ETC CD4069UBCSJX

Revised April 2002
CD4069UBC
Inverter Circuits
General Description
Features
The CD4069UB consists of six inverter circuits and is manufactured using complementary MOS (CMOS) to achieve
wide power supply operating range, low power consumption, high noise immunity, and symmetric controlled rise
and fall times.
■ Wide supply voltage range:
This device is intended for all general purpose inverter
applications where the special characteristics of the
MM74C901, MM74C907, and CD4049A Hex Inverter/Buffers are not required. In those applications requiring larger
noise immunity the MM74C14 or MM74C914 Hex Schmitt
Trigger is suggested.
3.0V to 15V
■ High noise immunity: 0.45 VDD typ.
■ Low power TTL compatibility:
or 1 driving 74LS
Fan out of 2 driving 74L
■ Equivalent to MM74C04
All inputs are protected from damage due to static discharge by diode clamps to VDD and VSS.
Ordering Code:
Order Number
Package Number
Package Description
CD4069UBCM
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
CD4069UBCSJ
M14D
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
CD4069UBCN
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Device also available in Tape and Reel. Specify by appending suffix “X” to the ordering code.
Connection Diagram
© 2002 Fairchild Semiconductor Corporation
Schematic Diagram
DS005975
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CD4069UBC Inverter Circuits
October 1987
CD4069UBC
Absolute Maximum Ratings(Note 1)
Recommended Operating
Conditions (Note 2)
(Note 2)
−0.5V to +18 VDC
DC Supply Voltage (VDD)
DC Supply Voltage (VDD)
−0.5V to VDD +0.5 VDC
Input Voltage (VIN)
−65°C to +150°C
Storage Temperature Range (TS)
700 mW
Small Outline
500 mW
−55°C to +125°C
Note 1: “Absolute Maximum Ratings” are those values beyond which the
safety of the device cannot be guaranteed. They are not meant to imply
that the devices should be operated at these limits. The table of “Recommended Operating Conditions” and Electrical Characteristics table provide
conditions for actual device operation.
Lead Temperature (TL)
Note 2: VSS = 0V unless otherwise specified.
260°C
(Soldering, 10 seconds)
0V to VDD VDC
Operating Temperature Range (TA)
Power Dissipation (PD)
Dual-In-Line
3V to 15VDC
Input Voltage (VIN)
DC Electrical Characteristics (Note 3)
Symbol
IDD
Parameter
Quiescent Device Current
−55°C
Conditions
Min
VDD = 5V,
Max
+25°C
Min
Typ
+125°C
Max
Min
Max
0.25
0.25
7.5
0.5
0.5
15
1.0
1.0
30
Units
VIN = VDD or VSS
VDD = 10V,
VIN = VDD or VSS
VDD = 15V,
µA
VIN = VDD or VSS
VOL
VOH
VIL
VIH
IOL
IOH
IIN
LOW Level Output Voltage
HIGH Level Output Voltage
LOW Level Input Voltage
HIGH Level Input Voltage
|IO| < 1 µA
VDD = 5V
0.05
0
0.05
0.05
VDD = 10V
0.05
0
0.05
0.05
VDD = 15V
0.05
0
0.05
0.05
|IO| < 1 µA
VDD = 5V
4.95
4.95
5
VDD = 10V
9.95
9.95
10
9.95
VDD = 15V
14.95
14.95
15
14.95
4.95
VDD = 5V, VO = 4.5V
1.0
1.0
1.0
VDD = 10V, VO = 9V
2.0
2.0
2.0
VDD = 15V, VO = 13.5V
3.0
3.0
3.0
V
|IO| < 1 µA
4.0
4.0
4.0
VDD = 10V, VO = 1V
8.0
8.0
8.0
VDD = 15V, VO = 1.5V
12.0
12.0
12.0
LOW Level Output Current
VDD = 5V, VO = 0.4V
0.64
0.51
0.88
(Note 4)
VDD = 10V, VO = 0.5V
1.6
1.3
2.25
0.9
VDD = 15V, VO = 1.5V
4.2
3.4
8.8
2.4
HIGH Level Output Current
VDD = 5V, VO = 4.6V
−0.64
−0.51
−0.88
−0.36
(Note 4)
VDD = 10V, VO = 9.5V
−1.6
−1.3
−2.25
−0.9
VDD = 15V, VO = 13.5V
−4.2
−3.4
−8.8
−2.4
V
0.36
mA
mA
VDD = 15V, VIN = 0V
−0.1
−10−5
−0.1
−1.0
VDD = 15V, VIN = 15V
0.1
10−5
0.1
1.0
Note 3: VSS = 0V unless otherwise specified.
Note 4: IOH and IOL are tested one output at a time.
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V
|IO| < 1 µA
VDD = 5V, VO = 0.5V
Input Current
V
2
µA
(Note 5)
TA = 25°C, CL = 50 pF, RL = 200 kΩ, tr and tf ≤ 20 ns, unless otherwise specified
Symbol
tPHL or tPLH
tTHL or tTLH
Typ
Max
Propagation Delay Time from
Parameter
VDD = 5V
50
90
Input to Output
VDD = 10V
30
60
VDD = 15V
25
50
Transition Time
Conditions
Min
VDD = 5V
80
150
VDD = 10V
50
100
VDD = 15V
40
80
15
CIN
Average Input Capacitance
Any Gate
6
CPD
Power Dissipation Capacitance
Any Gate (Note 6)
12
Units
ns
ns
pF
pF
Note 5: AC Parameters are guaranteed by DC correlated testing.
Note 6: CPD determines the no load AC power consumption of any CMOS device. For complete explanation, see Family Characteristics application note—
AN-90.
AC Test Circuits and Switching Time Waveforms
3
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CD4069UBC
AC Electrical Characteristics
CD4069UBC
Typical Performance Characteristics
Gate Transfer Characteristics
Propagation Delay vs. Ambient Temperature
Power Dissipation vs. Frequency
Propagation Delay vs. Ambient Temperature
Propagation Delay Time vs. Load Capacitance
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4
CD4069UBC
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
5
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CD4069UBC
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
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6
CD4069UBC Inverter Circuits
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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7
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