DATASHEET Low-Noise 24-bit Delta Sigma ADC ISL26132, ISL26134 Features The ISL26132 and ISL26134 are complete analog front ends for high resolution measurement applications. These 24-bit Delta-Sigma Analog-to-Digital Converters include a very low-noise amplifier and are available as either two or four differential multiplexer inputs. The devices offer the same pinout as the ADS1232 and ADS1234 devices and are functionally compatible with these devices. The ISL26132 and ISL26134 offer improved noise performance at 10Sps and 80Sps conversion rates. • Up to 21.6 Noise-free bits The on-chip low-noise programmable-gain amplifier provides gains of 1x/2x/64x/128x. The 128x gain setting provides an input range of ±9.766mVFS when using a 2.5V reference. The high input impedance allows direct connection of sensors, such as load cell bridges to ensure the specified measurement accuracy without additional circuitry. The inputs accept signals 100mV outside the supply rails when the device is set for unity gain. • On-chip temperature sensor (ISL26132) • Low noise amplifier with gains of 1x/2x/64x/128x • RMS noise: 10.6nV @ 10Sps (PGA = 128x) • Linearity error: 0.0002% FS • Simultaneous rejection of 50Hz and 60Hz (@ 10Sps) • Two (ISL26132) or four (ISL26134) channel differential input multiplexer • Automatic clock source detection • Simple interface to read conversions • +5V Analog, +5 to +2.7V digital supplies • Pb-Free (RoHS compliant) • TSSOP packages: ISL26132, 24 pin; ISL26134, 28 pin Applications The Delta-Sigma ADC features a third order modulator providing up to 21.6-bit noise-free performance. The device can be operated from an external clock source, crystal (4.9152MHz typical), or the on-chip oscillator. • Weigh scales • Temperature monitors and controls • Industrial process control The two channel ISL26132 is available in a 24 Ld TSSOP package and the four channel ISL26134 is available in a 28 Ld TSSOP package. Both are specified for operation over the automotive temperature range (-40°C to +105°C). • Pressure sensors CAP AVDD DVDD INTERNAL CLOCK EXTERNAL OSCILLATOR XTALIN/CLOCK XTALOUT AIN1+ AIN1AIN2+ AIN2- ISL26134 Only AIN3+ AIN3- SDO/RDY PGA 1x/2x/64x/ 128x INPUT MULTIPLEXER ADC SCLK AIN4+ AIN4PWDN SPEED A0 A1/TEMP AGND GAIN0 GAIN1 CAP DGND VREF+ VREF- DGND DGND NOTE for A1/TEMP pin: Functions as A1 on ISL26134; Functions as TEMP on ISL26132 FIGURE 1. BLOCK DIAGRAM November 20, 2014 FN6954.3 1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2011, 2012, 2014. All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. ISL26132, ISL26134 Ordering Information PART NUMBER (Notes 2, 3) PART MARKING TEMPERATURE RANGE (°C) PACKAGE (Pb-free) PKG. DWG. # ISL26132AVZ 26132 AVZ -40 to +105 24 Ld TSSOP M24.173 ISL26132AVZ-T (Note 1) 26132 AVZ -40 to +105 24 Ld TSSOP (Tape & Reel) M24.173 ISL26132AVZ-T7A (Note 1) 26132 AVZ -40 to +105 24 Ld TSSOP (Tape & Reel) M24.173 ISL26134AVZ 26134 AVZ -40 to +105 28 Ld TSSOP ISL26134AVZ-T (Note 1) 26134 AVZ -40 to +105 28 Ld TSSOP (Tape & Reel) M28.173 ISL26134AVZ-T7A (Note 1) 26134 AVZ -40 to +105 28 Ld TSSOP (Tape & Reel) M28.173 ISL26134AV28EV1Z Evaluation Board M28.173 NOTES: 1. Please refer to TB347 for details on reel specifications. 2. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020. 3. For Moisture Sensitivity Level (MSL), please see device information page for ISL26132, ISL26134. For more information on MSL please see techbrief TB363. TABLE 1. KEY DIFFERENCES OF PARTS PART NUMBER NUMBER OF CHANNELS ON-CHIP TEMPERATURE SENSOR NUMBER OF PINS ISL26132 2 YES 24 ISL26134 4 NO 28 Pin Configurations ISL26134 (28 LD TSSOP) TOP VIEW ISL26132 (24 LD TSSOP) TOP VIEW DVDD 1 24 SDO/RDY DGND 2 23 SCLK XTALIN/CLOCK 3 22 PDWN XTALOUT 4 21 SPEED DGND 5 20 GAIN1 DGND 5 24 GAIN1 DGND 6 19 GAIN0 DGND 6 23 GAIN0 TEMP 7 18 AVDD A1 7 22 AVDD A0 8 17 AGND A0 8 21 AGND CAP 9 16 VREF+ CAP 9 20 VREF+ CAP 10 15 VREF- CAP 10 19 VREF- AIN1+ 11 14 AIN2+ AIN1+ 11 18 AIN2+ AIN1- 12 13 AIN2- AIN1- 12 17 AIN2- AIN3+ 13 16 AIN4+ AIN3- 14 15 AIN4- Submit Document Feedback 2 DVDD 1 28 SDO/RDY DGND 2 27 SCLK XTALIN/CLOCK 3 26 PDWN 4 25 SPEED XTALOUT FN6954.3 November 20, 2014 ISL26132, ISL26134 Pin Descriptions PIN NUMBER NAME ISL26132 ISL26134 ANALOG/DIGITAL INPUT/OUTPUT DVDD 1 1 Digital Digital Power Supply (2.7V to 5.25V) Digital Ground DGND 2, 5, 6 2, 5, 6 Digital XTALIN/CLOCK 3 3 Digital/Digital Input XTALOUT 4 4 Digital TEMP 7 - Digital Input A1 A0 8 7 8 Digital Input DESCRIPTION External Clock Input: typically 4.9152MHz. Tie low to activate internal oscillator. Can also use external crystal across XTALIN/CLOCK and XTALOUT pins. External Crystal connection On-chip Temperature Diode Enable TABLE 2. INPUT MULTIPLEXER SELECT ISL26134 ISL26132 A1 A0 CHANNEL 0 0 AIN1 0 1 AIN2 1 0 AIN3 1 1 AIN4 CAP 9, 10 9, 10 Analog AIN1+ 11 11 Analog Input Positive Analog Input Channel 1 AIN1- 12 12 Analog Input Negative Analog Input Channel 1 AIN3+ - 13 Analog Input Positive Analog Input Channel 3 AIN3- - 14 Analog Input Negative Analog Input Channel 3 AIN4- - 15 Analog Input Negative Analog Input Channel 4 AIN4+ - 16 Analog Input Positive Analog Input Channel 4 AIN2- 13 17 Analog Input Negative Analog Input Channel 2 AIN2+ 14 18 Analog Input Positive Analog Input Channel 2 VREF- 15 19 Analog Input Negative Reference Input VREF+ 16 20 Analog Input Positive Reference Input AGND 17 21 Analog Analog Ground AVDD 18 22 Analog Analog Power Supply 4.75V to 5.25V GAIN0 GAIN1 19 20 23 24 Digital Input Submit Document Feedback 3 PGA Filter Capacitor TABLE 3. GAIN SELECT GAIN1 GAIN0 GAIN 0 0 1 0 1 2 1 0 64 1 1 128 FN6954.3 November 20, 2014 ISL26132, ISL26134 Pin Descriptions (Continued) PIN NUMBER NAME ISL26132 ISL26134 ANALOG/DIGITAL INPUT/OUTPUT SPEED 21 25 Digital Input DESCRIPTION TABLE 4. DATA RATE SELECT SPEED DATA RATE 0 10Sps 1 80Sps PDWN 22 26 Digital Input Power-Down: Holding this pin low powers down the entire converter and resets the ADC. SCLK 23 27 Digital Input Serial Clock: Clock out data on the rising edge. Also used to initiate Offset Calibration and Sleep modes. See “Serial Clock Input (SCLK)” on page 14 for more details. SDO/RDY 24 28 Digital Output Dual-Purpose Output: Data Ready: Indicate valid data by going low. Data Output: Outputs data, MSB first, on the first rising edge of SCLK. Circuit Description The ISL26132 (2-channel) and ISL26134 (4-channel) devices are very low noise 24-bit delta-sigma ADCs that include a programmable gain amplifier and an input multiplexer. The ISL26132 offers an on-chip temperature measurement capability. The ISL26132, ISL26134 provide pin compatibility and output data compatibility with the ADS1232/ADS1234, and offer the same conversion rates of 10Sps and 80Sps. All the features of the ISL26132, ISL26134 are pin-controllable, while offset calibration, standby mode, and output conversion data are accessible through a simple 2-wire interface. The clock can be selected to come from an internal oscillator, an external clock signal, or crystal (4.9152MHz typical). Submit Document Feedback 4 FN6954.3 November 20, 2014 ISL26132, ISL26134 Absolute Maximum Ratings Thermal Information AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to +0.3V Analog In to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3 to AVDD+0.3V Digital In to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3 to DVDD+0.3V Input Current Momentary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100mA Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mA ESD Rating Human Body Model (Per MIL-STD-883 Method 3015.7) . . . . . . . . . . . . .7.5kV Machine Model (Per JESD22-A115). . . . . . . . . . . . . . . . . . . . . . . . . . 450V Charged Device Model (Per JESD22-C101) . . . . . . . . . . . . . . . . . . . . . . . . 2kV Latch-up (Per JEDEC JESD-78C; Class 2, Level A) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100mA @ Room and Hot (+105°C) Thermal Resistance (Typical) JA (°C/W) JC (°C/W) 24 Ld TSSOP (Notes 4, 5) . . . . . . . . . . . . . . 65 18 28 Ld TSSOP (Notes 4, 5) . . . . . . . . . . . . . . 63 18 Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80mW Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . .+150°C Maximum Storage Temperature Range . . . . . . . . . . . . . .-65°C to +150°C Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see link below http://www.intersil.com/pbfree/Pb-FreeReflow.asp Operating Conditions Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-40°C to +105°C AVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.75V to 5.25V DVDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.7V to 5.25V CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and result in failures not covered by warranty. NOTES: 4. JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details. 5. For JC, the “case temp” location is taken at the package top center. Electrical Specifications VREF+ = 5V, VREF- = 0V, AVDD = 5V, DVDD = 5V, AGND = DGND = 0V, MCLK = 4.9152MHz, and TA = -40°C to +105°C, unless otherwise specified. Boldface limits apply over the operating temperature range, -40°C to +105°C SYMBOL PARAMETER TEST LEVEL or NOTES MIN (Note 6) TYP MAX (Note 6) UNITS ANALOG INPUTS Differential Input Voltage Range Common Mode Input Voltage Range Differential Input Current ±0.5VREF/ Gain V Gain = 1, 2 AGND - 0.1 AVDD + 0.1 V Gain = 64, 128 AGND+1.5 AVDD - 1.5 V Gain = 1 ±20 nA Gain = 2 ±40 nA Gain = 64, 128 ±1 nA 80 SPS SYSTEM PERFORMANCE Resolution No Missing Codes Internal Osc. SPEED = High Data Rate Digital Filter Settling Time INL Integral Nonlinearity Input Offset Error Input Offset Drift Gain Error (Note 8) Gain Drift Submit Document Feedback 5 24 Bits Internal Osc. SPEED = Low 10 SPS External Osc. SPEED = High fCLK/61440 SPS External Osc. SPEED = Low fCLK/491520 SPS 4 Conversions Full Setting Differential Input Gain = 1, 2 ±0.0002 Differential Input Gain = 64, 128 ±0.0004 ±0.001 % of FSR (Note 7) % of FSR (Note 7) Gain = 1 ±0.4 ppm of FS Gain = 128 ±1.5 ppm of FS Gain = 1 0.3 µV/°C Gain = 128 10 nV/°C Gain = 1 ±0.007 Gain = 128 ±0.02 ±0.02 % % Gain = 1 0.5 ppm/°C Gain = 64 3.5 ppm/°C Gain = 128 3.5 ppm/°C FN6954.3 November 20, 2014 ISL26132, ISL26134 Electrical Specifications VREF+ = 5V, VREF- = 0V, AVDD = 5V, DVDD = 5V, AGND = DGND = 0V, MCLK = 4.9152MHz, and TA = -40°C to +105°C, unless otherwise specified. Boldface limits apply over the operating temperature range, -40°C to +105°C (Continued) SYMBOL CMRR PSRR PARAMETER TEST LEVEL or NOTES MIN (Note 6) TYP 85 100 MAX (Note 6) UNITS Common Mode Rejection AtDC, Gain = 1, V = 1V At DC, Gain = 128, V = 0.1V 100 dB 50Hz/60Hz Rejection (Note 9) External 4.9152MHz Clock 130 dB Power Supply Rejection dB At DC, Gain = 1, V = 1V 82 100 dB At DC, Gain = 128, V = 0.1V 100 105 dB 1.5 AVDD Input Referred Noise See “Typical Characteristics” beginning on page 8 Noise Free Bits See “Typical Characteristics” beginning on page 8 VOLTAGE REFERENCE INPUT VREF Voltage Reference Input VREF- Negative Reference Input VREF+ Positive Reference Input IREF VREF = VREF+ - VREF- AVDD + 0.1 V AGND - 0.1 VREF+ - 1.5 V VREF- + 1.5 AVDD + 0.1 V Voltage Reference Input Current ±350 nA POWER SUPPLY REQUIREMENTS AVDD Analog Supply Voltage 4.75 5.0 5.25 V DVDD Digital Supply Voltage 2.7 3.3 5.25 V AIDD Analog Supply Current Normal Mode, AVDD = 5, Gain = 1, 2 7 8.5 mA Normal Mode, AVDD = 5, Gain = 64, 128 9 12 mA DIDD Digital Supply Current Standby Mode 0.2 3 µA Power-Down 0.2 2.5 µA Normal Mode, AVDD = 5, Gain = 1, 2 750 950 µA Normal Mode, AVDD = 5, Gain = 64, 128 750 950 µA Standby Mode 1.5 26 µA 1 26 µA 49.6 mW 68 mW Power-Down PD Power Dissipation, Total Normal Mode, AVDD = 5, Gain = 1, 2 Normal Mode, AVDD = 5, Gain = 64, 128 Standby Mode 0.14 mW Power-Down 0.14 mW DIGITAL INPUTS VIH 0.7 DVDD V 0.2 DVDD VIL VOH IOH = -1mA DVDD - 0.4 V IOL = 1mA VOL 0.2 DVDD V ±10 µA Input Leakage Current External Clock Input Frequency Serial Clock Input Frequency 0.3 V 4.9152 MHz 1 MHz NOTES: 6. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design. 7. FSR = Full Scale Range = VREF/Gain 8. Gain accuracy is calibrated at the factory (AVDD = +5V). 9. Specified for word rate equal to 10Sps. Submit Document Feedback 6 FN6954.3 November 20, 2014 ISL26132, ISL26134 Noise Performance The ISL26132 and ISL26134 provide excellent noise performance. The noise performance on each of the gain settings of the PGA at the selected word rates is shown in Tables 5 and 6. Resolution in bits decreases by 1-bit if the ADC is operated as a single-ended input device. Noise measurements are input-referred, taken with bipolar inputs under the specified operating conditions, with fCLK = 4.9152MHz. TABLE 5. AVDD = 5V, VREF = 5V, DATA RATE = 10Sps GAIN RMS NOISE (nV) PEAK-TO-PEAK NOISE (nV) (Note 10) NOISE-FREE BITS (Note 11) 1 243 1604 21.6 2 148 977 21.3 64 11.3 75 20 128 10.6 70 19 TABLE 6. AVDD = 5V, VREF = 5V, DATA RATE = 80Sps GAIN RMS NOISE (nV) PEAK-TO-PEAK NOISE (nV) (Note 10) NOISE-FREE BITS (Note 11) 1 565 3730 20.4 2 285 1880 20.3 64 29.5 194.8 18.6 128 28.2 186.1 17.6 NOTES: 10. The peak-to-peak noise number is 6.6 times the rms value. This encompasses 99.99% of the noise excursions that may occur. This value best represents the worst case noise that could occur in the output conversion words from the converter. 11. Noise-Free Bits is defined as: Noise-Free Bits = ln(FSR/peak-to-peak noise)/ln(2) where FSR is the full scale range of the converter, VREF/Gain. Submit Document Feedback 7 FN6954.3 November 20, 2014 ISL26132, ISL26134 Typical Characteristics 300 10 GAIN = 1, N = 1024 GAIN = 1 RATE = 10Sps RATE = 10Sps 250 STD DEV = 1.635 LSB VREF = 2.5V 200 COUNTS OUTPUT CODE (LSB) 5 0 150 100 -5 50 -10 0 200 400 600 800 0 1000 -7 -6 -5 -4 FIGURE 2. NOISE AT GAIN = 1, 10Sps 10 -2 -1 0 1 2 3 4 5 6 7 FIGURE 3. NOISE HISTOGRAM AT GAIN = 1, 10Sps 250 GAIN = 2 RATE = 10Sps GAIN = 2, N = 1024 RATE = 10Sps STD DEV = 1.989 LSB VREF = 2.5V 200 COUNTS 5 OUTPUT CODE (LSB) -3 OUTPUT CODE (LSB) TIME (SAMPLES) 0 150 100 -5 50 -10 0 200 400 600 TIME (SAMPLES) 800 0 1000 FIGURE 4. NOISE AT GAIN = 2, 10Sps 120 GAIN = 64 RATE = 10Sps 15 -6 -4 -2 0 2 OUTPUT CODE (LSB) 4 6 8 FIGURE 5. NOISE HISTOGRAM AT GAIN = 2, 10Sps 20 100 10 GAIN = 64, N = 1024 RATE = 10Sps STD DEV = 4.627 LSB VREF = 2.5V 80 5 COUNTS OUTPUT CODE (LSB) -8 0 60 40 -5 20 -10 -15 0 200 400 600 800 TIME (SAMPLES) FIGURE 6. NOISE AT GAIN = 64, 10Sps Submit Document Feedback 8 1000 0 -20 -15 -10 -5 0 5 OUTPUT CODE (LSB) 10 15 20 FIGURE 7. NOISE HISTOGRAM AT GAIN = 64, 10Sps FN6954.3 November 20, 2014 ISL26132, ISL26134 Typical Characteristics (Continued) 50 60 GAIN = 128 RATE = 10Sps GAIN = 128, N = 1024 RATE = 10Sps 50 30 STD DEV = 8.757 LSB 40 10 COUNTS OUTPUT CODE (LSB) VREF = 2.5V -10 30 20 -30 -50 10 0 200 400 600 800 0 1000 -30 -25 -20 -15 -10 TIME (SAMPLES) FIGURE 8. NOISE AT GAIN = 128, 10Sps 0 5 10 15 20 25 30 FIGURE 9. NOISE HISTOGRAM AT GAIN = 128, 10Sps 25 120 GAIN = 1 RATE = 80Sps 20 -5 OUTPUT CODE (LSB) GAIN = 1, N = 1024 RATE = 80Sps 100 STD DEV = 3.791 LSB 15 80 5 COUNTS OUTPUT CODE (LSB) VREF = 2.5V 10 0 -5 60 40 -10 -15 20 -20 -25 0 200 400 600 800 0 -15 1000 -10 0 5 10 15 FIGURE 11. NOISE HISTOGRAM AT GAIN = 1, 80Sps FIGURE 10. NOISE AT GAIN = 1, 80Sps 120 25 GAIN = 2 RATE = 80Sps GAIN = 2, N = 1024 RATE = 80Sps 100 15 STD DEV = 3.831 LSB VREF = 2.5V 80 5 COUNTS OUTPUT CODE (LSB) -5 OUTPUT CODE (LSB) TIME (SAMPLES) -5 60 40 -15 -25 20 0 200 400 600 TIME (SAMPLES) 800 FIGURE 12. NOISE AT GAIN = 2, 80Sps Submit Document Feedback 9 1000 0 -15 -10 -5 0 5 OUTPUT CODE (LSB) 10 15 FIGURE 13. NOISE HISTOGRAM AT GAIN = 2, 80Sps FN6954.3 November 20, 2014 ISL26132, ISL26134 Typical Characteristics (Continued) 100 50 GAIN = 64, N = 1024 GAIN = 64 RATE = 80Sps RATE = 80Sps COUNTS OUTPUT CODE (LSB) STD DEV = 12.15 LSB 40 50 0 VREF = 2.5V 30 20 -50 10 -100 0 200 400 600 800 0 -40 -35 -30 -25 -20 -15 -10 -5 1000 FIGURE 14. NOISE AT GAIN = 64, 80Sps 30 GAIN = 128 RATE = 80Sps GAIN = 128, N = 1024 RATE = 80Sps 25 80 OUTPUT CODE (LSB) 5 10 15 20 25 30 35 40 FIGURE 15. NOISE HISTOGRAM AT GAIN = 64, 80Sps 160 120 0 OUTPUT CODE (LSB) TIME (SAMPLES) STD DEV = 23.215 LSB VREF = 2.5V 40 COUNTS 20 0 -40 -80 15 10 -120 5 -160 -200 0 200 400 600 TIME (SAMPLES) 800 0 -80 1000 FIGURE 16. NOISE AT GAIN = 128, 80Sps -40 -20 0 20 OUTPUT CODE (LSB) 40 60 80 FIGURE 17. NOISE HISTOGRAM AT GAIN = 128, 80Sps 10000 10 8 NORMAL MODE, PGA = 64.128 1000 CURRENT (µA) CURRENT (mA) -60 6 NORMAL MODE, PGA = 1, 2 4 NORMAL MODE, ALL PGA GAINS 100 10 2 0 -40 -10 20 50 80 TEMPERATURE (°C) FIGURE 18. ANALOG CURRENT vs TEMPERATURE Submit Document Feedback 10 110 POWERDOWN MODE 1 -40 -10 20 50 80 110 TEMPERATURE (°C) FIGURE 19. DIGITAL CURRENT vs TEMPERATURE FN6954.3 November 20, 2014 ISL26132, ISL26134 Typical Characteristics (Continued) 10000 11.0 WORD RATE = 10Sps GAIN = 1, 80Sps 64k FFT 25 AVERAGES 10.8 NOISE (nV/√Hz) DATA RATE (Sps) 10.6 10.4 10.2 1000 100 10.0 9.8 9.6 -40 -10 20 50 TEMPERATURE (°C) 80 10 110 FIGURE 20. TYPICAL WORD RATE vs TEMPERATURE USING INTERNAL OSCILLATOR 0.01 0.1 1 FREQUENCY (Hz) 10 FIGURE 21. NOISE DENSITY vs FREQUENCY AT GAIN = 1, 80Sps 100 NOISE (nV/√Hz) GAIN = 128, 80Sps 64k FFT 25 AVERAGES 10 1 0.01 0.1 1 10 FREQUENCY (Hz) FIGURE 22. NOISE DENSITY vs FREQUENCY AT GAIN = 128, 80Sps Submit Document Feedback 11 FN6954.3 November 20, 2014 ISL26132, ISL26134 Functional Description Analog Inputs The analog signal inputs to the ISL26132 connect to a 2-Channel differential multiplexer and the ISL26134 connect to a 4-Channel differential multiplexer (Mux). The multiplexer connects a pair of inputs to the positive and negative inputs (AINx+, AINx-), selected by the Channel Select Pins A0 and A1 (ISL26134 only). Input channel selection is shown in Table 7. On the ISL26132, the TEMP pin is used to select the Temperature Sensor function. If the differential input exceeds well above the +VE or the -VE FS (by ~1.5x times) the output code will clip to the corresponding FS value. Under such conditions, the output data rate will become 1/4th of the original value as the Digital State Machine will RESET the Delta-Sigma Modulator and the Decimation Filter. Temperature Sensor (ISL26132 only) TABLE 7. INPUT CHANNEL SELECTION CHANNEL SELECT PINS The input span of the ADC is ±0.5 VREF/GAIN. For a 5V VREF and a gain of 1x, the input span will be 5VP-P fully differential as shown in Figure 23. Note that input voltages that exceed the supply rails by more than 100mV will turn on the ESD protection diodes and degrade measurement accuracy. ANALOG INPUT PINS SELECTED A1 A0 AIN+ AIN- 0 0 AIN1+ AIN1- 0 1 AIN2+ AIN2- When the TEMP pin of the ISL26132 is set High, the input multiplexer is connected to a pair of diodes, which are scaled in both size and current. The voltage difference measured between them corresponds to the temperature of the die according to Equation 1: 1 0 AIN3+ AIN3- V = 102.2mV + (379V T C ) Gain 1 1 AIN4+ AIN4- (EQ. 1) Note: Valid only for GAIN = 1x or 2x Whenever the MUX channel is changed (i.e. if any one of the following inputs - A0/A1, Gain1/0, SPEED is changed), the digital logic will automatically restart the digital filter and will cause SDO/RDY to go low only when the output is fully settled. But if the input itself is suddenly changed, then the user needs to ignore the first four RDY pulses (going low) to get an accurate measurement of the input signal. 1.25V Where T is the temperature of the die, and Gain = the PGA Gain Setting. At a temperature of +25°C, the measured voltage will be approximately 111.7mV. Note that this measurement indicates only the temperature of the die itself. Applying the result to correct for the temperature drift of a device external to the package requires that thermal coupling between the sensor and the die be taken into account. Low-Noise Programmable Gain Amplifier (PGA) 3.75 2.50 AIN+ 1.25 INPUT VOLTAGE RANGE = ±0.5VREF/GAIN VREF = 5V, GAIN = 1X 3.75 2.50 AIN- The chopper-stabilized programmable gain amplifier features a variety of gain settings to achieve maximum dynamic range and measurement accuracy from popular sensor types with excellent low noise performance, input offset error, and low drift, and with minimal external parts count. The GAIN0 and GAIN1 pins allow the user to select gain settings of 1x, 2x, 64x, or 128x. A block diagram is shown in Figure 24. The differential input stage provides a gain of 64, which is bypassed when the lower gain settings are selected. The lower gain settings (1 and 2) will accept inputs with common mode voltages up to 100mV outside the rails, allowing the device to accept ground-referred signals. At gain settings of 64 or 128 the common mode voltage at the inputs is limited to 1.5V inside the supply rails while maintaining specified measurement accuracy. 1.25 2.50V FIGURE 23. DIFFERENTIAL INPUT FOR VREF = 5V, GAIN = 1X Submit Document Feedback 12 FN6954.3 November 20, 2014 ISL26132, ISL26134 CAP AINx+ + RINT A1 RF1 R1 ADC RF2 A2 AINx- RINT + CAP FIGURE 24. SIMPLIFIED PROGRAMMABLE GAIN AMPLIFIER BLOCK DIAGRAM Filtering PGA Output Noise The programmable gain amplifier, as shown in Figure 24, includes a passive RC filter on its output. The resistors are located inside the chip on the outputs of the differential amplifier stages. The capacitor (nominally a 100nF C0G ceramic or a PPS film (Polyphenylene sulfide)) for the filter is connected to the two CAP pins of the chip. The outputs of the differential amplifier stages of the PGA are filtered before their signals are presented to the delta-sigma modulator. This filter reduces the amount of noise by limiting the signal bandwidth and filters the chopping artifacts of the chopped PGA stage. If the ADC is to be operated from a crystal, it should be located close to the package pins of the ADC. Note that external loading capacitors for the crystal are not required as there are loading capacitors built into the silicon, although the capacitor values are optimized for operation with a 4.9152MHz crystal. The XTALOUT pin is not intended to drive external circuits. XTALIN/ CLOCK CRYSTAL OSCILLATOR CLOCK DETECT Voltage Reference Inputs (VREF+, VREF-) The voltage reference for the ADC is derived from the difference in the voltages presented to the VREF+ and VREF- pins; VREF = (VREF+ - VREF-). The ADCs are specified with a voltage reference value of 5V, but a voltage reference as low as 1.5V can be used. For proper operation, the voltage on the VREF+ pin should not be greater than AVDD + 0.1V and the voltage on the VREF- pin should not be more negative than AGND - 0.1V. INTERNAL EN OSCILLATOR XTALOUT MUX TO ADC FIGURE 25. CLOCK BLOCK DIAGRAM Clock Sources Digital Filter Characteristics The ISL26132, ISL26134 can operate from an internal oscillator, an external clock source, or from a crystal connected between the XTALIN/CLOCK and XTALOUT pins. See the block diagram of the clock system in Figure 25. When the ADC is powered up, the CLOCK DETECT block determines if an external clock source is present. If a clock greater than 300kHz is present on the XTALIN/CLOCK pin, the circuitry will disable the internal oscillator on the chip and use the external clock as the clock to drive the chip circuitry. If the ADC is to be operated from the internal oscillator, the XTALIN/CLOCK pin should be grounded. The digital filter inside the ADC is a fourth-order Sinc filter. Figures 26 and 27 on page 14 on illustrate the filter response for the ADC when it is operated from a 4.9152MHz crystal. The internal oscillator is factory trimmed so the frequency response for the filter will be much the same when using the internal oscillator. The figures illustrate that when the converter is operated at 10Sps the digital filter provides excellent rejection of 50Hz and 60Hz line interference. Submit Document Feedback 13 FN6954.3 November 20, 2014 ISL26132, ISL26134 Serial Clock Input (SCLK) 0 The serial clock input is provided with hysteresis to minimize false triggering. Nevertheless, care should be taken to ensure reliable clocking. DATA RATE = 10 10Sps SPS -50 GAIN (dB) Filter Settling Time and ADC Latency Whenever the analog signal into the ISL26132, ISL26134 converters is changed, the effects of the digital filter must be taken into account. The filter takes four data ready periods for the output code to fully reflect a new value at the analog input. If the multiplexer control input is changed, the modulator and the digital filter are reset, and the device uses four data ready periods to fully settle to yield a digital code that accurately represents the analog input. Therefore, from the time the control inputs for the multiplexer are changed until the SDO/RDY goes low, four data ready periods will elapse. The settling time delay after a multiplexer channel change is listed in Table 8 for the converter operating in continuous conversion mode. This is also shown pictorially in Figure 28 for a change in the MUX setting and Figure 29 for an abrupt change in the analog input VIN. -100 -150 0 10 20 30 40 50 60 70 FREQUENCY (Hz) 80 90 100 FIGURE 26. 10Sps: FREQUENCY RESPONSE OUT TO 100Hz -50 -60 DATA RATE = 10Sps -70 GAIN (dB) -80 -90 -100 -110 -120 -130 -140 -150 45 50 55 FREQUENCY (Hz) 65 60 FIGURE 27. 10Sps: 50/60Hz NOISE REJECTION, 45Hz TO 65Hz TABLE 8. SETTLING TIME DESCRIPTION (fCLK = 4.9152MHz) PARAMETER tS MIN MAX UNITS 40 50 µs SPEED = 1 54 55 ms SPEED = 0 404 405 ms A0, A1, SPEED, Gain1, Gain0 change set-up time t1 Settling time A0, A1, SPEED, Gain1, Gain0 t1 SDO/RDY tS FIGURE 28. SDO/RDY DELAY AFTER MULTIPLEXER CHANGE Submit Document Feedback 14 FN6954.3 November 20, 2014 ISL26132, ISL26134 Abrupt Change in External VIN VIN 1st conversion; includes unsettled VIN Start of conversion SDO/RDY 2nd conversion; VIN settled, Digital filter unsettled 3rd conversion; VIN settled, Digital filter unsettled 4th conversion; VIN settled, Digital filter unsettled 5th conversion; VIN and Digital, filter settled Conversion time FIGURE 29. SDO/RDY DELAY AFTER MULTIPLEXER CHANGE Conversion Data Rate Reading Conversion Data from the Serial Data Output/Ready SDO/RDY Pin The SPEED pin is used to select between the 10Sps and 80Sps conversion rates. The 10Sps rate (SPEED = Low) is preferred in applications requiring 50/60Hz noise rejection. Note that the sample rate is directly related to the oscillator frequency, as 491,520 clocks are required to perform a conversion at the 10Sps rate, and 61,440 clocks at the 80Sps rate. Output Data Format The 24-bit converter output word is delivered in two’s complement format. Input exceeding full scale results in a clipped output which will not return to in-range values until after the input signal has returned to the specified allowable voltage range and the digital filter has settled as discussed previously. TABLE 9. OUTPUT CODES CORRESPONDING TO INPUT INPUT SIGNAL OUTPUT CODE (HEX) +0.5VREF/GAIN 7FFFFF (+0.5VREF/GAIN)/(223 - 1) 000001 0 000000 (-0.5VREF/GAIN)/(223 - 1) FFFFFF -0.5VREF/GAIN 800000 When the ADC is powered, it will automatically begin doing conversions. The SDO/RDY signal will go low to indicate the completion of a conversion. After the SDO/RDY signal goes low, the MSB data bit of the conversion word will be output from the SDO/RDY pin after SCLK is transitioned from a low to a high. Each subsequent new data bit is also output on the rising edge of SCLK (see Figure 30). The receiving device should use the falling edge of SCLK to latch the data bits. After the 24th SCLK, the SDO/RDY output will remain in the state of the LSB data bit until a new conversion is completed. At this time, the SDO/RDY will go high if low and then go low to indicate that a new conversion word is available. If not all data bits are read from the SDO/RDY pin prior to the completion of a new conversion, they will be overwritten. SCLK should be low during time t6, as shown in Figure 30, when SDO/RDY is high. If the user wants the SDO/RDY signal to go high after reading the 24 bits of the conversion data word, a 25th SCLK can be issued. The 25th SCLK will force the SDO/RDY signal to go high and remain high until it falls to signal that a new conversion word is available. Figure 31 illustrates the behavior of the SDO/RDY signal when a 25th SCLK is used. DATA DATA READY NEW DATA READY MSB SDO/RDY 23 LSB 22 0 21 t5 t4 t2 SCLK t6 t3 24 1 t3 t7 FIGURE 30. OUTPUT DATA WAVEFORMS USING 24 SCLKS TO READ CONVERSION DATA Submit Document Feedback 15 FN6954.3 November 20, 2014 ISL26132, ISL26134 TABLE 10. INTERFACE TIMING CHARACTERISTICS PARAMETER DESCRIPTION MIN TYP MAX UNITS t2 SDO/RDY Low to first SLK 0 ns t3 SCLK pulsewidth, Low or High 100 ns t4 SCLK High to Data Valid t5 Data Hold after SCLK High 0 Register Update Time 39 t6 Conversion Period t7 50 ns ns µs SPEED = 1 12.5 ms SPEED = 0 100 ms DATA DATA READY NEW DATA READY SDO/RDY 23 22 21 0 25TH SCLK FORCES SCLK 24 1 SDO/RDY HIGH 25 FIGURE 31. OUTPUT DATA WAVEFORMS FOR SDO/RDY POLLING DATA READY AFTER CALIBRATION SDO/RDY 23 22 21 23 0 CALIBRATION BEGINS SCLK 1 24 25 26 t8 FIGURE 32. OFFSET CALIBRATION WAVEFORMS Offset Calibration Control The offset internal to the ADC can be removed by performing an offset calibration operation. Offset calibration can be initiated immediately after reading a conversion word with 24 SCLKs by issuing two additional SCLKs. The offset calibration operation will begin immediately after the 26th SCLK occurs. Figure 32 illustrates the timing details for the offset calibration operation. During offset calibration, the analog inputs are shorted internally and a regular conversion is performed. This conversion generates a conversion word that represents the offset error. This value is stored and used to digitally remove the offset error from future conversion words. The SDO/RDY output will fall to indicate the completion of the offset calibration operation. TABLE 11. SDO/RDY DELAY AFTER CALIBRATION PARAMETER t8 MIN MAX UNITS SPEED = 1 108 109 ms SPEED = 0 808 809 ms Standby Mode Operation The ADC can be put into standby mode to save power. Standby mode reduces the power to all circuits in the device except the Submit Document Feedback 16 crystal oscillator amplifier. To enter the standby mode, take the SCLK signal high and hold it high after SDO/RDY falls. The converter will remain in standby mode as long as SCLK is held high. To return to normal operation, take SCLK back low and wait for the SDO/RDY to fall to indicate that a new conversion has completed. Figure 33 and Table 12 illustrate the details of standby mode. Supply currents are equal in Standby and Power-down modes unless a Crystal is used. If the Crystal is used, the Crystal amplifier is turned ON, even in the standby mode. Performing Offset Calibration After Standby Mode To perform an offset calibration automatically upon returning from standby, deliver two or more additional SCLKs following a data read cycle, and then set and hold SCLK high. The device will remain in Standby as long as SCLK remains high. A calibration cycle will begin once SCLK is brought low again to resume normal operation. Additional time will be required to perform the calibration after returning from Standby. Figure 34 and Table 13 illustrate the details of performing offset calibration after standby mode. FN6954.3 November 20, 2014 ISL26132, ISL26134 STANDBY MODE 23 SDO/RDY 22 21 DATA READY 23 0 START CONVERSION SCLK 1 24 t9 t11 t10 FIGURE 33. STANDBY MODE WAVEFORMS TABLE 12. STANDBY MODE TIMING PARAMETER DESCRIPTION t9 SCLK High after SDO/RDY Low Standby Mode Delay t10 t11 SDO/RDY falling edge after SCLK Low MIN MAX UNITS SPEED = 1 0 12.44 ms SPEED = 0 0 99.94 SPEED = 1 12.5 ms SPEED = 0 100 ms SPEED = 1 50 60 ms SPEED = 0 400 410 ms ms TABLE 13. OFFSET CALIBRATION TIMING AFTER STANDY PARAMETER DESCRIPTION t12 SDO/RDY Low after SCLK Low MIN MAX UNITS SPEED = 1 108 113 ms SPEED = 0 808 813 ms STANDBY MODE SDO/RDY 23 SCLK 22 21 0 1 24 t10 DATA READY AFTER CALIBRATION BEGIN CALIBRATION 23 25 t12 FIGURE 34. OFFSET CALIBRATION WAVEFORMS AFTER STANDBY Submit Document Feedback 17 FN6954.3 November 20, 2014 ISL26132, ISL26134 Operation of PDWN AVDD PDWN must transition from low to high after both power supplies have settled to specified levels in order to initiate a correct power-up reset (Figure 35). This can be implemented by an external controller or a simple RC delay circuit, as shown in Figure 36. DVDD PDWN 10µs In order to reduce power consumption, the user can assert the Power-down mode by bringing PDWN Low as shown in Figure 37. All circuitry is shut down in this mode, including the Crystal Oscillator. After PDWN is brought High to resume operation, the reset delay varies depending on the clock source used. While an external clock source will resume operation immediately, a circuit utilizing a crystal will incur about a 20ms delay due to the inherent start-up time of this type of oscillator. FIGURE 35. POWER-DOWN TIMING RELATIVE TO SUPPLIES DVDD 1k CONNECT TO 2.2nF PDWN PIN FIGURE 36. PDWNDELAY CIRCUIT POWER-DOWN MODE CLK SOURCE WAKEUP START CONVERSION DATA READY t14 t14 PDWN SDO/RDY t13 t11 SCLK FIGURE 37. POWER-DOWN MODE WAVEFORMS TABLE 14. POWER-DOWN RECOVERY TIMING PARAMETER DESCRIPTION t13 Clock Recovery after PDWN High t14 Submit Document Feedback PDWN Pulse Duration 18 TYP UNITS Internal Oscillator 7.95 µs External Clock Source 0.16 µs 4.9152MHz Crystal Oscillator 5.6 ms 26 µs (min) FN6954.3 November 20, 2014 ISL26132, ISL26134 Application Information Application Examples Power-up Sequence – Initialization and Configuration WEIGH SCALE SYSTEM Figure 38 illustrates the ISL26132 connected to a load cell. The A/D converter is configured for a gain of 128x and a sample rate of 10Sps. If a load cell with 2mV/V sensitivity is used, the full scale output from the load cell will be 10mV. On a gain of 128x and sample rate of 10Sps, the converter noise is 67nVP-P. The converter will achieve 10mV/67nVP-P = 149,250 noise free counts across its 10mV input signal. This equates to 14,925 counts per millivolt of input signal. If five output words are averaged together this can be improved by √5 to yield √5*14925 counts = 33,370 counts per millivolt of input signal with an effective update rate of 2 readings per second. The sequence to properly power-up and initialize the device are as follows. For details on individual functions, refer to their descriptions. 1. AVDD, DVDD ramp to specified levels 2. Apply External Clock 3. Pull PDWN High to initiate Reset 4. Device begins conversion 5. SDO/RDY goes low at end of first conversion OPTIONAL ACTIONS • Perform Offset Calibration • Place device in Standby • Return device from Standby • Read on-chip Temperature (applicable to ISL26132 only) 5V 3V 0.1µF 18 AVDD 16 9 - + 1 DVDD GAIN1 VREF+ CAP GAIN0 SDO/RDY 0.1µF 10 CAP SCLK ISL26132 PDWN VDD 20 19 24 GAIN = 128 23 22 4 XTALOUT 11 AIN+1 12 AIN-1 3 14 XTALIN/CLOCK AIN+2 21 SPEED 13 AIN-2 A0 8 15 7 VREFTEMP AGND DGND 17 MICRO CONTROLLER GND 2, 5, 6 FIGURE 38. WEIGH SCALE APPLICATION Submit Document Feedback 19 FN6954.3 November 20, 2014 ISL26132, ISL26134 +5V +3V 0.1µF 0.1µF 5M 18 AVDD ISL21009 4.096V 16 1 DVDD GAIN1 VREF+ 10nF GAIN0 SDO/RDY SCLK 10k TYPE K PDWN 11 AIN+1 10k 12 1µF 14 XTALOUT AIN-1 AIN+2 XTALIN/CLOCK 13 AIN-2 5M 15 VREFAGND 17 20 19 24 22 4 3 SPEED 21 A0 8 TEMP DGND MICRO CONTROLLER 23 4.9152 MHz 7 2, 5, 6 FIGURE 39. THERMOCOUPLE MEASUREMENT APPLICATION THERMOCOUPLE MEASUREMENT Figure 39 illustrates the ISL26132 in a thermocouple application. The 4.096V reference combined with the PGA gain set to 128x sets the input span of the converter to ±16mV. This supports the K type thermocouple measurement for temperatures from -270°C at -6.485mV to +380°C at about 16mV. If a higher temperature is preferred, the PGA can be set to 64x to provide a converter span of ±32mV. This will allow the converter to support temperature measurement with the K type thermocouple up to about +765°C. Figure 39 shows that the thermocouple is referenced to a voltage dictated by the resistor divider from the +5V supply to ground. These set the common mode voltage at about 2.5V. The 5M resistors provide a means for detection of an open thermocouple. If the thermocouple fails to open or is not connected, the bias through the 5M resistors will cause the input to the PGA to go to full scale. PCB Board Layout and System Configuration The ISL26132, ISL26134 ADC is a very low noise converter. To achieve the full performance available from the device will require attention to the printed circuit layout of the circuit board. Care should be taken to have a full ground plane without impairments (traces running through it) directly under the chip on the back side of the circuit board. The analog input signals should be laid down adjacent (AIN+ and AIN- for each channel) to achieve good differential signal practice and routed away from any traces carrying active digital signals. The connections from the CAP pins to the off-chip filter capacitor should be short, and without any digital signals nearby. The crystal, if used, should be connected with relatively short leads. No active digital signals should be routed near or under the crystal case or near the traces, which connect it to the ADC. The AGND and DGND pins of the ADC should be connected to a common solid ground plane. All digital signals to the chip should be powered from the same supply, as that used for DVDD (do not allow digital signals to be active high unless the DVDD supply to the chip is alive). Route all active digital signals in a way to keep distance from any analog pin on the device (AIN, VREF, CAP, AVDD). Power on the AVDD supply should be active before the VREF voltage is present. PCB layout patterns for the chips (ISL26132 and ISL26134) are found on the respective package outline drawings on pages 22 and 23. Submit Document Feedback 20 FN6954.3 November 20, 2014 ISL26132, ISL26134 Revision History The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to web to make sure you have the latest Rev. DATE REVISION CHANGE November 20, 2014 FN6954.3 Datasheet updated with minor text and graphic changes. November 12, 2012 FN6954.2 Changed in Abs Max Rating on page 5 Latchup JESD from 78B to 78C Electrical Spec Table Gain Drift on page 5 changed the following: Added Gain = 64 and Typical value of 3.5 Changed Gain = 128 Typical value from 7 to 3.5 Table 5 on page 7 changed the following: Gain 64 RMS changed from 10.8 to 11.3 Peak to Peak from 71 to 75 NFB from 20.1 to 20 Gain 128 RMS changed from 10.2 to 10.6 Peak to Peak from 67 to 70 NFB from 19.1 to 19 Table 6 on page 7 changed the following: Gain 64 RMS changed from 28.3 to 29.5 Peak to Peak from 187 to 194.8 NFB from 18.7 to 18.6 Gain 128 RMS changed from 27 to 28.2 Peak to Peak from 178 to 186.1 NFB from 17.7 to 17.6 September 08, 2011 FN6954.1 Power Supply Requirements on page 6 - AIDD - Analog Supply Current - Normal Mode, AVDD = 5, Gain = 1,2 changed TYP and MAX from “6, 7.3” to “7, 8.5” Power Dissipation, Total Normal Mode, AVDD = 5, Gain = 1, 2 changed from “43.3” to “49.6” mW (Max) August 22, 2011 FN6954.0 Initial Release. About Intersil Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets. For the most updated datasheet, application notes, related documentation and related parts, please see the respective product information page found at www.intersil.com. You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask. Reliability reports are also available from our website at www.intersil.com/support For additional products, see www.intersil.com/product_tree Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted in the quality certifications found at www.intersil.com/design/quality Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com Submit Document Feedback 21 FN6954.3 November 20, 2014 ISL26132, ISL26134 Package Outline Drawing M24.173 24 LEAD THIN SHRINK SMALL OUTLINE PACKAGE (TSSOP) Rev 1, 5/10 A 1 3 7.80 ±0.10 SEE DETAIL "X" 13 24 6.40 PIN #1 I.D. MARK 4.40 ±0.10 2 3 0.20 C B A 1 12 0.15 +0.05 -0.06 B 0.65 TOP VIEW END VIEW 1.00 REF H - 0.05 C 0.90 +0.15 -0.10 1.20 MAX GAUGE PLANE SEATING PLANE 0.25 +0.05 -0.06 0.10 M C B A 0.10 C 5 0°-8° 0.05 MIN 0.15 MAX SIDE VIEW 0.25 0.60± 0.15 DETAIL "X" (1.45) NOTES: 1. Dimension does not include mold flash, protrusions or gate burrs. (5.65) Mold flash, protrusions or gate burrs shall not exceed 0.15 per side. 2. Dimension does not include interlead flash or protrusion. Interlead flash or protrusion shall not exceed 0.25 per side. 3. Dimensions are measured at datum plane H. 4. Dimensioning and tolerancing per ASME Y14.5M-1994. 5. Dimension does not include dambar protrusion. Allowable protrusion shall be 0.08mm total in excess of dimension at maximum material condition. Minimum space between protrusion and adjacent lead (0.65 TYP) (0.35 TYP) TYPICAL RECOMMENDED LAND PATTERN is 0.07mm. 6. Dimension in ( ) are for reference only. 7. Conforms to JEDEC MO-153. Submit Document Feedback 22 FN6954.3 November 20, 2014 ISL26132, ISL26134 Package Outline Drawing M28.173 28 LEAD THIN SHRINK SMALL OUTLINE PACKAGE (TSSOP) Rev 1, 5/10 A 9.70± 0.10 1 3 SEE DETAIL "X" 15 28 6.40 PIN #1 I.D. MARK 4.40 ± 0.10 2 3 0.20 C B A 1 14 0.15 +0.05 -0.06 B 0.65 TOP VIEW END VIEW 1.00 REF H - 0.05 0.90 +0.15 -0.10 C GAUGE PLANE 1.20 MAX SEATING PLANE +0.05 0.25 5 -0.06 0.10 M C B A 0.10 C 0.25 0°-8° 0.05 MIN 0.15 MAX 0.60 ±0.15 SIDE VIEW DETAIL "X" (1.45) NOTES: 1. Dimension does not include mold flash, protrusions or gate burrs. Mold flash, protrusions or gate burrs shall not exceed 0.15 per side. (5.65) 2. Dimension does not include interlead flash or protrusion. Interlead flash or protrusion shall not exceed 0.25 per side. 3. Dimensions are measured at datum plane H. 4. Dimensioning and tolerancing per ASME Y14.5M-1994. 5. Dimension does not include dambar protrusion. Allowable protrusion shall be 0.08mm total in excess of dimension at maximum material condition. Minimum space between protrusion and adjacent lead (0.35 TYP) (0.65 TYP) TYPICAL RECOMMENDED LAND PATTERN is 0.07mm. 6. Dimension in ( ) are for reference only. 7. Conforms to JEDEC MO-153. Submit Document Feedback 23 FN6954.3 November 20, 2014