BSI BS62LV1027HI55

Very Low Power CMOS SRAM
128K X 8 bit
BS62LV1027
Pb-Free and Green package materials are compliant to RoHS
n FEATURES
n DESCRIPTION
Ÿ Wide VCC operation voltage : 2.4V ~ 5.5V
Ÿ Very low power consumption :
VCC = 3.0V Operation current : 18mA (Max.) at 55ns
2mA (Max.) at 1MHz
Standby current : 0.02uA (Typ.) at 25 OC
VCC = 5.0V Operation current : 47mA (Max.) at 55ns
10mA (Max.) at 1MHz
Standby current : 0.4uA (Typ.) at 25OC
Ÿ High speed access time :
-55
55ns (Max.) at VCC : 3.0~5.5V
-70
70ns (Max.) at VCC : 2.7~5.5V
Ÿ Automatic power down when chip is deselected
Ÿ Easy expansion with CE2, CE1 and OE options
Ÿ Three state outputs and TTL compatible
Ÿ Fully static operation
Ÿ Data retention supply voltage as low as 1.5V
The BS62LV1027 is a high performance, very low power CMOS
Static Random Access Memory organized as 131,072 by 8 bits and
operates form a wide range of 2.4V to 5.5V supply voltage.
Advanced CMOS technology and circuit techniques provide both
high speed and low power features with typical CMOS standby
current of 0.02uA at 3.0V/25OC and maximum access time of 55ns at
3.0V/85OC.
Easy memory expansion is provided by an active LOW chip enable
(CE1), an active HIGH chip enable (CE2), and active LOW output
enable (OE) and three-state output drivers.
The BS62LV1027 has an automatic power down feature, reducing
the power consumption significantly when chip is deselected.
The BS62LV1027 is available in DICE form, JEDEC standard 32 pin
450mil Plastic SOP, 600mil Plastic DIP, 8mmx13.4mm STSOP,
8mmx20mm TSOP and 36-ball BGA package.
n POWER CONSUMPTION
POWER DISSIPATION
PRODUCT
FAMILY
STANDBY
OPERATING
TEMPERATURE
VCC=5.0V
BS62LV1027DC
BS62LV1027HC
BS62LV1027PC
BS62LV1027SC
BS62LV1027STC
BS62LV1027TC
BS62LV1027HI
BS62LV1027PI
BS62LV1027SI
BS62LV1027STI
BS62LV1027TI
Operating
(ICCSB1, Max.)
1MHz
fMax.
1MHz
9mA
29mA
46mA
1.5mA
9mA
17mA
Industrial
-40OC to +85OC
5.0uA
1.5uA
10mA
30mA
47mA
2mA
10mA
18mA
•
BS62LV1027PC
BS62LV1027PI
BS62LV1027SC
BS62LV1027SI
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
BS62LV1027STC
BS62LV1027STI
BS62LV1027TC
BS62LV1027TI
VCC
A15
CE2
WE
A13
A8
A9
A11
OE
A10
CE1
DQ7
DQ6
DQ5
DQ4
DQ3
DICE
BGA-36-0608
PDIP-32
SOP-32
STSOP-32
TSOP-32
BGA-36-0608
PDIP-32
SOP-32
STSOP-32
TSOP-32
n BLOCK DIAGRAM
OE
A10
CE1
DQ7
DQ6
DQ5
DQ4
DQ3
GND
DQ2
DQ1
DQ0
A0
A1
A2
A3
A6
A7
A12
A14
A16
A15
A13
A8
A9
A11
Address
10
Input
2
3
4
1024
Row
Decoder
Memory Array
1024 x 1024
Buffer
1024
DQ0
8
DQ1
DQ2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
fMax.
1.0uA
1
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
GND
VCC=3.0V
10MHz
3.0uA
•
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
VCC=5.0V
10MHz
Commercial
+0OC to +70OC
n PIN CONFIGURATIONS
A11
A9
A8
A13
WE
CE2
A15
VCC
NC
A16
A14
A12
A7
A6
A5
A4
PKG TYPE
(ICC, Max.)
VCC=3.0V
5
DQ3
DQ4
6
A
A0
A1
CE2
A3
A6
A8
B
DQ4
A2
WE
A4
A7
DQ0
C
DQ5
NC
A5
D
VSS
E
VCC
F
DQ6
G
DQ7
H
A9
8
DQ5
DQ6
Data
Input
Buffer
Data
Output
Buffer
8
Column I/O
Write Driver
Sense Amp
8
128
Column Decoder
DQ7
DQ1
CE2
CE1
WE
OE
VCC
GND
VCC
VSS
NC
NC
DQ2
OE
CE1
A16
A15
DQ3
A10
A11
A12
A13
A14
7
Control
Address Input Buffer
A5 A10 A4 A3 A2 A1 A0
36-ball BGA top view
Brilliance Semiconductor, Inc. reserves the right to change products and specifications without notice.
R0201-BS62LV1027
1
Revision 2.3
May.
2006
BS62LV1027
n PIN DESCRIPTIONS
Name
Function
A0-A16 Address Input
These 17 address inputs select one of the 131,072 x 8-bit in the RAM
CE1 Chip Enable 1 Input
CE1 is active LOW and CE2 is active HIGH. Both chip enables must be active when
data read form or write to the device. If either chip enable is not active, the device is
deselected and is in standby power mode. The DQ pins will be in the high impedance
state when the device is deselected.
CE2 Chip Enable 2 Input
WE Write Enable Input
The write enable input is active LOW and controls read and write operations. With the
chip selected, when WE is HIGH and OE is LOW, output data will be present on the
DQ pins; when WE is LOW, the data present on the DQ pins will be written into the
selected memory location.
OE Output Enable Input
The output enable input is active LOW. If the output enable is active while the chip is
selected and the write enable is inactive, data will be present on the DQ pins and they
will be enabled. The DQ pins will be in the high impendence state when OE is inactive.
DQ0-DQ7 Data Input/Output
There 8 bi-directional ports are used to read data from or write data into the RAM.
Ports
VCC
Power Supply
GND
Ground
n TRUTH TABLE
MODE
CE1
CE2
WE
OE
Not selected
(Power Down)
H
X
X
X
X
L
X
X
Output Disabled
L
H
H
Read
L
H
Write
L
H
n ABSOLUTE MAXIMUM RATINGS
TBIAS
TSTG
VCC CURRENT
High Z
ICCSB, ICCSB1
H
High Z
ICC
H
L
DOUT
ICC
L
X
DIN
ICC
(1)
n OPERATING RANGE
RATING
UNITS
RANG
AMBIENT
TEMPERATURE
VCC
Terminal Voltage with
Respect to GND
Temperature Under
Bias
-0.5(2) to 7.0
V
Commercial
0OC to + 70OC
2.4V ~ 5.5V
-40 to +125
O
C
Industrial
-40OC to + 85OC
2.4V ~ 5.5V
Storage Temperature
-60 to +150
O
C
SYMBOL
VTERM
I/O OPERATION
PARAMETER
PT
Power Dissipation
1.0
W
IOUT
DC Output Current
20
mA
n CAPACITANCE
O
(TA = 25 C, f = 1.0MHz)
SYMBOL PAMAMETER CONDITIONS MAX. UNITS
1. Stresses greater than those listed under ABSOLUTE
MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of
the device at these or any other conditions above those
indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. –2.0V in case of AC pulse width less than 30 ns.
R0201-BS62LV1027
(1)
CIN
CIO
Input
Capacitance
Input/Output
Capacitance
VIN = 0V
6
pF
VI/O = 0V
8
pF
1. This parameter is guaranteed and not 100% tested.
2
Revision 2.3
May.
2006
BS62LV1027
O
O
n DC ELECTRICAL CHARACTERISTICS (TA = -40 C to +85 C)
PARAMETER
NAME
PARAMETER
TEST CONDITIONS
MIN.
TYP.(1)
MAX.
UNITS
2.4
--
5.5
V
VCC
Power Supply
VIL
Input Low Voltage
-0.5(2)
--
0.8
V
VIH
Input High Voltage
2.2
--
VCC+0.3(3)
V
IIL
Input Leakage Current
VCC = Max, VIN = 0V to VCC
--
--
1
uA
ILO
Output Leakage Current
V CC = Max, CE1= VIH, CE2= VIL, or
OE = VIH, V I/O = 0V to V CC
--
--
1
uA
VOL
Output Low Voltage
V CC = Max, IOL = 2.0mA
--
--
0.4
V
2.4
--
--
V
VOH
ICC(5)
ICC1
ICCSB
ICCSB1(6)
Output High Voltage
VCC=3.0V
VCC=5.0V
VCC=3.0V
V CC = Min, IOH = -1.0mA
VCC=5.0V
Operating Power Supply
Current
CE1 = VIL, CE2 = VIH,
IDQ = 0mA, f = fMax(4)
VCC=3.0V
--
--
18
VCC=5.0V
--
--
47
Operating Power Supply
Current
CE1 = VIL, CE2 = VIH,
IDQ = 0mA, f = 1MHz
VCC=3.0V
2
VCC=5.0V
10
Standby Current – TTL
CE1 = VIH, or CE2 = VIL,
IDQ = 0mA
VCC=3.0V
--
--
0.5
VCC=5.0V
--
--
1.0
CE1≧VCC-0.2V or CE2≦0.2V,
VCC=3.0V
--
0.02
1.5
VCC=5.0V
--
0.4
5.0
MIN.
TYP. (1)
MAX.
UNITS
1.5
--
--
V
--
0.02
0.5
uA
0
--
--
ns
tRC (2)
--
--
ns
Standby Current – CMOS
VIN≧V CC-0.2V or VIN≦0.2V
1. Typical characteristics are at TA=25OC and not 100% tested.
2. Undershoot: -1.0V in case of pulse width less than 20 ns.
3. Overshoot: VCC+1.0V in case of pulse width less than 20 ns.
4. fMax.=1/tRC.
5. ICC (MAX.) is 17mA/46mA at VCC=3.0V/5.0V and TA=70OC.
6. ICCSB1(MAX.) is 1.3uA/4.0uA at VCC=3.0V/5.0V and TA=70OC.
O
mA
mA
mA
uA
O
n DATA RETENTION CHARACTERISTICS (TA = -40 C to +85 C)
SYMBOL
PARAMETER
VDR
VCC for Data Retention
ICCDR(3)
Data Retention Current
tCDR
Chip Deselect to Data
Retention Time
tR
TEST CONDITIONS
CE1≧VCC-0.2V or CE2≦0.2V,
VIN≧VCC-0.2V or VIN≦0.2V
CE1≧VCC-0.2V or CE2≦0.2V,
VIN≧VCC-0.2V or VIN≦0.2V
See Retention Waveform
Operation Recovery Time
O
1. VCC=1.5V, TA=25 C and not 100% tested.
2. tRC = Read Cycle Time.
3. ICCRD(Max.) is0.3uA at TA=70OC.
n LOW VCC DATA RETENTION WAVEFORM (1) (CE1 Controlled)
Data Retention Mode
VCC
VCC
VDR≧1.5V
tCDR
CE1
R0201-BS62LV1027
VIH
VCC
tR
CE1≧VCC - 0.2V
3
VIH
Revision 2.3
May.
2006
BS62LV1027
n LOW VCC DATA RETENTION WAVEFORM (2) (CE2 Controlled)
Data Retention Mode
VDR≧1.5V
VCC
VCC
VCC
tCDR
tR
CE2≦0.2V
CE2
VIL
VIL
n AC TEST CONDITIONS
n KEY TO SWITCHING WAVEFORMS
(Test Load and Input/Output Reference)
Input Pulse Levels
Vcc / 0V
Input Rise and Fall Times
1V/ns
Input and Output Timing
Reference Level
0.5Vcc
Output Load
WAVEFORM
tCLZ, tOLZ, tCHZ, tOHZ, tWHZ
CL = 5pF+1TTL
Others
CL = 30pF+1TTL
ALL INPUT PULSES
VCC
1 TTL
Output
GND
CL(1)
90%
90%
10%
10%
→ ←
Rise Time :
1V/ns
→ ←
Fall Time :
1V/ns
INPUTS
OUTPUTS
MUST BE
STEADY
MUST BE
STEADY
MAY CHANGE
FROM “H” TO “L”
WILL BE CHANGE
FROM “H” TO “L”
MAY CHANGE
FROM “L” TO “H”
WILL BE CHANGE
FROM “L” TO “H”
DON’T CARE
ANY CHANGE
PERMITTED
CHANGE :
STATE UNKNOW
DOES NOT
APPLY
CENTER LINE IS
HIGH INPEDANCE
“OFF” STATE
1. Including jig and scope capacitance.
O
O
n AC ELECTRICAL CHARACTERISTICS (TA = -40 C to +85 C)
READ CYCLE
CYCLE TIME : 55ns
(VCC = 3.0~5.5V)
MIN. TYP. MAX.
CYCLE TIME : 70ns
(VCC = 2.7~5.5V)
MIN. TYP. MAX.
JEDEC
PARAMETER
NAME
PARAMETER
NAME
tAVAX
tRC
Read Cycle Time
55
--
--
70
--
--
ns
tAVQX
tAA
Address Access Time
--
--
55
--
--
70
ns
tE1LQV
tACS1
Chip Select Access Time
(CE1)
--
--
55
--
--
70
ns
tE2HQV
tACS2
Chip Select Access Time
(CE2)
--
--
55
--
--
70
ns
tGLQV
tOE
Output Enable to Output Valid
--
--
30
--
--
35
ns
tE1LQX
tCLZ1
Chip Select to Output in Low Z
(CE1)
10
--
--
10
--
--
ns
tE2HQX
tCLZ2
Chip Select to Output in Low Z
(CE2)
10
--
--
10
--
--
ns
tGLQX
tOLZ
Output Enable to Output in Low Z
5
--
--
5
--
--
ns
tE1HQZ
tCHZ1
Chip Deselect to Output in High Z
(CE1)
--
--
30
--
--
35
ns
tE2LQZ
tCHZ2
Chip Deselect to Output in High Z
(CE2)
--
--
30
--
--
35
ns
tGHQZ
tOHZ
Output Disable to Output in High Z
--
--
25
--
--
30
ns
tAVQX
tOH
Data Hold from Address Change
10
--
--
10
--
--
ns
R0201-BS62LV1027
DESCRIPTION
4
UNITS
Revision 2.3
May.
2006
BS62LV1027
n SWITCHING WAVEFORMS (READ CYCLE)
READ CYCLE 1
(1,2,4)
tRC
ADDRESS
tAA
tOH
tOH
DOUT
READ CYCLE 2
(1,3,4)
CE1
tACS1
CE2
tACS2
tCLZ
tCHZ1, tCHZ2
(5)
(5)
DOUT
READ CYCLE 3
(1, 4)
tRC
ADDRESS
tAA
OE
tOH
tOE
tOLZ
CE1
(5)
tACS1
tCLZ1
CE2
tOHZ
(5)
tCHZ1
(1,5)
tCHZ2
(2,5)
tACS2
(5)
tCLZ2
DOUT
NOTES:
1. WE is high in read Cycle.
2. Device is continuously selected when CE1 = VIL and CE2= VIH.
3. Address valid prior to or coincident with CE1 transition low and/or CE2 transition high.
4. OE = VIL.
5. Transition is measured ± 500mV from steady state with CL = 5pF.
The parameter is guaranteed but not 100% tested.
R0201-BS62LV1027
5
Revision 2.3
May.
2006
BS62LV1027
O
O
n AC ELECTRICAL CHARACTERISTICS (TA = -40 C to +85 C)
WRITE CYCLE
CYCLE TIME : 55ns
(VCC = 3.0~5.5V)
CYCLE TIME : 70ns
(VCC = 2.7~5.5V)
MIN.
TYP.
MAX.
MIN.
TYP.
MAX.
Write Cycle Time
55
--
--
70
--
--
ns
tCW
Chip Select to End of Write
55
--
--
70
--
--
ns
tAVWL
tAS
Address Set up Time
0
--
--
0
--
--
ns
tAVWH
tAW
Address Valid to End of Write
55
--
--
70
--
--
ns
tWLWH
tWP
Write Pulse Width
30
--
--
35
--
--
ns
tWHAX
tWR1
Write Recovery Time
(CE1, WE)
0
--
--
0
--
--
ns
tE2LAX
tWR2
Write Recovery Time
(CE2)
0
--
--
0
--
--
ns
tWLQZ
tWHZ
Write to Output in High Z
--
--
25
--
--
30
ns
tDVWH
tDW
Data to Write Time Overlap
25
--
--
30
--
--
ns
tWHDX
tDH
Data Hold from Write Time
0
--
--
0
--
--
ns
tGHQZ
tOHZ
Output Disable to Output in High Z
--
--
25
--
--
30
ns
tWHQX
tOW
End of Write to Output Active
5
--
--
5
--
--
ns
JEDEC
PARAMETER
NAME
PARAMETER
NAME
tAVAX
tWC
tE1LWH
DESCRIPTION
UNITS
n SWITCHING WAVEFORMS (WRITE CYCLE)
WRITE CYCLE 1
(1)
tWC
ADDRESS
tWR1
(3)
tWR2
(3)
OE
CE1
(5)
CE2
(5)
tAW
WE
(11)
tCW
(11)
tWP
tAS
tOHZ
tCW
(2)
(4,10)
DOUT
tDH
tDW
DIN
R0201-BS62LV1027
6
Revision 2.3
May.
2006
BS62LV1027
WRITE CYCLE 2
(1,6)
tWC
ADDRESS
(5)
CE1
CE2
tCW
(11)
tCW
(11)
(5)
tAW
tWP
WE
tAS
tWHZ
tWR2
(2)
(4,10)
(3)
tOW
(7)
(8)
DOUT
tDW
tDH
(8,9)
DIN
NOTES:
1. WE must be high during address transitions.
2. The internal write time of the memory is defined by the overlap of CE1 and CE2 active and
WE low. All signals must be active to initiate a write and any one signal can terminate a
write by going inactive. The data input setup and hold timing should be referenced to the
second transition edge of the signal that terminates the write.
3. tWR is measured from the earlier of CE1 or WE going high or CE2 going low at the end of
write cycle.
4. During this period, DQ pins are in the output state so that the input signals of opposite
phase to the outputs must not be applied.
5. If the CE1 low transition or the CE2 high transition occurs simultaneously with the WE low
transitions or after the WE transition, output remain in a high impedance state.
6. OE is continuously low (OE = VIL).
7. DOUT is the same phase of write data of this write cycle.
8. DOUT is the read data of next address.
9. If CE1 is low and CE2 is high during this period, DQ pins are in the output state. Then the
data input signals of opposite phase to the outputs must not be applied to them.
10. Transition is measured ± 500mV from steady state with CL = 5pF.
The parameter is guaranteed but not 100% tested.
11. tCW is measured from the later of CE1 going low or CE2 going high to the end of write.
R0201-BS62LV1027
7
Revision 2.3
May.
2006
BS62LV1027
n ORDERING INFORMATION
BS62LV1027
X
X
Z
YY
SPEED
55: 55ns
70: 70ns
PKG MATERIAL
-: Normal
G: Green, RoHS Compliant
P: Pb free, RoHS Compliant
GRADE
C: +0oC ~ +70oC
I: -40oC ~ +85oC
PACKAGE
D: DICE
H: BGA-36-0608
P: PDIP
S: SOP
T: TSOP (8mm x 20mm)
ST: Small TSOP (8mm x 13.4mm)
Note:
BSI (Brilliance Semiconductor Inc.) assumes no responsibility for the application or use of any product or circuit described herein. BSI does
not authorize its products for use as critical components in any application in which the failure of the BSI product may be expected to result
in significant injury or death, including life-support systems and critical medical instruments.
n PACKAGE DIMENSIONS
WITH PLATING
c
b
c1
BASE METAL
b1
SECTION
A-A
SOP -32
R0201-BS62LV1027
8
Revision 2.3
May.
2006
BS62LV1027
n PACKAGE DIMENSIONS (continued)
n
STSOP - 32
TSOP - 32
R0201-BS62LV1027
9
Revision 2.3
May.
2006
BS62LV1027
PACKAGE DIMENSIONS (continued)
PDIP - 32
NOTES
:
1: CONTROLLING DIMENSIONS ARE IN MILLIMETERS.
2: PIN#1 DOT MARKING BY LASER OR PAD PRINT.
1.2 Max.
3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS.
BALL PITCH e = 0.75
D
E
N
D1
E1
8.0
6.0
48
5.25
3.75
E1
e
D1
VIEW A
36 mini-BGA (6 x 8mm)
R0201-BS62LV1027
10
Revision 2.3
May.
2006
BS62LV1027
n Revision History
Revision No.
History
Draft Date
2.2
Add Icc1 characteristic parameter
Improve Iccsb1 spec.
I-grade from 20uA to 5.0uA at 5.0V
2.5uA to 1.5uA at 3.0V
C-grade from 8.0uA to 3.0uA at 5.0V
1.3uA to 1.0uA at 3.0V
Jan. 13, 2006
2.3
Change I-grade operation temperature range
- from –25OC to –40OC
May. 25, 2006
R0201-BS62LV1027
11
Remark
Revision 2.3
May.
2006