NSC DS75325

DS75325
Memory Drivers
General Description
The DS75325 is a monolithic memory driver which features
high current outputs as well as internal decoding of logic
inputs. This circuit is designed for use with magnetic memories.
The circuit contains two 600 mA sink-switch pairs and two
600 mA source-switch pairs. Inputs A and B determine
source selection while the source strobe (S1) allows the
selected source turn on. In the same manner, inputs C and
D determine sink selection while the sink strobe (S2) allows
the selected sink turn on.
Sink-output collectors feature an internal pull-up resistor in
parallel with a clamping diode connected to VCC2. This protects the outputs from voltage surges associated with
switching inductive loads.
The source stage features Node R which allows extreme
flexibility in source current selection by controlling the
amount of base drive to each source transistor. This method
of setting the base drive brings the power associated with
the resistor outside the package thereby allowing the circuit
to operate at higher source currents for a given junction
temperature. If this method of source current setting is not
desired, then Nodes R and RINT can be shorted externally,
activating an internal resistor connected from VCC2 to Node
R. This provides adequate base drive for source currents up
to 375 mA with VCC2 e 15V or 600 mA with VCC2 e 24V.
Connection Diagram
Truth Table
Dual-In-Line Package
Features
Y
Y
Y
Y
Y
Y
Y
600 mA output capability
24V output capability
Dual sink and dual source outputs
Fast switching times
Source base drive externally adjustable
Input clamping diodes
TTL compatible
Address Inputs
Source
Sink
A
B C D
L
H X X
H
L
X X
X
X
L H
X
X H L
X
X X X
H
H H H
Strobe Inputs
Source Sink
S1
S2
L
H
L
H
H
L
H
L
H
H
X
X
Outputs
Source
Sink
W
X
Y
Z
ON OFF OFF OFF
OFF ON OFF OFF
OFF OFF ON OFF
OFF OFF OFF ON
OFF OFF OFF OFF
OFF OFF OFF OFF
H e High Level, L e Low Level, X e Irrelevant
Note: Not more than one output is to be on at any one time.
TL/F/9755 – 2
Top View
Order Number DS75325N
See NS Package Number N14A
C1995 National Semiconductor Corporation
TL/F/9755
RRD-B30M115/Printed in U. S. A.
DS75325 Memory Drivers
June 1992
Absolute Maximum Ratings (Note 1)
Storage Temperature Range
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage VCC1 (Note 5)
Supply Voltage VCC2 (Note 5)
Input Voltage (Any Address or Strobe Input)
Maximum Power Dissipation* at 25§ C
Cavity Package
Molded Package
b 65§ C to a 150§ C
Lead Temperature
(Soldering, 10 seconds)
7V
25V
5.5V
300§ C
Operating Conditions
Temperature (TA)
DS75325
1509 mW
1476 mW
Min
Max
Units
0
a 70
§C
*Derate Cavity Package 10.1 mW/§ C above 25§ C; derate molded package
11.8 mW/§ C above 25§ C.
Electrical Characteristics (Notes 2 and 3)
Symbol
Parameter
Conditions
VIH
High Level Input Voltage
(Figures 1 and 2)
VIL
Low Level Input Voltage
(Figures 3 and 4)
VI
Input Clamp Voltage
VCC1 e 4.5V, VCC2 e 24V, IIN e b12 mA
TA e 25§ C (Figure 5)
Source Collectors Terminal
‘‘Off’’ State Current
VCC1 e 4.5V, VCC2 e 24V
IOFF
Min
Full Range
(Figure 1)
TA e 25§ C
b 1.7
V
500
mA
mA
DS55325
3
150
mA
DS75325
3
200
mA
VCC1 e 4.5V, VCC2 e 24V, IOUT e 0 mA (Figure 2)
VCC1 e 4.5V, VCC2 e 15V,
RL e 24X,
ISOURCE & b600 mA
(Figure 3) (Notes 4 and 6)
IIL
V
200
Saturation Voltage Source
Outputs
IIH
0.8
DS55325
High Level Sink Output Voltage
II
Units
DS75325
VSAT
Saturation Voltage
Sink Outputs
Max
VCC1 e 4.5V, VCC2 e 15V,
RL e 24X,
ISINK & 600 mA (Figure 4)
(Notes 4 and 6)
V
b 1.3
VOH
VSAT
Typ
2
19
23
Full Range
TA e 25§ C
0.9
V
DS55325
0.43
0.7
V
DS75325
0.43
0.75
V
0.9
V
Full Range
TA e 25§ C
V
DS55325
0.43
0.7
V
DS75325
0.43
0.75
V
Input Current at Maximum
Input Voltage
VCC1 e 5.5V, VCC2 e 24V,
VI e 5.5V (Figure 5)
Address Inputs
1
mA
Strobe Inputs
2
mA
High Level Input Current
VCC1 e 5.5V, VCC2 e 24V,
VI e 2.4V (Figure 5)
Address Inputs
3
40
mA
Strobe Inputs
6
80
mA
Address Inputs
b1
b 1.6
mA
Strobe Inputs
b2
b 3.2
mA
VCC1
14
22
mA
VCC2
7.5
20
mA
Low Level Input Current
VCC1 e 5.5V, VCC2 e 24V,
VI e 0.4V (Figure 5)
Supply Current, All Sources
and Sinks ‘‘Off’’
VCC1 e 5.5V, VCC2 e 24V,
TA e 25§ C (Figure 6)
ICC1
Supply Current from VCC1,
Either Sink ‘‘On’’
VCC1 e 5.5V, VCC2 e 24V, ISINK e 50 mA,
TA e 25§ C (Figure 7)
55
70
mA
ICC2
Supply Current from VCC2,
Either Source ‘‘On’’
VCC1 e 5.5V, VCC2 e 24V, ISOURCE e b50 mA
TA e 25§ C (Figure 8)
32
50
mA
ICC OFF
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: Unless otherwise specified min/max limits apply across the b 55§ C to a 125§ C temperature range for the DS55325 and across the 0§ C to a 70§ C range for
the DS75325. All typical values are at TA e 25§ C.
Note 3: All currents into device pins shown as positive, out of device pins as negative, all voltages referenced to ground unless otherwise noted. All values shown
as max or min on absolute value basis.
Note 4: Only one output at a time should be shorted.
Note 5: Voltage values are with respect to network ground terminal.
Note 6: These parameters must be measured using pulse techniques. tW e 200 ms, duty cycle s 2%.
2
Switching Characteristics VCC1 e 5V, TA e 25§ C
Symbol
tPLH
Parameter
Conditions
Typ
Max
Units
Source Collectors
25
50
ns
Sink Outputs
20
45
ns
VCC2 e 15V, RL e 24X,
CL e 25 pF (Figure 9)
Source Collectors
25
50
ns
Sink Outputs
20
45
ns
CL e 25 pF
Source Outputs, VCC2 e 20V,
RL e 1 kX (Figure 10)
55
Sink Outputs, VCC2 e 15V,
RL e 24X (Figure 9)
7
Source Outputs, VCC2 e 20V,
RL e 1 kX (Figure 10)
7
Sink Outputs, VCC2 e 15V,
RL e 24X (Figure 9)
9
20
ns
15
30
ns
Propagation Delay Time,
Low-to-High Level Output
VCC2 e 15V, RL e 24X,
CL e 25 pF (Figure 9)
tPHL
Propagation Delay Time,
High-to-Low Level Output
tTLH
Transition Time,
Low-to-High Level Output
tTHL
tS
Transition Time,
High-to-Low Level Output
Storage Time, Sink Outputs
CL e 25 pF
VCC2 e 15V, RL e 24X, CL e 25 pF (Figure 9)
Min
DC Test Circuits
TL/F/9755 – 3
Test Table
A
B
GND GND
2V
2V
S1
2V
GND
FIGURE 1. IOFF
3
ns
15
ns
ns
DC Test Circuits (Continued)
Test Table
C
D
S2
Y
Z
2V
4.5V
GND
VOH
OPEN
GND
4.5V
2V
VOH
OPEN
4.5V
2V
GND
OPEN
VOH
4.5V
GND
2V
OPEN
VOH
A
B
S1
0.8V
4.5V
4.5V
0.8V
TL/F/9755 – 4
FIGURE 2. VIH and VOH
Test Table
W
X
0.8V
GND
OPEN
0.8V
OPEN
GND
TL/F/9755 – 5
Note 1: Figure 3 and 4 parameters must be measured using pulse techniques, tW e 200 ms, duty cycle s 2%.
FIGURE 3. VIL and Source VSAT
4
DC Test Circuits (Continued)
TL/F/9755 – 6
Note 1: Figure 3 and 4 parameters must be measured using pulse techniques, tW e 200 ms, duty cycle s 2%.
Test Table
C
D
S2
Y
Z
0.8V
4.5V
0.8V
RL
OPEN
4.5V
0.8V
0.8V
OPEN
RL
FIGURE 4. VIL and Sink VSAT
5
DC Test Circuits (Continued)
TL/F/9755 – 7
Test Tables
II, IIH
Apply VI e 5.5V
Measure II
Ground
VI, IIL
Apply VI e 0.4V
Measure IIL
Apply 5.5V
Apply VI e 2.4V
Measure IIH
Apply 5.5V
Apply II e b10 mA
Measure VI
A
S1
B, C, S2, D
A
S1
B
S1, B, C, S2, D
A, B
C, S2, D
S1
A, B, C, S2, D
S1
A, C, S2, D
B
A, S1, C, S2, D
C
S2
A, S1, B, D
C
A, S1, B, S2, D
S2
C, D
A, S1, B
S2
A, S1, B, C, D
D
S2
A, S1, B, C
D
A, S1, B, C, S2
FIGURE 5. VI, II, IIH and IIL
6
DC Test Circuits (Continued)
TL/F/9755 – 8
FIGURE 6. ICC1 (OFF) and ICC2 (OFF)
7
DC Test Circuits (Continued)
TL/F/9755 – 9
Test Table
C
D
S2
Y
Z
GND
5V
5V
GND
GND
ISINK
OPEN
GND
OPEN
ISINK
FIGURE 7. ICC1, Either Sink On
8
DC Test Circuits (Continued)
TL/F/9755 – 10
Test Table
A
B
S1
GND
5V
GND
5V
GND
GND
FIGURE 8. ICC2, Either Source On
9
DC Test Circuits (Continued)
TL/F/9755 – 11
Note 1: The pulse generator has the following characteristics: ZOUT e 50X, duty cycle s 1%.
Note 2: CL includes probe and jig capacitance.
Voltage Waveforms
TL/F/9755 – 12
Test Table
Parameter
tPLH and tPHL
tPLH, tPHL,
tTLH, tTHL and tS
Output Under Test
Source Collectors
Input
Connect to 5V
A and S1
B, C, D and S2
B and S1
A, C, D and S2
Sink Output Y
C and S2
A, B, D and S1
Sink Output Z
D and S2
A, B, C and S1
FIGURE 9. Switching Times
10
DC Test Circuits (Continued)
TL/F/9755 – 13
Note 1: The pulse generator has the following characteristics: ZOUT e 50X, duty cycle s 1%.
Note 2: CL includes probe and jig capacitance.
Voltage Waveforms
TL/F/9755 – 14
Test Table
Parameter
tTLH and tTHL
Input
Connect to 5V
Source Output W
Output Under Test
A and S1
B, C, D and S2
Source Output X
B and S1
A, C, D and S2
FIGURE 10. Transition Times of Source Outputs
11
Schematic Diagram
TL/F/9755 – 1
12
Applications
After solving for Rext, the magnitude of the source collector
current (ICS) is determined from Equation 3.
ICS & 0.94 IL
(3)
where: ICS is in mA.
As an example, let VCC2(Min) e 20V and VL e 3V while IL
of 500 mA flows. Using Equation 1:
16 (20 b 3 b 2.2)
e 0.5 kX
Rext e
500 b 1.6 (20 b 3 b 2.9)
EXTERNAL RESISTOR CALCULATION
A typical magnetic-memory word drive requirement is shown
in Figure 11 . A source-output transistor of one DS75325
delivers load current (IL). The sink-output transistor of another DS75325 sinks this current.
The value of the external pull-up resistor (Rext) for a particular memory application may be determined using the following equation:
16 [VCC2(Min) b VS b 2.2]
Rext e
(1)
IL b1.6 [VCC2(Min) b VS b 2.9]
and from Equation 2:
where: Rext is in kX,
VCC2(Min) is the lowest expected value of VCC2 in volts, VS
is the source output voltage in volts with respect to ground,
IL is in mA.
The power dissipated in resistor Rext during the load current
pulse duration is calculated using Equation 2.
IL
[VCC2(Min) b VS b 2]
PRext &
16
where: PRext is in mW.
PRext &
500
[20 b 3 b 2] & 470 mW
16
The amount of the memory system current source (ICS)
from Equation 3 is:
ICS & 0.94 (500) & 470 mA
In this example the regulated source-output transistor base
current through the external pull-up resistor (Rext) and the
source gate is approximately 30 mA. This current and ICS
comprise IL.
(2)
TL/F/9755 – 15
Note 1: For clarity, partial logic diagrams of two DS55325s are shown.
Note 2: Source and sink shown are in different packages.
FIGURE 11. Typical Application Data
13
DS75325 Memory Drivers
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package (N)
Order Number DS75325N
NS Package Number N14A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
1111 West Bardin Road
Arlington, TX 76017
Tel: 1(800) 272-9959
Fax: 1(800) 737-7018
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
National Semiconductor
Europe
Fax: (a49) 0-180-530 85 86
Email: cnjwge @ tevm2.nsc.com
Deutsch Tel: (a49) 0-180-530 85 85
English Tel: (a49) 0-180-532 78 32
Fran3ais Tel: (a49) 0-180-532 93 58
Italiano Tel: (a49) 0-180-534 16 80
National Semiconductor
Hong Kong Ltd.
13th Floor, Straight Block,
Ocean Centre, 5 Canton Rd.
Tsimshatsui, Kowloon
Hong Kong
Tel: (852) 2737-1600
Fax: (852) 2736-9960
National Semiconductor
Japan Ltd.
Tel: 81-043-299-2309
Fax: 81-043-299-2408
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.