ONSEMI ADP3208D

ADP3208D
7-Bit, Programmable,
Dual-Phase, Mobile, CPU,
Synchronous Buck
Controller
The ADP3208D is a highly efficient, multiphase, synchronous buck
switching regulator controller. With its integrated drivers, the
ADP3208D is optimized for converting the notebook battery voltage
into the core supply voltage required by high performance Intel
processors. An internal 7−bit DAC is used to read a VID code directly
from the processor and to set the CPU core voltage to a value within
the range of 0.3 V to 1.5 V. The phase relationship of the output signals
ensures interleaved 2−phase operation.
The ADP3208D uses a multi−mode architecture run at a
programmable switching frequency and optimized for efficiency
depending on the output current requirement. The ADP3208D
switches between single− and dual−phase operation to maximize
efficiency with all load conditions. The chip includes a programmable
load line slope function to adjust the output voltage as a function of the
load current so that the core voltage is always optimally positioned for
a load transient. The ADP3208D also provides accurate and reliable
short−circuit protection, adjustable current limiting, and a delayed
power−good output. The IC supports On−The−Fly (OTF) output
voltage changes requested by the CPU.
The ADP3208D is specified over the extended commercial
temperature range of −10°C to 100°C and is available in a 48−lead
LFCSP.
Features
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LFCSP48
CASE 932AD
MARKING DIAGRAM
ADP3208D
AWLYYWWG
A
WL
YYWW
G
= Assembly Location
= Wafer Lot
= Date Code
= Pb−Free Package
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 36 of this data sheet.
• Single−Chip Solution
• Fully Compatible with the Intel® IMVP−6+t
• Short−Circuit Protection with Latchoff Delay
• Clock Enable Output Delays the CPU Clock Until the
• Integrated MOSFET Drivers
• Input Voltage Range of 3.3 V to 22 V
• Selectable 1− or 2−Phase Operation with Up to 1 MHz
• Output Load Current Monitor
• This is a Pb−Free Device
Specifications
•
•
•
•
•
•
•
Core Voltage is Stable
Applications
per Phase Switching Frequency
Guaranteed ±8 mV Worst−Case Differentially Sensed
Core Voltage Error Overtemperature
Automatic Power−Saving Mode Maximizes Efficiency
with Light Load During Deeper Sleep Operation
Soft Transient Control Reduces Inrush Current and
Audio Noise
Active Current Balancing Between Output Phases
Independent Current Limit and Load Line Setting
Inputs for Additional Design Flexibility
Built−In Power−Good Blanking Supports Voltage
Identification (VID) OTF Transients
7−Bit, Digitally Programmable DAC with 0.3 V to
1.5 V Output
© Semiconductor Components Industries, LLC, 2010
February, 2010 − Rev. 0
• Notebook Power Supplies for Next Generation
Intel® Processors
1
Publication Order Number:
ADP3208D/D
ADP3208D
GND VCC EN
RPM RT RAMP
BST1
UVLO
Shutdown
and Bias
COMP
+
Σ
REF
LLINE
+
VEA
−
+
CSREF
+
Σ
Oscillator
_
1.7V
DRVH1
Driver
Logic
Current
Balancing
Circuit
−
+
FB
VARFREQ SP
SW1
PVCC1
DRVL1
PGND1
OVP
BST2
DRVH2
PSI
SW2
Thermal
Throttle
Control
TTSNS
VRTT
PVCC2
DRVL2
PGND2
DAC − 200mV
DAC − 300mV
CLKEN
FBRTN
−
+
PWRGD
Startup
Delay
PWRGD
Open
Drain
Precision
Reference
VID0
+
−
IMON
CSREF
CSSUM
CSCOMP
ILIMN
ILIMP
DAC
VID2
VID1
VID3
VID4
DPRSLP
Delay
Disable
CLKEN
Startup
Delay
VID
DAC
DPRSTP
Current
Monitor
Soft
Transient
Delay
CLKEN
Open
Drain
VID6
VID5
Current
Limit
Circuit
DPRSTP
DPRSLP
Logic
REF
Soft−Start
Soft Transient
IREF
CSREF
PWRGD
OCP
Shutdown
Delay
−
+
Figure 1. Functional Block Diagram
ABSOLUTE MAXIMUM RATINGS
Rating
Unit
VCC, PVCC1, PVCC2
Parameter
−0.3 to +6.0
V
FBRTN, PGND1, PGND2
−0.3 to +0.3
V
BST1, BST2
DC
t < 200 ns
−0.3 to +28
−0.3 to +33
BST1 to SW1, BST2 to SW2
−0.3 to +6.0
SW1, SW2
DC
t < 200 ns
−5.0 to +22
−10 to +28
DRVH1 to SW1, DRVH2 to SW2
−0.3 to +6.0
DRVL1 to PGND1, DRVL2 to PGND2
DC
t < 200 ns
−0.3 to +6.0
−5.0 to +6.0
V
V
V
V
V
RAMP (In Shutdown) DC
−0.3 to +22
All Other Inputs and Outputs
−0.3 to +6.0
V
V
Storage Temperature
−65 to +150
°C
Operating Ambient Temperature Range
−10 to 100
°C
Operating Junction Temperature
125
°C
Thermal Impedance (qJA) 2−Layer Board
40
°C/W
Lead Temperature
Soldering (10 sec)
Infrared (15 sec)
300
260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
NOTE: This device is ESD sensitive. Use standard ESD precautions when handling.
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2
ADP3208D
TEST CIRCUITS
7-BIT CODE
5.0 V
ADP3208D
PWRGD
SP
VCC
VID6
VID4
VID5
VID3
VID1
VID2
PSI
VID0
EN
DPRSLP
1
1.05 V
DPRSTP
48
37 VCC
DRVH1
SW1
NC
CLKEN#
PVCC1
FB
DRVL1
FBRTN
DRVL2
NC
PVCC2
1 kW
18
CSSUM
CSREF
+
GND
ILIMP
RT
ILIMN
RAMP
CSSUM
1.0 V
24 GND
80 kW
-
BST2
CSREF
LLINE
IREF
TTSNS
CSCOMP
VRTT
CSCOMP
100 nF
19
SW2
DRVH2
VARFREQ
IMON
39 k W
PGND2
NC
RPM
17
PGND1
ADP3208D
COMP
1 kW
5.0 V
BST1
Vos =
CSCOMP - 1.0 V
40 V
20 kW
100 nF
Figure 2. Closed−Loop Output Voltage Accuracy
Figure 3. Current Sense Amplifier, VOS
ADP3208D
5.0 V
37 VCC
7
10 k W
6
COMP
FB
+
16
ΔV
18
LLINE
CSREF
VID DAC
1.0 V
24 GND
D VFB = FBDV = V − FBDV=0mV
Figure 4. Positioning Accuracy
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3
ADP3208D
PIN FUNCTION DESCRIPTIONS
Pin No
Mnemonic
1
EN
2
PWRGD
Description
Enable Input. Driving this pin low shuts down the chip, disables the driver outputs, pulls PWRGD and VRTT
low, and pulls CLKEN high.
Power−Good Output. Open−drain output. A low logic state means that the output voltage is outside of the
VID DAC defined range.
3
NC
4
CLKEN
Not Connected.
Clock Enable Output. Open−drain output. A low logic state enables the CPU internal PLL clock to lock to the
external clock.
5
FBRTN
Feedback Return Input/Output. This pin remotely senses the CPU core voltage. It is also used as the ground
return for the VID DAC and the voltage error amplifier blocks.
6
FB
7
COMP
Voltage Error Amplifier Feedback Input. The inverting input of the voltage error amplifier.
Voltage Error Amplifier Output and Frequency Compensation Point.
8
NC
9
IRPM/NC
Not Connected.
RPM Mode Timing Control Input. A resistor between this pin or RPM pin to ground sets the RPM mode
turn−on threshold voltage. If a resistor is connected between this pin to ground, RPM pin must remain
floating and not connected.
10
VARFREQ
Variable Frequency Enable Input. A high logic state enables the PWM clock frequency to vary with VID code.
11
VRTT
12
TTSNS
13
IMON
Current Monitor Output. This pin sources a current proportional to the output load current. A resistor to
FBRTN sets the current monitor gain.
14
RPM
RPM Mode Timing Control Input. A resistor between this pin or IRPM pin to ground sets the RPM mode
turn−on threshold voltage. If a resistor is connected between this pin to ground, IRPM pin must remain
floating.
15
IREF
This pin sets the internal bias currents. A 80 kW resistor is connected from this pin to ground.
16
LLINE
Load Line Programming Input. The center point of a resistor divider connected between CSREF and
CSCOMP can be tied to this pin to set the load line slope.
17
CSCOMP
18
CSREF
Current Sense Reference Input. This pin must be connected to the common point of the output inductors.
The node is shorted to GND through an internal switch when the chip is disabled to provide soft stop
transient control of the converter output voltage.
19
CSSUM
Current Sense Summing Input. External resistors from each switch node to this pin sum the inductor currents
to provide total current information.
20
RAMP
PWM Ramp Slope Setting Input. An external resistor from the converter input voltage node to this pin sets
the slope of the internal PWM stabilizing ramp used for phase−current balancing.
21
ILIMN
Current Limit Set. An external resistor from ILIMN to ILIMP sets the current limit threshold of the converter.
22
ILIMP
Current Limit Set. An external resistor from ILIMN to ILIMP sets the current limit threshold of the converter.
23
RT
PWM Oscillator Frequency Setting Input. An external resistor from this pin to GND sets the PWM oscillator
frequency.
24
GND
Analog and Digital Signal Ground.
25
BST2
High−Side Bootstrap Supply for Phase 2. A capacitor from this pin to SW2 holds the bootstrapped voltage
while the high−side MOSFET is on.
26
DRVH2
27
SW2
28
PVCC2
Power Supply Input/Output of Low−Side Gate Driver for Phase 2.
29
DRVL2
Low−Side Gate Drive Output for Phase 2.
30
PGND2
Low−Side Driver Power Ground for Phase 2.
Voltage Regulator Thermal Throttling Output. Logic high state indicates that the voltage regulator
temperature at the remote sensing point exceeded a set alarm threshold level.
Thermal Throttling Sense and Crowbar Disable Input. A resistor divider where the upper resistor is
connected to VCC, the lower resistor (NTC thermistor) is connected to GND, and the center point is
connected to this pin and acts as a temperature sensor half bridge. Connecting TTSNS to GND disables the
thermal throttling function and disables the crowbar, or Overvoltage Protection (OVP), feature of the chip.
Current Sense Amplifier Output and Frequency Compensation Point.
High−Side Gate Drive Output for Phase 2.
Current Balance Input for Phase 2 and Current Return for High−Side Gate Drive.
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4
ADP3208D
Pin No
Mnemonic
31
PGND1
Low−Side Driver Power Ground for Phase 1.
Description
32
DRVL1
Low−Side Gate Drive Output for Phase 1.
33
PVCC1
Power Supply Input/Output of Low−Side Gate Driver for Phase 1.
34
SW1
35
DRVH1
36
BST1
High−Side Bootstrap Supply for Phase 1. A capacitor from this pin to SW1 holds the bootstrapped voltage
while the high−side MOSFET is on.
37
VCC
Power Supply Input/Output of the Controller.
Current Balance Input for Phase 1 and Current Return For High−Side Gate Drive.
High−Side Gate Drive Output for Phase 1.
SP
VID6 to
VID0
Single−Phase Select Input. Logic high state sets single−phase configuration.
Voltage Identification DAC Inputs. A 7−bit word (the VID code) programs the DAC output voltage, the
reference voltage of the voltage error amplifier without a load (see the VID code Table 3).
46
PSI
Power State Indicator Input. Driving this pin low forces the controller to operate in single−phase mode.
47
DPRSTP
Deeper Stop Control Input. The logic state of this pin is usually complementary to the state of the DPRSLP
pin; however, during slow deeper sleep exit, both pins are logic low.
48
DPRSLP
Deeper Sleep Control Input.
DPRSLP
DPRSTP
PSI
VID0
VID1
VID2
VID3
VID4
VID5
VID6
SP
VCC
38
39 to
45
1
ADP3208D
IMON
RPM
IREF
LLINE
CSCOMP
CSREF
CSSUM
RAMP
ILIMIN
ILIMP
RT
GND
EN
PWRGD
NC
CLKEN
FBRTN
FB
COMP
NC
IRPM/NC
VARFREQ
VRTT
TTSNS
Figure 5. Pin Configuration
(Top View)
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5
BST1
DRVH1
SW1
PVCC1
DRVL1
PGND1
PGND2
DRVL2
PVCC2
SW2
DRVH2
BST2
ADP3208D
ELECTRICAL CHARACTERISTICS VCC = PVCC1 = PVCC2 = BST1 = BST2 = High = 5.0V, FBRTN = GND = SW1 = SW2 = PGND1
= PGND2 = Low = 0 V, EN = VATFREQ = High, DPRSLP = 0 V, PSI = 1.05 V, VVID = 1.2000 V, TA = −40°C to 100°C, unless otherwise
noted (Note 1). Current entering a pin (sunk by the device) has a positive sign. RREF = 80 kW.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VOLTAGE CONTROL − Voltage Error Amplifier (VEAMP)
FB, LLINE Voltage Range
(Note 2)
VFB, VLLINE
Relative to CSREF = VDAC
−200
+200
mV
FB, LLINE Offset Voltage
(Note 2)
VOSVEA
Relative to CSREF = VDAC
−0.5
+0.5
mV
−100
100
A
−82
mV
FB LLINE Bias Current
(Note 2)
LLINE Positioning Accuracy
IFB
VFB − VVID
Measured on FB relative to VVID, LLINE
forced 80 mV below CSREF
−78
0.85
COMP Voltage Range
VCOMP
Operating Range
COMP Current
ICOMP
COMP = 2.0 V, CSREF = VDAC
FB forced 200 mV below CSREF
FB forced 200 mV above CSREF
SRCOMP
CCOMP = 10 pF, CSREF = VDAC,
Open loop configuration
FB forced 200 mV below CSREF
FB forced 200 mV above CSREF
COMP Slew Rate
Gain Bandwidth (Note 2)
GBW
−80
4.0
V
mA
−0.75
6.0
V/ms
15
−20
Non−inverting unit gain configuration,
RFB = 1 kW
20
MHz
VID DAC VOLTAGE REFERENCE
VDAC Voltage Range (Note 3)
VDAC Accuracy
See VID Code Table
VFB − VVID
0
Measured on FB (includes offset),
relative to VVID, for VID table see Table 3,
VVID = 1.2125 V to 1.5000 V
VVID = 0.3000 V to 1.2000 V
VDAC Differential Non−linearity (Note 2)
VDAC Line Regulation
VDAC Boot Voltage (Note 2)
DVFB
VBOOTFB
1.5
V
mV
−9.0
−7.5
+9.0
+7.5
−1.0
+1.0
LSB
VCC = 4.75 V to 5.25 V
0.05
%
Measured during boot delay period
1.200
V
Soft−Start Delay (Note 2)
tDSS
Measured from EN pos edge to FB = 50 mV
200
ms
Soft−Start Time
tSS
Measured from EN pos edge to FB settles to
VBOOT = 1.2 V within −5%
1.7
ms
tBOOT
Measured from FB settling to VBOOT = 1.2 V
within −5% to CLKEN neg edge
150
ms
0.0625
0.25
LSB/ms
Boot Delay
VDAC Slew Rate
FBRTN Current
Soft−Start
Non−LSB VID step, DPRSLP = H,
Slow C4 Entry/Exit
Non−LSB VID step, DPRSLP = L,
Fast C4 Exit
1.0
IFBRTN
90
200
−360
−360
−300
−300
−240
−160
mA
VOLTAGE MONITORING AND PROTECTION − Power Good
CSREF Undervoltage
Threshold
VUVCSREF
Relative to DAC Voltage:
CSREF Overvoltage
Threshold
VOVCSREF
Relative to nominal DAC Voltage
150
200
250
mV
CSREF Crowbar Voltage
Threshold
VCBCSREF
Relative to FBRTN
1.57
1.7
1.78
V
CSREF Reverse Voltage
Threshold
VRVCSREF
Relative to FBRTN, Latchoff mode:
CSREF Falling
CSREF Rising
−350
−300
−70
= 0.5 V to 1.5 V
= 0.3 V to 0.4875 V
1. All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
3. Timing is referenced to the 90% and 10% points, unless otherwise noted.
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6
mV
mV
−5.0
ADP3208D
ELECTRICAL CHARACTERISTICS VCC = PVCC1 = PVCC2 = BST1 = BST2 = High = 5.0V, FBRTN = GND = SW1 = SW2 = PGND1
= PGND2 = Low = 0 V, EN = VATFREQ = High, DPRSLP = 0 V, PSI = 1.05 V, VVID = 1.2000 V, TA = −40°C to 100°C, unless otherwise
noted (Note 1). Current entering a pin (sunk by the device) has a positive sign. RREF = 80 kW.
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
50
150
mV
0.1
mA
VOLTAGE MONITORING AND PROTECTION − Power Good
PWRGD Low Voltage
VPWRGD
IPWRGD(SINK) = 4 mA
PWRGD High, Leakage
Current
IPWRGD
VPWRDG = 5.0 V
PWRGD Startup Delay
TSSPWRGD
PWRGD Latchoff Delay
Measured from CLKEN neg edge to
PWRGD Pos Edge
8.0
ms
TLOFFPWRGD
Measured from Out−off−Good−Window
event to Latchoff (switching stops)
8.0
ms
TPDPWRGD
Measured from Out−off−Good−Window
event to PWRGD neg edge
200
ns
Measured from Crowbar event to Latchoff
(switching stops)
200
ns
PWRGD Masking Time
Triggered by any VID change or OCP event
100
ms
CSREF Soft−Stop
Resistance
EN = L or Latchoff condition
70
W
PWRGD Propagation Delay
(Note 3)
Crowbar Latchoff Delay
(Note 2)
TLOFFCB
CURRENT CONTROL − Current Sense Amplifier (CSAMP)
CSSUM, CSREF Common−Mode Range
(Note 2)
Voltage range of interest
CSSUM, CSREF Offset
Voltage
VOSCSA
TA = 25°C
CSREF − CSSUM, TA = −10°C to 85°C
CSREF − CSSUM, TA = −40°C to 85°C
CSSUM Bias Current
IBCSSUM
CSREF Bias Current
IBCSREF
0
2.0
V
−0.5
−1.7
−1.8
+0.5
+1.7
+1.8
mV
−50
+50
nA
−120
+120
nA
0.05
2.0
V
CSCOMP Voltage Range (Note 2)
Operating Range
CSCOMP Current
CSCOMP = 2.0 V
CSSUM forced 200 mV below CSREF
CSSUM forced 200 mV above CSREF
−750
1.0
CCSCOMP = 10 pF, Open Loop Configuration
CSSUM forced 200 mV below CSREF
CSSUM forced 200 mV above CSREF
10
−10
ICSCOMPsource
ICSCOMPsink
CSCOMP Slew Rate
Gain Bandwidth (Note 2)
GBWCSA
Non−inverting unit gain configuration
RFB = 1 kW
mA
mA
V/ms
20
MHz
CURRENT MONITORING AND PROTECTION
Current Reference
IREF Voltage
Current Limiter (OCP)
Current Limit Threshold
Current Limit Latchoff Delay
VREF
VLIMTH
RREF = 80 kW to set IREF = 20 mA
Measured from CSCOMP to CSREF,
RLIM = 4.5 kW,
2−ph configuration, PSI = H
2−ph configuration, PSI = L
1−ph configuration
Measured from CSCOMP to CSREF,
RLIM = 4.5 kW,
3−ph configuration, PSI = H
3−ph configuration, PSI = L
1−ph configuration
Measured from OCP event to PWRGD
deassertion
1.55
1.6
7
V
mV
−70
−32
−70
−95
−47.5
−95
−115
−65
−115
−70
−15
−70
−90
−30
−90
−115
−50
−115
8.0
1. All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
3. Timing is referenced to the 90% and 10% points, unless otherwise noted.
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1.65
ms
ADP3208D
ELECTRICAL CHARACTERISTICS VCC = PVCC1 = PVCC2 = BST1 = BST2 = High = 5.0V, FBRTN = GND = SW1 = SW2 = PGND1
= PGND2 = Low = 0 V, EN = VATFREQ = High, DPRSLP = 0 V, PSI = 1.05 V, VVID = 1.2000 V, TA = −40°C to 100°C, unless otherwise
noted (Note 1). Current entering a pin (sunk by the device) has a positive sign. RREF = 80 kW.
Parameter
Symbol
Conditions
Min
Typ
Max
Current Gain Accuracy
IMON/ILIM
Measured from ILIMP to IMON
ILIM = −20 mA
ILIM = −10 mA
ILIM = −5 mA
9.5
9.3
9.0
10
10
10
10.5
10.7
11.0
IMON Clamp Voltage
VMAXMON
Relative to FBRTN, ILIMP = −30 mA
1.0
Unit
CURRENT MONITOR
1.05
V
V
PULSE WIDTH MODULATOR − Clock Oscillator
RT Voltage
VRT
VARFREQ = High, RT = 125 kW,
VVID = 1.5000 V
VARFREQ = Low, See also VRT(VVID) formula
1.22
1.25
1.27
0.98
1.0
1.02
PWM Clock Frequency
Range (Note 2)
fCLK
Operating Range
0.3
PWM Clock Frequency
fCLK
TA = 25°C, VVID = 1.2000 V
RT = 73 kW
RT = 125 kW
RT = 180 kW
3.0
MHz
kHz
1200
680
400
1470
920
640
1720
1120
840
1.0
VIN
1.1
V
RAMP GENERATOR
RAMP Voltage
VRAMP
EN = high, IRAMP = 30 mA
EN = low
0.9
RAMP Current Range
(Note 2)
IRAMP
EN = high
EN = low, RAMP = 19 V
1.0
−0.5
100
+0.5
mA
VRAMP − VCOMP
−3.0
3.0
mV
PWM COMPARATOR
PWM Comparator Offset
(Note 2)
VOSRPM
RPM COMPARATOR
RPM Current
RPM Comparator Offset
(Note 2)
IRPM
VOSRPM
−8.8
VVID = 1.2 V, RT = 125 kW,
VARFREQ = High, See also IRPM(RT) formula
VCOMP − (1 +VRPM)
−3.0
mA
3.0
mV
EPWM CLOCK SYNC
Relative to COMP sampled TCLK earlier
2−phase configuration
1−phase configuration
Trigger Threshold (Note 2)
mV
400
450
SWITCH AMPLIFIER
SW Common Mode Range
(Note 2)
SW Resistance
VSW(X)CM
RSW_PGND(X)
Operating Range for current sensing
−600
+200
mV
Measured from SW to PGND
3.0
kW
ZERO CURRENT SWITCHING COMPARATOR
SW ZCS Threshold
VDCM(SW1)
DCM mode, DPRSLP = 3.3 V
−6.0
mV
Masked Off Time
tOFFMSKD
Measured from DRVH neg edge to DRVH
pos edge at max frequency of operation
700
ns
SYSTEM I/O BUFFERS VID[6:0], PSI INPUTS
Input Voltage
Refers to driving signal level
Logic low, Isink w 1 mA
Logic high, Isource v −5 mA
Input Current
V = 0.2 V
VID[6:0], DPRSLP (active pulldown to GND)
PSI (active pullup to VCC)
VID Delay Time (Note 2)
Any VID edge to FB change 10%
0.3
0.7
−1.0
+1.0
200
1. All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
3. Timing is referenced to the 90% and 10% points, unless otherwise noted.
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8
V
mA
ns
ADP3208D
ELECTRICAL CHARACTERISTICS VCC = PVCC1 = PVCC2 = BST1 = BST2 = High = 5.0V, FBRTN = GND = SW1 = SW2 = PGND1
= PGND2 = Low = 0 V, EN = VATFREQ = High, DPRSLP = 0 V, PSI = 1.05 V, VVID = 1.2000 V, TA = −40°C to 100°C, unless otherwise
noted (Note 1). Current entering a pin (sunk by the device) has a positive sign. RREF = 80 kW.
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
DPRSLP
Refers to driving signal level
Logic low, Isink w 1 mA
Logic high, Isource v −5 mA
Input Voltage
Input Current
1.0
2.3
DPRSLP = low
DPRSLP = high
−1.0
+2.0
V
mA
DPRSTP
Input Voltage
Refers to driving signal level
Logic low, Isink w 1 mA
Logic high, Isource v −5 mA
0.3
0.7
Input Current
1.0
V
mA
VARFREQ, SP
Refers to driving signal level
Logic low, Isink w 1 mA
Logic high, Isource v −5 mA
Input Voltage
0.7
4.0
Input Current
1.0
V
mA
EN INPUT
Refers to driving signal level
Logic low, Isink w 1 mA
Logic high, Isource v −5 mA
Input Voltage
Input Current
1.0
2.3
EN = L or EN = H (Static)
0.8 V < EN < 1.6 V (During Transition)
10
70
Output Low Voltage
Logic low, Isink = 4 mA
50
Output High, Leakage
Current
Logic high, VCLKEN = VCC
V
nA
mA
CLKEN OUTPUT
100
mV
1.0
mA
5.0
V
2.55
V
THERMAL MONITORING AND PROTECTION
0
TTSNS Voltage Range
(Note 2)
TTSNS Threshold
VCC = 5.0 V, TTSNS is falling
TTSNS Hysteresis
TTSNS Bias Current
VRTT Output Voltage
TTSNS = 2.6 V
VVRTT
2.45
2.5
50
110
−2.0
Logic low, IVRTT(SINK) = 400 mA
Logic high, IVRTT(SOURCE) = −400 mA
4.0
10
5.0
mV
2.0
mA
100
mV
V
SUPPLY
Supply Voltage Range
VCC
5.5
V
EN = H
EN = 0 V
6.0
15
10
50
mA
mA
VCCOK
VCC is Rising
4.3
4.5
V
VCCUVLO
VCC is Falling
Supply Current
VCC OK Threshold
VCC UVLO Threshold
4.5
4.0
VCC Hysteresis (Note 2)
4.1
V
210
mV
HIGH−SIDE MOSFET DRIVER
Pullup Resistance, Sourcing
Current
BST = PVCC
1.8
3.3
W
Pulldown Resistance, Sinking
Current
BST = PVCC
1.0
3.0
W
1. All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
3. Timing is referenced to the 90% and 10% points, unless otherwise noted.
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9
ADP3208D
ELECTRICAL CHARACTERISTICS VCC = PVCC1 = PVCC2 = BST1 = BST2 = High = 5.0V, FBRTN = GND = SW1 = SW2 = PGND1
= PGND2 = Low = 0 V, EN = VATFREQ = High, DPRSLP = 0 V, PSI = 1.05 V, VVID = 1.2000 V, TA = −40°C to 100°C, unless otherwise
noted (Note 1). Current entering a pin (sunk by the device) has a positive sign. RREF = 80 kW.
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
BST = PVCC, CL = 3 nF, Figure 6
BST = PVCC, CL = 3 nF, Figure 6
15
13
35
31
ns
BST = PVCC, Figure 6
39
50
ns
EN = L (Shutdown)
EN = H, no switching
0.6
15
5.0
mA
Pullup Resistance, Sourcing
Current
BST = PVCC
1.6
3.3
W
Pulldown Resistance, Sinking
Current
BST = PVCC
0.8
2.5
W
trDRVL
tfDRVL
CL = 3 nF, Figure 6
CL = 3 nF, Figure 6
15
14
35
35
ns
tpdhDRVL
CL = 3 nF, Figure 6
10
45
ns
250
450
ns
1.0
240
15
mA
6.0
1.0
W
HIGH−SIDE MOSFET DRIVER
trDRVH
tfDRVH
Transition Times
Dead Delay Times
tpdhDRVH
BST Quiescent Current
LOW−SIDE MOSFET DRIVER
Transition Times
Progation Delay Times
SW Transition Times
tTOSW
SW Off Threshold
DRVH = L, SW = 2.5 V
210
VOFFSW
1.6
PVCC Quiescent Current
EN = L (Shutdown)
EN = H, no switching
V
BOOTSTRAP RECTIFIER SWITCH
EN = L or EN = H and DRVL = H
On Resistance
3.0
1. All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
3. Timing is referenced to the 90% and 10% points, unless otherwise noted.
IN
tpdlDRVL
tfDRVL
tpdlDRVH
trDRVL
DRVL
tfDRVH
tpdhDRVH
DRVH
(WITH RESPECT TO SW)
trDRVH
VTH
VTH
tpdhDRVL
1.0 V
SW
Figure 6. Timing Diagram (Note 3)
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10
ADP3208D
TYPICAL PERFORMANCE CHARACTERISTICS
VVID = 1.5 V, TA = 20°C to 100°C, unless otherwise noted.
95
VIN = 9.0 V
90
SW2
EFFICIENCY (%)
85
80
SW1
VIN = 9.0 V
75
70
65
60
VOUT = 1.2 V
OUTPUT VOLTAGE
55
fSW = 305 kHz
Input = 12 V, Output = 1.0 V
44 A to 9 A Load Step
50
0
5
10
15
20
25
30
35
40
45
LOAD CURRENT (A)
Figure 7. PWM Mode Efficiency vs. Load Current
Figure 8. Load Transient with 2−Phases
OUTPUT RIPPLE
SW2
SW1
CSREF to CSCOMP
SW1
OUTPUT VOLTAGE
SW2
Input = 12 V, Output = 1.0 V
9 A to 44 A Load Step
Input = 12 V, Output = 1.1 V
No Load
Figure 9. Load Transient with 2 Phases
Figure 10. Switching Waveforms in 2 Phase
400
PER PHASE SWITCHING FREQUENCY (kHz)
OUTPUT RIPPLE
COMP
SW1
SW2
350
300
250
VARFREQ = 5.0 V
200
150
100
50
0
0.25
Input = 12 V, Output = 1.1 V
No Load
VARFREQ = 0 V
RT = 187 kΩ
2−Phase Mode
0.5
0.75
1
1.25
1.5
VID OUTPUT VOLTAGE (V)
Figure 11. Switching Waveforms in 2−Phase
Figure 12. Switching Frequency vs. VID Output
Voltage in PWM Mode
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11
ADP3208D
TYPICAL PERFORMANCE CHARACTERISTICS
VVID = 1.5 V, TA = 20°C to 100°C, unless otherwise noted.
350
1200
SWITCHING FREQUENCY (kHz)
300
1000
PMON VOLTAGE (mV)
250
200
150
100
600
400
200
50
0
800
RT = 237 kW
RPM = 80.5 kW
0
0.5
0
1.5
1.0
0
20
40
OUTPUT VOLTAGE (V)
60
80
OUTPUT POWER (W)
Figure 13. Switching Frequency vs. Output
Voltage in RPM Mode
Figure 14. IMON Voltage vs. Output Current
1.05
1000
1-Phase
PSI = Low
Switching Frequency (kHz)
VID = 1.4125 V
1
2-Phase
PSI = High
Output (V)
+2%
VID = 1.2125 V
0.95
-2%
VID = 1.1 V
0.9
VID = 0.8125
VID = 0.6125
2−Phase Configuration
100
10
0.85
100
1000
0
Rt RESISTANCE (kW )
20
30
40
Load (A)
Figure 15. Per Phase Switching Frequency vs. RT
Resistance
Figure 16. Load Line Accuracy
OUTPUT VOLTAGE
0.8
VCC CURRENT (mA)
10
0.6
PWRGND
0.4
CLKEN
0.2
VDC = 12 V
EN = LOW
EN
0
0
1
2
3
4
5
6
VCC VOLTAGE (V)
Figure 17. VCC Current vs. VCC Voltage with
Enable Low
Figure 18. Startup Waveforms
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50
ADP3208D
TYPICAL PERFORMANCE CHARACTERISTICS
VVID = 1.5 V, TA = 20°C to 100°C, unless otherwise noted.
OUTPUT VOLTAGE
4
L1 CURRENT
L2 CURRENT
2
R1
SWITCH NODE 1
1
SWITCH NODE 2
CH1 10.0V
CH2 5.00A
CH3 5.00A
CH4 20.0mV
REF1 10.0V 1.00ms
M1.00ms
A CH3
8.00A
T 20.00%
Figure 19. Dual−Phase, Interleaved PWM Waveform, 20 A Load
SWITCH NODE 2
SWITCH NODE 1
SWITCH NODE 1
PSI
SWITCH NODE 2
OUTPUT VOLTAGE
OUTPUT VOLTAGE
Figure 20. PSI Transition
Figure 21. PSI Transition
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ADP3208D
TYPICAL PERFORMANCE CHARACTERISTICS
VVID = 1.5 V, TA = 20°C to 100°C, unless otherwise noted.
OUTPUT VOLTAGE
OUTPUT VOLTAGE
DPRSLP
SWITCH NODE 1
DPRSLP
SWITCH NODE 1
SWITCH NODE 2
SWITCH NODE 2
PSI = HIGH
LOAD = 2 A
PSI = HIGH
LOAD = 2 A
Figure 22. DPRSLP Transition
Figure 23. DPRSLP Transition
OUTPUT VOLTAGE
OUTPUT VOLTAGE
DPRSLP
DPRSLP
SWITCH NODE 2
SWITCH NODE 2
SWITCH NODE 1
SWITCH NODE 1
PSI = LOW
LOAD = 2 A
PSI = LOW
LOAD = 2 A
Figure 24. DPRSLP Transition
Figure 25. DPRSLP Transition
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14
ADP3208D
Theory of Operation
than one output can be active at a time, permitting
overlapping phases.
The ADP3208D combines multi−mode Pulse Width
Modulated (PWM) control and Ramp Pulse Modulated
(RPM) control with multi−phase logic outputs for use in
single− and dual−phase synchronous buck CPU core supply
power converters. The internal 7−bit VID DAC conforms to
the Intel IMVP−6+ specifications.
Multiphase operation is important for producing the high
currents and low voltages demanded by today’s
microprocessors. Handling high currents in a single−phase
converter would put too high of a thermal stress on system
components such as the inductors and MOSFETs.
The multi−mode control of the ADP3208D is a stable,
high performance architecture that includes
• Current and thermal balance between phases
• High speed response at the lowest possible switching
frequency and minimal count of output decoupling
capacitors
• Minimized thermal switching losses due to lower
frequency operation
• High accuracy load line regulation
• High current output by supporting 2−phase operation
• Reduced output ripple due to multiphase ripple
cancellation
• High power conversion efficiency with heavy and light
loads
• Increased immunity from noise introduced by PC board
layout constraints
• Ease of use due to independent component selection
• Flexibility in design by allowing optimization for either
low cost or high performance
Operation Modes
The number of phases can be static (see the Number of
Phases section) or dynamically controlled by system signals
to optimize the power conversion efficiency with heavy and
light loads.
If SP is set low (user−selected dual−phase mode) during
a VID transient or with a heavy load condition (indicated by
DPRSLP being low and PSI being high), the ADP3208D
runs in 2−phase, interleaved PWM mode to achieve minimal
VCORE output voltage ripple and the best transient
performance possible. If the load becomes light (indicated by
PSI being low or DPRSLP being high), ADP3208D switches
to single−phase mode to maximize the power conversion
efficiency.
In addition to changing the number of phases, the
ADP3208D is also capable of dynamically changing the
control method. In dual−phase operation, the ADP3208D
runs in PWM mode, where the switching frequency is
controlled by the master clock. In single−phase operation
(commanded by the PSI low state), the ADP3208D runs in
RPM mode, where the switching frequency is controlled by
the ripple voltage appearing on the COMP pin. In RPM
mode, the DRVH1 pin is driven high each time the COMP
pin voltage rises to a voltage limit set by the VID voltage and
an external resistor connected from the RPM to GND. If the
device is in single−phase mode and the system signal
DPRSLP is asserted high during the deeper sleep mode of
CPU operation, the ADP3208D continues running in RPM
mode but offers the option of turning off the low−side
(synchronous rectifier) MOSFET when the inductor current
drops to 0. Turning off the low−side MOSFETs at the zero
current crossing prevents reversed inductor current build up
and breaks synchronous operation of high− and low−side
switches. Due to the asynchronous operation, the switching
frequency becomes slower as the load current decreases,
resulting in good power conversion efficiency with very
light loads.
Table 1 summarizes how the ADP3208D dynamically
changes the number of active phases and transitions the
operation mode based on system signals and operating
conditions.
Number of Phases
The number of operational phases can be set by the user.
Tying the SP pin to the VCC pin forces the chip into
single−phase operation. Otherwise, dual−phase operation is
automatically selected, and the chip switches between
single− and dual−phase modes as the load changes to
optimize power conversion efficiency.
In dual−phase configuration, SP is low and the timing
relationship between the two phases is determined by
internal circuitry that monitors the PWM outputs. Because
each phase is monitored independently, operation
approaching 100% duty cycle is possible. In addition, more
Table 1. Phase Number and Operation Modes
PSI
DPRSLP
VID Transient
(Note 1)
Current Limit
No. of Phases
Selected by User
No. of Phases
in Operation
Operation Mode (Note 2)
*
*
Yes
*
N [2 or 1]
N
PWM, CCM only
1
0
No
*
N [2 or 1]
N
PWM, CCM only
0
0
No
No
*
1
RPM, CCM only
0
0
No
Yes
*
1
PWM, CCM only
*
1
No
No
*
1
RPM, automatic CCM/DCM
*
1
No
Yes
*
1
PWM, CCM only
* = Don’t Care
1. VID transient period is the time following any VID change, including entry into and exit from deeper sleep mode. The duration of VID transient
period is the same as that of PWRGD masking time.
2. CCM stands for continuous current mode, and DCM stands for discontinuous current mode.
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ADP3208D
VRMP
5V
FLIP−FLOP
IR = AR y IRAMP
S
Q
BST1
GATE DRIVER
BST
DRVH
RD
CR
FLIP−FLOP
400ns
1V
IN
SW
DCM
DRVL
Q
S
Q
Q
VCC
RI
DRVH1
L
SW1
LOAD
DRVL1
5V
RD
R2
BST2
R1
VCC
DRVH2
R1
R2
30mV
RI
L
SW2
1V
DRVL2
VDC
+–
+
CSREF
–
VCS
+
COMP
CA
RA
CFB
+
FBRTN
FB
LLINE
CSCOMP
CB
CSSUM
RCS
RPH
CCS
RPH
RB
6
2
-0
4
7
3
Figure 26. Single−Phase RPM Mode Operation
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ADP3208D
5V
BST1
GATE DRIVER
IR = A R y I RAMP
BST
DRVH
FLIP−FLOP
CLOCK
OSCILLATOR
S
Q
IN
SW
DRVL
RD
CR
DRVH1
RI
L
SW1
DRVL1
LOAD
5V
AD
BST2
VCC
GATE DRIVER
0.2V
IR = A R y I RAMP
BST
DRVH
FLIP−FLOP
CLOCK
OSCILLATOR
S
SW
Q
DRVL
RD
CR
VCC
VCC
DRVH2
RI
L
SW2
DRVL2
AD
VDC
+–
0.2V
CSREF
–
+ V
CS
RAMP
+
COMP
CA
RA
CFB
+
FBRTN
FB
CSCOMP
LLINE
CB
CSSUM
R CS
RPH
C CS
RPH
RB
7
3
6
5
2
-0
4
Figure 27. Dual−Phase PWM Mode Operation
Setting Switch Frequency
capacitor (5 pF typical) and creates a ramp. When the
internal ramp signal intercepts the COMP voltage, the
DRVH1 pin is reset low.
In continuous current mode, the switching frequency of
RPM operation is almost constant. While in discontinuous
current conduction mode, the switching frequency is
reduced as a function of the load current.
Master Clock Frequency in PWM Mode
When the ADP3208D runs in PWM, an external resistor
connected from the RT pin to GND sets the clock frequency.
The frequency is constant at a given VID code but varies
with the VID voltage: the lower the VID voltage, the lower
the clock frequency. The variation of clock frequency with
VID voltage maintains constant VCORE ripple and improves
power conversion efficiency at lower VID voltages.
Figure 15 shows the relationship between clock frequency
and VID voltage, parametrized by RT resistance.
To determine the switching frequency per phase, divide
the clock by the number of phases in use.
Differential Sensing of Output Voltage
The ADP3208D combines differential sensing with a high
accuracy VID DAC, referenced by a precision band gap
source and a low offset error amplifier, to meet the rigorous
accuracy requirement of the Intel IMVP−6+ specification.
In steady−state mode, the combination of the VID DAC and
error amplifier maintain the output voltage for a worst−case
scenario within ±8 mV of the full operating output voltage
and temperature range.
The CPU core output voltage is sensed between the FB
and FBRTN pins. FB should be connected through a resistor
to the positive regulation point; the VCC remote sensing pin
of the microprocessor. FBRTN should be connected directly
to the negative remote sensing point; the VSS sensing point
of the CPU. The internal VID DAC and precision voltage
reference are referenced to FBRTN and have a maximum
current of 200 mA for guaranteed accurate remote sensing.
Switching Frequency in RPM Mode — Single−Phase
Operation
In single−phase RPM mode, the switching frequency is
controlled by the ripple voltage on the COMP pin, rather
than by the master clock. Each time the COMP pin voltage
exceeds the RPM pin voltage threshold level determined by
the VID voltage and the external resistor connected from
RPM to GND, an internal ramp signal is started and DRVH1
is driven high. The slew rate of the internal ramp is
programmed by the current entering the RAMP pin.
One−third of the RAMP current charges an internal ramp
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ADP3208D
Output Current Sensing
used as the voltage positioning setpoint. The arrangement
results in an enhanced feed−forward response.
The ADP3208D includes a dedicated Current Sense
Amplifier (CSA) to monitor the total output current of the
converter for proper voltage positioning vs. load current and
for over current detection. Sensing the current delivered to
the load is an inherently more accurate method than
detecting peak current or sampling the current across a sense
element, such as the low−side MOSFET. The CSA can be
configured several ways, depending on system optimization
objectives, and the current information can be obtained by:
• Output inductor ESR sensing without the use of a
thermistor for the lowest cost
• Output inductor ESR sensing with the use of a
thermistor that tracks inductor temperature to improve
accuracy
• Discrete resistor sensing for the highest accuracy
At the positive input of the CSA, the CSREF pin is
connected to the output voltage. At the negative input (that
is, the CSSUM pin of the CSA), signals from the sensing
element (in the case of inductor DCR sensing, signals from
the switch node side of the output inductors) are summed
together by series summing resistors. The feedback resistor
between the CSCOMP and CSSUM pins sets the gain of the
CSA, and a filter capacitor is placed in parallel with this
resistor. The current information is then given as the voltage
difference between the CSCOMP and CSREF pins. This
signal is used internally as a differential input for the current
limit comparator.
An additional resistor divider connected between the
CSCOMP and CSREF pins with the midpoint connected to
the LLINE pin can be used to set the load line required by the
microprocessor specification. The current information to set
the load line is then given as the voltage difference between
the LLINE and CSREF pins. This configuration allows the
load line slope to be set independent from the current limit
threshold. If the current limit threshold and load line do not
have to be set independently, the resistor divider between the
CSCOMP and CSREF pins can be omitted and the
CSCOMP pin can be connected directly to LLINE. To
disable voltage positioning entirely (that is, to set no load
line), LLINE should be tied to CSREF.
To provide the best accuracy for current sensing, the CSA
has a low offset input voltage and the sensing gain is set by
an external resistor ratio.
Current Control Mode and Thermal Balance
The ADP3208D has individual inputs for monitoring the
current of each phase. The phase current information is
combined with an internal ramp to create a
current−balancing feedback system that is optimized for
initial current accuracy and dynamic thermal balance. The
current balance information is independent from the total
inductor current information used for voltage positioning
described in the Active Impedance Control Mode section.
The magnitude of the internal ramp can be set so that the
transient response of the system is optimal. The ADP3208D
monitors the supply voltage to achieve feed forward control
whenever the supply voltage changes. A resistor connected
from the power input voltage rail to the RAMP pin
determines the slope of the internal PWM ramp. More detail
about programming the ramp is provided in the Application
Information section.
The ADP3208D should not require external thermal
balance circuitry if a good layout is used. However, if
mismatch is desired due to uneven cooling in phase, external
resistors can be added to individually control phase currents
as long as the phase currents are mismatched by less than
30%. If unwanted mismatch exceeds 30%, a new layout that
improves phase symmetry should be considered.
RAMP
ADP3208D
20
SWITCH NODE 1
VDC
C
R1
R2
R SW1
SWITCH NODE 2
R SW2
Reserved for Thermal Balance Tune
Figure 28. Optional Current Balance Resistors
In 2−phase operation, alternate cycles of the internal ramp
control the duty cycle of the separate phases. Figure 28
shows the addition of two resistors from each switch node
to the RAMP pin; this modifies the ramp−charging current
individually for each phase. During Phase 1, SW Node 1 is
high (practically at the input voltage potential) and SW
Node 2 is low (practically at the ground potential). As a
consequence, the RAMP pin, through the R2 resistor, sees
the tap point of a divider connected to the input voltage,
where RSW1 is the upper element and RSW2 is the lower
element of the divider. During Phase 2, the voltages on SW
Node 1 and SW Node 2 switch and the resistors swap
functions. Tuning RSW1 and RSW2 allows the current to be
optimally set for each phase. To increase the current for a
given phase, decrease RSW for that phase.
Active Impedance Control Mode
To control the dynamic output voltage droop as a function
of the output current, the signal that is proportional to the
total output current, converted from the voltage difference
between LLINE and CSREF, can be scaled to be equal to the
required droop voltage. This droop voltage is calculated by
multiplying the droop impedance of the regulator by the
output current. This value is used as the control voltage of
the PWM regulator. The droop voltage is subtracted from the
DAC reference output voltage, and the resulting voltage is
Voltage Control Mode
A high−gain bandwidth error amplifier is used for the
voltage mode control loop. The noninverting input voltage
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ADP3208D
is set via the 7−bit VID DAC. The VID codes are listed in the
VID Code table. The noninverting input voltage is offset by
the droop voltage as a function of current, commonly known
as active voltage positioning. The output of the error
amplifier is the COMP pin, which sets the termination
voltage of the internal PWM ramps.
At the negative input, the FB pin is tied to the output sense
location using RB, a resistor for sensing and controlling the
output voltage at the remote sensing point. The main loop
compensation is incorporated in the feedback network
connected between the FB and COMP pins.
VCC
EN
VCORE
t BOOT
CLKEN
Power−Good Monitoring
PWRGD
The power−good comparator monitors the output voltage
via the CSREF pin. The PWRGD pin is an open−drain
output that can be pulled up through an external resistor to
a voltage rail, not necessarily the same VCC voltage rail that
is running the controller. A logic high level indicates that the
output voltage is within the voltage limits defined by a range
around the VID voltage setting. PWRGD goes low when the
output voltage is outside of this range.
Following the IMVP−6+ specification, the PWRGD
range is defined to be 300 mV less than and 200 mV greater
than the actual VID DAC output voltage. For any DAC
voltage less than 300 mV, only the upper limit of the
PWRGD range is monitored. To prevent a false alarm, the
power−good circuit is masked during various system
transitions, including a VID change and entrance into or exit
out of deeper sleep. The duration of the PWRGD mask is set
to approximately 130 ms by an internal timer. If the voltage
drop is greater than 200 mV during deeper sleep entry or
slow deeper sleep exit, the duration of PWRGD masking is
extended by the internal logic circuit.
t CPU _PWRGD
Figure 29. Powerup Sequence of ADP3208D
If EN is taken low or VCC drops below the VCC UVLO
threshold, both the SS capacitor and the PGDELAY
capacitor are reset to ground to prepare the chip for a
subsequent soft−start cycle.
Soft Transient
When a VID input changes, the ADP3208D detects the
change but ignores new code for a minimum of 400 ns. This
delay is required to prevent the device from reacting to
digital signal skew while the 7−bit VID input code is in
transition. Additionally, the VID change triggers a PWRGD
masking timer to prevent a PWRGD failure. Each VID
change resets and retriggers the internal PWRGD masking
timer.
The ADP3208D provides a soft transient function to
reduce inrush current during VID transitions. Reducing the
inrush current helps decrease the acoustic noise generated
by the MLCC input capacitors and inductors.
The soft transient feature is implemented internally. When
a new VID code is detected, the ADP3208D steps
sequentially through each VID voltage to the final VID
voltage. There is a PWRGD masking time of 100ms after the
last VID code is changed internally. Table 2 lists the soft
transient slew rate.
Powerup Sequence and Soft−Start
The power−on ramp−up time of the output voltage is set
internally. The powerup sequence, including the soft−start is
illustrated in Figure 29.
After EN is asserted high, the soft−start sequence starts.
The core voltage ramps up linearly to the boot voltage. The
ADP3208D regulates at the boot voltage for 100 ms. After
the boot time is completed, CLKEN is asserted low. After
CLKEN is asserted low for 9ms, PWRGD is asserted high.
In VCC UVLO or in shutdown, a small MOSFET turns on
connecting the CSREF to GND. The MOSFET on the
CSREF pin has a resistance of approximately 100W. When
VCC ramps above the upper UVLO threshold and EN is
asserted high, the ADP3208D enables internal bias and
starts a reset cycle that lasts about 50 ms to 60 ms. Next, when
initial reset is over, the chip detects the number of phases set
by the user, and gives a go signal to start soft−start. The
ADP3208D reads the VID codes provided by the CPU on
VID0 to VID6 input pins after CLKEN is asserted low. The
PWRGD signal is asserted after a tCPU_PWRGD delay of
about 9 ms, as specified by IMVP−6+. The power−good
delay is programmed internally.
Table 2. Soft Transient Slew Rate
DPRSLP
Slew Rate
Entrance to Deeper Sleep
VID Transient
HIGH
−3.125mV/ms
Fast Exit from Deeper Sleep
LOW
+12.5mV/ms
Slow Exit from Deeper Sleep
HIGH
+3.125mV/ms
Transient from VBOOT to VID
DNC1
±3.125mV/ms
1. DNC = Do Not Care.
Current Limit
The ADP3208D compares the differential output of a
current sense amplifier to a programmable current limit
setpoint to provide current limiting function. The current
limit set point is set with a resistor connected from ILIM pin
to CSCOMP pin. This is the Rlim resistor. During normal
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ADP3208D
Changing VID OTF
operation, the voltage on the ILIM pin is equal to the CSREF
pin. The voltage across RLIM is equal to the voltage across
the CSA (from CSREF pin to CSCOMP pin). This voltage
is proportional to output current. The current through RLIM
is proportional to the output inductor current. The current
through RLIM is compared with an internal reference
current. When the RLIM current goes above the internal
reference current, the ADP3208D goes into current limit.
The current limit circuit is shown in Figure 30.
The ADP3208D is designed to track dynamically
changing VID code. As a consequence, the CPU VCC
voltage can change without the need to reset the controller
or the CPU. This concept is commonly referred to as VID
OTF transient. A VID OTF can occur with either light or
heavy load conditions. The processor alerts the controller
that a VID change is occurring by changing the VID inputs
in LSB incremental steps from the start code to the finish
code. The change can be either upwards or downwards steps.
When a VID input changes, the ADP3208D detects the
change but ignores new code for a minimum of 400 ns. This
delay is required to prevent the device from reacting to
digital signal skew while the 7−bit VID input code is in
transition. Additionally, the VID change triggers a PWRGD
masking timer to prevent a PWRGD failure. Each VID
change resets and retriggers the internal PWRGD masking
timer.
As listed in Table 3, during a VID transient, the
ADP3208D forces PWM mode regardless of the state of the
system input signals. For example, this means that if the chip
is configured as a dual−phase controller but is running in
single−phase mode due to a light load condition, a current
overload event causes the chip to switch to dual−phase mode
to share the excessive load until the delayed current limit
latchoff cycle terminates.
In user−set single−phase mode, the ADP3208D usually
runs in RPM mode. When a VID transition occurs, however,
the ADP3208D switches to dual−phase PWM mode.
20 μA
CLA
VI CONV
I LIM
I LIM
+
-
+
R
R
CSREF
CSA
+
CSCOMP
ILIM
CSSUM
L
R LIM
R CS
DCR
C BULK
R PH
C CS
Figure 30. Current Limit Circuit
During startup when the output voltage is below 200 mV,
a secondary current limit is activated. This is necessary
because the voltage swing on CSCOMP cannot extend
below ground. The secondary current limit circuit clamps
the internal COMP voltage and sets the internal
compensation ramp termination voltage at 1.5 V level. The
clamp actually limits voltage drop across the low side
MOSFETs through the current balance circuitry.
An inherent per phase current limit protects individual
phases in case one or more phases stop functioning because
of a faulty component. This limit is based on the maximum
normal mode COMP voltage.
After 9 ms in current limit, the ADP3208D will latchoff.
The latchoff can be reset by removing and reapplying VCC,
or by recycling the EN pin low and high for a short time.
The latchoff can be reset by removing and reapplying
VCC, or by recycling the EN pin low and high for a short
time.
Light Load RPM DCM Operation
In single−phase normal mode, DPRSLP is pulled low and
the APD3208 operates in Continuous Conduction Mode
(CCM) over the entire load range. The upper and lower
MOSFETs run synchronously and in complementary phase.
See Figure 32 for the typical waveforms of the ADP3208D
running in CCM with a 7 A load current.
OUTPUT VOLTAGE 20 mV/DIV
4
INDUCTOR CURRENT 5 A/DIV
PWRGD 2.0 V/DIV
2
SWITCH NODE 5.0 V/DIV
LOW−SIDE GATE 5.0 V/DIV
3
1
OUTPUT 0.5 V/DIV
400 ns/DIV
Figure 32. Single−Phase Waveforms in CCM
2 ms/DIV
CURRENT LIMIT
APPLIED
LATCHED
OFF
Figure 31. Current Overload
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ADP3208D
If DPRSLP is pulled high, the ADP3208D operates in
RPM mode. If the load condition is light, the chip enters
Discontinuous Conduction Mode (DCM). Figure 33 shows
a typical single−phase buck with one upper FET, one lower
FET, an output inductor, an output capacitor, and a load
resistor. Figure 34 shows the path of the inductor current
with the upper FET on and the lower FET off. In Figure 35
the high−side FET is off and the low−side FET is on. In
CCM, if one FET is on, its complementary FET must be off;
however, in DCM, both high− and low−side FETs are off and
no current flows into the inductor (see Figure 36). Figure 37
shows the inductor current and switch node voltage in DCM.
In DCM with a light load, the ADP3208D monitors the
switch node voltage to determine when to turn off the
low−side FET. Figure 38 shows a typical waveform in DCM
with a 1 A load current. Between t1 and t2, the inductor current
ramps down. The current flows through the source drain of
the low−side FET and creates a voltage drop across the FET
with a slightly negative switch node. As the inductor current
ramps down to 0 A, the switch voltage approaches 0 V, as seen
just before t2. When the switch voltage is approximately
−6 mV, the low−side FET is turned off.
Figure 37 shows a small, dampened ringing at t2. This is
caused by the LC created from capacitance on the switch
node, including the CDS of the FETs and the output inductor.
This ringing is normal.
The ADP3208D automatically goes into DCM with a light
load. Figure 38 shows the typical DCM waveform of the
ADP3208D. As the load increases, the ADP3208D enters
into CCM. In DCM, frequency decreases with load current.
Figure 39 shows switching frequency vs. load current for a
typical design. In DCM, switching frequency is a function
of the inductor, load current, input voltage, and output
voltage.
OFF
L
C
ON
LOAD
Figure 35. Buck Topology Inductor Current During
t1 and t2
OFF
L
OFF
C
LOAD
Figure 36. Buck Topology Inductor Current During
t2 and t3
INDUCTOR
CURRENT
SWITCH
NODE
VOLTAGE
Q1
INPUT
VOLTAGE
DRVH
t0
OUTPUT
VOLTAGE
SWITCH
L
NODE
C
t2
t3
t4
Figure 37. Inductor Current and Switch Node in DCM
Q2
DRVL
t1
LOAD
4
OUTPUT VOLTAGE
20 mV/DIV
Figure 33. Buck Topology
SWITCH NODE 5.0 V/DIV
2
ON
L
3
OFF
C
LOAD
INDUCTOR CURRENT
5 A/DIV
1
LOW−SIDE GATE DRIVE 5.0 V/DIV
2 ms/DIV
Figure 34. Buck Topology Inductor Current During
t0 and t1
Figure 38. Single−Phase Waveforms in DCM with 1 A
Load Current
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ADP3208D
prevent damage to the CPU caused from negative voltage,
the ADP3208D maintains its RVP monitoring function even
after OVP latchoff. During OVP latchoff, if the CSREF pin
voltage drops to less than −300 mV, the low−side MOSFETs
is turned off. DRVL outputs are allowed to turn back on
when the CSREF voltage recovers to greater than −100 mV.
Figure 40 shows a typical OVP test. FB pin is shorted to
ground causing the control to command a large duty cycle.
The output voltage climbs up. When the output voltage is
climbs 200 mV above the DAC voltage, the PWRGD signal
de−asserts. When the output voltage climbs to 1.7V, OVP is
enabled. In OVP, the phase 1 and phase 2 low side drive turns
on the low side power MOSFETs. The low side MOSFETs
pull the output voltage low through the power inductor.
When the output voltage falls below −300 mV, Reverse
Voltage Protection is enabled. In Reverse Voltage
Protection, all power MOSFETs are turned off. This protects
the CPU from seeing a large negative voltage.
400
350
FREQUENCY (kHz)
300
9.0 V INPUT
250
19 V INPUT
200
150
100
50
0
0
2
4
6
8
10
12
14
LOAD CURRENT (A)
Figure 39. Single−Phase CCM/DCM Frequency vs.
Load Current
Output Crowbar
To prevent the CPU and other external components from
damage due to overvoltage, the ADP3208D turns off the
DRVH1 and DRVH2 outputs and turns on the DRVL1 and
DRVL2 outputs when the output voltage exceeds the OVP
threshold (1.7 V typical).
Turning on the low−side MOSFETs forces the output
capacitor to discharge and the current to reverse due to
current build up in the inductors. If the output overvoltage
is due to a drain−source short of the high−side MOSFET,
turning on the low−side MOSFET results in a crowbar
across the input voltage rail. The crowbar action blows the
fuse of the input rail, breaking the circuit and thus protecting
the microprocessor from destruction.
When the OVP feature is triggered, the ADP3208D is
latched off. The latchoff function can be reset by removing
and reapplying VCC to the ADP3208D or by briefly pulling
the EN pin low.
Pulling TTSNS to less than 1.0 V disables the overvoltage
protection function. In this configuration, VRTT should be
tied to ground.
OUTPUT VOLTAGE
PWRGD
PHASE 2
LOW SIDE GATE
PHASE 1
LOW SIDE GATE
Figure 40. Overvoltage Protection and Reverse
Voltage Protection
Output Enable and UVLO
For the ADP3208D to begin switching the VCC supply
voltage to the controller must be greater than the VCCO
threshold and the EN pin must be driven high. If the VCC
voltage is less than the VCCUVLO threshold or the EN pin is
a logic low, the ADP3208D shuts off. In shutdown mode, the
controller holds the PWM outputs low, shorts the capacitors
of the SS and PGDELAY pins to ground, and drives the
DRVH and DRVL outputs low.
The user must adhere to proper power supply sequencing
during startup and shutdown of the ADP3208D. All input
pins must be at ground prior to removing or applying VCC,
and all output pins should be left in high impedance state
while VCC is off.
Reverse Voltage Protection
Very large reverse current in inductors can cause negative
VCORE voltage, which is harmful to the CPU and other
output components. The ADP3208D provides a reverse
voltage protection (RVP) function without additional
system cost. The VCORE voltage is monitored through the
CSREF pin. When the CSREF pin voltage drops to less than
−300 mV, the ADP3208D triggers the RVP function by
disabling all PWM outputs and driving DRVL1 and DRVL2
low, thus turning off all MOSFETs. The reverse inductor
currents can be quickly reset to 0 by discharging the built−up
energy in the inductor into the input dc voltage source via the
forward−biased body diode of the high−side MOSFETs. The
RVP function is terminated when the CSREF pin voltage
returns to greater than −100 mV.
Sometimes the crowbar feature inadvertently causes
output reverse voltage because turning on the low−side
MOSFETs results in a very large reverse inductor current. To
Thermal Throttling Control
The ADP3208D includes a thermal monitoring circuit to
detect whether the temperature of the VR has exceeded a
user−defined thermal throttling threshold. The thermal
monitoring circuit requires an external resistor divider
connected between the VCC pin and GND. The divider
consists of an NTC thermistor and a resistor. To generate a
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ADP3208D
100 mV to prevent high frequency oscillation of VRTT
when the temperature approaches the set alarm point.
voltage that is proportional to temperature, the midpoint of
the divider is connected to the TTSNS pin. An internal
comparator circuit compares the TTSNS voltage to half the
VCC threshold and outputs a logic level signal at the VRTT
output when the temperature trips the user−set alarm
threshold. The VRTT output is designed to drive an external
transistor that in turn provides the high current, open−drain
VRTT signal required by the IMVP−6+ specification. The
internal VRTT comparator has a hysteresis of approximately
Current Monitor Function
The ADP3208D has an output current monitor. The
IMON pin sources a current proportional to the inductor
current. A resistor from IMON pin to FBRTN sets the gain.
A 0.1 mF is added in parallel with RMON to filter the inductor
ripple. The IMON pin is clamped to prevent it from going
above 1.15V
Table 3. VID Code Table
VID6
VID5
VID4
VID3
VID2
VID1
VID0
Output (V)
0
0
0
0
0
0
0
1.5000
0
0
0
0
0
0
1
1.4875
0
0
0
0
0
1
0
1.4750
0
0
0
0
0
1
1
1.4625
0
0
0
0
1
0
0
1.4500
0
0
0
0
1
0
1
1.4375
0
0
0
0
1
1
0
1.4250
0
0
0
0
1
1
1
1.4125
0
0
0
1
0
0
0
1.4000
0
0
0
1
0
0
1
1.3875
0
0
0
1
0
1
0
1.3750
0
0
0
1
0
1
1
1.3625
0
0
0
1
1
0
0
1.3500
0
0
0
1
1
0
1
1.3375
0
0
0
1
1
1
0
1.3250
0
0
0
1
1
1
1
1.3125
0
0
1
0
0
0
0
1.3000
0
0
1
0
0
0
1
1.2875
0
0
1
0
0
1
0
1.2750
0
0
1
0
0
1
1
1.2625
0
0
1
0
1
0
0
1.2500
0
0
1
0
1
0
1
1.2375
0
0
1
0
1
1
0
1.2250
0
0
1
0
1
1
1
1.2125
0
0
1
1
0
0
0
1.2000
0
0
1
1
0
0
1
1.1875
0
0
1
1
0
1
0
1.1750
0
0
1
1
0
1
1
1.1625
0
0
1
1
1
0
0
1.1500
0
0
1
1
1
0
1
1.1375
0
0
1
1
1
1
0
1.1250
0
0
1
1
1
1
1
1.1125
0
1
0
0
0
0
0
1.1000
0
1
0
0
0
0
1
1.0875
0
1
0
0
0
1
0
1.0750
0
1
0
0
0
1
1
1.0625
0
1
0
0
1
0
0
1.0500
0
1
0
0
1
0
1
1.0375
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ADP3208D
Table 3. VID Code Table
VID6
VID5
VID4
VID3
VID2
VID1
VID0
Output (V)
0
1
0
0
1
1
0
1.0250
0
1
0
0
1
1
1
1.0125
0
1
0
1
0
0
0
1.0000
0
1
0
1
0
0
1
0.9875
0
1
0
1
0
1
0
0.9750
0
1
0
1
0
1
1
0.9625
0
1
0
1
1
0
0
0.9500
0
1
0
1
1
0
1
0.9375
0
1
0
1
1
1
0
0.9250
0
1
0
1
1
1
1
0.9125
0
1
1
0
0
0
0
0.9000
0
1
1
0
0
0
1
0.8875
0
1
1
0
0
1
0
0.8750
0
1
1
0
0
1
1
0.8625
0
1
1
0
1
0
0
0.8500
0
1
1
0
1
0
1
0.8375
0
1
1
0
1
1
0
0.8250
0
1
1
0
1
1
1
0.8125
0
1
1
1
0
0
0
0.8000
0
1
1
1
0
0
1
0.7875
0
1
1
1
0
1
0
0.7750
0
1
1
1
0
1
1
0.7625
0
1
1
1
1
0
0
0.7500
0
1
1
1
1
0
1
0.7375
0
1
1
1
1
1
0
0.7250
0
1
1
1
1
1
1
0.7125
1
0
0
0
0
0
0
0.7000
1
0
0
0
0
0
1
0.6875
1
0
0
0
0
1
0
0.6750
1
0
0
0
0
1
1
0.6625
1
0
0
0
1
0
0
0.6500
1
0
0
0
1
0
1
0.6375
1
0
0
0
1
1
0
0.6250
1
0
0
0
1
1
1
0.6125
1
0
0
1
0
0
0
0.6000
1
0
0
1
0
0
1
0.5875
1
0
0
1
0
1
0
0.5750
1
0
0
1
0
1
1
0.5625
1
0
0
1
1
0
0
0.5500
1
0
0
1
1
0
1
0.5375
1
0
0
1
1
1
0
0.5250
1
0
0
1
1
1
1
0.5125
1
0
1
0
0
0
0
0.5000
1
0
1
0
0
0
1
0.4875
1
0
1
0
0
1
0
0.4750
1
0
1
0
0
1
1
0.4625
1
0
1
0
1
0
0
0.4500
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ADP3208D
Table 3. VID Code Table
VID6
VID5
VID4
VID3
VID2
VID1
VID0
Output (V)
1
0
1
0
1
0
1
0.4375
1
0
1
0
1
1
0
0.4250
1
0
1
0
1
1
1
0.4125
1
0
1
1
0
0
0
0.4000
1
0
1
1
0
0
1
0.3875
1
0
1
1
0
1
0
0.3750
1
0
1
1
0
1
1
0.3625
1
0
1
1
1
0
0
0.3500
1
0
1
1
1
0
1
0.3375
1
0
1
1
1
1
0
0.3250
1
0
1
1
1
1
1
0.3125
1
1
0
0
0
0
0
0.3000
1
1
0
0
0
0
1
0.2875
1
1
0
0
0
1
0
0.2750
1
1
0
0
0
1
1
0.2625
1
1
0
0
1
0
0
0.2500
1
1
0
0
1
0
1
0.2375
1
1
0
0
1
1
0
0.2250
1
1
0
0
1
1
1
0.2125
1
1
0
1
0
0
0
0.2000
1
1
0
1
0
0
1
0.1875
1
1
0
1
0
1
0
0.1750
1
1
0
1
0
1
1
0.1625
1
1
0
1
1
0
0
0.1500
1
1
0
1
1
0
1
0.1375
1
1
0
1
1
1
0
0.1250
1
1
0
1
1
1
1
0.1125
1
1
1
0
0
0
0
0.1000
1
1
1
0
0
0
1
0.0875
1
1
1
0
0
1
0
0.0750
1
1
1
0
0
1
1
0.0625
1
1
1
0
1
0
0
0.0500
1
1
1
0
1
0
1
0.0375
1
1
1
0
1
1
0
0.0250
1
1
1
0
1
1
1
0.0125
1
1
1
1
0
0
0
0.0000
1
1
1
1
0
0
1
0.0000
1
1
1
1
0
1
0
0.0000
1
1
1
1
0
1
1
0.0000
1
1
1
1
1
0
0
0.0000
1
1
1
1
1
0
1
0.0000
1
1
1
1
1
1
0
0.0000
1
1
1
1
1
1
1
0.0000
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Figure 41. Typical 2−Phase Application Circuit
ADP3208D
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ADP3208D
Application Information
frequency is reduced with the load current in a linear
manner. When considering power conversion efficiency in
light load, lower switching frequency is usually preferred
for RPM mode. However, the VCORE ripple specification in
the IMVP−6 sets the limitation for lowest switching
frequency. Therefore, depending on the inductor and output
capacitors, the switching frequency in RPM mode can be
equal, larger, or smaller than its counterpart in PWM mode.
A resistor from RPM to GND sets the pseudo constant
frequency as following:
The design parameters for a typical IMVP−6+ compliant
CPU core VR application are as follows:
• Maximum input voltage (VINMAX) = 19 V
• Minimum input voltage (VINMIN) = 8.0 V
• Output voltage by VID setting (VVID) = 1.4375 V
• Maximum output current (IO) = 40 A
• Droop resistance (RO) = 2.1 mW
• Nominal output voltage at 40 A load (VOFL) = 1.3535 V
• Static output voltage drop from no load to full load
(DV) = VONL − VOFL = 1.4375 V − 1.3535 V = 84 mV
• Maximum output current step (DIO) = 27.9 A
• Number of phases (n) = 2
• Switching frequency per phase (fSW) = 300 kHz
• Duty cycle at maximum input voltage (DMAX) = 0.18 V
• Duty cycle at minimum input voltage (DMIN) = 0.076 V
P S(MF) + 2
In PWM operation, the ADP3208D uses a
fixed−frequency control architecture. The frequency is set
by an external timing resistor (RT). The clock frequency and
the number of phases determine the switching frequency per
phase, which relates directly to the switching losses and the
sizes of the inductors and input and output capacitors. For a
dual−phase design, a clock frequency of 600 kHz sets the
switching frequency to 300 kHz per phase. This selection
represents the trade−off between the switching losses and
the minimum sizes of the output filter components. To
achieve a 600 kHz oscillator frequency at a VID voltage of
1.2 V, RT must be 187 kW. Alternatively, the value for RT can
be calculated by using the following equation:
V VID ) 1.0 V
2
n
f SW
9 pF
* 16 kW
P S(MF) + 2
RT +
n
f SW
9 pF
* 16 kW
RG
n MF
n
C ISS
(eq. 3)
IO
V CC
f SW
n MF
RG
n MF
n
C ISS
(eq. 4)
Inductor Selection
The choice of inductance determines the ripple current of
the inductor. Less inductance results in more ripple current,
which increases the output ripple voltage and the conduction
losses in the MOSFETs. However, this allows the use of
smaller−size inductors, and for a specified peak−to−peak
transient deviation, it allows less total output capacitance.
Conversely, a higher inductance results in lower ripple
current and reduced conduction losses, but it requires
larger−size inductors and more output capacitance for the
same peak−to−peak transient deviation. For a multiphase
converter, the practical value for peak−to−peak inductor
ripple current is less than 50% of the maximum dc current
of that inductor. Equation 5 shows the relationship between
the inductance, oscillator frequency, and peak−to−peak
ripple current. Equation 6 can be used to determine the
minimum inductance based on a given output ripple voltage.
(eq. 1)
where:
9 pF and 16 kW are internal IC component values.
VVID is the VID voltage in volts.
n is the number of phases.
fSW is the switching frequency in hertz for each phase.
For good initial accuracy and frequency stability, it is
recommended to use a 1% resistor.
When VARFREQ pin is connected to ground, the
switching frequency does not change with VID. The value
for RT can be calculated by using the following equation.
1.0 V
n MF
where:
AR is the internal ramp amplifier gain.
CR is the internal ramp capacitor value.
RR is an external resistor on the RAMPADJ pin to set the
internal ramp magnitude.
Because RR = 280 kW, the following resistance sets up
300 kHz switching frequency in RPM operation.
Setting the Clock Frequency for PWM
RT +
IO
V CC
f SW
IR +
Lw
ǒ1 * DMINǓ
V VID
L
f SW
V VID
(eq. 5)
RO
(1 * (n
f SW
V RIPPLE
D MIN))
(eq. 6)
Solving Equation 6 for a 16 mV peak−to−peak output
ripple voltage yields
(eq. 2)
Lw
For good initial accuracy and frequency stability, it is
recommended to use a 1% resistor.
1.4375 V
2.1 mW
300 kHz
(1 * (2
16 mV
0.076)
+ 533 nH
(eq. 7)
If the resultant ripple voltage is less than the initially
selected value, the inductor can be changed to a smaller
value until the ripple value is met. This iteration allows
optimal transient response and minimum output decoupling.
The smallest possible inductor should be used to minimize
the number of output capacitors. Choosing a 490 nH
inductor is a good choice for a starting point, and it provides
Setting the Switching Frequency for RPM Operation of
Phase 1
During the RPM mode operation of Phase 1, the
ADP3208D runs in pseudo constant frequency, given that
the load current is high enough for continuous current mode.
While in discontinuous current mode, the switching
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27
ADP3208D
a calculated ripple current of 9.0 A. The inductor should not
saturate at the peak current of 24.5 A, and it should be able
to handle the sum of the power dissipation caused by the
winding’s average current (20 A) plus the ac core loss. In this
example, 330 nH is used.
Another important factor in the inductor design is the
DCR, which is used for measuring the phase currents. Too
large of a DCR causes excessive power losses, whereas too
small of a value leads to increased measurement error. For
this example, an inductor with a DCR of 0.8 mW is used.
capacitor. In this example, a 220 kW is used for RCS to
achieve optimal results.
Next, solve for RPH(x) by rearranging Equation 8 as
follows:
R PH(X) w
0.8 mW
2.1 mW
@ 220 kW + 83.8 kW
(eq. 11)
The standard 1% resistor for RPH(x) is 86.6 kW.
Inductor DCR Temperature Correction
If the DCR of the inductor is used as a sense element and
copper wire is the source of the DCR, the temperature
changes associated with the inductor’s winding must be
compensated for. Fortunately, copper has a well−known
temperature coefficient (TC) of 0.39%/°C.
If RCS is designed to have an opposite but equal
percentage of change in resistance, it cancels the
temperature variation of the inductor’s DCR. Due to the
nonlinear nature of NTC thermistors, series resistors RCS1
and RCS2 (see Figure 42) are needed to linearize the NTC and
produce the desired temperature coefficient tracking.
Selecting a Standard Inductor
After the inductance and DCR are known, select a
standard inductor that best meets the overall design goals. It
is also important to specify the inductance and DCR
tolerance to maintain the accuracy of the system. Using 20%
tolerance for the inductance and 15% for the DCR at room
temperature are reasonable values that most manufacturers
can meet.
Power Inductor Manufacturers
The following companies provide surface−mount power
inductors optimized for high power applications upon
request:
• Vishay Dale Electronics, Inc.
• Panasonic
• Sumida Corporation
• NEC Tokin Corporation
Place as close as possible
to nearest inductor
R TH
ADP3208D
CSCOMP
R PH1
+
RPH2
To VOUT
Sense
R PH3
R CS1 R CS2
17
CCS1
CSSUM
-
To Switch Nodes
19
CSREF
CCS2
Keep This Path As Short
As Possible And Well Away
From Switch Node Lines
18
Output Droop Resistance
The design requires that the regulator output voltage
measured at the CPU pins decreases when the output current
increases. The specified voltage drop corresponds to the
droop resistance (RO).
The output current is measured by summing the currents
of the resistors monitoring the voltage across each inductor
and by passing the signal through a low−pass filter. The
summing is implemented by the CS amplifier that is
configured with resistor RPH(x) (summer) and resistors RCS
and CCS (filters). The output resistance of the regulator is set
by the following equations:
RO +
R CS
R SENSE
R PH(x)
C CS +
Figure 42. Temperature−Compensation Circuit
Values
The following procedure and expressions yield values for
RCS1, RCS2, and RTH (the thermistor value at 25°C) for a
given RCS value.
1. Select an NTC to be used based on its type and
value. Because the value needed is not yet
determined, start with a thermistor with a value
close to RCS and an NTC with an initial tolerance
of better than 5%.
2. Find the relative resistance value of the NTC at
two temperatures. The appropriate temperatures
will depend on the type of NTC, but 50°C and
90°C have been shown to work well for most types
of NTCs. The resistance values are called A (A is
RTH(50°C)/RTH(25°C)) and B (B is
RTH(90°C)/RTH(25°C)). Note that the relative
value of the NTC is always 1 at 25°C.
3. Find the relative value of RCS required for each of
the two temperatures. The relative value of RCS is
based on the percentage of change needed, which
is initially assumed to be 0.39%/°C in this
example.
The relative values are called r1 (r1 is 1/(1+ TC ×
(T1 − 25))) and r2 (r2 is 1/(1 + TC × (T2 − 25))),
where TC is 0.0039,
T1 is 50°C, and T2 is 90°C.
(eq. 8)
L
R SENSE
R CS
(eq. 9)
where RSENSE is the DCR of the output inductors.
Either RCS or RPH(x) can be chosen for added flexibility.
Due to the current drive ability of the CSCOMP pin, the RCS
resistance should be greater than 100 kW. For example,
initially select RCS to be equal to 200 kW, and then use
Equation 9 to solve for CCS:
C CS +
330 nH
0.8 mW
200 kW
+ 2.1 nF
(eq. 10)
If CCS is not a standard capacitance, RCS can be tuned. For
example, if the optimal CCS capacitance is 1.5 nF, adjust RCS
to 280 kW. For best accuracy, CCS should be a 5% NPO
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28
ADP3208D
allows a maximum VCORE overshoot (VOSMAX) of 10 mV
more than the VID voltage for a step−off load current.
4. Compute the relative values for rCS1, rCS2, and rTH
by using the following equations:
ȡ
ȧ
Ȣn ǒR
r CS2 +
(A * B)
A
r CS1 +
r1
(1 * B)
(1 * B)
r1 * B
r2 ) B
(1 * A)
(1 * A)
r1
1
1*r
*r
r 2 * (A * B)
1
*r
1
C X(MAX) v
CS2
1
1
1*r
CS2
*r
5. Calculate RTH = rTH × RCS, and then select a
thermistor of the closest value available. In
addition, compute a scaling factor k based on the
ratio of the actual thermistor value used relative to
the computed one:
k+
k
R CS2 + R CS
((1 * k) ) (k
O
V VID
(eq. 15)
V VID
RO 2
ǒ
1 ) tv
where:
k + −1n
V VID
n
Ǔ ȣȧ
k
Vv
RO
L
2
* 1 * Cz
Ȥ
ǒ Ǔ
V ERR
VV
(eq. 17)
To meet the conditions of these expressions and the
transient response, the ESR of the bulk capacitor bank (RX)
should be less than two times the droop resistance, RO. If the
CX(MIN) is greater than CX(MAX), the system does not meet
the VID OTF and/or the deeper sleep exit specifications and
may require less inductance or more phases. In addition, the
switching frequency may have to be increased to maintain
the output ripple.
For example, if 30 pieces of 10 mF, 0805−size MLC
capacitors (CZ = 300 mF) are used, the fastest VID voltage
change is when the device exits deeper sleep, during which
the VCORE change is 220 mV in 22 ms with a setting error of
10 mV. If k = 3.1, solving for the bulk capacitance yields:
(eq. 13)
r CS1
r CS2))
DI
(eq. 16)
6. Calculate values for RCS1 and RCS2 by using the
following equations:
R CS1 + R CS
Ǔ
OSMAX
ȣ
ȧ
Ȥ
* Cz
Vv
k2
n
R TH(ACTUAL)
R TH(CALCULATED)
V
O)
Ǹ
(eq. 12)
DI O
L
ȡ
ȧ
Ȣ
1
CS1
L
C x(MIN) w
(1 * A)
CS2
r TH +
r2 * A
(eq. 14)
For example, if a thermistor value of 100 kW is selected
in Step 1, an available 0603−size thermistor with a value
close to RCS is the Vishay NTHS0603N04 NTC thermistor,
which has resistance values of A = 0.3359 and B = 0.0771.
Using the equations in Step 4, rCS1 is 0.359, rCS2 is 0.729,
and rTH is 1.094. Solving for rTH yields 241 kW, so a
thermistor of 220 kW would be a reasonable selection,
making k equal to 0.913. Finally, RCS1 and RCS2 are found
to be 72.1 kW and 166 kW. Choosing the closest 1% resistor
for RCS2 yields 165 kW. To correct for this approximation,
73.3 kW is used for RCS1.
ȡ
ȣ
330 nH @ 27.9 A
* 300 mFȧ
ȧ ǒ
Ȣ2 2.1 mW ) Ǔ 1.4375 V
Ȥ
C X(MIN) w
10 mV
27.9 A
+ 1.0 mF
COUT Selection
The required output decoupling for processors and
platforms is typically recommended by Intel. For systems
containing both bulk and ceramic capacitors, however, the
following guidelines can be a helpful supplement.
Select the number of ceramics and determine the total
ceramic capacitance (CZ). This is based on the number and
type of capacitors used. Keep in mind that the best location
to place ceramic capacitors is inside the socket; however, the
physical limit is twenty 0805−size pieces inside the socket.
Additional ceramic capacitors can be placed along the outer
edge of the socket. A combined ceramic capacitor value of
200 mF to 300 mF is recommended and is usually composed
of multiple 10 mF or 22 mF capacitors.
Ensure that the total amount of bulk capacitance (CX) is
within its limits. The upper limit is dependent on the VID
OTF output voltage stepping (voltage step, VV, in time, tV,
with error of VERR); the lower limit is based on meeting the
critical capacitance for load release at a given maximum load
step, DIO. The current version of the IMVP−6+ specification
C X(MAX) v
330 nH
3.1 2
2
ȡǸ1 ) ǒ22 ms
ȧ
Ȣ
220 mV
(2.1 mW) 2
1.4375 V
220 mV
1.4375 V
2
3.1
490 nH
Ǔ ȣȧ
2.1 mW
2
*1
Ȥ
* 300 mF + 21 mF
Using six 330 mF Panasonic SP capacitors with a typical
ESR of 7 mW each yields CX = 1.98 mF and RX = 1.2 mW.
Ensure that the ESL of the bulk capacitors (LX) is low
enough to limit the high frequency ringing during a load
change. This is tested using:
LX v CZ
RO 2
L X v 300 mF
Q2
(2.1 mW) 2
2 + 2 nH
(eq. 18)
where:
Q is limited to the square root of 2 to ensure a critically
damped system.
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29
ADP3208D
The high−side (main) MOSFET must be able to handle
two main power dissipation components: conduction losses
and switching losses. Switching loss is related to the time for
the main MOSFET to turn on and off and to the current and
voltage that are being switched. Basing the switching speed
on the rise and fall times of the gate driver impedance and
MOSFET input capacitance, the following expression
provides an approximate value for the switching loss per
main MOSFET:
LX is about 150 pH for the six SP capacitors, which is low
enough to avoid ringing during a load change. If the LX of
the chosen bulk capacitor bank is too large, the number of
ceramic capacitors may need to be increased to prevent
excessive ringing.
For this multi−mode control technique, an all ceramic
capacitor design can be used if the conditions of Equations
16, 17, and 18 are satisfied.
Power MOSFETs
For typical 20 A per phase applications, the N−channel
power MOSFETs are selected for two high−side switches
and two or three low−side switches per phase. The main
selection parameters for the power MOSFETs are VGS(TH),
QG, CISS, CRSS, and RDS(ON). Because the voltage of the
gate driver is 5.0 V, logic−level threshold MOSFETs must be
used.
The maximum output current, IO, determines the RDS(ON)
requirement for the low−side (synchronous) MOSFETs. In
the ADP3208D, currents are balanced between phases; the
current in each low−side MOSFET is the output current
divided by the total number of MOSFETs (nSF). With
conduction losses being dominant, the following expression
shows the total power that is dissipated in each synchronous
MOSFET in terms of the ripple current per phase (IR) and
the average total output current (IO):
P SF + (1 * D)
ƪǒ
IO
Ǔ
ǒ
2
n
) 1
12
n SF
Ǔƫ
IR
n SF
R RPM +
L
R RPM +
RR
(1 * D )
CR
V VID
f SW
* 0.5 kW
2
280 kW
1.150 V ) 1.0 V
0.5
(1 * 0.061)
462 kW
5 pF
1.150
300 kHz
* 500 kW + 202 kW
(eq. 22)
where RDS(MF) is the on resistance of the MOSFET.
Typically, a user wants the highest speed (low CISS)
device for a main MOSFET, but such a device usually has
higher on resistance. Therefore, the user must select a device
that meets the total power dissipation (about 0.8 W to 1.0 W
for an 8−lead SOIC) when combining the switching and
conduction losses.
For example, an IRF7821 device can be selected as the
main MOSFET (four in total; that is, nMF = 4), with
approximately CISS = 1010 pF (max) and RDS(MF) = 18 mW
(max at TJ = 120°C), and an IR7832 device can be selected
as the synchronous MOSFET (four in total; that is, nSF = 4),
with RDS(SF) = 6.7 mW (max at TJ = 120°C). Solving for the
power dissipation per MOSFET at IO = 40 A and IR = 9.0 A
yields 630 mW for each synchronous MOSFET and
590 mW for each main MOSFET. A third synchronous
MOSFET is an option to further increase the conversion
efficiency and reduce thermal stress.
Finally, consider the power dissipation in the driver for
each phase. This is best described in terms of the QG for the
MOSFETs and is given by the following equation:
2
R DS(SF)
V OUT
f SW
1.0 V
AR
(eq. 21)
(eq. 19)
(1 * D )
V VID
RT
where:
nMF is the total number of main MOSFETs.
RG is the total gate resistance.
CISS is the input capacitance of the main MOSFET.
The most effective way to reduce switching loss is to use
lower gate capacitance devices.
The conduction loss of the main MOSFET is given by the
following equation:
where:
D is the duty cycle and is approximately the output voltage
divided by the input voltage.
IR is the inductor peak−to−peak ripple current and is
approximately:
IR +
2
(eq. 20)
Knowing the maximum output current and the maximum
allowed power dissipation, the user can calculate the required
RDS(ON) for the MOSFET. For 8−lead SOIC or 8−lead
SOIC−compatible MOSFETs, the junction−to−ambient
(PCB) thermal impedance is 50°C/W. In the worst case, the
PCB temperature is 70°C to 80°C during heavy load
operation of the notebook, and a safe limit for PSF is about 0.8
W to 1.0 W at 120°C junction temperature. Therefore, for this
example (40 A maximum), the RDS(SF) per MOSFET is less
than 8.5 mW for two pieces of low−side MOSFETs. This
RDS(SF) is also at a junction temperature of about 120°C;
therefore, the RDS(SF) per MOSFET should be less than 6 mW
at room temperature, or 8.5 mW at high temperature.
Another important factor for the synchronous MOSFET
is the input capacitance and feedback capacitance. The ratio
of the feedback to input must be small (less than 10% is
recommended) to prevent accidentally turning on the
synchronous MOSFETs when the switch node goes high.
P DRV +
ƪ
f SW
2
n
ǒnMF
Q GMF ) n SF
ƫ
Q QSFǓ ) I CC
V CC
(eq. 23)
where QGMF is the total gate charge for each main MOSFET,
and QGSF is the total gate charge for each synchronous
MOSFET.
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30
ADP3208D
the ADP3208D is set with RCLIM. RCLIM can be found using
the following equation:
The previous equation also shows the standby dissipation
(ICC times the VCC) of the driver.
Ramp Resistor Selection
R LIM +
The ramp resistor (RR) is used to set the size of the internal
PWM ramp. The value of this resistor is chosen to provide
the best combination of thermal balance, stability, and
transient response. Use the following expression to
determine a starting value:
RR +
RR +
AR
3
0.5
3
CR
360 nH
5
5.2 mW
5 pF
(eq. 24)
+ 462 kW
where:
AR is the internal ramp amplifier gain.
AD is the current balancing amplifier gain.
RDS is the total low−side MOSFET ON−resistance;
CR is the internal ramp capacitor value.
Another consideration in the selection of RR is the size of
the internal ramp voltage (see Equation 25). For stability and
noise immunity, keep the ramp size larger than 0.5 V. Taking
this into consideration, the value of RR in this example is
selected as 280 kW.
The internal ramp voltage magnitude can be calculated as
follows:
VR +
VR +
AR
(1 * D)
RR
0.5
CR
1.150 V
5 pF
280 kHz
R MON +
+ 0.83 V
1*
n
2
(1*n
f
C
SW
D)
X
R
Ǔ
O
RO
I FS
(eq. 28)
Optimized compensation of the ADP3208D allows the best
possible response of the regulator’s output to a load change.
The basis for determining the optimum compensation is to
make the regulator and output decoupling appear as an output
impedance that is entirely resistive over the widest possible
frequency range, including dc, and that is equal to the droop
resistance (RO). With the resistive output impedance, the
output voltage droops in proportion with the load current at
any load current slew rate, ensuring the optimal position and
allowing the minimization of the output decoupling.
With the multi−mode feedback structure of the
ADP3208D, it is necessary to set the feedback compensation
so that the converter’s output impedance works in parallel
with the output decoupling. In addition, it is necessary to
compensate for the several poles and zeros created by the
output inductor and decoupling capacitors (output filter).
In addition to the internal ramp, there is a ramp signal on
the COMP pin due to the droop voltage and output voltage
ramps. This ramp amplitude adds to the internal ramp to
produce the following overall ramp signal at the PWM
input:
ǒ
10
R LIM
Feedback Loop Compensation Design
COMP Pin Ramp
VR
1.15 V
where:
RMON is the current monitor resistor. RMON is connected
from IMON pin to FBRTN.
RLIM is the current limit resistor.
RO is the output load line resistance.
IFS is the output current when the voltage on IMON is at full
scale.
The size of the internal ramp can be increased or
decreased. If it is increased, stability and transient response
improves but thermal balance degrades. Conversely, if the
ramp size is decreased, thermal balance improves but
stability and transient response degrade. In the denominator
of Equation 24, the factor of 3 sets the minimum ramp size
that produces an optimal combination of good stability,
transient response, and thermal balance.
V RT +
(eq. 27)
The ADP3208D has output current monitor. The IMON
pin sources a current proportional to the total inductor
current. A resistor, RMON, from IMON to FBRTN sets the
gain of the output current monitor. A 0.1 mF is placed in
parallel with RMON to filter the inductor current ripple and
high frequency load transients. Since the IMON pin is
connected directly to the CPU, it is clamped to prevent it
from going above 1.15V.
The IMON pin current is equal to the RLIM times a fixed
gain of 10. RMON can be found using the following equation:
(eq. 25)
(1 * 0.061)
462 kW
60 mA
Output Current Monitor
V VID
f SW
RO
where:
RLIM is the current limit resistor.
RO is the output load line.
ILIM is the current limit set point.
When the ADP3208D is configured for 2−phase
operation, the equation above is used to set the current limit.
When the ADP3208D switches from 2−phase to 1−phase
operation by PSI or DPRSLP signal, the current is
single−phase is one half of the current limit in 2−phase.
When the ADP3208D is configured for 1−phase
operation, the equation above is used to set the current limit.
L
R DS
AD
I LIM
(eq. 26)
where CX is the total bulk capacitance, and RO is the droop
resistance of the regulator.
For this example, the overall ramp signal is 1.85 V.
Current Limit Setpoint
To select the current limit setpoint, the resistor value for
RCLIM must be determined. The current limit threshold for
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31
ADP3208D
A Type III compensator on the voltage feedback is
adequate for proper compensation of the output filter.
Figure 43 shows the Type III amplifier used in the
ADP3208D. Figure 44 shows the locations of the two poles
and two zeros created by this amplifier.
VOLTAGE ERROR
AMPLIFIER
TA + CX
T B + (R X ) RȀ * R O)
V RT
REFERENCE
VOLTAGE
TC +
ADP3208D
COMP
TD +
FB
RA
CA
ǒ
L*
R FB
Figure 43. Voltage Error Amplifier
GAIN
–20dB/DEC
RA +
0dB
f Z1
FREQUENCY
f P2
CB +
Figure 44. Poles and Zeros of Voltage Error Amplifier
The following equations give the locations of the poles
and zeros shown in Figure 44:
2p
CA
f Z2 +
2p
C FB
f P1 +
f P2 +
RA
R FB
(eq. 31)
CB ) CA
(eq. 32)
I CRMS + D
The expressions that follow compute the time constants
for the poles and zeros in the system and are intended to yield
an optimal starting point for the design; some adjustments
may be necessary to account for PCB and component
parasitic effects (see the Tuning Procedure for ADP3208D
section):
RE + n
RO ) AD
)
2
R DS )
L
(1 * (n
n
CX
RO
Ǔ
DS
SW
(eq. 36)
RO
2
RO
(eq. 37)
n
TA
RO
RE
RB
(eq. 38)
TC
CA
(eq. 39)
TB
RB
(eq. 40)
TD
RA
(eq. 41)
In continuous inductor−current mode, the source current
of the high−side MOSFET is approximately a square wave
with a duty ratio equal to n × VOUT/VIN and amplitude that
is one−nth of the maximum output current. To prevent large
voltage transients, use a low ESR input capacitor sized for
the maximum RMS current. The maximum RMS capacitor
current occurs at the lowest input voltage and is given by:
(eq. 30)
CA ) CB
RA
(eq. 35)
CIN Selection and Input Current DI/DT Reduction
R FB
1
2p
(eq. 34)
The standard values for these components are subject to
the tuning procedure described in the Tuning Procedure for
ADP3208D section.
(eq. 29)
1
2pǒC A ) C BǓ
R
f
CZ
C FB +
1
f Z1 +
RX
(R O * RȀ) ) C Z
–20dB/DEC
f Z2
RO
RE
CX
CX
R O * RȀ
CX
D
2
V VID
CA +
f P1
A
LX
where:
R’ is the PCB resistance from the bulk capacitors to the
ceramics and is approximately 0.4 mW (assuming an 8−layer
motherboard).
RDS is the total low−side MOSFET for on resistance per
phase.
AD is 5.
VRT is 1.25 V.
LX is 150 pH for the six Panasonic SP capacitors.
The compensation values can be calculated as follows:
OUTPUT
VOLTAGE
CFB
CB
(R O * RȀ) )
RL
I CRMS + 0.18
V RT
V RT
V VID
Ǹ
n
40 A
1
D
Ǹ
2
*1
(eq. 42)
1
* 1 + 9.6 A
0.18
where IO is the output current.
In a typical notebook system, the battery rail decoupling
is achieved by using MLC capacitors or a mixture of MLC
capacitors and bulk capacitors. In this example, the input
capacitor bank is formed by eight pieces of 10 mF, 25 V MLC
capacitors, with a ripple current rating of about 1.5 A each.
V ID
D))
IO
(eq. 33)
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32
ADP3208D
Tuning Procedure for ADP3208D
Selecting Thermal Monitor Components
To monitor the temperature of a single−point hot spot, set
RTTSET1 equal to the NTC thermistor’s resistance at the
alarm temperature. For example, if the alarm temperature
for VRTT is 100°C and a Vishey thermistor
(NTHS−0603N011003J) with a resistance of 100 kW at
25°C, or 6.8 kW at 100°C, is used, the user can set RTTSET1
equal to 6.8 kW (the RTH1 at 100°C).
Set Up and Test the Circuit
1. Build a circuit based on the compensation values
computed from the design spreadsheet.
2. Connect a dc load to the circuit.
3. Turn on the ADP3208D and verify that it operates
properly.
4. Check for jitter with no load and full load
conditions.
5.0 V
VCC
Set the DC Load Line
31
ADP3208D
R
1. Measure the output voltage with no load (VNL)
and verify that this voltage is within the specified
tolerance range.
2. Measure the output voltage with a full load when
the device is cold (VFLCOLD). Allow the board to
run for ~10 minutes with a full load and then
measure the output when the device is hot
(VFLHOT). If the difference between the two
measured voltages is more than a few millivolts,
adjust RCS2 using Equation 44.
R TTSET1
TTSN
-
VRTT
30
C TT
+
R TH
R
Figure 45. Single−Point Thermal Monitoring
To monitor the temperature of multiple−point hot spots,
use the configuration shown in Figure 46. If any of the
monitored hot spots reaches the alarm temperature, the
VRTT signal is asserted. The following calculation sets the
alarm temperature:
1
R TTSET1 +
2
)
V
V
R CS2(NEW) + R CS2(OLD)
REF
1
* FD
2
V
R TH1ALARMTEMPERATURE
(eq. 43)
REF
where VFD is the forward drop voltage of the parallel diode.
Because the forward current is very small, the forward
drop voltage is very low, that is, less than 100 mV. Assuming
the same conditions used for the single−point thermal
monitoring example, that is, an alarm temperature of 100°C
and use of an NTHS−0603N011003J Vishay thermistor;
solving Equation 43 gives a RTTSET of 7.37 kW, and the
closest standard resistor is 7.32 kW (1%).
R PH(NEW) + R PH(OLD)
5.0 V
31
R TTSET1
R TTSET2
R TTSET3
R
VRTT
30
+
R OMEAS
RO
(eq. 45)
Set the AC Load Line
TTSN
-
(eq. 44)
6. Repeat Steps 4 and 5 until no adjustment of RPH is
needed. Once this is achieved, do not change RPH,
RCS1, RCS2, or RTH for the rest of the procedure.
7. Measure the output ripple with no load and with a
full load with scope, making sure both are within
the specifications.
VCC
ADP3208D
V NL * V FLHOT
3. Repeat Step 2 until no adjustment of RCS2 is needed.
4. Compare the output voltage with no load to that
with a full load using 5 A steps. Compute the load
line slope for each change and then find the
average to determine the overall load line slope
(ROMEAS).
5. If the difference between ROMEAS and RO is more
than 0.05 mW, use the following equation to adjust
the RPH values:
FD
V
V NL * V FLCOLD
C TT
R TH1
R TH2
1. Remove the dc load from the circuit and connect a
dynamic load.
2. Connect the scope to the output voltage and set it
to dc coupling mode with a time scale of
100 ms/div.
3. Set the dynamic load for a transient step of about
40 A at 1 kHz with 50% duty cycle.
4. Measure the output waveform (note that use of a
dc offset on the scope may be necessary to see the
waveform). Try to use a vertical scale of
100 mV/div or finer.
R TH3
R
Figure 46. Multiple−Point Thermal Monitoring
The number of hot spots monitored is not limited. The
alarm temperature of each hot spot can be individually set by
using different values for RTTSET1, RTTSET2, ... RTTSETn.
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33
ADP3208D
5. The resulting waveform will be similar to that
shown in Figure 47. Use the horizontal cursors to
measure VACDRP and VDCDRP, as shown in Figure
47. Do not measure the undershoot or overshoot
that occurs immediately after the step.
VDROOP
VTRAN1
VACDRP
VTRAN2
VDCDRP
Figure 48. Transient Setting Waveform, Load Step
2. If both overshoots are larger than desired, try the
following adjustments in the order shown.
a. Increase the resistance of the ramp resistor
(RRAMP) by 25%.
b. For VTRAN1, increase CB or increase the
switching frequency.
c. For VTRAN2, increase RA by 25% and decrease
CA by 25%.
If these adjustments do not change the response, it
is because the system is limited by the output
decoupling. Check the output response and the
switching nodes each time a change is made to
ensure that the output decoupling is stable.
3. For load release (see Figure 49), if VTRANREL is
larger than the value specified by IMVP−6+, a
greater percentage of output capacitance is needed.
Either increase the capacitance directly or decrease
the inductor values. (If inductors are changed,
however, it will be necessary to redesign the
circuit using the information from the spreadsheet
and to repeat all tuning guide procedures).
Figure 47. AC Loadline Waveform
6. If the difference between VACDRP and VDCDRP is
more than a couple of millivolts, use Equation 46
to adjust CCS. It may be necessary to try several
parallel values to obtain an adequate one because
there are limited standard capacitor values
available (it is a good idea to have locations for
two capacitors in the layout for this reason).
C CS(NEW) + C CS(OLD)
V ACDRP
V DCDRP
(eq. 46)
7. Repeat Steps 5 and 6 until no adjustment of CCS is
needed. Once this is achieved, do not change CCS
for the rest of the procedure.
8. Set the dynamic load step to its maximum step size
(but do not use a step size that is larger than
needed) and verify that the output waveform is
square, meaning VACDRP and VDCDRP are equal.
9. Ensure that the load step slew rate and the
powerup slew rate are set to ~150 A/ms to
250 A/ms (for example, a load step of 50 A should
take 200 ns to 300 ns) with no overshoot. Some
dynamic loads have an excessive overshoot at
powerup if a minimum current is incorrectly set
(this is an issue if a VTT tool is in use).
VTRANREL
VDROOP
Set the Initial Transient
1. With the dynamic load set at its maximum step
size, expand the scope time scale to 2 ms/div to
5 ms/div. This results in a waveform that may have
two overshoots and one minor undershoot before
achieving the final desired value after VDROOP
(see Figure 48).
Figure 49. Transient Setting Waveform, Load Release
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34
ADP3208D
Layout and Component Placement
The following guidelines are recommended for optimal
performance of a switching regulator in a PC system.
problems for the entire PC system as well as
noise−related operational problems in the
power−converter control circuitry. The switching
power path is the loop formed by the current path
through the input capacitors and the power
MOSFETs, including all interconnecting PCB
traces and planes. The use of short, wide
interconnection traces is especially critical in this
path for two reasons: it minimizes the inductance
in the switching loop, which can cause high energy
ringing, and it accommodates the high current
demand with minimal voltage loss.
2. When a power−dissipating component (for
example, a power MOSFET) is soldered to a PCB,
the liberal use of vias, both directly on the
mounting pad and immediately surrounding it, is
recommended. Two important reasons for this are
improved current rating through the vias and
improved thermal performance from vias extended
to the opposite side of the PCB, where a plane can
more readily transfer heat to the surrounding air.
To achieve optimal thermal dissipation, mirror the
pad configurations used to heat sink the MOSFETs
on the opposite side of the PCB. In addition,
improvements in thermal performance can be
obtained using the largest possible pad area.
3. The output power path should also be routed to
encompass a short distance. The output power path
is formed by the current path through the inductor,
the output capacitors, and the load.
4. For best EMI containment, a solid power ground
plane should be used as one of the inner layers and
extended under all power components.
General Recommendations
1. 1. For best results, use a PCB of four or more
layers. This should provide the needed versatility
for control circuitry interconnections with optimal
placement; power planes for ground, input, and
output; and wide interconnection traces in the rest
of the power delivery current paths. Keep in mind
that each square unit of 1 oz copper trace has a
resistance of ~0.53 mW at room temperature.
2. When high currents must be routed between PCB
layers, vias should be used liberally to create
several parallel current paths so that the resistance
and inductance introduced by these current paths is
minimized and the via current rating is not
exceeded.
3. If critical signal lines (including the output voltage
sense lines of the ADP3208D) must cross through
power circuitry, it is best if a signal ground plane
can be interposed between those signal lines and
the traces of the power circuitry. This serves as a
shield to minimize noise injection into the signals
at the expense of increasing signal ground noise.
4. An analog ground plane should be used around
and under the ADP3208D for referencing the
components associated with the controller. This
plane should be tied to the nearest ground of the
output decoupling capacitor, but should not be tied
to any other power circuitry to prevent power
currents from flowing into the plane.
5. The components around the ADP3208D should be
located close to the controller with short traces.
The most important traces to keep short and away
from other traces are those to the FB and CSSUM
pins. Refer to Figure 42 for more details on the
layout for the CSSUM node.
6. The output capacitors should be connected as close
as possible to the load (or connector) that receives
the power (for example, a microprocessor core). If
the load is distributed, the capacitors should also
be distributed and generally placed in greater
proportion where the load is more dynamic.
7. Avoid crossing signal lines over the switching
power path loop, as described in the Power
Circuitry section.
Signal Circuitry
1. The output voltage is sensed and regulated
between the FB and FBRTN pins, and the traces of
these pins should be connected to the signal
ground of the load. To avoid differential mode
noise pickup in the sensed signal, the loop area
should be as small as possible. Therefore, the FB
and FBRTN traces should be routed adjacent to
each other, atop the power ground plane, and back
to the controller.
2. The feedback traces from the switch nodes should
be connected as close as possible to the inductor.
The CSREF signal should be Kelvin connected to
the center point of the copper bar, which is the
VCORE common node for the inductors of all the
phases.
3. On the back of the ADP3208D package, there is a
metal pad that can be used to heat sink the device.
Therefore, running vias under the ADP3208D is
not recommended because the metal pad may
cause shorting between vias.
Power Circuitry
1. The switching power path on the PCB should be
routed to encompass the shortest possible length to
minimize radiated switching noise energy (that is,
EMI) and conduction losses in the board. Failure
to take proper precautions often results in EMI
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35
ADP3208D
ORDERING INFORMATION
Device
ADP3208DJCPZ−RL
Temperature Range
Package
Package Option
Shipping†
−10°C to 100°C
48−Lead Frame Chip Scale
Package [LFCSP_VQ]
CP−48−1
2500 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*The “Z” suffix indicates Pb−Free part.
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36
ADP3208D
PACKAGE DIMENSIONS
LFCSP48 7x7, 0.5P
CASE 932AD−01
ISSUE A
D
A
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSIONS: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.30mm FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
B
D1
PIN ONE
REFERENCE
E1
E
DIM
A
A1
A3
b
D
D1
D2
E
E1
E2
e
H
K
L
M
0.20 C
TOP VIEW
0.20 C
H
(A3)
0.10 C
A
NOTE 4
0.08 C
A1
SIDE VIEW
C
4X
M
D2
K
4X
SEATING
PLANE
MILLIMETERS
MIN
MAX
0.80
1.00
0.00
0.05
0.20 REF
0.18
0.30
7.00 BSC
6.75 BSC
4.95
5.25
7.00 BSC
6.75 BSC
4.95
5.25
0.50 BSC
−−−
12 °
0.20
−−−
0.30
0.50
−−−
0.60
SOLDERING FOOTPRINT*
7.30
M
5.14
13
48X
0.63
25
1
E2
PIN 1
INDICATOR
48X
5.14
L
7.30
1
48
37
e
48X
BOTTOM VIEW
b
0.10 C A B
0.05 C
PACKAGE
OUTLINE
NOTE 3
48X
0.50
PITCH
0.28
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
All brand names and product names appearing in this document are registered trademarks or trademarks of their respective holders.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
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Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
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For additional information, please contact your local
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ADP3208D/D