Reliability Report for AME8846 Cu Wire Series Product ______________________________________________________________________ Prepared by Jess Lin, Supervisor of Quality & Reliability Dept. Approved by Amy Shen, Manager of Production Management Dept. REL-AME8846-Cu-B Table of Contents: Ⅰ、General Description Ⅱ、Product Information Ⅲ、Failures In Time Calculation Ⅳ、Product Reliability Test Result Ⅴ、Package Reliability Test Result Ⅵ、IR-reflow Test Result REL-AME8846-Cu-B Ⅰ、General Description: The AME8846A/B family of positive CMOS linear regulators provides ultra low-dropout voltage (210mV @3A) and low quiescent current (typically 600uA), thus making them ideal for power-saving system. These rugged devices have both Thermal Shutdown and Current limit to prevent device failure under the "Worst" of operating conditions. The AME8846A/B also provides SS time in order to reduce inrush current in different applications. Ⅱ、Product Information: Enable Pin Function A: Internal Pull High B: Internal Pull Low Pin Configuration A (SOP-8/PP) A (DFN-10B) 1. 2. 3. 4. 5. 6. 7. 8. PG EN IN VCNTL NC OUT ADJ GND Package Type V: DFN Z: SOP-8/PP Number of Pins A: 8 V: 10 Output Options ADJ: Adjustable 1. OUT 2. OUT 3. OUT 4. ADJ 5. PG 6. EN 7. IN 8. IN 9. IN 10. VCNTL REL-AME8846-Cu-B Ⅲ、Failures In Time Calculation: Use HTOL test information mentioned in section FIT = ( x 2 (ν , CL ) Ⅳ, FIT (Failures In Time) can be calculated as below: × 10 9 ) /( 2 × S × H × AF ) = ( 4 .61 × 10 9 ) /( 2 × 77 × 1000 × 280 .59 ) 9 =106.57 (pieces per 10 hours) @ 40 ℃ with 90% Confidence Level. Where AF is acceleration factor setting activation energy to 1.0eV as zero failure. Ⅳ、Product Reliability Test Result: Test Item Test Condition Sample Size / Failures Result HTOL TSTRESS=125 77 pcs / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass 3 pcs package pair / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass ℃ Duration=1000hrs Biased, Read at 168/504/1000 hours ESD Human Body Model Pin-to-Pin test Class 1C, 1.5kV minimum Machine Model Pin-to-Pin Test Class B, 200V minimum Charged Device Model Class II, 200V minimum Latch-up Level A, 100mA minimum REL-AME8846-Cu-B Ⅴ、Package Reliability Test Result: Test Item Test Condition Sample Size / Failures Result MSL 85/85 168 hours 22 pcs / 0 pcs Level 1 77 pcs / 0 pcs Pass 77 pcs / 0 pcs Pass 77 pcs / 0 pcs Pass 77 pcs / 0 pcs Pass 5 pcs / 0 pcs Pass IR-reflow 3 cycles Peak Temp.= 260 ℃ IPC/JEDEC J-STD-020C HTS Precondition Temp.=150 NOTE 1 ℃ Duration=1000 hours Unbiased, Read at 1000 hours THT Precondition NOTE 1 ℃ Temp.=85 , R.H.=85% Duration=1000 hours Unbiased, Read at 1000 hours PCT Precondition Temp.=121 NOTE 1 ℃, R.H.=100% 15PSIG, Unbiased Duration=168 hours Read at 168 hours TCT Precondition -65 NOTE 1 ℃ ~ 150℃ 500 cycles Unbiased, Read at 500 cycles Solderability Temp.=260 ℃ (lead-free) Duration=5sec NOTE 1: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 260 ℃ REL-AME8846-Cu-B Ⅵ、IR-reflow Test Result: Test Item Test Condition Sample Size / Failures Result IR-reflow See IR reflow Profile 22 pcs / 0 pcs Pass Perform 3 cycles test IR reflow Profile: Profile Feature Average Ramp-Up Rate (Tsmax to Tp) Preheat - Temperature Min (Tsmin) - Temperature Max (Tsmax) - Time (tsmin to tsmax) Time maintained above - Temperature (TL) - Time (tL) Peak/Classification Temperature (Tp) Time within 5° of actual Peak Temperature (tp) Ramp-Down Rate Time 25° to Peak Temperature C C Sn-Pb Eutectic Assembly Pb-Free Assembly 3° /second max. 3° /second max. C C C 100° 150° 60~120 seconds C C C C C 150° 200° 60~180 seconds C C 183° 60~150 seconds 245° 217° 60~150 seconds 260° 10~30 seconds 20~40 seconds C 6° /second max. 6 minutes max. C 6° /second max. 8 minutes max. REL-AME8846-Cu-B The product has successfully met AME’s reliability standard that is required on all AME, Inc products. Furthermore, QRA Dept. of AME, Inc monitors the reliability continuously to make sure that all product will still meet AME’s reliability standard in the future. REL-AME8846-Cu-B