1N5221B-LCC3

500mW ZENER DIODES
1N5221B TO 1N5261B LCC3
•
LCC3 Hermetic Ceramic Surface Mount Package
•
Extensive Voltage Selection (2.4V – 47V)
•
Standard Zener Voltage Tolerance of ±5% (B Suffix)
•
Regulation Over a Large Operating Current & Temperature Range
•
High-Reliability Screening Options Available
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated)
VZM
IZM
PT
TJ
TSTG
TSP
Reference Voltage
Continuous DC Current
Total Power Dissipation at TA = 25°C
Junction Temperature Range
Storage Temperature Range
Maximum Soldering Pad Temperature for 20s
See Reference Table
See Reference Table
500mW
-55 to +175°C
-65 to +175°C
260°C
THERMAL PROPERTIES
Symbol
Parameter
Max
RθJA
Thermal Resistance Junction to Ambient
300
Units
°C/W
SERIES ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise)
Symbol
Parameter
Test Conditions
Max
VF
Forward Voltage
IF = 200mA
1.5
Units
V
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing an order.
Semelab Limited
Telephone +44 (0) 1455 556565
Email: [email protected]
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website: http://www.semelab-tt.com
Document Number 7788
Issue 4
Page 1 of 4
500mW ZENER DIODES
1N5221B TO 1N5261B LCC3
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated)
P/N
1N5221
1N5222
1N5223
1N5224
1N5225
1N5226
1N5227
1N5228
1N5229
1N5230
1N5231
1N5232
1N5233
1N5234
1N5235
1N5236
1N5237
1N5238
1N5239
1N5240
1N5241
1N5242
1N5243
1N5244
1N5245
1N5246
1N5247
1N5248
1N5249
1N5250
1N5251
1N5252
1N5253
1N5254
1N5255
1N5256
1N5257
1N5258
1N5259
1N5260
1N5261
Notes:
1)
Nominal
Zener
Voltage
Test
Current
VZ @ IZT
IZT
V
mA
2.4
2.5
2.7
2.8
3.0
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6.0
6.2
6.8
7.5
8.2
8.7
9.1
10
11
12
13
14
15
16
17
18
19
20
22
24
25
27
28
30
33
36
39
43
47
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
9.5
9.0
8.5
7.8
7.4
7.0
6.6
6.2
5.6
5.2
5.0
4.6
4.5
4.2
3.8
3.4
3.2
3.0
2.7
Maximum Zener Impedance(1)
ZZT @ IZT
ZZK @ IZK = 250µA
Ω
30
30
30
30
29
28
24
23
22
19
17
11
7.0
7.0
5.0
6.0
8.0
8.0
10
17
22
30
13
15
16
17
19
21
23
25
29
33
35
41
44
49
58
70
80
93
105
1200
1250
1300
1400
1600
1600
1700
1900
2000
1900
1600
1600
1600
1000
750
500
500
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
700
700
800
900
1000
Maximum Reverse Leakage
Current
IR
@VR
µA
V
100
100
75
75
50
25
15
10
5.0
5.0
5.0
5.0
5.0
5.0
3.0
3.0
3.0
3.0
3.0
3.0
2.0
1.0
0.5
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
1.0
2.0
3.0
3.5
4.0
5.0
6.0
6.5
6.5
7.0
8.0
8.4
9.1
9.9
10
11
12
13
14
14
15
17
18
19
21
21
23
25
27
30
33
36
Maximum Zener
Voltage
Coefficient(2)
αVZ
%/°C
–0.085
–0.085
–0.080
–0.080
–0.075
–0.070
–0.065
–0.060
±0.055
±0.030
±0.030
+0.038
+0.038
+0.045
+0.050
+0.058
+0.062
+0.065
+0.068
+0.075
+0.076
+0.077
+0.079
+0.082
+0.082
+0.083
+0.084
+0.085
+0.086
+0.086
+0.087
+0.088
+0.089
+0.090
+0.091
+0.091
+0.092
+0.093
+0.094
+0.095
+0.095
Zener Impedance is measured to ensure a sharp knee characteristic on the breakdown curve. ZZT is specified at the test current and ZZK is specified near the knee.
The given DC operating current (where I = I
or I
as specified above) is modulated 10% pk-pk at 1KHz (∆I ) and is forced between the anode and cathode.
Z ZT
ZK
Z
The resulting modulated Zener voltage (∆V ) is then measured and the Zener impedance (Z ) is then calculated by Z = ∆V /∆I (where Z = Z or Z
as
Z
Z
Z
Z Z
Z
ZT
ZK
specified above).
2)
Temperature Coefficient test conditions:
a. I
= 7.5mA , T = 25°C, T = 125°C (1N5221 through to 1N5242)
ZT
1
2
b. I
= Rated I , T = 25°C, T = 125°C (1N5243 through to 1N5261)
ZT
ZT 1
2
DUT temperature stabilised with constant current for αVZ measurement @ T1,T2
Semelab Limited
Telephone +44 (0) 1455 556565
Email: [email protected]
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website: http://www.semelab-tt.com
Document Number 7788
Issue 4
Page 2 of 4
500mW ZENER DIODES
1N5221B TO 1N5261B LCC3
MECHANICAL DATA
Dimensions in mm (inches)
1.40 ± 0.15
(0.055 ± 0.006)
5.59 ± 0.13
(0.22 ± 0.005)
3
4
1.02 ± 0.20
(0.04 ± 0.008)
2
1
1.27 ± 0.05
(0.05 ± 0.002)
0.23 rad.
(0.009)
0.64 ± 0.08
(0.025 ± 0.003)
3.81 ± 0.13
(0.15 ± 0.005)
0.25 ± 0.03
(0.01 ± 0.001)
0.23 min.
(0.009)
2.03 ± 0.20
(0.08 ± 0.008)
LCC3 (MO-041BA, UA)
PAD 1 – CATHODE
PAD 2 – N/C
PAD 3 – N/C
PAD 4 – ANODE
Pad metallisation typically 100µ inches Au over 50-250µ inches Ni
Semelab Limited
Telephone +44 (0) 1455 556565
Email: [email protected]
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website: http://www.semelab-tt.com
Document Number 7788
Issue 4
Page 3 of 4
500mW ZENER DIODES
1N5221B TO 1N5261B LCC3
SCREENING OPTIONS
ORDERING INFORMATION
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the High Reliability and
Screening Options Handbook available for download from
the from the TT electronics Semelab web site.
Part numbers are built up from Type, Package Variant, and
screening level. The part numbers are extended to include
the additional options as shown below.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Type – See Electrical Characteristics Table
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MILPRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
MARKING DETAILS
Parts are typically laser marked with up to 7 characters on
two lines. High reliability screened parts have 3 lines.
Typical marking would include a pin 1 identifier, part or
specification number, week of seal (High Rel) or serial
number subject to available space and legibility.
Customer specific marking requirements can be arranged at
the time of order.
Example Marking:
Customer Pre-Cap Visual Inspection
Customer Buy-Off visit
Data Pack
Solderability Samples
Scanning Electron Microscopy
Radiography (X-ray)
Total Dose Radiation Test
.CVP
.CVB
.DA
.SS
.SEM
.XRAY
.RAD
MIL-PRF-19500 (QR217)
Group B charge
Group B destructive mechanical samples
Group C charge
Group C destructive electrical samples
Group C destructive mechanical samples
.GRPB
.GBDM (12 pieces)
.GRPC
.GCDE (12 pieces)
.GCDM (6 pieces)
ESA/ESCC
Lot Validation Testing (subgroup 1) charge
LVT1 destructive samples (environmental)
LVT1 destructive samples (mechanical)
Lot Validation Testing (subgroup 2) charge
LVT2 endurance samples (electrical)
Lot Validation Testing (subgroup 3) charge
LVT3 destructive samples (mechanical)
.LVT1
.L1DE (15 pieces)
.L1DM (15 pieces)
.LVT2
.L2D (15 pieces)
.LVT3
.L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
Example ordering information:
The following example is for the 1N5245B part with JQRS
screening, additional Group C conformance testing and a
Data pack.
Part Numbers:
1N5245BLCC3-JQRS (Include quantity for flight parts)
1N5245BLCC3.GRPC (chargeable conformance option)
1N5245BLCC3.GCDE (charge for destructive parts)
1N5245BLCC3.GCDM (charge for destructive parts)
1N5245BLCC3.DA (charge for Data pack)
Customers with specific requirements (e.g. marking or
screening) may be supplied with a similar alternative part
number (there is maximum 20 character limit to part
numbers). Contact Semelab sales with enquiries.
High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
Semelab Limited
Telephone +44 (0) 1455 556565
Email: [email protected]
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website: http://www.semelab-tt.com
Document Number 7788
Issue 4
Page 4 of 4