FREESCALE MZ5004GW

Pressure
Freescale Semiconductor
MPXV5004G
Rev 12, 09/2009
Integrated Silicon Pressure Sensor
On-Chip Signal Conditioned,
Temperature Compensated and
Calibrated
MPXV5004
MPVZ5004
Series
0 to 3.92 kPa
(0 to 400 mm H2O)
1.0 to 4.9 V Output
The MPxx5004 series piezoresistive transducer is a state-of-the-art
monolithic silicon pressure sensor designed for a wide range of applications,
but particularly those employing a microcontroller or microprocessor with A/D
inputs. This sensor combines a highly sensitive implanted strain gauge with
advanced micromachining techniques, thin-film metallization, and bipolar
processing to provide an accurate, high level analog output signal that is
proportional to the applied pressure.
Application Examples
• Washing Machine Water Level
• Ideally Suited for Microprocessor or
Microcontroller-Based Systems
• Appliance Liquid Level and Pressure
Measurement
• Respiratory Equipment
Features
•
•
•
•
•
•
1.5% Maximum Error for 0 to 100 mm H2O over +10° to +60°C with Auto Zero
2.5% Maximum Error for 100 to 400 mm H2O over +10° to +60°C with Auto Zero
6.25% Maximum Error for 0 to 400 mm H2O over +10° to +60°C without Auto Zero
Temperature Compensated over 10° to 60°C
Available in Gauge Surface Mount (SMT) or Through-Hole (DIP) Configurations
Durable Thermoplastic (PPS) Package
ORDERING INFORMATION
Device Name
Case
No.
# of Ports
None
Single
Pressure Type
Dual
Gauge
Differential
Absolute
Device
Marking
Small Outline Package (MPXV5004 Series)
MPXV5004DP
1351
MPXV5004GC6T1
482A
•
•
•
•
MPXV5004DP
MPXV5004G
MPXV5004GC6U
482A
•
•
MPXV5004G
MPXV5004GC7U
482C
•
•
MPXV5004G
MPXV5004GP
1369
•
•
MPXV5004GP
MPXV5004GPT1
1369
•
•
MPXV5004GP
MPXV5004GVP
1368
•
•
MPXV5004GVP
Small Outline Package (Media Resistant Gel) (MPVZ5004 Series)
MPVZ5004G6T1
482
•
•
MPVZ5004G
MPVZ5004G6U
482
•
•
MPVZ5004G
MPVZ5004G7U
482B
•
•
MPVZ5004G
MPVZ5004GC6U
482A
•
•
MPVZ5004G
MPVZ5004GW6U
1735
•
•
MZ5004GW
MPVZ5004GW7U
1560
•
•
MZ5004GW
© Freescale Semiconductor, Inc., 2006-2009. All rights reserved.
Pressure
SMALL OUTLINE PACKAGES THROUGH-HOLE
MPVZ5004G7U
CASE 482B-03
MPXV5004GC7U
CASE 482C-03
MPVZ5004GW7U
CASE 1560-02
SMALL OUTLINE PACKAGES SURFACE MOUNT
MPVZ5004G6U/6T1
CASE 482-01
MPXV5004DP
CASE 1351-01
MPVZ5004GW6U
CASE 1735-01
MPXV5004G6U/6T1, MPVZ5004GC6U
CASE 482A-01
MPXV5004GVP
CASE 1368-01
MPXV5004GP/GPT1
CASE 1369-01
MPXV5004G
2
Sensors
Freescale Semiconductor
Pressure
Operating Characteristics
Table 1. Operating Characteristics (VS = 5.0 VDC, TA = 25°C unless otherwise noted, P1 > P2)
Characteristic
Symbol
Min
Typ
Max
Units
Pressure Range
POP
0
—
3.92
400
kPa
mm H2O
Supply Voltage(1)
VS
4.75
5.0
5.25
VDC
IS
—
—
10
mAdc
Span @ 306 mm H2O (3
Full Scale Span @ 400 mm H2O (3.92 kPa)(2)
VFSS
—
—
3.0
4.0
—
—
V
Offset(3)
VOFF
0.75
1.0
1.25
V
V/P
—
1.0
—
V/kPa
0 to 100 mm H2O (10 to 60°C)
—
—
—
±1.5
100 to 400 mm H2O (10 to 60°C)
—
—
—
±2.5
0 to 400 mm H2O (10 to 60°C
—
—
—
±6.25
Supply Current
kPa)(2)
Sensitivity
Accuracy (4) (5)
%VFSS with auto
zero
%VFSS with auto
zero
%VFSS without
auto zero
1. Device is ratiometric within this specified excitation range.
2. Span is defined as the algebraic difference between the output voltage at specified pressure and the output voltage at the minimum rated
pressure.
3. Offset (Voff) is defined as the output voltage at the minimum rated pressure.
4. Accuracy (error budget) consists of the following:
Linearity:Output deviation from a straight line relationship with pressure over the specified pressure range.
Temperature Hysteresis:Output deviation at any temperature within the operating temperature range, after the temperature is cycled to and
from the minimum or maximum operating temperature points, with zero differential pressure applied.
Pressure Hysteresis:Output deviation at any pressure within the specified range, when this pressure is cycled to and from the minimum or
maximum rated pressure, at 25°C.
Offset Stability:Output deviation, after 1000 temperature cycles, -30 to 100°C, and 1.5 million pressure cycles, with minimum rated pressure
applied.
TcSpan:Output deviation over the temperature range of 10 to 60°C, relative to 25°C.
TcOffset:Output deviation with minimum rated pressure applied, over the temperature range of 10 to 60°C, relative to 25°C.
Variation from Nominal:The variation from nominal values, for Offset or Full Scale Span, as a percent of VFSS, at 25°C.
5. Auto Zero at Factory Installation: Due to the sensitivity of the MPVZ5004G, external mechanical stresses and mounting position can affect
the zero pressure output reading. Autozeroing is defined as storing the zero pressure output reading and subtracting this from the device's
output during normal operations. Reference AN1636 for specific information. The specified accuracy assumes a maximum temperature
change of ±5°C between autozero and measurement.
MPXV5004G
Sensors
Freescale Semiconductor
3
Pressure
Maximum Ratings
Table 2. Maximum Ratings(1)
Rating
Symbol
Value
Unit
Maximum Pressure (P1 > P2)
PMAX
16
kPa
Storage Temperature
TSTG
–30 to +100
°C
TA
0 to +85
°C
Operating Temperature
1. Exposure beyond the specified limits may cause permanent damage or degradation to the device.
Figure 1 shows a block diagram of the internal circuitry integrated on a pressure sensor chip.
VS
2
Gain Stage #2
and
Ground
Reference
Shift Circuitry
Thin Film
Temperature
Compensation
and Calibration
Circuitry
Sensing
Element
3
GND
4
VOUT
Pins 1, 5, 6, 7, and 8 are NO CONNECTS
for small outline package device.
Figure 1. Integrated Pressure Sensor Schematic
On-chip Temperature Compensation and Calibration
The performance over temperature is achieved by
integrating the shear-stress strain gauge, temperature
compensation, calibration and signal conditioning circuitry
onto a single monolithic chip.
Figure 2 illustrates the gauge configuration in the basic
chip carrier (Case 482). A fluorosilicone gel isolates the die
surface and wire bonds from the environment, while allowing
the pressure signal to be transmitted to the silicon diaphragm.
The MPxx5004G series sensor operating characteristics
are based on use of dry air as pressure media. Media, other
than dry air, may have adverse effects on sensor
performance and long-term reliability. Internal reliability and
qualification test for dry air, and other media, are available
from the factory. Contact the factory for information regarding
media tolerance in your application.
Figure 3 shows the recommended decoupling circuit for
interfacing the output of the MPxx5004G to the A/D input of
the microprocessor or microcontroller. Proper decoupling of
the power supply is recommended.
Typical, minimum and maximum output curves are shown
for operation over a temperature range of 10°C to 60°C using
the decoupling circuit shown in Figure 3. The output will
saturate outside of the specified pressure range.
Fluorosilicone
Gel Die Coat
Die
Stainless
Steel Cap
P1
Thermoplastic
Case
Wire Bond
Lead Frame
P2
Differential Sensing Element
Die Bond
Figure 2. Cross-Sectional Diagram (Not to Scale)
MPXV5004G
4
Sensors
Freescale Semiconductor
Pressure
+5 V
OUTPUT
Vout
Vs
IPS
1.0 μF
GND
0.01 μF
470 pF
Figure 3. Recommended Power Supply Decoupling and Output Filtering
(For additional output filtering, please refer to AN1646.)
5.0
5.0
TRANSFER FUNCTION:
Vout = VS*[(0.2*P) + 0.2] ± 6.25% VFSS
VS = 5.0 Vdc
TEMP = 10 to 60°C
4.0
4.0
3.0
MAX
Output (V)
Output (V)
3.0
TYPICAL
2.0
MIN
1.0
0
0
TRANSFER FUNCTION:
Vout = VS*[(0.2*P) + 0.2] ± 2.5% VFSS
VS = 5.0 Vdc
TEMP = 10 to 60°C
TYPICAL
2.0
MIN
1.0
2.0
1.0
MAX
3.0
0
4.0
Differential Pressure (kPa)
0
1.0
2.0
3.0
4.0
Differential Pressure (kPa)
Figure 5. Output vs. Pressure Differential
at ±2.5% VFSS (with auto zero, Table 1., note 5))
Figure 4. Output vs. Pressure Differential
at ±6.25% VFSS (without auto zero, Table 1., note 5)
PRESSURE (P1)/VACUUM (P2) SIDE IDENTIFICATION TABLE
Freescale Semiconductor designates the two sides of the
pressure sensor as the Pressure (P1) side and the Vacuum
(P2) side. The Pressure (P1) side is the side containing
silicone gel which isolates the die from the environment.
Part Number
The Freescale Semiconductor pressure sensor is
designed to operate with positive differential pressure
applied, P1 > P2.
The Pressure (P1) side may be identified by using the
table below.
Case Type
Pressure (P1) Side Identifier
MPXV5004DP
1351
Side with Part Marking
MPXV5004GC6U/6T1,
MPVZ5004GC6U
482A
Side with Port Attached
MPXV5004GC7U
482C
Side with Port Attached
MPXV5004GP/GPT1
1369
Side with Port Attached
MPXV5004GVP
1368
Stainless Steel Cap
MPVZ5004G6U/6T1
482
Stainless Steel Cap
MPVZ5004G7U
482B
Stainless Steel Cap
MPVZ5004GW6U
1735
Vertical Port Attached
MPVZ5004GW7U
1560
Vertical Port Attached
MPXV5004G
Sensors
Freescale Semiconductor
5
Pressure
INFORMATION FOR USING THE SMALL OUTLINE PACKAGE (CASE 482)
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE
MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total
design. The footprint for the surface mount packages must be
the correct size to ensure proper solder connection interface
between the board and the package. With the correct
footprint, the packages will self align when subjected to a
solder reflow process. It is always recommended to design
boards with a solder mask layer to avoid bridging and
shorting between solder pads.
0.100 TYP 8X
2.54
0.660
16.76
0.060 TYP 8X
1.52
0.300
7.62
0.100 TYP 8X
2.54
inch
mm
SCALE 2:1
Figure 6. SOP Footprint (Case 482)
MPXV5004G
6
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Freescale Semiconductor
Pressure
PACKAGE DIMENSIONS
-A-
D 8 PL
0.25 (0.010)
4
5
M
T B
S
A
S
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5˚ TYPICAL DRAFT.
-BG
8
1
S
N
H
C
J
-TSEATING
PLANE
PIN 1 IDENTIFIER
K
M
DIM
A
B
C
D
G
H
J
K
M
N
S
INCHES
MIN
MAX
0.415 0.425
0.415 0.425
0.212 0.230
0.038 0.042
0.100 BSC
0.002 0.010
0.009 0.011
0.061 0.071
0˚
7˚
0.405 0.415
0.709 0.725
MILLIMETERS
MIN
MAX
10.54
10.79
10.54
10.79
5.38
5.84
0.96
1.07
2.54 BSC
0.05
0.25
0.23
0.28
1.55
1.80
0˚
7˚
10.29
10.54
18.01
18.41
CASE 482-01
ISSUE O
SMALL OUTLINE PACKAGE
SURFACE MOUNT
-A-
D
4
0.25 (0.010)
5
N
8 PL
M
T B
S
A
S
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5˚ TYPICAL DRAFT.
-BG
8
1
S
W
V
C
H
J
-TK
M
PIN 1 IDENTIFIER
DIM
A
B
C
D
G
H
J
K
M
N
S
V
W
INCHES
MIN
MAX
0.415 0.425
0.415 0.425
0.500 0.520
0.038 0.042
0.100 BSC
0.002 0.010
0.009 0.011
0.061 0.071
0˚
7˚
0.444 0.448
0.709 0.725
0.245 0.255
0.115 0.125
MILLIMETERS
MIN
MAX
10.54
10.79
10.54
10.79
12.70
13.21
0.96
1.07
2.54 BSC
0.05
0.25
0.23
0.28
1.55
1.80
0˚
7˚
11.28
11.38
18.01
18.41
6.22
6.48
2.92
3.17
SEATING
PLANE
CASE 482A-01
ISSUE A
SMALL OUTLINE PACKAGE
SURFACE MOUNT
MPXV5004G
Sensors
Freescale Semiconductor
7
Pressure
PACKAGE DIMENSIONS
–A–
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5_ TYPICAL DRAFT.
6. DIMENSION S TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4
5
–B–
G
8
1
0.25 (0.010)
M
T B
D 8 PL
S A
S
DETAIL X
S
PIN 1 IDENTIFIER
N
C
–T–
SEATING
PLANE
DIM
A
B
C
D
G
J
K
M
N
S
INCHES
MIN
MAX
0.415
0.425
0.415
0.425
0.210
0.220
0.026
0.034
0.100 BSC
0.009
0.011
0.100
0.120
0_
15 _
0.405
0.415
0.540
0.560
MILLIMETERS
MIN
MAX
10.54
10.79
10.54
10.79
5.33
5.59
0.66
0.864
2.54 BSC
0.23
0.28
2.54
3.05
0_
15 _
10.29
10.54
13.72
14.22
K
M
J
DETAIL X
CASE 482B-03
ISSUE B
SMALL OUTLINE PACKAGE
THROUGH-HOLE
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5˚ TYPICAL DRAFT.
6. DIMENSION S TO CENTER OF LEAD WHEN
FORMED PARALLEL.
-A4
5
N
-BG
0.25 (0.010)
8
1
M
T B
D 8 PL
S
A
S
DIM
A
B
C
D
G
J
K
M
N
S
V
W
DETAIL X
S
W
V
PIN 1
IDENTIFIER
C
-T-
INCHES
MILLIMETERS
MAX
MAX MIN
MIN
10.79
0.425 10.54
0.415
10.79
0.425 10.54
0.415
13.21
0.520 12.70
0.500
0.864
0.66
0.034
0.026
0.100 BSC
2.54 BSC
0.28
0.23
0.011
0.009
3.05
2.54
0.120
0.100
15˚
0˚
15˚
0˚
11.38
0.448 11.28
0.444
14.22
0.560 13.72
0.540
6.48
6.22
0.255
0.245
3.17
2.92
0.125
0.115
SEATING
PLANE
K
M
J
DETAIL X
CASE 482C-03
ISSUE B
SMALL OUTLINE PACKAGE
THROUGH-HOLE
MPXV5004G
8
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Freescale Semiconductor
Pressure
PACKAGE DIMENSIONS
PAGE 1 OF 2
CASE 1351-01
ISSUE A
SMALL OUTLINE PACKAGE
SURFACE MOUNT
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PACKAGE DIMENSIONS
PAGE 2 OF 2
CASE 1351-01
ISSUE A
SMALL OUTLINE PACKAGE
SURFACE MOUNT
MPXV5004G
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PACKAGE DIMENSIONS
PAGE 1 OF 3
CASE 1368-01
ISSUE B
SMALL OUTLINE PACKAGE
SURFACE MOUNT
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Freescale Semiconductor
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PACKAGE DIMENSIONS
PAGE 2 OF 3
CASE 1368-01
ISSUE B
SMALL OUTLINE PACKAGE
SURFACE MOUNT
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PACKAGE DIMENSIONS
PAGE 3 OF 3
CASE 1368-01
ISSUE B
SMALL OUTLINE PACKAGE
SURFACE MOUNT
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PACKAGE DIMENSIONS
PAGE 1 OF 2
CASE 1369-01
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SMALL OUTLINE PACKAGE
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PACKAGE DIMENSIONS
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PACKAGE DIMENSIONS
PAGE 1 OF 3
1560-03
ISSUE C
SMALL OUTLINE PACKAGE
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PACKAGE DIMENSIONS
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CASE 1560-03
ISSUE D
SMALL OUTLINE PACKAGE
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PACKAGE DIMENSIONS
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CASE 1560-03
ISSUE D
SMALL OUTLINE PACKAGE
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PACKAGE DIMENSIONS
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CASE 1735-02
ISSUE B
SMALL OUTLINE PACKAGE
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PACKAGE DIMENSIONS
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CASE 1735-02
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PACKAGE DIMENSIONS
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MPXV5004G
Rev. 12
09/2009
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