STMICROELECTRONICS STS8NF30L

STS8NF30L

N - CHANNEL 30V - 0.018Ω - 8A SO-8
STripFET POWER MOSFET
TYPE
STS8NF 30L
■
■
■
V DSS
R DS(on)
ID
30 V
< 0.022 Ω
6 A
TYPICAL RDS(on) = 0.018 Ω
STANDARD OUTLINE FOR EASY
AUTOMATED SURFACE MOUNT ASSEMBLY
LOW THRESHOLD DRIVE
DESCRIPTION
This Power MOSFET is the second generation of
STMicroelectronics unique ” Single Feature
Size ” strip-based process. The resulting
transistor shows extremely high packing density
for low on-resistance, rugged avalanche
characteristics and less critical alignment steps
therefore
a
remarkable
manufacturing
reproducibility.
SO-8
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ DC MOTOR DRIVE
■ DC-DC CONVERTERS
■ BATTERY MANAGMENT IN NOMADIC
EQUIPMENT
■ POWER MANAGEMENT IN
PORTABLE/DESKTOP PCs
ABSOLUTE MAXIMUM RATINGS
Symb ol
V DS
V DGR
V GS
ID
I DM (•)
P tot
Parameter
Value
Un it
Drain-source Voltage (V GS = 0)
30
V
Drain- gate Voltage (R GS = 20 kΩ)
30
V
± 20
V
8
A
5
A
32
A
2.5
W
G ate-source Voltage
o
Drain Current (continuous) at Tc = 25 C
Single O peration
Drain Current (continuous) at Tc = 100 o C
Single O peration
Drain Current (pulsed)
o
T otal Dissipation at Tc = 25 C
(•) Pulse width limited by safe operating area
December 1999
1/8
STS8NF30L
THERMAL DATA
R thj -amb
Tj
T s tg
*Thermal Resistance Junction-ambient
Maximum O perating Junction Temperature
Storage T emperature
o
50
150
-65 to 150
o
C/W
C/W
o
C
(*) Mounted on FR-4 board (Steady State)
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
OFF
Symbo l
V (BR)DSS
Parameter
Drain-source
Breakdown Voltage
Test Con ditions
I D = 250 µA
V GS = 0
I DSS
V DS = Max Rating
Zero Gate Voltage
Drain Current (V GS = 0) V DS = Max Rating
IGSS
Gate-body Leakage
Current (VDS = 0)
Min.
Typ.
Max.
30
Unit
V
T c = 125 oC
V GS = ± 20 V
1
10
µA
µA
± 100
nA
ON (∗)
Symbo l
Parameter
Test Con ditions
ID = 250 µA
V GS(th)
Gate Threshold Voltage V DS = V GS
R DS(on)
Static Drain-source On
Resistance
V GS = 10 V
V GS = 4.5 V
I D(o n)
On State Drain Current
V DS > ID(o n) x R DS(on )ma x
V GS = 10 V
Min.
Typ.
Max.
Unit
1
1.6
2.5
V
0.018
0.021
0.022
0.026
Ω
Ω
ID = 4 A
ID = 4 A
8
A
DYNAMIC
Symbo l
g f s (∗)
C iss
C os s
C rss
2/8
Parameter
Test Con ditions
Forward
Transconductance
V DS > ID(o n) x R DS(on )ma x
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V DS = 25 V
f = 1 MHz
Min.
Typ.
Max.
Unit
ID = 4 A
10
S
V GS = 0 V
1050
250
85
pF
pF
pF
STS8NF30L
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbo l
Parameter
Test Con ditions
t d(on)
tr
Turn-on Delay T ime
Rise Time
V DD = 15 V
ID = 4 A
R G = 4.7 Ω
V GS = 4.5 V
(Resistive Load, see fig. 3)
Qg
Q gs
Q gd
Total G ate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = 24 V ID = 6 A V GS = 4.5 V
Min.
Typ.
Max.
22
60
Unit
ns
ns
17.5
4
7
23
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbo l
Parameter
Test Con ditions
Min.
t d(of f)
tf
Turn-off Delay T ime
Fall T ime
V DD = 15 V
ID = 4 A
V GS = 4.5 V
R G = 4.7 Ω
(Resistive Load, see fig. 3)
42
10
ns
ns
tr (Voff)
tf
tc
Off-voltage Rise T ime
Fall T ime
Cross-over Time
V clamp = 24 V
ID = 8 A
V GS = 4.5 V
R G = 4.7 Ω
(Induct ive Load, see fig. 5)
11
12
25
ns
ns
ns
SOURCE DRAIN DIODE
Symbo l
Parameter
Test Con ditions
ISD
I SDM (•)
Source-drain Current
Source-drain Current
(pulsed)
V SD (∗)
Forward On Voltage
I SD = 8 A
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I SD = 8 A
di/dt = 100 A/µs
T j = 150 o C
V DD = 20 V
(see test circuit, fig. 5)
t rr
Q rr
I RRM
Min.
Typ.
V GS = 0
Max.
Unit
8
32
A
A
1.2
V
50
ns
40
nC
1.6
A
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Area
Thermal Impedance
3/8
STS8NF30L
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STS8NF30L
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/8
STS8NF30L
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STS8NF30L
SO-8 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
a1
inch
MAX.
MIN.
TYP.
1.75
0.1
0.068
0.25
a2
MAX.
0.003
0.009
1.65
0.064
a3
0.65
0.85
0.025
0.033
b
0.35
0.48
0.013
0.018
b1
0.19
0.25
0.007
0.010
C
0.25
0.5
0.010
0.019
c1
45 (typ.)
D
4.8
5.0
0.188
0.196
E
5.8
6.2
0.228
0.244
e
1.27
0.050
e3
3.81
0.150
F
3.8
4.0
0.14
0.157
L
0.4
1.27
0.015
0.050
M
S
0.6
0.023
8 (max.)
0016023
7/8
STS8NF30L
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specific ation mentioned in this publication are
subjec t to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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 1999 STMicroelectronics – Printed in Italy – All Rights Reserved
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8/8
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