Data Sheet Low Noise, Precision Operational Amplifier OP27 FEATURES PIN CONFIGURATIONS BAL BAL 1 OP27 V+ OUT –IN 2 NC +IN 3 00317-001 Low noise: 80 nV p-p (0.1 Hz to 10 Hz), 3 nV/√Hz Low drift: 0.2 μV/°C High speed: 2.8 V/μs slew rate, 8 MHz gain bandwidth Low VOS: 10 μV Excellent CMRR: 126 dB at VCM of ±11 V High open-loop gain: 1.8 million Fits OP07, 5534A sockets Available in die form 4V– (CASE) NC = NO CONNECT Figure 1. 8-Lead TO-99 (J-Suffix) The OP27 precision operational amplifier combines the low offset and drift of the OP07 with both high speed and low noise. Offsets down to 25 μV and maximum drift of 0.6 μV/°C make the OP27 ideal for precision instrumentation applications. Exceptionally low noise, en = 3.5 nV/√Hz, at 10 Hz, a low 1/f noise corner frequency of 2.7 Hz, and high gain (1.8 million), allow accurate high-gain amplification of low-level signals. A gain bandwidth product of 8 MHz and a 2.8 V/μs slew rate provide excellent dynamic accuracy in high speed, data-acquisition systems. VOS TRIM 1 OP27 8 VOS TRIM –IN 2 7 V+ +IN 3 6 OUT V– 4 5 NC 00317-002 GENERAL DESCRIPTION NC = NO CONNECT Figure 2. 8-Lead CERDIP – Glass Hermetic Seal (Z-Suffix), 8-Lead PDIP (P-Suffix), and 8-Lead SO (S-Suffix) A low input bias current of ±10 nA is achieved by use of a bias current cancellation circuit. Over the military temperature range, this circuit typically holds IB and IOS to ±20 nA and 15 nA, respectively. The output stage has good load driving capability. A guaranteed swing of ±10 V into 600 Ω and low output distortion make the OP27 an excellent choice for professional audio applications. (Continued on Page 3) FUNCTIONAL BLOCK DIAGRAM V+ R3 Q6 R11 1 8 VOS ADJ.. C2 R4 Q22 R21 R23 Q21 Q24 Q23 Q46 C1 R24 R9 Q20 Q1A Q1B Q2B Q19 OUTPUT R12 Q2A NONINVERTING INPUT (+) C3 R5 C4 Q3 INVERTING INPUT (–) Q11 Q26 Q12 Q27 Q45 Q28 ADJUSTED AT WAFER TEST FOR MINIMUM OFFSET VOLTAGE V– 00317-003 1 R1 AND R2 ARE PERMANENTLY Figure 3. Rev. G Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©1981–2015 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com OP27 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Typical Performance Characteristics ..............................................8 General Description ......................................................................... 1 Applications Information .............................................................. 14 Pin Configurations ........................................................................... 1 Offset Voltage Adjustment ........................................................ 14 Functional Block Diagram .............................................................. 1 Noise Measurements .................................................................. 14 Revision History ............................................................................... 2 Unity-Gain Buffer Applications ............................................... 14 Specifications..................................................................................... 4 Comments On Noise ................................................................. 15 Electrical Characteristics ............................................................. 4 Audio Applications .................................................................... 16 Typical Electrical Characteristics ............................................... 6 References .................................................................................... 18 Absolute Maximum Ratings............................................................ 7 Outline Dimensions ....................................................................... 19 Thermal Resistance ...................................................................... 7 Ordering Guide .......................................................................... 21 ESD Caution .................................................................................. 7 REVISION HISTORY 3/15—Rev. F to Rev. G Changes to General Description Section ...................................... 3 Changes to Figure 31 ...................................................................... 12 Changes to Applications Information Section and Output Voltage Adjustment Section .......................................................... 14 Updated Outline Dimensions ....................................................... 19 Changes to Ordering Guide .......................................................... 21 5/06—Rev. E to Rev. F Removed References to 745 .............................................. Universal Updated 741 to AD741 ...................................................... Universal Changes to Ordering Guide .......................................................... 20 9/01—Rev. 0 to Rev. A Edits to Ordering Information ........................................................1 Edits to Pin Connections ..................................................................1 Edits to Absolute Maximum Ratings ..............................................2 Edits to Package Type .......................................................................2 Edits to Electrical Characteristics .............................................. 2, 3 Edits to Wafer Test Limits ................................................................4 Deleted Typical Electrical Characteristics......................................4 Edits to Burn-In Circuit Figure .......................................................7 Edits to Application Information ....................................................8 12/05—Rev. D to Rev. E Edits to Figure 2 ................................................................................ 1 9/05—Rev. C to Rev. D Updated Format .................................................................. Universal Changes to Table 1 ............................................................................ 4 Removed Die Characteristics Figure ............................................ 5 Removed Wafer Test Limits Table .................................................. 5 Changes to Table 5 ............................................................................ 7 Changes to Comments on Noise Section .................................... 15 Changes to Ordering Guide .......................................................... 24 1/03—Rev. B to Rev. C Edits to Pin Connections ................................................................. 1 Edits to General Description........................................................... 1 Edits to Die Characteristics ............................................................. 5 Edits to Absolute Maximum Ratings ............................................. 7 Updated Outline Dimensions ....................................................... 16 Edits to Figure 8 .............................................................................. 14 Edits to Outline Dimensions ......................................................... 16 Rev. G | Page 2 of 21 Data Sheet OP27 GENERAL DESCRIPTION (Continued from Page 1) PSRR and CMRR exceed 120 dB. These characteristics, coupled with long-term drift of 0.2 μV/month, allow the circuit designer to achieve performance levels previously attained only by discrete designs. Low cost, high volume production of OP27 is achieved by using an on-chip Zener zap-trimming network. This reliable and stable offset trimming scheme has proven its effectiveness over many years of production history. The OP27 provides excellent performance in low noise, high accuracy amplification of low level signals. Applications include stable integrators, precision summing amplifiers, precision voltage threshold detectors, comparators, and professional audio circuits such as tape heads and microphone preamplifiers. Rev. G | Page 3 of 21 OP27 Data Sheet SPECIFICATIONS ELECTRICAL CHARACTERISTICS VS = ±15 V, TA = 25°C, unless otherwise noted. Table 1. Parameter INPUT OFFSET VOLTAGE1 LONG-TERM VOS STABILITY2, 3 INPUT OFFSET CURRENT INPUT BIAS CURRENT INPUT NOISE VOLTAGE3, 4 INPUT NOISE Voltage Density3 Symbol VOS VOS/Time IOS IB en p-p en INPUT NOISE Current Density3 in INPUT RESISTANCE Differential Mode5 Common Mode INPUT VOLTAGE RANGE COMMON-MODE REJECTION RATIO POWER SUPPLY REJECTION RATIO LARGE SIGNAL VOLTAGE GAIN RIN RINCM IVR CMRR PSRR AVO OUTPUT VOLTAGE SWING VO SLEW RATE6 GAIN BANDWIDTH PRODUCT6 OPEN-LOOP OUTPUT RESISTANCE POWER CONSUMPTION OFFSET ADJUSTMENT RANGE SR GBW RO Pd Test Conditions 0.1 Hz to 10 Hz fO = 10 Hz fO = 30 Hz fO = 1000 Hz fO = 10 Hz fO = 30 Hz fO = 1000 Hz OP27A/OP27E Min Typ Max 10 25 0.2 1.0 7 35 ±10 ±40 0.08 0.18 3.5 5.5 3.1 4.5 3.0 3.8 1.7 4.0 1.0 2.3 0.4 0.6 1.3 VCM = ±11 V VS = ±4 V to ±18 V RL ≥ 2 kΩ, VO = ±10 V RL ≥ 600 Ω, VO = ±10 V RL ≥ 2 kΩ RL ≥ 600 Ω RL ≥ 2 kΩ VO = 0, IO = 0 VO RP = 10 kΩ 1 ±11.0 114 1000 800 ±12.0 ±10.0 1.7 5.0 6 3 ±12.3 126 1 1800 1500 ±13.8 ±11.5 2.8 8.0 70 90 ±4.0 Min 0.7 ±11.0 100 10 700 600 ±11.5 ±10.0 1.7 5.0 140 OP27G Typ 30 0.4 12 ±15 0.09 3.8 3.3 3.2 1.7 1.0 0.4 4 2 ±12.3 120 2 1500 1500 ±13.5 ±11.5 2.8 8.0 70 100 ±4.0 Max 100 2.0 75 ±80 0.25 8.0 5.6 4.5 0.6 20 170 Unit μV μV/MO nA nA μV p-p nV/√Hz nV/√Hz nV/√Hz pA/√Hz pA/√Hz pA/√Hz MΩ GΩ V dB μV/V V/mV V/mV V V V/μs MHz Ω mW mV Input offset voltage measurements are performed approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up. Long-term input offset voltage stability refers to the average trend line of VOS vs. time over extended periods after the first 30 days of operation. Excluding the initial hour of operation, changes in VOS during the first 30 days are typically 2.5 μV. Refer to the Typical Performance Characteristics section. 3 Sample tested. 4 See voltage noise test circuit (Figure 31). 5 Guaranteed by input bias current. 6 Guaranteed by design. 2 Rev. G | Page 4 of 21 Data Sheet OP27 VS = ±15 V, −55°C ≤ TA ≤ 125°C, unless otherwise noted. Table 2. Parameter INPUT OFFSET VOLTAGE1 AVERAGE INPUT OFFSET DRIFT Symbol VOS TCVOS2 TCVOSn3 IOS IB IVR CMRR PSRR AVO VO INPUT OFFSET CURRENT INPUT BIAS CURRENT INPUT VOLTAGE RANGE COMMON-MODE REJECTION RATIO POWER SUPPLY REJECTION RATIO LARGE SIGNAL VOLTAGE GAIN OUTPUT VOLTAGE SWING Test Conditions VCM = ±10 V VS = ±4.5 V to ±18 V RL ≥ 2 kΩ, VO = ±10 V RL ≥ 2 kΩ Min OP27A Typ 30 ±10.3 108 0.2 15 ±20 ±11.5 122 2 1200 ±13.5 600 ±11.5 Max 60 Unit μV 0.6 50 ±60 μV/°C nA nA V dB μV/V V/mV V 16 1 Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up. 2 The TCVOS performance is within the specifications unnulled or when nulled with RP = 8 kΩ to 20 kΩ. TCVOS is 100% tested for A/E grades, sample tested for G grades. 3 Guaranteed by design. VS = ±15 V, −25°C ≤ TA ≤ 85°C for OP27J and OP27Z and −40°C ≤ TA ≤ 85°C for OP27GS, unless otherwise noted. Table 3. Parameter INPUT ONSET VOLTAGE AVERAGE INPUT OFFSET DRIFT INPUT OFFSET CURRENT INPUT BIAS CURRENT INPUT VOLTAGE RANGE COMMON-MODE REJECTION RATIO POWER SUPPLY REJECTION RATIO LARGE SIGNAL VOLTAGE GAIN OUTPUT VOLTAGE SWING 1 2 Symbol VOS TCVOS1 TCVOSn2 IOS IB IVR CMRR PSRR AVO VO Test Conditions VCM = ±10 V VS = ±4.5 V to ±18 V RL ≥ 2 kΩ, VO = ±10 V RL ≥ 2 kΩ Min ±10.5 110 750 ±11.7 OP27E Typ 20 0.2 0.2 10 ±14 ±11.8 124 2 1500 ±13.6 Max 50 0.6 0.6 50 ±60 Min ±10.5 96 15 450 ±11.0 OP27G Typ 55 04 04 20 ±25 ±11.8 118 2 1000 ±13.3 Max 220 1.8 1.8 135 ±150 32 Unit μV μV/°C μV/°C nA nA V dB μV/V V/mV V The TCVOS performance is within the specifications unnulled or when nulled with RP = 8 kΩ to 20 kΩ. TCVOS is 100% tested for A/E grades, sample tested for C/G grades. Guaranteed by design. Rev. G | Page 5 of 21 OP27 Data Sheet TYPICAL ELECTRICAL CHARACTERISTICS VS = ±15 V, TA = 25°C unless otherwise noted. Table 4. Parameter AVERAGE INPUT OFFSET VOLTAGE DRIFT1 AVERAGE INPUT OFFSET CURRENT DRIFT AVERAGE INPUT BIAS CURRENT DRIFT INPUT NOISE VOLTAGE DENSITY Symbol TCVOS or TCVOSn TCIOS TCIB en Test Conditions Nulled or unnulled, RP = 8 kΩ to 20 kΩ INPUT NOISE CURRENT DENSITY in INPUT NOISE VOLTAGE SLEW RATE enp-p SR GBW fO = 10 Hz fO = 30 Hz fO = 1000 Hz 0.1 Hz to 10 Hz RL ≥ 2 kΩ GAIN BANDWIDTH PRODUCT 1 fO = 10 Hz fO = 30 Hz fO = 1000 Hz OP27N Typical 0.2 80 100 3.5 3.1 3.0 Unit μV/°C pA/°C pA/°C nV/√Hz nV/√Hz nV/√Hz 1.7 1.0 0.4 0.08 2.8 8 pA/√Hz pA/√Hz pA/√Hz μV p-p V/μs MHz Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. Rev. G | Page 6 of 21 Data Sheet OP27 ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE Table 5. Parameter Supply Voltage Input Voltage1 Output Short-Circuit Duration Differential Input Voltage2 Differential Input Current2 Storage Temperature Range Operating Temperature Range OP27A (J, Z) OP27E (Z) OP27E (P) OP27G (P, S, J, Z) Lead Temperature Range (Soldering, 60 sec) Junction Temperature Rating ±22 V ±22 V Indefinite ±0.7 V ±25 mA −65°C to +150°C θJA is specified for the worst-case conditions, that is, θJA is specified for device in socket for TO, CERDIP, and PDIP packages; θJA is specified for device soldered to printed circuit board for SO package. Absolute maximum ratings apply to both DICE and packaged parts, unless otherwise noted. Table 6. −55°C to +125°C −25°C to +85°C 0°C to 70°C −40°C to +85°C 300°C −65°C to +150°C 1 For supply voltages less than ±22 V, the absolute maximum input voltage is equal to the supply voltage. 2 The inputs of the OP27 are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise. If differential input voltage exceeds ±0.7 V, the input current should be limited to 25 mA. Package Type 8-Lead Metal Can (TO-99) (J) 8-Lead CERDIP (Z) 8-Lead PDIP (P) 8-Lead SOIC_N (S) ESD CAUTION Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. Rev. G | Page 7 of 21 θJA 150 148 103 158 θJC 18 16 43 43 Unit °C/W °C/W °C/W °C/W OP27 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 100 10 TA = 25C VS = 15V RMS VOLTAGE NOISE (V) 90 70 60 50 0.1 TEST TIME OF 10sec FURTHER LIMITS LOW FREQUENCY (<0.1Hz) GAIN 30 0.01 0.1 1 10 100 FREQUENCY (Hz) 0.01 100 00317-004 40 1k 10k 100k BANDWIDTH (Hz) Figure 7. Input Wideband Voltage Noise vs. Bandwidth (0.1 Hz to Frequency Indicated) Figure 4. 0.1 Hz to 10 Hz p-p Noise Tester Frequency Response 100 10 9 8 R1 TA = 25C VS = 15V TA = 25C VS = 15V 7 R2 RS – 2R1 6 TOTAL NOISE (nV/Hz) VOLTAGE NOISE (nV/Hz) 1 00317-007 GAIN (dB) 80 5 4 3 I/F CORNER = 2.7Hz 2 10 AT 10Hz AT 1kHz 1 10 100 1k FREQUENCY (Hz) 00317-005 1 1k 10k SOURCE RESISTANCE () 00317-008 RESISTOR NOISE ONLY 1 100 Figure 8. Total Noise vs. Sourced Resistance Figure 5. Voltage Noise Density vs. Frequency 100 5 VS = 15V VOLTAGE NOISE (nV/Hz) I/F CORNER 10 LOW NOISE AUDIO OP AMP OP27 I/F CORNER INSTRUMENTATION RANGE TO DC 1 1 10 4 AT 10Hz 3 AT 1kHz 2 AUDIO RANGE TO 20kHz 100 FREQUENCY (Hz) 1k 1 –50 –25 0 25 50 75 100 TEMPERATURE (C) Figure 6. A Comparison of Op Amp Voltage Noise Spectra Figure 9. Voltage Noise Density vs. Temperature Rev. G | Page 8 of 21 125 00317-009 I/F CORNER = 2.7Hz 00317-006 VOLTAGE NOISE (nV/Hz) 741 Data Sheet OP27 5 60 TA = 25C OP27C 50 OP27A 30 3 AT 1kHz 2 20 10 OP27A 0 –10 OP27A –20 –30 –40 TRIMMING WITH 10k POT DOES NOT CHANGE TCVOS –50 –60 0 10 20 30 40 TOTAL SUPPLY VOLTAGE, V+ – V–, (V) –70 –75 00317-010 1 –50 –25 OP27C 0 25 50 75 100 125 150 175 TEMPERATURE (C) 00317-013 AT 10Hz OFFSET VOLTAGE (V) VOLTAGE NOISE (nV/Hz) 40 4 Figure 13. Offset Voltage Drift of Five Representative Units vs. Temperature Figure 10. Voltage Noise Density vs. Supply Voltage 10.0 6 CHANGE IN OFFSET VOLTAGE (V) CURRENT NOISE (pA/Hz) 4 1.0 I/F CORNER = 140Hz 2 0 –2 –4 –6 6 4 2 0 –2 10k FREQUENCY (Hz) –6 0 CHANGE IN INPUT OFFSET VOLTAGE (V) TA = +125C 3.0 TA = –55C 2.0 TA = +25C 25 35 TOTAL SUPPLY VOLTAGE (V) 45 4 5 6 7 TA = 25C VS = 15V 10 OP27 C/G OP27 F 5 1 00317-012 SUPPLY CURRENT (mA) 4.0 15 3 Figure 14. Long-Term Offset Voltage Drift of Six Representative Units 5.0 5 2 TIME (Months) Figure 11. Current Noise Density vs. Frequency 1.0 1 OP27 A/E 0 1 2 3 4 TIME AFTER POWER ON (Min) Figure 15. Warm-Up Offset Voltage Drift Figure 12. Supply Current vs. Supply Voltage Rev. G | Page 9 of 21 5 00317-015 1k 00317-011 100 00317-014 –4 0.1 10 OP27 Data Sheet 130 30 VS = 15V 110 TA = 70C 20 THERMAL SHOCK RESPONSE BAND 50 30 5 10 DEVICE IMMERSED IN 70C OIL BATH 0 20 40 60 100 80 TIME (Sec) –10 00317-016 0 –20 1 10 PHASE MARGIN (Degrees) VS = 15V 100k 1M 100M 10M 30 10 70 M VS = 15V 9 60 GBW 50 8 4 20 SLEW RATE (V/S) OP27C 10 0 –50 –25 0 25 50 75 100 125 150 TEMPERATURE (C) –75 –50 –25 0 25 50 75 100 6 125 TEMPERATURE (C) Figure 20. Slew Rate, Gain Bandwidth Product, Phase Margin vs. Temperature Figure 17. Input Bias Current vs. Temperature 50 7 2 00317-017 OP27A SLEW 3 80 25 VS = 15V TA = 25C VS = 15V 20 40 100 15 GAIN (dB) 30 20 10 OP27C 120 PHASE MARGIN = 70 140 5 160 0 180 –5 200 PHASE SHIFT (Degrees) GAIN 10 0 –75 –50 –25 0 25 50 75 100 TEMPERATURE (C) 125 00317-018 OP27A –10 1M Figure 18. Input Offset Current vs. Temperature 10M FREQUENCY (Hz) Figure 21. Gain, Phase Shift vs. Frequency Rev. G | Page 10 of 21 220 100M 00317-021 INPUT BIAS CURRENT (nA) 10k Figure 19. Open-Loop Gain vs. Frequency 40 INPUT OFFSET CURRENT (nA) 1k FREQUENCY (Hz) Figure 16. Offset Voltage Change Due to Thermal Shock 50 100 00317-019 10 70 GAIN BANDWIDTH PRODUCT (MHz) 15 90 00317-020 TA = 25C VOLTAGE GAIN (dB) OPEN-LOOP GAIN (dB) 25 Data Sheet 2.5 OP27 100 TA = 25C 80 RL = 2k % OVERSHOOT 1.5 RL = 1k 1.0 0 40 20 0 10 20 30 50 40 TOTAL SUPPLY VOLTAGE (V) 0 00317-022 0.5 60 1000 1500 2000 2500 Figure 25. Small-Signal Overshoot vs. Capacitive Load TA = 25°C VS = ±15V 24 MAXIMUM OUTPUT SWING 500 CAPACITIVE LOAD (pF) Figure 22. Open-Loop Voltage Gain vs. Supply Voltage 28 0 20mV 500ns 20 50mV AVCL = +1 CL = 15pF VS = 15V TA = 25C 16 12 0V 8 4 100k 10M 1M FREQUENCY (Hz) 00317-023 10k 00317-026 –50mV 0 1k Figure 26. Small-Signal Transient Response Figure 23. Maximum Output Swing vs. Frequency 18 16 POSITIVE SWING 2V 2s 12 10 +5V NEGATIVE SWING 8 AVCL = +1 VS = 15V TA = 25C 6 0V 4 2 TA = 25C VS = 15V –2 100 1k LOAD RESISTANCE () –5V 10k Figure 24. Maximum Output Voltage vs. Load Resistance 00317-027 0 00317-024 MAXIMUM OUTPUT (V) 14 Figure 27. Large Signal Transient Response Rev. G | Page 11 of 21 00317-025 OPEN-LOOP GAIN (V/V) 2.0 VS = 15V VIN = 100mV AV = +1 OP27 Data Sheet TA = 25C VS = 15V 50 0.1mF 100kΩ 40 ISC (+) OP27 10Ω D.U.T. 30 ISC (–) 2kΩ VOLTAGE GAIN = 50,000 20 AD8677 1 2 3 5 4 TIME FROM OUTPUT SHORTED TO GROUND (Min) 0.1mF 2.2mF 24.3kΩ 00317-028 0 Figure 28. Short-Circuit Current vs. Time 110kΩ Figure 31. Voltage Noise Test Circuit (0.1 Hz to 10 Hz) 2.4 140 VS = 15V TA = 25C VCM = 10V TA = 25C VS = 15V OPEN-LOOP VOLTAGE GAIN (V/V) 2.2 120 CMRR (dB) SCOPE ´ 1 RIN = 1MΩ 100kΩ 4.7mF 10 4.3kΩ 22mF 00317-031 SHORT-CIRCUIT CURRENT (mA) 60 100 80 2.0 1.8 1.6 1.4 1.2 1.0 0.8 1k 10k 100k 1M FREQUENCY (Hz) 0.4 100 00317-029 60 100 1k 10k LOAD RESISTANCE () 100k 00317-032 0.6 Figure 32. Open-Loop Voltage Gain vs. Load Resistance Figure 29. CMRR vs. Frequency 16 TA = –55C 1 SEC/DIV TA = +25C 120 8 VOLTAGE NOISE (nV) TA = +125C 4 0 TA = –55C –4 TA = +25C –8 TA = +125C –12 80 40 0 –40 –90 –120 0 5 10 15 20 SUPPLY VOLTAGE (V) 0.1Hz TO 10Hz p-p NOISE Figure 33. Low Frequency Noise Figure 30. Common-Mode Input Range vs. Supply Voltage Rev. G | Page 12 of 21 00317-033 –16 00317-030 COMMON-MODE RANGE (V) 12 Data Sheet OP27 160 120 100 NEGATIVE SWING 80 60 POSITIVE SWING 40 20 0 1 10 100 1k 10k 100k 1M FREQUENCY (Hz) 10M 100M 00317-034 POWER SUPPLY REJECTION RATIO (dB) TA = 25C 140 Figure 34. PSRR vs. Frequency Rev. G | Page 13 of 21 OP27 Data Sheet APPLICATIONS INFORMATION OP27 series units can be inserted directly into OP07 sockets with or without removal of external compensation or nulling components. OP27 offset voltage can be nulled to 0 (or another desired setting) using a potentiometer (see Figure 35). NOISE MEASUREMENTS The OP27 provides stable operation with load capacitances of up to 2000 pF and ±10 V swings; larger capacitances should be decoupled with a 50 Ω resistor inside the feedback loop. The OP27 is unity-gain stable. Thermoelectric voltages generated by dissimilar metals at the input terminal contacts can degrade the drift performance. Best operation is obtained when both input contacts are maintained at the same temperature. V+ 1 –- 8 2 3 6 OUTPUT 4 00317-035 + 7 OP27 V– Figure 35. Offset Nulling Circuit OFFSET VOLTAGE ADJUSTMENT The input offset voltage of the OP27 is trimmed at wafer level. However, if further adjustment of VOS is necessary, a 10 kΩ trim potentiometer can be used. TCVOS is not degraded (see Figure 35). Other potentiometer values from 1 kΩ to 1 MΩ can be used with a slight degradation (0.1 μV/°C to 0.2 μV/°C) of TCVOS. Trimming to a value other than zero creates a drift of approximately (VOS/300) μV/°C. For example, the change in TCVOS is 0.33 μV/°C if VOS is adjusted to 100 μV. The offset voltage adjustment range with a 10 kΩ potentiometer is ±4 mV. If smaller adjustment range is required, the nulling sensitivity can be reduced by using a smaller potentiometer in conjunction with fixed resistors. For example, Figure 36 shows a network that has a ±280 μV adjustment range. 4.7k 1k POT T 4.7k 8 V+ Figure 36. Offset Voltage Adjustment 00317-036 1 The device must be warmed up for at least five minutes. As shown in the warm-up drift curve, the offset voltage typically changes 4 μV due to increasing chip temperature after power-up. In the 10-second measurement interval, these temperature-induced effects can exceed tens-ofnanovolts. For similar reasons, the device has to be well-shielded from air currents. Shielding minimizes thermocouple effects. Sudden motion in the vicinity of the device can also feedthrough to increase the observed noise. The test time to measure 0.1 Hz to 10 Hz noise should not exceed 10 seconds. As shown in the noise-tester frequency response curve, the 0.1 Hz corner is defined by only one zero. The test time of 10 seconds acts as an additional zero to eliminate noise contributions from the frequency band below 0.1 Hz. A noise voltage density test is recommended when measuring noise on a large number of units. A 10 Hz noise voltage density measurement correlates well with a 0.1 Hz to 10 Hz p-p noise reading, since both results are determined by the white noise and the location of the 1/f corner frequency. UNITY-GAIN BUFFER APPLICATIONS When Rf ≤ 100 Ω and the input is driven with a fast, large signal pulse (>1 V), the output waveform looks as shown in the pulsed operation diagram (see Figure 37). During the fast feedthrough-like portion of the output, the input protection diodes effectively short the output to the input, and a current, limited only by the output short-circuit protection, is drawn by the signal generator. With Rf ≥ 500 Ω, the output is capable of handling the current requirements (IL ≤ 20 mA at 10 V); the amplifier stays in its active mode and a smooth transition occurs. When Rf > 2 kΩ, a pole is created with Rf and the amplifier’s input capacitance (8 pF) that creates additional phase shift and reduces phase margin. A small capacitor (20 pF to 50 pF) in parallel with Rf eliminates this problem. Rf – OP27 + Figure 37. Pulsed Operation Rev. G | Page 14 of 21 2.8V/s 00317-037 10k RP To measure the 80 nV p-p noise specification of the OP27 in the 0.1 Hz to 10 Hz range, the following precautions must be observed: Data Sheet OP27 Voltage noise is inversely proportional to the square root of bias current, but current noise is proportional to the square root of bias current. The noise advantage of the OP27 disappears when high source resistors are used. Figure 38, Figure 39, Figure 40 compare the observed total noise of the OP27 with the noise performance of other devices in different circuit applications. (Voltage Noise) Total Noise (Current Noise R S ) 2 2 (Resistor Noise) 2 1k OP08/108 500 5534 OP07 1 2 100 OP27/37 1 RS e.g. RS 2 RS e.g. RS 50 UNMATCHED = R S1 = 10k, R S2 = 0 MATCHED = 10k, R S1 = R S2 = 5k RS1 RS2 REGISTER NOISE ONLY 10 50 1/ 2 10k 500 1k 5k RS—SOURCE RESISTANCE () 100 50k 00317-039 The OP27 is a very low noise, monolithic op amp. The outstanding input voltage noise characteristics of the OP27 are achieved mainly by operating the input stage at a high quiescent current. The input bias and offset currents, which would normally increase, are held to reasonable values by the input bias current cancellation circuit. The OP27A/OP27E has IB and IOS of only ±40 nA and 35 nA at 25°C respectively. This is particularly important when the input has a high source resistance. In addition, many audio amplifier designers prefer to use direct coupling. The high IB, VOS, and TCVOS of previous designs have made direct coupling difficult, if not impossible, to use. Figure 39 shows the 0.1 Hz to 10 Hz p-p noise. Here the picture is less favorable; resistor noise is negligible and current noise becomes important because it is inversely proportional to the square root of frequency. The crossover with the OP07 occurs in the 3 kΩ to 5 kΩ range depending on whether balanced or unbalanced source resistors are used (at 3 kΩ the IB and IOS error also can be 3× the VOS spec). p-p NOISE (nV) COMMENTS ON NOISE Figure 39. Peak-to-Peak Noise (0.1 Hz to 10 Hz) as Source Resistance (Includes Resistor Noise) Figure 38 shows noise vs. source resistance at 1000 Hz. The same plot applies to wideband noise. To use this plot, multiply the vertical scale by the square root of the bandwidth. 100 For low frequency applications, the OP07 is better than the OP27/OP37 when RS > 3 kΩ. The only exception is when gain error is important. Figure 40 illustrates the 10 Hz noise. As expected, the results are between the previous two figures. 100 50 50 TOTAL NOISE (nV/Hz) OP07 10 1 RS e.g. RS 2 RS e.g. RS 5534 OP27/37 1 50 REGISTER NOISE ONLY 100 UNMATCHED = R S1 = 10k, R S2 = 0 MATCHED = 10k, R S1 = R S2 = 5k RS1 OP08/108 10 5534 1 RS e.g. RS 2 RS e.g. RS 5 OP27/37 RS2 500 1k 5k 10k RS—SOURCE RESISTANCE () OP07 UNMATCHED = R S1 = 10k, R S2 = 0 MATCHED = 10k, R S1 = R S2 = 5k RS1 50k 1 50 Figure 38. Noise vs. Source Resistance (Including Resistor Noise) at 1000 Hz At RS < 1 kΩ, the low voltage noise of the OP27 is maintained. With RS < 1 kΩ, total noise increases but is dominated by the resistor noise rather than current or voltage noise. lt is only beyond RS of 20 kΩ that current noise starts to dominate. The argument can be made that current noise is not important for applications with low-to-moderate source resistances. The crossover between the OP27 and OP07 noise occurs in the 15 kΩ to 40 kΩ region. REGISTER NOISE ONLY 100 RS2 500 1k 5k 10k RS—SOURCE RESISTANCE () 50k 00317-040 5 1 2 2 00317-038 TOTAL NOISE (nV/Hz) 1 OP08/108 Figure 40. 10 Hz Noise vs. Source Resistance (Includes Resistor Noise) Audio Applications Rev. G | Page 15 of 21 OP27 Data Sheet C4 (2) 220µF + For reference, typical source resistances of some signal sources are listed in Table 7. MOVING MAGNET CARTRIDGE INPUT Device Strain Gauge Magnetic Tape Head Source Impedance <500 Ω <1500 Ω Magnetic Phonograph Cartridges <1500 Ω Linear Variable Differential Transformer <1500 Ω Comments Typically used in low frequency applications. Low is very important to reduce self-magnetization problems when direct coupling is used. OP27 IB can be neglected. Similar need for low IB in direct coupled applications. OP27 does not introduce any selfmagnetization problems. Used in rugged servo-feedback applications. Bandwidth of interest is 400 Hz to 5 kHz. Table 8. Open-Loop Gain Frequency At 3 Hz At 10 Hz At 30 Hz OP07 100 dB 100 dB 90 dB OP27 124 dB 120 dB 110 dB OP37 125 dB 125 dB 124 dB RA 47.5kΩ 3 CA 150pF A1 OP27 C3 0.47µF LF ROLLOFF OUT R5 100kΩ IN 6 2 R1 97.6kΩ R2 7.87kΩ R4 75kΩ C1 0.03µF OUTPUT C2 0.01µF R3 100Ω G = 1kHz GAIN R1 = 0.101 ( 1 + ) R3 = 98.677 (39.9dB) AS SHOWN 00317-041 Table 7. + Figure 41. Phono Preamplifier Circuit The OP27 brings a 3.2 nV/√Hz voltage noise and 0.45 pA/√Hz current noise to this circuit. To minimize noise from other sources, R3 is set to a value of 100 Ω, generating a voltage noise of 1.3 nV/√Hz. The noise increases the 3.2 nV/√Hz of the amplifier by only 0.7 dB. With a 1 kΩ source, the circuit noise measures 63 dB below a 1 mV reference level, unweighted, in a 20 kHz noise bandwidth. Gain (G) of the circuit at 1 kHz can be calculated by the expression: AUDIO APPLICATIONS Figure 41 is an example of a phono pre-amplifier circuit using the OP27 for A1; R1-R2-C1-C2 form a very accurate RIAA network with standard component values. The popular method to accomplish RIAA phono equalization is to employ frequency dependent feedback around a high quality gain block. Properly chosen, an RC network can provide the three necessary time constants of 3180 μs, 318 μs, and 75 μs. For initial equalization accuracy and stability, precision metal film resistors and film capacitors of polystyrene or polypropylene are recommended because they have low voltage coefficients, dissipation factors, and dielectric absorption. (High-k ceramic capacitors should be avoided here, though low-k ceramics, such as NPO types that have excellent dissipation factors and somewhat lower dielectric absorption, can be considered for small values.) R1 G 0.101 1 R3 For the values shown, the gain is just under 100 (or 40 dB). Lower gains can be accommodated by increasing R3, but gains higher than 40 dB show more equalization errors because of the 8 MHz gain bandwidth of the OP27. This circuit is capable of very low distortion over its entire range, generally below 0.01% at levels up to 7 V rms. At 3 V output levels, it produces less than 0.03% total harmonic distortion at frequencies up to 20 kHz. Capacitor C3 and Resistor R4 form a simple −6 dB per octave rumble filter, with a corner at 22 Hz. As an option, the switch selected Shunt Capacitor C4, a nonpolarized electrolytic, bypasses the low frequency roll-off. Placing the rumble filter’s high-pass action after the preamplifier has the desirable result of discriminating against the RIAA-amplified low frequency noise components and pickup produced low frequency disturbances. A preamplifier for NAB tape playback is similar to an RIAA phono preamplifier, though more gain is typically demanded, along with equalization requiring a heavy low frequency boost. The circuit in Figure 41 can be readily modified for tape use, as shown by Figure 42. Rev. G | Page 16 of 21 Data Sheet OP27 + OP27 – 15kΩ R1 33kΩ 10Ω C1 5mF R3 316kΩ R6 100Ω 0.01µF T1 = 3180µs T2 = 50µs – LOW IMPEDANCE MICROPHONE INPUT (Z = 50Ω TO 200Ω) The network values of the configuration yield a 50 dB gain at 1 kHz, and the dc gain is greater than 70 dB. Thus, the worstcase output offset is just over 500 mV. A single 0.47 μF output capacitor can block this level without affecting the dynamic range. R2 1kΩ R3 = R4 R1 R2 Common-mode input noise rejection will depend upon the match of the bridge-resistor ratios. Either close tolerance (0.1%) types should be used, or R4 should be trimmed for best CMRR. All resistors should be metal film types for best stability and low noise. Noise performance of this circuit is limited more by the Input Resistors R1 and R2 than by the op amp, as R1 and R2 each generate a 4 nV/√Hz noise, while the op amp generates a 3.2 nV/√Hz noise. The rms sum of these predominant noise R4 316kΩ For applications demanding appreciably lower noise, a high quality microphone transformer coupled preamplifier (Figure 44) incorporates the internally compensated OP27. T1 is a JE115K-E 150 Ω/15 kΩ transformer that provides an optimum source resistance for the OP27 device. The circuit has an overall gain of 40 dB, the product of the transformer’s voltage setup and the op amp’s voltage gain. C2 1800pF R1 121Ω R2 1100Ω 2 Amplifier bias-current transients that can magnetize a head present one potential tape head problem. The OP27 and OP37 are free of bias current transients upon power-up or powerdown. It is always advantageous to control the speed of power supply rise and fall to eliminate transients. A simple, but effective, fixed gain transformerless microphone preamp (Figure 43) amplifies differential signals from low impedance microphones by 50 dB and has an input impedance of 2 kΩ. Because of the high working gain of the circuit, an OP37 helps to preserve bandwidth, which is 110 kHz. As the OP37 is a decompensated device (minimum stable gain of 5), a dummy resistor, Rp, may be necessary if the microphone is to be unplugged. Otherwise, the 100% feedback from the open input can cause the amplifier to oscillate. OUTPUT Figure 43. Fixed Gain Transformerless Microphone Preamplifier The tape head can be coupled directly to the amplifier input, because the worst-case bias current of 80 nA with a 400 mH, 100 μ inch head (such as the PRB2H7K) is not troublesome. In addition, the dc resistance of the head should be carefully controlled and preferably below 1 kΩ. For this configuration, the bias current induced offset voltage can be greater than the 100 pV maximum offset if the head resistance is not sufficiently controlled. R7 10kΩ + Figure 42. Tape Head Preamplifier While the tape equalization requirement has a flat high frequency gain above 3 kHz (T2 = 50 μs), the amplifier need not be stabilized for unity gain. The decompensated OP37 provides a greater bandwidth and slew rate. For many applications, the idealized time constants shown can require trimming of R1 and R2 to optimize frequency response for nonideal tape head performance and other factors (see the References section). OP27/ OP37 RP 30kΩ 00317-043 R2 5kΩ R1 1kΩ T11 A1 OP27 6 OUTPUT 3 150Ω SOURCE R3 100Ω 1 T1 – JENSEN JE – 115K – E JENSEN TRANSFORMERS 00317-044 CA Figure 44. High Quality Microphone Transformer Coupled Preamplifier Gain can be trimmed to other levels, if desired, by adjusting R2 or R1. Because of the low offset voltage of the OP27, the output offset of this circuit is very low, 1.7 mV or less, for a 40 dB gain. The typical output blocking capacitor can be eliminated in such cases, but it is desirable for higher gains to eliminate switching transients. +18V 8 2 OP27 3 7 6 4 –18V 00317-045 RA 00317-042 TAPE HEAD sources is about 6 nV/√Hz, equivalent to 0.9 μV in a 20 kHz noise bandwidth, or nearly 61 dB below a 1 mV input signal. Measurements confirm this predicted performance. 0.47µF Figure 45. Burn-In Circuit Capacitor C2 and Resistor R2 form a 2 μs time constant in this circuit, as recommended for optimum transient response by the transformer manufacturer. With C2 in use, A1 must have unitygain stability. For situations where the 2 μs time constant is not necessary, C2 can be deleted, allowing the faster OP37 to be employed. Rev. G | Page 17 of 21 OP27 Data Sheet A 150 Ω resistor and R1 and R2 gain resistors connected to a noiseless amplifier generate 220 nV of noise in a 20 kHz bandwidth, or 73 dB below a 1 mV reference level. Any practical amplifier can only approach this noise level; it can never exceed it. With the OP27 and T1 specified, the additional noise degradation is close to 3.6 dB (or −69.5 referenced to 1 mV). REFERENCES 1. 2. 3. 4. 5. 6. Rev. G | Page 18 of 21 Lipshitz, S. R, “On RIAA Equalization Networks,” JAES, Vol. 27, June 1979, p. 458–481. Jung, W. G., IC Op Amp Cookbook, 2nd. Ed., H. W. Sams and Company, 1980. Jung, W. G., Audio IC Op Amp Applications, 2nd. Ed., H. W. Sams and Company, 1978. Jung, W. G., and Marsh, R. M., “Picking Capacitors,” Audio, February and March, 1980. Otala, M., “Feedback-Generated Phase Nonlinearity in Audio Amplifiers,” London AES Convention, March 1980, preprint 1976. Stout, D. F., and Kaufman, M., Handbook of Operational Amplifier Circuit Design, New York, McGraw-Hill, 1976. Data Sheet OP27 OUTLINE DIMENSIONS 0.400 (10.16) 0.365 (9.27) 0.355 (9.02) 8 5 1 0.280 (7.11) 0.250 (6.35) 0.240 (6.10) 4 0.100 (2.54) BSC 0.325 (8.26) 0.310 (7.87) 0.300 (7.62) 0.060 (1.52) MAX 0.210 (5.33) MAX 0.015 (0.38) MIN 0.150 (3.81) 0.130 (3.30) 0.115 (2.92) SEATING PLANE 0.022 (0.56) 0.018 (0.46) 0.014 (0.36) 0.195 (4.95) 0.130 (3.30) 0.115 (2.92) 0.015 (0.38) GAUGE PLANE 0.430 (10.92) MAX 0.005 (0.13) MIN 0.014 (0.36) 0.010 (0.25) 0.008 (0.20) COMPLIANT TO JEDEC STANDARDS MS-001 CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. CORNER LEADS MAY BE CONFIGURED AS WHOLE OR HALF LEADS. Figure 46. 8-Lead Plastic Dual-in-Line Package [PDIP] (N-8) P-Suffix Dimensions shown in inches and (millimeters) 0.005 (0.13) MIN 8 0.055 (1.40) MAX 5 0.310 (7.87) 0.220 (5.59) 1 4 0.100 (2.54) BSC 0.320 (8.13) 0.290 (7.37) 0.405 (10.29) MAX 0.060 (1.52) 0.015 (0.38) 0.200 (5.08) MAX 0.150 (3.81) MIN 0.200 (5.08) 0.125 (3.18) 0.023 (0.58) 0.014 (0.36) 0.070 (1.78) 0.030 (0.76) SEATING PLANE 15° 0° 0.015 (0.38) 0.008 (0.20) CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. Figure 47. 8-Lead Ceramic DIP – Glass Hermetic Seal [CERDIP] (Q-8) Z-Suffix Dimensions shown in inches and (millimeters) Rev. G | Page 19 of 21 070606-A 0.070 (1.78) 0.060 (1.52) 0.045 (1.14) OP27 Data Sheet 5.00 (0.1968) 4.80 (0.1890) 4.00 (0.1574) 3.80 (0.1497) 8 1 5 6.20 (0.2441) 5.80 (0.2284) 4 1.27 (0.0500) BSC 0.25 (0.0098) 0.10 (0.0040) COPLANARITY 0.10 SEATING PLANE 1.75 (0.0688) 1.35 (0.0532) 0.51 (0.0201) 0.31 (0.0122) 0.50 (0.0196) 0.25 (0.0099) 45° 8° 0° 1.27 (0.0500) 0.40 (0.0157) 0.25 (0.0098) 0.17 (0.0067) 012407-A COMPLIANT TO JEDEC STANDARDS MS-012-AA CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. Figure 48. 8-Lead Standard Small Outline Package [SOIC_N] Narrow Body (R-8) S-Suffix Dimensions shown in millimeters and (inches) REFERENCE PLANE 0.50 (12.70) MIN 0.185 (4.70) 0.165 (4.19) 0.100 (2.54) BSC 0.250 (6.35) MIN 0.050 (1.27) MAX 0.160 (4.06) 0.140 (3.56) 5 0.370 (9.40) 0.335 (8.51) 0.021 (0.53) 0.016 (0.40) 6 4 0.200 (5.08) BSC 0.335 (8.51) 0.305 (7.75) 7 3 2 SIDE VIEW 0.040 (1.02) MAX 0.100 (2.54) BSC 0.019 (0.48) 0.016 (0.41) 8 1 0.045 (1.14) 0.027 (0.69) 0.034 (0.86) 0.028 (0.71) BOTTOM VIEW 45° BSC 0.040 (1.02) 0.010 (0.25) COMPLIANT TO JEDEC STANDARDS MO-002-AK CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. Figure 49. 8-Lead Metal Can [TO-99] (H-08) J-Suffix Dimensions shown in inches and (millimeters) Rev. G | Page 20 of 21 01-15-2015-B BASE & SEATING PLANE Data Sheet OP27 ORDERING GUIDE Model1 OP27AJ/883C OP27GJZ OP27AZ OP27AZ/883C OP27EZ OP27GZ OP27EPZ OP27GPZ OP27GS OP27GS-REEL7 OP27GSZ OP27GSZ-REEL OP27GSZ-REEL7 OP27NBC 1 Temperature Range −55°C to +125°C −40°C to +85°C −55°C to +125°C −55°C to +125°C −25°C to +85°C −40°C to +85°C 0°C to +70°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C Package Description 8-Lead Metal Can (TO-99) 8-Lead Metal Can (TO-99) 8-Lead CERDIP 8-Lead CERDIP 8-Lead CERDIP 8-Lead CERDIP 8-Lead PDIP 8-Lead PDIP 8-Lead SOIC_N 8-Lead SOIC_N 8-Lead SOIC_N 8-Lead SOIC_N 8-Lead SOIC_N Die Z = RoHS Compliant Part ©1981–2015 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D00317-0-3/15(G) Rev. G | Page 21 of 21 Package Option J-Suffix (H-08) J-Suffix (H-08) Z-Suffix (Q-8) Z-Suffix (Q-8) Z-Suffix (Q-8) Z-Suffix (Q-8) P-Suffix (N-8) P-Suffix (N-8) S-Suffix (R-8) S-Suffix (R-8) S-Suffix (R-8) S-Suffix (R-8) S-Suffix (R-8)