500mW ZENER DIODES 1N5221B TO 1N5261B LCC3 • LCC3 Hermetic Ceramic Surface Mount Package • Extensive Voltage Selection (2.4V – 47V) • Standard Zener Voltage Tolerance of ±5% (B Suffix) • Regulation Over a Large Operating Current & Temperature Range • High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VZM IZM PT TJ TSTG TSP Reference Voltage Continuous DC Current Total Power Dissipation at TA = 25°C Junction Temperature Range Storage Temperature Range Maximum Soldering Pad Temperature for 20s See Reference Table See Reference Table 500mW -55 to +175°C -65 to +175°C 260°C THERMAL PROPERTIES Symbol Parameter Max RθJA Thermal Resistance Junction to Ambient 300 Units °C/W SERIES ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise) Symbol Parameter Test Conditions Max VF Forward Voltage IF = 200mA 1.5 Units V Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 7788 Issue 4 Page 1 of 4 500mW ZENER DIODES 1N5221B TO 1N5261B LCC3 ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) P/N 1N5221 1N5222 1N5223 1N5224 1N5225 1N5226 1N5227 1N5228 1N5229 1N5230 1N5231 1N5232 1N5233 1N5234 1N5235 1N5236 1N5237 1N5238 1N5239 1N5240 1N5241 1N5242 1N5243 1N5244 1N5245 1N5246 1N5247 1N5248 1N5249 1N5250 1N5251 1N5252 1N5253 1N5254 1N5255 1N5256 1N5257 1N5258 1N5259 1N5260 1N5261 Notes: 1) Nominal Zener Voltage Test Current VZ @ IZT IZT V mA 2.4 2.5 2.7 2.8 3.0 3.3 3.6 3.9 4.3 4.7 5.1 5.6 6.0 6.2 6.8 7.5 8.2 8.7 9.1 10 11 12 13 14 15 16 17 18 19 20 22 24 25 27 28 30 33 36 39 43 47 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 9.5 9.0 8.5 7.8 7.4 7.0 6.6 6.2 5.6 5.2 5.0 4.6 4.5 4.2 3.8 3.4 3.2 3.0 2.7 Maximum Zener Impedance(1) ZZT @ IZT ZZK @ IZK = 250µA Ω 30 30 30 30 29 28 24 23 22 19 17 11 7.0 7.0 5.0 6.0 8.0 8.0 10 17 22 30 13 15 16 17 19 21 23 25 29 33 35 41 44 49 58 70 80 93 105 1200 1250 1300 1400 1600 1600 1700 1900 2000 1900 1600 1600 1600 1000 750 500 500 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 700 700 800 900 1000 Maximum Reverse Leakage Current IR @VR µA V 100 100 75 75 50 25 15 10 5.0 5.0 5.0 5.0 5.0 5.0 3.0 3.0 3.0 3.0 3.0 3.0 2.0 1.0 0.5 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 1.0 2.0 3.0 3.5 4.0 5.0 6.0 6.5 6.5 7.0 8.0 8.4 9.1 9.9 10 11 12 13 14 14 15 17 18 19 21 21 23 25 27 30 33 36 Maximum Zener Voltage Coefficient(2) αVZ %/°C –0.085 –0.085 –0.080 –0.080 –0.075 –0.070 –0.065 –0.060 ±0.055 ±0.030 ±0.030 +0.038 +0.038 +0.045 +0.050 +0.058 +0.062 +0.065 +0.068 +0.075 +0.076 +0.077 +0.079 +0.082 +0.082 +0.083 +0.084 +0.085 +0.086 +0.086 +0.087 +0.088 +0.089 +0.090 +0.091 +0.091 +0.092 +0.093 +0.094 +0.095 +0.095 Zener Impedance is measured to ensure a sharp knee characteristic on the breakdown curve. ZZT is specified at the test current and ZZK is specified near the knee. The given DC operating current (where I = I or I as specified above) is modulated 10% pk-pk at 1KHz (∆I ) and is forced between the anode and cathode. Z ZT ZK Z The resulting modulated Zener voltage (∆V ) is then measured and the Zener impedance (Z ) is then calculated by Z = ∆V /∆I (where Z = Z or Z as Z Z Z Z Z Z ZT ZK specified above). 2) Temperature Coefficient test conditions: a. I = 7.5mA , T = 25°C, T = 125°C (1N5221 through to 1N5242) ZT 1 2 b. I = Rated I , T = 25°C, T = 125°C (1N5243 through to 1N5261) ZT ZT 1 2 DUT temperature stabilised with constant current for αVZ measurement @ T1,T2 Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 7788 Issue 4 Page 2 of 4 500mW ZENER DIODES 1N5221B TO 1N5261B LCC3 MECHANICAL DATA Dimensions in mm (inches) 1.40 ± 0.15 (0.055 ± 0.006) 5.59 ± 0.13 (0.22 ± 0.005) 3 4 1.02 ± 0.20 (0.04 ± 0.008) 2 1 1.27 ± 0.05 (0.05 ± 0.002) 0.23 rad. (0.009) 0.64 ± 0.08 (0.025 ± 0.003) 3.81 ± 0.13 (0.15 ± 0.005) 0.25 ± 0.03 (0.01 ± 0.001) 0.23 min. (0.009) 2.03 ± 0.20 (0.08 ± 0.008) LCC3 (MO-041BA, UA) PAD 1 – CATHODE PAD 2 – N/C PAD 3 – N/C PAD 4 – ANODE Pad metallisation typically 100µ inches Au over 50-250µ inches Ni Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 7788 Issue 4 Page 3 of 4 500mW ZENER DIODES 1N5221B TO 1N5261B LCC3 SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type – See Electrical Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts are typically laser marked with up to 7 characters on two lines. High reliability screened parts have 3 lines. Typical marking would include a pin 1 identifier, part or specification number, week of seal (High Rel) or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 1N5245B part with JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N5245BLCC3-JQRS (Include quantity for flight parts) 1N5245BLCC3.GRPC (chargeable conformance option) 1N5245BLCC3.GCDE (charge for destructive parts) 1N5245BLCC3.GCDM (charge for destructive parts) 1N5245BLCC3.DA (charge for Data pack) Customers with specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries. High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Telephone +44 (0) 1455 556565 Email: [email protected] Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 7788 Issue 4 Page 4 of 4