AME8510

RR-AME8510 _rev. B
Reliability Report
for
AME8510 Series Product
Approved by
Prepared by
Amy Shen
Eric Chen
Quality & Reliability Dept.
Manager
Quality & Reliability Dept.
Engineer
Conclusion:
The AME8510 series product has successfully met AME’s reliability standard that is required on all
AME, Inc products.
Furthermore, QRA Dept. of AME, Inc monitors the reliability continuously to make sure that all
AME8510 series product will still meet AME’s reliability standard in the future.
Table of Contents:
General Description
Product Information
Failures In Time Calculation
Product Reliability Test Result
Package Reliability Test Result
IR-reflow Test Result
General Description:
The AME8510 family allows the user to customize the CPU monitoring function without any external
components. The user has a large choice of reset voltage thresholds and output driver configurations, all of
which are preset at the factory. Each wafer is trimmed to the customer'
s specifications.
These circuits will ignore fast negative going transients on VDD. The state of the reset output is
guaranteed to be correct down to 1V.
After VDD crosses above a factory-preset threshold, the AME8510 assert a reset signal. After a
predetermined time (the “reset” interval) the reset is de-asserted. If VDD ever drops below the threshold
voltage a reset is asserted immediately. In addition to a supply monitoring function the AME8510 also
monitor transitions at the watch dog (WDI) input. If a logic transition does not occur at the WDI pin within a
certain time interval (the “watchdog” interval) then a reset is asserted. The reset de-asserts after the reset
interval, as explained earlier.
The AME8510 can both assert a reset manually by pulling the MRB input to ground.
Space saving SOT-25 packages and micropower quiescent current make this family a natural for
portable battery powered equipment.
Product Information:
Pin
Configuration
Operating
Temperature
Range
A:
E -40
1. Reset/
ResetB
2. GND
3. MRB
4. WDI
5. VDD
to 85
Num
Package ber
Type
Output Driver
of
Option
Pins
Reset
Watch
Time
Dog
(TD2NOM)
Interval
E:
V: 5 A: Pin1_RESETB/ PP F: TD=
SOT-2X
B: Pin1_RESETB/ OD 210ms
VIN Threshold
Special
Voltage (VTH)
Feature
D: 1000ms 22:VTH= 2.19V
L: Low profile
E: 1760ms 23:VTH= 2.32V
Y: Lead free &
C: Pin1_RESET/ PP
26:VTH= 2.63V
Low profile
D: Pin1_RESET/ OD
29:VTH= 2.93V
Z: Lead free
31:VTH= 3.08V
44:VTH= 4.38V
46:VTH= 4.63V
(Reset = Active High)
(ResetB = Active Low)
(PP = Push pull out)
(OD = Open Drain output
polarity)
Failures In Time Calculation:
Use HTOL test information mentioned in section
FIT = ( x 2 (ν ,
CL )
, FIT (Failures In Time) can be calculated as below:
× 10 9 ) /( 2 × S × H × AF ) = ( 4 .61 × 10 9 ) /( 2 × 77 × 1000 × 280 .59 )
9
=106.69 (pieces per 10 hours) @ 40
with 90% Confidence Level.
Where AF is acceleration factor setting activation energy to 1.0eV as zero failure.
Product Reliability Test Result:
Test Item
HTOL
Test Condition
Precondition
NOTE 1
Sample Size / Failures
Result
77 pcs / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
TSTRESS=125
Duration=1000hrs
Biased, Read at
168/504/1000 hours
ESD
Human Body Model
Pin-to-Pin test
Level 2, 2kV minimum
ESD
Machine Model
Pin-to-Pin test
Level 2, 200V minimum
Latch-up
Level 3, 100mA minimum
NOTE 1: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 245
(leaded) or 260
(lead-free).
Package Reliability Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
MSL
85/85 168 hours
22 pcs / 0 pcs
Level 1
45 pcs / 0 pcs
Pass
45 pcs / 0 pcs
Pass
45 pcs / 0 pcs
Pass
45 pcs / 0 pcs
Pass
5 pcs / 0 pcs
Pass
IR-reflow 3 cycles
Peak Temp.= 260
(lead-free)
IPC/JEDEC J-STD-020C
HTS
Precondition
NOTE 2
Temp.=150
Duration=1000 hours
Unbiased, Read at
168/504/1000 hours
THT
Precondition
NOTE 2
Temp.=85 , R.H.=85%
Duration=1000 hours
Unbiased, Read at
168/504/1000 hours
PCT
Precondition
NOTE 2
Temp.=121 , R.H.=100%
15PSIG, Unbiased
Duration=168 hours
Read at 168 hours
TCT
Precondition
-65
NOTE 2
~ 150
1000 cycles
Unbiased, Read at
500/1000 cycles
Solderability
Temp.=245
(leaded)
Temp.=260
(lead-free)
Duration=5sec
NOTE 2: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 245
(leaded) or 260
(lead-free).
IR-reflow Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
IR-reflow
See IR reflow Profile
22 pcs / 0 pcs
Pass
Perform 3 cycles test
IR reflow Profile:
Profile Feature
Average Ramp-Up Rate
(Tsmax to Tp)
Preheat
- Temperature Min (Tsmin)
- Temperature Max (Tsmax)
- Time (tsmin to tsmax)
Time maintained above
- Temperature (TL)
- Time (tL)
Peak/Classification Temperature (Tp)
Time within 5
of actual Peak
Temperature (tp)
Ramp-Down Rate
Time 25
to Peak Temperature
Sn-Pb Eutectic Assembly
Pb-Free Assembly
3 /second max.
3 /second max.
100
150
60~120 seconds
150
200
60~180 seconds
183
60~150 seconds
245
217
60~150 seconds
260
10~30 seconds
20~40 seconds
6 /second max.
6 minutes max.
6 /second max.
8 minutes max.