HIGH SPEED PNP SILICON BIPOLAR TRANSISTOR 2N2894AC1 • Hermetic Ceramic Surface Mount Package (SOT23 Compatible) • Silicon Planar Epitaxial PNP Transistor • High Speed low Saturation Switching • Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VCBO VCEO VEBO IC PD TJ Tstg Collector – Base Voltage Collector – Emitter Voltage Emitter – Base Voltage Continuous Collector Current TA = 25°C Total Power Dissipation at Derate Above 25°C Junction Temperature Range Storage Temperature Range -12V -12V -4.5V -200mA 360mW 2.88mW/°C -65 to +150°C -65 to +150°C THERMAL PROPERTIES Symbol Parameter Max Units RθJA Thermal Resistance Junction to Ambient 347 °C/W Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8519 Issue 1 Page 1 of 4 HIGH SPEED PNP SILICON BIPOLAR TRANSISTOR 2N2894AC1 ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols Parameters Test Conditions Collector-Base Breakdown Voltage IC = -10µA IE = 0 -12 Collector-Emitter Breakdown Voltage IC = -10mA IB = 0 -12 V(BR)EBO Emitter-Base Breakdown Voltage IE = -100µA IC = 0 -4.5 ICBO Collector Cut-Off Current VCB = -10V IE = 0 -100 nA TA = 125°C -10 µA (1) V(BR)CBO (1) V(BR)CEO (1) hFE (1) Forward-current transfer ratio (1) VCE(sat) VBE(sat) (1) Collector-Emitter Saturation Voltage Base-Emitter Saturation Voltage Min Typ Max Units V IC = -10mA VCE = -0.3V 30 IC = -30mA VCE = -0.5V 40 TA = -55°C 20 IC = -100mA VCE = -1.0V 30 IC = -10mA IB = -1.0mA -0.15 IC = -30mA IB = -3.0mA -0.19 IC = -100mA IB = -10mA -0.45 IC = -10mA IB = -1.0mA -0.98 IC = -30mA IB = -3.0mA -1.15 IC = -100mA IB = -10mA -1.50 IC = -30mA VCE = -10V 120 V V DYNAMIC CHARACTERISTICS fT Current Gain-Bandwidth Product COBO Output Capacitance VCB = -5V, IE = 0, 1.0MHz 4.5 CIBO Input Capacitance VEB = -0.5V, IC = 0, 1.0MHz 6.0 ton Turn-On Time VCC = -2V IC = -30mA 60 toff Turn-Off Time IB1 = 1.5mA IB2 = -1.5mA 60 650 MHz f = 100MHz pF ns Notes (1) Pulse Width < 300µs, Duty Cycle <2% Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8519 Issue 1 Page 2 of 4 HIGH SPEED PNP SILICON BIPOLAR TRANSISTOR 2N2894AC1 MECHANICAL DATA Dimensions in mm (Inches) R0.31 (0.012) 0.51 ± 0.10 (0.02 ± 0.004) See Package Variant Table 2 0.76 ± 0.15 (0.03 ± 0.006) R (0 0. .0 56 22 ) 2.54 ± 0.13 (0.10 ± 0.005) 4 3 1.02 ± 0.10 (0.04 ± 0.004) 1 1.91 ± 0.10 (0.075 ± 0.004) 0.31 (0.012) rad. 3.05 ± 0.13 (0.12 ± 0.005) 1.40 (0.055) max. C1 Underside View PACKAGE VARIANT TABLE Variant C1A C1B Pad 1 Base Base Pad 2 Emitter Emitter Pad 3 Collector Collector Pad 4 No Pad (3-Pins Only) Lid Contact * * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to be specified at order. Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8519 Issue 1 Page 3 of 4 HIGH SPEED PNP SILICON BIPOLAR TRANSISTOR 2N2894AC1 SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type – See Electrical Stability Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts can be marked with approximately 8 characters on two lines and can include the cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 2N2894AC1 part with package variant B, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 2N2894AC1B-JQRS (Include quantity for flight parts) 2N2894AC1B.GRPC (chargeable conformance option) 2N2894AC1B.GCDE (charge for destructive parts) 2N2894AC1B.GCDM (charge for destructive parts) 2N2894AC1B.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries. High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8519 Issue 1 Page 4 of 4