TECHNICAL DATA Interface Transceiver of RS-232 Standard with One Supply Voltage ILX3232 DESCRIPTION The ILX3232 is a 3.3V powered EIA/TIA-232 and V.28/V.24 communication interface with low power requirements, high data-rate capabilities. ILX3232 has a proprietary low dropout transmitter output stage providing true RS-232 performance from 3.3vVto 5.5V supplies. The device requires only four small 0.1 µF standard external capacitors for operations from 3.3V supply. The ILX3232 has two receivers and two drivers. The device is guaranteed to run at data rates of 120Kbps while maintaining RS-232 output levels. Typical applications are Notebook, Subnotebook and Palmtop Computers, Battery Powered Equipment, Hand-Held Equipment, Peripherals and Printers. FEATURES 300 µA SUPPLY CURRENT 120Kbps MAX GUARENTEED DATA RATE 3V/µs MINIMUM GUARANTEED SLEW RATE ENHANCED ESD SPECIFICATIONS: ±15kV IEC61000-4-2 Air Discharge ±8kV IEC61000-4-2 Contact Discharge AVAILABLE IN DIP-16, SO-16,TSSOP16 AND TSSOP 16 SOP16L(W) Ordering Information ILX3232N Plastic DIP ILX3232D SOIC ILX3232TSD TSSOP о ТА= from -40 to 85 С for all packages PIN CONFIGURATION 2015. November. rev.10 ILX3232 PIN DESCRIPTION PlN N° SYMBOL NAME AND FUNCTION 1 C1+ Positive Terminal for the first Charge Pump Capacitor 2 V+ 3 C1 Doubled Voltage Terminal Negative Terminal for the first Charge Pump Capacitor 4 C2+ 5 C2 Positive Terminal for the second Charge Pump Capacitor Negative Terminal for the second Charge Pump Capacitor 6 V- 7 T2OUT Inverted Voltage Terminal Second Transmitter Output Voltage 8 R2IN 9 R2OUT Second Receiver Output Voltage 10 T2IN Second Transmitter Input Voltage First Transmitter Input Voltage Second Receiver Input Voltage 11 T1IN 12 R1OUT 13 R1IN 14 T1OUT 15 GND Ground 16 VCC Supply Voltage First Receiver Output Voltage First Receiver Input Voltage First Transmitter Output Voltage ABSOLUTE MAXIMUM RATING Symbol Parameter Value Unit VCC Supply Voltage -0.3 to 6 V V+ Doubled Voltage Terminal (VCC - 0.3) to 7 V V- Inverted Voltage Terminal 0.3 to -7 V 13 V -0.3 to 6 V ± 25 V ± 13.2 V V+ +|V-| TIN Transmitter Input Voltage Range RIN Receiver Input Voltage Range TOUT ROUT Transmitter Output Voltage Range Receiver Output Voltage Range -0.3 to (VCC + 0.3) V Ta Operating Temerature -40 to 85 °C Ts Storage Temperature -60 to 150 °C Transmitter Output Short to GND Time Continuous tSHORT * Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. V+ and V-can have a maximum magnitude of +7V, but their absolute addition cannot exceed 13 V. 2015. November. rev.10 ILX3232 ELECTRICAL CHARACTERISTICS (C1 - C4 = 0.1µF, VCC = 3.3V to 5.5V, TA = -40 to 85°C, unless otherwise specified. Typical values are referred to TA = 25°C) Symbol ISUPPLY Parameter VCC Power Supply Current Test Conditions Min. No Load VCC = 3.3V ±10% TA = 25°C No Load VCC = 5V ±10% TA = 25°C Typ. Max. Unit 2.5 5 mA 6 10 mA Typ. Max. Unit 0.8 LOGIC INPUT ELECTRICAL CHARACTERISTICS (C1 - C4 = 0.1µF, VCC = 3.3V to 5.5V, TA = -40 to 85°C, unless otherwise specified. Typical values are referred to TA = 25°C) Symbol VTIL VTIH Parameter Test Conditions Input Logic Threshold Low Input Logic Threshold High T-IN (Note 1) VCC = 3.3V VCC = 5V T-IN Min. ± 0.01 ±1 V V V µA Min. Typ. Max. Unit VCC = 5.0V ±5 ± 5.4 VCC = 3.3V ± 3.5 ± 4.0 300 10M 2 2.4 Input Leakage Current IIL Note1: Transmitter input hysteresis is typically 250mV TRANSMITTER ELECTRICAL CHARACTERISTICS (C1 - C4 = 0.1µF tested at VCC = 3.3V to 5.5V, TA = -40 to 85°C, unless otherwise specified. Typical values are referred to TA = 25°C) Symbol Parameter Test Conditions VTOUT Output Voltage Swing All Transmitter outputs are loaded with 3KΩ to GND RTOUT ITSC Transmitter Output Resistance Output Short Circuit Current VCC = V+ = V- = 0V VOUT = ± 2V VCC = 3.3V to 5V VOUT = 0V V Ω ± 60 mA Max. Unit 25 V RECEIVER ELECTRICAL CHARACTERISTICS (C1 - C4 = 0.1µF tested at VCC = 3.3V to 5.5V, TA = -40 to 85°C, unless otherwise specified. Typical values are referred to TA = 25°C) Symbol VRIN VRIL VRIH Parameter Receiver Input Voltage Operating Range RS-232 Input Threshold Low TA = 25°C TA = 25°C VCC = 3.3V VCC = 5V RS-232 Input Threshold High TA = 25°C TA = 25°C VCC = 3.3V VCC = 5V VRIHYS Input Hysteresis RRIN VROL Input Resistance VROH Test Conditions TTL/CMOS Output Voltage Low TTL/CMOS Output Voltage High Min. Typ. -25 0.6 0.8 1.2 1.5 1.5 1.8 V 2.4 2.4 V 7 kΩ 0.4 V 0.3 TA = 25°C IOUT = 1.6mA 3 VCC = 3.3V IOUT = 3.2mA VCC = 5.5V IOUT = -0.5mA VCC = 3.3V IOUT = -1mA VCC = 5.5V 5 VCC-0.6 VCC-0.1 V V 2015. November. rev.10 ILX3232 TIMING CHARACTERISTICS (C1 - C4 = 0.1µF, VCC = 3.3V to 5.5V, TA = -40 to 85°C, unless otherwise specified. Typical values are referred to TA = 25°C) Symbol Parameter DR Data Transfer Rate tPHLR tPLHR tPHLT tPLHT |tPHLR - tPLHR| |tPHLT - tPLHT| Propagation Delay Input to Output Propagation Delay Input to Output Receiver Propagation Delay Difference Transmitter Propagation Delay Difference SRT Transition Slew Rate Test Conditions CL2= 1000pF one transmitter switching RL = 3KΩ Min. Typ. VCC=3.3V Max. Unit 120 Kbps RXIN = RXOUT CL = 150pF 4.0 9.7 µs RL = 3KΩ CL = 2500pF 2.0 5.0 µs TA = 25°C RL = 3KΩ to 7KΩ VCC = 3.3V measured from +3V to -3V or -3V to +3V CL = 150pF to 1000pF 300 ns 300 ns 3 30 V/µs Transmitter Skew is measured at the transmitter zero cross points APPLICATION CIRCUITS CAPACITANCE VALUE (µF) VCC C1 C2 C3 C4 Cbypass 3.0 to 5.5 1.0 1.0 1.0 1.0 1.0 2015. November. rev.10 ILX3232 TYPICAL OPERATING CHARACTERISTICS (VCC = +3.3V, 120kbps data rate, 0.1μF capacitors, all transmitters loaded with 3k, TA = +25°C, unless otherwise noted.) TRANSMITTER OUTPUT VOLTAGE vs. LOAD CAPACITANCE SLEW RATE vs. LOAD CAPACITANCE 2015. November. rev.10 ILX3232 ESD PROTECTION The ILX3232 incorporates ruggedized ESD cells on all driver output and receiver input pins. The ESD structure is for rugged applications and environments sensitive to electro -static discharges and associated transients. The ESD tolerance is at least ±15kV without damage or latch-up. There are different methods of ESD testing applied: a) MIL-STD-883, Method 3015.7 b) IEC1000-4-2 Air-Discharge The Human Body Model has been the generally accepted ESD testing method for semiconductors. This method is also specified in MIL-STD- 883, Method 3015.7 for ESD testing. The premise of this ESD testi s to simulate the human body’s potential to store electro-static energy and discharge it to an integrated circuit. The simulation is performed by using a test model as shown in Figure 1. This method will test the IC’s capability to withstand an ESD transient during normal handling such as in manufacturing areas where the ICs tend to be handled frequently. The IEC-1000-4-2, formerly IEC801-2, is generally used for testing ESD on equipment and systems. For system manufacturers, they must guarantee a certain amount of ESD protection since the system itself is exposed to the outside environment and human presence. The premise with IEC1000-4-2 is that the system is required to withstand an amount of static electricity when ESD is applied to points and surfaces of the equipment that are accessible to personnel during normal usage. The transceiver IC receives most of the ESD current when the ESD source is applied to the connector pins. The test circuit for IEC1000-4-2 is shown on Figure 2. There are two methods within IEC1000-4-2, the Air Discharge method and the Contact Discharge method. With the Air Discharge Method, an ESD voltage is applied to the equipment under test (EUT) through air. This simulates an electrically charged person ready to connect a cable onto the rear of the system only to find an unpleasant zap just before the person touches the back panel. The high energy potential on the person discharges through an arcing path to the rear panel of the system before he or she even touches the system. This energy, whether discharged directly or through air, is predominantly a function of the discharge current rather than the discharge voltage. Variables with an air discharge such as approach speed of the object carrying the ESD potential to the system and humidity will tend to change the discharge current. For example, the rise time of the discharge current varies with the approach speed. Fig. 1 ESD Test Circuit for Human Body Model The Contact Discharge Method applies the ESD current directly to the EUT. This method was devised to reduce the unpredictability of the ESD arc. The discharge current rise time is constant since the energy is directly transferred without the air-gap arc. In situations such as hand held systems, the ESD charge can be directly discharged to the equipment from a person already holding the equipment. The current is transferred on to the keypad or the serial port of the equipment directly and then travels through the PCB and finally to the IC. 2015. November. rev.10 ILX3232 The circuit models in Figures 1 and 2 represent the typical ESD testing circuits used for these methods. The CS is initially charged with the DC power supply when the first switch (SW1) is on. Now that the capacitor is charged, the second switch (SW2) is on while SW1 switches off. The voltage stored in the capacitor is then applied through RS, the current limiting resistor, onto the device under test (DUT). In ESD tests, the SW2 switch is pulsed so that the device under test receives a duration of voltage. Fig. 2. ESD Test Circuit for IEC1000-4-2 Fig. 3. ESD Test Waveform for IEC1000-4-2 For the Human Body Model, the current limiting resistor (R ) and the source capacitor (C ) are 1.5kΩ S S an 100pF, respectively. For IEC-1000-4-2, the current limiting resistor (R ) and the source capacitor (C ) are S S 330Ω an 150pF, respectively. The higher C value and lower R value in the IEC1000-4-2 model are more S S stringent than the Human Body Model. The larger storage capacitor injects a higher voltage to the test point when SW2 is switched on. The lower current limiting resistor increases the current charge onto the test point. Device Pin Tested Driver Outputs Receiver Inputs IEC1000-4-2 Air Discharge Level ±15kV ±15kV 4 4 2015. November. rev.10 ILX3232 N SUFFIX PLASTIC DIP (MS - 001BB) A Dimension, mm 9 16 Symbol MIN MAX A 18.67 19.69 B 6.1 7.11 B 1 8 C F L C 5.33 D 0.36 0.56 F 1.14 1.78 G 2.54 H 7.62 -T- SEATING PLANE N G K M H D J 0.25 (0.010) M T NOTES: 1. Dimensions “A”, “B” do not include mold flash or protrusions. Maximum mold flash or protrusions 0.25 mm (0.010) per side. J 0 10 K 2.92 3.81 L 7.62 8.26 M 0.2 0.36 N 0.38 D SUFFIX SOIC (MS - 012AC) Dimension, mm A 16 9 H B 1 G P 8 R x 45 C -TK D SEATING PLANE J 0.25 (0.010) M T C M NOTES: 1. Dimensions A and B do not include mold flash or protrusion. 2. Maximum mold flash or protrusion 0.15 mm (0.006) per side for A; for B ‑ 0.25 mm (0.010) per side. F M Symbol MIN MAX A 9.8 10 B 3.8 4 C 1.35 1.75 D 0.33 0.51 F 0.4 1.27 G 1.27 H 5.72 J 0 8 K 0.1 0.25 M 0.19 0.25 P 5.8 6.2 R 0.25 0.5 2015. November. rev.10 ILX3232 2015. November. rev.10