PO49FCT1816

PO49FCT1816
www.potatosemi.com
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
FEATURES:
DESCRIPTION:
. Patented technology
. Operating frequency up to 500MHz with 2pf load
. Operating frequency up to 400MHz with 5pf load
. Operating frequency up to 250MHz with 50pf load
. Very low output pin to pin skew < 100ps
. Very low pulse skew < 300ps
. VCC = 1.65V to 3.6V
. Propagation delay < 2.5ns max with 50pf load
. Low input capacitance: 3pf typical
. 4x1:4 fanout
. Available in 28pin 50mil PLCC package
Potato Semiconductor’s PO49FCT1816G is
designed for world top performance using
submicron CMOS technology to achieve
500MHz TTL output frequency with less than
100ps output pin to pin skew.
Pin Configuration
PO49FCT1816G is a 1.65V to 3.3V CMOS 1
input to 4 outputs Buffered driver in 4 groups to
achieve 500MHz output frequency. Typical
applications are clock and signal distribution.
Logic Block Diagram
Pin Description
Pin Name
Description
INA, INB, INC, IND
Inputs
A[0-3], B[0-3], C[0-3], D[0-3]
Potato Semiconductor Corporation
Outputs
1
01/01/10
PO49FCT1816
www.potatosemi.com
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
Maximum Ratings
Description
Max
Unit
Storage Temperature
-65 to 150
°C
Operation Temperature
-40 to 85
°C
Operation Voltage
-0.5 to +4.6
V
Input Voltage
-0.5 to Vcc+0.5
V
Output Voltage
-0.5 to Vcc+0.5
V
Note:
stresses greater than listed under
Maximum
Ratings
may
cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
DC Electrical Characteristics
Symbol
Description
Test Conditions
VOH
Output High voltage
Vcc=3V Vin=VIH or VIL, IOH= -24mA
VOL
Output Low voltage
VIH
Min
Typ
Max
Unit
2.46
-
V
Vcc=3V Vin=VIH or VIL, IOH=24mA
-
0.44
V
Input High voltage
Guaranteed Logic HIGH Level (Input Pin)
2
-
Vcc
V
VIL
Input Low voltage
Guaranteed Logic LOW Level (Input Pin)
-0.5
-
0.8
V
IIH
Input High current
Vcc = 3.6V and Vin = 3.6V
-
-
1
uA
IIL
Input Low current
Vcc = 3.6V and Vin = 0V
-
-
-1
uA
VIK
Clamp diode voltage
Vcc = Min. And IIN = -18mA
-
-0.7
-1.2
V
Notes:
1.
2.
3.
4.
5.
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25 °C ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
VoH = Vcc – 0.6V at rated current
Potato Semiconductor Corporation
2
01/01/10
PO49FCT1816
www.potatosemi.com
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
Power Supply Characteristics
Symbol
IccQ
Description
Quiescent Power Supply Current
Test Conditions (1)
Min
Typ
Max
Unit
Vcc=Max, Vin=Vcc or GND
-
0.1
30
uA
Notes:
1.
2.
3.
4.
5.
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25°C ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
VoH = Vcc – 0.6V at rated current
Capacitance
Parameters (1)
Description
Test Conditions
Typ
Max
Unit
Cin
Input Capacitance
Vin = 0V
3
4
pF
Cout
Output Capacitance
Vout = 0V
-
6
pF
Notes:
1 This parameter is determined by device characterization but not production tested.
Switching Characteristics (Vcc = 3.3V±0.3V, TA=85°C)
Symbol
Description
Test
Min
M ax
Unit
tPLH
Propagation Delay A to Bn
CL = 50pF
2.5
ns
tPHL
Propagation Delay A to Bn
CL = 50pF
2.5
ns
tr/tf
Rise/Fall Time Measured between 0.8V – 2.0V
CL = 50pf
2.0
ns
tsk(p)
Pulse Skew (Same Package)
CL = 50pF
0.3
ns
tsk(o)
Output Pin to Pin Skew (Same Bank)
CL = 50pF
0.1
ns
tsk(o)
Output Pin to Pin Skew (Same Package)
CL = 50pF
0.15
ns
Output Skew (Different Package)
CL = 50pF
0.4
ns
Pulse Width Duration
CL = 50pF
5
Duty Cycle
CL = 5 0 p F
45
fmax
Input Frequency
fmax
fmax
tsk(pp)
tLOW/tHIGH
tDC
ns
55
%
CL = 50pF
250
MHz
Input Frequency
CL = 5pF
400
MHz
Input Frequency
CL = 2pF
500
MHz
Notes:
1. See test circuits and waveforms.
2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested.
3. Airflow of 1m/s is recommended for frequencies above 133MHz
Potato Semiconductor Corporation
3
01/01/10
PO49FCT1816
www.potatosemi.com
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
Test Waveforms
Test Circuit 1
50Ohm
Potato Semiconductor Corporation
4
01/01/10
PO49FCT1816
www.potatosemi.com
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
Test Circuit 2
50Ohm
Packaging Mechanical Drawing: 28 pin PLCC
Potato Semiconductor Corporation
5
01/01/10
PO49FCT1816
www.potatosemi.com
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
Ordering Information
Ordering Code
PO49FCT1816P
Potato Semiconductor Corporation
Package Code
Package Description
Pb-free & Green, 28-pin PLCC
6
01/01/10