INTERSIL HCS151MS

HCS151MS
Radiation Hardened
8-Input Multiplexer
September 1995
Features
Pinouts
• 3 Micron Radiation Hardened SOS CMOS
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16
TOP VIEW
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
10
• Dose Rate Upset >10
RAD (Si)/s 20ns Pulse
• Cosmic Ray Upset Immunity 2 x 10-9 Error/Gate Day
(Typ)
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
I3
1
16 VCC
I2
2
15 I4
I1
3
14 I5
I0
4
13 I6
Y
5
12 I7
Y
6
11 S0
E
7
10 S1
GND
8
9 S2
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F16
TOP VIEW
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCS151MS is a Radiation Hardened 8-Input
Multiplexer having three binary control inputs (S0, S1, S2)
and an active low enable (E) input. The three binary signals
select one of eight channels. Outputs are both inverting and
non-inverting.
The HCS151MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
I3
1
16
VCC
I2
2
15
I4
I1
3
14
I5
I0
4
13
I6
Y
5
12
I7
Y
6
11
S0
E
7
10
S1
GND
8
9
S2
The HCS151MS is supplied in a 16 lead Ceramic flatpack (K
suffix) or a SBDIP Package (D suffix).
Ordering Information
PART NUMBER
TEMPERATURE RANGE
SCREENING LEVEL
PACKAGE
HCS151DMSR
-55oC to +125oC
Intersil Class S Equivalent
16 Lead SBDIP
HCS151KMSR
-55oC to +125oC
Intersil Class S Equivalent
16 Lead Ceramic Flatpack
+25oC
Sample
16 Lead SBDIP
HCS151K/Sample
+25oC
Sample
16 Lead Ceramic Flatpack
HCS151HMSR
+25oC
Die
Die
DB NA
HCS151D/Sample
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
163
Spec Number
File Number
518753
3077.1
HCS151MS
Functional Diagram
I0
I1
S0
I2
S0
S1
S2
I3
S0
S1
S2
I4
S0
S1
S0
I6
S0
S1
S1
S2
I5
S0
S1
S2
S2
I7
S0
S1
S2
S2
S1
S2
7
E
16
VCC
11
8
S0
S0
GND
S0
10
S1
S1
S1
9
6
8
Y
S2
S2
S2
Y
TRUTH TABLE
INPUTS
OUTPUTS
E
S0
S1
S2
I0
I1
I2
I3
I4
I5
I6
I7
Y
Y
H
X
X
X
X
X
X
X
X
X
X
X
H
L
L
L
L
L
L
X
X
X
X
X
X
X
H
L
L
L
L
L
H
X
X
X
X
X
X
X
L
H
L
L
L
H
X
L
X
X
X
X
X
X
H
L
L
L
L
H
X
H
X
X
X
X
X
X
L
H
L
L
H
L
X
X
L
X
X
X
X
X
H
L
L
L
H
L
X
X
H
X
X
X
X
X
L
H
L
L
H
H
X
X
X
L
X
X
X
X
H
L
L
L
H
H
X
X
X
H
X
X
X
X
L
H
L
H
L
L
X
X
X
X
L
X
X
X
H
L
L
H
L
L
X
X
X
X
H
X
X
X
L
H
L
H
L
H
X
X
X
X
X
L
X
X
H
L
L
H
L
H
X
X
X
X
X
H
X
X
L
H
L
H
H
L
X
X
X
X
X
X
L
X
H
L
L
H
H
L
X
X
X
X
X
X
H
X
L
H
L
H
H
H
X
X
X
X
X
X
X
L
H
L
L
H
H
H
X
X
X
X
X
X
X
H
L
H
H = High Level, L = Low Level, X = Don’t Care
Spec Number
164
518753
Specifications HCS151MS
Absolute Maximum Ratings
Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265oC
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance
θJA
θJC
SBDIP Package. . . . . . . . . . . . . . . . . . . .
73oC/W
24oC/W
Ceramic Flatpack Package . . . . . . . . . . . 114oC/W
29oC/W
Maximum Package Power Dissipation at +125oC Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.44W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13.7mW/oC
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 8.8mW/oC
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation.
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . .500ns Max
Operating Temperature Range (TA) . . . . . . . . . . . . -55oC to +125oC
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . 0.0V to 30% of VCC
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . 70% of VCC to VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Quiescent Current
Output Current
(Sink)
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage
Current
Noise Immunity
Functional Test
GROUP
A SUBGROUPS
TEMPERATURE
MIN
MAX
UNITS
1
+25oC
-
40
µA
2, 3
+125oC, -55oC
-
750
µA
1
+25oC
4.8
-
mA
2, 3
+125oC, -55oC
4.0
-
mA
1
+25oC
-4.8
-
mA
2, 3
+125oC, -55oC
-4.0
-
mA
VCC = 4.5V, VIH = 3.15V,
IOL = 50µA, VIL = 1.35V
1, 2, 3
+25oC, +125oC, -55oC
-
0.1
V
VCC = 5.5V, VIH = 3.85V,
IOL = 50µA, VIL = 1.65V
1, 2, 3
+25oC, +125oC, -55oC
-
0.1
V
VCC = 4.5V, VIH = 3.15V,
IOH = -50µA, VIL = 1.35V
1, 2, 3
+25oC, +125oC, -55oC
VCC
-0.1
-
V
VCC = 5.5V, VIH = 3.85V,
IOH = -50µA, VIL = 1.65V
1, 2, 3
+25oC, +125oC, -55oC
VCC
-0.1
-
V
VCC = 5.5V, VIN = VCC or
GND
1
+25oC
-
±0.5
µA
2, 3
+125oC, -55oC
-
±5.0
µA
7, 8A, 8B
+25oC, +125oC, -55oC
-
-
-
(NOTE 1)
CONDITIONS
SYMBOL
ICC
IOL
IOH
VOL
VOH
IIN
FN
VCC = 5.5V,
VIN = VCC or GND
VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VOUT = VCC -0.4V,
VIL = 0V
VCC = 4.5V,
VIH = 0.70(VCC),
VIL = 0.30(VCC) (Note 2)
LIMITS
NOTES:
1. All voltages reference to device GND.
2. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
Spec Number
165
518753
Specifications HCS151MS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Input to Y
Input to Y
Select to Y
Select to Y
E to Y
E to Y
(NOTES 1, 2)
CONDITIONS
SYMBOL
TPHL
TPLH
TPHL
TPLH
TPHL
TPLH
TPHL
TPLH
TPHL
TPLH
TPHL
TPLH
GROUP
A SUBGROUPS
TEMPERATURE
MIN
MAX
UNITS
9
+25oC
2
21
ns
10, 11
+125oC, -55oC
2
23
ns
9
+25oC
2
24
ns
10, 11
+125oC, -55oC
2
27
ns
9
+25oC
2
25
ns
10, 11
+125oC, -55oC
2
29
ns
9
+25oC
2
29
ns
10, 11
+125oC, -55oC
2
33
ns
9
+25oC
2
17
ns
10, 11
+125oC, -55oC
2
19
ns
9
+25oC
2
20
ns
10, 11
+125oC, -55oC
2
21
ns
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
LIMITS
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
SYMBOL
Capacitance Power
Dissipation
CPD
Input Capacitance
Output Transition
Time
CIN
TTHL
TTLH
CONDITIONS
NOTES
TEMPERATURE
MIN
MAX
UNITS
1
+25oC
-
68
pF
1
+125oC
-
83
pF
1
+25oC
-
10
pF
1
+125oC
-
10
pF
1
+25oC
-
15
ns
1
+125oC
-
22
ns
VCC = 5.0V, f = 1MHz
VCC = 5.0V, f = 1MHz
VCC = 4.5V
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
Spec Number
166
518753
Specifications HCS151MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
200K RAD
LIMITS
PARAMETER
(NOTES 1, 2)
CONDITIONS
SYMBOL
TEMPERATURE
MIN
MAX
UNITS
Quiescent Current
ICC
VCC = 5.5V, VIN = VCC or GND
+25oC
-
750
µA
Output Current (Sink)
IOL
VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
+25oC
4.0
-
mA
Output Current
(Source)
IOH
VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
+25oC
-4.0
-
mA
Output Voltage Low
VOL
VCC = 4.5V and 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC) at 200K RAD, IOL = 50µA
+25oC
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V and 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC) at 200K RAD, IOH = -50µA
+25oC
VCC
-0.1
-
V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25oC
-
±5
µA
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC) at 200K RAD, (Note 3)
+25oC
-
-
-
Input to Y
TPHL
TPLH
VCC = 4.5V
+25oC
2
29
ns
Input to Y
TPHL
TPLH
VCC = 4.5V
+25oC
2
34
ns
Select to Y
TPHL
TPLH
VCC = 4.5V
+25oC
2
37
ns
Select to Y
TPHL
TPLH
VCC = 4.5V
+25oC
2
42
ns
E to Y
TPHL
TPLH
VCC = 4.5V
+25oC
2
24
ns
E to Y
TPHL
TPLH
VCC = 4.5V
+25oC
2
27
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12µA
IOL/IOH
5
-15% of 0 Hour
PARAMETER
Spec Number
167
518753
Specifications HCS151MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample/5005
1, 7, 9
Sample/5005
1, 7, 9
Group A (Note 1)
Group B
Group D
READ AND RECORD
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
NOTE: 1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
TEST
CONFORMANCE
GROUPS
READ AND RECORD
METHOD
PRE RAD
POST RAD
PRE RAD
POST RAD
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
Group E Subgroup 2
NOTE: Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V
VCC = 6V ± 0.5V
50kHz
25kHz
-
16
-
-
-
1 - 4, 7, 9 - 16
-
-
5, 6
1, 3, 9, 12, 14, 16
11
7
STATIC BURN-IN I TEST CONDITIONS (Note 1)
5, 6
1 - 4, 7 - 15
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
5, 6
8
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
-
2, 4, 8, 10, 13, 15
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
5, 6
8
1 - 4, 7, 9 - 16
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
168
518753
HCS151MS
Intersil Space Level Product Flow - ‘MS’
Wafer Lot Acceptance (All Lots) Method 5007
(Includes SEM)
100% Interim Electrical Test 1 (T1)
GAMMA Radiation Verification (Each Wafer) Method 1019,
4 Samples/Wafer, 0 Rejects
100% Static Burn-In 2, Condition A or B, 24 hrs. min.,
+125oC min., Method 1015
100% Nondestructive Bond Pull, Method 2023
100% Interim Electrical Test 2 (T2)
Sample - Wire Bond Pull Monitor, Method 2011
100% Delta Calculation (T0-T2)
Sample - Die Shear Monitor, Method 2019 or 2027
100% PDA 1, Method 5004 (Notes 1and 2)
100% Internal Visual Inspection, Method 2010, Condition A
100% Dynamic Burn-In, Condition D, 240 hrs., +125oC or
Equivalent, Method 1015
100% Delta Calculation (T0-T1)
100% Temperature Cycle, Method 1010, Condition C,
10 Cycles
100% Interim Electrical Test 3 (T3)
100% Constant Acceleration, Method 2001, Condition per
Method 5004
100% Delta Calculation (T0-T3)
100% PDA 2, Method 5004 (Note 2)
100% PIND, Method 2020, Condition A
100% Final Electrical Test
100% External Visual
100% Fine/Gross Leak, Method 1014
100% Serialization
100% Radiographic, Method 2012 (Note 3)
100% Initial Electrical Test (T0)
100% Static Burn-In 1, Condition A or B, 24 hrs. min.,
+125oC min., Method 1015
100% External Visual, Method 2009
Sample - Group A, Method 5005 (Note 4)
100% Data Package Generation (Note 5)
NOTES:
1. Failures from Interim electrical test 1 and 2 are combined for determining PDA 1.
2. Failures from subgroup 1, 7, 9 and deltas are used for calculating PDA. The maximum allowable PDA = 5% with no more than 3% of the
failures from subgroup 7.
3. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004.
4. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
5. Data Package Contents:
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number,
Quantity).
• Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage.
• GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test
equipment, etc. Radiation Read and Record data on file at Intersil.
• X-Ray report and film. Includes penetrometer measurements.
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Lot Serial Number Sheet (Good units serial number and lot number).
• Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
by an authorized Quality Representative.
Spec Number
169
518753
HCS151MS
AC Timing Diagrams
AC Load Circuit
VIH
DUT
TEST
POINT
INPUT
VS
VIL
CL
RL
TPLH
TPHL
VOH
VS
CL = 50pF
OUTPUT
RL = 500Ω
VOL
VOH
TTLH
TTHL
80%
VOL
20%
80%
20%
OUTPUT
AC VOLTAGE LEVELS
PARAMETER
HCS
UNITS
VCC
4.50
V
VIH
4.50
V
VS
2.25
V
VIL
0
V
GND
0
V
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Spec Number
170
518753
HCS151MS
Die Characteristics
DIE DIMENSIONS:
84 x 84 mils
2.13 x 2.13mm
METALLIZATION:
Type: AlSi
Metal Thickness: 11kÅ ± 1kÅ
GLASSIVATION:
Type: SiO2
Thickness: 13kÅ ± 2.6kÅ
WORST CASE CURRENT DENSITY:
<2.0 x 105A/cm2
BOND PAD SIZE:
100µm x 100µm
4 x 4 mils
Metallization Mask Layout
HCS151MS
I2
(2)
I3
(1)
VCC
(16)
I4
(15)
I1 (3)
(14) I5
(13) I6
I0 (4)
(12) I7
Y (5)
(11) S0
Y (6)
(10) S1
(7)
E
(8)
GND
(9)
S2
NOTE: The die diagram is a generic plot from a similar HCS device. It is intended to indicate approximate die size and bond pad location.
The mask series for the HCTS151 is TA14467A.
Spec Number
171
518753