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Better Than Ever – RLDRAM 3
Reduced-latency DRAM (RLDRAM®) is a high-performance
memory that combines the high density, high bandwidth,
and fast SRAM-like random access that networking, image
processing, and cache applications need. This well-established
memory solution—which beats even leading-edge DDR3 for
sustained high bandwidth—is getting better with the introduction of our third-generation RLDRAM memory.
Easy Transition to RLDRAM 3
Leveraging RLDRAM 2 and DDR3 features and reusing existing functionality enables simplified PHY development and
eases design work.
DDR3 I/O Functionality Incorporated
•
5 Ways RLDRAM 3
Enables High Sustainable
Access Rate
1. Ultra-High Data Rate; Lowest DRAM Random Access Latency
8ns tRC versus 46–52ns on DDR3.
SSTL-based I/O
Speed bin cadence (1600, 1866, 2133 Mb/s)
• AC timing1
• READ training register
2. Multibank WRITE
RLDRAM 2 Functionality Incorporated
READ-WRITE-READ delay of 1 idle cycle versus 15
or more on DDR3.
•
•
Command protocol
SDR addressing with multiplexed/
non-multiplexed options
• Free-running differential input and output strobes and QVLD
•
1Not all AC timing is the same. RLDRAM 3 leverages DDR3 jitter, skew, slew rates, and
derating where applicable.
RLDRAM 3 Integration Advantages
• JTAG: Valuable for interconnect debug on complex high-density PCBs
• 1.0mm Ball Pitch: Simplifies routing for easier board design
• Mirror Functionality: Reduces routing complexity for clamshelled designs
Enables random READ accesses every 1.0ns.
3. Minimal Bus Turnaround Delay
4. No tFAW, tRRD
No idle cycles between cyclic bank accesses versus
t
FAW of 27 or more cycles on DDR3.
5. Minimum Burst Lengths
BL2, BL4, and BL8 allow flexible memory access and
full data bus utilization.
Micron RLDRAM Memory
Feature and Performance Comparison
Data Rate
tRC
RLDRAM 3
RLDRAM 2
DDR4
DDR3
DDR2+/
QDR2+SRAM
400 –2133 Mb/s
350 –1066 Mb/s
1600–3200 Mb/s
600–2133 Mb/s
240–1100 MHz
8ns
15 –20ns
44 –50ns
46–52ns
1.81ns
Density
576Mb, 1Gb
288Mb, 576Mb
2Gb – 16Gb
1Gb, 2Gb, 4Gb
18Mb, 36Mb, 72Mb
Voltages
1.35V core;
1.2V IO
1.8V core;
1.5 –1.8V IO
1.05V or 1.1V (TBD);
1.2V core and IO
1.5V;
1.35V core and IO
1.8V core;
1.5–1.8V IO
x18, x36
x9, x18, x36
x4, x8, x16
x4, x8, x16
x18, x36
Configurations
Burst Length
Multibank Write
Internal Banks
2, 4, 8
2, 4, 8
8
8
DDR2+: 2
QDR2+: 4
Enables 1.0ns
READ tRC
Not Applicable
Not Applicable
Not Applicable
Not Applicable
16
8
16
8
Not Applicable
Delay
No delay
No delay
>28 clock cycles
>27 clock cycles
Not Applicable
Bus Turnaround
Delay (RD-WR-RD)
1–2 clock cycles
1–2 clock cycles
>17 clock cycles
>15 clock cycles
DDR2+: 2–3
QDR2+: 0
Available
Not Available
Available
Available
Not Available
tFAW
RESET Pin
Longevity for RLDRAM 2
We’re transitioning our RLDRAM 2 devices to a more
advanced 50nm process technology node. For
customers, this means lower power consumption and
an upgrade (for the 288Mb device) to 1066 Mb/s and
15ns tRC. It also means we’ll be able to support
RLDRAM 2 memory for the long term, with production
planned for years to come.
Partner
Ecosystem
Micron is reinforcing and
expanding current relationships with
Preferred Partners and key enablers in the
networking industry.
Achronix
Altera
Applied Micro
Broadcom
Cavium
Dolphin
Freescale
LSI Logic
micron.com
Products are warranted only to meet Micron’s production data sheet
specifications. Products and specifications are subject to change without notice. Dates are estimates only.
Micron and the Micron logo are trademarks and RLDRAM is a registered trademark of Micron
Technology, Inc. All other trademarks are the property of their respective owners. ©2007 Micron
Technology, Inc. All rights reserved. 08/14 EN.L
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Open Silicon
Northwest Logic
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