TI SN54CDC586WD

SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
D
D
D
D
D
D
D
D
D
D
D
D
WD PACKAGE
(TOP VIEW)
Low Output Skew for Clock-Distribution
and Clock-Generation Applications
Operates at 3.3-V VCC
Distributes One Clock Input to Twelve
Outputs
Two Select Inputs Configure Up to Nine
Outputs to Operate at One-Half or Double
the Input Frequency
No External RC Network Required
External Feedback Pin (FBIN) Is Used to
Synchronize the Outputs to the Clock Input
Application for Synchronous DRAM,
High-Speed Microprocessor
TTL-Compatible Inputs and Outputs
Outputs Drive Parallel 50-Ω Terminated
Transmission Lines
State-of-the-Art EPIC-ΙΙB  BiCMOS Design
Significantly Reduces Power Dissipation
Distributed VCC and Ground Pins Reduce
Switching Noise
Packaged in 56-Pin Ceramic Flat Package
NC
AVCC
AGND
FBIN
AGND
SEL0
SEL1
GND
GND
1Y1
VCC
GND
1Y2
VCC
GND
1Y3
VCC
GND
GND
2Y1
VCC
GND
2Y2
VCC
GND
2Y3
VCC
NC
description
The SN54CDC586 is a high-performance,
low-skew, low-jitter clock driver. It uses a
phase-lock loop (PLL) to precisely align, in both
frequency and phase, the clock output signals to
the clock input (CLKIN) signal. It is specifically
designed for use with popular microprocessors
operating at speeds from 50 MHz to 100 MHz, or
down to 25 MHz on outputs configured as
half-frequency outputs. The SN54CDC586
operates at 3.3-V VCC and is designed to drive a
properly terminated 50-W transmission line.
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
30
28
29
NC
CLKIN
NC
AVCC
OE
TEST
CLR
VCC
4Y3
GND
VCC
4Y2
GND
VCC
4Y1
GND
GND
VCC
3Y3
GND
VCC
3Y2
GND
VCC
3Y1
GND
GND
NC
NC – No internal connection
The feedback input (FBIN) is used to synchronize the output clocks in frequency and phase to CLKIN. One of
the 12 output clocks must be fed back to FBIN for the PLL to maintain synchronization between the CLKIN input
and the outputs. The output used as the feedback pin is synchronized to the same frequency as the CLKIN input.
The Y outputs can be configured to switch in phase and at the same frequency as CLKIN. Select inputs
(SEL1, SEL0) configure up to nine Y outputs, in banks of three, to operate at one-half or double the CLKIN
frequency, depending on which pin is fed back to FBIN (see Tables 1 and 2). All output-signal duty cycles are
adjusted to 50%, independent of the duty cycle at CLKIN.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC-ΙΙB is a trademark of Texas Instruments Incorporated.
Copyright  1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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1
SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
description (continued)
Output-enable (OE) is provided for output control. When OE is high, the outputs are in the high-impedance state.
When OE is low, the outputs are active. CLR is negative-edge triggered and can be used to reset the outputs
operating at half frequency. TEST is used for factory testing of the device and can be used to bypass the PLL.
TEST should be strapped to GND for normal operation.
Unlike many products containing PLLs, the SN54CDC586 does not require external RC networks. The loop filter
for the PLL is included on chip, minimizing component count, board space, and cost.
Because it is based on PLL circuitry, the SN54CDC586 requires a stabilization time to achieve phase lock of
the feedback signal to the reference signal. This stabilization time is required, following power up and application
of a fixed-frequency, fixed-phase signal at CLKIN, as well as following any changes to the PLL reference or
feedback signals. Such changes occur upon change of the select inputs, enabling of the PLL via TEST, and upon
enable of all outputs via OE.
The SN54CDC586 is characterized for operation over the full military temperature range of –55°C to 125°C.
detailed description of output configurations
The voltage-controlled oscillator (VCO) used in the SN54CDC586 PLL has a frequency range of 100 MHz to
200 MHz, twice the operating frequency range of the SN54CDC586 outputs. The output of the VCO is divided
by two and by four to provide reference frequencies with a 50% duty cycle of one-half and one-fourth the VCO
frequency. SEL0 and SEL1 select which of the two signals are buffered to each bank of device outputs.
One device output must be externally wired to FBIN to complete the PLL. The VCO operates such that the
frequency and phase of this output match that of CLKIN. In the case in which a VCO/2 output is wired to FBIN,
the VCO must operate at twice the CLKIN frequency, resulting in device outputs that operate at either the same
or one-half the CLKIN frequency. If a VCO/4 output is wired to FBIN, the device outputs operate at twice or the
same frequency as the CLKIN frequency.
2
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SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
output configuration A
Output configuration A is valid when any output configured as a 1x frequency output in Table 1 is fed back to
FBIN. The input frequency range for CLKIN is 50 MHz to 100 MHz when using output configuration A. Outputs
configured as 1/2x outputs operate at one-half the CLKIN frequency, while outputs configured as 1x outputs
operate at the same frequency as CLKIN.
Table 1. Output Configuration A
INPUTS
OUTPUTS
SEL1
SEL0
1/2X
FREQUENCY
1X
FREQUENCY
L
L
None
All
L
H
1Yn
2Yn, 3Yn, 4Yn
H
L
1Yn, 2Yn
3Yn, 4Yn
H
H
1Yn, 2Yn, 3Yn
4Yn
NOTE: n = 1, 2, 3
output configuration B
Output configuration B is valid when any output configured as a 1x frequency output in Table 2 is fed back to
FBIN. The input frequency range for CLKIN is 25 MHz to 50 MHz when using output configuration B. Outputs
configured as 1x outputs operate at the CLKIN frequency, while outputs configured as 2x outputs operate at
double the frequency of CLKIN.
Table 2. Output Configuration B
INPUTS
SEL1
SEL0
OUTPUTS
1X
FREQUENCY
2X
FREQUENCY
L
L
All
None
L
H
1Yn
2Yn, 3Yn, 4Yn
H
L
1Yn, 2Yn
3Yn, 4Yn
H
H
1Yn, 2Yn, 3Yn
4Yn
NOTE: n = 1, 2, 3
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3
SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
functional block diagram
OE 52
CLR
FBIN
50
4
ÎÎÎÎÎÎÎ
ÁÁÁ
ÁÁÁÁÁÁ
ÎÎÎÎÎÎÎ
ÁÁÁ
B
ÁÁÁÁÁÁ
ÎÎÎÎÎÎÎÁÁÁ
ÎÎÎÎÎÎÎ
Phase-Lock Loop
CLKIN
TEST
SEL0
55
2
ÁÁÁ
ÁÁÁ
B
ÁÁÁ
CLR
2
51
6
SEL1 7
ÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁ
One of Three Identical
Outputs – 1Yn
Select
Logic
10, 13, 16
1Y1 – 1Y3
One of Three Identical
Outputs – 2Yn
20, 23, 26
2Y1 – 2Y3
One of Three Identical
Outputs – 3Yn
32, 35, 38
3Y1 – 3Y3
One of Three Identical
Outputs – 4Yn
42, 45, 48
4Y1 – 4Y3
4
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SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
Terminal Functions
TERMINAL
NAME
NO.
I/O
DESCRIPTION
CLKIN
55
I
Clock input. CLKIN is the clock signal distributed by the SN54CDC586 clock-driver circuit. CLKIN provides
the reference signal to the integrated PLL that generates the clock output signals. CLKIN must have a fixed
frequency and fixed phase for the PLL to obtain phase lock. Once the circuit is powered up and a valid CLKIN
signal is applied, a stabilization time is required for the PLL to phase lock the feedback signal to its reference
signal.
CLR
50
I
Clear. CLR resets the VCO/4 reference frequency. CLR is negative-edge triggered and should be strapped
to GND or VCC for normal operation.
FBIN
4
I
Feedback input. FBIN provides the feedback signal to the internal PLL. FBIN must be hardwired to one of
the 12 clock outputs to provide frequency and phase lock. The internal PLL adjusts the output clocks to
obtain zero phase delay between FBIN and CLKIN.
OE
52
I
Output enable. OE is the output enable for all outputs. When OE is low, all outputs are enabled. When OE
is high, all outputs are in the high-impedance state. Since the feedback signal for the PLL is taken directly
from an output terminal, placing the outputs in the high-impedance state interrupts the feedback loop;
therefore, when a high-to-low transition occurs at OE, enabling the output buffers, a stabilization time is
required before the PLL obtains phase lock.
SEL1, SEL0
7, 6
I
Output configuration select. SEL0 and SEL1 select the output configuration for each output bank
(e.g., 1×, 1/2×, or 2×). (see Tables 1 and 2).
TEST
51
I
TEST is used to bypass the PLL circuitry for factory testing of the device. When TEST is low, all outputs
operate using the PLL circuitry. When TEST is high, the outputs are placed in a test mode that bypasses
the PLL circuitry. TEST should be strapped to GND for normal operation.
1Y1 – 1Y3
2Y1 – 2Y3
3Y1 – 3Y3
10, 13, 16
20, 23, 26
32, 35, 38
O
Output ports. These outputs are configured by SEL1 and SEL0 to transmit one-half or one-fourth the
frequency of the VCO. The relationship between the CLKIN frequency and the output frequency is
dependent on SEL1 and SEL0 and the frequency of the output being fed back to FBIN. The duty cycle of
the Y-output signals is nominally 50%, independent of the duty cycle of CLKIN.
O
Output ports. 4Y1 – 4Y3 transmit one-half the frequency of the VCO regardless of the state of SEL1 and
SEL0. The relationship between the CLKIN frequency and the output frequency is dependent on the
frequency of the output being fed back to FBIN. The duty cycle of the Y-output signals is nominally 50%,
independent of the duty cycle of CLKIN.
4Y1 – 4Y3
42, 45, 48
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.6 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Voltage range applied to any output in the high or power-off state,
VO (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Current into any output in the low state, IO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64 mA
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20 mA
Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
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SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
recommended operating conditions (see Note 2)
MIN
MAX
VCC
VIH
Supply voltage
3
3.6
High-level input voltage
2
VIL
VI
Low-level input voltage
5.5
V
IOH
IOL
High-level output current
–32
mA
Low-level output current
32
mA
125
°C
0
TA
Operating free-air temperature
NOTE 2: Unused inputs must be held high or low to prevent them from floating.
–55
V
V
0.8
Input voltage
UNIT
V
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
VOH
VCC = 3 V,
VCC = MIN to MAX†,
II = –18 mA
IOH = – 100 µA
VCC = 3 V,
IOH = – 32 mA
IOL = 100 µA
VOL
VCC = 3 V
II
VCC = 0 or MAX†,
VCC = 3.6 V,
IOZH
IOZL
VCC = 3.6 V,
VCC = 3.6 V,
ICC
Ci
TA = 25°C
MIN
MAX
TEST CONDITIONS
–1.2
VCC – 0.2
2
0.5
±10
±1
VI = VCC or GND
VO = 3 V
VO = 0
VCC = 3.6
3 6 V,
V IO = 0,
0
VI = VCC or GND
6
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– 10
µA
Outputs low
1
Outputs disabled
1
• DALLAS, TEXAS 75265
µA
µA
1
Co
† For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
V
10
Outputs high
VI = VCC or GND
VO = VCC or GND
V
V
0.2
IOL = 32 mA
VI = 3.6 V
UNIT
mA
4
pF
8
pF
SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
timing requirements over recommended ranges of supply voltage and operating free-air
temperature
fclock
l k
Clock frequency
MIN
MAX
VCO is operating at four times the CLKIN frequency
25
50
VCO is operating at double the CLKIN frequency
50
100
40%
60%
Input clock duty cycle
Stabilization time†
After SEL1, SEL0
50
After OE↓
50
After power up
50
UNIT
MHz
µs
After CLKIN
50
† Time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. For phase lock to be obtained, a
fixed-frequency, fixed-phase reference signal must be present at CLKIN. Until phase lock is obtained, the specifications for propagation delay
and skew parameters given in the switching characteristics table are not applicable.
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, CL = 30 pF, unless otherwise noted (see Note 3 and Figures 1 through 3)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
MIN
Y
42%
58%
CLKIN↑
Y
–900
200
ps
CLKIN↑
Y
200
ps
fmax
Duty cycle
tphase error‡
Jitter(pk-pk)*
MAX
100
tsk(o)‡
UNIT
MHz
0.75
ns
tsk(pr)‡*
1.1
ns
tr
tf
1.4
ns
1.4
ns
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
‡ The propagation delay, tphase error, is dependent on the feedback path from any output to FBIN. The tphase error, tsk(o), and tsk(pr) specifications
are valid only for equal loading of all outputs.
NOTE 3: The specifications for parameters in this table are applicable only after any appropriate stabilization time has elapsed.
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SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
3V
Input
IOL
1.5 V
1.5 V
0V
tphase error
Output
Output
Under Test
2V
0.8 V
0.8 V
VTH
tr
CL
VOH
2V
1.5 V
VOL
tf
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
IOH
PARAMETER
IOL
32 mA
IOH
32 mA
VTH
1.5 V
CL (typical)
tphase error
tr, tf
16 mA
16 mA
1.5 V
20 pF
20 pF
LOAD CIRCUIT
NOTES: A. CL includes probe and jig capacitance.
B. The outputs are measured one at a time with one transition per measurement.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 100 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
Figure 1. Load Circuit and Voltage Waveforms
8
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SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
CLKIN
tphase error 1
Outputs
Operating
at 1/2 CLKIN
Frequency
tphase error 2
tphase error 3
Outputs
Operating
at CLKIN
Frequency
tphase error 4
tphase error 7
tphase error 5
tphase error 8
tphase error 6
tphase error 9
NOTES: A. Output skew, tsk(o), is calculated as the greater of:
– The difference between the fastest and slowest of tphase error n (n = 1, 2, . . . 6)
– The difference between the fastest and slowest of tphase error n (n = 7, 8, 9)
B. Process skew, tsk(pr), is calculated as the greater of:
– The difference between the maximum and minimum tphase error n (n = 1, 2, . . . 6) across multiple
devices under identical operating conditions.
– The difference between the maximum and minimum tphase error n (n = 7, 8, 9) across multiple devices
under identical operating conditions.
Figure 2. Waveforms for Calculation of tsk(o)
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SN54CDC586
3.3-V PHASE-LOCK-LOOP CLOCK DRIVER
WITH 3-STATE OUPUTS
SGBS311 – FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
CLKIN
tphase error 10
Outputs
Operating
at CLKIN
Frequency
tphase error 11
tphase error 12
tphase error 13
Outputs
Operating
at 2X CLKIN
Frequency
tphase error 14
tphase error 15
NOTES: A. Output skew, tsk(o), is calculated as the greater of:
– The difference between the fastest and slowest of tphase error n (n = 10, 11, . . . 15)
B. Process skew, tsk(pr), is calculated as the greater of:
– The difference between the maximum and minimum tphase error n (n = 10, 11, . . . 15) across multiple devices
under identical operating conditions.
Figure 3. Waveforms for Calculation of tsk(o) and tsk(pr)
10
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Copyright  1998, Texas Instruments Incorporated