGH LOW RXRATE LOW LOW LPEN HIGH LOW RFEN HIGH MID INSEL HIGH The values of the TXMODE[1:0] have been selected for TX Mode 3. The FRAMECHAR value is HIGH to select K28.5 characters as the framing character. RFMODE is set MID which means that the Cypress-mode multibyte framer is selected. RFEN is HIGH which implies that the framer selected by the RFMODE is enabled. Parity Generation is disabled as PARCTL is LOW. LPEN is HIGH, which indicates that the internal loopback mode is enabled. INSEL is HIGH, which means that the IN1+ are selected. 9. Adjust the voltage and current limit of the power supply to 3.3V and 1 Amp respectively. 10.Apply power to the board. Adjust the voltage across the banana jacks for power supply on the board to 3.3V. Verify that the power LED is ON. 11.Toggle TRSTZ* to LOW for a short moment and toggle to HIGH again, which will reset the board. 12.Push RXLE and OELE HIGH, and BISTLE to LOW 13.Enable necessary transmit and receive channels by keeping the corresponding BOEs HIGH as shown in Table 5. 14.Start transmitting the data from the DG2020. The format of the clock and the data should be as shown in Figure 15 as seen below. Make sure that the data is generated in repeat mode. 15.Press the RUN button on the logic analyzer TLA700. After it has acquired the data, stop the logic analyzer. 6.3.1.3 Result Verification 1. Compare the received data on the logic analyzer and the transmitted data from the DG2020. The data should be same as the transmitted data except for the cycle when TxCTC0 is 1, During this cycle the TXCT[1:0] signals tell the transmitter to ignore the parallel inputs and to send a K28.5 character. Thus in this cycle the receiver will output a K28.5 character, which is not what was presented at the transmitter. 6.3.2 Unencoded Mode (Parallel-In – Parallel-Out) 6.3.2.1 Equipment Required Equipment Needed is same as mentioned in Section 6.3.1.1 on page 19. 6.3.2.2 Test Set-up Retain the test set-up as described in Section 6.3.1.2 on page 19. Now make the following changes to the set-up. 1. The shunts on JT7 should be placed in the following manner. The highlighted texts show the changes made to Table 6 on page 20. 20 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 7. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Unencoded) Signal Level Signal Level Signal Level TXMODE0 LOW SPDSEL HIGH FRAMCHAR HIGH TXMODE1 LOW SDASEL LOW DECMODE LOW TXCKSEL LOW PARCTL LOW RXRATE LOW TXRATE LOW RXMODE LOW LPEN HIGH SCSEL LOW RXCKSEL MID RFEN HIGH TXRST* HIGH RFMODE MID INSEL HIGH The change of TXMODE[1] to LOW implies that the encoder is bypassed, i.e., the data now will be 10-bit instead of eight bits, or the data is considered as pre-encoded. The DECMODE is now LOW, which implies that the decoder is bypassed. 2. The output registers are assigned in a different sequence when the DECMODE is LOW, i.e., when the decoder is bypassed, than when the DECMODE is not equal to LOW. Table 8 shows the sequence in which the bits are arranged from LSB to MSB. Table 8. Output Register Bit Assignments Signal Name DECMODE = LOW DECMODE = MID or HIGH RXST[2] COMDET RXST[2] RXST[1] DOUT[0] RXST[1] RXST[0] DOUT[1] RXST[0] RXD[0] DOUT[2] RXD[0] RXD[1] DOUT[3] RXD[1] RXD[2] DOUT[4] RXD[2] RXD[3] DOUT[5] RXD[3] RXD[4] DOUT[6] RXD[4] RXD[5] DOUT[7] RXD[5] RXD[6] DOUT[8] RXD[6] RXD[7] DOUT[9] RXD[7] Note that when DECMODE is LOW, i.e,. the decoder is bypassed, the signal RXST[1] corresponds to the LSB of the 10-bit data. This is unlike when the decoder is not bypassed, and the signal RXD[0] corresponds to the LSB of the 8-bit data. Similarly, when the DECMODE is LOW, the signal RXD[7] corresponds to the MSB of the 10-bit data. When the decoder is not bypassed, RXD[7] is the MSB of the 8-bit data. This warrants the change in the way the data is viewed in the logic analyzer. The connector for the logic analyzer on the board needs to be reversed in order to see the right data that is being received and therefore, can be compared with the transmit data. The input register bit assignments for the 10-bit unencoded data is shown in Table 9. Note that TXD[0] corresponds to the LSB of the 10-bit value. TXCT[1] corresponds to the MSB of the 10-bit value. Table 9. Input Register Bit Assignments Signal Name Unencoded TXD[0] (LSB) DIN[0] TXD[1] DIN[1] TXD[2] DIN[2] TXD[3] DIN[3] TXD[4] DIN[4] TXD[5] DIN[5] TXD[6] DIN[6] TXD[7] DIN[7] TXCT[0] DIN[8] TXCT[1] (MSB) DIN[9] 21 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide The DG2020 data pattern provided by Cypress does not contain any framing patterns for the unencoded mode. In order for HOTLink to frame the data properly, two consecutive K28.5’s need to be added to the DG2020 pattern. This can be accomplished by extending the data pattern by two clock cycles. Add the two 10-bit K28-5 characters as shown in Figure 16. REFCLK TXCT[1:0], TXDATA[7:0] 055 0AA 17C 055 End of Previous Data Stream 17C Add These Two Fram ing Characters Figure 16. Adding Two Framing Characters to Data Stream 6.3.2.3 Result Verification Follow the verification steps as mentioned in Section 6.3.1.3 on page 20. 6.3.3 Operational Variations for Parallel-In–Parallel-Out Mode 6.3.3.1 Equipment Required Equipment needed is the same as mentioned in Section 6.3.1.1 on page 19. 6.3.3.2 Test Set-up and Result Verification Following are a few variations that can be worked out with the present settings. 1. Parallel In – Serial Out Mode Changes to the set-up described in Section 6.3.1.2 on page 19: • Change LPEN to LOW on the JT7. • Connect a pair of serial output to the digital signal analyzer using SMA cable. • Trigger the signal analyzer by connecting a JT to SMA cable from TXCLKO on JT9 to the trigger input on the analyzer. • Results Verification: • Verify on the signal analyzer that the eye diagram looks perfect as in Figure 13 on page 18. 2. Different Clock Signal The test set-up for using a TXCLK to latch the parallel data into the device instead of REFCLK, is similar to that of the parallel in parallel out mode described in Section 6.3.1.2 on page 19. The following are some of the changes that need to be made. a.Changing the transmit clock select. • By changing TXCKSEL on JT7 to MID, parallel data can be latched into the input registers by using TXCLK instead of the reference clock. Please refer to Table 2: Description of Control Pins in JT7 on page 11 to locate TXCLK signals in the board. A clock should be connected to TXCLK input and this clock must have identical frequency to REFCLK. b.Once dataflow has started, move TXRST* jumper in JT7 from HIGH to LOW and then back to HIGH. This will reset the phase align buffer to absorb the phase differences between the TxCLK and REFCLK. 22 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide 7. Schematic Diagram, PCB Layout, and Bill of Materials (BOM) Figure 17 to Figure 21 in Appendix A shows the schematic diagram of the CYP15G0101DXB-EVAL. Figure 22 to Figure 29 in Appendix B shows the PCB layout of each layer of the CYP15G0101DXB-EVAL. The Bill of Materials (BOM) of the evaluation board is listed in Appendix C in Table 11. Table 10.Operation Specification of CYP15G0101DXB Eval Board Description Operating Voltage Min. Max. Unit 3 3.3 V 0 70 °C Operating Current Operating Temperature A 23 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Appendix A. Schematic Diagram of CYP15G0101DXB Evaluation Board 24 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 17. CYP15G0101DXB-EVAL Top Level Schematics 25 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 18. CYP15G0101DXB-EVAL Terminated Transmitter & Receiver Blocks 26 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 19. CYP15G0101DXB-EVAL Terminated Control Signals Block 27 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 20. CYP15G0101DXB-EVAL Transmit and Receive Clock Schematics 28 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 21. CYP15G0101DXB-EVAL Input Power Schematics 29 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Appendix B. PCB Layout for CYP15G0101DXB Evaluation Board 30 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 22. CYP15G0101DXB-EVAL Top Layout 31 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 23. CYP15G0101DXB-EVAL Bottom Layout 32 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 24. CYP15G0101DXB-EVAL Top Layer Silk Layout 33 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 25. CYP15G0101DXB-EVAL Bottom Layer Silk Layout 34 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 26. CYP15G0101DXB-EVAL Top Layer Solder Mask Layout 35 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 27. CYP15G0101DXB-EVAL Bottom Layer Solder Mask Layout 36 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 28. CYP15G0101DXB-EVAL Power Plane Layout 37 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Figure 29. CYP15G0101DXB-EVAL Ground Plane Layout 38 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Appendix C. Bill Of Materials (BOM) CYP15G0101DXB Evaluation Board 39 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 11.CYP15G0101DXB Eval Board Bill Of Materials Part Name Ref Des Manufacturer MAN_PN Qty CAP-.1UF CB1,CB2,CB5, CB6,CB7,CB8, CB9,CT1,CT6, CT7,CT8,CT9, CT10,CT11 Vishay VJ0805Y104KXJAT 14 CAP-SMDC0805V-2400PF CT2,CT3,CT4, CT5 DIELECTRIC LABORATORIES C08BLBB1X5UX 4 CAPPOL-10UF CB3,CB4,CB10 VISHAY 293D106X9010C2T 3 CLK_HCMOS-LCC197X295P4 UB1 Connor Winfield HSM923-125.00MHZ 1 CYP15G0101DXB_BGA100 UT1 CYPRESS CYP15G0101DXB 1 ECONORESET_SOT23 QT1 DALLAS DS1818R-10 1 ETHR1G_OXCVR-MSA_SFP XT1 STRATOS LIGHTWAVE 437-001 1 HEADER10-HDR100STR2X5 JT11 DIGIKEY MHB10K-ND 1 HEADER26-HDR100STR2X13 JT5,JT6,JT9,JT10 DIGIKEY S2011-13-ND 4 HEADER3X18-HDR100STR JT7 DIGIKEY S2011-18-ND 1 DIGIKEY 929955-06 25 LB1,LB2 VISHAY ILBB-0805 80 25% 2 SHUNT INDUCTOR-10UH JACK-BASE-CONJBANANA JT8,JT13 DIGIKEY J147-ND 2 LED-N/A DT1,DT2 DIGIKEY 67-1316-ND 2 RES0402-0 RT51,RT52,RT57 VISHAY CRCW0402000RT2 3 RES0402-100 RB5,RB9,RB12, RB15,RB17,RT1, RT2,RT5,RT9, RT12,RT14,RT15, RT18,RT20,RT25, RT29,RT30,RT31, RT34,RT35,RT36, RT39,RT41,RT44, RT48,RT58,RT61, RT70,RT71,RT82, RT83 VISHAY CRCW04021000FB02 31 RES0402-1M RT8,RT13,RT19, RT23, RT24,RT26 VISHAY CRCW0402106JRT2 6 RES0402-267 RB13,RB14,RB18, RT6,RT7,RT16, RT17,RT27,RT28, RT37,RT38,RT45, RT46,RT47,RT54, RT56,RT59,RT60, RT63,RT65,RT67, RT69,RT73,RT75, RT77,RT79,RT81 VISHAY CRCW04022670FB02 27 RES0402-365 RB10,RB11,RB16, RT3,RT4,RT10, RT11,RT21,RT22, RT32,RT33,RT40, RT42,RT43,RT49, RT50,RT53,RT55, RT62,RT64,RT66, RT68,RT72,RT74, RT76,RT78,RT80 VISHAY CRCW04023650FB02 27 RES0402-4.7K RB1-RB4,RB6-RB8 VISHAY CRCW0402472JRT2 7 RES0402-390 RT84-RT87 VISHAY CRCW0402391JRT2 4 40 [+] Feedback CYP15G0101DXB Evaluation Board User’s Guide Table 11.CYP15G0101DXB Eval Board Bill Of Materials (continued) Part Name Ref Des Manufacturer MAN_PN Qty SMA_THRU-SMA_TH_VERT JT1-JT4,JT12,JT14 DIGIKEY ARFX1231-ND 6 SWITCH_DIP8 SWT1 GRAYHILL 76SB08S 1 ZENER-5.1V DT3 DIGIKEY 1N4733ADICT-ND 1 ESCON is a registered trademark of IBM. HOTLink is a registered trademark and HOTLink II and MultiFrame are trademarks of Cypress. All product and company names mentioned in this document may be the trademarks of their respective holders. UG001_B approved kkv 08/12/03 © Cypress Semiconductor Corporation, 2001. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges. 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