ICS ICS8516

Integrated
Circuit
Systems, Inc.
ICS8516
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
GENERAL DESCRIPTION
FEATURES
The ICS8516 is a low skew, high performance
1-to-16 Differential-to-LVDS Clock Distribution
HiPerClockS™ Chip and a member of the HiPerClock S ™
family of High Performance Clock Solutions from
ICS. The ICS8516 CLK, nCLK pair can accept
any differential input levels and translates them to 3.3V LVDS
output levels. Utilizing Low Voltage Differential Signaling
(LVDS), the ICS8516 provides a low power, low noise, pointto-point solution for distributing clock signals over controlled
impedances of 100Ω.
• Sixteen differential LVDS outputs
Dual output enable inputs allow the ICS8516 to be used in a
1-to-16 or 1-to-8 input/output mode.
• Multiple output enable inputs for disabling unused
outputs in reduced fanout applications
Guaranteed output and part-to-part skew specifications make
the ICS8516 ideal for those applications demanding well
defined performance and repeatability.
• LVDS compatible
ICS
• CLK, nCLK pair can accept the following differential
input levels: LVPECL, LVDS, LVHSTL, HCSL, SSTL
• Maximum output frequency: 700MHz
• Translates any differential input signal (LVPECL, LVHSTL,
SSTL, DCM) to LVDS levels without external bias networks
• Translates any single-ended input signal to LVDS
with resistor bias on nCLK input
• Output skew: 90ps (maximum)
• Part-to-part skew: 500ps (maximum)
• Propagation delay: 2.4ns (maximum)
• Additive phase jitter, RMS: 148fs (typical)
• 3.3V operating supply
• 0°C to 70°C ambient operating temperature
• Available in both standard and lead-free RoHS compliant
packages
BLOCK DIAGRAM
PIN ASSIGNMENT
Q9
nQ9
Q8
nQ8
GND
OE2
OE1
GND
nQ7
Q7
nQ6
Q6
CLK
nCLK
Q15
nQ15
Q1
nQ1
Q14
nQ14
Q2
nQ2
Q13
nQ13
Q3
nQ3
Q12
nQ12
Q4
nQ4
Q11
nQ11
Q5
nQ5
Q10
nQ10
Q6
nQ6
Q9
nQ9
Q7
nQ7
Q8
nQ8
VDD
nQ5
Q5
nQ4
Q4
VDD
GND
nQ3
Q3
nQ2
Q2
VDD
48 47 46 45 44 43 42 41 40 39 38 37
1
36
2
35
3
34
4
33
5
32
6
31
7
30
8
29
9
28
10
27
11
26
12
25
13 14 15 16 17 18 19 20 21 22 23 24
ICS8516
VDD
nQ10
Q10
nQ11
Q11
VDD
GND
nQ12
Q12
nQ13
Q13
VDD
nQ14
Q14
nQ15
Q15
GND
CLK
nCLK
GND
Q0
nQ0
Q1
nQ1
Q0
nQ0
48-Lead LQFP
7mm x 7mm x 1.4mm body package
Y Package
Top View
OE1
OE2
8516FY
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1
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
TABLE 1. PIN DESCRIPTIONS
Number
1, 6, 12,
25, 31, 36
2, 3
Name
Type
Description
VDD
Power
Positive supply pins.
nQ5, Q5
Output
Differential output pair. LVDS interface levels.
4, 5
7, 17, 20,
30, 41, 44
8, 9
nQ4, Q4
Output
Differential output pair. LVDS interface levels.
GND
Power
Power supply ground.
nQ3, Q3
Output
Differential output pair. LVDS interface levels.
10, 11
nQ2, Q2
Output
Differential output pair. LVDS interface levels.
13, 14
nQ1, Q1
Output
Differential output pair. LVDS interface levels.
15, 16
nQ0, Q0
Output
Differential output pair. LVDS interface levels.
18
nCLK
Input
Pullup
19
CLK
Input
Pulldown
21, 22
Q15, nQ15
Output
23, 24
Q14, nQ14
Output
Differential output pair. LVDS interface levels.
26, 27
Q13, nQ13
Output
Differential output pair. LVDS interface levels.
Inver ting differential clock input.
Non-inver ting differential clock input.
Differential output pair. LVDS interface levels.
28, 29
Q12, nQ12
Output
Differential output pair. LVDS interface levels.
32, 33
Q11, nQ11
Output
Differential output pair. LVDS interface levels.
34, 35
Q10, nQ10
Output
Differential output pair. LVDS interface levels.
37, 38
Q9, nQ9
Output
Differential output pair. LVDS interface levels.
39, 40
Q8, nQ8
Output
Differential output pair. LVDS interface levels.
Output enable. OE2 controls outputs Q8, nQ8 thru Q15, nQ15;
OE1 controls outputs Q0, nQ0 thru Q7, nQ7.
42, 43
OE2, OE1
Input
Pullup
LVCMOS/LVTTL interface levels.
Differential output pair. LVDS interface levels.
45, 46
nQ7, Q7
Output
47, 48
nQ6, Q6
Output
Differential output pair. LVDS interface levels.
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
8516FY
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2
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
CIN
Input Capacitance
4
pF
RPULLUP
Input Pullup Resistor
51
kΩ
RPULLDOWN
Input Pulldown Resistor
Power Dissipation Capacitance
(per output)
51
kΩ
4
pF
CPD
Test Conditions
Minimum
Typical
Maximum
Units
TABLE 3A. CONTROL INPUT FUNCTION TABLE
Inputs
OE1
Outputs
OE2
Q0:Q7
nQ0:nQ7
Q8:Q15
nQ8:nQ15
0
0
Hi Z
Hi Z
Hi Z
Hi Z
1
0
ACTIVE
ACTIVE
Hi Z
Hi Z
0
1
Hi Z
Hi Z
ACTIVE
ACTIVE
1
1
ACTIVE
ACTIVE
ACTIVE
ACTIVE
In the active mode, the state of the outputs are a function of the CLK and nCLK inputs as described in Table 3B.
TABLE 3B. CLOCK INPUT FUNCTION TABLE
Inputs
CLK
0
nCLK
1
Q0:Q15
LOW
Outputs
nQ0:nQ15
HIGH
Input to Output Mode
Polarity
Differential to Differential
Non Inver ting
1
0
HIGH
LOW
Differential to Differential
Non Inver ting
0
Biased; NOTE 1
LOW
HIGH
Single Ended to Differential
Non Inver ting
Non Inver ting
1
Biased; NOTE 1
HIGH
LOW
Single Ended to Differential
Biased; NOTE 1
0
HIGH
LOW
Single Ended to Differential
Inver ting
Biased; NOTE 1
1
LOW
HIGH
Single Ended to Differential
Inver ting
NOTE 1: Please refer to the Application Information section, "Wiring the Differential Input to Accept Single Ended Levels".
8516FY
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3
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
4.6V
Inputs, VI
-0.5V to VDD + 0.5 V
Outputs, VO
-0.5V to VDD + 0.5V
Package Thermal Impedance, θJA
47.9°C/W (0 lfpm)
Storage Temperature, TSTG
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = 3.3V±5%, TA = 0°C TO 70°C
Symbol
Parameter
VDD
Positive Supply Voltage
Test Conditions
IDD
Static Power Supply Current
Minimum
Typical
Maximum
Units
3.135
3. 3
3.465
V
RL = 100Ω
135
16 5
mA
No Load
60
75
mA
Typical
Maximum
Units
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = 3.3V±5%, TA = 0°C TO 70°C
Symbol
Parameter
Test Conditions
Minimum
VIH
Input High Voltage
OE1, OE2
2
VDD + 0.3
V
VIL
Input Low Voltage
OE1, OE2
-0.3
0.8
V
IIH
Input High Current
OE1, OE2
VDD = VIN = 3.465V
5
µA
IIL
Input Low Current
OE1, OE2
VDD = 3.465V, VIN = 0V
-150
µA
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = 3.3V±5%, TA = 0°C TO 70°C
Symbol
Parameter
IIH
Input High Current
IIL
Input Low Current
Test Conditions
Minimum
Typical
Units
CLK
VIN = VDD = 3.465V
150
µA
nCLK
VIN = VDD = 3.465V
5
µA
CLK
VDD = 3.465V, VIN = 0V
-5
nCLK
VDD = 3.465V, VIN = 0V
-150
VPP
Peak-to-Peak Voltage
0.15
Common Mode Input Voltage;
VCMR
GND + 0.5
NOTE 1, 2
NOTE 1: For single ended applications, the maximum input voltage for CLK, nCLK is VDD + 0.3V.
NOTE 2: Common mode voltage is defined ast VIH.
8516FY
Maximum
www.icst.com/products/hiperclocks.html
4
µA
µA
1.3
V
VDD - 0.85
V
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
TABLE 4D. LVDS DC CHARACTERISTICS, VDD = 3.3V±5%, TA = 0°C TO 70°C
Symbol
Parameter
VOD
Differential Output Voltage
Δ VOD
VOD Magnitude Change
VOS
Offset Voltage
Δ VOS
VOS Magnitude Change
Test Conditions
Minimum
Typical
Maximum
250
400
600
mV
50
mV
1.125
1.4
Units
1.6
V
50
mV
-10
+10
µA
-1
+1
µA
IOZ
High Impedance Leakage Current
IOFF
Power Off Leakage
IOSD
Differential Output Shor t Circuit Current
-5.5
mA
IOS/IOSB
Output Shor t Circuit Current
-12
mA
Maximum
Units
700
MH z
TABLE 5. AC CHARACTERISTICS, VDD = 3.3V±5%, TA = 0°C TO 70°C
Symbol
Parameter
fMAX
Output Frequency
Test Conditions
tPD
Propagation Delay; NOTE 1
t sk(o)
Output Skew; NOTE 2, 4
t sk(pp)
Par t-to-Par t Skew; NOTE 3, 4
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
Output Rise/Fall Time
t jit
tR/tF
Minimum
1.6
Integration Range:
12kHz - 20MHz
20% to 80%
Typical
2.0
2. 4
ns
90
ps
500
ps
148
100
45
fs
55 0
50
ps
odc
Output Duty Cycle
55
%
tPZL, tPZH
Output Enable Time; NOTE 5
5
ns
tPLZ, tPHZ
Output Disable Time; NOTE 5
5
ns
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltages and with equal load conditions.
Measured at the output differential cross points.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 5: These parameters are guaranteed by characterization. Not tested in production.
8516FY
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5
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
ADDITIVE PHASE JITTER
ratio of the power in the 1Hz band to the power in the fundamental. When the required offset is specified, the phase noise
is called a dBc value, which simply means dBm at a specified
offset from the fundamental. By investigating jitter in the frequency domain, we get a better understanding of its effects
on the desired application over the entire time record of the
signal. It is mathematically possible to calculate an expected
bit error rate given a phase noise plot.
The spectral purity in a band at a specific offset from the
fundamental compared to the power of the fundamental is
called the dBc Phase Noise. This value is normally expressed
using a Phase noise plot and is most often the specified plot
in many applications. Phase noise is defined as the ratio of
the noise power present in a 1Hz band at a specified offset
from the fundamental frequency to the power value of the
fundamental. This ratio is expressed in decibels (dBm) or a
-50
Additive Phase Jitter @ 155.52MHz
-60
(12kHz to 20MHz)
= 148fs typical
-70
SSB PHASE NOISE dBc/HZ
-80
-90
-100
-100
-120
-130
-140
-150
-160
1k
10k
100k
1M
10M
100M
OFFSET FROM CARRIER FREQUENCY (HZ)
above. The device meets the noise floor of what is shown, but
can actually be lower. The phase noise is dependant on the
input source and measurement equipment.
As with most timing specifications, phase noise measurements have issues. The primary issue relates to the limitations of the equipment. Often the noise floor of the equipment
is higher than the noise floor of the device. This is illustrated
8516FY
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6
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
PARAMETER MEASUREMENT INFORMATION
VDD
3.3V ± 5%
SCOPE
nCLK
Qx
Power Supply
+
Float GND
V
LVDS
-
V
Cross Points
PP
CMR
CLK
nQx
GND
3.3V OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
nQx
PART 1
nQx
nQ
Qx
nQy
PART 2
nQy
Qy
Qy
tsk(pp)
tsk(o)
PART-TO-PART SKEW
OUTPUT SKEW
nCLK
80%
80%
VOD
CLK
Clock
Outputs
nQ0:nQ15
20%
20%
tR
tF
Q0:Q15
tPD
OUTPUT RISE/FALL TIME
PROPAGATION DELAY
8516FY
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7
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
VDD
nQ0:nQ15
out
Q0:Q15
t
odc =
DC Input
LVDS
➤
t PW
PERIOD
t PW
➤
out
VOS/Δ VOS
x 100%
t PERIOD
➤
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD
OFFSET VOLTAGE SETUP
VDD
VDD
out
➤
out
➤
LVDS
100
VOD/Δ VOD
out
DC Input
➤
LVDS
IOSD
➤
DC Input
out
DIFFERENTIAL OUTPUT SHORT
DIFFERENTIAL OUTPUT VOLTAGE SETUP
CIRCUIT
CURRENT SETUP
VDD
➤
out
DC Input
IOS
LVDS
LVDS
➤
➤
IOSB
out
IOFF
OUTPUT SHORT CIRCUIT CURRENT SETUP
8516FY
VDD
POWER OFF LEAKAGE SETUP
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8
REV. B FEBRUARY 21, 2006
Integrated
Circuit
Systems, Inc.
ICS8516
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
APPLICATION INFORMATION
WIRING THE DIFFERENTIAL INPUT TO ACCEPT SINGLE ENDED LEVELS
Figure 1 shows how the differential input can be wired to accept
single ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The ratio
of R1 and R2 might need to be adjusted to position the V_REF in
the center of the input voltage swing. For example, if the input
clock swing is only 2.5V and VDD= 3.3V, V_REF should be 1.25V
and R2/R1 = 0.609.
VDD
R1
1K
Single Ended Clock Input
CLKx
V_REF
nCLKx
C1
0.1u
R2
1K
FIGURE 1. SINGLE ENDED SIGNAL DRIVING DIFFERENTIAL INPUT
RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS
INPUTS:
OUTPUTS:
LVCMOS CONTROL PINS:
All control pins have internal pull-ups or pull-downs; additional
resistance is not required but can be added for additional
protection. A 1kΩ resistor can be used.
8516FY
LVDS – Like OUTPUT
All unused LVDS output pairs can be either left floating or
terminated with 100Ω across. If they are left floating, we
recommend that there is no trace attached.
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9
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
DIFFERENTIAL CLOCK INPUT INTERFACE
The CLK /nCLK accepts LVDS, LVPECL, LVHSTL, SSTL, HCSL
and other differential signals. Both VSWING and VOH must meet the
VPP and VCMR input requirements. Figures 2A to 2E show interface examples for the HiPerClockS CLK/nCLK input driven by
the most common driver types. The input interfaces suggested
here are examples only. Please consult with the vendor of the
driver component to confirm the driver termination requirements.
For example in Figure 2A, the input termination applies for ICS
HiPerClockS LVHSTL drivers. If you are using an LVHSTL driver
from another vendor, use their termination recommendation.
3.3V
3.3V
3.3V
1.8V
Zo = 50 Ohm
CLK
Zo = 50 Ohm
CLK
Zo = 50 Ohm
nCLK
Zo = 50 Ohm
LVPECL
nCLK
HiPerClockS
Input
LVHSTL
ICS
HiPerClockS
LVHSTL Driver
R1
50
R1
50
HiPerClockS
Input
R2
50
R2
50
R3
50
FIGURE 2A. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
ICS HIPERCLOCKS LVHSTL DRIVER
FIGURE 2B. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER
3.3V
3.3V
3.3V
3.3V
3.3V
R3
125
R4
125
Zo = 50 Ohm
LVDS_Driv er
Zo = 50 Ohm
CLK
CLK
R1
100
Zo = 50 Ohm
nCLK
LVPECL
R1
84
HiPerClockS
Input
nCLK
Receiv er
Zo = 50 Ohm
R2
84
FIGURE 2C. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER
FIGURE 2D. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
3.3V LVDS DRIVER
3.3V
3.3V
3.3V
LVPECL
Zo = 50 Ohm
C1
Zo = 50 Ohm
C2
R3
125
R4
125
CLK
nCLK
R5
100 - 200
R6
100 - 200
R1
84
HiPerClockS
Input
R2
84
R5,R6 locate near the driver pin.
FIGURE 2E. HIPERCLOCKS CLK/NCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER WITH AC COUPLE
8516FY
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10
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
LVDS DRIVER TERMINATION
A general LVDS interface is shown in Figure 3. In a 100Ω
differential transmission line environment, LVDS drivers require a matched load termination of 100Ω across near the
receiver input. For a multiple LVDS outputs buffer, if only partial outputs are used, it is recommended to terminate the unused outputs.
3.3V
3.3V
Zo = 50 Ohm
LVDS_Driver
CLK
R1
100
nCLK
HiPerClockS
Zo = 50 Ohm
FIGURE 3. TYPICAL LVDS DRIVER TERMINATION
SCHEMATIC EXAMPLE
Figure 4 shows a schematic example of ICS8516. In this example, the input is driven by an LVDS driver. For LVDS buffer,
it is recommended to terminate the unused outputs for better
signal integrity. The decoupling capacitors should be physically located near the power pin.
Zo = 50 Ohm
+
R16
100
VDD=3.3V
-
Zo = 50 Ohm
LVDS_input
VDD
Q2
nQ2
Q3
nQ3
GND
VDD
Q4
nQ4
Q5
nQ5
VDD
12
11
10
9
8
7
6
5
4
3
2
1
U1
8516
13
14
15
16
17
18
19
20
21
22
23
24
LVDS_Driver
Zo = 50 Ohm
R17
100
Zo = 50 Ohm
Q6
nQ6
Q7
nQ7
GND
OE1
OE2
GND
nQ8
Q8
nQ9
Q9
48
47
46
45
44
43
42
41
40
39
38
37
+
R10
100
-
Zo = 50 Ohm
LVDS_input
25
26
27
28
29
30
31
32
33
34
35
36
VDD
Q13
nQ13
Q12
nQ12
GND
VDD
Q11
nQ11
Q10
nQ10
VDD
Zo = 50 Ohm
nQ1
Q1
nQ0
Q0
GND
nCLK
CLK
GND
Q15
nQ15
Q14
nQ14
Zo = 50 Ohm
+
R1
100
-
Zo = 50 Ohm
LVDS_input
(U1-1)
VDD=3.3V
C1
0.1u
(U1-6)
C2
0.1u
(U1-12)
(U1-25)
C3
0.1u
(U1-31)
C4
0.1u
(U1-36)
C5
0.1u
C6
0.1u
Decoupling capacitors located near the power pins
FIGURE 4. ICS8516 LVDS BUFFER SCHEMATIC EXAMPLE
8516FY
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11
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
RELIABILITY INFORMATION
TABLE 6. θJAVS. AIR FLOW TABLE
FOR
48 LEAD LQFP
θJA by Velocity (Linear Feet per Minute)
0
67.8°C/W
47.9°C/W
Single-Layer PCB, JEDEC Standard Test Boards
Multi-Layer PCB, JEDEC Standard Test Boards
200
55.9°C/W
42.1°C/W
500
50.1°C/W
39.4°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
TRANSISTOR COUNT
The transistor count for ICS8516 is: 1821
8516FY
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12
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
PACKAGE OUTLINE - Y SUFFIX
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
FOR
48 LEAD LQFP
TABLE 7. PACKAGE DIMENSIONS
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
SYMBOL
BBC
MINIMUM
NOMINAL
48
N
8516FY
MAXIMUM
A
--
--
1.60
A1
0.05
--
0.15
A2
1.35
1.40
1.45
b
0.17
0.22
0.27
c
0.09
--
0.20
D
9.00 BASIC
D1
7.00 BASIC
D2
5.50 Ref.
E
9.00 BASIC
E1
7.00 BASIC
E2
5.50 Ref.
e
0.50 BASIC
L
0.45
0.60
0.75
θ
0°
--
7°
ccc
--
--
0.08
Reference Document: JEDEC Publication 95, MS-026
www.icst.com/products/hiperclocks.html
13
REV. B FEBRUARY 21, 2006
ICS8516
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
TABLE 8. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
ICS8516FY
ICS8516FY
48 Lead LQFP
tray
0°C to 70°C
ICS8516FYT
ICS8516FY
48 Lead LQFP
1000 tape & reel
0°C to 70°C
ICS8516FYLF
ICS8516FYLF
48 Lead "Lead-Free" LQFP
tray
0°C to 70°C
ICS8516FYLFT
ICS8516FYLF
48 Lead "Lead-Free" LQFP
1000 tape & reel
0°C to 70°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
The aforementioned trademark, HiPerClockS is a trademark of Integrated Circuit Systems, Inc. or its subsidiaries in the United States and/or other countries.
While the information presented herein has been checked for both accuracy and reliability, Integrated Circuit Systems, Incorporated (ICS) assumes no responsibility for either its use
or for infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use
in normal commercial applications. Any other applications such as those requiring extended temperature range, high reliability, or other extraordinary environmental requirements are
not recommended without additional processing by ICS. ICS reserves the right to change any circuitry or specifications without notice. ICS does not authorize or warrant any ICS
product for use in life support devices or critical medical instruments.
8516FY
www.icst.com/products/hiperclocks.html
14
REV. B FEBRUARY 21, 2006
Integrated
Circuit
Systems, Inc.
ICS8516
LOW SKEW, 1-TO-16
DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
REVISION HISTORY SHEET
Rev
A
A
Table
T1
T1
T2
A
T8
B
8516FY
T5
Page
2
8
2
3
9
12
1
5
6
9
Description of Change
Pin Description table - added pins 47 thru 48.
Added LVDS Driver Termination in the Application Information section.
Pin Description Table - switched pin names for 45, 46 & 47,48
Pin Characteristics Table - changed CIN from 4pF max. to 4pF typical.
Updated Differential Clock Input Interface section.
Ordering Information Table - added Lead-Free par t numbers.
Feature Section - added Additive Phase Jitter bullet.
AC Characteristics Table - added Additive Phase Jitter.
Added Additive Phase Jitter section.
Added Recommendations for Unused Input and Output Pins
www.icst.com/products/hiperclocks.html
15
Date
3/31/03
5/6/03
7/30/04
2/21/06
REV. B FEBRUARY 21, 2006