IDT IDT74SSTU32864BF

IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
1:1 AND 1:2 REGISTERED
BUFFER WITH 1.8V SSTL I/O
FEATURES:
DESCRIPTION:
•
•
•
•
•
•
•
•
1:1 and 1:2 registered buffer
1.8V Operation
SSTL_18 style clock and data inputs
Differential CLK input
Control inputs compatible with LVCMOS levels
Flow-through architecture for optimum PCB design
Latch-up performance exceeds 100mA
ESD >2000V per MIL-STD-883, Method 3015; >200V using
machine model (C = 200pF, R = 0)
• Available in 96-pin LFBGA package
The SSTU32864/A is a 25-bit 1:1 / 14-bit 1:2 configurable registered
buffer designed for 1.7V to 1.9V VDD operation. All clock and data inputs
are compatible with the JEDEC standard for SSTL_18. The control inputs
are LVCMOS. All outputs are 1.8V CMOS drivers that have been optimized
to drive the DDR2 DIMM load.
The SSTU32864/A operates from a differential clock (CLK and CLK).
Data are registered at the crossing of CLK going high and CLK going low.
The C0 input controls the pinout configuration of the 1:2 pinout from the
A configuration (when low) to B configuration (when high). The C1 input
controls the configuration from the 25-bit 1:1 (when low) to 14-bit 1:2 (when
high).
This device supports low-power standby operation. When the reset input
(RESET) is low, the differential input receivers are disabled, and undriven
(floating) data, clock, and reference voltage (VREF) inputs are allowed. In
addition, when RESET is low all registers are reset, and all outputs are
forced low. The LVCMOS RESET and Cx inputs must always be held at
a valid logic high or low level.
To ensure defined outputs from the register before a stable clock has
been supplied, RESET must be held in the low state during power up.
In the DDR2 DIMM application, RESET is specified to be completely
asynchronous with respect to CLK and CLK. Therefore, no timing
relationship can be guaranteed between the two. When entering reset, the
register will be cleared and the outputs will be driven low quickly, relative
to the time to disable the differential input receivers. However, when coming
out of a reset, the register will become active quickly, relative to the time to
enable the differential input receivers. As long as the data inputs are low,
and the clock is stable during the time from the low-to-high transition of
RESET until the input receivers are fully enabled, the design of the
SSTU32864/A must ensure that the outputs will remain low, thus ensuring
no glitches on the outputs.
The device monitors both DCS and CSR inputs and will gate the outputs
from changing states when both DCS and CSR inputs are high. If either
DCS or CSR input is low, the device will function normally. The RESET
input has priority over the DCS control and will force the inputs low. If the
DCS control functionality is not desired, then the CSR input can be hardwired to ground, in which case the set-up time requirement for DCS would
be the same as for the other D data inputs.
APPLICATIONS:
•
•
•
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IDT74SSTU32864/A
Ideally suited for DDR2 DIMM registered applications
SSTU32864 is optimized for DDR2 Raw Cards B and C R-DIMMs
SSTU32864A is optimized for DDR2 Raw Card A R-DIMMs
Along with CSPU877, zero delay PLL clock buffer, provides
complete solution for DDR2 DIMMs
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
COMMERCIAL TEMPERATURE RANGE
AUGUST 2003
1
c
2003 Integrated Device Technology, Inc.
DSC-5980/17
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
FUNCTIONAL BLOCK DIAGRAM (1:2)
RESET
CLK
CLK
VREF
DCKE
QCKEA
1D
C1
R
DODT
QCKEB
QODTA
1D
C1
R
DCS
QODTB
QCSA
1D
C1
R
QCSB
CSR
Dx
O
1
QxA
1D
C1
R
TO 10 OTHER CHANNELS
2
QxB
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
PIN CONFIGURATION (TYPE A)
6
QCKEB
Q2B
Q3B
QODTB
Q5B
Q6B
C0
QCSB
ZOL
Q8B
Q9B
Q10B
Q11B
Q12B
Q13B
Q14B
5
QCKEA
Q2A
Q3A
QODTA
Q5A
Q6A
C1
QCSA
ZOH
Q8A
Q9A
Q10A
Q11A
Q12A
Q13A
Q14A
4
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
VDD
3
VREF
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
VREF
2
NC
NC
NC
NC
NC
NC
RESET
DCS
CSR
NC
NC
NC
NC
NC
NC
NC
1
DCKE
D2
D3
DODT
D5
D6
NC
CLK
CLK
D8
D9
D10
D11
D12
D13
D14
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
96-PIN LFBGA
1:2 REGISTER (TYPE A, FRONTSIDE)
TOP VIEW
PIN CONFIGURATION (TYPE B)
6
Q1B
Q2B
Q3B
Q4B
Q5B
Q6B
C0
QCSB
ZOL
Q8B
Q9B
Q10B
QODTB
Q12B
Q13B
QCKEB
5
Q1A
Q2A
Q3A
Q4A
Q5A
Q6A
C1
QCSA
ZOH
Q8A
Q9A
Q10A
QODTA
Q12A
Q13A
QCKEA
4
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
VDD
3
VREF
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
VREF
2
NC
NC
NC
NC
NC
NC
RESET
DCS
CSR
NC
NC
NC
NC
NC
NC
NC
1
D1
D2
D3
D4
D5
D6
NC
CLK
CLK
D8
D9
D10
DODT
D12
D13
DCKE
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
96-PIN LFBGA
1:2 REGISTER (TYPE B, BACKSIDE)
TOP VIEW
3
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
FUNCTIONAL BLOCK DIAGRAM (1:1)
RESET
CLK1
CLK1
VREF
DCKE
1D
C1
QCKE
C1
QOTD
C1
QCS
C1
Qx
R
DODT
1D
R
DCS
1D
R
CSR
Dx
O
1
1D
R
TO 21 OTHER CHANNELS
4
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
PIN CONFIGURATION
6
NC
Q15
Q16
NC
Q17
Q18
C0
NC
ZOL
Q19
Q20
Q21
Q22
Q23
Q24
Q25
5
QCKE
Q2
Q3
QODT
Q5
Q6
C1
QCS
ZOH
Q8
Q9
Q10
Q11
Q12
Q13
Q14
4
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
VDD
3
VREF
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
GND
VDD
VREF
2
NC
D15
D16
NC
D17
D18
RESET
DCS
CSR
D19
D20
D21
D22
D23
D24
D25
1
DCKE
D2
D3
DODT
D5
D6
NC
CLK
CLK
D8
D9
D10
D11
D12
D13
D14
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
*Rows 3 and 4 are reserved for VDD and GND.
96-PIN LFBGA
1:1 REGISTER
TOP VIEW
96 BALL LFBGA PACKAGE ATTRIBUTES
6
5
4
3
2
1
A
B
C
D
E
F
G
H
5
J
K
L
M
N
P
R
T
T
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
FUNCTION TABLE (EACH FLIP-FLOP) (1)
Inputs
Qx
QCSx
QODTx, QCKEx
RESET
DCS
CSR
CLK
CLK
Dx, DODT, DCKE
Outputs
Output
Outputs
H
L
L
↑
↓
L
L
L
L
H
L
L
↑
↓
H
H
L
H
(2)
Q0(2)
H
L
L
L or H
L or H
X
Q0
H
L
H
↑
↓
L
L
L
L
H
L
H
↑
↓
H
H
L
H
(2)
Q0
(2)
Q0(2)
H
L
H
L or H
L or H
X
Q0
H
H
L
↑
↓
L
L
H
L
H
H
L
↑
↓
H
H
H
H
H
H
L
L or H
L or H
X
Q0(2)
Q0(2)
Q0(2)
H
H
H
↑
↓
L
Q0(2)
H
L
H
↑
↓
H
Q0
(2)
H
H
Q0
(2)
H
H
H
H
H
L or H
L or H
X
L
X or Floating
X or Floating
X or Floating
X or Floating
X or Floating
NOTES:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
↑ = LOW to HIGH
↓ = HIGH to LOW
2. Output level before the indicated steady-state conditions were established.
MODE SELECT
C0
C1
Device Mode
0
0
1:1 25-bit to 25-bit
0
1
1:2 14-bit to 28-bit, Front (Type A)
1
0
Reserved
1
1
1:2 14-bit to 28-bit, Back (Type B)
6
L
Q0
(2)
Q0
(2)
L
Q0(2)
L
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS (1)
Symbol
VDD
VI
(2,3)
Description
Supply Voltage Range
Max.
Unit
–0.5 to 2.5
V
Input Voltage Range
–0.5 to 2.5
V
VO(2,3)
Output Voltage Range
–0.5 to VDD +0.5
V
IIK
Input Clamp Current
±50
mA
±50
mA
±50
mA
±100
mA
–65 to +150
°C
VI < 0
VI > VDD
IOK
Output Clamp Current VO < 0
VO > VDD
IO
Continuous Output Current,
VO = 0 to VDD
VDD
Continuous Current through each
VDD or GND
TSTG
Storage Temperature Range
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. The input and output negative voltage ratings may be exceeded if the ratings of the
I/P and O/P clamp current are observed.
3. This value is limited to 2.5V maximum.
TERMINAL FUNCTIONS (ALL PINS)
Terminal
Name
Electrical
Characteristics
GND
Ground Input
Ground
VDD
1.8V nominal
Power Supply Voltage
Description
VREF
0.9V nominal
Input Reference Voltage
ZOH(1)
Input
Reserved for future use
ZOL(1)
Input
Reserved for future use
CLK
Differential Input
Positive Master Clock Input
CLK
Differential Input
Negative Master Clock Input
Cx
LVCMOS Input
Configuration Control Inputs
RESET
LVCMOS Input
Asynchronous Reset Input. Resets registers and disables VREF data and clock differential-input receivers.
CSR, DCS
SSTL_18 Input
Chip Select Inputs. Disables outputs Dx switching when both inputs are HIGH.
Dx
SSTL_18 Input
Data Input. Clocked in on the crossing of the rising edge of CLK and the falling edge of CLK.
DODT
SSTL_18 Input
The outputs of this register bit will not be suspended by the DCS and CSR controls
DCKE
SSTL_18 Input
The outputs of this register bit will not be suspended by the DCS and CSR controls
Qx
1.8V CMOS
Data Outputs that are suspended by the DCS and CSR controls
QCSx
1.8V CMOS
Data Output that will not be suspended by the DCS and CSR controls
QODTx
1.8V CMOS
Data Output that will not be suspended by the DCS and CSR controls
QCKEx
1.8V CMOS
Data Output that will not be suspended by the DCS and CSR controls
NOTE:
1. The signals will be left unconnected.
7
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
OPERATING CHARACTERISTICS, TA = 25ºC (1,2)
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
Supply Voltage
1.7
—
1.9
V
VREF
Reference Voltage
0.49 * VDD
0.5 * VDD
0.51 * VDD
V
V TT
Termination Voltage
VREF– 40mV
VREF
VREF+ 40mV
V
0
—
VDD
V
VI
Input Voltage
VIH
AC High-Level Input Voltage
Data Inputs
VREF+ 250mV
—
—
V
VIL
AC Low-Level Input Voltage
Data Inputs
—
—
VREF– 250mV
V
VIH
DC High-Level Input Voltage
Data Inputs
VREF+ 125mV
—
—
V
VIL
DC Low-Level Input Voltage
Data Inputs
—
—
VREF– 125mV
V
VIH
High-Level Input Voltage
RESET, Cx
0.65 * VDD
—
—
V
VIL
Low-Level Input Voltage
RESET, Cx
—
—
0.35 * VDD
V
VICR
Common Mode Input Voltage
CLK, CLK
0.675
—
1.125
V
VID
Differential Input Voltage
CLK, CLK
600
—
—
mV
IOH
High-Level Output Current
—
—
TBD
mA
IOL
Low-Level Output Current
—
—
TBD
TA
Operating Free-Air Temperature
0
—
70
°C
NOTES:
1. The RESET and Cx inputs of the device must be held at valid levels (not floating) to ensure proper device operation.
2. The differential inputs must not be floating unless RESET is LOW.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Operating Condition: TA = 0°C to +70°C, VDD = 1.8V ±0.1V
Symbol
Test Conditions
Min.
Typ.
VOH
VDD = 1.7V to 1.9V, IOH = – TBD mA
TBD
VOL
VDD = 1.7V to 1.9V, IOL = TBD mA
—
All Inputs
VI = VDD or GND
—
Static Standby
IO = 0, VDD = 1.9V, RESET = GND
—
II
IDD
IDDD
Parameter
Max.
Unit
—
—
V
—
TBD
V
—
±5
µA
—
100
µA
Static Operating
IO = 0, VDD = 1.9V, RESET = VDD, VI = VIH (AC) or VIL (AC)
—
—
TBD
mA
Dynamic Operating
IO = 0, VDD = 1.8V, RESET = VDD, VI = VIH (AC) or VIL (AC),
—
—
—
µA/Clock
(Clock Only)
CLK and CLK Switching 50% Duty Cycle.
1:1 Mode
—
—
—
1:2 Mode
—
—
—
2.5
—
3.5
IO = 0, VDD = 1.8V, RESET = VDD,
MHz
µA/Clock
Dynamic Operating
VI = VIH (AC) or VIL (AC), CLK and CLK Switching at
(Per Each Data Input)
50% Duty Cycle. One Data Input Switching at
Data Inputs
VI = VREF ± 250mV
CLK and CLK
VICR = 0.9V, VID = 600mV
2
—
3
RESET
VI = VDD or GND
—
—
—
Half Clock Frequency, 50% Duty Cycle.
CI
8
MHz/Data
Input
pF
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
TIMING REQUIREMENTS OVER RECOMMENDED OPERATING FREE-AIR
TEMPERATURE RANGE
VDD = 1.8V ± 0.1V
Symbol
Min.
Max.
Unit
Clock Frequency
—
270
MHz
Pulse Duration, CLK, CLK HIGH or LOW
1
—
ns
tACT(1,2)
Differential Inputs Active Time
—
TBD
ns
tINACT(1,3)
Differential Inputs Inactive Time
—
TBD
ns
fCLOCK
tw
Parameter
tSU
Setup Time
tH
Hold Time
DCS before CLK↑, CLK↓, CSR HIGH
0.7
—
DCS before CLK↑, CLK↓, CSR LOW
0.5
—
DODT, CSR, Data, and DCKE before CLK↑, CLK↓
0.5
—
Data, DCS, CSR, DCKE, and DODT after CLK↑, CLK↓
0.5
—
ns
ns
NOTES:
1. This parameter is not production tested.
2. Data and VREF inputs must be low a minimum time of tACT max, after RESET is taken HIGH.
3. Data, VREF, and clock inputs must be held at valid levels (not floating) a minimum time of tINACT max, after RESET is taken LOW.
SWITCHING CHARACTERISTICS OVER RECOMMENDED FREE-AIR OPERATING
RANGE (UNLESS OTHERWISE NOTED) (1)
VDD = 1.8V ± 0.1V
Symbol
fMAX
tPDM(2)
tPDMSS(2,4)
tRPHL
dV/dt_r
dV/dt_f
dV/dt_∆(5)
Parameter
Min
270
1.41(3)
—
—
1
1
—
CLK and CLK to Q
CLK and CLK to Q (simultaneous switching)
RESET to Q
Output slew rate from 20% to 80%
Output slew rate from 20% to 80%
Output slew rate from 20% to 80%
NOTES:
1. See TEST CIRCUITS AND WAVEFORMS.
2. Includes 350ps of test load transmission line delay.
3. For reference only. Final values to be determined.
4. This parameter is not production tested.
5. Difference between dV/dt_r (rising edge rate) and dV/dt_f (falling edge rate).
9
Max.
—
2.15(3)
2.35(3)
3
4
4
1
Unit
MHz
ns
ns
ns
V/ns
V/ns
V/ns
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS (VDD = 1.8V ± 0.1V)
VDD
DUT
RL = 1KΩ
TL = 50Ω
CLK
CLK
CLK Inputs
TL = 350ps, 50Ω
Out
Test Point
(1)
CL = 30 pF
RL = 1KΩ
Test Point
RL = 100Ω
Load Circuit
Test Point
VDD
LVCMOS
RESET
Input
VDD/2
VDD/2
0V
CLK
tACT
tINACT
IDD(2)
VICR
CLK
90%
VICR
tPLH
10%
Output
VID
tPHL
VTT
VTT
VOH
VOL
Voltage and Current Waveforms
Inputs Active and Inactive Times
Voltage Waveforms - Propagation Delay Times
tW
Input
VICR
VICR
VID
LVCMOS
RESET
Input
Voltage Waveforms - Pulse Duration
VIH
VDD/2
VIL
tRPHL
VOH
Output
CLK
VICR
VTT
VOL
VID
CLK
Voltage Waveforms - Propagation Delay Times
tSU
tH
VIH
Input
VREF
VREF
VIL
Voltage Waveforms - Setup and Hold Times
NOTES:
1. CL includes probe and jig capacitance.
2. IDD tested with clock and data inputs held at VDD or GND, and IO = 0mA
3. All input pulses are supplied by generators having the following characteristics: PRR ≤10MHz, ZO = 50Ω, input slew rate = 1 V/ns ±20% (unless otherwise specified).
4. The outputs are measured one at a time with one transition per measurement.
5. VTT = VREF = VDD/2
6. VIH = VREF + 250mV (AC voltage levels) for differential inputs. VIH = VDD for LVCMOS input.
7. VIL = VREF - 250mV (AC voltage levels) for differential inputs. VIL = GND for LVCMOS input.
8. VID = 600mV.
9. tPLH and tPHL are the same as tPDM.
10
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS (VDD = 1.8V ± 0.1V)
VDD
DUT
RL = 50Ω
Out
Test Point
CL = 10 pF
(1)
Load Circuit: High-to-Low Slew-Rate Adjustment
Output
VOH
80%
20%
dv_f
VOL
dt_f
Voltage Waveforms: High-to-Low Slew-Rate Adjustment
DUT
Out
Test Point
CL = 10 pF
(1)
RL = 50Ω
Load Circuit: Low-to-High Slew-Rate Adjustment
dt_r
VOH
dv_r
80%
20%
VOL
Output
Voltage Waveforms: Low-to-High Slew-Rate Adjustment
NOTES:
1. CL includes probe and jig capacitance.
2. All input pulses are supplied by generators having the following characteristics: PRR ≤10MHz, ZO = 50Ω, input slew rate = 1 V/ns ±20% (unless otherwise specified).
11
IDT74SSTU32864/A
1:1 AND 1:2 REGISTERED BUFFER WITH 1.8V SSTL I/O
COMMERCIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
XX
XX
SSTU
Family
Temp. Range
XXX
XX
Device Type Package
Low Profile, Fine Pitch, Ball Grid Array
BF
BFG Very Fine Pitch Ball Grid Array, Green
864 1:1 and 1:2 Registered Buffer with 1.8V SSTL I/O
864A
CORPORATE HEADQUARTERS
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Santa Clara, CA 95054
32
Extra Wide
74
0°C to +70°C
for SALES:
800-345-7015 or 408-727-6116
fax: 408-492-8674
www.idt.com
12
for Tech Support:
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