Datasheet

UNISONIC TECHNOLOGIES CO., LTD
4N60Z-E
Power MOSFET
4A, 600V N-CHANNEL
POWER MOSFET

DESCRIPTION
The UTC 4N60Z-E is a high voltage power MOSFET and is
designed to have better characteristics, such as fast switching
time, low gate charge, low on-state resistance and have a high
rugged avalanche characteristics. This power MOSFET is usually
used at high speed switching applications in power supplies, PWM
motor controls, high efficient DC to DC converters and bridge
circuits.

FEATURES
* RDS(ON)=2.5Ω @ VGS=10V, ID=2.2A
* Fast Switching Capability
* Avalanche Energy Specified
* Improved dv/dt Capability, high Ruggedness

SYMBOL

ORDERING INFORMATION
Ordering Number
Lead Free
Halogen Free
4N60ZL-TF1-T
4N60ZG-TF1-T
Note: Pin Assignment: G: Gate D: Drain S: Source
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Copyright © 2013 Unisonic Technologies Co., Ltd
Package
TO-220F1
Pin Assignment
1
2
3
G
D
S
Packing
Tube
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QW-R502-A22. A
4N60Z-E

Power MOSFET
ABSOLUTE MAXIMUM RATINGS (TC=25°С, unless otherwise specified)
PARAMETER
SYMBOL
RATINGS
UNIT
Drain-Source Voltage
VDSS
600
V
Gate-Source Voltage
VGSS
±20
V
Avalanche Current (Note 2)
IAR
4.4
A
4.0
A
Continuous
ID
Drain Current
Pulsed (Note 2)
IDM
16
A
200
mJ
Single Pulsed (Note 3)
EAS
Avalanche Energy Single
Repetitive (Note 2)
EAR
10.6
mJ
Peak Diode Recovery dv/dt (Note 4)
dv/dt
4.5
V/ns
Power Dissipation
PD
36
W
Junction Temperature
TJ
+150
°С
Operating Temperature
TOPR
-55 ~ +150
°С
Storage Temperature
TSTG
-55 ~ +150
°С
Notes: 1. Absolute maximum ratings are those values beyond which the device could be permanently damaged.
Absolute maximum ratings are stress ratings only and functional device operation is not implied.
2. Repetitive Rating : Pulse width limited by maximum junction temperature.
3. L = 30mH, IAS = 3.65A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
4. ISD≤4.4A, di/dt ≤200A/μs, VDD≤BVDSS, Starting TJ = 25°C

THERMAL DATA
PARAMETER
Junction to Ambient
Junction to Case
UNISONIC TECHNOLOGIES CO., LTD
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SYMBOL
θJA
θJc
RATINGS
62.5
3.47
UNIT
°С/W
°С/W
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QW-R502-A22. A
4N60Z-E

Power MOSFET
ELECTRICAL CHARACTERISTICS (TC =25°С, unless otherwise specified)
PARAMETER
OFF CHARACTERISTICS
Drain-Source Breakdown Voltage
Drain-Source Leakage Current
SYMBOL
TEST CONDITIONS
MIN TYP MAX UNIT
BVDSS
IDSS
VGS = 0V, ID = 250μA
600
V
VDS = 600V, VGS = 0V
10
μA
5
μA
Forward
VGS = 20V, VDS = 0V
Gate-Source Leakage Current
IGSS
Reverse
VGS = -20V, VDS = 0V
-5
μA
Breakdown Voltage Temperature Coefficient △BVDSS/△TJ ID=250μA,Referenced to 25°C
0.6
V/°С
ON CHARACTERISTICS
Gate Threshold Voltage
VGS(TH)
VDS = VGS, ID = 250μA
2.0
4.0
V
Static Drain-Source On-State Resistance
RDS(ON)
VGS = 10 V, ID = 2.2A
2.0 2.5
Ω
DYNAMIC CHARACTERISTICS
Input Capacitance
CISS
550 680 pF
VDS = 25V, VGS = 0V, f = 1MHz
Output Capacitance
COSS
60
80
pF
Reverse Transfer Capacitance
CRSS
12.5 16
pF
SWITCHING CHARACTERISTICS
Turn-On Delay Time
tD(ON)
50
70
ns
Turn-On Rise Time
tR
260 280 ns
VDD=30V, VGS=0~10V, ID=0.5A
RG = 25Ω (Note 1, 2)
Turn-Off Delay Time
tD(OFF)
145 160 ns
Turn-Off Fall Time
tF
300 320 ns
60
80
nC
Total Gate Charge
QG
VDD= 50V, VDS=10V, ID= 1.3A,
IG= 100μA, VGS= 10V
Gate-Source Charge
QGS
15
nC
(Note 1, 2)
Gate-Drain Charge
QGD
18
nC
SOURCE- DRAIN DIODE RATINGS AND CHARACTERISTICS
Drain-Source Diode Forward Voltage
VSD
VGS = 0V, IS = 4.4A
1.4
V
Maximum Continuous Drain-Source Diode
IS
4.4
A
Forward Current
Maximum Pulsed Drain-Source Diode
ISM
17.6 A
Forward Current
250
ns
Reverse Recovery Time
trr
VGS = 0 V, IS = 4.4A,
dIF/dt = 100 A/μs (Note 1)
Reverse Recovery Charge
QRR
1.5
μC
Notes: 1. Pulse Test: Pulse width≤300μs, Duty cycle≤2%
2. Essentially independent of operating temperature
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QW-R502-A22. A
4N60Z-E

Power MOSFET
TEST CIRCUITS AND WAVEFORMS
D.U.T.
+
VDS
-
+
-
L
RG
Driver
VGS
VDD
* dv/dt controlled by RG
* ISD controlled by pulse period
* D.U.T.-Device Under Test
Same Type
as D.U.T.
Peak Diode Recovery dv/dt Test Circuit
VGS
(Driver)
Period
D=
P.W.
P. W.
Period
VGS= 10V
IFM, Body Diode Forward Current
ISD
(D.U.T.)
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VDS
(D.U.T.)
VDD
Body Diode
Forward Voltage Drop
Peak Diode Recovery dv/dt Waveforms
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4N60Z-E

Power MOSFET
TEST CIRCUITS AND WAVEFORMS (Cont.)
VDS
90%
VGS
10%
tD(ON)
tD(OFF)
tF
tR
Switching Test Circuit
Switching Waveforms
VGS
QG
10V
QGS
QGD
Charge
Gate Charge Test Circuit
Gate Charge Waveform
BVDSS
IAS
ID(t)
VDS(t)
VDD
tp
Unclamped Inductive Switching Test Circuit
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Time
Unclamped Inductive Switching Waveforms
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4N60Z-E
Power MOSFET
UTC assumes no responsibility for equipment failures that result from using products at values that
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specifications of any and all UTC products described or contained
herein. UTC products are not designed for use in life support appliances, devices or systems where
malfunction of these products can be reasonably expected to result in personal injury. Reproduction in
whole or in part is prohibited without the prior written consent of the copyright owner. The information
presented in this document does not form part of any quotation or contract, is believed to be accurate
and reliable and may be changed without notice.
UNISONIC TECHNOLOGIES CO., LTD
www.unisonic.com.tw
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