NPC CF5026AL1

5026 series
Crystal Oscillator Module ICs
OVERVIEW
The 5026 series are miniature crystal oscillator module ICs. They feature a damping resistor RD matched to the
crystal's characteristics to reduce crystal current. They support fundamental oscillation and 3rd overtone oscillation modes. The 5026 series can be used to correspond to wide range of applications.
FEATURES
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Miniature-crystal matched oscillator characteristics
Operating supply voltage range
• 2.5V operation: 2.25 to 2.75V
• 3.0V operation: 2.7 to 3.6V
Recommended operating frequency range
• For fundamental oscillator
- 5026AL×: 20MHz to 50MHz
- 5026BL1: 20MHz to 100MHz
• For 3rd overtone oscillator
- 5026ML×: 70MHz to 133MHz
−40 to 85°C operating temperature range
Oscillator capacitor with excellent frequency characteristics built-in
Oscillator circuit with damping resistor RD builtin for reduced crystal current
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Standby function
• High impedance in standby mode, oscillator stops
Low standby current
• Power-saving pull-up resistor built-in
Oscillation detector function
Frequency divider built-in (5026AL×)
• Varies with version: fO, fO/2, fO/4, fO/8, fO/16,
fO/32
CMOS output duty level (1/2VDD)
50 ± 5% output duty @ 1/2VDD
30pF output load
Molybdenum-gate CMOS process
Chip form (CF5026×L×)
SERIES CONFIGURATION
Operating
supply voltage
range [V]
Version
Oscillation
mode
Recommended
Output
operating frequency
current
range (fundamental (VDD = 2.5V)
oscillation)*1 [MHz]
[mA]
Standby mode
Output
frequency
CF5026AL1
fO
CF5026AL2
fO/2
CF5026AL3
2.25 to 3.6
Fundamental
20 to 50
4
fO/4
CF5026AL4
fO/8
CF5026AL5
fO/16
CF5026AL6
fO/32
CF5026BL1*2
2.25 to 3.6
Fundamental
CF5026MLA
CF5026MLB
20 to 100
Output duty
level
Oscillator
stop
function
Output state
CMOS
Yes
Hi-Z
8
fO
CMOS
Yes
Hi-Z
8
fO
CMOS
Yes
Hi-Z
70 to 80
2.25 to 3.6
3rd overtone
CF5026MLC
80 to 100
90 to 133
*1. The recommended operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillator frequency band is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the
oscillation characteristics of components must be carefully evaluated.
*2. The CF5026BL1 has a higher maximum operating frequency, hence the negative resistance is also larger than in the CF5026AL× devices.
ORDERING INFORMATION
Device
Package
CF5026×L×–3
Chip form
SEIKO NPC CORPORATION —1
5026 series
PAD LAYOUT
(Unit: µm)
HA5026
(750,850)
Q
Y
VSS
VDD
INHN
NPC
XT
XTN
(0,0)
X
Chip size: 0.75 × 0.85mm
Chip thickness: 180 ± 20µm
PAD size: 90µm
Chip base: VDD level
PIN DESCRIPTION and PAD DIMENSIONS
Pad dimensions [µm]
Name
I/O
Description
X
Y
INHN
I
Output state control input. High impedance when LOW (oscillator stops).
Power-saving pull-up resistor built-in.
605
413
XT
I
Amplifier input
579
144
XTN
O
Amplifier output
171
144
VDD
–
Supply voltage
131
438
Q
O
Output. Output frequency determined by internal circuit to one of fO, fO/2, fO/4, fO/8, fO/16,
fO/32. High impedance in standby mode
131
705
VSS
–
Ground
618
718
Crystal connection pins.
Crystal is connected between XT and XTN.
SEIKO NPC CORPORATION —2
5026 series
BLOCK DIAGRAM
For Fundamental Oscillator (5026AL×, 5026BL1)
VDD VSS
XTN
CG
CD
RD
XT
Rf
1/2
1/2
1/2
1/2
1/2
Q
INHN
INHN = LOW active
For 3rd Overtone Oscillator (5026ML×)
VDD VSS
XTN
CG
Rf 1
CD
Cf
RD
XT
Rf 2
Q
INHN
INHN = LOW active
SEIKO NPC CORPORATION —3
5026 series
SPECIFICATIONS
Absolute Maximum Ratings
VSS = 0V
Parameter
Symbol
Condition
Rating
Unit
Supply voltage range
VDD
−0.5 to +7.0
V
Input voltage range
VIN
−0.5 to VDD + 0.5
V
Output voltage range
VOUT
−0.5 to VDD + 0.5
V
Operating temperature range
Topr
−40 to +85
°C
Storage temperature range
TSTG
−65 to +150
°C
Output current
IOUT
20
mA
Recommended Operating Conditions
VSS = 0V
Rating
Parameter
Operating supply voltage
Symbol
Condition
Operating temperature
Operating frequency*1
typ
max
5026AL×
CL ≤ 30pF
2.25
–
3.6
V
5026BL1
CL ≤ 30pF
2.25
–
3.6
V
5026MLA
f ≤ 80MHz, CL ≤ 30pF
2.25
–
3.6
V
5026MLB
f ≤ 100MHz, CL ≤ 30pF
2.25
–
3.6
V
f ≤ 100MHz, CL ≤ 30pF
2.25
–
3.6
V
f ≤ 133MHz, CL ≤ 15pF
2.25
–
3.6
V
VIN
VSS
–
VDD
V
TOPR
−40
–
+85
°C
5026AL×
20
–
50
MHz
5026BL1*2
20
–
100
MHz
5026MLA
70
–
80
MHz
5026MLB*2
80
–
100
MHz
5026MLC*2
90
–
133
MHz
VDD
5026MLC
Input voltage
Unit
min
fO
*1. The operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillator frequency
band is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated.
*2. When 2.5V operation, the ratings of switching characteristics are difference by the frequency or output load. Refer to “Switching Characteristics”.
SEIKO NPC CORPORATION —4
5026 series
Electrical Characteristics
5026AL× (2.5V operation)
VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
HIGH-level output voltage
VOH
Q: Measurement cct 1, VDD = 2.25V, IOH = 4mA
1.65
1.95
–
V
LOW-level output voltage
VOL
Q: Measurement cct 2, VDD = 2.25V, IOL = 4mA
–
0.3
0.4
V
HIGH-level input voltage
VIH
INHN
0.7VDD
–
–
V
LOW-level input voltage
VIL
INHN
–
–
0.3VDD
V
–
10
µA
IZ
Q: Measurement cct 2, INHN = LOW
VOH = VDD
–
Output leakage current
VOL = VSS
–
–
10
µA
5026AL1
–
7
14
mA
5026AL2
–
4.5
9
mA
5026AL3
–
3.5
7
mA
5026AL4
–
2.9
5.8
mA
5026AL5
–
2.5
5.0
mA
5026AL6
–
2.4
4.8
mA
–
–
3
µA
2
6
12
MΩ
20
100
200
kΩ
Current consumption
Standby current
INHN pull-up resistance
IDD2
IST
RUP1
Measurement cct 3, load cct 1,
INHN = open, CL = 30pF, f = 50MHz
Measurement cct 3, INHN = LOW
Measurement cct 4
RUP2
Feedback resistance
Rf
Measurement cct 5
50
–
150
kΩ
Oscillator amplifier output
resistance
RD
Design value. A monitor pattern on a wafer is tested.
340
400
460
Ω
6.8
8
9.2
pF
8.5
10
11.5
pF
Built-in capacitance
CG
CD
Design value. A monitor pattern on a wafer is tested.
SEIKO NPC CORPORATION —5
5026 series
5026AL× (3.0V operation)
VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
HIGH-level output voltage
VOH
Q: Measurement cct 1, VDD = 2.7V, IOH = 4mA
2.3
2.4
–
V
LOW-level output voltage
VOL
Q: Measurement cct 2, VDD = 2.7V, IOL = 4mA
–
0.3
0.4
V
HIGH-level input voltage
VIH
INHN
0.7VDD
–
–
V
LOW-level input voltage
VIL
INHN
–
–
0.3VDD
V
–
10
µA
IZ
Q: Measurement cct 2, INHN = LOW
VOH = VDD
–
Output leakage current
VOL = VSS
–
–
10
µA
5026AL1
–
8.5
17
mA
5026AL2
–
5.5
11
mA
5026AL3
–
4
8
mA
5026AL4
–
3.3
6.6
mA
5026AL5
–
2.9
5.8
mA
5026AL6
–
2.7
5.4
mA
–
–
5
µA
2
4
8
MΩ
15
75
150
kΩ
Current consumption
Standby current
INHN pull-up resistance
IDD2
IST
RUP1
Measurement cct 3, load cct 1,
INHN = open, CL = 30pF, f = 50MHz
Measurement cct 3, INHN = LOW
Measurement cct 4
RUP2
Feedback resistance
Rf
Measurement cct 5
50
–
150
kΩ
Oscillator amplifier output
resistance
RD
Design value. A monitor pattern on a wafer is tested.
340
400
460
Ω
6.8
8
9.2
pF
8.5
10
11.5
pF
Built-in capacitance
CG
CD
Design value. A monitor pattern on a wafer is tested.
SEIKO NPC CORPORATION —6
5026 series
5026BL1 (2.5V operation)
VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
HIGH-level output voltage
VOH
Q: Measurement cct 1, VDD = 2.25V, IOH = 8mA
1.65
1.95
–
V
LOW-level output voltage
VOL
Q: Measurement cct 2, VDD = 2.25V, IOL = 8mA
–
0.3
0.4
V
HIGH-level input voltage
VIH
INHN
0.7VDD
–
–
V
LOW-level input voltage
VIL
INHN
–
–
0.3VDD
V
–
10
µA
IZ
Q: Measurement cct 2, INHN = LOW
VOH = VDD
–
Output leakage current
VOL = VSS
–
–
10
µA
Current consumption
IDD2
Measurement cct 3, load cct 1, INHN = open, CL = 30pF,
f = 100MHz
–
14
28
mA
Standby current
IST
Measurement cct 3, INHN = LOW
–
–
3
µA
2
6
12
MΩ
20
100
200
kΩ
INHN pull-up resistance
RUP1
Measurement cct 4
RUP2
Feedback resistance
Rf
Measurement cct 5
50
–
150
kΩ
Oscillator amplifier output
resistance
RD
Design value. A monitor pattern on a wafer is tested.
170
200
230
Ω
6.8
8
9.2
pF
8.5
10
11.5
pF
Built-in capacitance
CG
Design value. A monitor pattern on a wafer is tested.
CD
5026BL1 (3.0V operation)
VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
HIGH-level output voltage
VOH
Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA
2.3
2.4
–
V
LOW-level output voltage
VOL
Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA
–
0.3
0.4
V
HIGH-level input voltage
VIH
INHN
0.7VDD
–
–
V
LOW-level input voltage
VIL
INHN
–
–
0.3VDD
V
–
10
µA
IZ
Q: Measurement cct 2, INHN = LOW
VOH = VDD
–
Output leakage current
VOL = VSS
–
–
10
µA
Current consumption
IDD2
Measurement cct 3, load cct 1, INHN = open, CL = 30pF,
f = 100MHz
–
19
38
mA
Standby current
IST
Measurement cct 3, INHN = LOW
–
–
5
µA
2
4
8
MΩ
15
75
150
kΩ
INHN pull-up resistance
RUP1
Measurement cct 4
RUP2
Feedback resistance
Rf
Measurement cct 5
50
–
150
kΩ
Oscillator amplifier output
resistance
RD
Design value. A monitor pattern on a wafer is tested.
170
200
230
Ω
6.8
8
9.2
pF
8.5
10
11.5
pF
Built-in capacitance
CG
CD
Design value. A monitor pattern on a wafer is tested.
SEIKO NPC CORPORATION —7
5026 series
5026ML× (2.5V operation)
VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
HIGH-level output voltage
VOH
Q: Measurement cct 1, VDD = 2.25V, IOH = 8mA
1.65
1.95
–
V
LOW-level output voltage
VOL
Q: Measurement cct 2, VDD = 2.25V, IOL = 8mA
–
0.3
0.4
V
HIGH-level input voltage
VIH
INHN
0.7VDD
–
–
V
LOW-level input voltage
VIL
INHN
–
–
0.3VDD
V
–
10
µA
IZ
Q: Measurement cct 2, INHN = LOW
VOH = VDD
–
Output leakage current
VOL = VSS
–
–
10
µA
f = 133MHz
5026MLC
–
15
30
mA
f = 72MHz
5026MLA
–
11
22
mA
f = 100MHz
5026MLB
–
15
30
mA
f = 100MHz
5026MLC
–
15
30
mA
–
–
3
µA
2
6
12
MΩ
20
100
200
kΩ
5026MLA
3.99
4.7
5.41
kΩ
5026MLB
2.29
2.70
3.11
kΩ
5026MLC
2.97
3.5
4.03
kΩ
IDD1
Measurement cct 3, load cct 1,
INHN = open, CL = 15pF
IDD2
Measurement cct 3, load cct 1,
INHN = open, CL = 30pF
Current consumption
Standby current
INHN pull-up resistance
IST
RUP1
Measurement cct 3, INHN = LOW
Measurement cct 4
RUP2
AC feedback resistance
Rf1
Design value.
A monitor pattern on a wafer is tested.
DC feedback resistance
Rf2
Measurement cct 5
50
–
150
kΩ
Oscillator amplifier output
resistance
RD
Design value. A monitor pattern on a wafer is tested.
85
100
115
Ω
AC feedback capacitance
Cf
Design value. A monitor pattern on a wafer is tested.
8.5
10
11.5
pF
5026MLA
1.70
2
2.30
pF
CG
Design value.
A monitor pattern on a wafer is tested.
5026MLB
1.70
2
2.30
pF
5026MLC
0.85
1
1.15
pF
5026MLA
3.40
4
4.60
pF
5026MLB
3.40
4
4.60
pF
5026MLC
3.40
4
4.60
pF
Built-in capacitance
CD
Design value.
A monitor pattern on a wafer is tested.
SEIKO NPC CORPORATION —8
5026 series
5026ML× (3.0V operation)
VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
Unit
min
typ
max
HIGH-level output voltage
VOH
Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA
2.3
2.4
–
V
LOW-level output voltage
VOL
Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA
–
0.3
0.4
V
HIGH-level input voltage
VIH
INHN
0.7VDD
–
–
V
LOW-level input voltage
VIL
INHN
–
–
0.3VDD
V
–
10
µA
IZ
Q: Measurement cct 2, INHN = LOW
VOH = VDD
–
Output leakage current
VOL = VSS
–
–
10
µA
f = 133MHz
5026MLC
–
20
40
mA
f = 72MHz
5026MLA
–
15
30
mA
f = 100MHz
5026MLB
–
20
40
mA
f = 100MHz
5026MLC
–
20
40
mA
–
–
5
µA
2
4
8
MΩ
15
75
150
kΩ
5026MLA
3.99
4.7
5.41
kΩ
5026MLB
2.29
2.70
3.11
kΩ
5026MLC
2.97
3.5
4.03
kΩ
IDD1
Measurement cct 3, load cct 1,
INHN = open, CL = 15pF
IDD2
Measurement cct 3, load cct 1,
INHN = open, CL = 30pF
Current consumption
Standby current
INHN pull-up resistance
IST
RUP1
Measurement cct 3, INHN = LOW
Measurement cct 4
RUP2
AC feedback resistance
Rf1
Design value.
A monitor pattern on a wafer is tested.
DC feedback resistance
Rf2
Measurement cct 5
50
–
150
kΩ
Oscillator amplifier output
resistance
RD
Design value. A monitor pattern on a wafer is tested.
85
100
115
Ω
AC feedback capacitance
Cf
Design value. A monitor pattern on a wafer is tested.
8.5
10
11.5
pF
5026MLA
1.70
2
2.30
pF
CG
Design value.
A monitor pattern on a wafer is tested.
5026MLB
1.70
2
2.30
pF
5026MLC
0.85
1
1.15
pF
5026MLA
3.40
4
4.60
pF
5026MLB
3.40
4
4.60
pF
5026MLC
3.40
4
4.60
pF
Built-in capacitance
CD
Design value.
A monitor pattern on a wafer is tested.
SEIKO NPC CORPORATION —9
5026 series
Switching Characteristics
5026AL× (2.5V operation)
VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Output rise time
Symbol
tr1
tr2
Output fall time
tf1
tf2
Output duty cycle*1
Duty1
Duty2
Output disable delay time*2
tPLZ
Output enable delay time*2
tPZL
Condition
Unit
min
typ
max
Measurement cct 3, load cct 1,
0.1VDD to 0.9VDD
CL = 15pF
–
3
6
ns
CL = 30pF
–
5
10
ns
Measurement cct 3, load cct 1,
0.9VDD to 0.1VDD
CL = 15pF
–
3
6
ns
CL = 30pF
–
5
10
ns
Measurement cct 3, load cct 1,
VDD = 2.5V, Ta = 25°C, f = 50MHz
CL = 15pF
45
–
55
%
CL = 30pF
45
–
55
%
–
–
100
ns
–
–
100
ns
Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C,
CL = 15pF
*1. The duty cycle characteristic is checked the sample chips of each production lot.
*2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the
oscillator start-up time has elapsed.
5026AL× (3.0V operation)
VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Output rise time
Symbol
tr1
tr2
Output fall time
tf1
tf2
Output duty cycle*1
Duty1
Duty2
Output disable delay time*2
tPLZ
Output enable delay time*2
tPZL
Condition
Unit
min
typ
max
Measurement cct 3, load cct 1,
0.1VDD to 0.9VDD
CL = 15pF
–
2.5
5
ns
CL = 30pF
–
4.5
9
ns
Measurement cct 3, load cct 1,
0.9VDD to 0.1VDD
CL = 15pF
–
2.5
5
ns
CL = 30pF
–
4.5
9
ns
Measurement cct 3, load cct 1,
VDD = 3.0V, Ta = 25°C, f = 50MHz
CL = 15pF
45
–
55
%
CL = 30pF
45
–
55
%
–
–
100
ns
–
–
100
ns
Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C,
CL = 15pF
*1. The duty cycle characteristic is checked the sample chips of each production lot.
*2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the
oscillator start-up time has elapsed.
SEIKO NPC CORPORATION —10
5026 series
5026BL1 (2.5V operation)
VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
tr1
Output rise time
tr2
tr3
tf1
Output fall time
tf2
tf3
Condition
Measurement cct 3, load cct 1,
0.1VDD to 0.9VDD
Measurement cct 3, load cct 1,
0.2VDD to 0.8VDD
Measurement cct 3, load cct 1,
0.9VDD to 0.1VDD
Measurement cct 3, load cct 1,
0.8VDD to 0.2VDD
Duty1
Output duty cycle*1
Duty2
Measurement cct 3, load cct 1,
VDD = 2.5V, Ta = 25°C
Duty3
Output disable delay time*2
tPLZ
Output enable delay time*2
tPZL
Unit
min
typ
max
CL = 15pF
–
2
4
ns
CL = 30pF
–
3
6
ns
CL = 30pF
–
2.5
5
ns
CL = 15pF
–
2
4
ns
CL = 30pF
–
3
6
ns
CL = 30pF
–
2.5
5
ns
CL = 15pF
f = 100MHz
45
–
55
%
CL = 30pF
f = 80MHz
45
–
55
%
CL = 30pF
f = 100MHz
40
–
60
%
–
–
100
ns
–
–
100
ns
Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C,
CL = 15pF
*1. The duty cycle characteristic is checked the sample chips of each production lot.
*2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the
oscillator start-up time has elapsed.
5026BL1 (3.0V operation)
VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Rating
Parameter
Output rise time
Symbol
tr1
tr2
Output fall time
tf1
tf2
Output duty cycle*1
Duty1
Duty2
Output disable delay time*2
tPLZ
Output enable delay time*2
tPZL
Condition
Unit
min
typ
max
Measurement cct 3, load cct 1,
0.1VDD to 0.9VDD
CL = 15pF
–
1.5
3
ns
CL = 30pF
–
2.5
5
ns
Measurement cct 3, load cct 1,
0.9VDD to 0.1VDD
CL = 15pF
–
1.5
3
ns
CL = 30pF
–
2.5
5
ns
Measurement cct 3, load cct 1,
VDD = 3.0V, Ta = 25°C, f = 100MHz
CL = 15pF
45
–
55
%
CL = 30pF
45
–
55
%
–
–
100
ns
–
–
100
ns
Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C,
CL = 15pF
*1. The duty cycle characteristic is checked the sample chips of each production lot.
*2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the
oscillator start-up time has elapsed.
SEIKO NPC CORPORATION —11
5026 series
5026ML× (2.5V operation)
VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Parameter
Output rise time
Output fall time
Symbol
tr1
tr2
tf1
tf2
Duty1
Output disable delay time*2
tPLZ
Output enable delay time*2
tPZL
min
typ
max
Unit
Measurement cct 3, load cct 1,
0.1VDD to 0.9VDD
CL = 15pF
–
2
4
ns
CL = 30pF
–
3
6
ns
Measurement cct 3, load cct 1,
0.9VDD to 0.1VDD
CL = 15pF
–
2
4
ns
Measurement cct 3, load cct 1,
VDD = 2.5V, Ta = 25°C,
CL = 15pF
Output duty cycle*1
Duty2
Rating
Condition
Measurement cct 3, load cct 1,
VDD = 2.5V, Ta = 25°C,
CL = 30pF
CL = 30pF
–
3
6
ns
f = 72MHz
5026MLA
45
–
55
%
f = 100MHz
5026MLB
45
–
55
%
f = 133MHz
5026MLC
45
–
55
%
f = 72MHz
5026MLA
45
–
55
%
f = 100MHz
5026MLB
40
–
60
%
f = 100MHz
5026MLC
40
–
60
%
–
–
100
ns
–
–
100
ns
Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C,
CL = 15pF
*1. The duty cycle characteristic is checked the sample chips of each production lot.
*2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the
oscillator start-up time has elapsed.
5026ML× (3.0V operation)
VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted.
Parameter
Output rise time
Output fall time
Symbol
tr1
tr2
tf1
tf2
Duty1
Output duty cycle*1
Duty2
tPLZ
Output enable delay time*2
tPZL
min
typ
max
Unit
Measurement cct 3, load cct 1,
0.1VDD to 0.9VDD
CL = 15pF
–
1.5
3
ns
CL = 30pF
–
2.5
5
ns
Measurement cct 3, load cct 1,
0.9VDD to 0.1VDD
CL = 15pF
–
1.5
3
ns
Measurement cct 3, load cct 1,
VDD = 3.0V, Ta = 25°C,
CL = 15pF
Measurement cct 3, load cct 1,
VDD = 3.0V, Ta = 25°C,
CL = 30pF
CL = 30pF
–
2.5
5
ns
f = 72MHz
5026MLA
45
–
55
%
f = 100MHz
5026MLB
45
–
55
%
f = 133MHz
5026MLC
45
–
55
%
f = 72MHz
5026MLA
45
–
55
%
f = 100MHz
5026MLB
45
–
55
%
5026MLC
45
–
55
%
–
–
100
ns
–
–
100
ns
Measurement cct 3, load cct 1, VDD = 3.3V,
Ta = 25°C, CL = 30pF, f = 100MHz
Output disable delay time*2
Rating
Condition
Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C,
CL = 15pF
*1. The duty cycle characteristic is checked the sample chips of each production lot.
*2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the
oscillator start-up time has elapsed.
SEIKO NPC CORPORATION —12
5026 series
Current consumption and Output waveform with NPC’s standard crystal
Cb
L
Ca
f [MHz]
R [Ω]
L [mH]
Ca [fF]
Cb [pF]
50
16.12
6.88
1.48
1.18
72
−
−
−
−
100
−
−
−
−
R
Note. The 72MHz and 100MHz crystal parameters are confidential.
FUNCTIONAL DESCRIPTION
Standby Function
When INHN goes LOW, the oscillator stops and the oscillator output on Q becomes high impedance.
Version
INHN
5026AL×
HIGH (or open)
5026BL1, ML×
5026AL×, BL1, ML×
Q
Oscillator
Any fO, fO/2, fO/4, fO/8, fO/16 or fO/32 output frequency
Normal operation
fO
LOW
High impedance
Stopped
Power-saving Pull-up Resistor
The INHN pull-up resistance changes in response to the input level (HIGH or LOW). When INHN goes LOW
(standby state), the pull-up resistance becomes large to reduce the current consumption during standby.
SEIKO NPC CORPORATION —13
5026 series
MEASUREMENT CIRCUITS
Measurement cct 1
Measurement cct 4
C1
Signal
Generator
VDD
XT
VDD
XT
Q
XTN
INHN
R1
Q
VSS
XTN
INHN
R2
VSS
V
VPR
VDD
VOH
0V
Q output
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
R2: 5026AL×
: 412Ω (2.5V operation)
575Ω (3.0V operation)
5026BL1, ML× : 206Ω (2.5V operation)
287Ω (3.0V operation)
IPR
RUP1 =
VDD
IPR
(VPR = V SS)
RUP2 = VDD VPR
IPR
(VPR = 0.7VDD)
A
Measurement cct 5
Measurement cct 2
VDD
XT
Rf =
Q
XTN
INHN
IZ, IOL
XT
VDD
IZ
VSS
V
VDD
IRf
A
A
Q
XTN
INHN
Rf 2 =
VSS
VDD
IRf
IRf
VOH
VOL
Measurement cct 6
Signal
Generator
Measurement cct 3
C1
Q
R1
A
XT
VDD
XT
XTN
INHN
VSS
IDD
IST
VDD
X'tal
Q
XTN
INHN
VSS
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
Load cct 1
Q output
CL
(Including probe
capacitance)
SEIKO NPC CORPORATION —14
5026 series
Switching Time Measurement Waveform
Output duty level, tr, tf
0.9VDD
0.8VDD
0.9VDD
0.8VDD
Q output
0.2VDD
0.1VDD
0.2VDD
0.1VDD
TW
tr3
DUTY measurement
voltage (0.5V DD )
tf3
tr1,tr2
tf1,tf2
Output duty cycle
DUTY measurement
voltage (0.5V DD)
Q output
TW
DUTY= TW/ T
T
100 (%)
Output Enable/Disable Delay
when the device is in standby, the oscillator stops. When standby is released, the oscillator starts and stable
oscillator output occurs after a short delay.
VIH
INHN
VIL
tPLZ
tPZL
INHN input waveform tr = tf
10ns
Q output
SEIKO NPC CORPORATION —15
5026 series
Please pay your attention to the following points at time of using the products shown in this document.
The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on
human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such
use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and
harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right
to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that
the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties.
Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document.
Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products,
and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or
modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in
compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested
appropriately take steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
15-6, Nihombashi-kabutocho, Chuo-ku,
Tokyo 103-0026, Japan
Telephone: +81-3-6667-6601
Facsimile: +81-3-6667-6611
http://www.npc.co.jp/
Email: sales@npc.co.jp
NC0413CE
2008.12
SEIKO NPC CORPORATION —16