74LVC02A D

74LVC02A
Low-Voltage CMOS Quad
2-Input NOR Gate
With 5 V−Tolerant Inputs
The 74LVC02A is a high performance, quad 2−input NOR gate
operating from a 1.2 to 3.6 V supply. High impedance TTL compatible
inputs significantly reduce current loading to input drivers while TTL
compatible outputs offer improved switching noise performance. A VI
specification of 5.5 V allows 74LVC02A inputs to be safely driven
from 5 V devices.
Current drive capability is 24 mA at the outputs.
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SOIC−14 NB
D SUFFIX
CASE 751A
TSSOP−14
DT SUFFIX
CASE 948G
Features
•
•
•
•
•
•
PIN ASSIGNMENT
Designed for 1.2 V to 3.6 V VCC Operation
5 V Tolerant Inputs − Interface Capability With 5 V TTL Logic
24 mA Output Sink and Source Capability
Near Zero Static Supply Current (10 mA) Substantially Reduces
System Power Requirements
ESD Performance: Human Body Model >2000 V;
Machine Model >200 V
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
A0
B0
A1
B1
A2
B2
A3
B3
2
VCC
O2
B2
A2
O3
B3
A3
14
13
12
11
10
9
8
1
2
3
4
5
6
7
O0
A0
B0
O1
A1
B1
GND
MARKING DIAGRAMS
1
3
O0
14
5
4
6
LVC02AG
AWLYWW
O1
11
13
12
1
O2
SOIC−14 NB
8
10
9
O3
14
LVC
02A
ALYWG
G
Figure 1. Logic Diagram
1
TSSOP−14
A
WL, L
Y
WW, W
G or G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 6 of this data sheet.
© Semiconductor Components Industries, LLC, 2015
September, 2015 − Rev. 0
1
Publication Order Number:
74LVC02A/D
74LVC02A
PIN NAMES
TRUTH TABLE
Pins
Function
An, Bn
Data Inputs
An
Inputs
Bn
On
On
Outputs
L
L
H
H = High Voltage Level
L = Low Voltage Level
For ICC reasons, DO NOT FLOAT Inputs
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2
Outputs
L
H
L
H
L
L
H
H
L
74LVC02A
MAXIMUM RATINGS
Symbol
VCC
Parameter
Value
DC Supply Voltage
VI
DC Input Voltage
VO
DC Output Voltage
IIK
IOK
Condition
Unit
−0.5 to +6.5
V
−0.5 ≤ VI ≤ +6.5
V
−0.5 ≤ VO ≤ VCC + 0.5
Output in HIGH or LOW State
(Note 1)
V
DC Input Diode Current
−50
VI < GND
mA
DC Output Diode Current
−50
VO < GND
mA
+50
VO > VCC
mA
IO
DC Output Source/Sink Current
±50
mA
ICC
DC Supply Current Per Supply Pin
±100
mA
IGND
DC Ground Current Per Ground Pin
±100
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case for
10 Seconds
TL = 260
°C
TJ
Junction Temperature Under Bias
TJ = 135
°C
qJA
Thermal Resistance (Note 2)
SOIC = 85
TSSOP = 100
°C/W
MSL
Moisture Sensitivity
Level 1
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Parameter
Min
Supply Voltage
Operating
Functional
Typ
Max
V
1.65
1.2
3.6
3.6
VI
Input Voltage
0
5.5
VO
Output Voltage
HIGH or LOW State
3−State
0
0
VCC
5.5
IOH
IOL
Units
V
V
HIGH Level Output Current
VCC = 3.0 V − 3.6 V
VCC = 2.7 V − 3.0 V
−24
−12
mA
LOW Level Output Current
VCC = 3.0 V − 3.6 V
VCC = 2.7 V − 3.0 V
24
12
mA
TA
Operating Free−Air Temperature
−40
+125
Dt/DV
Input Transition Rise or Fall Rate
VCC = 1.65 V to 2.7 V
VCC = 2.7 V to 3.6 V
0
0
20
10
°C
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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3
74LVC02A
DC ELECTRICAL CHARACTERISTICS
−405C to +855C
Symbol
VIH
VIL
VOH
VOL
−405C to +1255C
Parameter
Conditions
Min
Typ
(Note 3)
Max
Min
Typ
(Note 3)
Max
Unit
HIGH−level input
voltage
VCC = 1.2 V
1.08
−
−
1.08
−
−
V
VCC = 1.65 V to 1.95 V
0.65 x
VCC
−
−
0.65 x
VCC
−
−
VCC = 2.3 V to 2.7 V
1.7
−
−
1.7
−
−
VCC = 2.7 V to 3.6 V
2.0
−
−
2.0
−
−
VCC = 1.2 V
−
−
0.12
−
−
0.12
VCC = 1.65 V to 1.95 V
−
−
0.35 x
VCC
−
−
0.35 x
VCC
VCC = 2.3 V to 2.7 V
−
−
0.7
−
−
0.7
VCC = 2.7 V to 3.6 V
−
−
0.8
−
−
0.8
LOW−level input
voltage
HIGH−level output
voltage
LOW−level output
voltage
V
V
VI = VIH or VIL
IO = −100 mA;
VCC = 1.65 V to 3.6 V
VCC −
0.2
−
−
VCC −
0.3
−
−
IO = −4 mA; VCC = 1.65 V
1.2
−
−
1.05
−
−
IO = −8 mA; VCC = 2.3 V
1.8
−
−
1.65
−
−
IO = −12 mA; VCC = 2.7 V
2.2
−
−
2.05
−
−
IO = −18 mA; VCC = 3.0 V
2.4
−
−
2.25
−
−
IO = −24 mA; VCC = 3.0 V
2.2
−
−
2.0
−
−
V
VI = VIH or VIL
IO = 100 mA;
VCC = 1.65 V to 3.6 V
−
−
0.2
−
−
0.3
IO = 4 mA; VCC = 1.65 V
−
−
0.45
−
−
0.65
IO = 8 mA; VCC = 2.3 V
−
−
0.6
−
−
0.8
IO = 12 mA; VCC = 2.7 V
−
−
0.4
−
−
0.6
IO = −24 mA; VCC = 3.0 V
−
−
0.55
−
−
0.8
Input leakage current
VI = 5.5V or GND VCC = 3.6 V
−
±0.1
±5
−
±0.1
±20
mA
IOFF
Power−off leakage
current
VI or VO = 5.5 V; VCC = 0.0 V
−
±0.1
±10
−
±0.1
±20
mA
ICC
Supply current
VI = VCC or GND; IO = 0 A;
VCC = 3.6 V
−
0.1
10
−
0.1
40
mA
Additional supply
current
per input pin;
VI = VCC − 0.6 V; IO = 0 A;
VCC = 2.7 V to 3.6 V
−
5
500
−
5
5000
mA
II
DICC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
3. All typical values are measured at TA = 25°C and VCC = 3.3 V, unless stated otherwise.
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74LVC02A
AC ELECTRICAL CHARACTERISTICS (tR = tF = 2.5 ns)
−405C to +855C
Symbol
tpd
tsk(0)
Parameter
Propagation Delay (Note 5)
Output Skew Time (Note 6)
−405C to +1255C
Conditions
Min
Typ1
Max
Min
Typ1
Max
Unit
VCC = 1.2 V
−
14.0
−
−
−
−
ns
VCC = 1.65 V to 1.95 V
0.5
4.0
8.6
0.5
−
10.1
ns
VCC = 2.3 V to 2.7 V
0.5
2.4
4.9
0.5
−
5.7
VCC = 2.7 V
0.5
2.5
5.1
0.5
−
6.5
VCC = 3.0 V to 3.6 V
0.5
2.2
4.4
0.5
−
5.5
VCC = 3.0 V to 3.6 V
−
−
1.0
−
−
1.5
ns
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Typical values are measured at TA = 25°C and VCC = 3.3 V, unless stated otherwise.
5. tpd is the same as tPLH and tPHL.
6. Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device.
The specification applies to any outputs switching in the same direction, either HIGH−to−LOW (tOSHL) or LOW−to−HIGH (tOSLH); parameter
guaranteed by design.
DYNAMIC SWITCHING CHARACTERISTICS
TA = +25°C
Symbol
Characteristic
Condition
Min
Typ
Max
Unit
VOLP
Dynamic LOW Peak Voltage (Note 7)
VCC = 3.3 V, CL = 50 pF, VIH = 3.3 V, VIL = 0 V
VCC = 2.5 V, CL = 30 pF, VIH = 2.5 V, VIL = 0 V
0.8
0.6
V
VOLV
Dynamic LOW Valley Voltage (Note 7)
VCC = 3.3 V, CL = 50 pF, VIH = 3.3 V, VIL = 0 V
VCC = 2.5 V, CL = 30 pF, VIH = 2.5 V, VIL = 0 V
−0.8
−0.6
V
7. Number of outputs defined as “n”. Measured with “n−1” outputs switching from HIGH−to−LOW or LOW−to−HIGH. The remaining output is
measured in the LOW state.
CAPACITIVE CHARACTERISTICS
Symbol
CIN
COUT
CPD
Parameter
Condition
Typical
Unit
Input Capacitance
VCC = 3.3 V, VI = 0 V or VCC
4.0
pF
Output Capacitance
VCC = 3.3 V, VI = 0 V or VCC
5.0
pF
Power Dissipation Capacitance
(Note 8)
pF
Per input; VI = GND or VCC
VCC = 1.65 V to 1.95 V
2.5
VCC = 2.3 V to 2.7 V
5.7
VCC = 3.0 V to 3.6 V
8.5
8. CPD is used to determine the dynamic power dissipation (PD in mW).
PD = CPD x VCC2 x fi x N + S (CL x VCC2 x fo) where:
fi = input frequency in MHz; fo = output frequency in MHz
CL = output load capacitance in pF VCC = supply voltage in Volts
N = number of outputs switching
S(CL x VCC2 x fo) = sum of the outputs.
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5
74LVC02A
VCC
An, Bn
Vmi
Vmi
0V
tPHL
tPLH
VOH
Vmo
On
Vmo
VOL
WAVEFORM 1 − PROPAGATION DELAYS
tR = tF = 2.5 ns, 10% to 90%; f = 1 MHz; tW = 500 ns
Vcc
Symbol
3.3 V + 0.3 V
2.7 V
VCC < 2.7 V
Vmi
1.5 V
1.5 V
Vcc/2
Vmo
1.5 V
1.5 V
Vcc/2
Figure 2. AC Waveforms
VCC
VI
VO
PULSE
GENERATOR
DUT
RT
CL
RL
CL includes jig and probe capacitance
RT = ZOUT of pulse generator (typically 50 W)
Supply Voltage
Input
Load
VCC (V)
VI
tr, tf
CL
RL
1.2
VCC
≤ 2 ns
30 pF
1 kW
1.65 − 1.95
VCC
≤ 2 ns
30 pF
1 kW
2.3 − 2.7
VCC
≤ 2 ns
30 pF
500 W
2.7
2.7 V
≤ 2.5 ns
50 pF
500 W
3 − 3.6
2.7 V
≤ 2.5 ns
50 pF
500 W
Figure 3. Test Circuit
ORDERING INFORMATION
Device
74LVC02ADR2G
74LVC02ADTR2G
Package
Shipping†
SOIC−14 NB
(Pb−Free)
2500 / Tape & Reel
TSSOP−14
(Pb−Free)
2500 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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6
74LVC02A
PACKAGE DIMENSIONS
TSSOP−14
DT SUFFIX
CASE 948G
ISSUE B
14X K REF
0.10 (0.004)
0.15 (0.006) T U
M
T U
V
S
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION SHALL
NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
S
S
N
2X
14
L/2
0.25 (0.010)
8
M
B
−U−
L
PIN 1
IDENT.
F
7
1
0.15 (0.006) T U
N
S
DETAIL E
K
A
−V−
ÉÉÉ
ÇÇÇ
ÇÇÇ
ÉÉÉ
K1
J J1
SECTION N−N
−W−
C
0.10 (0.004)
−T− SEATING
PLANE
D
H
G
DETAIL E
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
4.90
5.10
4.30
4.50
−−−
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.50
0.60
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
SOLDERING FOOTPRINT*
7.06
1
0.65
PITCH
14X
0.36
14X
1.26
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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7
INCHES
MIN MAX
0.193 0.200
0.169 0.177
−−− 0.047
0.002 0.006
0.020 0.030
0.026 BSC
0.020 0.024
0.004 0.008
0.004 0.006
0.007 0.012
0.007 0.010
0.252 BSC
0_
8_
74LVC02A
PACKAGE DIMENSIONS
SOIC−14 NB
CASE 751A−03
ISSUE K
D
A
B
14
8
A3
E
H
L
1
0.25
M
DETAIL A
7
B
13X
M
b
0.25
C A
M
S
B
S
DETAIL A
h
A
e
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF AT
MAXIMUM MATERIAL CONDITION.
4. DIMENSIONS D AND E DO NOT INCLUDE
MOLD PROTRUSIONS.
5. MAXIMUM MOLD PROTRUSION 0.15 PER
SIDE.
X 45 _
M
A1
C
SEATING
PLANE
DIM
A
A1
A3
b
D
E
e
H
h
L
M
MILLIMETERS
MIN
MAX
1.35
1.75
0.10
0.25
0.19
0.25
0.35
0.49
8.55
8.75
3.80
4.00
1.27 BSC
5.80
6.20
0.25
0.50
0.40
1.25
0_
7_
INCHES
MIN
MAX
0.054 0.068
0.004 0.010
0.008 0.010
0.014 0.019
0.337 0.344
0.150 0.157
0.050 BSC
0.228 0.244
0.010 0.019
0.016 0.049
0_
7_
SOLDERING FOOTPRINT*
6.50
14X
1.18
1
1.27
PITCH
14X
0.58
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and the
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specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets
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8
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For additional information, please contact your local
Sales Representative
74LVC02A/D