02001

REVISIONS
LT
A
DESCRIPTION
DATE
APPROVED
Add pure tin prohibition, manufacturer eligibility, pulse
application paragraphs and table IV. Changes to
paragraphs 3.6, 3.12, 3.13, 4.4.1 and table V.
Deletion of power conditioning and overload tests.
Editorial changes throughout.
11 JAN 11
M. Radecki
CURRENT DESIGN ACTIVITY CAGE CODE 037Z3
HAS CHANGED NAMES TO:
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
Prepared in accordance with ASME Y14.100
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Source control drawing
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PREPARED BY
Dennis L. Cross
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OH
Original date of drawing
CHECKED BY
Andrew R. Ernst
18 July 2002
TITLE:
RESISTOR, FIXED, FILM, PRECISION, CHIP
1/8 WATT, STYLE 2012
APPROVED BY
Kendall A. Cottongim
SIZE
A
REV
AMSC N/A
CODE IDENT. NO.
037Z3
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DWG NO.
02001
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OF
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5905-E676
1. SCOPE
1.1 Scope. This drawing describes the requirements for a fixed, film, chip, 1/8 watt, precision resistor, style 2012.
1.2 Part or Identifying Number (PIN). The complete PIN is as follows:
02001

Drawing
number
1K050


Resistance
(3.3.1 and
3.5)
T


Resistance
tolerance
(3.3.2)
C


Temperature
characteristic
(3.4)
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of
this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-55342 -- Resistors, Fixed, Film, Chip, Nonestablished Reliability, Established Reliability, Space Level,
General Specification For.
*
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202
MIL-STD-690
MIL-STD-790
*
- Tests Methods for Electronic and Electrical Components Parts.
- Failure Rate Sampling Plans and Procedures.
- Standard Practice for Established Reliability and High Reliability Qualified Products List (QPL)
Systems for Electrical Electronic, and Fiber Optic Parts Specifications.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Non-Government publications. The following documents form a part of this document to the extent specified
herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
*
NATIONAL CONFERENCE OF STANDARDS LABORATORIES (NCSL)
NCSL Z540.3
- Requirements for the Calibration of Measuring and Test Equipment.
(Copies of this document are available from http://www.ncsli.org or from the National Conference of Standards
th
Laboratories (NCSL) International, 1800 30 Street, Suite 305, Boulder, CO 80301-1026.)
*
2.3 Order of precedence. Unless otherwise noted herein or in the event of a conflict between the text of this document
and the references cited herein, the text of this document takes precedence. Nothing in this document, however,
supersedes applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be as specified herein.
DEFENSE SUPPLY CENTER, COLUMBUS
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3.2 Interface and physical dimensions. The chip resistor shall meet the interface and physical dimensions as specified
herein (see figure 1).
A
B
C
D
E
0.200 ±0.020
0.096 ±0.015
0.040 ±0.010
0.125 ±0.005
0.050 ±0.010
Inches
0.005
0.010
0.015
0.020
0.040
mm
0.127
0.254
0.381
0.508
1.020
Inches
0.050
0.096
0.125
0.200
mm
1.270
2.440
3.180
5.080
Notes:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only.
FIGURE 1. Resistor, fixed, film, precision, chip.
3.3 Electrical characteristics.
3.3.1 Resistance. The nominal resistance is expressed in ohms and identified by five characters, consisting of four
digits and a letter. The letter is used simultaneously as a decimal point and as a multiplier. For resistance values:
a. Greater than or equal to 10 ohms but less than 1 kilohm, the letter “R” is used to represent a decimal point.
b. Greater than or equal to 1 kilohm but less than 100 kilohms, the letter “K” is used to represent the decimal point.
All digits preceding and following the letters R and K of the group represent significant figures. Minimum and maximum
resistance values shall be as specified herein (see 3.5). The standard values for every decade shall follow the sequence
specified in table I for the resistance tolerances D and F. The resistance values for tolerances T, Q, A, and B maybe any
value within the limits specified herein, but it is preferred that the values be chosen from the tighter tolerance columns of
table I.
3.3.2 Resistors tolerance. Resistors are available in tolerances (T) ±.01 percent, (Q) ±.02 percent, (A) ±.05 percent,
(B) ±.1 percent, (C) ±.25 percent, (D) ±.5 percent, and (F) ±1.0 percent.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
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TABLE I. Standard resistance values for the 10 to 100 decade.
T, Q, A,
B, D
10.0
10.1
10.2
10.4
10.5
10.6
10.7
10.9
11.0
11.1
11.3
11.4
11.5
11.7
11.8
12.0
12.1
12.3
12.4
12.6
12.7
12.9
13.0
13.2
13.3
13.5
13.7
13.8
14.0
14.2
14.3
14.5
F
10.0
10.2
10.5
10.7
11.0
11.3
11.5
11.8
12.1
12.4
12.7
13.0
13.3
13.7
14.0
14.3
T, Q, A,
B, D
14.7
14.9
15.0
15.2
15.4
15.6
15.8
16.0
16.2
16.4
16.5
16.7
16.9
17.2
17.4
17.6
17.8
18.0
18.2
18.4
18.7
18.9
19.1
19.3
19.6
19.8
20.0
20.3
20.5
20.8
21.0
21.3
F
14.7
15.0
15.4
15.8
16.2
16.5
16.9
17.4
17.8
18.2
18.7
19.1
19.6
20.0
20.5
21.0
Resistance tolerance
T, Q, A,
F
T, Q, A,
B, D
B, D
21.5
21.5
31.6
21.8
32.0
22.1
22.1
32.4
22.3
32.8
22.6
22.6
33.2
22.9
33.6
23.2
23.2
34.0
23.4
34.4
23.7
23.7
34.8
24.0
35.2
24.3
24.3
35.7
24.6
36.1
24.9
24.9
36.5
25.2
37.0
25.5
25.5
37.4
25.8
37.9
26.1
26.1
38.3
26.4
38.8
26.7
26.7
39.2
27.1
39.7
27.4
27.4
40.2
27.7
40.7
28.0
28.0
41.2
28.4
41.7
28.7
28.7
42.2
29.1
42.7
29.4
29.4
43.2
29.8
43.7
30.1
30.1
44.2
30.5
44.8
30.9
30.9
45.3
31.2
45.9
F
31.6
32.4
33.2
34.0
34.8
35.7
36.5
37.4
38.3
39.2
40.2
41.2
42.2
43.2
44.2
45.3
T, Q, A,
B, D
46.4
47.0
47.5
48.1
48.7
49.3
49.9
50.5
51.1
51.7
52.3
53.0
53.6
54.2
54.9
55.6
56.2
56.9
57.6
58.3
59.0
59.7
60.4
61.2
61.9
62.6
63.4
64.2
64.9
65.7
66.5
67.3
F
46.4
47.5
48.7
49.9
51.1
52.3
53.6
54.9
56.2
57.6
59.0
60.4
61.9
63.4
64.9
66.5
T, Q, A,
B, D
68.1
69.0
69.8
70.6
71.5
72.3
73.2
74.1
75.0
75.9
76.8
77.7
78.7
79.6
80.6
81.6
82.5
83.5
84.5
85.6
86.6
87.6
88.7
89.8
90.9
92.0
93.1
94.2
95.3
96.5
97.6
98.8
F
68.1
69.8
71.5
73.2
75.0
76.8
78.7
80.6
82.5
84.5
86.6
88.7
90.9
93.1
95.3
97.6
3.4 Temperature characteristics. Resistors are available with temperature coefficient codes C or F as specified in
table II.
TABLE II. Characteristic.
Resistance temperature characteristic (referenced to 25°C) (ppm/°C)
Temperature °C
-55
-15
+65
+125
RTC
*
code
Min
Max
Min
Max
Min
Max
Min
Max
C
-10
10
-10
10
-10
10
-10
10
F
-10
10
-5
5
-5
5
-10
10
3.5 Resistance range. The resistance range shall be from 15 ohms to 100 kilohms.
3.6 Reactance. If circuit reactance is critical for your application, contact the sources of supply listed herein (see 6.7)
for the circuit reactance characteristics.
3.7 Power rating. The power rating shall be 0.125 watt at +85°C. For operation at temperature in excess of +85°C,
derate in accordance with figure 2.
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3.8 Voltage rating. The maximum continuous working voltage shall not exceed 200 volts.
3.9 Maximum weight. The maximum weight shall not exceed 0.00221 pound (1 gram).
3.10 Termination finish. Termination material shall be in accordance with MIL-PRF-55342 code letter B, except the
termination may consist of a solder coated, formed metal lead that egresses from the ends of the body and is formed
around the bottom seating area of the device.
3.11 Pure tin. The use of pure tin, as an underplate or final finish is prohibited both internally and externally. Tin
content of resistor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3
percent lead, by mass (see 6.3).
*
3.12 Thermal shock. When resistors are tested as specified in 4.6, there shall be no evidence of mechanical damage;
the change in resistance shall be within the resistance tolerances specified in table IV of the group A tests.
*
3.13 DC resistance. When resistors are tested as specified in 4.5, the dc resistance shall be within the specified
tolerance of the nominal resistance (see 3.3.1) except for resistance tolerances ±.01, ±.02, ±.05 percent .
additional tolerances testing is required on some lots after the group A test to meet the final tolerance limit for all
product deliverable on the contract..
3.14 Solderability. When resistors are tested as specified in MIL-PRF-55342 and 4.7, the immersed metallized surface
shall be at least 95 percent covered with a new clean smooth coating.
3.15 Life. When resistors are tested as specified in 4.8, there shall be no evidence of mechanical damage. The
change in resistance between the initial measurement and any of the succeeding measurements, up to and including
1,000 hours, shall not exceed ±.1 percent.
3.16 Resistance temperature characteristic. When resistors are tested as specified in 4.9, the resistance temperature
characteristic, at each of the temperatures specified in 4.9c, referred to 25°C ±5°C, and shall not exceed the value
specified in table II for the applicable characteristic.
3.17 Dielectric withstanding voltage. When resistors are tested as specified in 4.10, there shall be no evidence of
flashover, mechanical damage, arching, or insulation breakdown. The change in resistance shall not exceed ±(.05
percent +.001 ohm).
3.18 Insulation resistance. When resistors are tested as specified in 4.11, the insulation resistance shall be not less
than 10,000 megohms.
3.19 Low temperature operation. When resistors are tested as specified in 4.12, there shall be no evidence of
mechanical damage. The change in resistance shall not exceed ±(0.05 percent).
3.20 Solder mounting integrity. When resistors are tested as specified in MIL-PRF-55342 and 4.13 herein there shall
be no evidence of mechanical damage.
3.21 Resistance to bonding exposure. When resistors are tested as specified in 4.14, there shall be no evidence of
mechanical damage. The change in resistance shall not exceed ±(.075 percent +.001 ohm).
3.22 Moisture resistance. When resistors are tested as specified in 4.15 there shall be no evidence of mechanical
damage. The power applied shall be 0.1 watt not to exceed rated voltage as a load voltage on all samples. The change in
resistance shall not exceed ±(.1 percent +.001 ohm).
3.23 High temperature exposure. When resistors are tested as specified in 4.16, there shall be no evidence of
mechanical damage. The change in resistance shall not exceed ±(.2 percent +.001 ohm). Following this test, the
dielectric withstanding voltage shall be as specified in 3.17, and the insulation resistance shall be 1,000 megohms
minimum.
3.24 Shock (specified pulse). When resistors are tested as specified in 4.17, there shall be no evidence of mechanical
or electrical damage. The change in resistance shall not exceed ±(.01 percent +.001 ohm). There shall be no electrical
discontinuity during the test.
DEFENSE SUPPLY CENTER, COLUMBUS
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3.25 Resistance to solvents. When resistors are tested as specified in 4.18, there shall be no evidence of mechanical
damage and the markings shall remain legible.
NOTE: This curve indicates the percentage of nominal wattage to be applied at temperatures
higher than 85°C for the same ∆R that would occur at 85°C during life testing.
However, at no time shall the applied voltage exceed the maximum rated voltage.
FIGURE 2. Derating curves for various ambient temperatures.
3.26 Current noise. When resistors are tested as specified in 4.19, the current noise index shall not exceed –32dB
from 10 ohms to 1 kilohm, -15db from 1.01 kilohms to 10 kilohms, and 0db from 10.1 kilohms to 100 kilohms, unless
otherwise specified.
3.27 Visual inspection. Resistors shall be inspected as specified in 4.20, to verify that the interface, physical
dimensions, marking, and workmanship are in accordance with the applicable requirements (see 3.2 and 3.31).
3.28 Marking. Due to size limitations, this style resistor shall be marked with the following minimum information:
1K05: - First four characters of the resistance value code.
00TY: - Last two characters of resistance value code, tolerance, and temperature characteristic.
Each unit package shall be marked with the PIN assigned herein (see 1.2) and manufacturer's identification code
(CAGE or logo). Where manufacturers are able to provide more information, the following is preferred in the sequence
presented: Style, manufacturer’s trademark, production lot code, and source code.
3.29 Recycled, recovered, or environmentally preferable materials. Recycled, recovered, or environmentally preferable
materials should be used to the maximum extent possible provided that the material meets or exceeds the operational
and maintenance requirements, and promotes economically advantageous life cycle costs.
*
3.30 Manufacturer eligibility. To be eligible for listing as a approved source of supply, a manufacturer shall be listed on
the MIL-PRF-55342 Qualified Products List for at least one part, or perform the group A and group C inspections specified
herein on a sample agreed upon by the manufacturer and DLA Land and Maritime-VAT.
*
3.30.1 Certificate of compliance. A certificate of compliance shall be required from manufacturers requesting to be an
approved source of supply.
3.31 Workmanship. Resistors shall be uniform in quality and free from defects that will affect life, serviceability, or
appearance.
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4. VERIFICATION
4.1 Qualification inspection. Qualification inspection is not applicable to this document.
4.2 Reliability assurance program. The reliability assurance provisions specified in MIL-PRF-55342 and maintained in
accordance with MIL-STD-790 are not applicable to this document.
4.3 Failure rate qualification. Failure rate qualification specified in MIL-PRF-55342 and MIL-STD-690 is not applicable
to this document.
4.4 Conformance inspection.
4.4.1 Inspection of product for delivery. Inspection of product for delivery shall consist of group A and group B
inspections:
4.4.1.1 Group A inspection. Group A inspection shall consist of the inspections specified in table III, and shall be made
on the same set of sample units, in the order shown.
*
TABLE III. Group A inspection.
Inspection
Subgroup I
Thermal shock
DC resistance 1/
Subgroup II
Visual inspection
Subgroup III
Solderability 2/
Requirement
paragraph
Test method
paragraph
Number of samples
3.12
3.13
4.6
4.5
100
percent
3.27
4.20
13
3.14
4.7
5
*
1/ The resistance measurement made upon completion of the thermal shock test may be
used if a measurement has been made which can, without conversion, be directly related
to nominal resistance value and tolerance (see table IV).
*
2/ The manufacturer may request the deletion of the Subgroup III solderability test, provided
an in-line or process control system for assessing and assuring the solderability of
terminations can be validated and approved by DLA Land and Maritime-VAT. Deletion of
the test does not relieve the manufacturer from meeting this test requirement in case of
dispute. If the design, material, construction, or processing of the part is changed, or if
there are any quality problems, DLA Land and Maritime-VAT may require resumption of
the test.
*
TABLE IV. Group A resistance tolerance limits.
Tolerances
(± percent)
1.0
0.5
0.25
0.10
0.05
0.02
0.01
DEFENSE SUPPLY CENTER, COLUMBUS
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Group A initial
tolerance limit
(percent)
±0.90
±0.45
±0.20
±0.075
±0.075
±0.075
±0.075
Group A final
tolerance limit
(percent)
±1.0
±0.50
±0.25
±0.10
±0.10
±0.10
±0.10
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*
4.4.1.2 Subgroup I. Subgroup I tests shall be performed on 100 percent of the product supplied under this
specification. Resistors that are out of resistance tolerance per the requirement of table IV for this test shall be removed
from the lot. Lots having more than 5 percent total rejects or one resistor, which ever is greater, shall not be furnished on
the contract.
4.4.1.3 Subgroup II. A sample of 13 parts shall be randomly selected, if one or more defects are found, the lot shall be
rescreened and defects removed. A new sample of 13 parts shall then be randomly selected. If one or more defects are
found in this second sample, the lot shall be rejected and shall not be supplied against this document.
4.4.1.4 Subgroup III (solderability). A sample of 5 parts shall be randomly selected, as an option; the manufacturer
may use electrical rejects from subgroup I test for all or part of the sample. If there are one or more defects, the lot is
rejected. The manufacturer may use the following for corrective action:
a. Each lot that was used to form the failed lot shall be individually submitted to the solderability test. Lots that pass
the solderability test are available for shipment.
b. The failed lot is submitted to a 100 percent hot solder dip. A subsequent solderability test shall then be performed.
If the lot passes, it is available for shipment; if the lot fails, the manufacturer may perform the hot solder dip one
additional time. If the lot fails, the lot is considered rejected and shall not be supplied to this drawing.
4.4.1.4.1 Disposition of samples. The solderability test is considered a destructive test and samples submitted to the
solderability test shall not be supplied on the contract.
4.4.2 Group B inspection. Group B inspection shall consist of the inspections specified in table V, in the
order shown.
4.4.2.1 Certification. The acquiring activity, at its discretion, may accept a certificate of compliance with group B
requirements in lieu of performing group B tests (see 6.2c).
TABLE V. Group B inspection.
Inspection
Requirement
Paragraph
Test method
paragraph
Number of
sample units
for inspection
Number of
failures
allowed
Subgroup I
Life
3.15
4.8
5
0
Subgroup II
Resistance temperature characteristic
Dielectric withstanding voltage
Insulation resistance
Low temperature operation
Solder mounting integrity
3.16
3.17
3.18
3.19
3.20
4.9
4.10
4.11
4.12
4.13
5
0
Subgroup III
Resistance to bonding exposure
Moisture resistance
3.21
3.22
4.14
4.15
5
0
Subgroup IV
High temperature exposure
Shock (specified pulse)
3.23
3.24
4.16
4.17
5
0
Subgroup V
Resistance to solvents
Current noise
3.25
3.26
4.18
4.19
5
0
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4.4.2.2 Action in case of failure. If any of the subgroups fail Group B testing and an appropriate lot screen can be
established the lot shall be screened and a new set of samples (see table V for number of samples), from the screened
lot, shall be submitted to the subgroup(s) that failed. If one or more defects are found in the resubmitted samples, the lot
shall be rejected and shall not be supplied to this specification.
4.4.2.3 Disposition of sample units. Sample units which have been subjected to group B inspections shall not be
supplied to this specification.
4.5 DC resistance. (see 3.13). Resistors shall be tested in accordance with method 303 of MIL-STD-202. The
following details and exceptions shall apply:
a. Measuring apparatus: Different types of measuring test equipment (multimeter, bridges, or equivalent) are
permitted to be used on the initial and final readings of this test, provided the equipment is the same style, model,
or if it can be shown that the performance of the equipment is equivalent. All test equipment shall be calibrated in
accordance with NCSL Z540.3.
b. Limit of error of measuring apparatus shall not exceed one-fourth of the resistor tolerance or the resistance change
limit for which the measurement is being made. Manufacturers, at their option, may use the apparatus of less
accuracy, provided limits are reduced to fully compensate for accuracy deviation.
c. Test voltage for bridges: Measurements of resistance shall be made by using the test voltages specified in
table VI. The test voltage chosen, whether maximum voltage or a lower voltage which would still provide the
sensitivity required, shall be applied across the terminals of the resistor. This same voltage shall be used
whenever a subsequent resistance measurement is made.
TABLE VI. DC resistance test voltages.
Resistance, nominal
Ohms
10 to
98.8 inclusive
100 to
980 inclusive
1,000 to 9,800 inclusive
10,000 to 98,800 inclusive
0.1 megohm or higher
Maximum test voltage
0.5 watt or greater
Less than 0.5 watt
Volts
Volts
1
1
3
3
10
3
30
10
100
30
d. Measurement energy for electronic test equipment: The measurement energy applied to the unit under test shall
not exceed 10 percent of the +25°C rated wattage times 1 second.
e. Temperature: The temperature at which subsequent and final resistance measurements are made in each test
shall be within ±2°C of the temperature at which the initial resistance measurement was made.
4.6 Thermal shock (see 3.12). Resistors shall be tested in accordance with method 107 of MIL-STD-202. The
following details and exceptions shall apply:
a. Mounting: Resistors may be mounted or unmounted. Resistors may be placed in metal baskets, vials, or other
apparatus as long as resistors are subjected to the specified temperature extremes.
b. Measurement before cycling: DC resistance shall be measured as specified in 4.5.
c. Test condition F (except temperatures shall be +150°C, +10°C, -0°C and -65°C, +0°C, -10°C. These extreme
temperatures shall be achieved within 4 minutes.
d. Measurement after cycling: After stabilization at room temperature, the dc resistance shall again be measured as
specified in 4.5 and the resistors shall be examined for evidence of mechanical damage.
4.7 Solderability (see 3.14). Resistors shall be tested in accordance with method 208 of MIL-STD-202. Both leads
shall be tested. Steam aging is not applicable.
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4.8 Life (see 3.15). Resistors shall be tested in accordance with method 108 of MIL-STD-202. The following details
and exceptions shall apply:
a. Method of mounting: Resistors shall be mounted per MIL-PRF-55342 on ceramic boards.
b. Test temperature: 85°C ±5°C.
c. Initial measurements: Measurements may be made inside or outside the chamber.
(1) Inside chamber: When measurements are made inside the chamber, the initial dc resistance shall be
measured after mounting at the applicable test temperature, after temperature stabilization, and within 8 hours
of exposure of the resistors to the test temperature. This initial measurement shall be used as the reference
temperature for all subsequent measurements under the same condition.
(2) Outside chamber: When measurements are made outside the chamber, the initial dc resistance shall be
measured after mounting at the room temperature. This initial measurement shall be used as the reference
temperature for all subsequent measurements under the same condition.
d. Operating conditions: Rated dc continuous working voltage, or filtered or nonfiltered full wave rectified ac voltage,
shall be applied intermittently, 1.5 hours “on” and 0.5 hour “off”, for the applicable number of hours (see 4.8f), and
at the applicable test temperature. "On time" shall be three quarters of the total elapsed time. During the "on"
cycle, the voltage shall be regulated and controlled to maintain ±5 percent of the rated continuous working voltage.
e. Test condition: One thousand hours elapsed time for inspection with all samples.
f. Measurements during test:
(1) DC resistance shall be measured at the end of the 30 minutes “off” periods after 250 hours +72 hours,
-24 hours; 500 hours +72 hours, -24 hours; and 1,000 hours +96 hours, -24 hours elapsed.
(2) Measurements outside of the chamber: When measurements are made outside the chamber, resistors shall
be outside of the chamber for a minimum of 45 minutes and stabilized before measurement.
g. Examination after test: Resistors shall be examined for evidence of mechanical damage.
4.9 Resistance temperature characteristic (see 3.16). Resistors shall be tested in accordance with method 304 of
MIL-STD-202. The following details and exceptions shall apply:
a. Resistors shall be mounted per MIL-PRF-55342 using ceramic boards.
b. Referenced temperature: Room ambient temperature.
c. Test temperature: In accordance with table VII.
d. Stability of temperature: Resistors shall be maintained for 30 minutes to 45 minutes within 1°C at each of the test
temperatures in table VII. This tolerance shall be maintained at the established test temperatures. Allow resistor
to stabilize at the temperature in table VII for a minimum of 5 minutes.
e. The resistance temperature coefficient will be based on the stabilized temperature.
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TABLE VII. Resistance temperature characteristic.
Sequence 1/
Temperature
Group B acceptance inspection (°C)
1
2
3
4
25
-55
25
+125
±3 2/
±3
±3 2/
±3
1/ At the option of the manufacturer, the reverse sequence
of table VII may be as follows:
1.
25 ±3
2. +125 ±3
3. +25 ±3
4. -55 ±3
2/ Reference temperature for each of the succeeding temperatures.
4.10 Dielectric withstanding voltage (see 3.17).
4.10.1 Atmospheric pressure. Resistors shall be tested in accordance with method 301 of MIL-STD-202. The following
details and exceptions shall apply:
a. Special preparations. Resistors shall be placed in fixtures that short the terminations on the termination side of the
resistor together and a second conductive surface that contacts the flat top surface of the resistor (see figure 3).
b. Initial measurement: DC resistance shall be measured as specified in 4.5.
c. Magnitude of test potential: Sine wave test potential of magnitude shall be 450 volts.
d. Nature of potential: An ac supply at commercial-line frequency (not more than 100 Hz) and waveform.
e. Rate of application of test voltage: One hundred volts per second.
f. Duration of application of test voltage: One minute.
g. Points of application of test voltage: Between the resistor terminals connected together and the second conductive
surface.
h. Measurement after test: DC resistance shall be measured as specified in 4.5.
i. Examination after test: Resistors shall be examined for evidence of flashover, mechanical damage, arching, and
insulation breakdown.
4.10.2 Barometric pressure (reduced). Resistors shall be tested in accordance with method 105 of MIL-STD-202. The
following details and exception shall apply:
a. Method of mounting: As specified in 4.10.1a.
b. Initial measurement: DC resistance shall be measured as specified in 4.5.
c. Test condition D (100,000 feet).
d. Magnitude of test voltage: Sine wave test potential of magnitude shall be 200 volts.
e. Nature of potential: As specified in 4.10.1d.
f. Rate of application of test voltage: One hundred volts per second.
g. Duration of test: One minute.
h. Points of application of test voltage: As specified in 4.10.1g.
i. Final measurement: DC resistance shall be measured as specified in 4.5.
j. Examination after test: As specified in 4.10.1i.
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FIGURE 3. Mounting for dielectric withstanding voltage and insulation resistance tests.
4.11 Insulation resistance (see 3.18). Resistors shall be tested in accordance with method 302 of MIL-STD-202. The
following details and exceptions shall apply:
a. Test condition B (500 volts).
b. Special preparations: As specified in 4.10.1a.
c. Points of application: As specified in 4.10.1g.
4.12 Low temperature operation (see 3.19). Following a dc resistance measurement as specified in 4.5, the resistors
shall be placed in a cold chamber at -65°C +0°C, -5° C. After 1 hour of stabilization at this temperature, full rated
continuous working voltage as specified in 3.8 shall be applied fro 45 minutes. The resistors may be loaded individually or
in parallel. Fifteen +5, -0 minutes after the removal of the voltage, the temperature in the chamber shall be gradually
increased to room temperature within a period of not more than 8 hours. The resistors shall be removed from the
chamber and maintained at a temperature of 25°C ±5°C for a period of approximately 24 hours; the dc resistance shall
then be measured as specified in 4.5. Resistors shall then be inspected for evidence of mechanical damage.
4.13 Solder mounting integrity (see 3.20). Resistors shall be tested in accordance with MIL-PRF-55342, mounting
integrity, termination B. The force applied shall be 3 kilograms.
4.14 Resistance to bonding exposure (see 3.21). Resistors shall be tested in accordance with MIL-PRF-55342.
4.15 Moisture resistance (see 3.22). Resistors shall be tested in accordance with MIL-PRF-55342.
4.16 High temperature exposure (see 3.23). Resistors shall be tested in accordance with MIL-PRF-55342.
4.17 Shock, specified pulse (see 3.24). Resistors shall be tested in accordance with method 213 of MIL-STD-202. The
following details and exceptions shall apply:
a. Mounting: The resistor shall be mounted with the body clamped or cemented to a flat surface. The resistors shall
be mounted to insure that they have the same motion as the shock table. In all cases, the resistors shall be
mounted in relation to test equipment so that the stress applied is in the direction that would be considered most
detrimental.
b. Measurement before shock: DC resistance shall be measured as specified in 4.5.
c. Number and direction of applied shock: The resistors shall be subjected to a total of 10 shocks in each of three
mutually perpendicular planes, two perpendicular and the other parallel to the longitudinal axis of the resistor.
d. Test condition I (100 g's, 6 milliseconds (ms) sawtooth).
e. Measurement during shock: Each resistor shall be monitored to determine electrical discontinuity by a method that
shall at least be sensitive enough to monitor or register, automatically, any electrical discontinuity of 0.1 ms or
greater.
f. Measurement after shock: DC resistance shall be measured as specified in 4.5.
g. Examination after test: Resistors shall be examined for evidence of mechanical and electrical damage.
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4.18 Resistance to solvents (see 3.25). Resistors shall be tested in accordance with method 215 of MIL-STD-202. The
following details shall apply:
a. Mounting: Unmounted.
b. The marked portion of the resistor shall be brushed.
c. The number of sample units shall be as specified in table V.
d. Resistor shall be examined for mechanical damage and legibility of minimum marking.
4.19 Current noise (see 3.26). Current noise shall be measured in accordance with method 308 of MIL-STD-202.
4.20 Visual inspection (see 3.27). Resistors shall be examined under 30X to 60X magnification. In case of conflict 30X
will be the referee power to verify that the requirements of 3.27 are met.
5. PACKAGING
5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see
6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to
contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained
by the Inventory Control Point's packaging activities within the Military Service or Defense Agency, or within the military
service's system commands. Packaging data retrieval is available from the managing Military Department's or Defense
Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature which may be helpful, but is not mandatory.)
6.1 Intended use. The film resistors described herein are intended to be used where high precision and stability are
required.
6.2 Ordering data. The contract or purchase order should specify the following:
a. Complete PIN (see 1.2).
b. Requirements for delivery: One copy of the conformance inspection data or certification of compliance
that parts have passed conformance inspection with each shipment of parts by the manufacturer.
c. Whether the manufacturer performs the group B tests or provides certification of compliance with group B
requirements (see 4.4.2.1).
d. Requirements for packaging and packing.
e. Circuit reactance requirements (see 3.6).
*
6.3 Tin whisker growth. The use of alloys with tin content greater than 97 percent, by mass, may exhibit tin whisker
growth problems after manufacture. Tin whiskers may occur anytime from a day to years after manufacture and can
develop under typical operating conditions, on products that use such materials. Conformal coatings applied over top of a
whisker-prone surface will not prevent the formation of tin whiskers. Alloys of 3 percent lead, by mass, have shown to
inhibit the growth of tin whiskers. For additional information on this matter, refer to ASTM-B545 (Standard Specification
for Electrodeposited Coatings of Tin).
6.4 Electrostatic charge. Under several combinations of conditions, these resistors can be electrically damaged, by
electrostatic charges, and drift from specified value. Users should consider this phenomena when ordering or shipping
resistors. Direct shipment to the Government is controlled by MIL-DTL-39032, which specifies a preventive packaging
procedure.
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*
6.5 Pulse application. Designers are CAUTIONED on using these resistors in high power pulse applications. Since
they have not been qualified nor tested for such applications, damage and premature failure are possible.
*
6.6 User of record. Coordination of this document for future revisions is coordinated only with the approved source of
supply and the users of record of this document. Requests to be added as a recorded user of this drawing may be
achieved online at [email protected] or in writing to: DLA Land and Maritime-VAT, Post Office Box 3990, Columbus, OH
43218-3990 or by telephone (614) 692-0552 or DSN 850-0552.
*
6.7 Approved source of supply. Approved source of supply is listed herein. Additional sources will be added as they
become available. Assistance in the use of this drawing may be obtained online at [email protected] or contact
DLA Land and Maritime-VAT, Post Office Box 3990, Columbus, OH 43218-3990 or by telephone (614) 692-0552 or DSN
850-0552.
DLA Land and
Vendors similar
Maritime drawing designation or type
PIN
number 1/
02001-*******
PSF2012-1
Vendor
CAGE
91637
Vendor name
and address
Vishay Dale Electronics, Inc.
P.O. Box 609
Columbus, NE 68602-0609
1/ Parts must be purchased to this DLA Land and Maritime PIN to assure that all performance
requirements and tests are met.
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