MOTOROLA MPXY8021A

MOTOROLA
Freescale Semiconductor, Inc.
Order Number: MPXY8021A
Rev. 0, 07/2004
SEMICONDUCTOR TECHNICAL DATA
Tire Pressure Monitoring Sensor
Temperature Compensated and
Calibrated, Fully Integrated,
Digital Output
Freescale Semiconductor, Inc...
General Description
The Motorola MPXY8021A sensor is an 8-pin tire monitoring sensor which is
comprised of a variable capacitance pressure sensing element, a temperature
sensing element, and an interface circuit (with a wake-up feature) all on a single
chip. It is housed in a Super-Small Outline Package (SSOP), which includes a media
protection filter. Specifically designed for the low power consumption requirements
of tire pressure monitoring systems, it can combine with a Motorola remote keyless
entry (RKE) system to facilitate a low-cost, highly integrated system.
MPXY8021A
TIRE PRESSURE
MONITORING SENSOR
MPXY8021A:
OPTIMIZED FOR 250 kPa – 450 kPa
Detailed Description
The block diagram of the MPXY8021A sensor is shown in Figure 1. The pressure
sensor is a capacitive transducer constructed using surface micromachining, the
temperature sensor is constructed using a diffused resistor, and the interface circuit
is integrated onto the same die as the sensors using a standard silicon CMOS
process.
The conditioning of the pressure signal begins with a capacitance to voltage
conversion (C to V) followed by a switched capacitor amplifier. This amplifier has
adjustable offset and gain trimming. The offset and gain are factory calibrated, with
calibration values stored in the EEPROM trim register. This amplifier also has
temperature compensation circuits for both sensitivity and offset, which also are
factory adjusted using the EEPROM trim register.
The pressure is monitored by a voltage comparator, which compares the
measured value against an 8-bit threshold adjusted by a serial input. By adjusting
the threshold and monitoring the state of the OUT pin the external device can check
whether a low-pressure threshold has been crossed, or perform up to 8-bit A/D
conversions.
The temperature is measured by a diffused resistor with a positive temperature
coefficient driven by a current source, thereby creating a voltage. The room
temperature value of this voltage is factory calibrated using the EEPROM trim
register. A two-channel multiplexer can route either the pressure or temperature
signal to a sampling capacitor that is monitored by a voltage comparator with
variable threshold adjust, providing a digital output for temperature.
An internal low frequency, low power 5.4 kHz oscillator with a 14-stage divider
provides a periodic pulse to the OUT pin (divide by 16384 for 3 seconds). This pulse
can be used to wake up an external MCU to begin an interface with the device. An
additional 10-stage divider will provide a pulse every 52 minutes which can be used
to reset an external MCU.
The power consumption can be controlled by several operational modes selected
by external pins.
SUPER SMALL OUTLINE PACKAGE
CASE 1352-03
PIN ASSIGNMENT
S1/VPP 1
VDD 2
VSS 3
OUT 4
8-pin Super Small Outline Package (SSOP)
ORDERING INFORMATION
Shipped In Rails
Shipped in Tape &
Reel
MPXY8021A6U
MPXY8021A6T1
REV 0
© Motorola, Inc. 2004
8 SO
7 CLK
6 DATA
5 RST
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VDD
Clock
Gen
PX
fHF
S1
Internal
HF OSC.
PREF
C to V
Convert
Data
CLK
AMP
P-Cell
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S0
Digital
Control
Power
Control
Internal LF
OSC.
P-Off
Trim
P-Gain
Trim
P-TCO
Trim
P-TCS
Trim
f LF
14-Stage
Divider
Lock
8-Bit
Current
Source
T-Off
Trim
10-Stage
Divider
8-Bit
D/A
Register
RST
2-Chan
MUX
t
PTC
Res.
AVSS
2-Chan
MUX
COMP
+
3-Chan
MUX
Sample CAP
OUT
VSS
AVSS
AVSS
Figure 1. MPXY8021A Sensor Block Diagram
MPXY8021A
2
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Operating Modes
The device has several operating modes dependent on the
applied voltages to the S1 and S0 pins as shown in Table 1. In
all the modes listed the channel multiplexers, D/A Register,
LFO, and the output pulse dividers will always be powered up
as long as there is a voltage source connected to the VDD pin.
Freescale Semiconductor, Inc...
When only the S0 pin is at a logic one the pressure
measuring circuit in the device is powered up and the pressure
output signal is connected to the sample capacitor through a
multiplexer. When the S0 pin returns to the low state the
multiplexer will first turn off to store the signal on the sample
capacitor before powering down the measuring circuitry.
When only the S1 pin is at a logic one the temperature
measuring circuit in the device is powered up and the
temperature output signal is connected to the sample capacitor
through a multiplexer. When the S1 pin returns to the low state
the multiplexer will first turn off to store the signal on the sample
capacitor before powering down the measuring circuitry.
NOTE: All of the EEPROM trim bits will be powered up
regardless of whether the pressure or temperature measuring
circuitry is activated.
NOTE: If the voltage on the S1 pin exceeds 2.5 times the
voltage on the VDD pin the device will be placed into its Trim/
Test Mode.
NOTE: If the VDD supply source is switched off in order to
reduce current consumption, it is important that all input pins be
driven LOW to avoid powering up the device.
If any input pin (S1, S0, DATA, or CLK) is driven HIGH while
the VDD supply is switched off, the device may be powered up
through an ESD protection diode. In such a case, the effective
VDD voltage will be about 0.3 V less than the voltage applied to
the input pin, and the full device IDD current will be drawn from
the device driving input.
Table 1. Operating Modes
Circuitry Powered
Serial Data
Counter
Pressure
Measure
System
Temp
Measure
System
A/D Output
Comp.
LFO
Oscill.
Standby/Reset
OFF
OFF
OFF
ON
ACTIVE
1
Measure Pressure
ON
OFF
OFF
ON
RESET
1
0
Measure Temperature
OFF
ON
OFF
ON
RESET
1
1
Output Read
OFF
OFF
ON
ON
ACTIVE
S1
S0
0
0
0
Operating Mode
Pin Functions
The following paragraphs give a description of the general function of each pin.
VDD and VSS Pins
Power is supplied to the control IC through VDD and VSS.
VDD is the positive supply and VSS is the digital and analog
ground. The control IC operates from a single power supply.
MPXY8021A
Therefore, the conductors to the power supply should be
connected to the VDD and VSS pins and locally decoupled as
shown in Figure 2.
To Other VDD Loads
VDD
VDD
0.1 µF
To Power Supply
VSS
VSS
To Other VSS Returns
Figure 2. Recommended Power Supply Connections
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MPXY8021A
3
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OUT Pin
The OUT pin normally provides a digital signal related to the
voltage applied to the voltage comparator and the threshold
level shifted into an 8-bit register from an external device. When
the device is placed in the standby mode the OUT pin is driven
high and will be clocked low when an overflow is detected from
a clock divider (divide by 16384) driven by the LFO. This allows
the OUT pin to wake up an external device such as an MCU.
2/f LFO
OUT
Operation
Standby
Measure
2/f LFO
Measure
3 Sec
Freescale Semiconductor, Inc...
Wake Up
Figure 3. Pulse on OUT Pin During Standby Mode
RST Pin
The RST pin is normally driven high and will be clocked low
when an overflow is detected from total clock divider (divide by
16,777,216) driven by the LFO. This allows the RST pin to reset
an external device such as an MCU. This pulse will appear on
the RST pin approximately every 52 minutes regardless of the
OUT
RST
Standby
operating mode of the device. The pulse lasts for two cycles of
the LFO oscillator as shown in Figure 4. Since the RST pin is
clocked from the same divider string as the OUT pin, there will
also be a pulse on the OUT pin when the RST pin pulses every
52 minutes.
2/f LFO
2/f LFO
≈ 3 Sec
≈ 52 Minutes
Figure 4. Pulse on RST Pin
S0 Pin
DATA Pin
The S0 pin is used to select the mode of operation as shown
in Table 1.
The DATA pin is the serial data in (SDI) function for setting
the threshold of the voltage comparator.
The S0 pin contains an internal Schmitt trigger as part of its
input to improve noise immunity. The S0 pin has an internal pulldown device in order to provide a low level when the pin is left
unconnected.
The DATA pin contains an internal Schmitt trigger as part of
its input to improve noise immunity. This pin has an internal pulldown device to provide a low level when the pin is left
unconnected.
S1 Pin
CLK Pin
The S1 pin is used to select the mode of operation, as shown
in Table 1.
The CLK pin is used to provide a clock used for loading and
shifting data into the DATA pin. The data on the DATA pin is
clocked into a shift register on the rising edge of the CLK pin
signal. The data is transferred to the D/A Register on the eighth
falling edge of the CLK pin. This protocol may be handled by the
SPI or SIOP serial I/O function found on some MCU devices.
The S1 pin contains an internal Schmitt trigger as part of its
input to improve noise immunity. This pin has an internal pulldown device to provide a low level when the pin is left
unconnected.
The S1 pin also serves the purpose of enabling factory trim
and test of the device.
The higher VPP programming voltage for the internal
EEPROM trim register is also supplied through the S1 pin.
MPXY8021A
4
The CLK pin contains an internal Schmitt trigger as part of its
input to improve noise immunity. The CLK pin has an internal
pull-down device to provide a low level when the pin is left
unconnected.
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Output Threshold Adjust
The state of the OUT pin is driven by a voltage comparator
whose output state depends on the level of the input voltage on
the sample capacitor and the level of an adjustable 8-bit
threshold voltage. The threshold is adjusted by shifting data bits
into the D/A Register (DAR) via the DATA pin while clocking the
CLK pin. The timing of this data is shown in Figure 5. Data is
transferred into the serial shift register on the rising edge of the
CLK pin. On the falling edge of the 8th clock the data in the serial
shift register is latched into the parallel DAR register. The DAR
remains powered up whenever VDD is present. The serial data
is clocked into the DATA pin starting with the MSB first. This
sequence of threshold select bits is shown in Table 2.
Table 2. D/A Threshold Bit Assignment
Function
Bit Weight
Data Bit
1
D0
2
D1
4
D2
8
D3
16
D4
32
D5
64
D6
128
D7
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LSB
Voltage Comparator Threshold Adjust (8 bits)
MSB
An analog to digital (A/D) conversion can be accomplished
with eight (8) different threshold levels in a successive
approximation algorithm; or the OUT pin can be set to trip at
some alarm level. The voltage on the sample capacitor will
maintain long enough for a single 8-bit conversion, but may
need to be refreshed with a new measured reading if the read
interval is longer than the specified hold time, tSH.
clock stream is corrupted during a transmission. In these two
modes the DATA and CLK pins should not be clocked to reduce
noise in the captured pressure or temperature data. Any
change in the DAR contents should be done during the Standby
or Output Read Modes.
Both the serial bit counter and the state of the DAR are
undefined following power up of the device. The serial bit
counter can be reset by cycling either the SO pin or the S1/VPP
pin to a high level and then back low. The DAR can then be
reset to the lowest level by holding the DATA pin low while
bursting the CLK pin with eight (8) clock pulses.
The counter that determines the number of clock pulses into
the device is reset whenever the device is placed into the
Measure Pressure or Measure Temperature Modes. This
provides a means to reset the data transfer count in case the
1
2
3
4
BIT5
BIT4
5
6
7
BIT2
BIT1
8
CLK
Data
Serial Data ∗
MSB
BIT6
MSB
BIT6
BIT5
BIT3
BIT4
BIT3
BIT2
LSB
BIT1
LSB
DAR Load *
Data
DAR *
(*) Denotes Internal Signal
Figure 5. Serial Data Timing
Pressure Sensor Output
Temperature Sensor Output
The pressure channel compares the output of its analog
measurement circuit to the D/A reference voltage. The device is
calibrated at two different nominal values depending on the
calibration option.
The temperature channel compares the output of a positive
temperature coefficient (PTC) resistor driven by a switched
current source. The current source is only active when the
temperature channel is selected.
Motorola Sensor Device Data
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MPXY8021A
5
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APPLICATIONS
Suggested application example is shown in Figure 6.
Optional
Motion
Sense
S1
+
VDD
3.0 V
S0
RF
Transmitter
Data
0.1 µF
MPXY8021A
Sensor
CLK
State Machine
or MCU
Freescale Semiconductor, Inc...
RST
VSS
OUT
Figure 6. Application Example
ELECTRICAL SPECIFICATIONS
Maximum Ratings
Maximum ratings are the extreme limits to which the device can be exposed without permanently damaging it. The device contains
circuitry to protect the inputs against damage from high static voltages; however, do not apply voltages higher than those shown in
the table below. Keep VIN and VOUT within the range VSS ≤ (VIN or VOUT) ≤ VDD.
Rating
Symbol
Value
Unit
Supply Voltage
VDD
–0.3 to +4.0
V
Short Circuit Capability (all pins excluding VDD and VSS)
Maximum High Voltage for 5 minutes
Minimum Low Voltage for 5 minutes
VSC
VSC
VDD
VSS
V
V
Substrate Current Injection
Current from any pin to VSS –0.3 VDC)
ISUB
600
µA
Electrostatic Discharge
Human Body Model (HBM)
Charged Device Model (CDM)
Machine Model (MM)
VESD
VESD
VESD
±1000
±1000
±200
V
V
V
Storage Temperature Range
Standard Temperature Range
Tstg
–40 to +150
°C
MPXY8021A
6
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Operating Range
The limits normally expected in the application which define range of operation.
Characteristic
Symbol
Min
Typ
Max
Units
VDD
2.1
3.0
3.3
V
TA
TL
–40
—
TH
+125
°C
Pressure Operating Range
MPXY8021A
P637.5
50
—
637.5
kPa
Supply Current Drain
Standby Mode
−40°C to +85°C
+85°C to +100°C
+100°C to +125°C
ISTBY
ISTBY
ISTBY
—
—
—
0.6
0.8
1.5
0.9
1.2
2.2
µA
µA
µA
Read Mode
−40°C to +125°C
IREAD
—
400
600
µA
Measure Temperature Mode
−40°C to +125°C
ITEMP
—
400
600
µA
Measure Pressure Mode
−40°C to +10°C
+10°C to +60°C
+60°C to +125°C
IPRESS
IPRESS
IPRESS
—
—
—
1400
1300
1200
1800
1700
1700
µA
µA
µA
Supply Voltage
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Operating Temperature Range
Standard Temperature Range
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7
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Electrical Characteristics
+2.1 V ≤ VDD ≤ +3.6 V, TL ≤ TA ≤ TH, unless otherwise specified.
Symbol
Min
Typ
Max
Units
Output High Voltage
DATA, OUT, RST (ILoad = 100 µA)
Characteristic
VOH
VDD –0.8
—
—
V
Output Low Voltage
DATA, OUT, RST (ILoad = -100 µA)
VOL
—
—
0.4
V
S0, S1, DATA, CLK
VIH
0.7 x VDD
—
—
V
Input Low Voltage
S0, S1, DATA, CLK
VIL
VSS
—
0.3 x VDD
V
Input High Voltage
VHYS
100
200
—
mV
Input Low Current (at VIL)
S0, S1, DATA, CLK
IIL
-5
-25
-100
µA
Input High Current (at VIH)
S0, S1, DATA, CLK
IIH
-5
-35
-140
µA (2)
Temperature Measurement (+2.1 V ≤ VDD < +2.5 V)
D/A Conversion Code at -40°C
D/A Conversion Code at -20°C
D/A Conversion Code at 25°C
D/A Conversion Code at 70°C
D/A Conversion Code at 100°C
D/A Conversion Code at 120°C
D/A Conversion Code at 125°C
T-40
T-20
T25
T70
T100
T120
T125
34
52
97
154
203
240
249
42
57
102
163
214
252
255
51
67
107
172
225
255
255
counts
counts
counts
counts
counts
counts
counts
Temperature Measurement (+2.5 V ≤ VDD ≤ +3.0 V)
D/A Conversion Code at -40°C
D/A Conversion Code at -20°C
D/A Conversion Code at 25°C
D/A Conversion Code at 70°C
D/A Conversion Code at 100°C
D/A Conversion Code at 120°C
D/A Conversion Code at 125°C
T-40
T-20
T25
T70
T100
T120
T125
36
52
97
155
204
241
249
42
57
102
163
214
252
255
50
64
107
171
224
255
255
counts
counts
counts
counts
counts
counts
counts
Temperature Measurement (+3.0 V < VDD ≤ +3.6 V)
D/A Conversion Code at -40°C
D/A Conversion Code at -20°C
D/A Conversion Code at 25°C
D/A Conversion Code at 70°C
D/A Conversion Code at 100°C
D/A Conversion Code at 120°C
D/A Conversion Code at 125°C
T-40
T-20
T25
T70
T100
T120
T125
36
52
97
154
203
240
249
42
57
102
163
214
252
255
49
64
107
172
225
255
255
counts
counts
counts
counts
counts
counts
counts
—
0.80
Temperature Sensitivity at 25°C
Approximate Temperature Output Response
°C/bit
OUT = 74.7461 + 0.9752 x Ta + 0.0041 x Ta^2
counts
12.0
10.0
Temperature Error [°C]
Freescale Semiconductor, Inc...
Input Hysteresis (VIH — VIL)
S0, S1, DATA, CLK
8.0
6.0
°
4.0
2.0
0.0
-40
-20
0
20
40
60
80
100
120
Temperature [°C]
Figure 7. Temperature Error vs Temperature at VDD = 3.0 V
MPXY8021A
8
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Control Timing
+2.1 V ≤ VDD ≤ +3.6 V, TL ≤ TA ≤ TH, unless otherwise specified.
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Characteristic
Symbol
Min
Typ
Max
Units
HFO Measurement Clock Frequency
fHF
100
135
150
kHz
LFO Wake Up Clock Frequency
Ta = –40°C, +2.1V ≤ VDD ≤ +3.6
Ta = +25°C, +2.1V ≤ VDD ≤ +3.6
Ta = +125°C, +2.1V ≤ VDD ≤ +3.6
fLF
fLF
fLF
3300
3900
3800
5400
5400
5300
8000
7700
7000
Hz
Hz
Hz
Wake Up Pulse
Pulse Timing
Pulse Width
tWAKE
tWPW
—
—
16384
2
—
—
LFO clocks
LFO clocks
Reset Pulse
Pulse Timing
Pulse Width
tRESET
tRPW
—
—
16,777,216
2
—
—
LFO clocks
LFO clocks
Minimum Setup Time (DATA edge to CLK rise)
tSETUP
100
—
—
nSec
Minimum Hold Time (CLK rise to DATA change)
tHOLD
100
—
—
nSec
Measurement Response Time
Recommended time to hold device in measurement mode
Temperature
Pressure
tTMEAS
tPMEAS
—
—
200
500
—
—
µSec
µSec
Read Response Time (see Figure 8)
From 90% VDD on S0 to OUT less than VOL or greater than VOH
tREAD
—
50
100
µSec
tSH
20
—
—
mSec
Sample Capacitor Discharge Time
From initial full scale D/A count (255) to drop 2 counts (253)
VDD
6.32 kΩ
Test Point
50 pF
10.91 kΩ
Figure 8. Control Timing Test Load for OUT and RST Pins
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MPXY8021A
9
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SENSOR CHARACTERISTICS (MPXY8021A)
Pressure Transfer Function
kPa = 2.5 x Output ± (Pressure Error)
Output = 8-bit digital pressure measurement (between 0-255)
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Pressure Error (±kPa): 50 kPa ≤ P < 250 kPa
T[°C] \ VDD[V]
2.1
2.5
2.7
3.0
3.3
3.6
–40
72.5
72.5
35.0
35.0
35.0
37.5
–20
57.5
57.5
30.0
30.0
30.0
35.0
0
57.5
57.5
25.0
25.0
25.0
27.5
25
57.5
57.5
25.0
25.0
25.0
27.5
70
57.5
57.5
27.5
25.0
25.0
27.5
100
72.5
72.5
37.5
37.5
37.5
37.5
125
95.0
92.5
57.5
47.5
47.5
47.5
Pressure Error (±kPa): 250 kPa ≤ P ≤ 450 kPa
T[°C] \ VDD[V]
2.1
2.5
2.7
3.0
3.3
3.6
–40
40.0
40.0
30.0
30.0
30.0
35.0
–20
32.5
25.0
20.0
20.0
20.0
25.0
0
30.0
25.0
10.0
10.0
10.0
15.0
25
30.0
25.0
7.5
7.5
7.5
15.0
70
35.0
25.0
10.0
7.5
7.5
15.0
100
40.0
40.0
25.0
25.0
25.0
30.0
125
62.5
60.0
35.0
35.0
35.0
35.0
Pressure Error (±kPa): 450 kPa < P ≤ 637.5 kPa
T[°C] \ VDD[V]
2.1
2.5
2.7
3.0
3.3
3.6
–40
70.0
70.0
40.0
40.0
40.0
40.0
–20
55.0
55.0
30.0
30.0
30.0
35.0
0
55.0
55.0
22.5
22.5
22.5
35.0
25
55.0
55.0
22.5
22.5
22.5
35.0
70
55.0
55.0
25.0
25.0
25.0
35.0
100
70.0
70.0
32.5
32.5
32.5
40.0
125
90.0
90.0
47.5
47.5
47.5
52.5
Areas marked in grey indicate the typical operating range.
MPXY8021A
10
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SENSOR CHARACTERISTICS (MPXY8021A)
Pressure Error
30.0
25.0
Error [kPa]
20.0
15.0
10.0
0.0
50
100
150
200
250
300
350
400
450
500
550
600
Pressure [kPa]
Figure 9. Pressure Error vs Pressure at T = 25°C, 2.7 V ≤ VDD ≤ 3.3 V
35.0
30.0
25.0
Error [kPa]
20.0
15.0
10.0
5.0
0.0
2.1
2.3
2.5
2.9
2.7
3.1
3.3
3.5
VDD [V]
Figure 10. Pressure Error vs VDD at T = 25°C, 250 kPa ≤ P ≤ 450 kPa
30 .0
25 .0
Error [kPa]
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5.0
20 .0
15 .0
10 .0
5 .0
0 .0
50
100
15 0
20 0
250
30 0
35 0
40 0
45 0
50 0
550
600
65 0
700
P re ssu re [kP a ]
Figure 11. Pressure Error vs Temperature at VDD = 3.0 V, 250 kPa ≤ P ≤ 450 kPa
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MPXY8021A
11
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MECHANICAL SPECIFICATIONS
Maximum Ratings
Maximum ratings are the extreme limits to which the device can be exposed without permanently damaging it. Keep VIN and VOUT
within the range VSS ≤ (VIN or VOUT) ≤ VDD.
Rating
Symbol
Value
Unit
pmax
1400
kPa1
Centrifugal Force Effects (3 axis)
Pressure measurement change less than 1% FSS
gCENT
2000
g
Unpowered Shock (three sides, 0.5 mSec duration)
gshock
2000
g
Maximum
Pressure1
NOTES:
Freescale Semiconductor, Inc...
1. Tested for 5 minutes at 25°C.
Media Compatibility
Media compatibility is as specified in Motorola document “SPD TPM Media Test.”
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Motorola Sensor Device Data
Freescale Semiconductor, Inc.
PACKAGE DIMENSIONS
2X
2 PLACES 4 TIPS
0.006 C A B
A
.420
.400
6X
.050
5
4
8
1
NOTES:
1. CONTROLLING DIMENSION: INCH.
2. INTERPRET DIMENSIONS AND TOLERANCES PER
ASME Y14.5M-1994.
3. DIMENSIONS DO NOT INCLUDE MOLD FLASH
OR PROTRUSIONS. MOLD FLASH AND PROTRUSIONS
SHALL NOT EXCEED 0.006 PER SIDE.
4. ALL VERTICAL SURFACES TO BE 5˚ MAXIMUM.
5. DIMENSION DOES NOT INCLUDE DAMBAR PROTRUSION.
ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.008
MAXIMUM.
.025
.300
.280
3
Freescale Semiconductor, Inc...
8X .019
3
B
5
.014
0.004 M C A B
.300
.280
.160
.140
.292
.272
GAGE
PLANE
.006
.000
.175
.155
8X
.011
.009
.041
.031
7˚
0˚
.014
DETAIL G
0.004
DETAIL G
C
SEATING
PLANE
CASE 1352-03
ISSUE B
CASE 1352-03
ISSUE B
DATE 04/14/04
Motorola Sensor Device Data
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NOTES
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Motorola Sensor Device Data
Freescale Semiconductor, Inc.
Freescale Semiconductor, Inc...
NOTES
Motorola Sensor Device Data
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