CQ 330B

[CQ-330B]
CQ-330B
High-Speed Response Coreless Current Sensor
1. General Description
CQ-330B is an open-type current sensor using a Hall sensor which outputs the analog voltage proportional
to the AC/DC current. Quantum well ultra- thin film InAs (Indium Arsenide) is used as the Hall sensor, which
enables the high-accuracy and high-speed current sensing. Coreless surface mount package realizes the spacesaving.
2. Features
-
Small-sized surface mount package: VSOP-24
High isolation voltage: 3.0kV (50/60Hz, 60sec)
Compliant to safety standards of IEC/UL-60950 and UL-508
Ultra-fast response time: 0.5μsec (typ.)
Low variation and low temperature drift of sensitivity and zero-current output voltage
No output hysteresis
Low noise output: 1.7mVrms (typ.)
Uni-directional type
5V single power supply
Ratiometric output
Halogen free
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3. Table of Contents
1. General Description ........................................................................................................................................................ 1
2. Features........................................................................................................................................................................... 1
3. Table of Contents ........................................................................................................................................................... 2
4. Block Diagram and Functions ........................................................................................................................................ 3
5. Pin Configurations and Functions .................................................................................................................................. 4
6. Safety Standards ............................................................................................................................................................. 5
7. Absolute Maximum Ratings ........................................................................................................................................... 5
8. Recommended Operating Conditions ............................................................................................................................. 5
9. Electrical Characteristics ................................................................................................................................................ 6
10. Characteristics Definitions............................................................................................................................................ 8
11. Recommended External Circuits ................................................................................................................................ 11
12. Package ....................................................................................................................................................................... 13
13. Board Layout Sample ................................................................................................................................................. 16
14. Reliability Tests .......................................................................................................................................................... 17
15. Precautions ................................................................................................................................................................. 18
IMPORTANT NOTICE ................................................................................................................................................... 19
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4. Block Diagram and Functions
P
Primary Conductor
Amplifier
Buffer
VOUT
Hall
Sensor
VSS
Compensation
Bias Unit
N
VDD
EEPROM Unit
TAB1
TAB2
TEST1
TEST2
TEST3
Figure 1. Functional block diagram of CQ-330B
Circuit Block
Primary
Conductor
Hall Sensor
Amplifier
Buffer
Compensation
Bias Unit
EEPROM Unit
Table 1. Explanation of circuit blocks
Function
Conductor which measured current is applied.
Hall element which detects magnetic flux density generated from the measured current.
Amplifier of Hall element’s output.
Output buffer with gain. This block outputs the voltage (VOUT) proportional to the current
applied to the primary conductor.
Compensation circuit which adjusts the temperature drifts of sensitivity and zero-current
output voltage.
Drive circuit for Hall element.
Non-volatile memory for setting adjustment parameters. The parameters are adjusted
before the shipment.
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5. Pin Configurations and Functions
VOUT
Measured Current IIN
VDD
N
P
9
10
CQ-330B
(Top View)
8
1
9% VDD
VDD
VOUT
0
P to N
INS
Figure 2. Pin assignment and typical output characteristics of CQ-330B
No.
1
2
3
4
5
6
7
8
9
10
Pin Name
TAB1
TEST1
VDD
TEST2
VSS
VOUT
TEST3
TAB2
N
P
Table 2. Pin configuration and functions of CQ-330B
I/O
Function
Radiation pin, recommended to connect to GND
Test pin, recommended to connect to GND
PWR Power supply pin, 5.0V
Test pin, recommended to connect to VDD
GND Ground pin (GND)
O
Analog output pin
Test pin, recommended to connect to GND
Radiation pin, recommended to connect to GND
I
Primary conductor pin
I
Primary conductor pin
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6. Safety Standards
- IEC/UL 60950-1 – Information Technology Equipment – Edition 2. (File No.E359197)
- CSA C22.2 NO. 60950-1-07 – Information Technology Equipment – Edition 2. (File No. E359197)
- UL 508 – Industrial Control Equipment – Edition 17. (File No. E353882)
7. Absolute Maximum Ratings
Table 3. Absolute maximum ratings
Parameter
Symbol
Min.
Max.
Units
Notes
Supply Voltage
VDD
−0.3
6.5
V
VDD pin
Analog Output Current
IOUT
−1
1
mA VOUT pin
Storage Temperature
Tstg
−40
125
°C
WARNING: Operation at or beyond these limits may result in permanent damage to the device. Normal
operation is not guaranteed at these extremes.
8. Recommended Operating Conditions
Parameter
Supply Voltage
Analog Output Current
Output Load Capacitance
Maximum Primary Current
(RMS)
Table 4. Recommended operating conditions
Symbol Min.
Typ. Max. Units
Notes
VDD
4.5
5.0
5.5
V
IOUT
−0.5
0.5
mA VOUT pin
CL
100
pF
VOUT pin
DC value or RMS value which can
IRMSmax
−20
20
A
be applied to primary conductor
see Figure 3
Operating Ambient
Ta
−40
90
°C
see Figure 3
Temperature
WARNING: Electrical characteristics are not guaranteed when operated at or beyond these conditions.
(80°C, 20A)
(90°C, 10A)
Conditions: Mounted on the test board shown in Figure 12. VDD = 5V
Figure 3. Primary current derating curve of CQ-330B
Cooling or thermal radiation will improve the derating curve above.
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9. Electrical Characteristics
Table 5. Electrical characteristics
Conditions (unless otherwise specified): Ta = 35°C, VDD = 5V
Parameter
Symbol
Conditions
Min.
Typ.
Max.
Units
Current Consumption
IDD
No loads
8.3
11
mA
Sensitivity
Vh
See paragraph 10.1
193
195
197
mV/A
(Note 1, Note 2, Note 3)
Zero-Current Output
Vof
See paragraph 10.1
0.430
0.450
0.470
V
Voltage (Note 1, Note 2)
Linear Sensing Range
INS
0
21.0
A
Linearity Error
ρ
See paragraph 10.2
−0.6
0.6
%F.S.
(Note 1, Note 2)
CL = 100pF,
Rise Response Time
tr
0.5
µsec
see paragraph 10.5
CL = 100pF,
Fall Response Time
tf
0.5
µsec
see paragraph 10.5
Bandwidth
fT
-3dB, CL = 100pF
1000
kHz
Output Noise (Note 2)
VNrms
100Hz to 4MHz
1.7
mVrms
Temperature Drift of
Vh-dmax Ta = −40 to 90°C
±2.1
%
Sensitivity (Note 2)
Temperature Drift of
Ta = −40 to 90°C
Zero-Current Output
Vof-dmax
±19
mV
IIN = 0A
Voltage (Note 2)
Ratiometricity Error of
Vh-R
VDD = 4.5V to 5.5V
−1.0
1.0
%
Sensitivity (Note 2)
Ratiometricity Error of
VDD = 4.5V to 5.5V,
%F.S.
Zero-Current Output
Vof-R
−0.7
0.7
IIN = 0A
Voltage (Note 2)
Ta = −40 to 90°C
±2.6
Total Accuracy (Note 5)
ETO
%F.S.
Ta = 35°C
±0.5
Primary Conductor
R1
1.6
mΩ
Resistance (Note 4)
Isolation Voltage(Note 6)
VINS
AC 50/60Hz, 60sec
3.0
kV
Isolation Resistance
RINS
DC 1kV
500
MΩ
(Note 4)
Clearance Distance
between primary and
dCL
5.0
5.2
mm
(Note 4)
secondary conductors
Creepage Distance
between primary and
dCP
5.0
5.2
mm
(Note 4)
secondary conductors
Note 1. These parameters can drift by long-term use or reflow process. Please see ‘14. Reliability Tests’ for the
reference of drift values.
Note 2. The primary current (IIN) is swept within 0~10A. Current is applied within 35msec in each step.
Note 3. This parameter is tested on condition that current density is uniform. Sensitivity may change slightly
depending on a primary conductor layout on PCB. Please see the application note provided in the
AKM website.
Note 4. These parameters are guaranteed by design.
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Note 5. Total accuracy ETO is calculated by the equation below.
ETO = |100 × (Vh_meas − 195) / 195| + |100 × (Vof_meas − Vof_meas_35) / (195 × 21 / 1000)| + |ρmeas|
where Vh_meas[mV/A], Vof_meas[V], ρmeas[%F.S.] represent the measured value of sensitivity,
zero-current output voltage and linearity error respectively, Vh[mV/A] represent the typical value of
sensitivity, and Vof_meas_35[V] represent the measured value of zero-current output voltage at Ta = 35°C.
Note 6. This parameter is tested in mass-production line for all devices.
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10. Characteristics Definitions
10.1. Sensitivity Vh [mV/A], Zero-current output Voltage Vof [V]
Sensitivity is defined as the slope of the approximate straight line calculated by the least square method,
using the data of VOUT pin voltage (VOUT) when the primary current (IIN) is swept within 0~10A.
Zero-current output voltage is defined as the intercept of the approximate straight line above.
10.2. Linearity Error ρ [%F.S.]
Linearity error is defined as the ration of the maximum error voltage (Vd) to the full scale (F.S.), where Vd is
the maximum difference between the VOUT pin voltage (VOUT) and the approximate straight line calculated
in the sensitivity and zero-current output voltage definition. Definition formula is shown in below:
ρ = Vd / F.S. × 100
Full scale (F.S.) is defined by the multiplication of the linear sensing range and sensitivity (Figure 4).
Approximate straight line
by least square method
VOUT(V)
F.S.
=Vh×|INS|
Actual output voltage
(Peak time: 35msec)
Vd
|INS| IIN(A)
0
Figure 4. Output characteristics of CQ-330B
10.3. Ratiometric Error of Sensitivity Vh-R [%] and Ratiometric Error of Zero-Current Output Voltage Vof-R
[%F.S.]
Output of CQ-330B is ratiometric, which means the values of sensitivity (Vh) and zero-current output
voltage (Vof) are proportional to the supply voltage (VDD). Ratiometric error is defined as the difference
between the Vh (or Vof) and ideal Vh (or Vof) when the VDD is changed from 5.0V to VDD1 (4.5V ≤ VDD1 ≤
5.5V). Definition formula is shown in below:
Vh-R = 100 × {(Vh(VDD = VDD1) / Vh(VDD = 5.0V)) – (VDD1 / 5.0)} / (VDD1 / 5.0)
Vof-R = 100 × (Vof(VDD = VDD1) – Vof(VDD = 5.0V) × VDD1 / 5.0) / F.S.
Full scale (F.S.) is defined by the multiplication of the linear sensing range and sensitivity at the condition of
VDD = 5.0V (Figure 4).
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10.4. Temperature Drift of Sensitivity Vh-d [%] , Temperature Drift of Zero-current output Voltage Vof-d [mV]
Temperature drift of sensitivity is defined as the drift ratio of the sensitivity (Vh) at Ta = Ta1 (–40°C ≤ Ta1 ≤
90°C) to the Vh at Ta = 35°C, and calculated from the formula below:
Vh-d = 100 × (Vh(Ta = Ta1) / Vh(Ta = 35°C) – 1)
Maximum temperature drift of sensitivity (Vh-dmax) is defined as the maximum value of |Vh-d| through the
defined temperature range.
Temperature drift of zero-current output voltage is defined as the drift value between the zero-current output
voltage (Vof) at Ta = Ta1 (–40°C ≤ Ta1 ≤ 90°C) and the Vof at Ta = 35°C, and calculated from the formula
below:
Vof-d = Vof(Ta = Ta1) – Vof(Ta = 35°C)
Maximum temperature drift of zero-current output voltage (Vof-dmax) is defined as the maximum value of
|Vof-d| through the defined temperature range.
Reference data of the temperature drift of sensitivity and zero-current output voltage are shown in Figure 5.
Figure 5. Temperature Drift of Sensitivity and Zero-current output Voltage.
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10.5. Rise Response Time tr [µsec] and Fall Response Time tf [µsec]
Rise response time (or fall response time) is defined as the time delay from the 90% (or 10%) of input
primary current (IIN) to the 90% (or 10%) of the VOUT pin voltage (VOUT) under the pulse input of primary
current (Figure 6).
IIN
IIN
90% IIN
10% IIN
Time
tr
VOUT
Time
tf
VOUT
10% Vout
90% Vout
Time
Time
Rise response time (tr)
Fall response time (tf)
Figure 6. Definition of response time
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11. Recommended External Circuits
P
N
Printed wiring pattern
for primary conductor
Printed wiring pattern
for primary conductor
9
10
CQ-330B
(Top View)
1
8
Printed wiring pattern
for radiation
VDD
Printed wiring pattern
for radiation
0.1uF
VOUT
Low-Pass Filter (Optional)
Figure 7. Recommended external circuits
Radiation pattern should be designed as wide as possible, so that the clearance and creepage distances satisfy
the requirement.
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CQ-330B
Figure 8. Recommended external circuits of CQ-330B
(a) 0.1F bypass capacitor should be placed near by the CQ-330B.
(b) CQ-330B has the ratiometric output. By making the supply voltage of CQ-330B and the reference voltage
of A/D converter common, the A/D conversion error caused by the fluctuation of supply voltage is
decreased. Voltage dividers (R1 and R2) are required if the reference voltage of A/D converter is less than
+5V.
For example, if the reference voltage of A/D converter is +3.3V which is its supply voltage level, R1=20kΩ,
R2=39kΩ are recommended. If the reference voltage of A/D converter is different from its supply voltage
level, one more voltage divider is required.
(c) Add a low-pass filter if it is necessary.
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12. Package
12.1. Outline Dimensions
Unit: mm
The tolerances of dimensions without any mention are ±0.1mm.
Terminals: Cu
Plating for Terminals: Sn-100% (10µm)
RoHS compliant, halogen-free
Figure 9. Outline dimensions of CQ-330B
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12.2. Recommended Pad Dimensions
C
W1
E
L
W1
L
P
W2
L
E
W1
W2
W3
C
P
W3
W2
1.42
7.62
3.60
1.65
0.35
0.30
0.65
Unit: mm
Figure 10. Pad dimensions of CQ-330B
If two or more trace layers are used as the current paths, please make enough number of through-holes to
flow current between the trace layers.
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12.3. Marking
Production information is printed on the package surface by laser marking. Markings consist of 10 characters
excluding AKM logo.
AKM
CQ 3 3 0
Y WW L
B
Product Code (CQ-330B)
Production Date (Y/WW/L)
Figure 11. Markings of CQ-330B
Table 6. Production date code table
Last Number of Year
Week Date
Lot Number
Character
Number
Character
Week
Character
Number
0
0
01
1
1
1
1
1
02
2
2
2
2
2
03
3
3
3
3
3
04
4
4
4
4
4
5
5
5
5
6
6
6
6
7
7
7
7
8
8
8
8
51
51
9
9
9
9
52
52
0
10
53
53
A
11
54
54
B
12
C
13
D
14
E
15
：
：
：
：
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F
16
G
17
H
18
J
19
K
20
L
21
M
22
N
23
P
24
R
25
S
26
T
27
U
28
V
29
W
30
X
31
Y
32
Z
33
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13. Board Layout Sample
(a) Top pattern
(b) Bottom pattern
Board size: 35.5mm × 42.0mm
Board thickness: 1.6mm
Copper layer thickness: 70µm
For more information about board layout, please see the application note provided in the AKM website.
Figure 12. Board layout sample of CQ-330B
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14. Reliability Tests
No.
Table 7. Test parameters and conditions of reliability tests
Test Parameter
Test Conditions
1
High Humidity Bias Test
2
High Temperature Bias Test
3
High Temperature Storage Test
4
Low Temperature Storage Test
5
Heat Cycle Test
n
Test Time
[JEITA EIAJ ED-4701 102]
Ta = 85C, 85%RH, continuous operation
22
1000h
[JEITA EIAJ ED-4701 101]
Ta = 125C, continuous operation
22
1000h
[JEITA EIAJ ED-4701 201]
Ta = 150C
22
1000h
22
1000h
22
100 cycles
[JEITA EIAJ ED-4701 202]
Ta = −55C
[JEITA EIAJ ED-4701 105]
−65C ↔150C
30min. ↔ 30min.
Tested in vapor phase
Tested samples are pretreated as below before each reliability test:
Desiccation: 125C/24h → Moisture Absorption: 60C/60%RH/120h → Reflow: 3 times (JEDEC Level2a)
Criteria：
Products whose drifts before and after the reliability tests do not exceed the values below are considered
to be in spec.
Sensitivity Vh (Ta=35C)
: Within ±1.5%
Zero-current output Voltage Vof (Ta=35C) : Within ±200mV
Linearity ρ (Ta=35C)
: Within ±1%F.S.
EEPROM data
: Unchanged
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15. Precautions
<Storage Environment>
Products should be stored at an appropriate temperature, and at as low humidity as possible
by using desiccator(5 to 35C). It is recommended to use the products within 4 weeks since it has
opened. Keep products away from chlorine and corrosive gas.
<Long-term Storage>
Long-term storage may result in poor lead solderability and degraded electrical performance even under
proper conditions. For those parts, which stored long-term shall be check solderability before it is used.
For storage longer than 1 year, it is recommended to store in nitrogen atmosphere. Oxygen of atmosphere
oxidizes leads of products and lead solderability get worse.
<Other Precautions>
1) This product should not be used under the environment with corrosive gas including chlorine or sulfur.
2) This product is lead (Pb) free. All leads are plated with 100% tin. Do not store this product alone in
high temperature and high humidity environment. Moreover, this product should be mounted on
substrate within six months after delivery.
3) This product is damaged when it is used on the following conditions:
- Supply voltage is applied in the opposite way.
- Overvoltage which is larger than the value indicated in the specification.
4) This product will be damaged if it is used for a long time with the current (effective current) which
exceeds the current rating. Careful attention must be paid so that maximum effective current is
smaller than current rating.
5) The characteristic can change by the influences of nearby current and magnetic field. Please make
sure of the mounting position.
As this product contains gallium arsenide, observe the following procedures for safety.
1) Do not alter the form of this product into a gas, powder, liquid, through burning, crushing, or chemical
processing.
2) Observe laws and company regulations when discarding this product.
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IMPORTANT NOTICE
0. Asahi Kasei Microdevices Corporation (“AKM”) reserves the right to make changes to the
information contained in this document without notice. When you consider any use or application of
AKM product stipulated in this document (“Product”), please make inquiries the sales office of AKM
or authorized distributors as to current status of the Products.
1. All information included in this document are provided only to illustrate the operation and
application examples of AKM Products. AKM neither makes warranties or representations with
respect to the accuracy or completeness of the information contained in this document nor grants any
license to any intellectual property rights or any other rights of AKM or any third party with respect
to the information in this document. You are fully responsible for use of such information contained
in this document in your product design or applications. AKM ASSUMES NO LIABILITY FOR
ANY LOSSES INCURRED BY YOU OR THIRD PARTIES ARISING FROM THE USE OF
SUCH INFORMATION IN YOUR PRODUCT DESIGN OR APPLICATIONS.
2. The Product is neither intended nor warranted for use in equipment or systems that require
extraordinarily high levels of quality and/or reliability and/or a malfunction or failure of which may
cause loss of human life, bodily injury, serious property damage or serious public impact, including
but not limited to, equipment used in nuclear facilities, equipment used in the aerospace industry,
medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic
signaling equipment, equipment used to control combustions or explosions, safety devices, elevators
and escalators, devices related to electric power, and equipment used in finance-related fields. Do not
use Product for the above use unless specifically agreed by AKM in writing.
3. Though AKM works continually to improve the Product’s quality and reliability, you are responsible
for complying with safety standards and for providing adequate designs and safeguards for your
hardware, software and systems which minimize risk and avoid situations in which a malfunction or
failure of the Product could cause loss of human life, bodily injury or damage to property, including
data loss or corruption.
4. Do not use or otherwise make available the Product or related technology or any information
contained in this document for any military purposes, including without limitation, for the design,
development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or
missile technology products (mass destruction weapons). When exporting the Products or related
technology or any information contained in this document, you should comply with the applicable
export control laws and regulations and follow the procedures required by such laws and regulations.
The Products and related technology may not be used for or incorporated into any products or
systems whose manufacture, use, or sale is prohibited under any applicable domestic or foreign laws
or regulations.
5. Please contact AKM sales representative for details as to environmental matters such as the RoHS
compatibility of the Product. Please use the Product in compliance with all applicable laws and
regulations that regulate the inclusion or use of controlled substances, including without limitation,
the EU RoHS Directive. AKM assumes no liability for damages or losses occurring as a result of
noncompliance with applicable laws and regulations.
6. Resale of the Product with provisions different from the statement and/or technical features set forth
in this document shall immediately void any warranty granted by AKM for the Product and shall not
create or extend in any manner whatsoever, any liability of AKM.
7. This document may not be reproduced or duplicated, in any form, in whole or in part, without prior
written consent of AKM.
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