Rev.2.4_00 S-5711A Series HALL IC The S-5711A Series, developed by CMOS technology, is a Hall IC with a high-sensitivity and operates on a low current. The output voltage changes when the S-5711A Series detects the intensity level of flux density. Using the S-5711A Series with a magnet makes it possible to detect the open/close state in various devices. High-density mounting is possible by using the super-small SNT-4A, SOT23-3 packages. Also, the S-5711A Series is the most suitable for portable devices due to the low current consumption. Features • Built-in chopping stabilized amplifier • Applicable in various devices with wide range of option : Detection of both poles, south pole or north pole*1 : Active “L”, active “H” *1 : Nch open drain output, CMOS output • Wide power supply voltage range : 2.4 V to 5.5 V • Low current consumption : 5.0 µA typ., 8.0 µA max. • Range of operation temperature: −40°C to +85°C Small magnetic characteristics against temperature dependency • Small package : SNT-4A, SOT23-3 • Lead-free product *1. Selectable by option Please contact our sales office for options other than those specified in “ Product Name Structure”, “2. name list”. Product Applications • Cellular phones (flip type, slide type, etc.) • Laptop PCs • Digital video cameras • Playthings, portable games • Home appliances Packages Package Name SNT-4A SOT-23-3 Drawing Code Package Tape Reel Land PF004-A MP003-C PF004-A MP003-C PF004-A MP003-Z PF004-A − Seiko Instruments Inc. 1 HALL IC S-5711A Series Rev.2.4_00 Block Diagrams 1. Nch open drain output product VDD OUT Sleep/Awake logic *1 *1 Chopping stabilized amplifier VSS *1. Parasitic diode Figure 1 2. CMOS output product VDD Sleep/Awake logic *1 *1 OUT Chopping stabilized amplifier VSS *1. Parasitic diode Figure 2 2 Seiko Instruments Inc. *1 HALL IC S-5711A Series Rev.2.4_00 Product Name Structure 1. Product name (1) SNT-4A S-5711 A x x x – I4T1 G Package name (abbreviation) and packing specifications*1 I4T1 : SNT-4A, Tape Detection logic for magnetism L : Active “L” H : Active “H”*2 Pole detection D : Detection of both poles S : Detection of south pole N : Detection of north pole*2 Output form N : Nch open drain output C : CMOS output *1. Refer to the tape specifications at the end of this book. *2. Selectable by option (2) SOT-23-3 S-5711 A x x x – M3T1 S Package name (abbreviation) and packing specifications*1 M3T1 : SOT-23-3, Tape Detection logic for magnetism L : Active “L” H : Active “H” Pole detection D : Detection of both poles S : Detection of south pole N : Detection of north pole*2 Output form N : Nch open drain output C : CMOS output *1. Refer to the tape specifications at the end of this book. *2. Selectable by option 2. Product name list Table 1 Output Form Pole Detection Detection Logic for Magnetism SNT-4A SOT-23-3 Nch open drain output Both poles Active “L” S-5711ANDL-I4T1G S-5711ANDL-M3T1S CMOS output Both poles Active “L” S-5711ACDL-I4T1G S-5711ACDL-M3T1S CMOS output Both poles Active “H” S-5711ACDH-M3T1S Nch open drain output South pole Active “L” − S-5711ANSL-I4T1G S-5711ANSL-M3T1S CMOS output Active “L” S-5711ACSL-I4T1G S-5711ACSL-M3T1S South pole Remark Please contact our sales office for options other than those specified above. Seiko Instruments Inc. 3 HALL IC S-5711A Series Rev.2.4_00 Pin Configurations SNT-4A Table 2 Top view 1 4 2 3 Pin No. Symbol Pin Description 1 VDD Power supply pin 2 VSS GND pin 3 NC*1 No connection 4 OUT Output pin *1. The NC pin is electrically open. The NC pin can be connected to VDD or VSS. Figure 3 Table 3 SOT-23-3 Top view 1 2 Pin No. Symbol 1 VSS GND pin 2 VDD Power supply pin 3 OUT Output pin 3 Figure 4 4 Seiko Instruments Inc. Pin Description HALL IC S-5711A Series Rev.2.4_00 Absolute Maximum Ratings Table 4 Item Symbol Power supply voltage Output voltage Power dissipation (Ta = 25°C unless otherwise specified) Absolute Maximum Rating Unit VDD Nch open drain output VOUT CMOS output SNT-4A PD SOT-23-3 VSS−0.3 to VSS+7.0 V VSS−0.3 to VSS+7.0 V VSS−0.3 to VDD+0.3 *1 300 V *1 430 mW mW Operating ambient temperature Topr −40 to +85 °C Storage temperature Tstg −40 to +125 °C *1. When mounted on board [Mounted board] (1) Board size: 114.3 mm × 76.2 mm × t1.6 mm (2) Name: JEDEC STANDARD51-7 Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. Power Dissipation (PD) [mW] 600 SNT-4A 200 0 Figure 5 SOT-23-3 400 0 150 100 50 Ambient Temperature (Ta) [°C] Power Dissipation of Package (When Mounted on Board) Seiko Instruments Inc. 5 HALL IC S-5711A Series Rev.2.4_00 Electrical Characteristics 1. Nch open drain output product Table 5 Item Power supply voltage Current consumption Output current Leakage current Awake mode time Sleep mode time 2. Symbol VDD IDD IOUT ILEAK tAW tSL (Ta = 25°C, VDD = 3.0 V, VSS = 0 V unless otherwise specified) Test Conditions Min. Typ. Max. Unit Circuit − Average value Output transistor Nch, VOUT = 0.4 V Output transistor Nch, VOUT = 5.5 V − − 2.4 − 1 − − − 3.0 5.0 − − 130 50 5.5 8.0 − 1 − 100 V µA mA µA µs ms − 1 2 2 − − CMOS output product Table 6 Item Symbol Power supply voltage Current consumption VDD IDD Output current IOUT Awake mode time Sleep mode time tAW tSL 6 (Ta = 25°C, VDD = 3.0 V, VSS = 0 V unless otherwise specified) Test Conditions Min. Typ. Max. Unit Circuit − Average value Output transistor Nch, VOUT = 0.4 V Output transistor Pch, VOUT = VDD−0.4 V − − Seiko Instruments Inc. 2.4 − 1 − − − 3.0 5.0 − − 130 50 5.5 8.0 − −1 − 100 V µA mA mA µs ms − 1 2 2 − − HALL IC S-5711A Series Rev.2.4_00 Magnetic Characteristics 1. Product with detection of both poles Table 7 Item Operating point*1 Release point*2 Hysteresis width*3 2. (Ta = 25°C, VDD = 3.0 V, VSS = 0 V unless otherwise specified) Test Conditions Min. Typ. Max. Unit Circuit Symbol S pole BOPS − − 3.8 6.0 mT 3 N pole BOPN − −6.0 −3.8 − mT 3 S pole BRPS − 0.5 2.8 − −0.5 mT 3 mT 3 3 3 N pole BRPN −2.8 BHYSS − BHYSS = BOPS − BRPS − S pole − 1.0 − mT N pole BHYSN BHYSN = |BOPN − BRPN| − 1.0 − mT Product with detection of south pole Table 8 Item (Ta = 25°C, VDD = 3.0 V, VSS = 0 V unless otherwise specified) Test Conditions Min. Typ. Max. Unit Circuit Symbol Operating point*1 S pole BOPS − − 3.8 6.0 mT 3 Release point*2 S pole BRPS − 0.5 2.8 − mT 3 S pole BHYSS − 1.0 − mT 3 *3 Hysteresis width 3. BHYSS = BOPS − BRPS Product with detection of north pole*4 Table 9 Item Operating point Release point *1 *2 Hysteresis width*3 Symbol (Ta = 25°C, VDD = 3.0 V, VSS = 0 V unless otherwise specified) Test Conditions Min. Typ. Max. Unit Circuit N pole BOPN − −6.0 −3.8 N pole BRPN − − −2.8 N pole BHYSN − 1.0 BHYSN = |BOPN − BRPN| mT 3 − −0.5 mT 3 − mT 3 *1. BOPN, BOPS : Operating points The operating points are the values of magnetic flux density when the output voltage (VOUT) is inverted after the magnetic flux density applied to the S-5711A Series by the magnet (N or S pole) is increased (the magnet is moved closer). Even when the magnetic flux density exceeds BOPN or BOPS, VOUT retains the status. *2. BRPN, BRPS : Release points The release points are the values of magnetic flux density when the output voltage (VOUT) is inverted after the magnetic flux density applied to the S-5711A Series by the magnet (N or S pole) is decreased (the magnet is moved further away). Even when the magnetic flux density falls below BRPN or BRPS, VOUT retains the status. *3. BHYSN, BHYSS : Hysteresis widths BHYSN and BHYSS are the difference between BOPN and BRPN, and BOPS and BRPS, respectively. *4. Selectable by option Remark The unit of magnetic density mT can be converted by using the formula 1 mT = 10 Gauss. Seiko Instruments Inc. 7 HALL IC S-5711A Series Rev.2.4_00 Test Circuits 1. A *1 R 100 kΩ VDD S-5711A Series OUT VSS *1. Resistor (R) is unnecessary for the CMOS output product. Figure 6 2. VDD S-5711A Series OUT VSS A V Figure 7 3. R*1 100 kΩ VDD S-5711A Series OUT VSS *1. V Resistor (R) is unnecessary for the CMOS output product. Figure 8 8 Seiko Instruments Inc. HALL IC S-5711A Series Rev.2.4_00 Standard Circuit *1 VDD CIN 0.1 µF R 100 kΩ S-5711A Series OUT VSS *1. Resistor (R) is unnecessary for the CMOS output product. Figure 9 Caution The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. Seiko Instruments Inc. 9 HALL IC S-5711A Series Rev.2.4_00 Operation 1. Direction of applied magnetic flux and position of Hall sensor The S-5711A Series detects the flux density which is vertical to the marking surface. In products with detection of both poles, the output voltage (VOUT) is inverted when the south or north pole is moved closer to the marking surface. In products with detection of the south pole, the output voltage (VOUT) is inverted when the south pole is moved closer to the marking surface. In products with detection of the north pole, the output voltage (VOUT) is inverted when the north pole is moved closer to the marking surface. Figures 10 and 11 show the direction in which magnetic flux is being applied. (1) SNT-4A (2) SOT-23-3 N S N S Marking surface Marking surface Figure 10 Figure 11 Figures 12 and 13 show the position of Hall sensor. The center of this Hall sensor is located in the area indicated by a circle, which is in the center of a package as described below. The following also shows the distance (typ. value) between the marking surface and the chip surface of a package. (1) SNT-4A (2) SOT-23-3 Top view Top view 1 The center of Hall sensor; in this φ 0.3 mm 4 2 3 The center of Hall sensor; in this φ 0.3 mm 1 2 3 0.16 mm (typ.) 0.7 mm (typ.) Figure 12 10 Figure 13 Seiko Instruments Inc. HALL IC S-5711A Series Rev.2.4_00 2. Basic operation The S-5711A Series changes the output voltage level (VOUT) according to the level of the magnetic flux density (north or south pole) applied by a magnet. The following explains the operation when the magnetism detection logic is active “L”. (1) Products with detection of both poles When the magnetic flux density vertical to the marking surface exceeds BOPN or BOPS after the south or north pole of a magnet is moved closer to the marking surface of the S-5711A Series, VOUT changes from “H” to “L”. When the south or north pole of a magnet is moved further away from the marking surface of the S-5711A Series and the magnetic flux density is lower than BRPN or BRPS, VOUT changes from “L” to “H”. (2) Products with detection of south pole When the magnetic flux density vertical to the marking surface exceeds BOPS after the south pole of a magnet is moved closer to the marking surface of the S-5711A Series, VOUT changes from “H” to “L”. When the south pole of a magnet is moved further away from the marking surface of the S-5711A Series and the magnetic flux density is lower than BRPS, VOUT changes from “L” to “H”. (3) Products with detection of north pole*1 When the magnetic flux density vertical to the marking surface exceeds BOPN after the north pole of a magnet is moved closer to the marking surface of the S-5711A Series, VOUT changes from “H” to “L”. When the north pole of a magnet is moved further away from the marking surface of the S-5711A Series and the magnetic flux density is lower than BRPN, VOUT changes from “L” to “H”. *1. Selectable by option Seiko Instruments Inc. 11 HALL IC S-5711A Series Rev.2.4_00 Figures 14 to 16 show the relationship between the magnetic flux density and VOUT. (1) Products with detection of both poles VOUT BHYSN BHYSS H L N pole BOPN BRPN 0 BRPS BOPS S pole Flux density (B) Figure 14 (2) Products with detection of south pole VOUT (3) Products with detection of north pole VOUT BHYSN BHYSS H H L L N pole 0 BRPS BOPS S pole N pole BOPN BRPN Flux density (B) Flux density (B) Figure 15 12 0 S pole Figure 16 Seiko Instruments Inc. HALL IC S-5711A Series Rev.2.4_00 3. Time dependency in the current consumption The S-5711A Series performs the intermittent operation. The S-5711A Series operates with low current consumption due to repeating the sleep mode (50 ms typ.) and the awake mode (130 µs typ.). Figure 17 shows the time dependency in the current consumption. Current consumption Sleep mode time 50 ms typ. Awake mode time 130 µs typ. At awake mode 1.2 mA typ. At sleep mode 1.8 µA typ. Time Figure 17 Seiko Instruments Inc. 13 HALL IC S-5711A Series Rev.2.4_00 4. Timing chart Figure 18 shows the operation timing of the S-5711A Series. BOPS Magnetic flux density applied to S-5711A Series BRPS BRPN BOPN Current consumption (IDD) Output voltage (VOUT) (both-pole detection, active “L” products) Output voltage (VOUT) (south-pole detection, active “L” products) Output voltage (VOUT) (both-pole detection, active “H” products) Figure 18 14 Seiko Instruments Inc. HALL IC S-5711A Series Rev.2.4_00 Precautions • If the impedance of the power supply is high, the IC may malfunction due to a supply voltage drop caused by throughtype current. Take care with the pattern wiring to ensure that the impedance of the power supply is low. • Note that the IC may malfunction if the power supply voltage rapidly changes. • Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit. • Large stress on this IC may affect on the magnetic characteristics. Avoid large stress which is caused by bend and distortion during mounting the IC on a board or handle after mounting. • When designing for mass production using an application circuit described herein, the product deviation and temperature characteristics of the external parts should be taken into consideration. SII shall not bear any responsibility for patent infringements related to products using the circuits described herein. • SII claims no responsibility for any disputes arising out of or in connection with any infringement by products including this IC of patents owned by a third party. Seiko Instruments Inc. 15 HALL IC S-5711A Series Rev.2.4_00 Characteristics (Typical Data) 1. Operating point, release point (BOP, BRP) Temperature (Ta) Detection of both poles Detection of both poles VDD = 3.0 V BOPS 4.0 2.0 BRPS 0.0 BRPN −2.0 −4.0 BOPN −40 −25 0 +25 Ta [°C] +50 IDD (average) [µA] IDD (average) [µA] VDD = 5.5 V 8.0 VDD = 3.0 V 6.0 4.0 VDD = 2.4 V 2.0 −40 −25 0 +25 Ta [°C] +50 BOPN 2.0 3.0 4.0 VDD [V] 5.0 6.0 10.0 Ta = +85°C 8.0 6.0 Ta = +25°C 4.0 Ta = −40°C 2.0 3.0 4.0 VDD [V] 5.0 6.0 6. Awake mode time (tAW) Power supply voltage (VDD) 250 VDD = 2.4 V 200 tAW [µs] tAW [µs] −4.0 300 250 VDD = 3.0 V 150 100 VDD = 5.5 V 50 −40 −25 0 +25 Ta [°C] +50 Ta = −40°C 200 150 100 Ta = +85°C 50 2.0 100 tSL [ms] VDD = 3.0 V 40 VDD = 5.5 V 20 −40 −25 0 +25 Ta [°C] +50 5.0 6.0 60 40 Ta = +85°C 20 +75 +85 4.0 VDD [V] Ta = −40°C 80 VDD = 2.4 V 60 3.0 8. Sleep mode time (tSL) Power supply voltage (VDD) 100 80 Ta = +25°C 0 +75 +85 7. Sleep mode time (tSL) Temperature (Ta) tSL [ms] −2.0 2.0 300 16 BRPN 0.0 +75 +85 5. Awake mode time (tAW) Temperature (Ta) 0 BRPS 0.0 12.0 10.0 0 2.0 4. Current consumption (average) (IDD (average)) Power supply voltage (VDD) 12.0 0.0 4.0 −6.0 +75 +85 3. Current consumption (average) (IDD (average)) Temperature (Ta) Ta = +25°C BOPS 6.0 BOP, BRP [mT] BOP, BRP [mT] 6.0 −6.0 2. Operating point, release point (BOP, BRP) Power supply voltage (VDD) Ta = +25°C 0 2.0 Seiko Instruments Inc. 3.0 4.0 VDD [V] 5.0 6.0 HALL IC S-5711A Series Rev.2.4_00 9. Start up response (Detection of both poles) (1) Active “L”, B > BOPS or B < BOPN Ta = +25°C (2) Active “L”, BRPN < B < BRPS Ta = +25°C VDD (= 3.0 V) 1 V / div. VSS VDD (= 3.0 V) 1 V / div. VSS VOUT 1 V / div. VOUT 1 V / div. VSS 1 mA / div. IDD VSS 1 mA / div. IDD 0 0 t (10 ms / div.) t (10 ms / div.) (3) Active “H”, B > BOPS or B < BOPN Ta = +25°C (4) Active “H”, BRPN < B < BRPS Ta = +25°C VDD (= 3.0 V) 1 V / div. VSS VDD (= 3.0 V) 1 V / div. VSS VOUT 1 V / div. VOUT 1 V / div. VSS 1 mA / div. IDD VSS 1 mA / div. IDD 0 t (10 ms / div.) 0 t (10 ms / div.) Seiko Instruments Inc. 17 HALL IC S-5711A Series Rev.2.4_00 Marking Specifications (1) SNT-4A SNT-4A Top view (1) to (3) : Product code (Refer to Product name vs. Product code.) 4 1 (1) (2) (3) 2 3 Product name vs. Product code (a) Nch open drain output product Product Code Product Name (1) (2) (3) S-5711ANDL-I4T1G T Z A S-5711ANSL-I4T1G T Z E (b) CMOS output product Product Name S-5711ACDL-I4T1G S-5711ACSL-I4T1G Product Code (1) (2) (3) T Z 1 T Z 5 (2) SOT-23-3 SOT-23-3 Top view (1) to (3) : Product code (Refer to Product name vs. Product code.) (4) : Lot number 1 (1) (2) (3) (4) 2 3 Product name vs. Product code (a) Nch open drain output product Product Code Product Name (1) (2) (3) S-5711ANDL-M3T1S T Z A S-5711ANSL-M3T1S T Z E (b) CMOS output product Product Name S-5711ACDL-M3T1S S-5711ACDH-M3T1S S-5711ACSL-M3T1S 18 Product Code (1) (2) (3) T Z 1 T Z 2 T Z 5 Seiko Instruments Inc. 1.2±0.04 3 4 +0.05 0.08 -0.02 2 1 0.65 0.48±0.02 0.2±0.05 No. PF004-A-P-SD-4.0 TITLE SNT-4A-A-PKG Dimensions PF004-A-P-SD-4.0 No. SCALE UNIT mm Seiko Instruments Inc. +0.1 ø1.5 -0 4.0±0.1 2.0±0.05 0.25±0.05 +0.1 5° 1.45±0.1 2 1 3 4 ø0.5 -0 4.0±0.1 0.65±0.05 Feed direction No. PF004-A-C-SD-1.0 TITLE SNT-4A-A-Carrier Tape PF004-A-C-SD-1.0 No. SCALE UNIT mm Seiko Instruments Inc. 12.5max. 9.0±0.3 Enlarged drawing in the central part ø13±0.2 (60°) (60°) No. PF004-A-R-SD-1.0 SNT-4A-A-Reel TITLE PF004-A-R-SD-1.0 No. SCALE UNIT QTY. mm Seiko Instruments Inc. 5,000 0.52 1.16 0.52 0.3 0.35 0.3 Caution Making the wire pattern under the package is possible. However, note that the package may be upraised due to the thickness made by the silk screen printing and of a solder resist on the pattern because this package does not have the standoff. No. PF004-A-L-SD-3.0 TITLE SNT-4A-A-Land Recommendation PF004-A-L-SD-3.0 No. SCALE UNIT mm Seiko Instruments Inc. 2.9±0.2 1 2 3 0.16 +0.1 -0.06 0.95±0.1 1.9±0.2 0.4±0.1 No. MP003-C-P-SD-1.0 TITLE SOT233-C-PKG Dimensions No. MP003-C-P-SD-1.0 SCALE UNIT mm Seiko Instruments Inc. +0.1 ø1.5 -0 4.0±0.1 2.0±0.1 +0.25 ø1.0 -0 0.23±0.1 4.0±0.1 1.4±0.2 3.2±0.2 1 2 3 Feed direction No. MP003-C-C-SD-1.0 TITLE SOT233-C-Carrier Tape No. MP003-C-C-SD-1.0 SCALE UNIT mm Seiko Instruments Inc. 12.5max. 9.2±0.5 Enlarged drawing in the central part ø13±0.2 No. MP003-Z-R-SD-1.0 SOT233-C-Reel TITLE MP003-Z-R-SD-1.0 No. SCALE UNIT QTY. mm Seiko Instruments Inc. 3,000 • • • • • • The information described herein is subject to change without notice. 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The products described herein cannot be used as part of any device or equipment affecting the human body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc. Although Seiko Instruments Inc. exerts the greatest possible effort to ensure high quality and reliability, the failure or malfunction of semiconductor products may occur. The user of these products should therefore give thorough consideration to safety design, including redundancy, fire-prevention measures, and malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.