INTEL AN82527

82527
SERIAL COMMUNICATIONS CONTROLLER
CONTROLLER AREA NETWORK PROTOCOL
Automotive
Y
Y
Y
Y
Supports CAN Specification 2.0
Ð Standard Data and Remote Frames
Ð Extended Data and Remote Frames
Programmable Global Mask
Ð Standard Message ldentifier
Ð Extended Message ldentifier
15 Message Objects of 8-Byte Data
Length
Ð 14 Tx/Rx Buffers
Ð 1 Rx Buffer with Programmable Mask
Flexible CPU Interface
Ð 8-Bit Multiplexed
Ð 16-Bit Multiplexed
Ð 8-Bit Non-Multiplexed
(Synchronous/Asynchronous)
Ð Serial Interface
Y
Programmable Bit Rate
Y
Programmable Clock Output
Y
Flexible Interrupt Structure
Y
Flexible Status Interface
Y
Configurable Output Driver
Y
Configurable Input Comparator
Y
Two 8-Bit Bidirectional I/O Ports
Y
44-Lead PLCC Package
Y
44-Lead QFP Package
Y
Pinout Compatibility with the 82526
The 82527 serial communications controller is a highly integrated device that performs serial communication
according to the CAN protocol. It performs all serial communication functions such as transmission and
reception of messages, message filtering, transmit search, and interrupt search with minimal interaction from
the host microcontroller, or CPU.
The 82527 is Intel’s first device to support the standard and extended message frames in CAN Specification
2.0 Part B. It has the capability to transmit, receive, and perform message filtering on extended message
frames. Due to the backwardly compatible nature of CAN Specification 2.0, the 82527 also fully supports the
standard message frames in CAN Specification 2.0 Part A.
The 82527 features a powerful CPU interface that offers flexibility to directly interface to many different CPUs.
It can be configured to interface with CPUs using an 8-bit multiplexed, 16-bit multiplexed, or 8-bit non-multiplexed address/data bus for Intel and non-Intel architectures. A flexible serial interface (SPI) is also available
when a parallel CPU interface is not required.
The 82527 provides storage for 15 message objects of 8-byte data length. Each message object can be
configured as either transmit or receive except for the last message object. The last message object is a
receive-only buffer with a special mask design to allow select groups of different message identifiers to be
received.
The 82527 also implements a global masking feature for message filtering. This feature allows the user to
globally mask any identifier bits of the incoming message. The programmable global mask can be used for
both standard and extended messages.
The 82527 PLCC offers hardware, or pinout, compatibility with the 82526. It is pin-to-pin compatible with the
82526 except for pins 9, 30, and 44. These pins are used as chip selects on the 82526 and are used as CPU
interface mode selection pins on the 82527.
The 82527 is fabricated using Intel’s reliable CHMOS III 5V technology and is available in either 44-lead PLCC
or 44-lead QFP for the automotive temperature range ( b 40§ C to a 125§ C).
*Other brands and names are the property of their respective owners.
Information in this document is provided in connection with Intel products. Intel assumes no liability whatsoever, including infringement of any patent or
copyright, for sale and use of Intel products except as provided in Intel’s Terms and Conditions of Sale for such products. Intel retains the right to make
changes to these specifications at any time, without notice. Microcomputer Products may have minor variations to this specification known as errata.
COPYRIGHT © INTEL CORPORATION, 1995
December 1995
Order Number: 272250-006
82527
272250 – 1
Figure 1. 82527 Block Diagram
272250 – 2
Figure 2. 44-Pin PLCC Package
2
82527
272250 – 15
Figure 3. 44-Pin QFP Package
3
82527
PIN DESCRIPTION
The 82527 pins are described in this section. Table 1 presents the legend for interpreting the pin types.
Table 1. Pin Type Legend
Symbol
I
O
I/O
Description
Input only pin
Output only pin
Pin can be either input or output
PIN DESCRIPTIONS
Pin Name
4
Pin Type
Pin Description
VSS1
Ground
GROUND connection must be connected externally to a VSS board plane.
Provides digital ground.
VSS2
Ground
GROUND connection must be connected externally to a VSS board plane.
Provides ground for analog comparator.
VCC
Power
POWER connection must be connected externally to a 5V DC. Provides power
for entire device.
XTAL1
I
Input for an external clock. XTAL1 (along with XTAL2) are the crystal
connections to an internal oscillator.
XTAL2
O
Push-pull output from the internal oscillator. XTAL2 (along with XTAL1) are the
crystal connections to an internal oscillator. If an external oscillator is used
XTAL2 must be floated, or not be connected. XTAL2 must not be used as a
clock output to drive other CPUs.
CLKOUT
O
Programmable clock output. This output may be used to drive the oscillator of
the host microcontroller.
RESETÝ
I
Warm Reset: (VCC remains valid while RESETÝ is asserted), RESETÝ must be
driven to a valid low level for 1 ms minimum.
Cold Reset: (VCC is driven to a valid level while RESETÝ is asserted), RESETÝ
must be driven low for 1 ms minimum measured from a valid VCC level. No
falling edge on the reset pin is required during a cold reset event.
CSÝ
I
A low level on this pin enables CPU access to the 82527 device.
INTÝ
(VCC/2)
O
O
The interrupt pin is an open-drain output to the host microcontroller. VCC/2 is
the power supply for the ISO low speed physical layer. The function of this pin is
determined by the MUX bit in the CPU Interface Register (Address 02H) as
follows:
MUX e 1: pin 24 (PLCC) e VCC/2, pin 11 e INTÝ
MUX e 0: pin 24 (PLCC) e INTÝ
RX0
RX1
I
I
Inputs from the CAN bus line(s) to the input comparator. A recessive level is
read when RX0 l RX1. A dominant level is read when RX1 l RX0. When the
CoBy bit (Bus Configuration register) is programmed as a ‘‘1’’, the input
comparator is bypassed and RX0 is the CAN bus line input.
TX0
TX1
O
O
Serial data push-pull output to the CAN bus line. During a recessive bit TX0 is
high and TX1 is low. During a dominant bit TX0 is low and TX1 is high.
82527
Pin Name
Pin Type
AD0/A0/ICP
AD1/A1/CP
AD2/A2/CSAS
AD3/A3/STE
AD4/A4/MOSI
AD5/A5
AD6/A6/SCLK
AD7/A7
I/O-I-I
I/O-I-I
I/O-I-I
I/O-I
I/O-I-I
I/O-I
I/O-I-I
I/O-I
Address/Data bus in 8-bit multiplexed mode.
Address bus in 8-bit non-multiplexed mode.
Low byte of A/D bus in 16-bit multiplexed mode.
In Serial Interface mode, the following pins have the following meaning:
AD0:
ICP
Idle Clock Polarity
AD1:
CP
Clock Phase
AD2:
CSAS
Chip Select Active State
AD3:
STE
Sync Transmit Enable
AD6:
SCLK
Serial Clock Input
AD4:
MOSI
Serial Data Input
AD8/D0/P1.0
AD9/D1/P1.1
AD10/D2/P1.2
AD11/D3/P1.3
AD12/D4/P1.4
AD13/D5/P1.5
AD14/D6/P1.6
AD15/D7/P1.7
I/O-O-I/O
I/O-O-I/O
I/O-O-I/O
I/O-O-I/O
I/O-O-I/O
I/O-O-I/O
I/O-O-I/O
I/O-O-I/O
High byte of A/D bus in 16-bit multiplexed mode.
Data bus in 8-bit non-multiplexed mode.
Low speed I/O port. P1 pins in 8-bit multiplexed mode and serial mode.
Port pins have weak pullups until the port is configured by writing to 9FH
and AFH.
P2.0
P2.1
P2.2
P2.3
P2.4
P2.5
P2.6/INTÝ
P2.7/WRHÝ
I/O
I/O
I/O
I/O
I/O
I/O
I/O-O
I/O-I
Pin Description
P2 in all modes.
P2.6 is INTÝ when MUX e 1 and is open-drain.
P2.7 is WRHÝ in 16-bit multiplexed mode.
Mode0
Mode1
I
I
These pins select one of the four parallel interfaces. These pins are
weakly held low during reset.
Mode1
Mode0
0
0
8-bit multiplexed Ð Intel
0
0
Serial Interface mode entered when RDÝ e 0,
WRÝ e 0 upon reset.
0
1
16-bit multiplexed Ð Intel
1
0
8-bit multiplexed Ð non-Intel
1
1
8-bit non-multiplexed
ALE/AS
I-I
ALE used for Intel modes.
AS used for non-Intel modes, except Mode 3 this pin must be tied high.
RDÝ
E
I
I
RDÝ used for Intel modes.
E used for non-Intel modes, except Mode 3 Asynchronous this pin must
be tied high.
WRÝ/WRLÝ
R/WÝ
I
I
WRÝ in 8-bit Intel mode and WRLÝ in 16-bit Intel mode.
R/WÝ used for non-Intel modes.
READY
MISO
O
O
READY is an output to synchronize accesses from the host
microcontroller to the 82527. READY is an open-drain output to the host
microcontroller. MISO is the serial data output for the serial interface
mode.
DSACK0Ý
O
DSACK0Ý is an open-drain output to synchronize accesses from the host
microcontroller to the 82527.
5
82527
ELECTRICAL CHARACTERISTICS
NOTICE: This is a production data sheet. The specifications are subject to change without notice.
ABSOLUTE MAXIMUM RATINGS*
*WARNING: Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage.
These are stress ratings only. Operation beyond the
‘‘Operating Conditions’’ is not recommended and extended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability.
Storage Temperature ÀÀÀÀÀÀÀÀÀÀ b 60§ C to a 150§ C
Voltage from Any Pin
to VSS ÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ b 0.5V to a 7.0V
Laboratory testing shows the 82527 will withstand
up to 10 mA of injected current into both RX0 and
RX1 pins for a total of 20 days without sustaining
permanent damage. This high current condition may
be the result of shorted signal lines. The 82527 will
not function properly if the RX0/RX1 input voltage
exceeds VCC a 0.5V.
D.C. Characteristics VCC e 5V g 10%; TA e b 40§ C to a 125§ C
Symbol
6
Min
Max
VIL
Input Low Voltage (All except RX0, RX1,
AD0–AD7 in Mode 3)
Parameter
b 0.5V
0.8V
VIL1
Input Low Voltage for AD0–AD7 in
Mode 3
b 0.5V
0.5V
VIL2
Input Low Voltage (RX0) for Comparator
Bypass Mode
0.5V
VIL3
Input Low Voltage for Port 1 and Port 2
Pins Not Used for Interface to Host CPU
0.3 VCC
VIH
Input High Voltage (All except RX0, RX1,
RESETÝ)
VIH1
Input High Voltage (RESETÝ)
Hysteresis on RESETÝ
VIH2
Input High Voltage (RX0) for Comparator
Bypass Mode
4.0V
VIH3
Input High Voltage for Port 1 and Port 2
Pins Not Used for Interface to Host CPU
0.7 VCC
VOL
Output Low Voltage (All Outputs except
TX0, TX1)
VOH
Output High Voltage (All Outputs except
TX0, TX1, CLOCKOUT)
VOHR1
Output High Voltage (CLOCKOUT)
ILK
Input Leakage Current
CIN
PIN Capacitance**
3.0V
VCC a 0.5V
3.0V
200 mV
VCC a 0.5V
0.45V
VCC b 0.8V
Conditions
IOL e 1.6 mA
IOH e b 200 mA
0.8 VCC
IOH e b 80 mA
g 10 mA
10 pF
VSS k VIN k VCC
fXTAL e 1 KHz
82527
D.C. Characteristics VCC e 5V g 10%; TA e b 40§ C to a 125§ C
Symbol
Max
Conditions
ICC
Supply Current(1)
50 mA
fXTAL e 16 MHz
ISLEEP
Sleep Current(1)
with VCC/2 Output Enabled, No Load
with VCC/2 Output Disabled
700 mA
100 mA
Powerdown Current(1)
25 mA
IPD
Parameter
Min
XTAL1 Clocked
NOTES:
**Typical value based on characterization data.
Port pins are weakly held after reset until the port configuration registers are written (9FH, AFH).
1. All pins are driven to VSS or VCC including RX0 and RX1.
PHYSICAL LAYER SPECIFICATIONS
Load Condition: 100 pF
D.C. Characteristics VCC e 5V g 10%; TA e b 40§ C to a 125§ C
RX0/RX1 and TX0/TX1
Min
Max
b 0.5V
VCC a 0.5V
Common Mode Range
VSS a 1V
VCC b 1V
Differential Input Threshold
g 100 mV
Input Voltage
Conditions
Internal Delay 1: Sum of the Comparator Input
Delay and the TX0/TX1 Output Driver Delay
60 ns
Load on TX0, TX1 e
100 pF, a 100 mV to
b 100 mV RX0/RX1
differential
Internal Delay 2: Sum of the RX0 Pin Delay (if
the Comparator is Bypassed) and the TX0/TX1
Output Driver Delay
50 ns
Load on TX0, TX1 e
100 pF
b 10 mA
VOUT e VCC b 1.0V
Source Current on Each TX0, TX1
Sink Current on Each TX0, TX1
10 mA
Input Hysteresis for RX0/RX1
0V
VOUT e 1.0V
VCC/2
VCC/2
2.38V
2.62V
IOUT s 75 mA, VCC e 5V
CLOCKOUT SPECIFICATIONS
Load Condition: 50 pF
Parameter
Min
Max
CLOCKOUT Frequency
XTAL/15
XTAL
7
82527
A.C. Characteristics for 8/16-Bit Multiplexed Intel Modes (Modes 0, 1)
Conditions: VCC e 5V g 10%, VSS e 0V, TA e b 40§ C to a 125§ C, CL e 100 pF
Min
Max
1/tXTAL
Symbol
Oscillator Frequency
Parameter
8 MHz
16 MHz
1/tSCLK
System Clock Frequency
4 MHz
10 MHz
1/tMCLK
Memory Clock Frequency
2 MHz
8 MHz
tAVLL
Address Valid to ALE Low
7.5 ns
tLLAX
Address Hold after ALE Low
10 ns
tLHLL
ALE High Time
30 ns
tLLRL
ALE Low to RDÝ Low
20 ns
tCLLL
CSÝ Low to ALE Low
10 ns
tQVWH
Data Setup to WRÝ High
27 ns
tWHQX
Input Data Hold after WRÝ High
10 ns
tWLWH
WRÝ Pulse Width
30 ns
tWHLH
WRÝ High to Next ALE High
8 ns
tWHCH
WRÝ High to CSÝ High
0 ns
tRLRH
RDÝ Pulse Width
This time is long enough to initiate a double
read cycle by loading the High Speed
Registers (04H, 05H), but is too short to
READ from 04H and 05H (See tRLDV)
40 ns
tRLDV
RDÝ Low to Data Valid
(Only for Registers 02H, 04H, 05H)
0 ns
tRLDV1
RDÝ Low Data to Data Valid (for Registers
except 02H, 04H, 05H)
for Read Cycle without a Previous Write(1)
for Read Cycle with a Previous Write(1)
tRHDZ
Data Float after RDÝ High
tCLYV
CSÝ Low to READY Setup
Condition: Load Capacitance on the READY
Output: 50 pF
8
Conditions
55 ns
1.5 tMCLK a 100 ns
3.5 tMCLK a 100 ns
0 ns
45 ns
32 ns
40 ns
tWLYZ
WRÝ Low to READY Float for a Write Cycle
if No Previous Write is Pending(2)
145 ns
tWHYZ
End of Last Write to READY Float for a Write
Cycle if a Previous Write Cycle is Active(2)
2 tMCLK a 100 ns
tRLYZ
RDÝ Low to READY Float
(for registers except 02H, 04H, 05H)
for Read Cycle without a Previous Write(1)
for Read Cycle with a Previous Write(1)
2 tMCLK a 100 ns
4 tMCLK a 100 ns
VOL e 1.0V
VOL e 0.45V
82527
A.C. Characteristics for 8/16-Bit Multiplexed Intel Modes (Modes 0, 1)
Conditions: VCC e 5V g 10%, VSS e 0V, TA e b 40§ C to a 125§ C, CL e 100 pF (Continued)
Parameter
Min
Max
tWHDV
Symbol
WRÝ High to Output Data Valid
on Port 1/2
tMCLK
2 tMCLK a 500 ns
tCOPO
CLKOUT Period
tCHCL
CLKOUT High Period
Conditions
(CDV a 1) * tOSC(3)
(CDV a 1) * (/2 tOSC b 10 (CDV a 1) * (/2 tOSC a 15
NOTES:
References to WRÝ also pertain to WRHÝ.
1. Definition of ‘‘read cycle without a previous write’’: The time between the rising edge of WRÝ/WRHÝ (for the previous
write cycle) and the falling edge of RDÝ (for the current read cycle) is greater than 2 tMCLK.
2. Definition of ‘‘write cycle with a previous write’’: The time between the rising edge of WRÝ/WRHÝ (for the previous write
cycle) and the rising edge of WRÝ/WRHÝ (for the current write cycle) is less than 2 tMCLK.
3. Definition of CDV is the value loaded in the CLKOUT register representing the CLKOUT divisor.
A.C. Characteristics for 8/16-Bit Multiplexed Intel Modes (Modes 0, 1)
272250 – 3
9
82527
A.C. Characteristics for 8/16-Bit Multiplexed Intel Modes (Modes 0, 1)
Ready Output Timing for a Write Cycle if No Previous Write is Pending
272250 – 4
Ready Output Timing for a Write Cycle if a Previous Write Cycle is Active
272250 – 5
Ready Output Timing for a Read Cycle
272250 – 6
10
82527
A.C. Characteristics for 8-Bit Multiplexed Non-Intel Mode (Mode 2)
Conditions: VCC e 5V g 10%, VSS e 0V, TA e b 40§ C to a 125§ C, CL e 100 pF
Min
Max
1/tXTAL
Symbol
Oscillator Frequency
Parameter
8 MHz
16 MHz
1/tSCLK
System Clock Frequency
4 MHz
10 MHz
1/tMCLK Memory Clock Frequency
2 MHz
8 MHz
tAVSL
Address Valid to AS Low
7.5 ns
tSLAX
Address Hold after AS Low
10 ns
tELDZ
Data Float after E Low
0 ns
45 ns
tEHDV
E High to Data Valid for Registers 02H,
04H, 05H
0 ns
45 ns
for Read Cycle without a Previous Write(1)
for Read Cycle with a Previous Write
(for Registers except for 02H, 04H, 05H)
1.5 tMCLK a 100 ns
3.5 tMCLK a 100 ns
tQVEL
Data Setup to E Low
30 ns
tELQX
Input Data Hold after E Low
20 ns
tELDV
E Low to Output Data Valid on Port 1/2
tMCLK
tEHEL
E High Time
tELEL
End of Previous Write (Last E Low) to E
Low for a Write Cycle
tSHSL
AS High Time
tRSEH
Setup Time of R/WÝ to E High
30 ns
tSLEH
AS Low to E High
20 ns
tCLSL
CSÝ Low to AS Low
20 ns
tELCH
E Low to CSÝ High
0 ns
tCOPD
CLKOUT Period
tCHCL
CLKOUT High Period
2 tMCLK a 500 ns
45 ns
2 tMCLK
30 ns
(CDV a 1) * tOSC(3)
(CDV a 1) * (/2 tOSC b 10 (CDV a 1) * (/2tOSC a 15
NOTES:
1. Definition of ‘‘Read Cycle without a Previous Write’’: The time between the falling edge of E (for the previous write cycle)
and the rising edge of E (for the current read cycle) is greater than 2 tMCLK.
2. Definition of ‘‘Write Cycle with a Previous Write’’: The time between the falling edge of E (for the previous write cycle) and
the falling edge of E (for the current write cycle) is less than 2 tMCLK.
3. Definition of CDV is the value loaded in the CLKOUT register representing the CLKOUT divisor.
11
82527
A.C. Characteristics for 8-Bit Multiplexed Non-Intel Mode (Mode 2)
272250 – 7
12
82527
A.C. Characteristics for 8-Bit Non-Multiplexed Asynchronous (Mode 3)
Conditions: VCC e 5V g 10%, VSS e 0V, TA e b 40§ C to a 125§ C, CL e 100 pF
Symbol
Min
Max
8 MHz
16 MHz
1/tSCLK System Clock Frequency
4 MHz
10 MHz
1/tMCLK Memory Clock Frequency
2 MHz
8 MHz
1/tXTAL
Parameter
Oscillator Frequency
tAVCL
Address or R/WÝ Valid to CSÝ Low
Setup
3 ns
tCLDV
CSÝ Low to Data Valid
for High Speed Registers (02H, 04H, 05H)
0 ns
55 ns
For Low Speed Registers
(Read Cycle without Previous Write)(1)
0 ns
1.5 tMCLK a 100 ns
For Low Speed Registers
(Read Cycle with Previous Write)(1)
0 ns
3.5 tMCLK a 100 ns
tKLDV
DSACK0Ý Low to Output Data Valid
for High Speed Read Register
23 ns
For Low Speed Read Register
k 0 ns
tCHDV
82527 Input Data Hold after CSÝ High
15 ns
tCHDH
82527 Output Data Hold after CSÝ High
0 ns
tCHDZ
CSÝ High to Output Data Float
tCHKH1
CSÝ High to DSACK0Ý e 2.4V(3)
tCHKH2
CSÝ High to DSACK0Ý e 2.8V
tCHKZ
CSÝ High to DSACK0Ý Float
0 ns
tCHCL
CSÝ Width between Successive Cycles
25 ns
tCHAI
CSÝ High to Address Invalid
7 ns
tCHRI
CSÝ High to R/WÝ Invalid
5 ns
tCLCH
CSÝ Width Low
65 ns
tDVCH
CPU Write Data Valid to CSÝ High
20 ns
tCLKL
CSÝ Low to DSACK0Ý Low
0 ns
67 ns
0 ns
2 tMCLK a 145 ns
35 ns
0 ns
55 ns
150 ns
100 ns
for High Speed Registers and Low Speed
Registers Write Access without Previous
Write(2)
tCHKL
End of Previous Write (CSÝ High) to
DSACK0Ý Low for a Write Cycle with a
Previous Write(2)
tCOPD
CLKOUT Period
tCHCL
CLKOUT High Period
(CDV a 1) * tOSC(4)
(CDV a 1) * (/2 tOSC b 10 (CDV a 1) * (/2 tOSC a 15
NOTES:
E and AS must be tied high in this mode.
1. Definition of ‘‘Read Cycle without a Previous Write’’: The time between the rising edge of CSÝ (for the previous write
cycle) and the falling edge of CSÝ (for the current read cycle) is greater than 2 tMCLK.
2. Definition of ‘‘Write Cycle without a Previous Write’’: The time between the rising edge of CSÝ (for the previous write
cycle) and the rising edge of CSÝ (for the current write cycle) is greater than 2 tMCLK.
3. An on-chip pullup will drive DSACK0Ý to approximately 2.4V. An external pullup is required to drive this signal to a higher
voltage.
4. Definition of CDV is the value loaded in the CLKOUT register representing the CLKOUT divisor.
13
82527
A.C. Characteristics for 8-Bit Non-Multiplexed Asynchronous Mode (Mode 3)
Timing of the Asynchronous Mode
(Read Cycle)
272250 – 10
A.C. Characteristics for 8-Bit Non-Multiplexed Asynchronous Mode (Mode 3)
Timing of the Asynchronous Mode
(Write Cycle)
272250 – 11
14
82527
A.C. Characteristics for 8-Bit Non-Multiplexed Synchronous Mode (Mode 3)
Conditions: VCC e 5V g 10%, VSS e 0V, TA e b 40§ C to a 125§ C, CL e 100 pF
Min
Max
1/tXTAL
Symbol
Oscillator Frequency
Parameter
8 MHz
16 MHz
1/tSCLK
System Clock Frequency
4 MHz
10 MHz
1/tMCLK
Memory Clock Frequency
2 MHz
8 MHz
tEHDV
E High to Data Valid out of High Speed
Register (02H, 04H, 05H)
55 ns
Read Cycle without Previous Write for
Low Speed Registers(1)
1.5 tMCLK a 100 ns
Read Cycle with Previous Write for
Low Speed Registers(1)
3.5 tMCLK a 100 ns
tELDH
Data Hold after E Low for a Read
Cycle
5 ns
tELDZ
Data Float after E Low
tELDV
Data Hold after E Low for a Write Cycle
15 ns
tAVEH
Address and R/WÝ to E Setup
25 ns
tELAV
Address and R/WÝ Valid after E Falls
15 ns
tCVEH
CSÝ Valid to E High
0 ns
tELCV
CSÝ Valid after E Low
0 ns
tDVEL
Data Setup to E Low
55 ns
tEHEL
E Active Width
100 ns
tAVAV
Start of a Write Cycle after a Previous
Write Access
2 tMCLK
tAVCL
Address or R/WÝ to CSÝ Low Setup
3 ns
tCHAI
CSÝ High to Address Invalid
7 ns
tCOPD
CLKOUT Period
tCHCL
CLKOUT High Period
35 ns
(CDV a 1) * tOSC(2)
(CDV a 1) * (/2 tOSC b 10
(CDV a 1) * (/2 tOSC a 15
NOTES:
1. Definition of ‘‘Read Cycle without a Previous Write’’: The time between the falling edge of E (for the previous write cycle)
and the rising edge of E (for the current read cycle) is greater than 2 tMCLK.
2. Definition of CDV is the value loaded in the CLKOUT register representing the CLKOUT divisor.
15
82527
A.C. Characteristics for 8-Bit Non-Multiplexed Synchronous Mode (Mode 3)
Timing of the Synchronous Mode
(Read Cycle)
272250 – 8
A.C. Characteristics for 8-Bit Non-Multiplexed Synchronous Mode (Mode 3)
Timing of the Synchronous Mode
(Write Cycle)
272250 – 9
16
82527
A.C. Characteristics for Serial Interface Mode
Conditions: VCC e 5V g 10%, VSS e 0V, TA e b 40§ C to a 125§ C, CL e 100 pF
Symbol
Parameter
Min
Max
0.5 MHz
8 MHz
1/SCLK
125 ns
2000 ns
Minimum Clock High Time
84 ns
tSKLO
Minimum Clock Low Time
84 ns
tLEAD
ENABLE Lead Time
70 ns
tLAG
Enable Lag Time
109 ns
tACC
Access Time
tPDO
Maximum Data Out Delay Time
tHO
Minimum Data Out Hold Time
tDIS
Maximum Data Out Disable Time
tSETUP
Minimum Data Setup Time
35 ns
tHOLD
Minimum Data Hold Time
84 ns
tRISE
Maximum Time for Input to go
from VOL to VOH
100 ns
tFALL
Maximum Time for Input to go
from VOH to VOL
100 ns
tCS
Minimum Time between
Consecutive CSÝ Assertions
tCOPD
CLKOUT Period
tCHCL
CLKOUT High Period
SCLK
SPI Clock
tCYC
tSKHI
60 ns
59 ns
0 ns
665 ns
670 ns
(CDV a 1) * tOSC(1)
(CDV a 1) * (/2 tOSC b 10
(CDV a 1) * (/2 tOSC a 15
NOTE:
1. Definition of CDV is the value loaded in the CLKOUT register representing the CLKOUT divisor.
17
82527
A.C. Characteristics for Serial Interface Mode
272250 – 12
272250 – 13
DATA SHEET REVISION HISTORY
A.C. TESTING INPUT
Input, Output Waveforms
272250 – 14
NOTE:
AC Inputs during testing are driven at VCC b 0.5V for a
Logic ‘‘1’’ and 0.1V for a Logic ‘‘0’’. Timing measurements are made at VOH Min for a Logic ‘‘1’’ and VOL
Max for a Logic ‘‘0’’.
18
This is the -006 revision of the 82527 data sheet.
The following differences exist between the -005
version and the -006 revision. There were no specification changes between the -004 version and the
-005 revision.
1. The 82527 44-ld QFP was added to the product
description, the pinmap for the QFP package is
also included.
2. The pin numbers were removed from the pin description list to accommodate the new 44-ld QFP
package.
82527
3. Removed XTAL1 and XTAL2 from the exceptions for VIL spec. XTAL1 VIL is now specified at
min e b 0.5V, max e 0.8V. XTAL2 is an output.
This is the -004 revision of the 82527 data sheet.
The following differences exist between the -003
version and the -004 revision.
4. Removed XTAL1 and XTAL2 from the exceptions for VIH spec. XTAL1 VIH is now specified at
min e 3.0V, max e VCC a 0.5V. XTAL2 is an
output.
1. Remove notice on page 1 concerning Advance
Information Data Sheet.
5. Source and Sink current for TX0 and TX1 were
corrected from minimum values to maximum values.
6. Mode 2; The tAVSL specification was decreased
to 7.5 ns from 33 ns.
3. Page 4, E pin description, add ‘‘pin tied high in
mode 3’’.
4. Page 5, add VIH e 0.7 VCC and VIL e 0.3 VCC
for LSIO port pins (pins not used to interface to
host-CPU).
7. Mode 2; The tSLAX specification was decreased
to 10 ns from 20 ns.
8. Mode 3, Asynchronous; The tDVCH specification
was decreased to 20 ns from 32 ns.
5. Page 6, change Differential Input Threshold
from MAX spec to MIN spec.
6. Page 6, add Input Hysteresis spec for RX0/RX1
e 0V maximum.
9. All modes; Two specifications were added for
CLKOUT. These specifications are tCOPD
(CLKOUT Period) e (CDV a 1)*tOSC, and tCHCL
(CLKOUT High Period) e min (CDv a 1) * (/2
tOSC b 10 ns and max (CDV a 1) * (/2 tOSC a
15 ns. NOTE: CDV represented the value loaded
in the lower nibble of the CLKOUT Register
(1FH).
10. Serial Interface Mode; The maximum SCLK (SPI
Clock) rate was increased to 8 MHz from 4.2
MHz. The minimum tCYC (1/SCLK) was set at
125 ns from 238 ns to reflect the increased maximum SPI clock rate.
11. MODE0/1, the tWHQX Specifications was decreased to 10 ns from 12.5 ns.
7. Page 7, tLLAX decreased from 20 ns to 10 ns (to
interface to 20 MHz C196).
8. Page 7, tQVWH decreased from 30 ns to 27 ns
(to interface to 20 MHz C196).
9. Page 7, tWLWH decreased from 40 ns to 30 ns
(to interface to 20 MHz C196).
10. Page 7, tRLDV increased from 45 ns to 55 ns.
11. Page 12, tCHKH specification added for VIH e
2.8V e 150 ns.
12. Page 12, tCHAI decreased from 10 ns to 7 ns.
2. Page 4, AS pin description, add ‘‘pin tied high in
Asycnhronous mode 3’’.
13. Page 13, timing diagram for tAVCL revised to
show common CL low level.
14. Page 14, tCHAI decreased from 10 ns to 7 ns.
19
82527
15. Page 7, tCLLL decreased from 20 ns to 10 ns.
16. Page 3, RESETÝ description addition:
Warm reset: (VCC remains valid while RESETÝ
is asserted), RESETÝ must be driven to a valid
low level for 1 ms minimum.
Cold reset: (VCC is driven to a valid level while
RESETÝ is asserted, RESETÝ must be driven
low for 1 ms minimum measured from a valid
VCC level. No falling edge on the reset pin is
required during a cold reset event.
17. Page 2, Figure 2: Pin 7 name changed to
(WRÝ/WRLÝ)/(R/WÝ) from WRÝ/(R/WÝ).
18. Page 4, pin description name changed to
(WRÝ/WRLÝ)/(R/WÝ) from WRÝ/(R/WÝ)
and WRÝ in 8-bit Intel mode and WRLÝ in
16-bit Intel mode replaces the description WRÝ
used for Intel modes.
19. Page 5, ABSOLUTE MAXIMUM RATINGS addition: Laboratory testing shows the 82527 will
withstand up to 10 mA for injected current into
both RX0 and RX1 pins for a total of 20 days
without sustaining permanent damage. This
high current condition may be the result of
shorted signal lines. The 82527 will not function
properly if the RX0/RX1 input voltage exceeds
VCC a 0.5V.
20. Page 12, tCHDV decreased from 25 ns to 15 ns.
21. Page 14, tELDV decreased from 25 ns to 15 ns.
22. Page 7, tAVLL decreased from 20 ns to 7.5 ns.
23. Page 7, tWHQX decreased from 20 ns to 12.5 ns.
This is the -003 revision of the 82527 data sheet.
The following differences exist between the -002
version and the -003 revision.
1. The data sheet has been revised to ADVANCE
from PRELIMINARY, indicating the specifications have been verified through electrical tests.
2. ABSOLUTE MAXIMUM RATINGS have been
added.
3. VIL no longer applies to the AD0–AD7 pins in
CPU Interface mode 3.
4. VIL1 has been added to specify Input Low Voltage for AD0–AD7 pins in CPU Interface mode 3
as b 0.5V minimum and a 0.5V maximum.
5. ICC supply current has been reduced to 50 mA
from 100 mA.
6. Note 2 was added stating during IPD testing, all
pins are driven to VSS or VCC, including RX0
and RX1.
7. tAVLL has been decreased to 20 ns from 33 ns.
20
8. tRLDV1 has been decreased to 1.5 tMCLK a 100
ns from 2 tMCLK a 100 ns for a Read Cycle
without a previous Write (Modes 0, 1).
tRLDV1 has been decreased to 3.5 tMCLK a 100
ns from 4 tMCLK a 100 ns for a Read Cycle with
a previous Write (Modes 0, 1).
9. tCLYV has added the condition of VOL e 1.0V
for a 32 ns delay. tCLYV is 40 ns for VOL e 0.45
(Modes 0, 1).
10. tWHYZ has been decreased to 2 tMCLK a
100 ns from 2 tMCLK a 145 ns (Modes 0, 1).
11. tEHDV has been decreased to 1.5 tMCLK a
100 ns from 2 tMCLK a 100 ns for a Read Cycle
without a previous Write (Mode 2).
tEHDV has been decreased to 3.5 tMCLK a
100 ns from 4 tMCLK a 100 ns for a Read Cycle
with a previous Write (Mode 2).
12. tELEL has been decreased to 2 tMCLK from
2 tMCLK a 145 ns (Mode 2).
13. tCLDV has been decreased to 55 ns from 65 ns
(Mode 3).
14. tCHKH is specified for VIH e 2.4V, decreased
from VIH e 3.0V. Note 3 has been added which
states an on-chip pullup will drive DSACK0Ý to
approximately 2.4V. An external pullup is required to drive this signal to a higher voltage
(Mode 3).
15. tCHAI has been increased to 10 ns from 5 ns.
tCHAI no longer includes CSÝ High to R/WÝ
Invalid (Mode 3).
16. tCHRI e 5 ns has been added to specify CSÝ
High to R/WÝ Invalid (Mode 3).
17. tEHDV has been decreased to 55 ns from 65 ns
for Reads of the High Speed Registers (Mode
3).
18. tEHDV has been decreased to 1.5 tMCLK a
100 ns from 2 tMCLK a 100 ns for a Read Cycle
without a previous Write (Mode 3).
tEHDV has been decreased to 3.5 tMCLK a
100 ns from 4 tMCLK a 100 ns for a Read Cycle
with a previous Write (Mode 3).
19. The tAVAL specification name has been corrected to tAVAV (Mode 3).
20. tCHAI has been increased to 10 ns from 5 ns
(Mode 3).
21. The input voltage in the A.C. Testing Input Diagram have been revised to VCC b 0.5V from
3.0V (high level) and revised to 0.1V from 0.8V
(low level).
82527
The following differences exist between the -001
version and the -002 revision.
1. The RAM block in Figure 1. 82527 Block Diagram was previously called DPRAM.
2. The INTÝ/(VCC/2) pin in Figure 2. 44-Pin PLCC
Package and in other descriptions was previously called the INTÝ/(VDD/2) pin.
3. The Mode0 and Mode1 pin descriptions were
modified to include the following note: These
pins are weakly held low during reset.
4. The DSACK0Ý pin description was changed to
reflect an open-drain output.
5. VIL1 for RX0 in comparator bypass mode was
added.
6. VIH1 hysteresis on RESETÝ was added.
7. VIH2 for RX0 in comparator bypass mode was
added.
8. ISLEEP current with VCC/2 output enabled was
corrected from 700 mA minimum to 700 mA
maximum.
9. ISLEEP current with VCC/2 output disabled was
corrected from 100 mA minimum to 100 mA
maximum.
10. IPD current was changed from 10 mA minimum
to 25 mA maximum.
11. The following note was added to the electrical
characteristics: Port pins are weakly held high
after reset until the port configuration registers
are written (9FH, AFH).
12. The following D.C. Characteristics Specifications have been removed and replaced by the
Internal Delay 1 and Internal Delay 2 specifications. These specifications reflect the production test methodology which requires these two
delays to be tested together.
a. Delay Dominant to Recessive
b. Delay Recessive to Dominant
c. Input Delay with Comparator Bypassed
13. The following A.C. Characteristics for 8-Bit/
16-Bit Multiplexed Intel Modes (Modes 0,1)
have been changed:
a. 1/tMCLK has been increased to 8 MHz from
5 MHz.
b. tLLAX has been decreased to 20 ns from
22.5 ns.
c. tLLRL has been increased to 20 ns from
0 ns.
d. tCLLL has been added.
e. tWHLH has been increased to 8 ns from 0 ns.
f. tWHCH has been added.
tRLDV1 has been added.
tWLYH has been changed to tWLYZ to reflect
the READY pin is an open-drain output.
g.
h.
i. tWHYH has been changed to tWHYZ to reflect the READY pin is an open-drain output.
j. tRLYH has been changed to tRLYZ to reflect
the READY pin is an open-drain output.
k. tWHDV has been increased to 2 tMCLK a
250 ns from 2 tMCLK a 100 ns.
l. The following note was added: References
to WRÝ also pertain to WRHÝ.
m. The following definition was added for a
‘‘read cycle without a previous write’’: The
time between the rising edge of WRÝ/
WRHÝ (for the previous write cycle) and the
falling edge of RDÝ (for the current read cycle) is greater than 2 tMCLK.
n. The following definition was added for a
‘‘write cycle with a previous write’’: The time
between the rising edge of WRÝ/WRHÝ
(for the previous write cycle) and the next
rising edge of WRÝ/WRHÝ (for the current
write cycle) is less than 2 tMCLK.
d. Rise Time
e. Fall Time
21
82527
14. The timing diagrams for 8-Bit/16-Bit Multiplexed
Intel Modes (Modes 0,1) have been changed to
show ALE rising before CSÝ falls.
15. The following A.C. Characteristics for 8-Bit Multiplexed Non-Intel Modes (Modes 2) have been
changed:
a. 1/tMCLK has been increased to 8 MHz from
5 MHz.
b. tSLAX has been decreased to 20 ns from
22.5 ns.
c. tEVDV has been decreased to (2, 4) tMCLK a
100 ns from (2, 4) tMCLK a 145 ns.
d. tELDV minimum has been decreased to
tMCLK from tMCLK a 100 ns.
e. tELDV maximum has been increased to
2 tMCLK a 500 ns from 2 tMCLK a 100 ns.
f. tEHEL for registers except 02H, 04H, 05H
has been renamed to tELEL and the specification has been decreased to 2 tMCLK a
145 ns from 4 tMCLK a 145 ns.
g. tSLEH has been increased to 20 ns from 0
ns.
h. tCLSL has been added.
i. tELCH has been added.
j. The following definition was added for a
‘‘read cycle without a previous write’’: The
time between the falling edge of E (for the
previous write cycle) and the rising edge of
E (for the current read cycle) is greater than
2 tMCLK.
k. The following definition was added for a
‘‘write cycle with a previous write’’: The time
between the falling edge of E (for the previous write cycle) and the next falling edge of
E (for the current write cycle) is less than
2 tMCLK.
16. The following A.C. Characteristics for 8-Bit NonMultiplexed Asynchronous Mode (Mode 3) have
been changed:
a. 1/tMCLK has been increased to 8 MHz from
5 MHz.
b. tCLDV has been decreased for low speed
registers to (2, 4) tMCLK a 100 ns from
(2, 4) tMCLK a 145 ns.
c. tCHKH comment ‘‘with 3.3 KX Pullup and
100 pF Load’’ has been removed since
tCHKH is tested with a current source.
d. tCLKL for a Write Access with a Previous
Write has been renamed to tCHKL.
e. The note ‘‘E and AS must be tied high in this
mode’’ has been added.
22
f. The following definition was added for a
‘‘read cycle without a previous write’’: The
time between the rising edge of CSÝ (for
the previous write cycle) and the falling edge
of CSÝ (for the current read cycle) is greater than 2 tMCLK.
g. The following definition was added for a
‘‘write cycle with a previous write’’: The time
between the rising edge of CSÝ (for the previous write cycle) and the next rising edge of
CSÝ (for the current write cycle) is less than
2 tMCLK.
17. The following A.C. Characteristics for 8-Bit NonMultiplexed Synchronous Mode (Mode 3) have
been changed:
a. 1/tMCLK has been increased to 8 MHz from
5 MHz.
b. tELDZ minimum has been removed.
c. tAVCL has been added.
d. tCHAI has been added.
e. The following definition was added for a
‘‘read cycle without a previous write’’: The
time between the falling edge of E (for the
previous write cycle) and the rising edge of
E (for the current read cycle) is greater than
2 tMCLK.
f. The following definition was added for a
‘‘write cycle with a previous write’’: The time
between the falling edge of E (for the previous write cycle) and the next falling edge of
E (for the current write cycle) is less than
2 tMCLK.
18. The following A.C. Characteristics for Serial Interface Mode have been changed:
a. tSKHI has been decreased to 84 ns from
119 ns.
b. tSKLO has been decreased to 84 ns from
119 ns.
c. tPDO has been decreased to 59 ns from
84 ns.
d. tSETUP has been decreased to 35 ns from
59 ns.
e. tHOLD has been decreased to 84 ns from
109 ns.
19. The note in the A.C. Testing Input diagram referenced VOH was previously named VIH.