LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only FOUR DIGIT LED DISPLAY (0.28 Inch) Pb Lead-Free Parts LFD265/6A-XX/S1-PF DATA SHEET DOC. NO : QW0905- LFD265/6A-XX/S1-PF REV. : DATE : 29 - Jul. - 2006 A LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 1/8 PART NO. LFD265/6A-XX/S1-PF Package Dimensions LFD265/6A-XX/S1-PF BIN GRADING ORDER DATE CUSTOMER P/N LAPLING 30.26(1.191") 6.1(0.24") L3 DIG.1 7.0 (0.28") DIG.2 L1 DIG.3 L2 DIG.4 10.0 (0.394") 7.62 (0.3") ψ0.8(0.031") A F G E C D 3.5± 0.5 ψ0.45 TYP B 2.54X7=17.78 (0.7") PIN NO.1 Note : 1.All dimension are in millimeters and (lnch) tolerance is ± 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. DP LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/8 PART NO. LFD265/6A-XX/S1-PF Internal Circuit Diagram LFD265A-XX/S1-PF 13 15 2 6 5 16 7 A DIG.1 B C D 1 E F G LFD266A-XX/S1-PF 13 15 2 6 5 16 7 A DIG.1 B C D 1 E F G A DIG.2 B C D 14 E F G A DIG.2 B C D 14 E F G A DIG.3 B C D 11 E F G A DIG.3 B C D 11 E F G A DIG.4 B C D 8 E F G A DIG.4 B C D 8 E F G L1 L2 12 L1 L2 12 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 3/8 PART NO. LFD265/6A-XX/S1-PF Electrical Connection PIN NO.1 LFD265A-XX/S1-PF PIN NO.1 LFD266A-XX/S1-PF 1 Common Cathode Dig.1 1 Common Anode Dig.1 2 Anode C 2 Cathode C 3 NO CONNECT 3 NO CONNECT 4 NO CONNECT 4 NO CONNECT 5 Anode E 5 Cathode E 6 Anode D 6 Cathode D 7 Anode G 7 Cathode G 8 Common Cathode Dig.4 8 Common Anode Dig.4 9 NO CONNECT 9 NO CONNECT 10 NO CONNECT 10 NO CONNECT 11 Common Cathode Dig.3 11 Common Anode Dig.3 12 Common Cathode L1,L2 12 Common Anode L1,L2 13 Anode A ,L1 13 Cathode A,L1 14 Common Cathode Dig.2 14 Common Anode Dig.2 15 Anode B,L2 15 Cathode B,L2 16 Anode F 16 Cathode F LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 4/8 PART NO. LFD265/6A-XX/S1-PF Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT 9UG Forward Current Per Chip IF 30 mA Peak Forward Current Per Chip (Duty 1/10,0.1ms Pulse Width) IFP 60 mA Power Dissipation Per Chip PD 75 mW Ir 10 μA Electrostatic Discharge( * ) ESD 2000 μA Operating Temperature Topr -25 ~ +85 ℃ Storage Temperature Tstg -25 ~ +85 ℃ Reverse Current Per Any Chip Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260 ℃ Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic * glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded. Part Selection And Application Information(Ratings at 25℃) common cathode Material Emitted or anode CHIP PART NO △λ Iv(mcd) Vf(v) (nm) IV-M Min. Typ. Max. Min. Typ. Common Cathode LFD265A-XX/S1-PF AIGaINP LFD266A-XX/S1-PF Electrical λD (nm) 574 Green 20 1.7 2.1 Common Anode Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. 2.6 5.0 8.5 2:1 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LFD265/6A-XX/S1-PF Page 5/8 Test Condition For Each Parameter Symbol Unit Test Condition Forward Voltage Per Chip Vf volt If=20mA Luminous Intensity Per Chip Iv mcd If=10mA λD nm If=20mA △λ nm If=20mA Ir μA Vr=5V Parameter Dominant Wavelength Spectral Line Half-Width Reverse Current Any Chip Luminous Intensity Matching Ratio IV-M LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 6/8 PART NO. LFD265/6A-XX/S1-PF Typical Electro-Optical Characteristics Curve 9UG CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1.0 0.1 2.5 2.0 1.5 1.0 0.5 0 1.0 2.0 3.0 4.0 1.0 5.0 10 Fig.4 Relative Intensity vs. Temperature 1.2 Relative Intensity @20mA Normalize @25℃ Forward Voltage@20mA Normaliz @25℃ Fig.3 Forward Voltage vs. Temperature 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 100 Relative Intensity @20mA Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0 550 600 Wavelength (nm) 3.0 2.5 2.0 1.5 1.0 0.5 0 -40 -20 0 20 40 60 80 Ambient Temperature( ℃) Ambient Temperature( ℃) 500 1000 Forward Current(mA) Forward Voltage(V) -40 100 650 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LFD265/6A-XX/S1-PF Page 7/8 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350° C Max Soldering Time:3 Seconds Max(One Time) Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260°C 2.Wave Soldering Profile Dip Soldering Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2° C/sec(max) Ramp-Down:-5° C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260° C Temp(°C) 260° C3sec Max 260° 5° /sec max 120° 25° 0° 0 2° /sec max Preheat 60 Seconds Max 50 100 150 Time(sec) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LFD265/6A-XX/S1-PF Page 8/8 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=10mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hours. 1.Ta=105 ℃±5 ℃&-40 ℃±5 ℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11