LANSDALE 12502BCA

ML12502
Analog Mixer With On–Chip
Regulator For Bias Control
Legacy Device: Motorola 12502
The ML12502 is the military temperature version of the
commercial ML12002 device. It is a double balanced analog mixer, including an input amplifier feeding the mixer
carrier port and a temperature compensated bias regulator.
The input circuits for both the amplifier and mixer are differential amplifier circuits. The on-chip regulator provides
all of the required biasing.
This circuit is designed for use as a balanced mixer in
high-frequency wide-band circuits. Other typical applications include suppressed carrier and amplitude modulation,
synchronous AM detection, FM detection, phase detection,
and frequency doubling, at frequencies up to UHF.
14
1
CERDIP 14 = C
CERAMIC PACKAGE
CASE 632
CROSS REFERENCE/ORDERING INFORMATION
PACKAGE
MOTOROLA
LANSDALE
CERDIP 14
12502/BCA
ML12502/BCA
There are two package offerings:
• Dual Inline 14 Lead, Ceramic Package.
PIN CONNECTIONS
• Operating Temperature Range: TA = –55° to +125°C
Figure 1. Logic Diagram
Local
Oscillator
Inputs
2
12
VB
VR
8
Signal
Inputs
Carrier
Port
Amplifier
3
11
Output
Mixer
Signal
Port
VR VB
9
1
14
VCC
Local Oscillator
Input
2
13
Resistor Load
Local Oscillator
Input
3
12
Data Output
Alternate Signal
Input
4
11
Data Output
Null Adjust
5
10
Regulator
Bypass
Null Adjust
6
9
Mixer Signal
Input
VEE
7
8
Mixer Signal
Input
(Top View)
Bias
Regulator
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Regulator
Bypass
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ELECTRICAL CHARACTERISTICS
ML12502
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ELECTRICAL CHARACTERISTICS
ML12502
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ML12502
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Figure 4. Carrier Feedthrough Test Circuits
Signal A
Input (Pin 2)
Output (Pin12)
Output (Pin 11)
Signal B Input (Pin 8)
Output (Pin 12)
Output (Pin 11)
Tektronix
454 and 568
Oscilloscopes
1.0 µf
2
12
Local Oscillator
Inputs
3
Outputs
11
1.0 µf
Hewlett Packard
651A and 3300B
100 kHz to 100 MHz
@ 30 mVpp
Sampling Volt meter
Hewlett Packard
3406A or Equiv.
Mixer
Inputs
8
1.0 µf
Reg.
Bypass
9
1
10
0.1 µf
0.1 µf
Null
Adjust
VEE
7
5
6
133
133
VCC
14
50
0.1 µf
+5.0 V
Notes:
Test 1 – Adjust potentiometer for carrier null at fc = 100 kHz.
Test 2 – Connect pins 5 and 6 to Gnd.
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All Input and output
cables to the scope are
equal lengths of 50-ohm
coaxial cable.
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ML12502
LANSDALE Semiconductor, Inc.
Figure 6. Carrier Feedthrough versus Frequency
(Test 2)
V CFT, CARRIER OUTPUT VOLTAGE (mV [rms])
V CFT, CARRIER OUTPUT VOLTAGE (mV[rms])
Figure 5. Carrier Feedthrough versus Frequency
(Test 1)
5.0
4.0
3.0
2.0
1.0
0.0
0.1
1.0
10.0
100.0
5.0
4.0
3.0
2.0
1.0
0.0
0.1
1.0
fc, CARRIER FREQUENCY (MHz)
10.0
100.0
fc, CARRIER FREQUENCY (MHz)
Figure 7. Carrier Suppression Test Circuit
Hewlett Packard 3406A
Sampling Voltmeter
0.1 µf
Hewlett
Packard
TEE 11536A
1.0 µf
50
2
3
9
0.1 µf
Outputs
11
50
8
Hewlett Packard
651A and 3300B
100 kHz to 400 MHz
@ 30 mV RMS.
Hewlett Packard
651A 10 kHz
@ 150 mV R.M.S.
50
12
Local Oscillator
Inputs
50
Reg.
Bypass
Mixer
Inputs
Null
Adjust
VEE
1.0µf
1
1.0 µf
10
7
5
6
X 50
Atten.
50
VCC
14
All input and output
cables to the scope are
equal lengths of 50-ohm
coaxial cable.
1.0 µf
50
– 5.0 V
–
+
– 5.0 V
Notes:
Test 1 – Adjust potentiometer for carrier null @ fc = 100 kHz
Test 2 – Connect pins 5 and 6 to –5.0 volts
Test 3 – Adjust potentiometer for carrier null @ 25° C
Figure 9. Carrier Suppression versus Frequency
(Test 2)
+40
+40
+30
+30
CARRIER SUPPRESSION (dB)
CARRIER SUPPRESSION (dB)
Figure 8. Carrier Suppression versus Frequency
(Test 1)
+20
+10
0
–10
–20
–30
–40
+10
0
–10
–20
–30
–40
–50
–50
–60
0.1
+20
1.0
10.0
100.0
1.0 K
–60
0.1
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1.0
10.0
100.0
1.0 K
fc, CARRIER FREQUENCY (MHz)
fc, CARRIER FREQUENCY (MHz)
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LANSDALE Semiconductor, Inc.
Figure 10. Carrier Suppression versus Temperature
CARRIER SUPPRESSION (dB)
–10
–20
–30
fc = 10 MHz @ 30 mvrms
fs = 10 KHz @ 150 mvrms
–40
–50
–60
–55
–25
0
+25
+50
+75
+100
+125
TA, AMBIENT TEMPERATURE (°C)
Figure 11. Output Offset Current (I00) versus Temperature
1.0 µf
1.0 µf
2
12
µA
Local Oscillator
Inputs
3
I12
I
Outputs
1.0 µf
1.0 µf
8
11
Mixer
Inputs
Reg.
Bypass
9
1
10
0.1µf
I11
I
µA
Null
Adjust
VEE
7
0.1 µf
5
VCC
6
14
IOO = I11 – I12
0.1 µf
–5.0 V
Notes:
Test 1 – Pins 5 and 6 left open
Test 2 – Pins 5 and 6 are tied to –5.0 volts
Figure 12. Output Offset Current versus Temperature
Figure 13. Typical Input Impedance versus Frequency
(No Circuit)
31
+100
R L RESISTANCE (Ohms)
+50
350
TEST 1
0.0
–50
TEST 2
300
250
26
R
16
Zin
21
C
200
11
6
150
100
–25
0
+25
+50
+75
+100
+125
TA, AMBIENT TEMPERATURE (°C)
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TYPICAL INPUT IMPEDANCE
vs
FREQUENCY
R
C
– LOCAL OSCILLATOR –
AND SIGNAL INPUTS
1
50
–100
–55
R(OHMS)
C, CAPACITANCE (pF)
I OO, OUTPUT OFFSET CURRENT ( µ A)
400
200
400
600
800
1000
f, FREQUENCY (MHZ)
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OUTLINE DIMENSIONS
CERDIP 14 = C
(ML12502/BCA)
CASE 632
Lansdale Semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function or design. Lansdale does not assume any liability arising out of the application or use of any product or circuit
described herein; neither does it convey any license under its patent rights nor the rights of others. “Typical” parameters which
may be provided in Lansdale data sheets and/or specifications can vary in different applications, and actual performance may
vary over time. All operating parameters, including “Typicals” must be validated for each customer application by the customer’s technical experts. Lansdale Semiconductor is a registered trademark of Lansdale Semiconductor, Inc.
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