VISHAY DALE THIN FILM www.vishay.com Resistive Products Technical Note Vishay Thin Film Engineering Test Report PTN CHIP RESISTOR - SURGE IMMUNITY TESTING 1. Background Surge immunity or electromagnetic compatibility can be defined as the ability of a system or device to withstand continuous or pulsed/transient energy from external sources without having an adverse effect on its performance. In this document we report the results of transient surge immunity testing on the Vishay Thin Film PTN product line over a range of voltage pulse levels. 2. Experimental Equipment and Methods Surge immunity testing for this study was conducted according to IEC standard 60115-1, paragraph 4.27 using the 1.2/50 μs waveform. Samples for the testing were selected from three different case sizes and values as detailed in table below. SAMPLE DETAILS CASE SIZE RESISTANCE VALUE Low Critical High 0603 10 25.2 k 150 k 1206 10 40.2 k 1 M 2512 10 40.2 k 1 M To facilitate the application of voltage pulses to the device under test (DUT), samples were mounted to FR-4 test cards and inserted into a testing fixture as shown in Figure 1 below. Revision: 19-Apr-12 Document Number: 60118 1 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 TECHNICAL NOTE Fig. 1 - Test Fixture Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report Voltage pulses, following the 1.2/50 μs waveform, were generated using a Schaffner NSG650 High Energy Pulse Generator. Prior to conducting the testing, the voltage waveform was verified using a Tektronix TDS3034B oscilloscope. This measured waveform is shown in Figure 2 below. U 1.0 B 0.9 0.5 T2 0.3 A 0.1 0.0 O1 T Front time: Time to half-value: Fig. 2 - 1.2/50 μs Waveform Verification t 30 % max. T1 T1 = 1.67× T = 1.2 μs ± 30 % T2 = 50 μs ± 20 % Fig. 3 - Waveform of Open-circuit Voltage (1.2/50 μs ìs) at the Output of the Generator with no CDN connected (waveform definition according to IEC 60060-1) Testing was conducted by subjecting sample groups of 10 resistors to incrementally higher voltage pulses, starting with 200 V, until a resistance delta greater than 0.5 % was observed. New samples were used for each voltage pulse level. Due to the pulse generator lower voltage limit of 200 V, the low-value chips ( 1 k) were tested in series instead of individually, as was the case on the higher resistance values. Once again, new groups of samples were used for each voltage pulse level. 3. Results and Discussion As previously stated, the low-value resistors were tested in series. The resultant voltage drop across the resistors is reflected in the reported pulse test voltage levels in Table 2. As the data shows, Vishay’s low-value PTN resistors are minimally affected up to 30 V and 40 V for the larger case sizes and 20 V for the smaller case sizes. PULSE TEST RESULTS SUMMARY SAMPLE DESCRIPTION PTN0603 10 PTN0603 25.2 k PTN0603 150 k TECHNICAL NOTE PTN1206 10 PTN1206 40.2 k PTN1206 1 M PTN2512 10 PTN2512 40.2 k PTN2512 1 M DELTA RESULTS Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. 20 25 - 0.204 0.131 0.048 0.798 30 40 80 PULSE TEST VOLTAGE LEVEL 120 200 400 600 800 1000 1200 1400 1600 - 0.057 - 0.007 - 0.001 0.005 - 0.156 0.188 - 0.156 0.099 - 0.129 2.275 - 0.016 0.002 1800 - 0.002 0.000 - 0.001 0.004 - 0.002 0.000 - 0.001 0.004 - 0.006 - 0.001 0.001 0.006 - 0.037 0.002 - 0.002 0.009 - 0.069 0.011 - 0.029 0.011 0.000 0.004 - 0.001 0.000 - 0.001 0.004 - 0.001 0.001 0.000 0.004 - 0.001 0.000 0.000 0.003 0.000 0.003 0.001 .000 0.000 0.000 0.004 0.004 0.006 0.004 0.000 0.000 0.000 - 0.001 0.000 0.001 0.002 0.002 - 0.005 0.002 0.000 0.002 - 0.001 0.001 - 0.005 0.002 0.000 0.001 - 0.012 0.000 - 0.002 0.002 - 0.006 - 0.001 0.000 0.002 -0 012 0.004 - 0.001 0.001 - 0.006 0.002 - 0.001 0.001 - 0.012 0.002 - 0.002 - 0.001 - 0.003 - 0.003 2.527 0.009 0.006 0.006 0.039 6.894 - 0.003 0.000 - 0.002 - 0.009 - 0.039 1.653 0.001 0.003 0.004 0.005 0.861 4.362 - 0.001 0.001 - 0.010 - 0.005 - 0.001 0.001 - 0.007 0.002 - 0.001 0.000 - 0.009 0.000 This pulse test data is also presented in graphical format in Figures 4 through 7 of Appendix A. Revision: 19-Apr-12 Document Number: 60118 2 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report 4. Conclusion Based on the results of this work, it can be concluded that Vishay’s PTN product line is able to withstand high pulse loads, with minimal effect on performance, when tested in accordance to IEC 60115-1 requirements. Appendix A TECHNICAL NOTE Fig. 4 - Low Value Pulse Test Results Fig. 5 - 0603 Case Size Pulse Test Results Revision: 19-Apr-12 Document Number: 60118 3 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report TECHNICAL NOTE Fig. 6 - 1206 Case Size Pulse Test Results Fig. 7 - 2512 Case Size Pulse Test Results Revision: 19-Apr-12 Document Number: 60118 4 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000