MC74VHC541 Octal Bus Buffer The MC74VHC541 is an advanced high speed CMOS octal bus buffer fabricated with silicon gate CMOS technology. It achieves high speed operation similar to equivalent Bipolar Schottky TTL while maintaining CMOS low power dissipation. The MC74VHC541 is a noninverting type. When either OE1 or OE2 are high, the terminal outputs are in the high impedance state. The internal circuit is composed of three stages, including a buffer output which provides high noise immunity and stable output. The inputs tolerate voltages up to 7.0 V, allowing the interface of 5.0 V systems to 3.0 V systems. http://onsemi.com SOIC−20WB SUFFIX DW CASE 751D 20 1 Features • • • • • • • • • • • • High Speed: tPD = 3.7ns (Typ) at VCC = 5.0 V Low Power Dissipation: ICC = 4 mA (Max) at TA = 25°C High Noise Immunity: VNIH = VNIL = 28% VCC Power Down Protection Provided on Inputs Balanced Propagation Delays Designed for 2.0 V to 5.5 V Operating Range Low Noise: VOLP = 1.2 V (Max) Pin and Function Compatible with Other Standard Logic Families Latchup Performance Exceeds 300mA ESD Performance: HBM > 2000 V; Machine Model > 200 V Chip Complexity: 134 FETs or 33.5 Equivalent Gates These Devices are Pb−Free and are RoHS Compliant A1 A2 A3 DATA INPUTS A4 A5 A6 A7 A8 OUTPUT ENABLES OE1 OE2 2 18 3 17 4 16 5 15 6 14 7 13 8 12 9 11 20 TSSOP−20 SUFFIX DT CASE 948E 1 PIN ASSIGNMENT OE1 1 20 VCC A1 2 19 OE2 A2 3 18 Y1 A3 4 17 Y2 A4 5 16 Y3 A5 6 15 Y4 A6 7 14 Y5 A7 8 13 Y6 A8 9 12 Y7 10 11 Y8 Y1 Y2 GND Y3 Y4 FUNCTION TABLE NONINVERTING OUTPUTS Y5 Y6 Y7 Y8 Inputs Output Y OE1 OE2 A L L H X L L X H L H X X L H Z Z ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 4 of this data sheet. 1 19 DEVICE MARKING INFORMATION See general marking information in the device marking section on page 4 of this data sheet. Figure 1. Logic Diagram © Semiconductor Components Industries, LLC, 2014 September, 2014 − Rev. 8 1 Publication Order Number: MC74VHC541/D MC74VHC541 MAXIMUM RATINGS Symbol Value Unit VCC DC Supply Voltage Parameter – 0.5 to + 7.0 V Vin DC Input Voltage – 0.5 to + 7.0 V Vout DC Output Voltage – 0.5 to VCC + 0.5 V IIK Input Diode Current − 20 mA IOK Output Diode Current ± 20 mA Iout DC Output Current, per Pin ± 25 mA ICC DC Supply Current, VCC and GND Pins ± 50 mA PD Power Dissipation in Still Air, 500 450 mW Tstg Storage Temperature – 65 to + 150 _C SOIC Package† TSSOP Package† This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high−impedance circuit. For proper operation, Vin and Vout should be constrained to the range GND v (Vin or Vout) v VCC. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or V CC ). Unused outputs must be left open. Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. †Derating — SOIC Package: – 7 mW/_C from 65_ to 125_C TSSOP Package: − 6.1 mW/_C from 65_ to 125_C RECOMMENDED OPERATING CONDITIONS Symbol Parameter VCC DC Supply Voltage Vin DC Input Voltage Vout DC Output Voltage TA Operating Temperature, All Package Types tr, tf Input Rise and Fall Time VCC = 5.0V ±0.5V Min Max Unit 2.0 5.5 V 0 5.5 V 0 VCC V −55 +125 _C 0 0 100 20 ns/V VCC = 3.3V ±0.3V Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. DC ELECTRICAL CHARACTERISTICS Symbol Parameter Test Conditions Min 1.50 VCC x 0.7 VIH Minimum High−Level Input Voltage 2.0 3.0 to 5.5 VIL Maximum Low−Level Input Voltage 2.0 3.0 to 5.5 VOH Minimum High−Level Output Voltage VOL Maximum Low−Level Output Voltage TA = 25°C VCC V Typ TA = − 55 to 125°C Max Min 0.50 VCC x 0.3 Vin = VIH or VIL IOH = − 50mA 2.0 3.0 4.5 1.9 2.9 4.4 Vin = VIH or VIL IOH = − 4mA IOH = − 8mA 3.0 4.5 2.58 3.94 Vin = VIH or VIL IOL = 50mA 2.0 3.0 4.5 Vin = VIH or VIL IOL = 4mA IOL = 8mA Max 1.50 VCC x 0.7 2.0 3.0 4.5 Unit V 0.50 VCC x 0.3 V V 1.9 2.9 4.4 2.48 3.80 0.0 0.0 0.0 0.1 0.1 0.1 0.1 0.1 0.1 3.0 4.5 0.36 0.36 0.44 0.44 V Iin Maximum Input Leakage Current Vin = 5.5V or GND 0 to 5.5 ± 0.1 ± 1.0 mA IOZ Maximum 3−State Leakage Current Vin = VIL or VIH Vout = VCC or GND 5.5 ± 0.25 ± 2.5 mA ICC Maximum Quiescent Supply Current Vin = VCC or GND 5.5 4.0 40.0 mA Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. http://onsemi.com 2 MC74VHC541 AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0ns) TA = 25°C Symbol tPLH, tPHL tPZL, tPZH tPLZ, tPHZ tOSLH, tOSHL Parameter Maximum Propagation Delay, A to Y Output Enable TIme, OE to Y Output Disable Time, OE to Y Output to Output Skew Min Test Conditions TA = − 55 to 125°C Typ Max Min Max Unit ns VCC = 3.3 ± 0.3V CL = 15pF CL = 50pF 5.0 7.5 7.0 10.5 1.0 1.0 8.5 12.0 VCC = 5.0 ± 0.5V CL = 15pF CL = 50pF 3.5 5.0 5.0 7.0 1.0 1.0 6.0 8.0 VCC = 3.3 ± 0.3V RL = 1kW CL = 15pF CL = 50pF 6.8 9.3 10.5 14.0 1.0 1.0 12.5 16.0 VCC = 5.0 ± 0.5V RL = 1kW CL = 15pF CL = 50pF 4.7 6.2 7.2 9.2 1.0 1.0 8.5 10.5 VCC = 3.3 ± 0.3V RL = 1kW CL = 50pF 11.2 15.4 1.0 17.5 VCC = 5.0 ± 0.5V RL = 1kW CL = 50pF 6.0 8.8 1.0 10.0 VCC = 3.3 ± 0.3V (Note 1) CL = 50pF 1.5 1.5 ns VCC = 5.0 ± 0.5V (Note 1) CL = 50pF 1.0 1.0 ns 10 10 pF Cin Maximum Input Capacitance 4 Cout Maximum Three−State Output Capacitance (Output in High Impedance State) 6 ns ns pF Typical @ 25°C, VCC = 5.0V CPD 18 Power Dissipation Capacitance (Note 2) pF 1. Parameter guaranteed by design. tOSLH = |tPLHm − tPLHn|, tOSHL = |tPHLm − tPHLn|. 2. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC / 8 (per bit). CPD is used to determine the no−load dynamic power consumption; PD = CPD VCC2 fin + ICC VCC. NOISE CHARACTERISTICS (Input tr = tf = 3.0ns, CL = 50pF, VCC = 5.0V) TA = 25°C Symbol Parameter Typ Max Unit VOLP Quiet Output Maximum Dynamic VOL 0.9 1.2 V VOLV Quiet Output Minimum Dynamic VOL − 0.9 − 1.2 V VIHD Minimum High Level Dynamic Input Voltage 3.5 V VILD Maximum Low Level Dynamic Input Voltage 1.5 V SWITCHING WAVEFORMS VCC VCC OE1 or OE2 50% 50% GND A 50% tPZL tPLZ HIGH IMPEDANCE GND tPLH tPHL Y 50% VCC VOL +0.3V Y tPZH 50% VCC tPHZ VOH -0.3V Y Figure 2. 50% VCC Figure 3. http://onsemi.com 3 HIGH IMPEDANCE MC74VHC541 TEST CIRCUITS TEST POINT TEST POINT OUTPUT DEVICE UNDER TEST OUTPUT DEVICE UNDER TEST CL* CONNECT TO VCC WHEN TESTING tPLZ AND tPZL. CONNECT TO GND WHEN TESTING tPHZ AND tPZH. 1kW CL* *Includes all probe and jig capacitance *Includes all probe and jig capacitance Figure 4. Figure 5. INPUT Figure 6. Input Equivalent Circuit ORDERING INFORMATION Package Shipping† SOIC−20WB (Pb−Free) 1000 / Tape & Reel MC74VHC541DTG TSSOP−20 (Pb−Free) 75 Units / Rail MC74VHC541DTR2G TSSOP−20 (Pb−Free) 2500 / Tape & Reel Device MC74VHC541DWR2G †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. MARKING DIAGRAMS SOIC−20WB 20 TSSOP−20 20 VHC 541 ALYWG G VHC541 AWLYYWWG 1 1 http://onsemi.com 4 A = Assembly Location WL, L = Wafer Lot YY, Y = Year WW, W = Work Week G or G = Pb−Free Package (Note: Microdot may be in either location) MC74VHC541 PACKAGE DIMENSIONS TSSOP−20 CASE 948E−02 ISSUE C 20X 0.15 (0.006) T U 2X K REF 0.10 (0.004) S L/2 20 M T U S V K K1 ÍÍÍÍ ÍÍÍÍ ÍÍÍÍ S J J1 11 B L SECTION N−N −U− PIN 1 IDENT 0.25 (0.010) N 1 10 M 0.15 (0.006) T U S A −V− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE −W−. N F DETAIL E −W− C G D 0.100 (0.004) −T− SEATING H DETAIL E DIM A B C D F G H J J1 K K1 L M SOLDERING FOOTPRINT PLANE 7.06 1 0.65 PITCH 16X 0.36 16X 1.26 DIMENSIONS: MILLIMETERS http://onsemi.com 5 MILLIMETERS MIN MAX 6.40 6.60 4.30 4.50 --1.20 0.05 0.15 0.50 0.75 0.65 BSC 0.27 0.37 0.09 0.20 0.09 0.16 0.19 0.30 0.19 0.25 6.40 BSC 0_ 8_ INCHES MIN MAX 0.252 0.260 0.169 0.177 --0.047 0.002 0.006 0.020 0.030 0.026 BSC 0.011 0.015 0.004 0.008 0.004 0.006 0.007 0.012 0.007 0.010 0.252 BSC 0_ 8_ MC74VHC541 PACKAGE DIMENSIONS SOIC−20 WB DW SUFFIX CASE 751D−05 ISSUE G 20 11 X 45 _ h H M E 0.25 10X NOTES: 1. DIMENSIONS ARE IN MILLIMETERS. 2. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M, 1994. 3. DIMENSIONS D AND E DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE. 5. DIMENSION B DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE PROTRUSION SHALL BE 0.13 TOTAL IN EXCESS OF B DIMENSION AT MAXIMUM MATERIAL CONDITION. q A B M D 1 10 20X B B 0.25 M T A S B S L A 18X e A1 DIM A A1 B C D E e H h L q MILLIMETERS MIN MAX 2.35 2.65 0.10 0.25 0.35 0.49 0.23 0.32 12.65 12.95 7.40 7.60 1.27 BSC 10.05 10.55 0.25 0.75 0.50 0.90 0_ 7_ SEATING PLANE C T ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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