SILICON EPITAXIAL PLANAR DIODE 1N6642D1A • • • • • • Low Leakage Fast Switching Low Forward Voltage Hermetic Ceramic Package Designed as a Drop-In Replacement for “MELF-4.5 (D-5D)”/ ”DO-213AA” Package. Suitable for general purpose, switching applications. Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VBR VRWM IO IFSM PD (1) (1) PD Breakdown Voltage Working Peak Reverse Voltage Average Rectified Output Current, TA = 75°C Surge Current (half sine wave, tp = 8.3ms TA = 75°C Total Power Dissipation at Total Power Dissipation at Derate Above 75°C TSP = 75°C Derate Above 75°C TJ Tstg Junction Temperature Range Storage Temperature Range 100V 75V 300mA 2.5A TBD TBD TBD TBD -65 to +200°C -65 to +200°C THERMAL PROPERTIES Symbols RθJA (1) RθJSP(IN) Parameters Max. Units Thermal Resistance, Junction To Ambient TBD °C/W Thermal Resistance, Junction To Solder Pads. TSP = 25°C TBD °C/W Notes (1) Thermal PCB rating to be determined. ‡ Recommended solder pad layout dimensions for this device, as detailed within this datasheet for the MELF-4.5 (D-5D) device. Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8882 Issue 1 Page 1 of 4 SILICON EPITAXIAL PLANAR DIODE 1N6642D1A ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols Parameters Test Conditions VBR Breakdown Voltage IR = 100µA VF IR (2) Forward Voltage Reverse Current Min. Typ Max. 100 IF = 10mA 0.8 IF = 100mA 1.2 IF = 10mA TA = 150°C 0.8 IF = 100mA TA = -55°C 1.2 VR = 20V 25 VR = 75V 500 VR = 20V VR = 75V Units TA = 150°C 50 V nA µA 100 DYNAMIC CHARACTERISTICS C trr Capacitance Reverse Recovery Time VR = 0V VR = 1.5V IF = IR = 10mA 5 f = 1.0MHz pF 2.8 RL = 100Ω 5 IREC = 1.0mA ns Notes (2) Pulse Width ≤ 300us, δ ≤ 2% Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8882 Issue 1 Page 2 of 4 SILICON EPITAXIAL PLANAR DIODE 1N6642D1A MECHANICAL DATA A C DLCC1 Variant A (D1A) PAD 1 PAD 2 SML DLCC1 D E B DIMENSION A B C D E F D 2 ANODE CATHODE 1 mm 4.60 ±0.20 2.00 ±0.20 1.30 ±0.20 0.70 ±0.20 3.00 ±0.20 1.80 ±0.20 Inches 0.181 ±0.007 0.079 ±0.007 0.051 ±0.007 0.028 ±0.007 0.118 ±0.007 0.071 ±0.007 F SOLDER PAD LAYOUT A C B DIMENSION A B C mm 6.45 1.70 2.41 Inches 0.254 0.067 0.095 Soldering temperature should be 260°C for a maximum of 10 seconds The physical dimensions for the DLCC1 ceramic package are designed to be different from the published dimensions for the “MELF-4.5 (D-5D)”. The DLCC1 design fully utilises the recommended solder footprint for the “MELF-4.5 (D-5D)” Package, and as such presents a drop in replacement for existing board designs. PACKAGE MASS Gold Plated Solder Pad Finish = 40mg Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8882 Issue 1 Page 3 of 4 SILICON EPITAXIAL PLANAR DIODE 1N6642D1A SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type – See Electrical Stability Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Semelab’s QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts can be laser marked with approximately 7 characters on two lines and always includes cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 1N6642 part with package variant A, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N6642D1A-JQRS (Include quantity for flight parts) 1N6642D1A-JQRS.GRPC (chargeable conformance option) 1N6642D1A-JQRS.GCDE (charge for destructive parts) 1N6642D1A-JQRS.GCDM (charge for destructive parts) 1N6642D1A-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8882 Issue 1 Page 4 of 4