tantalum and niobium oxide data libraries for insertion into

TANTALUM AND NIOBIUM OXIDE DATA LIBRARIES
FOR INSERTION INTO PSPICE SIMULATION
SOFTWARE
A KYOCERA GROUP COMPANY
TANTALUM DIVISION
Tantalum and Niobium Oxide Data library introduction
AVX has developed equivalent circuits for tantalum
and niobium oxide chip capacitors in PSpice library
format. These libraries are suitable for directly
importing into PSpice software. The libraries include
all electrical parameters for AVX tantalum and
niobium oxide series capacitors, that allow fast,
flexible creation and simulation of practical circuit
designs. While these library components have
analogous electrical behavior to actual components,
it is important to verify the design by use of the
simulated ratings in the completed circuit in order to
achieve the best solution. These libraries are
intended for use for both frequency and transient
simulations over the full operating temperature
range for each device. This article details the
content of the data libraries, their models, insertion
of the library data into PSpice and case studies for
some typical designs. The PSpice library can be a
powerful tool that enables the realization of flexible
design
solutions
with
minimum
physical
breadboarding, resulting in reduced overall time-tomarket.
0
R16
5k
0
0
C1
1n
+
R12
100M
0
R2
1
0
0
D1
120NQ045
0
C1
TAJA106K016R
C8
C9
L1
0.9mH
C10
+
0
0
0
C6
NOJC686K006R
1
SHUT
COMP
R1
50k
0
R8
2k
0
10
GND
8
9
4
5
13
14
R10
5
2
12
11
C_A
CT
E_A
RT
ERRERR+ C_B
E_B
CL+
CL-
+
7
6
1
2
R7
150
+
VIN
Q4
Q2N3703
U1
VREF
OSC
15
Q2N3703
+
R6
68
16
3
C3
100n
L1
0.9mH
+
C7
NOJC686K006R
Q3
+
R5
5k
R13
100M
C11
SG1524B
0
0
0
0
0
TPSV108K004R0035
TPSV108K004R0035
TPSV108K004R0035
TPSV108K004R0035
C2
+
TPSD107K010R0050
Description of equivalent circuit diagram
Revision 1.0
Capac itanc e
Capacitance (uF)
200
100
0
-100
100
1000
10000
100000
1000000
100000
1000000
fre que ncy (Hz)
ES R
10
ES R (Ohm)
The capacitor’s equivalent circuit diagram has been
modeled from ideal passive and semiconductor
components (C, R, L, and diode), which describe
the capacitor’s in-circuit behavior, including it’s
typical self-resonance. The equivalent circuit model
does include temperature dependence, even though
this is less significant for tantalum and niobium
dielectrics than for some other high dielectric
constant ceramic devices. There is no voltage
dependence included in the library, as tantalum and
niobium oxide dielectric characteristics are
independent of DC bias voltage. The reverse mode
for tantalum and niobium oxide dielectrics is
modeled by a diode integrated within the equivalent
circuit diagram, as tantalum and niobium oxide
dielectrics are polar components having an MIS
(Metal Insulator Semiconductor) structure. Modeled
Frequency
characteristics faithfully reproduce
actual device measurements as shown in figure 1.
Likewise, the simulated responses track identically
over temperature as shown in figure 2.
1
0.1
0.01
100
1000
10000
fre que ncy (Hz)
-measurement result
-simulation response
Figure 1. Comparison of actual device measurement
and library result for the same rating.
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Page 1
TANTALUM AND NIOBIUM OXIDE DATA LIBRARIES
FOR INSERTION INTO PSPICE SIMULATION
SOFTWARE
A KYOCERA GROUP COMPANY
TANTALUM DIVISION
Capac itanc e
Capacitance (uF)
200
100
Temperature -55°C
Temperature 25°C
0
Temperature 85°C
Temperature 125°C
ES R
-100
100
1000
10
100000
10000
1000000
Temperature -55°C
fre que ncy (Hz)
Temperature 25°C
ES R (Ohm)
1
Temperature 85°C
Temperature 125°C
0.1
0.01
100
1000
10000
100000
1000000
fre que ncy (Hz)
Figure 2. Simulated temperature dependence of capacitance and ESR
Graph of capacitance stability
Graph of ESR stability
12
10
11
10
9
8
7
ESR (:)
6
5
4
1
3
2
120
70
Temperature(°C)
80
40
50
20
10
DC bias
voltage (V)
60
3
0
90
6
4
1
100
7
5
2
110
120
100
110
80
70
Temperature(°C)
90
40
50
0,1
60
10
20
30
1
0
30
Capacitance (uF)
The graphs in figure 3 shown actual
measurement
of
tantalum
capacitors versus temperature and
DC bias. Neither tantalum nor
niobium oxide capacitors exhibit DC
bias dependence. Both tantalum
and niobium oxide capacitors show
small parametric dependence on
temperature which is included in
PSpice models.
7
6
5
4
3
2
1
0
DC bias
voltage (V)
Figure 3. Capacitance and ESR stability as a function of
temperature and DC bias
The structure and description of MicroSim and OrCAD PSpice
simulation software libraries
Each library consists of two files for implementation into PSpice
simulation software.
C1
TAJA106K010R
OrCAD Capture PSpice includes files with .LIB and .OLB file
extensions.
Files with a .LIB extension contain electrical parameters and
equivalent circuit diagrams for tantalum and niobium oxide devices.
The devices’ part number with circuit symbol is included in .OLB
files. A view of those files is shown in the figure 4 together with
parts symbol.
These libraries can be implemented into OrCAD Capture software
and used for schematic circuit design and subsequent simulation of
all electrical parameters as described at the next section.
Revision 1.0
A KYOCERA GROUP COMPANY
AVX_Tantalum.lib
AVX_Niobium
Oxide.lib
AVX_Tantalum
AVX_Niobium
Oxide
Figure 4. Symbol image view with
OrCAD Capture library files for both
Tantalum and Niobium Oxide
Page 2
TANTALUM AND NIOBIUM OXIDE DATA LIBRARIES
FOR INSERTION INTO PSPICE SIMULATION
SOFTWARE
A KYOCERA GROUP COMPANY
TANTALUM DIVISION
C1
A second file format was designed for using within MicroSim
and OrCAD versions of Schematics PSpice.
This library has a similar structure to OrCAD Capture. The
first library file has a .LIB file extension; it includes the model
structure for tantalum or niobium oxide components. The
second file is file has a .SLB extension and includes The
devices’ part number and circuit symbol for each tantalum or
niobium oxide part. A view of the .LIB, .SLB and symbol
image structure is shown in figure 5.
The Libraries are completely compatible with all versions of
both MicroSim and OrCAD Schematics PSpice software.
TAJA106K010R
AVX_Tantalum.lib
AVX_Niobium
Oxide.lib
AVX_Tantalum.slb
AVX_Niobium
Oxide.slb
Figure 5. OrCAD and MicroSim Schematics
library file extensions and circuit symbols
Installation both Tantalum and Niobium Oxide libraries into MicroSim and
OrCAD PSpice versions
Note: Library file insertion is similar for PSpice MicroSim, OrCAD Schematics and OrCAD Capture.
Library insertion into MicroSim and OrCAD Schematics PSpice versions
1. Load MicroSim or OrCAD Schematics before starting to insert the library.
2. It is recommended to save the .LIB and .SLB library files into the PSpice library directory.
3. At the “Analysis menu”, go to “Libraries and included files” and choose the “browse” option. Highlight
the desired library (eg AVX_Tantalum.LIB or AVX_NiobiumOxide.LIB), then click to open.
4. Install the library into PSpice by “Add Library*” button. Installation of the AVX_NiobiumOxide.LIB can be
done in the same way. When complete, click “OK”.
5. The next step is to install the .SLB files. At the top menu, choose “Options” then “Editor Configuration”
and “Library settings”
6. Using the “browse” option, choose the desired file (AVX_Tantalum.SLB or AVX_NiobiumOxide.SLB),
click “open” and in the “Library Settings” window click “Add*”. Finally click to OK to complete installation.
Insertion of library into OrCAD Capture.
1. Open OrCAD Capture design page.
2. Save required .LIB and .OLB library files into the PSpice library directory.
3. At the top Menu click “PSpice” menu and choose “Edit Simulation Profile”.
4. In the setting window, click “Libraries”, select “browse” button, choose desired AVX_Tantalum.LIB or
AVX_NiobiumOxide.LIB file, then click to open and go back to the “Simulation setting” window.
5. Install the file into PSpice by clicking “Add as Global” button. Repeat these steps for
AVX_NiobiumOxide.LIB installation.
6. For .OLB file installation, click “Place” at the top of the main menu then click “Part….”. At the “Place
Part” window. Choose “Add Library…” then “Browse” to select desired file (AVX_Tantalum.OLB or
AVX_NiobiumOxide.LIB) and click “Open”. The OLB file will be installed into the part browser. Repeat to
install the AVX_NiobiumOxide.OLB file.
7. To complete installation, click OK .
Once installation is complete, circuit design and simulation functions can be run.
Revision 1.0
A KYOCERA GROUP COMPANY
Page 3
TANTALUM AND NIOBIUM OXIDE DATA LIBRARIES
FOR INSERTION INTO PSPICE SIMULATION
SOFTWARE
A KYOCERA GROUP COMPANY
TANTALUM DIVISION
Example of circuit design creation, consequential simulation and
components evaluation
This section gives 3 worked examples (case studies I.-III.) of OrCAD Capture used to create PSpice
circuit diagram simulations.
Case study I.
20u
R1
1
0
V1
1V
+
Capacitance
10
C3
TAJA226K004R
1.0
0
0
100m
ESR
Figure 6. Basic circuit diagram for
frequency behavior measurement;
frequency response is shown in the
following graphs:
1.0K
1.0
10Hz
100Hz
1.0KHz
Impedance
10KHz
100KHz
1.0MHz
10MHz
Frequency
A component’s frequency characteristics are inserted into a basic filter circuit, which is then evaluated and
simulated in PSpice. The circuit design is evaluated with an AC source with frequency sweeping to
demonstrate output response. The frequency response is shown in the graphs below. All electrical
parameters of the capacitor can be simulated (the example shows capacitance, ESR and Impedance).
Case study II a.
50uH
Input voltage s ourc e
C1
TAJA226K006R
R2
5
Volta ge (V)
0.5
L1
+
R1
6
4
2
0
-2
850
851
852
853
854
853
854
853
854
Tim e (us )
R3
1u
L2
0.5
50uH
Volta ge (V)
R4
Output voltage on tantalum c apac itor
C2
22u_10V_Y5V
R6
5
R5
1u
2.322
2.32
2.318
2.316
2.314
850
851
852
Tim e (us )
Output voltage on c e ramic c apac itor
2.318
Volta ge (V)
V1
V2 = 5
PER = 1u
PW = 0.5u
2.317
2.316
850
851
852
Tim e (us )
The next examples are case studies II a) and II b). These compare the calculated PSpice source behavior
with measured parameters from real source. Case study II a) demonstrates how capacitors can filter an
ideal source voltage at the output stage. The ripple voltage is also shown for a tantalum and ceramic
device. In this case, tantalum capacitor has a smoother ripple characteristic than the ceramic, where
voltage spikes are present, although overall output filtering is similar. The same simulation is shown for
the same components in real voltage source (Case study II b), which was both measured and simulated in
PSpice. Most PSpice programs allow the insertion of a real signal source from an oscilloscope into a
circuit design. The resultant filtering is very similar to that obtained by simulation IIa.
Revision 1.0
A KYOCERA GROUP COMPANY
Page 4
TANTALUM AND NIOBIUM OXIDE DATA LIBRARIES
FOR INSERTION INTO PSPICE SIMULATION
SOFTWARE
Case study II b.
0.5
50uH
Volta ge (V)
V1
Source3.txt
L1
TANTALUM DIVISION
Input voltage s ourc e
C1
TAJA226K006R
t
+
R1
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R2
5
6
4
2
0
-2
0
1
2
3
4
3
4
63
74
Tim e (us )
V2
R3
1u
0
Output voltage on tantalum c apac itor
0
Volta ge (V)
2.5V
0
C2
22u_10V_Y5V
R4
L2
0.5
50uH
2.28
2.278
2.276
2.274
2.272
2.27
c
0
R6
5
0
2
Tim e (us )
Output voltage on c e ramic c apac itor
2.276
Volta ge (V)
R5
1u
1
2.275
2.274
2.273
30
0
41
52
Time e(us
(us) )
Tim
Case study III.
C1
R1
L1
in
input
V1
4n
out
90nH
0.01
+
+
V2
C2
0
0.1V
R2
+
+
C5
0.36
0
0
NOJD337K004R
NOJD337K004R
0
Output v o ltag e le v e l
Output voltage level
3
3 . 0V
Voltag e (V)
2.5
2
2 . 0V
1.5
Real measurement
1
PSpice simulation
1 . 0V
0.5
0
0V
0s
0
5
10
15
20
25
30
35
40
V( i n)
5us
V( out )
10 us
15us
20us
25u s
30 us
35us
40us
Ti me
Time (us )
Figure 7. Actual measurement (DC/DC converter o/p)
Figure 8. Simulated response (DC/DC converter o/p)
The last example (Case study III) demonstrates the flexibility of simulating a real DC/DC converter
application. An actual DC/DC converter was measured; the converter was overloaded because of high
output ripple voltage. The output voltage level was re-measured after inserting an LC (inductor and
Niobium Oxide) filter as shown in the “Real measurement” graph above. Next, the data from the DC/DC
converter output was fed into the PSpice simulator as the real source (green curve in figure 8). The LC
filter circuit used above was then created and the output simulated based the real source input data. The
simulation displays an identical response. This demonstrates how quickly a circuit design change can be
evaluated by the designer, using real equivalent circuits for all components in developmental circuit.
Revision 1.0
A KYOCERA GROUP COMPANY
Page 5
TANTALUM AND NIOBIUM OXIDE DATA LIBRARIES
FOR INSERTION INTO PSPICE SIMULATION
SOFTWARE
A KYOCERA GROUP COMPANY
TANTALUM DIVISION
Summary
A PSpice library of electronic components is a useful tool for fast, flexible electronic circuit design and
development. Component files from the library can be used for frequency and temperature analysis in
wide range of applications, also including transient investigation. Worked examples were used to
demonstrate the flexibility of these libraries; circuit designs can be evaluated using variety of components
together with tantalum and niobium oxide capacitors. Libraries are an integral part of any PSpice
program, which can incorporate equivalent circuit models for all real passive and active components.
An additional software program developed by AVX is SpiTanII. This software enables the designer to view
all basic characteristics and parameters for all ratings in all tantalum and niobium oxide capacitor series.
The designer can select a component by actual part number, or by reference to the desired capacitance,
rated voltage or case size, then display all basic parameters such as frequency dependence of
capacitance, ESR, Impedance, DF, plus ripple voltage and ripple current ratings. These parameters can
be saved and copied into other software programs or printed out. The SpiTanII software is aimed at
providing the designer a brief overview of all parameters of interest before starting the real simulation or
design.
USA
EUROPE
ASIA-PACIFIC
AVX Myrtle Beach, SC
Corporate Offices
Tel: 843-448-9411
Fax: 843-448-1943
AVX Limited, England
European Headquarters
Tel: +44 (0) 1252 770000
Fax: +44 (0) 1252 770001
AVX/Kyocera, Singapore
Asian-Pacific
Tel: (65) 258-2833
Fax: (65) 350-4880
AVX Northwest, WA
Tel: 360-669-8746
Fax: 360-699-8751
AVX S.A., France
Tel: +33 (1) 69.18.46.00
Fax: +33 (1) 69.28.73.87
AVX/Kyocera, Hong Kong
Tel: (852) 2-363-3303
Fax: (852) 2-765-8185
AVX North Central, IN
Tel: 317-848-8114
Fax: 317-844-9314
AVX GmbH, Germany
Tel: +49 (0) 8131 9004-0
Fax: +49 (0) 8131 9004-44
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Tel: (82) 2-785-6504
Fax: (82) 2-784-5411
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Tel: 508-485-8114
Fax: 508-485-8471
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Tel: +49 (0) 2741 2990
Fax: +49 (0) 2741 299299
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Tel: (886) 2-2696-4636
Fax: (886) 2-2696-4237
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Tel: 408-436-5400
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Tel: +390 (0)2 614571
Fax: +390 (0)2 614 2576
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Tel: (86) 21-6249-0314-16
Fax: (86) 21-6249-0313
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Tel: 602-539-1496
Fax: 602-539-1501
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Tel: +420 (0)467 558111
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Tel: (60) 4-228-1190
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Tel: 972-669-1223
Fax: 972-669-2090
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Tel: 045-943-2906/7
Fax: 045-943-2910
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Tel: 919-878-6357
Fax: 919-878-6462
Kyocera, Japan – AVX
Tel: (81) 75-604-3426
Fax: (81) 75-604-3425
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Tel: 905-564-8959
Fax: 905-564-9728
Kyocera, Japan – KDP
Tel: (81) 75-604-3424
Fax: (81) 75-604-3425
Niobium oxide capacitors are manufactured and sold under patent license from Cabot
Corporation, Boyertown, Pennsylvania U.S.A.
NOTICE: Specifications are subject to change without notice. Contact your nearest AVX Sales Office for the latest specifications.
All statements, information and data given herein are believed to be accurate and reliable, but are presented without guarantee,
warranty, or responsibility of any kind, expressed or implied. Statements or suggestions concerning possible use of our product
are made without responsibility or warranty that any such use is free of patent infringement and are not recommendations to
infringe any patent. The user should not assume that all safety measures are indicated or that other measures are indicated or that
measures may not be required. Specifications are typical and may not apply to all applications.
Revision 1.0
A KYOCERA GROUP COMPANY
Page 6