ONSEMI MC74HC273A_11

MC74HC273A
Octal D Flip-Flop with
Common Clock and Reset
High−Performance Silicon−Gate CMOS
The MC74HC273A is identical in pinout to the LS273. The device
inputs are compatible with standard CMOS outputs; with pullup
resistors, they are compatible with LSTTL outputs.
This device consists of eight D flip−flops with common Clock and
Reset inputs. Each flip−flop is loaded with a low−to−high transition of
the Clock input. Reset is asynchronous and active low.
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MARKING
DIAGRAMS
20
PDIP−20
N SUFFIX
CASE 738
Features
•
•
•
•
•
•
•
•
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1.0 mA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7 A
Chip Complexity: 264 FETs or 66 Equivalent Gates
These Devices are Pb−Free, Halogen Free and are RoHS Compliant
1
20
MC74HC273AN
AWLYYWWG
1
20
SOIC−20
DW SUFFIX
CASE 751D
20
1
HC273A
AWLYYWWG
1
20
HC
273A
ALYWG
G
TSSOP−20
DT SUFFIX
CASE 948E
20
1
1
20
SOEIAJ−20
F SUFFIX
CASE 967
1
20
1
A
WL, L
YY, Y
WW, W
G or G
74HC273A
AWLYWWG
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
© Semiconductor Components Industries, LLC, 2011
May, 2011 − Rev. 13
1
Publication Order Number:
MC74HC273A/D
MC74HC273A
PIN ASSIGNMENT
RESET
1
20
VCC
Q0
2
19
Q7
D0
3
18
D7
D1
4
17
D6
Q1
5
16
Q6
Q2
6
15
Q5
D2
7
14
D5
D3
8
13
D4
Q5
Q3
9
12
Q4
Q6
GND
10
11
CLOCK
LOGIC DIAGRAM
D0
D1
D2
D3
DATA
INPUTS
D4
D5
D6
D7
CLOCK
RESET
3
2
4
5
7
6
8
9
13
12
14
17
15
16
18
19
11
1
Q0
Q1
Q2
Q3
Q4
NONINVERTING
OUTPUTS
Q7
FUNCTION TABLE
Inputs
PIN 20 = VCC
PIN 10 = GND
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ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
Design Criteria
Value
Units
Internal Gate Count*
66
ea
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
mW
.0075
pJ
Speed Power Product
Output
Reset
Clock
D
Q
L
H
H
H
H
X
X
H
L
X
X
L
H
L
No Change
No Change
L
*Equivalent to a two−input NAND gate.
ORDERING INFORMATION
Package
Shipping†
PDIP−20
(Pb−Free)
18 Units / Rail
MC74HC273ADWG
SOIC−20 WIDE
(Pb−Free)
38 Units / Rail
MC74HC273ADWR2G
SOIC−20 WIDE
(Pb−Free)
1000 Tape & Reel
Device
MC74HC273ANG
MC74HC273ADTG
TSSOP−20*
75 Units / Rail
MC74HC273ADTR2G
TSSOP−20*
2500 Tape & Reel
MC74HC273AFG
SOEIAJ−20
(Pb−Free)
40 Units / Rail
MC74HC273AFELG
SOEIAJ−20
(Pb−Free)
2000 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
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2
MC74HC273A
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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
– 0.5 to + 7.0
V
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
VCC
DC Supply Voltage (Referenced to GND)
Vin
Vout
Iin
DC Input Current, per Pin
± 20
mA
Iout
DC Output Current, per Pin
± 25
mA
ICC
DC Supply Current, VCC and GND Pins
± 50
mA
PD
Power Dissipation in Still Air,
750
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
°C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
Plastic DIP, SOIC or TSSOP Package
Plastic DIP†
SOIC Package†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
°C
260
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress
ratings only. Functional operation above the Recommended Operating Conditions is not implied.
Extended exposure to stresses above the Recommended Operating Conditions may affect device
reliability.
†Derating — Plastic DIP: – 10 mW/°C from 65° to 125°C
SOIC Package: – 7 mW/°C from 65° to 125°C
TSSOP Package: − 6.1 mW/°C from 65° to 125°C
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
Min
Max
Unit
2.0
6.0
V
0
VCC
V
– 55
+ 125
°C
0
0
0
1000
500
400
ns
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time
(Figure 1)
VCC = 2.0 V
VCC = 4.5 V
VCC = 6.0 V
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Test Conditions
VCC
V
– 55 to
25°C
Symbol
Parameter
v 85°C
v 125°C
Unit
VIH
Minimum High−Level Input Voltage
Vout = VCC – 0.1 V
|Iout| v 20 mA
2.0
3.0
4.5
6.0
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
V
VIL
Maximum Low−Level Input Voltage
Vout = 0.1 V
|Iout| v 20 mA
2.0
3.0
4.5
6.0
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
V
VOH
Minimum High−Level Output
Voltage
Vin = VIH
|Iout| v 20 mA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
3.0
4.5
6.0
2.48
3.98
5.48
2.34
3.84
5.34
2.2
3.7
5.2
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
3.0
4.5
6.0
0.26
0.26
0.26
0.33
0.33
0.33
0.4
0.4
0.4
Vin = VIH
VOL
Maximum Low−Level Output
Voltage
|Iout| v 2.4 mA
|Iout| v 6.0 mA
|Iout| v 7.8 mA
Vin = VIL
|Iout| v 20 mA
Vin = VIL
|Iout| v 2.4 mA
|Iout| v 6.0 mA
|Iout| v 7.8 mA
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3
V
MC74HC273A
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DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
VCC
V
– 55 to
25°C
v 85°C
v 125°C
Unit
Iin
Maximum Input Leakage Current
Vin = VCC or GND
6.0
± 0.1
± 1.0
± 1.0
mA
ICC
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND
Iout = 0 mA
6.0
4.0
40
160
mA
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
VCC
V
– 55 to
25°C
v 85°C
v 125°C
Unit
fmax
Maximum Clock Frequency (50% Duty Cycle)
(Figures 1 and 4)
2.0
3.0
4.5
6.0
6.0
15
30
35
5.0
10
24
28
4.0
8.0
20
24
MHz
tPLH
tPHL
Maximum Propagation Delay, Clock to Q
(Figures 1 and 4)
2.0
3.0
4.5
6.0
145
90
29
25
180
120
36
31
220
140
44
38
ns
tPHL
Maximum Propagation Delay, Reset to Q
(Figures 2 and 4)
2.0
3.0
4.5
6.0
145
90
29
25
180
120
36
31
220
140
44
38
ns
tTLH
tTHL
Maximum Output Transition Time, Any Output
(Figures 1 and 4)
2.0
3.0
4.5
6.0
75
27
15
13
95
32
19
16
110
36
22
19
ns
Cin
Maximum Input Capacitance
10
10
10
pF
Typical @ 25°C, VCC = 5.0 V
CPD
48
Power Dissipation Capacitance (Per Enabled Output)*
* Used to determine the no−load dynamic power consumption: P D = CPD VCC 2 f + ICC VCC .
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4
pF
MC74HC273A
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TIMING REQUIREMENTS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
Figure
VCC
Volts
– 55 to 25°C
Min
Max
v 85°C
Min
Max
v 125°C
Min
Max
Unit
tsu
Minimum Setup Time, Data to Clock
3
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
32
18
15
ns
th
Minimum Hold Time, Clock to Data
3
2.0
3.0
4.5
6.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
ns
trec
Minimum Recovery Time, Reset Inactive to
Clock
2
2.0
3.0
4.5
6.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
ns
tw
Minimum Pulse Width, Clock
1
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
32
18
15
ns
tw
Minimum Pulse Width, Reset
2
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
32
18
15
ns
Maximum Input Rise and Fall Times
1
2.0
3.0
4.5
6.0
tr, tf
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5
1000
800
500
400
1000
800
500
400
1000
800
500
400
ns
MC74HC273A
SWITCHING WAVEFORMS
CLOCK
tw
tf
tr
VCC
90%
50%
10%
tw
GND
GND
1/fmax
tPHL
50%
Q
tPHL
tPLH
Q
VCC
50%
RESET
trec
90%
50%
10%
VCC
CLOCK
tTLH
50%
GND
tTHL
Figure 1.
Figure 2.
VALID
VCC
DATA
50%
GND
tsu
th
VCC
CLOCK
50%
C
GND
D0
Figure 3.
3
DR
C
D1
4
DR
C
D2
7
DR
C
TEST POINT
DATA
INPUTS
OUTPUT
DEVICE
UNDER
TEST
D3
8
DR
C
D4
13
DR
C
CL*
D5
14
DR
C
D6
*Includes all probe and jig capacitance
Figure 4. Test Circuit
D7
17
18
DR
C
DR
Q
Q
Q
Q
2
5
6
9
Q0
Q1
Q2
Q3
NONINVERTING
OUTPUTS
Q
Q
Q
Q
12
15
16
19
Q4
Q5
Q6
Q7
11
1
Figure 5. Expanded Logic Diagram
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6
MC74HC273A
PACKAGE DIMENSIONS
PDIP−20
N SUFFIX
PLASTIC DIP PACKAGE
CASE 738−03
ISSUE E
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD
FLASH.
−A−
20
11
1
10
B
L
C
−T−
K
SEATING
PLANE
M
N
E
G
F
J
D
20 PL
20 PL
0.25 (0.010)
0.25 (0.010)
M
T A
M
T B
M
DIM
A
B
C
D
E
F
G
J
K
L
M
N
INCHES
MIN
MAX
1.010
1.070
0.240
0.260
0.150
0.180
0.015
0.022
0.050 BSC
0.050
0.070
0.100 BSC
0.008
0.015
0.110
0.140
0.300 BSC
0_
15 _
0.020
0.040
MILLIMETERS
MIN
MAX
25.66
27.17
6.10
6.60
3.81
4.57
0.39
0.55
1.27 BSC
1.27
1.77
2.54 BSC
0.21
0.38
2.80
3.55
7.62 BSC
0_
15_
0.51
1.01
M
SOIC−20
DW SUFFIX
CASE 751D−05
ISSUE G
A
20
11
X 45 _
E
h
1
10
20X
B
B
0.25
M
T A
S
B
S
A
L
H
M
10X
0.25
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
q
B
M
D
18X
e
A1
SEATING
PLANE
C
T
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7
DIM
A
A1
B
C
D
E
e
H
h
L
q
MILLIMETERS
MIN
MAX
2.35
2.65
0.10
0.25
0.35
0.49
0.23
0.32
12.65
12.95
7.40
7.60
1.27 BSC
10.05
10.55
0.25
0.75
0.50
0.90
0_
7_
MC74HC273A
PACKAGE DIMENSIONS
TSSOP−20
DT SUFFIX
CASE 948E−02
ISSUE C
20X
0.15 (0.006) T U
2X
L
K REF
0.10 (0.004)
S
L/2
20
M
T U
S
V
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
K
K1
S
J J1
11
B
−U−
PIN 1
IDENT
1
SECTION N−N
0.25 (0.010)
N
10
M
0.15 (0.006) T U
S
N
A
−V−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. MOLD FLASH OR GATE BURRS
SHALL NOT EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
F
DETAIL E
−W−
C
G
D
H
DETAIL E
0.100 (0.004)
−T− SEATING
PLANE
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
SOLDERING FOOTPRINT
7.06
1
0.65
PITCH
16X
0.36
16X
1.26
DIMENSIONS: MILLIMETERS
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8
MILLIMETERS
MIN
MAX
6.40
6.60
4.30
4.50
--1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.27
0.37
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.252
0.260
0.169
0.177
--0.047
0.002
0.006
0.020
0.030
0.026 BSC
0.011
0.015
0.004
0.008
0.004
0.006
0.007
0.012
0.007
0.010
0.252 BSC
0_
8_
MC74HC273A
PACKAGE DIMENSIONS
SOEIAJ−20
F SUFFIX
CASE 967−01
ISSUE A
20
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE
MOLD FLASH OR PROTRUSIONS AND ARE
MEASURED AT THE PARTING LINE. MOLD FLASH
OR PROTRUSIONS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
LE
11
Q1
E HE
1
M_
L
10
DETAIL P
Z
D
e
VIEW P
A
A1
b
0.13 (0.005)
c
M
0.10 (0.004)
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
MILLIMETERS
MIN
MAX
--2.05
0.05
0.20
0.35
0.50
0.15
0.25
12.35
12.80
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 _
0_
0.70
0.90
--0.81
INCHES
MIN
MAX
--0.081
0.002
0.008
0.014
0.020
0.006
0.010
0.486
0.504
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
10 _
0_
0.028
0.035
--0.032
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MC74HC273A/D