ATMEL AT49LH002-33JC

Features
• Complies with Intel® Low-Pin Count (LPC) Interface Specification Revision 1.1
– Supports both Firmware Hub (FWH) and LPC Memory Read and Write Cycles
• Auto-detection of FWH and LPC Memory Cycles
•
•
•
•
•
•
– Can Be Used as FWH for Intel 8xx, E7xxx, and E8xxx Series Chipsets
– Can Be Used as LPC Flash for Non-Intel Chipsets
Flexible, Optimized Sectoring for BIOS Applications
– 16-Kbyte Top Boot Sector, Two 8-Kbyte Sectors, One 32-Kbyte Sector,
Three 64-Kbyte Sectors
– Or Memory Array Can Be Divided Into Four Uniform 64-Kbyte Sectors for Erasing
Two Configurable Interfaces
– FWH/LPC Interface for In-System Operation
– Address/Address Multiplexed (A/A Mux) Interface for Programming during
Manufacturing
FWH/LPC Interface
– Operates with the 33 MHz PCI Bus Clock
– 5-signal Communication Interface Supporting Byte Reads and Writes
– Two Hardware Write Protect Pins: TBL for Top Boot Sector and WP for All
Other Sectors
– Five General-purpose Input (GPI) Pins for System Design Flexibility
– Identification (ID) Pins for Multiple Device Selection
– Sector Locking Registers for Individual Sector Read and Write Protection
A/A Mux Interface
– 11-pin Multiplexed Address and 8-pin Data Interface
– Facilitates Fast In-System or Out-of-System Programming
Single Voltage Operation
– 3.0V to 3.6V Supply Voltage for Read and Write Operations
Industry-Standard Package Options
– 32-lead PLCC
– 40-lead TSOP
2-megabit
Firmware Hub
and Low-Pin
Count Flash
Memory
AT49LH002
Description
The AT49LH002 is a Flash memory device designed for use in PC and notebook BIOS
applications. The device complies with version 1.1 of Intel’s LPC Interface Specification, providing support for both FWH and LPC memory read and write cycles. The
device can also automatically detect the memory cycle type to allow the AT49LH002
to be used as a FWH with Intel chipsets or as an LPC Flash with non-Intel chipsets.
Pin Configurations
PLCC
29
28
27
26
25
24
23
22
21
14
15
16
17
18
19
20
5
6
7
8
9
10
11
12
13
IC [IC]
GND
NC
NC
VCC
INIT [OE]
FWH4/LFRAME [WE]
RES [RDY/BSY]
RES [I/O7]
[I/O1] FWH1/LAD1
[I/O2] FWH2/LAD2
GND
[I/O3] FWH3/LAD3
[I/O4] RES
[I/O5] RES
[I/O6] RES
[A7] GPI1
[A6] GPI0
[A5] WP
[A4] TBL
[A3] ID3
[A2] ID2
[A1] ID1
[A0] ID0
[I/O0] FWH0/LAD0
4
3
2
1
32
31
30
GPI2 [A8]
GPI3 [A9]
RST [RST]
NC
VCC
CLK [R/C]
GPI4 [A10]
TSOP
Note:
[ ] Designates A/A Mux Interface.
NC
[IC] IC
NC
NC
NC
NC
[A10] GPI4
NC
[R/C] CLK
VCC
NC
[RST] RST
NC
NC
[A9] GPI3
[A8] GPI2
[A7] GPI1
[A6] GPI0
[A5] WP
[A4] TBL
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
GND
VCC
FWH4/LFRAME [WE]
INIT [OE]
RES [RDY/BSY]
RES [I/O7]
RES [I/O6]
RES [I/O5]
RES [I/O4]
VCC
GND
GND
FWH3/LAD3 [I/O3]
FWH2/LAD2 [I/O2]
FWH1/LAD1 [I/O1]
FWH0/LAD0 [I/O0]
ID0 [A0]
ID1 [A1]
ID2 [A2]
ID3 [A3]
3377B–FLASH–9/03
1
The sectoring of the AT49LH002’s memory array has been optimized to meet the needs of
today’s BIOS applications. By optimizing the size of the sectors, the BIOS code memory space
can be used more efficiently. Because certain BIOS code modules must reside in their own
sectors by themselves, the wasted and unused memory space that occurred with previous
generation BIOS Flash memory devices can be greatly reduced. This increased memory
space efficiency allows additional BIOS routines to be developed and added while still maintaining the same overall device density.
The memory array of the AT49LH002 can be sectored in two ways simply by using two different erase commands. Using one erase command allows the device to contain a total of seven
sectors comprised of a 16-Kbyte boot sector, two 8-Kbyte sectors, a 32-Kbyte sector, and
three 64-Kbyte sectors. The 16-Kbyte boot sector is located at the top (uppermost) of the
device’s memory address space and can be hardware write protected by using the TBL pin.
Alternatively, by using a different erase command, the memory array can be arranged into four
even erase sectors of 64-Kbyte each, allowing the top 64-Kbyte region to be used as the boot
sector. The TBL pin, when used with the second erase command, will hardware write protect
the entire top 64-Kbyte region against erasure.
The AT49LH002 supports two hardware interfaces: The FWH/LPC interface for In-System
operations and the A/A Mux interface for programming during manufacturing. The Interface
Configuration (IC) pin of the device provides the control between these two interfaces. An
internal Command User Interface (CUI) serves as the control center between the device interfaces and the internal operation of the nonvolatile memory. A valid command sequence
written to the CUI initiates device automation.
Specifically designed for use in 3-volt systems, the AT49LH002 supports read, program, and
erase operations with a supply voltage range of 3.0V to 3.6V. No separate voltage is required
for programming and erasing.
The AT49LH002 utilizes fixed program and erase times, independent of the number of program and erase cycles that have occurred. Therefore, the system does not need to be
calibrated or correlated to the cumulative number of program and erase cycles.
Block Diagram
TBL
CLK
FWH4/LFRAME
FWH/LAD[3:0]
WP
INIT
FWH/LPC
INTERFACE
CONTROL LOGIC
I/O BUFFERS
AND LATCHES
IC
RST
R/C
A[10:0]
I/O[7:0]
OE
WE
INTERFACE CONTROL
AND LOGIC
A/A MUX
INTERFACE
ADDRESS LATCH
ID[3:0]
GPI[4:0]
Y-DECODER
Y-GATING
X-DECODER
FLASH
MEMORY
ARRAY
RDY/BSY
2
AT49LH002
3377B–FLASH–9/03
AT49LH002
Device Memory Map
Sector
Type
Size (Bytes)
Address Range
6
Sub-sector
16K
03C000H - 03FFFFH
5
Sub-sector
8K
03A000H - 03BFFFH
4
Sub-sector
8K
038000H - 039FFFH
3
Sub-sector
32K
030000H - 037FFFH
2
Main Sector
64K
020000H - 02FFFFH
1
Main Sector
64K
010000H - 01FFFFH
0
Main Sector
64K
000000H - 00FFFFH
Pin Description
Table 1 provides a description of each of the device pins. Most of the pins have dual functionality in that they are used for
both the FWH/LPC interface as well as the A/A Mux interface.
Table 1. Signal Descriptions
Interface
Symbol
Name and Function
FWH/LPC
A/A Mux
Type
IC
INTERFACE COMMUNICATION: The IC pin determines which interface is
operational. If the IC pin is held high, then the A/A Mux interface is enabled, and if
the IC pin is held low, then the FWH/LPC interface is enabled. The IC pin must be
set at power-up or before returning from a reset condition and cannot be changed
during device operation.
The IC pin is internally pulled-down with a resistor valued between 20 kΩ and
100 kΩ, so connection of this pin is not necessary if the FWH/LPC interface will
always be used in the system. If the IC pin is driven high to enable the A/A Mux
interface, then the pin will exhibit some leakage current.
X
X
Input
CLK
FWH/LPC CLOCK: This pin is used to provide a clock to the device. This pin is
usually connected to the 33 MHz PCI clock and adheres to the PCI specification.
This pin is used as the R/C pin in the A/A Mux interface.
X
Input
FWH4/
LFRAME
FWH INPUT/LPC FRAME: This pin is used to indicate the start of a FWH or LPC
data transfer operation. The pin is also used to abort a FWH or LPC cycle in
progress.
This pin is used as the WE pin in the A/A Mux interface.
X
Input
FWH/
LAD[3:0]
FWH/LPC ADDRESS AND DATA: These pins are used for FWH/LPC bus
information such as addresses, data, and command inputs/outputs.
These pins are used as the I/O[3:0] pins in the A/A Mux interface.
X
Input/
Output
RST
INTERFACE RESET: The RST pin is used for both FWH/LPC and A/A Mux
interfaces. When the RST pin is driven low, write operations are inhibited, internal
automation is reset, and the FWH/LAD[3:0] pins (when using the FWH/LPC
interface) are put into a high-impedance state. When the device exits the reset
state, it will default to the read array mode.
X
X
Input
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3377B–FLASH–9/03
Table 1. Signal Descriptions (Continued)
Interface
Symbol
Name and Function
INIT
PROCESSOR RESET/INITIALIZE: The INIT pin is used as a second reset pin for
In-System operation and functions identically to the RST pin. The INIT pin is
designed to be connected to the chipset’s INIT signal.
The maximum voltage to be applied to the INIT pin depends on the processor’s or
chipset’s specifications. Systems must take care to not violate processor or chipset
specifications regarding the INIT pin voltage.
This pin is used as the OE pin in the A/A Mux interface.
X
Input
TBL
TOP BOOT SECTOR LOCK: When the TBL pin is held low, program and erase
operations cannot be performed to the 16-Kbyte top boot sector regardless of the
state of the Sector Locking Registers. In addition, the TBL pin will either protect the
16-Kbyte top boot sector or the uppermost 64-Kbyte region against erasures
depending on which sector erase command has been issued to the device. Please
refer to the Sector Protection section for more details.
If the TBL pin is held high, then hardware write protection for the top boot sector will
be disabled. However, register-based sector protection will still apply. The state of
the TBL pin does not affect the state of the Sector Locking Registers.
This pin is used as the A4 pin in the A/A Mux interface.
X
Input
WP
WRITE PROTECT: The WP pin is used to protect all remaining sectors that are not
being used for the top boot region. See the “Sector Protection” section on page 16
for more details.
If the WP pin is high, then hardware write protection for all of the sectors except the
top boot sector will be disabled. Register-based sector protection, however, will still
apply. The state of the WP pin does not affect the state of the Sector Locking
Registers.
This pin is used as the A5 pin in the A/A Mux interface.
X
Input
ID[3:0]
IDENTIFICATION INPUTS: These four pins are part of the mechanism that allows
multiple devices to be attached to the same bus. The strapping of these pins is
used to assign an ID to each device. The boot device must have ID[3:0] = 0000,
and it is recommended that all subsequent devices should use sequential up-count
strapping (e.g., 0001, 0010, 0011, etc.).
Values presented on the ID[3:0] pins are only recognized when the device is
operated as a FWH device. If the device is operating as an LPC Flash, then the
ID[3:0] pins are ignored.
The ID[3:0] pins are internally pulled-down with resistors valued between 20 kΩ and
100 kΩ when using the FWH/LPC interface, so connection of these pins is not
necessary if only a single device will be used in a system. Any pins intended to be
low may be left floating. Any ID pin driven high will exhibit some leakage current.
These pins are used as the A[3:0] pins in the A/A Mux interface.
FWH
Input
GPI[4:0]
GENERAL-PURPOSE INPUTS: The individual GPI pins can be used for additional
board flexibility. The state of the GPI pins can be read, using the FWH/LPC
interface, through the GPI register. The GPI pins should be at their desired state
before the start of the PCI clock cycle during which the read is attempted, and they
should remain at the same level until the end of the read cycle.
The voltages applied to the GPI pins must comply with the devices VIH and VIL
requirements. Any unused GPI pins must not be left floating.
These pins are used as the A[10:6] pins in the A/A Mux interface.
X
Input
A[10:0]
ADDRESS INPUTS: These pins are used for inputting the multiplexed address
values when using the A/A Mux interface. The addresses are latched by the rising
and falling edge of R/C pin.
4
FWH/LPC
A/A Mux
X
Type
Input
AT49LH002
3377B–FLASH–9/03
AT49LH002
Table 1. Signal Descriptions (Continued)
Interface
Symbol
Name and Function
I/O[7:0]
FWH/LPC
A/A Mux
Type
DATA INPUTS/OUTPUTS: The I/O pins are used in the A/A Mux interface to input
data and commands during write cycles and to output data during memory array,
Status Register, and identifier code read cycles. Data is internally latched during a
write cycle.
The I/O pins will be in a high-impedance state when the outputs are disabled.
X
Input/
Output
R/C
ROW/COLUMN ADDRESS SELECT: In the A/A Mux interface, the R/C pin is used
to latch the address values presented on the A[10:0] pins. The row addresses
(A10 - 0) are latched on the falling edge of R/C, and the column addresses
(A17 - A11) are latched on the rising edge of R/C.
X
Input
OE
OUTPUT ENABLE: The OE pin is used in the A/A Mux interface to control the
device’s output buffers during a read cycle.
The I/O[7:0] pins will be in high-impedance state when the OE pin is deasserted
(high).
X
Input
WE
WRITE ENABLE: The WE pin is used in the A/A Mux interface to control write
operations to the device.
X
Input
RDY/BSY
READY/BUSY: The RDY/BSY pin provides the device’s ready/busy status when
using the A/A Mux interface. The RDY/BSY pin is a reflection of Status Register
bit 7, which is used to indicate whether a program or erase operation has been
completed.
Use of the RDY/BSY pin is optional, and the pin does not need to be connected.
X
Output
VCC
DEVICE POWER SUPPLY: The VCC pin is used to supply the source voltage to
the device. Program and erase operations are inhibited when VCC is less than or
equal to VLKO.
Operations at invalid VCC voltages may produce spurious results and should not be
attempted.
X
X
Power
GND
GROUND: The ground reference for the power supply. GND should be connected
to the system ground.
X
X
Power
NC
NO CONNECT: NC pins have no internal connections and can be driven or left
floating. If the pins are driven, the voltage levels should comply with VIH and VIL
requirements.
X
X
–
RES
RESERVED: RES pins are reserved for future device enhancements or
functionality. These pins may be left floating or may be driven. If the pins are driven,
the voltage levels should comply with VIH and VIL requirements.
These pins are used as the RDY/BSY and I/O[7:4] pins in the A/A Mux interface.
X
X
–
5
3377B–FLASH–9/03
Interface
Selection
The AT49LH002 can operate in two distinct interface modes: The FWH/LPC interface and the
A/A Mux interface. Selection of the interface is determined by the state of the IC pin. When the
IC pin is held low, the device will operate using the FWH/LPC interface. Alternatively, when
the IC pin is held high, the device will operate using the A/A Mux interface.
FWH/LPC
Interface
The FWH/LPC interface is designed as an In-System interface used in communicating with
either the I/O Controller Hub (ICH) in Intel chipsets or typically the PCI south bridge in nonIntel chipsets.
The FWH/LPC interface uses a 5-signal communication interface consisting of a 4-bit data
bus, the FWH/LAD[3:0] pins, and one control line, the FWH4/LFRAME pin. The operation and
timing of the interface is based on the 33 MHz PCI clock, and the buffers for the FWH/LPC
interface are PCI compliant. To ensure the effective delivery of security and manageability features, the FWH/LPC interface is the only way to get access to the full feature set of the device.
Commands, addresses, and data are transferred via the FWH/LPC interface using a series of
fields. The field sequences and contents are strictly defined for FWH and LPC memory cycles.
These field sequences are detailed in the FWH Interface Operation and LPC Interface Operation sections.
Since the AT49LH002 can be used as either a FWH Flash or an LPC Flash, the device is
capable of automatically detecting which type of memory cycle is being performed. For a
FWH/LPC cycle, the host will drive the FWH4/LFRAME pin low for one or more clock cycles to
initiate the operation. After driving the FWH4/LFRAME pin low, the host will send a START
value to indicate the type of FWH/LPC cycle that is to be performed. The value of the START
field determines whether the device will operate using a FWH cycle or an LPC cycle. Table 2
details the three valid START fields that the device will recognize.
Table 2. FWH/LPC Start Fields
START Value
Cycle Type
0000b
LPC Cycle – The type (memory, I/O, DMA) and direction of the cycle (read or
write) is determined by the second field (CYCTYPE + DIR) of the LPC cycle. Only
memory cycles are supported by the device.
1101b
FWH Memory Read Cycle
1110b
FWH Memory Write Cycle
If a valid START value is not detected, then the device will enter standby mode when the
FWH4/LFRAME pin is high and no internal operation is in progress. The FWH/LAD[3:0] pins
will also be placed in a high-impedance state.
FWH4/LFRAME PIN: FWH4/LFRAME is used by the master to indicate the start of cycles and
the termination of cycles due to an abort or time-out condition. This signal is to be used by
peripherals to know when to monitor the bus for a cycle.
The FWH4/LFRAME signal is used as a general notification that the FWH/LAD[3:0] lines contain information relative to the start or stop of a cycle, and that peripherals must monitor the
bus to determine whether the cycle is intended for them. The benefit to peripherals of
FWH4/LFRAME is that it allows them to enter lower power states internally when a cycle is not
intended for them.
When peripherals sample FWH4/LFRAME is active, they are to immediately stop driving the
FWH/LAD[3:0] signal lines on the next clock and monitor the bus for new cycle information.
6
AT49LH002
3377B–FLASH–9/03
AT49LH002
FWH/LAD[3:0] PINS: The FWH/LAD[3:0] signal lines communicate address, control, and data
information over the LPC bus between a master and a peripheral. The information communicated are: start, stop (abort a cycle), transfer type (memory, I/O, DMA), transfer direction
(read/write), address, data, wait states, DMA channel, and bus master grant.
FWH Memory
Cycles
A valid FWH memory cycle begins with the host driving the FWH4/LFRAME signal low for one
or more clock cycles. While the FWH4/LFRAME signal is low, a valid START value of either
1101b (FWH memory read) or 1110b (FWH memory write) must be driven on the
FWH/LAD[3:0] pins. Following the START field, an IDSEL (Device Select) field must be sent to
the device. The IDSEL field acts like a chip select in that it indicates which device should
respond to the current operation. After the IDSEL field has been sent, the 7-clock MADDR
(Memory Address) field must be sent to the device to provide the 28-bit starting address location of where to begin reading or writing in the memory. Following the MADDR field, the
MSIZE (Memory Size) field must be sent to indicate the number of bytes to transfer.
Figure 1. FWH Memory Cycle Initiation and Addressing
CLK
FWH4/LFRAME
FWH/LAD[3:0]
START
IDSEL
MADDR MADDR MADDR MADDR MADDR MADDR MADDR
MSIZE
START FIELD: This 1-clock field indicates the start of a cycle. It is valid on the last clock that
FWH4/LFRAME is sampled low. The two start fields that are used for a FWH cycle are: 1101b
to indicate a FWH memory read cycle and 1110b to indicate a FWH memory write cycle. If the
start field that is sampled is not one of these values, then the cycle attempted is not a FWH
memory cycle. It may be a valid LPC memory cycle that the device will attempt to decode.
IDSEL (DEVICE SELECT) FIELD: This 1-clock field is used to indicate which FWH component in the system is being selected. The four bits transmitted over FWH/LAD[3:0] during this
clock are compared with values strapped on the ID[3:0] pins. If there is a match, the device will
continue to decode the cycle to determine which bytes are requested on a read or which bytes
to update on a write. If there isn’t a match, the device may discard the rest of the cycle and go
into a standby power state.
MADDR (MEMORY ADDRESS) FIELD: This is a 7-clock field that is used to provide a 28-bit
(A27 - A0) memory address. This allows for provisioning of up to 256 MB per FWH memory
device, for a total of a 4 GB addressable space if 16 FWH memory devices (256 MB each)
were used in a system.
The AT49LH002 only decodes the last six MADDR nibbles (A23 - A0) and ignores address
bits A27 - A23 and A21 - A18. Address bit A22 is used to determine whether reads or writes to
the device will be directed to the memory array (A22 = 1) or to the register space (A22 = 0).
Addresses are transferred to the device with the most significant nibble first.
MSIZE (MEMORY SIZE) FIELD: The 1-clock MSIZE is used to indicate how many bytes of
data will be transferred during a read or write. The AT49LH002 only supports single-byte
transfers, so 0000b must be sent in this field to indicate a single-byte transfer.
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3377B–FLASH–9/03
Additional Fields
for FWH Memory
Cycles
Additional fields are required to complete a FWH read or write cycle. The placement of these
fields, in addition to the data field, depends on whether the cycle is a FWH read or write. The
FWH Read Cycle and FWH Write Cycle sections detail the order of the various fields.
TAR (TURN-AROUND) FIELD: This 2-clock field is driven by the master when it is turning
control over to the FWH memory device, and it is driven by the FWH device when it is turning
control back over to the master. On the first clock of the TAR field, the master or FWH drives
the FWH/LAD[3:0] lines to 1111b. On the second clock, the master or FWH device puts the
FWH/LAD[3:0] lines into a high-impedance state.
SYNC (SYNCHRONIZE) FIELD: This field is used to add wait-states for an access. It can be
several clocks in length. On target cycles, this field is driven by the FWH memory device. If
the FWH device needs to assert wait-states, it does so by driving a “wait” SYNC value of
0101b on the FWH/LAD[3:0] pins until it is ready. When ready, the device will drive a “ready”
SYNC value of 0000b on the FWH/LAD[3:0] lines. Valid values for the SYNC field are shown
in Table 3.
Table 3. Valid SYNC Values
FWH Read Cycle
SYNC Value
SYNC Type
0000b
RSYNC (Ready SYNC) – Synchronization has been achieved with no error.
0101b
WSYNC (Wait SYNC) – Device is indicating wait-states (also referred to as
short-sync).
FWH read cycles are used to read data from the memory array, the Sector Locking Registers,
the GPI register, the Status Register, and to read the product ID information. Upon initial
device power-up or after exiting from a reset condition, the device will automatically default to
the read array mode.
Valid FWH read cycles begin with a START field of 1101b being sent to the device. Following
the IDSEL, MADDR, and MSIZE fields, a 2-clock TAR field must be sent to the device to indicate that the master is turning control of the LPC bus over to the FWH memory device. After
the second clock of the TAR phase, the FWH device assumes control of the bus and begins
driving SYNC fields to add wait-states. When the device is ready to output data, it will first
send a “ready” SYNC and then output one byte of data during the next two clock cycles. The
data is sent one nibble at a time with the low nibble being output first followed by the high nibble. After the data has been output, the FWH device will send a 2-clock TAR field to the master
to indicate that it is turning control of the LPC bus back over to the master.
Figure 2 shows a FWH read cycle that requires three SYNC clocks to access data from the
memory array.
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AT49LH002
3377B–FLASH–9/03
AT49LH002
Figure 2. FWH Read Cycle
1
2
3
4
5
6
7
8
9
10
11
12
13
A27-A24 A23-A20 A19-A16 A15-A12 A11-A8
A7-A4
A3-A0
0000b
1111b
High-Z
0101b
MSIZE
TAR0
TAR1
WSYNC
14
15
16
17
18
19
0101b
0000b
D3-D0
D7-D4
1111b
High-Z
WSYNC
RSYNC
DATA
DATA
TAR0
TAR1
CLK
FWH4/LFRAME
FWH/LAD[3:0]
1101b
IDSEL
START
IDSEL
MADDR
Table 4. FWH Read Cycle
Clock Cycle
Field Name
Field Value(1)
FWH/LAD[3:0]
1
START
1101b
IN
FWH4/LFRAME must be active (low) for the device to
respond. Only the last START field (before FWH4/LFRAME
transitioning high) should be recognized. The START field
contents indicate a FWH memory read cycle.
2
IDSEL
0000b to 1111b
IN
Indicates which FWH memory device should respond. If the
IDSEL field matches the strapping values on ID[3:0], then that
particular device will respond to subsequent commands.
3-9
MADDR
YYYY
IN
These seven clock cycles make up the 28-bit memory
address. YYYY is one nibble of the entire address. Addresses
are transferred with the most significant nibble first.
10
MSIZE
0000b
(indicates
1 byte)
IN
The MSIZE field indicates how many bytes will be transferred.
The device only supports single-byte operations, so MSIZE
must be 0000b.
11
TAR0
1111b
IN then float
In this clock cycle, the master has driven the bus to all 1s and
then floats the bus prior to the next clock cycle. This is the first
part of the bus “turn-around cycle”.
12
TAR1
1111b (float)
Float then OUT
13 - 14
WSYNC
0101b (wait)
OUT
The device outputs the value 0101b, a “wait” SYNC, for two
clock cycles. This value indicates to the master that data is not
yet available from the device. This number of wait-syncs is a
function of the device’s memory access time.
15
RSYNC
0000b (ready)
OUT
During this clock cycle, the device will generate a “ready”
SYNC indicating that the least significant nibble of the data
byte will be available during the next clock cycle.
16
DATA
YYYY
OUT
YYYY is the least significant nibble of the data byte.
17
DATA
YYYY
OUT
YYYY is the most significant nibble of the data byte.
18
TAR0
1111b
OUT then float
19
TAR1
1111b (float)
Float then IN
Note:
FWH/LAD[3:0]
Direction
Comments
The device takes control of the bus during this clock cycle.
The FWH memory device drives the bus to 1111b to indicate a
turn-around cycle.
The FWH memory device floats its outputs, and the master
regains control of the bus during this clock cycle.
1. Field contents are valid on the rising edge of the present clock cycle.
9
3377B–FLASH–9/03
FWH Write Cycle
FWH write cycles are used to send commands to the device and to program data into the
memory array.
Valid FWH write cycles begin with a START field of 1110b being sent to the device. Following
the IDSEL, MADDR, and MSIZE fields, the master sends one byte of data to the FWH device
during the next two clock cycles. The data is sent one nibble at a time with the low nibble being
output first followed by the high nibble. After the data has been sent, the master will send a
2-clock TAR field to the FWH device to indicate that it is turning control of the LPC bus back
over to the FWH. After the second clock of the TAR phase, the FWH device assumes control
of the bus and drives a “ready” SYNC field to verify that it has received the data. The FWH
device will then send a 2-clock TAR field to the master to indicate that it is turning control of
the bus back over to the master.
Figure 3. FWH Write Cycle
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
A27-A24 A23-A20 A19-A16 A15-A12 A11-A8
A7-A4
A3-A0
0000b
D3-D0
D7-D4
1111b
MSIZE
DATA
DATA
TAR0
High-Z
0000b
1111b
High-Z
TAR1
RSYNC
TAR0
TAR1
CLK
FWH4/LFRAME
FWH/LAD[3:0]
1110b
IDSEL
START
IDSEL
MADDR
Table 5. FWH Write Cycle
Clock Cycle
Field Name
Field Value(1)
FWH/LAD[3:0]
FWH/LAD[3:0]
Direction
1
START
1110b
IN
FWH4/LFRAME must be active (low) for the device to respond. Only
the last START field (before FWH4/LFRAME transitioning high) should
be recognized. The START field contents indicate a FWH memory
write cycle.
2
IDSEL
0000b to 1111b
IN
Indicates which FWH memory device should respond. If the IDSEL field
matches the strapping values on ID[3:0], then that particular device will
respond to subsequent commands.
3-9
MADDR
YYYY
IN
These seven clock cycles make up the 28-bit memory address. YYYY
is one nibble of the entire address. Addresses are transferred with the
most significant nibble first.
10
MSIZE
0000b
(indicates 1 byte)
IN
The MSIZE field indicates how many bytes will be transferred. The
device only supports single-byte operations, so MSIZE must be 0000b.
11
DATA
YYYY
IN
YYYY is the least significant nibble of the data byte. The data byte is
either any valid Flash command or the data to be programmed into the
memory array.
12
DATA
YYYY
IN
YYYY is the most significant nibble of the data byte.
13
TAR0
1111b
IN then float
14
TAR1
1111b (float)
Float then OUT
15
RSYNC
0000b (ready)
OUT
16
TAR0
1111b
OUT then float
The FWH memory device drives the bus to 1111b to indicate a turnaround cycle.
17
TAR1
1111b (float)
Float then IN
The FWH memory device floats its outputs, and the master regains
control of the bus during this clock cycle.
Note:
10
Comments
In this clock cycle, the master has driven the bus to all 1s and then
floats the bus prior to the next clock cycle. This is the first part of the bus
“turn-around cycle”.
The device takes control of the bus during this clock cycle.
During this clock cycle, the device will generate a “ready” SYNC
indicating that the data byte has been received.
1. Field contents are valid on the rising edge of the present clock cycle.
AT49LH002
3377B–FLASH–9/03
AT49LH002
LPC Memory
Cycles
A valid LPC memory cycle begins with the host driving the FWH4/LFRAME signal low for one
or more clock cycles. While the FWH4/LFRAME signal is low, a valid START value of 0000b
must be driven on the FWH/LAD[3:0] pins. Following the START field, a CYCTYPE + DIR
(Cycle Type and Direction) field must be sent to the device to indicate the type of cycle (e.g.,
memory access, I/O access, etc.) and the direction (read or write) of the transfer. After the
CYCTYPE + DIR field has been sent, the 8-clock MADDR (Memory Address) field must be
sent to the device to provide the 32-bit starting address location of where to begin reading or
writing in the memory.
Figure 4. LPC Memory Cycle Initiation and Addressing
CLK
FWH4/LFRAME
FWH/LAD[3:0]
START
CYCTYPE
+ DIR
MADDR MADDR MADDR MADDR MADDR MADDR MADDR MADDR
START FIELD: This 1-clock field indicates the start of a cycle. It is valid on the last clock that
FWH4/LFRAME is sampled low. The start field that is used for an LPC cycle is 0000b. If the
start field that is sampled is not 0000b, then the cycle attempted is not an LPC memory cycle.
It may be a valid FWH memory cycle that the device will attempt to decode.
CYCTYPE + DIR (CYCLE TYPE AND DIRECTION) FIELD: This 1-clock field is used to indicate the type of cycle and the direction of the transfer to be performed. Of the four bits placed
on the FWH/LAD[3:0] pins, bits[3:2] must be 01b to indicate that the transfer will be a memory
cycle. Values other than 01b, which may be used to specify an I/O cycle or a DMA cycle for
other components in the system, will cause the device to enter standby mode when the
FWH4/LFRAME pin is brought high and no internal operation is in progress. The
FWH/LAD[3:0] pins will also be placed in a high-impedance state.
Bit[1] is used to determine the direction of the transfer. 0 is used to indicate a read, and 1 is
used to indicate a write. Bit[0] is ignored and reserved for future use. Table 6 details the two
valid CYCTYPE + DIR fields that the device will respond to.
Table 6. Valid CYCTYPE + DIR Values
FWH/LAD[3:0]
Cycle Type
010xb
LPC Memory Read
011xb
LPC Memory Write
MADDR (MEMORY ADDRESS) FIELD: This is an 8-clock field that is used to provide a 32-bit
(A31 - A0) memory address.
The AT49LH002 only decodes the last six MADDR nibbles (A23 - A0) and ignores address
bits A31 - A24 and A22 - A18. Address bit A23 is used to determine whether reads or writes to
the device will be directed to the memory array (A23 = 1) or to the register space (A23 = 0).
Addresses are transferred to the device with the most significant nibble first.
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3377B–FLASH–9/03
Additional Fields
for LPC Memory
Cycles
Additional fields are required to complete an LPC read or write cycle. The placement of these
fields, in addition to the data field, depends on whether the cycle is an LPC read or write. The
LPC Read Cycle and LPC Write Cycle sections detail the order of the various fields.
TAR (TURN-AROUND) FIELD: This 2-clock field is driven by the master when it is turning
control over to the LPC memory device, and it is driven by the LPC device when it is turning
control back over to the master. On the first clock of the TAR field, the master or LPC device
drives the FWH/LAD[3:0] lines to 1111b. On the second clock, the master or LPC device puts
the FWH/LAD[3:0] lines into a high-impedance state.
SYNC (SYNCHRONIZE) FIELD: This field is used to add wait-states for an access. It can be
several clocks in length. On target cycles, this field is driven by the LPC memory device.
If the LPC device needs to assert wait-states, it does so by driving a “wait” SYNC value of
0101b on the FWH/LAD[3:0] pins until it is ready. When ready, the device will drive a “ready”
SYNC value of 0000b on the FWH/LAD[3:0] lines. Valid values for the SYNC field are shown
in Table 7.
Table 7. Valid SYNC Values
LPC Read Cycle
SYNC Value
SYNC Type
0000b
RSYNC (Ready SYNC) – Synchronization has been achieved with no error.
0101b
WSYNC (Wait SYNC) – Device is indicating wait-states (also referred to as
short-sync).
LPC read cycles are used to read data from the memory array, the Sector Locking Registers,
the GPI register, the Status Register, and the product ID information. Upon initial device
power-up or after exiting from a reset condition, the device will automatically default to the
read array mode.
Valid LPC read cycles begin with a START field of 0000b and a CYCTYPE + DIR field of
010xb being sent to the device. Following the MADDR field, a 2-clock TAR field must be sent
to the device to indicate that the master is turning control of the LPC bus over to the LPC
memory device. After the second clock of the TAR phase, the LPC device assumes control of
the bus and begins driving SYNC fields to add wait-states. When the device is ready to output data, it will first send a “ready” SYNC and then output one byte of data during the next two
clock cycles. The data is sent one nibble at a time with the low nibble being output first followed by the high nibble. After the data has been output, the LPC device will send a 2-clock
TAR field to the master to indicate that it is turning control of the LPC bus back over to the
master.
Figure 5 shows a LPC read cycle that requires three SYNC clocks to access data from the
memory array.
12
AT49LH002
3377B–FLASH–9/03
AT49LH002
Figure 5. LPC Read Cycle
1
2
3
4
5
6
7
8
9
A31-A28 A27-A24 A23-A20 A19-A16 A15-A12 A11-A8
A7-A4
10
11
12
13
1111b
High-Z
0101b
TAR0
TAR1
WSYNC
14
15
16
17
18
19
0101b
0000b
D3-D0
D7-D4
1111b
High-Z
WSYNC
RSYNC
DATA
DATA
TAR0
TAR1
CLK
FWH4/LFRAME
FWH/LAD[3:0]
0000b
010xb
START
CYCTYPE
+ DIR
MADDR
A3-A0
Table 8. LPC Read Cycle
Clock Cycle
Field Name
Field Value(1)
FWH/LAD[3:0]
1
START
0000b
IN
FWH4/LFRAME must be active (low) for the device to
respond. Only the last START field (before FWH4/LFRAME
transitioning high) should be recognized. The START field
contents indicate an LPC cycle.
2
CYCTYPE +
DIR
010xb
IN
Indicates that the cycle type is an LPC memory cycle and the
direction of the transfer is a read.
3 - 10
MADDR
YYYY
IN
These eight clock cycles make up the 32-bit memory address.
YYYY is one nibble of the entire address. Addresses are
transferred with the most significant nibble first.
11
TAR0
1111b
IN then float
In this clock cycle, the master has driven the bus to all 1s and
then floats the bus prior to the next clock cycle. This is the first
part of the bus “turn-around cycle”.
12
TAR1
1111b (float)
Float then OUT
13 - 14
WSYNC
0101b (wait)
OUT
The device outputs the value 0101b, a “wait” SYNC, for two
clock cycles. This value indicates to the master that data is not
yet available from the device. This number of wait-syncs is a
function of the device’s memory access time.
15
RSYNC
0000b (ready)
OUT
During this clock cycle, the device will generate a “ready”
SYNC indicating that the least significant nibble of the data
byte will be available during the next clock cycle.
16
DATA
YYYY
OUT
YYYY is the least significant nibble of the data byte.
17
DATA
YYYY
OUT
YYYY is the most significant nibble of the data byte.
18
TAR0
1111b
OUT then float
19
TAR1
1111b (float)
Float then IN
Note:
FWH/LAD[3:0]
Direction
Comments
The device takes control of the bus during this clock cycle.
The LPC memory device drives the bus to 1111b to indicate a
turn-around cycle.
The LPC memory device floats its outputs, and the master
regains control of the bus during this clock cycle.
1. Field contents are valid on the rising edge of the present clock cycle.
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3377B–FLASH–9/03
LPC Write Cycle
LPC write cycles are used to send commands to the device and to program data into the
memory array.
Valid LPC write cycles begin with a START field of 0000b and a CYCTYPE + DIR field of
011xb being sent to the device. Following the MADDR field, the master sends one byte of data
to the LPC device during the next two clock cycles. The data is sent one nibble at a time with
the low nibble being output first followed by the high nibble. After the data has been sent, the
master will send a 2-clock TAR field to the LPC device to indicate that it is turning control of
the bus back over to the LPC device. After the second clock of the TAR phase, the LPC device
assumes control of the bus and drives a “ready” SYNC field to verify that it has received the
data. The LPC device will then send a 2-clock TAR field to the master to indicate that it is turning control of the bus back over to the master.
Figure 6. LPC Write Cycle
1
2
3
4
5
6
7
8
9
A31-A28 A27-A24 A23-A20 A19-A16 A15-A12 A11-A8
A7-A4
10
11
12
13
14
15
16
17
D3-D0
D7-D4
1111b
DATA
DATA
TAR0
High-Z
0000b
1111b
High-Z
TAR1
RSYNC
TAR0
TAR1
CLK
FWH4/LFRAME
FWH/LAD[3:0]
0000b
011xb
START
CYCTYPE
+ DIR
A3-A0
MADDR
Table 9. LPC Write Cycle
Clock Cycle
Field Name
Field Value(1)
FWH/LAD[3:0]
1
START
0000b
IN
FWH4/LFRAME must be active (low) for the device to
respond. Only the last START field (before FWH4/LFRAME
transitioning high) should be recognized. The START field
contents indicate an LPC cycle.
2
CYCTYPE +
DIR
011xb
IN
Indicates that the cycle type is an LPC memory cycle and the
direction of the transfer is a write.
3 - 10
MADDR
YYYY
IN
These eight clock cycles make up the 32-bit memory address.
YYYY is one nibble of the entire address. Addresses are
transferred with the most significant nibble first.
11
DATA
YYYY
IN
YYYY is the least significant nibble of the data byte. The data
byte is either any valid Flash command or the data to be
programmed into the memory array.
12
DATA
YYYY
IN
YYYY is the most significant nibble of the data byte.
13
TAR0
1111b
IN then float
14
TAR1
1111b (float)
Float then OUT
The device takes control of the bus during this clock cycle.
15
RSYNC
0000b (ready)
OUT
During this clock cycle, the device will generate a “ready”
SYNC indicating that the data byte has been received.
16
TAR0
1111b
OUT then float
17
TAR1
1111b (float)
Float then IN
Note:
14
FWH/LAD[3:0]
Direction
Comments
In this clock cycle, the master has driven the bus to all 1s and
then floats the bus prior to the next clock cycle. This is the first
part of the bus “turn-around cycle”.
The LPC memory device drives the bus to 1111b to indicate a
turn-around cycle.
The LPC memory device floats its outputs, and the master
regains control of the bus during this clock cycle.
1. Field contents are valid on the rising edge of the present clock cycle.
AT49LH002
3377B–FLASH–9/03
AT49LH002
Response to
Invalid
FWH/LPC Fields
During FWH/LPC operations, the device will not explicitly indicate that it has received invalid
field sequences. The response to specific invalid fields or sequences is as follows:
FWH Cycles
•
ID mismatch: If the IDSEL field does not match ID[3:0], then the device will ignore the
FWH cycle. The device will then enter standby mode when the FWH4/LFRAME pin is
brought high and no internal operation is in progress. The FWH/LAD[3:0] pins will also
be placed in a high-impedance state.
•
Address out of range: The FWH address sequences is seven fields long (28 bits), but
only the last six address fields (A23 - A0) will be decoded. Therefore, address bits
A27 - A24 will be ignored. In addition, because of the device density, address bits A23
and A21 - A18 will be ignored. Address bit A22 is used to determine whether reads or
writes to the device will be directed to the memory array (A22 = 1) or to the register
space (A22 = 0).
•
Invalid MSIZE field: If the device receives an invalid size field during a read or write
operation, the internal state machine will reset and no operation will be attempted. The
device will generate no response of any kind in this situation. Invalid size fields for a read
or write cycle are anything but 0000b. In addition, when accessing register space, invalid
field sizes are anything but 0000b.
Once valid START, IDSEL, and MSIZE fields are received, the device will always respond to
subsequent inputs as if they were valid. As long as the states of FWH/LAD[3:0] and
FWH4/LFRAME are known, the response of the device to signals received during the FWH
cycle should be predictable. The device will make no attempt to check the validity of incoming
Flash operation commands.
LPC Cycles
•
Address out of range: The LPC address sequences is eight fields long (32 bits), but only
the last six address fields (A23 - A0) will be decoded. Therefore, address bits A31 - A24
will be ignored. In addition, because of the device density, address bits A22 - A18 will be
ignored. Address bit A23 is used to determine whether reads or writes to the device will be
directed to the memory array (A23 = 1) or to the register space (A23 = 0).
Once valid START and CYCTYPE + DIR fields are received, the device will always respond to
subsequent inputs as if they were valid. As long as the states of FWH/LAD[3:0] and
FWH4/LFRAME are known, the response of the device to signals received during the LPC
cycle should be predictable. The device will make no attempt to check the validity of incoming
Flash operation commands.
Bus Abort
The Bus Abort operation can be used to immediately abort the current bus operation. A Bus
Abort occurs when FWH4/LFRAME is driven low for one or more clock cycles after the start of
a bus cycle. The memory will place the FWH/LAD[3:0] pins in a high-impedance state, and the
internal state machine will reset. During a write cycle, there is the possibility that an internal
Flash write or erase operation may be in progress (or has just been initiated). If the
FWH4/LFRAME pin is asserted during this time frame, the internal operation will not abort.
However, the internal state machine will not initiate a Flash write or erase operation until it has
received the last nibble from the host. This means that FWH4/LFRAME can be asserted as
late as clock cycle 12 (see Table 5 and Table 9) and no internal Flash operation will be
attempted.
When the FWH4/LFRAME pin has been driven low to abort a cycle, the host may issue a
START field of 1111b (stop/abort) to return the interface to the ready mode.
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3377B–FLASH–9/03
Device Reset
Asserting RST or INIT initiates a device reset. In read mode, RST or INIT low deselects the
memory, places the output drivers in a high-impedance state, and turns off all internal circuits.
RST or INIT must be held low for the minimum specified tPLPH time (FWH/LPC and A/A Mux
operations). The device resets to read array mode upon return from reset, and all Sector Locking Registers are reset to their default (write-locked) state. Since all Sector Locking Registers
are reset, all sectors in the memory array are set to the write-locked status regardless of their
locked state prior to reset.
A reset recovery time (tPHFV using the FWH/LPC interface and tPHAV using the A/A Mux interface) is required from RST or INIT switching back high until writes to the CUI are recognized.
A reset latency will occur if a reset procedure is performed during a programming or erase
operation.
During sector erase or program, driving RST or INIT low will abort the operation underway in
addition to causing a reset latency. Memory contents being altered are no longer valid since
the data may be partially erased or programmed.
It is important to assert RST or INIT during system reset. When the system comes out of reset,
it will expect to read from the memory array of the device. If a system reset occurs with no
FWH/LPC device reset (this will be hardware dependent), it is possible that proper CPU initialization will not occur (the FWH/LPC memory may be providing status information instead of
memory array data).
Sector
Protection
Sectors in the memory array can be protected from program and erase operations using a
hardware controlled method and/or a software (register-based) controlled method.
Hardware Write
Protection
Two pins are available to provide hardware write protection capabilities. The Top Boot Sector
Lock (TBL) pin, when held low, prevents program and sector erase operations to the top sector of the device (sector 6) where critical code can be stored. In addition, the TBL pin has the
flexibility to provide erase protection to the top 64-Kbyte region (sectors 6, 5, 4, and 3) of the
device when the Uniform Sector Erase command is used. This allows the TBL pin to protect a
larger region for systems that require a 64-Kbyte top boot sector rather than a 16-Kbyte top
boot sector.
When the TBL pin is high, hardware write protection for program and erase operations to the
top sector is disabled. Provided that the Write-Lock bits in the Sector Locking Registers are
not set (detailed later), sector erase commands can then be issued to the device to erase
either the top 16-Kbyte sector (sector 6) or the entire top 64-Kbyte region (sectors 6, 5, 4,
and 3). Program operations can also be performed to the top 16-Kbyte sector.
The Write Protect (WP) pin, which operates independently from the TBL pin, serves the same
basic function as the TBL pin for the remaining sectors except the top boot sector. When the
WP pin is held low, program and standard Sector Erase command operations to sectors 5
through 0 will not be allowed. If using the Uniform Sector Erase command, then erase operations to sectors 2, 1, and 0 cannot be performed, and erase protection for sectors 6 through 3
will be controlled by the TBL pin.
16
AT49LH002
3377B–FLASH–9/03
AT49LH002
Table 10. Hardware Write Protection Options
Hardware Write Protection
Address Range
For the Following Commands:
Sector Erase (21H)
Byte Program (40H or 10H)
For the Following Command:
Uniform Sector Erase (20H)
16K
03C000H - 03FFFFH
TBL
TBL
5
8K
03A000H - 03BFFFH
WP
TBL
4
8K
038000H - 039FFFH
WP
TBL
3
32K
030000H - 037FFFH
WP
TBL
2
64K
020000H - 02FFFFH
WP
WP
1
64K
010000H - 01FFFFH
WP
WP
0
64K
000000H - 00FFFFH
WP
WP
Sector
Size
(Bytes)
6
The TBL and WP pins must be set to the desired protection state prior to starting a program or
erase operation because they are sampled at the beginning of the operation. Changing the
state of TBL or WP during a program or erase operation may cause unpredictable results. The
new lock status will take place after the program or erase operation completes.
The TBL and WP pins function independently from the Sector Locking Registers. These pins,
when active, will write protect the appropriate sector(s) against program and erase operations
regardless of the values of the Sector Locking Registers. For example, when TBL is active,
writing to the top sector is prevented regardless of the state of the Write-Lock bit for the top
sector’s locking register. In such a case, clearing the Write-Lock bit in the Sector Locking Register will have no functional effect even though the register may indicate that the sector is no
longer locked. However, the register may still be set to Read-Lock the sector if desired.
For protecting the sectors of the memory array, the TBL and WP pins always take precedence
over the Sector Locking Registers. In addition, the states of the TBL and WP pins have no
effect on the values or status of the Sector Locking Registers.
Register-Based
Sector Locking
The device has seven Sector Locking Registers that are used in lieu of or in conjunction with
the TBL and WP pins to control the lock protection for each sector in the memory array. The
Sector Locking Registers are accessed through their respective address locations (detailed in
Table 11) in the 4 GB system memory map. Since the address bit used to distinguish between
memory and register accesses differs when the device is used as a FWH or LPC Flash (A22
for FWH and A23 for LPC), the register memory address will also differ.
The Sector Locking Registers are both readable and writable, and each register has three
dedicated locking bits to control Read Lock, Write Lock, and Lock Down functions. Therefore,
a Sector Locking Register can be read to determine what its current value is set to (e.g., set to
Lock Down status). Reading the Sector Locking Registers, however, will not determine the
status of the TBL and WP pins.
When returning from a reset condition or after power-up, the Sector Locking Registers will
always default to a state of 01H.
17
3377B–FLASH–9/03
Table 11. Sector Locking Registers
Register Memory Address
Register
Name
Associated
Sector
Sector Size
(Bytes)
FWH MODE
LPC MODE
Default Value
S6_LK
6
16K
FFBFC002H
FF7FC002H
01H
S5_LK
5
8K
FFBFA002H
FF7FA002H
01H
S4_LK
4
8K
FFBF8002H
FF7F8002H
01H
S3_LK
3
32K
FFBF0002H
FF7F0002H
01H
S2_LK
2
64K
FFBE0002H
FF7E0002H
01H
S1_LK
1
64K
FFBD0002H
FF7D0002H
01H
S0_LK
0
64K
FFBC0002H
FF7C0002H
01H
READ LOCK: The default read status of all sectors upon power-up is read-unlocked. When a
sector’s Read-Lock bit is set (1 state), data cannot be read from that sector. An attempted
read from a read-locked sector will result in data 00H being read (note that a read failure is not
reflected in the Status Register). The read lock status can be unlocked by clearing (0 state) the
Read-Lock bit, provided that the Lock-Down bit has not been set. The current read lock status
of a particular sector can be determined by reading the corresponding Read-Lock bit.
WRITE LOCK: The default write status of all sectors upon power-up is write-locked (1 state).
Any program or erase operations attempted on a locked sector will return an error in the Status Register (indicating sector lock). The status of the locked sector can be changed to
unlocked (0 state) by clearing the Write-Lock bit, provided that the Lock-Down bit is not set.
The current write lock status of a particular sector can be determined by reading the corresponding Write-Lock bit.
The Write-Lock bit must be set to the desired protection state prior to starting a program or
erase operation because it is sampled at the beginning of the operation. Changing the state of
the Write-Lock bit during a program or erase operation may cause unpredictable results. The
new lock status will take place after the program or erase operation completes.
The write lock functions independently of the hardware write protect pins, TBL and WP. When
active, these pins take precedence over the register-based write lock function. Changing the
state of the TBL and WP pins will not affect the state of the Write-Lock bits. Reading the Sector Locking Registers will not read the state of the TBL or WP pins.
LOCK DOWN: When in the FWH/LPC interface mode, the default lock down status of all sectors upon power-up is not-locked-down (0 state). The Lock-Down bit for any sector may be set
(1 state), but only once, as future attempted changes to that Sector Locking Register will be
ignored. Once a sector’s Lock-Down bit is set, the Read-Lock and Write-Lock bits for that sector can no longer be modified, and the sector is locked down in its current state of read and
write accessibility. The Lock-Down bit is only cleared upon a device reset with RST or INIT or
after a power-up. The current lock down status of a particular sector can be determined by
reading the corresponding Lock-Down bit.
18
AT49LH002
3377B–FLASH–9/03
AT49LH002
Table 12. Function of Sector Locking Bits
Bit
Name
7:3
Reserved
Reserved for future use.
2
Read-Lock
0
Sector is not read-locked.
Normal read operations in the sector can occur. This is the default state.
1
Sector is read-locked.
Read operations within the sector are prevented. Data read will be 00H.
0
Sector is not locked down.
The Read-Lock and Write-Lock bits may be changed. This is the default state.
1
Sector is locked down.
The Read-Lock and Write-Lock bits cannot be changed. Once the sector is locked down, it will
remain locked down until the device is reset (using the RST or INIT signals) or power-cycled.
0
Sector is not write-locked.
Normal program and erase operations to the sector can occur.
1
Sector is write-locked.
Program and erase operations to the sector are prevented. This is the default state.
1
Lock-Down
0
Write-Lock
Description
Table 13. Valid Sector Locking Register Values
Data
Resulting Sector State
07H
Sector is read and write locked down.
06H
Sector is read locked down.
05H
Sector is read and write locked but not locked down.
04H
Sector is read locked but not locked down.
03H
Sector is write locked down.
02H
Sector is locked open (full access locked down).
01H
Sector is write locked but not locked down. This is the default state.
00H
Sector is open for full access.
General Purpose Input Register
A General-purpose Input Register is provided to read the status of the GPI[4:0] pins when using the FWH/LPC interface.
Since this is a pass-through register, there is no default value. It is recommended that the GPI[4:0] pins be in their desired
state before FWH4/LFRAME is brought low for the beginning of the next bus cycle and remain in that state until the end of
the cycle.
Table 14. GPI Register Memory Address
Register Memory Address
Register Name
Associated Pins
FWH Mode
LPC Mode
Register Type
GPI_REG
GPI[4:0]
FFBC0100H
FF7C0100H
Read Only
19
3377B–FLASH–9/03
Table 15. General-purpose Input Register
Bit
Multiple Device
Selection
Name
7:5
Reserved
4
GPI_REG4
3
GPI_REG3
2
GPI_REG2
1
GPI_REG1
0
GPI_REG0
Description
Reserved for future use.
0
GPI4 input pin is at VIL.
1
GPI4 input pin is at VIH.
0
GPI3 input pin is at VIL.
1
GPI3 input pin is at VIH.
0
GPI2 input pin is at VIL.
1
GPI2 input pin is at VIH.
0
GPI1 input pin is at VIL.
1
GPI1 input pin is at VIH.
0
GPI0 input pin is at VIL.
1
GPI0 input pin is at VIH.
When used as a FWH device along with Intel chipsets, multiple FWH devices may be used in
a system to increase the overall memory density. By using the four ID strapping pins, ID[3:0],
up to 16 FWH devices may be attached to the same bus. BIOS support, bus loading, or the
attaching bridge may limit the actual number of devices that can be connected to the bus.
The boot device must have ID[3:0] equal to 0000b, and all subsequent devices should use
sequential up-count strapping. The strapping values on ID[3:0] must match the values in the
IDSEL field when performing FWH memory cycles. The device will compare the values on the
ID[3:0] pins with the IDSEL field. If there is a mismatch, the device will ignore the remainder of
the cycle. The device will then enter standby mode when the FWH4/LFRAME pin is high and
no internal operation is in progress. The FWH/LAD[3:0] pins will also be placed in a highimpedance state.
Table 16. FWH Multiple Device Selection
ID Strapping Pins
20
Device
ID3
ID2
ID1
ID0
IDSEL
0 (Boot Device)
0
0
0
0
0000b
1
0
0
0
1
0001b
2
0
0
1
0
0010b
3
0
0
1
1
0011b
4
0
1
0
0
0100b
5
0
1
0
1
0101b
6
0
1
1
0
0110b
7
0
1
1
1
0111b
8
1
0
0
0
1000b
9
1
0
0
1
1001b
10
1
0
1
0
1010b
11
1
0
1
1
1011b
12
1
1
0
0
1100b
13
1
1
0
1
1101b
14
1
1
1
0
1110b
15
1
1
1
1
1111b
AT49LH002
3377B–FLASH–9/03
AT49LH002
A/A Mux
Interface
The A/A Mux interface is designed as a programming interface for OEMs to use during motherboard manufacturing or component pre-programming. The term A/A Mux refers to the
multiplexed row and column addresses that this interface utilizes. The A/A Mux interface dramatically reduces the amount of overhead needed to access the device, allowing the device to
be tested and programmed quickly with automated test equipment (ATE) and PROM programmers in the OEM’s manufacturing flow. The number of signals required to use the interface
does not change with device density; therefore, the interface can accommodate larger density
devices while still allowing the device to fit into low lead-count packages.
Only basic read, erase, and program operations can be performed through the A/A Mux interface; FWH/LPC features, such as the use of the Sector Locking Registers and the Generalpurpose Input Register, are not available.
The A/A Mux interface mode is selected by driving the IC control pin high. The IC pin is internally pulled down in the device, so a modest amount of leakage current should be expected to
be drawn (see DC Specifications) when the pin is driven high.
Four control pins dictate the flow of data into and out of the device: R/C, OE, WE, and RST.
The R/C pin is the A/A Mux interface control pin used to latch row and column addresses. OE
is the data output control pin for the I/O[7:0] lines and, when active, drives the selected memory data onto the I/O bus (WE and RST must be at VIH). The WE pin controls the flow of data
into the device. Addresses previously captured by the R/C pin transitions and data are latched
into the device on the rising edge of WE. The RST pin is used to reset the device.
BUS OPERATION: All A/A Mux bus cycles can be conformed to operate on most automated
test equipment and PROM programmers.
Table 17. A/A Mux Interface Bus Operations
Mode
RST
OE
WE
Address
I/O[7:0]
VIH
VIL
VIH
X
DOUT
VIH
VIH
VIH
X
High-Z
Write(1)(2)
VIH
VIH
VIL
X
DIN
Product ID Read(1)(2)(3)
VIH
VIL
VIH
Note 3
Note 3
Read
(1)(2)
Output Disable
Notes:
(1)(2)
1. X can be VIL or VIH for control and address input pins.
2. VIH and VIL refer to the DC characteristics associated with the Flash memory output buffers:
VIL min = 0.5V, VIL max = 0.8V, VIH min = 2.0V, VIH max = VCC + 0.5V.
3. Refer to Table 20 for Product ID addresses and data.
OUTPUT DISABLE/ENABLE: With OE at a logic-high level (VIH), the device outputs are disabled. Output pins I/O[7:0] are placed in the high-impedance state. With OE at a logic-low
level (VIL), the device outputs are enabled. Output pins I/O[7:0] are placed in an output-drive
state.
ROW/COLUMN ADDRESSES: R/C is the A/A Mux interface control pin used to latch row
(A10 - A0) and column address (A17-A11) values presented on the A[10:0] pins. R/C latches
row addresses on the falling edge and column addresses on the rising edge.
RDY/BSY: The open-drain Ready/Busy output pin provides a hardware method of detecting
the end of a program or erase operation. RDY/BSY is actively pulled low during the internal
program and erase cycles and is released at the completion of the cycle.
21
3377B–FLASH–9/03
Device
Operation
The FWH/LPC and A/A Mux interfaces should be considered hardware interfaces that can be
used to transfer commands and data to and from the device. The device commands detailed
in Table 18 can be issued using either interface.
Since the FWH/LPC interface communicates using a 4-bit data bus and the A/A Mux interface
utilizes an 8-bit data bus, the number of interface bus cycles needed to perform an operation
will vary. For example, when using the FWH/LPC interface, 17 PCI clock cycles are required
for a FWH or LPC memory write cycle. Therefore, for one “write” device command cycle,
17 FWH/LPC bus cycles are needed. Likewise, for one “read” device command cycle using
the FWH/LPC interface, 19 FWH/LPC bus cycles are required.
Table 18. Command Definitions
1st Command Cycle
2nd Command Cycle
Command
Command
Cycles
Type
Address
Data
Type
Address
Data
Read Array
1+
Write
Any Address
FFH
Read
Any Address
Data OUT
Sector Erase(1)(2)
2
Write
Any Address in
the Sector
21H
Write
Any Address in
the Sector
D0H
Uniform Sector
Erase(1)(2)
2
Write
Any Address in
the Sector
20H
Write
Any Address in
the Sector
D0H
Byte Program(1)(3)
2
Write
The Address to
be Programmed
40H or 10H
Write
The Address to
be Programmed
Data IN
Read Status Register
2
Write
Any Address
70H
Read
Any Address
Status
Register
Data
Clear Status Register
1
Write
Any Address
50H
Product ID Read(4)
2
Write
Any Address
90H
Read
ID Address
ID Data
Notes:
22
1. The sector must not be hardware write protected or write-locked when attempting sector erase or program operations.
Attempts to issue a sector erase or byte program command to a hardware write protected or write-locked sector will fail.
2. Sub-sectors are sectors 6, 5, 4, and 3; the main sectors are sectors 2, 1, and 0. Refer to the Device Memory Map and Table
10 for sector sizes and address ranges. The Uniform Sector Erase command can be used to erase all sub-sectors at one
time to allow uniform 64 Kbytes sectors to be erased. A Uniform Sector Erase command issued to any address in any one of
the sub-sectors will cause all the sub-sectors to be erased provided that all of the sub-sectors are not protected or writelocked. The standard Sector Erase command can be used to individually erase both the sub-sectors and the main sectors,
allowing a single erase command to be used to erase any sector in the memory array.
3. Either 40H or 10H is recognized by the device as the byte program command.
4. Following the Product ID Read command, read operations will access manufacturer and device ID information. Refer to
Table 20 for Product ID addresses and data.
AT49LH002
3377B–FLASH–9/03
AT49LH002
READ ARRAY: Upon initial device power-up and after exit from reset, the device defaults to
the read array mode. This operation is also initiated by writing the Read Array command. The
device remains enabled for reads until another command is written to the device.
Once the internal write state machine (WSM) has started a sector erase or program operation,
the device will not recognize the Read Array command until the operation is completed.
SECTOR ERASE: Before a byte can be programmed into a sector, the sector must first be
erased. The memory array is organized into multiple sectors that can be individually erased
using two different sector erase commands, Sector Erase and Uniform Sector Erase. The Uniform Sector Erase command can be used to erase the main sectors, and it can also be used to
erase all of the sub-sectors to allow the memory array to be erased in uniform 64-Kbyte
regions. The Sector Erase command is used to erase the individual sub-sectors to provide a
more efficient and finer erase granularity. In addition, the Sector Erase command can be used
to erase the main sectors as well to allow a single erase command to be used to erase any
sector in the memory array. Both sector erase commands require two command cycles to initiate the internally self-timed erase operation.
After issuing a sector erase command, the device’s Status Register may be checked to determine the status of the WSM and the erase operation. If the device detects a sector erase error,
the Status Register should be cleared before the system software attempts any corrective
actions. After a sector erase, the CUI remains in the Read Status Register mode until a new
command is issued.
Successful sector erase requires that the corresponding sector’s Write-Lock bit be cleared and
the corresponding hardware write protect pin (TBL or WP) be inactive. If using the Uniform
Sector Erase command to erase all of the sub-sectors, then all of the sub-sectors must have
their Write-Lock bits cleared and the TBL pin must be inactive. If a sector erase is attempted
when the sector is locked, the sector erase will fail, and the reason for the failure will be indicated in the Status Register.
The erased state of the memory bits is a logical “1” (erased state of a byte is FFH).
BYTE PROGRAM: The device is programmed on a byte-by-byte basis. The Byte Program
command requires two command cycles with the programming address and data being input
on the second command cycle. The device will automatically generate the required internal
programming pulses, and all programming operations are completely self-timed. Please note
that the byte location being programmed must have already been erased to FFH. A “0” cannot
be programmed back to a “1”; only an erase operation can convert “0”s to “1”s.
After the Byte Program command is written, the device’s Status Register may be checked to
determine the WSM status and the result of the program operation. If a program error is
detected, the Status Register should be cleared before any corrective action is taken by the
system software. After a byte program operation, the CUI remains in the Read Status Register
mode until a new command is issued.
A successful program operation also requires that the corresponding sector’s Write-Lock bit
be cleared, and the corresponding hardware write protect pin (TBL or WP) be inactive. If a program operation is attempted when the sector is locked, the operation will fail, and the reason
for the failure will be indicated in the Status Register.
READ STATUS REGISTER: The Status Register (SR) may be read to determine when a sector erase or program operation completes and whether the operation completed successfully.
The Status Register may be read at any time by writing the Read Status Register command.
After writing the Read Status Register command, all subsequent read operations will return
data from the Status Register until another valid command is written to the device.
CLEAR STATUS REGISTER: Error flags (SR[5,4,1]) in the Status Register can only be set to
“1”s by the WSM and can only be reset by the Clear Status Register command. Therefore, if
an error is detected, the Status Register must be cleared before beginning another operation
to avoid ambiguity.
23
3377B–FLASH–9/03
Table 19. Status Register (SR)
SR
Bit
7
Name
Write State Machine
Status (WSM)
6
Reserved
5
Erase Status
4
3:2
1
0
Note:
Program Status
Reserved
Device Protect
Status(1)
Reserved
Description
0
Device is BUSY.
A program or erase cycle is in progress. SR[6-1] values are invalid when SR[7] is 0.
1
Device is READY.
The device is ready for any operation.
Reserved for future use.
0
Erase successful.
The sector erase operation completed successfully.
1
Erase failed.
The sector erase operation failed. If SR[5,4] are 1, then there was a command sequence
error.
0
Program successful.
The byte program operation competed successfully.
1
Program failed.
The program operation failed. If SR[5,4] are 1, then there was a command sequence error.
Reserved for future use.
0
Sector is unlocked.
The sector being erased or programmed is unlocked (not protected).
1
Sector is hardware write protected or write-locked.
The sector being erased or programmed is either hardware write protected by the TBL or
WP pin, or it is write-locked.
Reserved for future use.
1. SR[1] does not provide a continuous indication of the Write-Lock bit, TBL pin, or WP values. The WSM interrogates the
Write-Lock bit, TBL pin, or WP pin only after a sector erase or program operation. Depending on the attempted operation, it
informs the system whether or not the selected sector is locked.
PRODUCT ID READ: The Product ID Read mode is used to identify the product type and the manufacturer as Atmel. Following the Product ID Read command, read cycles from the addresses shown in Table 20 retrieve the manufacturer and
device ID code. To exit the Product ID Read mode, any valid command can be written to the device.
Table 20. Product ID Address and Data
Code
Address
Data
Manufacturer ID
000000H
1FH
Device ID
000001H
E9H
24
AT49LH002
3377B–FLASH–9/03
AT49LH002
Absolute Maximum Ratings*
*NOTICE:
Voltage on Any Pin ...................-0.5V to +VCC + 0.5V(1)(2)
Notes:
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions
beyond those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.
1. All specified voltages are with respect to GND. During transitions, this level may undershoot to -2.0V for periods of <20 ns.
During transitions, this level may overshoot to VCC + 2.0V for periods <20 ns.
2. Do not violate processor or chipset limitations on the INIT pin.
Operating Conditions
Temperature and VCC
Symbol
TC
Operating Temperature
Test Condition
(1)
Case Temperature
VCC Supply Voltage
VCC
Note:
Parameter
Min
Max
Unit
0
+85
°C
3.0
3.6
V
1. The device is designed to operate at temperatures beyond the normal commercial temperature range of 0° C to +70° C.
Power Supply Specifications – All Interfaces
Symbol
Parameter
VLKO
VCC Lockout Voltage
ICCSL1
VCC Standby Current (FWH/LPC
Interface)
Conditions
Min
Max
1.5
Voltage range of all inputs is VIH to
VIL, FWH4/ LFRAME = VIH,(2)
Units
V
35
µA
2
mA
15
mA
55
mA
VCC = 3.6V,
fCLK = 33 MHz
No internal operations in progress
VCC Standby Current (FWH/LPC
Interface)
ICCSL2
FWH4/ LFRAME = VIL(2)
VCC = 3.6V,
fCLK = 33 MHz
No internal operations in progress
ICCA
VCC Active Read Current
(FWH/LPC Interface)
VCC = VCC Max,
FWH4/ LFRAME = VIL(2)
fCLK = 33 MHz
IOUT = 0 mA
IPP
Notes:
Program or Erase Current
VCC = VCC Max
1. All currents are in RMS unless otherwise noted. These currents are valid for all packages.
2. VIH = 0.9 VCC, VIL = 0.1 VCC per the PCI output VOH and VOL spec.
25
3377B–FLASH–9/03
FWH/LPC Interface DC Input/Output Specifications
Symbol
VIH
Parameter
(1)
Conditions
Input High Voltage
Min
Max
Units
0.5 VCC
VCC + 0.5
V
VIH (INIT)(1)(2)
INIT Input High Voltage
1.35
VCC + 0.5
V
VIL
Input Low Voltage
-0.5
0.3 VCC
V
0.85
V
±10
µA
VIL (INIT)
IIL
(2)
(3)(4)
INIT Input Low Voltage
Input Leakage Current
0 < VIN < VCC
VOH
Output High Voltage
IOUT = -500 µA
VOL
Output Low Voltage
IOUT = 1.5 mA
CIN
Input Pin Capacitance
CCLK
CLK Pin Capacitance
LPIN(5)
Notes:
0.9 VCC
3
Recommended Pin Inductance
1.
2.
3.
4.
5.
V
0.1 VCC
V
13
pF
12
pF
20
nH
Inputs are not “5-volt safe.”
Do not violate processor or chipset specifications regarding the INIT pin voltage.
Input leakage currents include high-Z output leakage for all bi-directional buffers with high-Z outputs.
IIL may be higher on the IC and ID pins (up to 200 µA) if pulled against internal pull-downs. Refer to the pin descriptions
Refer to PCI spec.
FWH/LPC Interface AC Input/Output Specifications
Symbol
Parameter
Condition
IOH(AC)
Switching Current High
0 < VOUT ≤ 0.3 VCC
Min
0.3 VCC < VOUT < 0.9 VCC
IOL(AC)
Max
-12 VCC
mA
-17.1 (VCC - VOUT)
mA
0.7 VCC < VOUT < VCC
Note 2
(Test Point)
VOUT = 0.7 VCC
-32 VCC
Switching Current Low
VCC > VOUT ≥ 0.6 VCC
0.6 VCC > VOUT > 0.1 VCC
mA
-17.1 (VCC - VOUT)
mA
Note 3
(Test Point)
VOUT = 0.18 VCC
38 VCC
ICL
Low Clamp Current
-3 < VIN ≤ -1
ICH
High Clamp Current
VCC + 4 > VIN ≥ VCC + 1
slewf
Notes:
26
Output Rise Slew Rate
Output Fall Slew Rate
mA
16 VCC
0.18 VCC > VOUT > 0
slewr
Units
mA
-25 + (VIN + 1)/0.015
mA
25 + (VIN - VCC - 1)/0.015
mA
(1)
1
4
V/ns
(1)
1
4
V/ns
0.2 VCC - 0.6 VCC load
0.6 VCC - 0.2 VCC load
1. PCI specification output load is used.
2. IOH = (98.0/VCC) * (VOUT - VCC) * (VOUT + 0.4 VCC).
3. IOL = (256/VCC) * VOUT (VCC - VOUT).
AT49LH002
3377B–FLASH–9/03
AT49LH002
FWH/LPC Interface AC Timing Specifications
Clock Specification
Symbol
Parameter
Condition
(1)
Min
Max
Units
30
∞
ns
tCYC
CLK Cycle Time
tHIGH
CLK High Time
11
ns
tLOW
CLK Low Time
11
ns
–
CLK Slew Rate
–
Notes:
RST or INIT Slew Rate
peak-to-peak
1
(2)
4
50
V/ns
mV/ns
1. PCI components must work with any clock frequency between nominal DC and 33 MHz. Frequencies less than 16 MHz may
be guaranteed by design rather than testing.
2. Applies only to rising edge of signal.
Clock Waveform
tCYC
tHIGH
0.6 VCC
tLOW
0.5 VCC
0.4 VCC
0.3 VCC
0.4 VCC, p-to-p
(minimum)
0.2 VCC
27
3377B–FLASH–9/03
Signal Timing Parameters
Symbol
PCI Symbol
Parameter
(1)
tCHQX
tVAL
CLK to Data Out
tCHQX
tON
CLK to Active (Float to Active Delay)(2)
tCHQZ
tOFF
CLK to Inactive (Active to Float Delay)(2)
tAVCH
tDVCH
tSU
Input Set-up Time
tCHAX
tCHDX
tH
tVSPL
Min
Max
Units
2
11
ns
2
ns
28
(3)
ns
7
ns
Input Hold Time(3)
0
ns
tRST
Reset Active Time after Power Stable
1
ms
tCSPL
tRST-CLK
Reset Active Time after CLK Stable
100
µs
tPLQZ
tRST-OFF
Reset Active to Output Float Delay(2)
Notes:
48
ns
1. Minimum and maximum times have different loads. See PCI spec.
2. For purposes of Active/Float timing measurements, the high-Z or “off” state is defined to be when the total current delivered
through the component pin is less than or equal to the leakage current specification.
3. This parameter applies to any input type (excluding CLK).
Output Timing Parameters
CLK
VTH
VTL
VTEST
tVAL
FWH/LAD[3:0]
(Valid Output Data)
FWH/LDA[3:0]
(Float Output Data)
tON
tOFF
Input Timing Parameters
CLK
VTEST
VTH
VTL
tSU
FWH/LAD[3:0]
(Valid Input Data)
28
tH
Inputs Valid
VMAX
AT49LH002
3377B–FLASH–9/03
AT49LH002
Interface Measurement Condition Parameters
Symbol
Value
Units
VTH(1)
0.6 VCC
V
(1)
0.2 VCC
V
VTEST
0.4 VCC
V
VMAX(1)
0.4 VCC
V
VTL
Input Signal Edge Rate
Note:
1 V/ns
1. The input test environment is done with 0.1 VCC of overdrive over VIH and VIL. Timing parameters must be met with no more
overdrive than this. VMAX specifies the maximum peak-to-peak waveform allowed for measuring the input timing. Production
testing may use different voltage values, but must correlate results back to these parameters.
Reset Operations
Symbol
tPLPH
(1)
tPHFV
Note:
Parameter
Min
RST or INIT Pulse Low Time (If RST or INIT is tied to VCC, this
specification is not applicable)
100
ns
1
µs
RST or INIT High to FWH4/FRAME Low
Max
Unit
1. A reset latency of 20 µs will occur if a reset procedure is performed during a programming or erase operation.
AC Waveform for Reset Operation
RST
VIH
VIL
tPLPH
FWH4/LFRAME
tPHFV
VIH
VIL
Programming and Erase Times
Parameter
Byte Program Time(2)
(2)
Sector Erase Time
Notes:
Typ(1)
Max
Unit
30
50
µs
150
500
ms
1. Typical values measured at TA = +25° C and nominal voltages.
2. Excludes system-level overhead.
29
3377B–FLASH–9/03
ELECTRICAL CHARACTERISTICS FOR A/A MUX INTERFACE: Certain specifications differ from the previous sections
when programming using the A/A Mux interface. The following subsections provide this data. Any information that is not
shown here is not specific to the A/A Mux interface and uses the FWH/LPC interface specifications.
A/A Mux Interface DC Input/Output Specifications
Symbol
Parameter
VIH(1)
VIL
IIL
(2)(3)
Conditions
Min
Max
Unit
Input High Voltage
0.5 VCC
VCC + 0.5
V
Input Low Voltage
-0.5
0.8
V
+10
µA
Input Leakage Current
VCC = VCC max,
VOUT = VCC or GND
VOH
Output High Voltage
VCC = VCC min, IOH = -2.5 mA
VCC = VCC min, IOH = -100 µA
VOL
Output Low Voltage
VCC = VCC min, IOL = 2 mA
CIN
Input Pin Capacitance
CCLK
CLK Pin Capacitance
LPIN(4)
Recommended Pin Inductance
Notes:
1.
2.
3.
4.
0.85 VCC min
VCC = 0.4
3
V
V
0.4
V
13
pF
12
pF
20
nH
Inputs are not “5-volt safe.”
Input leakage currents include high-Z output leakage for all bi-directional buffers with high-Z outputs.
IIL may be higher on the IC and ID pins (up to 200 µA) if pulled against internal pull-downs. Refer to the pin descriptions.
Refer to PCI spec.
Reset Operations
Symbol
Parameter
Min
tPLPH
RST Pulse Low Time (If RST is tied to VCC, this specification is not
applicable.)
100
tPLRH
RST Low to Reset during Sector Erase or Program(1)(2)
tPHAV
Notes:
RST High to Row Address Setup
Max
Unit
ns
20
(2)
µs
1
µs
1. If RST is asserted when the WSM is not busy (RDY/BSY = 1), the reset will complete within 100 ns.
2. A reset recovery time, tPHAV, is required from the latter of RDY/BSY or RST going high until addresses are valid.
AC Waveforms for Reset Operations
RDY/BSY
VIH
VIL
tPLRH
RST
VIH
VIL
tPLPH
ADDRESS
30
tPHAV
tPHAV
VIH
VIL
AT49LH002
3377B–FLASH–9/03
AT49LH002
A/A Mux Interface Read-only Operations(1)(3)
Symbol
Parameter
Min
tAVAV
Read Cycle Time
250
ns
tAVCL
Row Address Setup to R/C Low
50
ns
tCLAX
Row Address Hold from R/C Low
50
ns
tAVCH
Column Address Setup to R/C High
50
ns
tCHAX
Column Address Hold from R/C High
50
ns
tCHQV
R/C High to Output Delay(2)
150
ns
tGLQV
OE Low to Output Delay(2)
50
ns
tPHAV
RST High to Row Address Setup
1
µs
tGLQX
OE Low to Output in Low-Z
0
ns
tGHQZ
OE High to Output in High-Z
tQXGH
Output Hold from OE High
Note:
Max
50
0
Units
ns
ns
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE may be delayed up to tCHQV - tGLQV after the rising edge of R/C without impact on tCHQV.
3. TC = 0° C to +85° C, VCC = 3.0V to 3.6V.
A/A Mux Read Timing Diagram
tAVAV
ADDRESSES
VIH
VIL
Row Address
Stable
tAVCL
Column Address
Stable
tCLAX tAVCH
VIH
R/C
VIL
Next Address
Stable
tCHAX
tCHQV
tGLQV
tGHQZ
OE
I/O
VIH
VIL
VOH
VOL
WE
VIH
VIL
RST
VIH
VIL
tQXGH
tPHAV
High-Z
High-Z
Data Valid
tGLQX
31
3377B–FLASH–9/03
A/A Mux Interface Write Operations(1)
Min
Symbol
Parameter
tPHWL
RST High Recovery to WE Low
tWLWH
Max
Units
1
µs
Write Pulse Width Low
100
ns
tDVWH
Data Setup to WE High
50
ns
tWHDX
Data Hold from WE High
5
ns
tAVCL
Row Address Setup to R/C Low
50
ns
tCLAX
Row Address Hold from R/C Low
50
ns
tAVCH
Column Address Setup to R/C High
50
ns
tCHAX
Column Address Hold from R/C High
50
ns
tWHWL
Write Pulse Width High
100
ns
tCHWH
R/C High Setup to WE High
50
ns
tWHGL
Write Recovery before Read
150
ns
tWHSV
Write Recovery before a Valid SRD (Status Register Data) Read
150
ns
tWHRL
WE High to RDY/BSY Going Low
Note:
0
ns
1. TC = 0° C to +85° C, VCC = 3.0V to 3.6V.
A/A Mux Write Timing Diagram
R1
C1
tAVCL
R2
F









E


















D
C2
tAVCH
tCLAX
VIH
R/C
VIL
tPHWL
WE
C









B














A
VIH
ADDRESSES
VIL
tCHAX
tCHWH
tWHWL
tWLWH
VIH
VIL
tWHGL
OE
VIH
VIL
VOH
I/O
VOL
RDY/BSY
VIH
VIL
RST
VIH
VIL
tWHDX
tWHSV
tDVWH
DIN
Valid
SRD
DIN
tWHRL
NOTES
A = VCC power-up and standby
B = Write sector erase or program setup
C = Write sector erase confirm or valid address and data
D = Automated erase or program delay
E = Read status register data
F = Ready to write another command
32
AT49LH002
3377B–FLASH–9/03
AT49LH002
Ordering Information
ICC (mA)
Active
Standby
Ordering Code
Package
Operation Range
15
0.03
AT49LH002-33JC
AT49LH002-33TC
32J
40T
Extended Commercial
(0° to 85° C)
Package Type
32J
32-lead, Plastic J-leaded Chip Carrier Package (PLCC)
40T
40-lead, Thin Small Outline Package (TSOP)
33
3377B–FLASH–9/03
Packaging Information
32J – PLCC
1.14(0.045) X 45˚
PIN NO. 1
IDENTIFIER
1.14(0.045) X 45˚
0.318(0.0125)
0.191(0.0075)
E1
E2
B1
E
B
e
A2
D1
A1
D
A
0.51(0.020)MAX
45˚ MAX (3X)
COMMON DIMENSIONS
(Unit of Measure = mm)
D2
Notes:
1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
SYMBOL
MIN
NOM
MAX
A
3.175
–
3.556
A1
1.524
–
2.413
A2
0.381
–
–
D
12.319
–
12.573
D1
11.354
–
11.506
D2
9.906
–
10.922
E
14.859
–
15.113
E1
13.894
–
14.046
E2
12.471
–
13.487
B
0.660
–
0.813
B1
0.330
–
0.533
e
NOTE
Note 2
Note 2
1.270 TYP
10/04/01
R
34
2325 Orchard Parkway
San Jose, CA 95131
TITLE
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)
DRAWING NO.
REV.
32J
B
AT49LH002
3377B–FLASH–9/03
AT49LH002
40T – TSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1 D
L
b
e
L1
A2
E
A
GAGE PLANE
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
NOM
MAX
A
–
–
1.20
A1
0.05
–
0.15
A2
0.95
1.00
1.05
D
19.80
20.00
20.20
D1
18.30
18.40
18.50
Note 2
E
9.90
10.00
10.10
Note 2
L
0.50
0.60
0.70
SYMBOL
Notes:
1. This package conforms to JEDEC reference MO-142, Variation CD.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
L1
0.25 BASIC
b
0.17
0.22
0.27
c
0.10
–
0.21
e
NOTE
0.50 BASIC
10/18/01
R
2325 Orchard Parkway
San Jose, CA 95131
TITLE
40T, 40-lead (10 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP)
DRAWING NO.
REV.
40T
B
35
3377B–FLASH–9/03
Atmel Corporation
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3377B–FLASH–9/03
xM