Data Sheet

74LVC1G3157-Q100
2-channel analog multiplexer/demultiplexer
Rev. 3 — 31 May 2016
Product data sheet
1. General description
The 74LVC1G3157-Q100 provides one analog multiplexer/demultiplexer with one digital
select input (S), two independent inputs/outputs (Y0, Y1) and a common input/output (Z).
Schmitt trigger action at the select input makes the circuit tolerant of slower input rise and
fall times across the entire VCC range from 1.65 V to 5.5 V.
This product has been qualified to the Automotive Electronics Council (AEC) standard
Q100 (Grade 1) and is suitable for use in automotive applications.
2. Features and benefits
 Automotive product qualification in accordance with AEC-Q100 (Grade 1)
 Specified from 40 C to +85 C and from 40 C to +125 C
 Wide supply voltage range from 1.65 V to 5.5 V
 Very low ON resistance:
 7.5  (typical) at VCC = 2.7 V
 6.5  (typical) at VCC = 3.3 V
 6  (typical) at VCC = 5 V
 Switch current capability of 32 mA
 Break-before-make switching
 High noise immunity
 CMOS low power consumption
 TTL interface compatibility at 3.3 V
 Latch-up performance meets requirements of JESD 78 Class I
 Control input accepts voltages up to 5.5 V
 Multiple package options
 ESD protection:
 MIL-STD-883, method 3015 exceeds 2000 V
 HBM JESD22-A114F exceeds 2000 V
 MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )
74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
3. Ordering information
Table 1.
Ordering information
Type number
Package
Temperature range Name
Description
Version
SOT363
74LVC1G3157GW-Q100 40 C to +125 C
SC-88
plastic surface-mounted package; 6 leads
40 C to +125 C
SC-74
plastic surface-mounted package (TSOP6); 6 leads SOT457
74LVC1G3157GV-Q100
4. Marking
Table 2.
Marking
Type number
Marking code[1]
74LVC1G3157GW-Q100
YJ
74LVC1G3157GV-Q100
YJ
[1]
The pin 1 indicator is located on the lower left corner of the device, below the marking code.
5. Functional diagram
<
6
=
6 <
= <
<
DDF
DDF
Fig 1.
Logic symbol
74LVC1G3157_Q100
Product data sheet
Fig 2.
Logic diagram
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2-channel analog multiplexer/demultiplexer
6. Pinning information
6.1 Pinning
/9&*4
< 6
*1' 9&&
< =
DDD
Fig 3.
Pin configuration SOT363 and SOT457
6.2 Pin description
Table 3.
Pin description
Symbol
Pin
Description
Y1
1
independent input or output
GND
2
ground (0 V)
Y0
3
independent input or output
Z
4
common output or input
VCC
5
supply voltage
S
6
select input
7. Functional description
Table 4.
Function table[1]
Input S
Channel on
L
Y0
H
Y1
[1]
H = HIGH voltage level; L = LOW voltage level.
74LVC1G3157_Q100
Product data sheet
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8. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V).
Symbol
Parameter
VCC
supply voltage
Conditions
[1]
VI
input voltage
IIK
input clamping current
VI < 0.5 V or VI > VCC + 0.5 V
ISK
switch clamping current
VI < 0.5 V or VI > VCC + 0.5 V
[2]
Min
Max
Unit
0.5
+6.5
V
0.5
+6.5
50
-
mA
-
50
mA
0.5
VCC + 0.5
V
VSW
switch voltage
enable and disable mode
ISW
switch current
VSW > 0.5 V or VSW < VCC + 0.5 V
-
50
mA
ICC
supply current
-
100
mA
IGND
ground current
100
-
mA
Tstg
storage temperature
65
+150
C
-
250
mW
total power dissipation
Ptot
Tamb = 40 C to +125 C
[3]
[1]
The minimum input voltage rating may be exceeded if the input current rating is observed.
[2]
The minimum and maximum switch voltage ratings may be exceeded if the switch clamping current rating is observed.
[3]
For SC-88 and SC-74 packages: above 87.5 C the value of Ptot derates linearly with 4.0 mW/K.
V
9. Recommended operating conditions
Table 6.
Recommended operating conditions
Symbol
Parameter
VCC
supply voltage
VI
input voltage
VSW
Conditions
switch voltage
Tamb
ambient temperature
t/V
input transition rise and fall rate
Min
Typ
Max
Unit
1.65
-
5.5
V
0
-
5.5
V
0
-
VCC
V
C
enable and disable mode
[1]
40
-
+125
VCC = 1.65 V to 2.7 V
[2]
-
-
20
ns/V
VCC = 2.7 V to 5.5 V
[2]
-
-
10
ns/V
[1]
To avoid sinking GND current from terminal Z when switch current flows in terminal Yn, the voltage drop across the bidirectional switch
must not exceed 0.4 V. If the switch current flows into terminal Z, no GND current flows from terminal Yn. In this case, there is no limit for
the voltage drop across the switch.
[2]
Applies to control signal levels.
74LVC1G3157_Q100
Product data sheet
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Rev. 3 — 31 May 2016
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10. Static characteristics
Table 7.
Static characteristics
At recommended operating conditions; voltages are referenced to GND (ground 0 V).
Symbol Parameter
40 C to +85 C
Conditions
Min
HIGH-level
input voltage
VIH
VCC = 1.65 V to 1.95 V
LOW-level
input voltage
40 C to +125 C
Max
Min
Max
Unit
0.65VCC
-
-
0.65VCC
-
V
VCC = 2.3 V to 2.7 V
1.7
-
-
1.7
-
V
VCC = 3 V to 3.6 V
2.0
-
-
2.0
-
V
0.7VCC
-
-
0.7VCC
-
V
VCC = 1.65 V to 1.95 V
-
-
0.35VCC
-
VCC = 2.3 V to 2.7 V
-
-
0.7
-
0.7
V
VCC = 3 V to 3.6 V
-
-
0.8
-
0.8
V
0.3VCC
V
VCC = 4.5 V to 5.5 V
VIL
Typ[1]
VCC = 4.5 V to 5.5 V
0.35VCC V
-
-
0.3VCC
[2]
-
0.1
2
-
10
A
[2]
-
0.1
5
-
20
A
[2]
-
0.1
5
-
20
A
II
input leakage
current
pin S; VI = 5.5 V or GND;
VCC = 0 V to 5.5 V
IS(OFF)
OFF-state
leakage
current
VCC = 5.5 V; see Figure 4
IS(ON)
ON-state
leakage
current
VCC = 5.5 V; see Figure 5
ICC
supply current VI = 5.5 V or GND;
VSW = GND or VCC; VCC = 1.65 V
to 5.5 V
[2]
-
0.1
10
-
40
A
ICC
additional
pin S; VI = VCC  0.6 V;
supply current VCC = 5.5 V; VSW = GND or VCC
[2]
-
5
500
-
5000
A
CI
input
capacitance
-
2.5
-
-
-
pF
CS(OFF)
OFF-state
capacitance
-
6.0
-
-
-
pF
CS(ON)
ON-state
capacitance
-
18
-
-
-
pF
[1]
Typical values are measured at Tamb = 25 C.
[2]
These typical values are measured at VCC = 3.3 V
74LVC1G3157_Q100
Product data sheet
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Rev. 3 — 31 May 2016
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2-channel analog multiplexer/demultiplexer
10.1 Test circuits
9&&
9,/RU9,+
6
<
=
<
VZLWFK
VZLWFK
6
9,+
9,/
,6
92
9,
*1'
DDF
VI = VCC or GND and VO = GND or VCC.
Fig 4.
Test circuit for measuring OFF-state leakage current
9&&
9,/RU9,+
,6
6
<
=
<
VZLWFK
6
9,+
9,/
VZLWFK
9,
92
*1'
DDF
VI = VCC or GND and VO = open circuit.
Fig 5.
Test circuit for measuring ON-state leakage current
74LVC1G3157_Q100
Product data sheet
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10.2 ON resistance
Table 8.
ON resistance
At recommended operating conditions; voltages are referenced to GND (ground 0 V); for graphs see Figure 7 to Figure 12.
Symbol
RON(peak)
RON(rail)
Parameter
ON resistance (peak)
ON resistance (rail)
40 C to +85 C
Conditions
40 C to +125 C Unit
Min
Typ[1]
Max
Min
Max
ISW = 4 mA;
VCC = 1.65 V to 1.95 V
-
34.0
130
-
195

ISW = 8 mA; VCC = 2.3 V to 2.7 V
-
12.0
30
-
45

ISW = 12 mA; VCC = 2.7 V
-
10.4
25
-
38

ISW = 24 mA; VCC = 3 V to 3.6 V
-
7.8
20
-
30

ISW = 32 mA; VCC = 4.5 V to 5.5 V
-
6.2
15
-
23

ISW = 4 mA;
VCC = 1.65 V to 1.95 V
-
8.2
18
-
27

ISW = 8 mA; VCC = 2.3 V to 2.7 V
-
7.1
16
-
24

ISW = 12 mA; VCC = 2.7 V
-
6.9
14
-
21

VI = GND to VCC; see Figure 6
VI = GND; see Figure 6
ISW = 24 mA; VCC = 3 V to 3.6 V
-
6.5
12
-
18

ISW = 32 mA; VCC = 4.5 V to 5.5 V
-
5.8
10
-
15

ISW = 4 mA;
VCC = 1.65 V to 1.95 V
-
10.4
30
-
45

ISW = 8 mA; VCC = 2.3 V to 2.7 V
-
7.6
20
-
30

ISW = 12 mA; VCC = 2.7 V
-
7.0
18
-
27

ISW = 24 mA; VCC = 3 V to 3.6 V
-
6.1
15
-
23

-
4.9
10
-
15

ISW = 4 mA;
VCC = 1.65 V to 1.95 V
-
26.0
-
-
-

VI = VCC; see Figure 6
ISW = 32 mA; VCC = 4.5 V to 5.5 V
RON(flat)
ON resistance
(flatness)
VI = GND to VCC
[2]
ISW = 8 mA; VCC = 2.3 V to 2.7 V
-
5.0
-
-
-

ISW = 12 mA; VCC = 2.7 V
-
3.5
-
-
-

ISW = 24 mA; VCC = 3 V to 3.6 V
-
2.0
-
-
-

ISW = 32 mA; VCC = 4.5 V to 5.5 V
-
1.5
-
-
-

[1]
Typical values are measured at Tamb = 25 C and nominal VCC.
[2]
Flatness is defined as the difference between the maximum and minimum value of ON resistance measured at identical VCC and
temperature.
74LVC1G3157_Q100
Product data sheet
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10.3 ON resistance test circuit and graphs
PQD
521
ȍ
96:
9
VZLWFK
9&&
9,/RU9,+
6
<
=
<
9,/
9,+
VZLWFK
6
,6:
9,
*1'
RON = VSW / ISW.
9,9
DDF
(1) VCC = 1.8 V.
(2) VCC = 2.5 V.
(3) VCC = 2.7 V.
(4) VCC = 3.3 V.
(5) VCC = 5.0 V.
Fig 6.
Test circuit for measuring ON resistance
Fig 7.
DDD
Typical ON resistance as a function of input
voltage; Tamb = 25 C
DDD
521
ȍ
521
ȍ
9,9
(1) Tamb = 125 C.
(2) Tamb = 85 C.
(2) Tamb = 85 C.
(3) Tamb = 25 C.
(3) Tamb = 25 C.
(4) Tamb = 40 C.
(4) Tamb = 40 C.
ON resistance as a function of input voltage;
VCC = 1.8 V
74LVC1G3157_Q100
Product data sheet
9,9
(1) Tamb = 125 C.
Fig 8.
Fig 9.
ON resistance as a function of input voltage;
VCC = 2.5 V
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DDD
DDD
521
ȍ
521
ȍ
9,9
9,9
(1) Tamb = 125 C.
(1) Tamb = 125 C.
(2) Tamb = 85 C.
(2) Tamb = 85 C.
(3) Tamb = 25 C.
(3) Tamb = 25 C.
(4) Tamb = 40 C.
(4) Tamb = 40 C.
Fig 10. ON resistance as a function of input voltage;
VCC = 2.7 V
Fig 11. ON resistance as a function of input voltage;
VCC = 3.3 V
DDD
521
ȍ
9,9
(1) Tamb = 125 C.
(2) Tamb = 85 C.
(3) Tamb = 25 C.
(4) Tamb = 40 C.
Fig 12. ON resistance as a function of input voltage; VCC = 5.0 V
74LVC1G3157_Q100
Product data sheet
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11. Dynamic characteristics
Table 9.
Dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for load circuit see Figure 16.
Symbol Parameter
tpd
ten
propagation delay
enable time
40 C to +85 C
Conditions
Min
Max
Min
Max
VCC = 1.65 V to 1.95 V
-
-
2
-
3.0
ns
VCC = 2.3 V to 2.7 V
-
-
1.2
-
2.0
ns
VCC = 2.7 V
-
-
1.0
-
1.5
ns
VCC = 3 V to 3.6 V
-
-
0.8
-
1.5
ns
VCC = 4.5 V to 5.5 V
-
-
0.6
-
1.0
ns
3.1
8.7
20.8
3.1
22.0
ns
Z to Yn or Yn to Z; see Figure 13
S to Yn; see Figure 14
[2][3]
[4]
VCC = 1.65 V to 1.95 V
VCC = 2.3 V to 2.7 V
2.2
5.3
11.5
2.2
12.5
ns
VCC = 2.7 V
2.1
4.9
9.3
2.1
10.2
ns
VCC = 3 V to 3.6 V
1.8
4.0
7.6
1.8
9.0
ns
1.5
3.0
5.7
1.5
6.1
ns
VCC = 1.65 V to 1.95 V
3.0
6.0
11.4
3.0
11.7
ns
VCC = 2.3 V to 2.7 V
2.1
4.4
7.3
2.1
7.6
ns
VCC = 2.7 V
2.1
4.2
6.3
2.1
6.6
ns
VCC = 3 V to 3.6 V
1.7
3.6
5.3
1.7
5.9
ns
VCC = 4.5 V to 5.5 V
1.3
2.9
3.8
1.3
4.3
ns
0.5
-
-
0.5
-
ns
VCC = 4.5 V to 5.5 V
tdis
tb-m
disable time
break-before-make
time
40 C to +125 C Unit
Typ[1]
S to Yn; see Figure 14
[5]
[6]
see Figure 15
VCC = 1.65 V to 1.95 V
VCC = 2.3 V to 2.7 V
0.5
-
-
0.5
-
ns
VCC = 2.7 V
0.5
-
-
0.5
-
ns
VCC = 3 V to 3.6 V
0.5
-
-
0.5
-
ns
VCC = 4.5 V to 5.5 V
0.5
-
-
0.5
-
ns
[1]
Typical values are measured at Tamb = 25 C and nominal VCC.
[2]
tpd is the same as tPLH and tPHL.
[3]
Propagation delay is the calculated RC time constant of the typical ON resistance of the switch and the specified capacitance when
driven by an ideal voltage source (zero output impedance).
[4]
ten is the same as tPZH and tPZL.
[5]
tdis is the same as tPLZ and tPHZ.
[6]
Break-before-make specified by design.
74LVC1G3157_Q100
Product data sheet
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11.1 Waveforms and test circuits
9,
<QRU=
LQSXW
90
90
*1'
W3/+
W3+/
92+
=RU<Q
RXWSXW
90
90
92/
DDF
Measurement points are given in Table 10.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Fig 13. Input (Yn or Z) to output (Z or Yn) propagation delays
9,
6LQSXW
90
*1'
W3=/
W3/=
9&&
<Q
RXWSXW
/2:WR2))
2))WR/2:
90
9;
92/
W3=+
W3+=
92+
<Q
RXWSXW
+,*+WR2))
2))WR+,*+
9<
90
*1'
VZLWFK
HQDEOHG
VZLWFK
GLVDEOHG
VZLWFK
HQDEOHG
DDF
Measurement points are given in Table 10.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Fig 14. Enable and disable times
Table 10.
Measurement points
Supply voltage
Input
Output
VCC
VM
VM
VX
VY
1.65 V to 5.5 V
0.5  VCC
0.5  VCC
VOL + 0.3 V
VOH  0.3 V
74LVC1G3157_Q100
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2-channel analog multiplexer/demultiplexer
9&&
9,
*
92
5/
9&&
6
<
=
<
&/
*1'
DDF
a. Test circuit
9,
9,
92
92
92
WEP
DDJ
b. Input and output measurement points
Fig 15. Test circuit for measuring break-before-make timing
9(;7
9&&
*
9,
5/
92
'87
57
&/
5/
PQD
Test data is given in Table 11.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
VEXT = External voltage for measuring switching times.
Fig 16. Test circuit for measuring switching times
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Table 11.
Test data
Supply voltage
Input
Load
VEXT
VCC
VI
tr, tf
CL
RL
tPLH, tPHL
tPZH, tPHZ
tPZL, tPLZ
1.65 V to 1.95 V
VCC
 2.0 ns
50 pF
500 
open
GND
2  VCC
2.3 V to 2.7 V
VCC
 2.0 ns
50 pF
500 
open
GND
2  VCC
2.7 V
VCC
 2.5 ns
50 pF
500 
open
GND
2  VCC
3 V to 3.6 V
VCC
 2.5 ns
50 pF
500 
open
GND
2  VCC
4.5 V to 5.5 V
VCC
 2.5 ns
50 pF
500 
open
GND
2  VCC
11.2 Additional dynamic characteristics
Table 12. Additional dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); Tamb = 25 C.
Symbol
Parameter
Conditions
THD
total harmonic distortion
fi = 600 Hz to 20 kHz; RL = 600 ;
CL = 50 pF; VI = 0.5 V (p-p);
see Figure 17
f(3dB)
iso
Qinj
3 dB frequency response
isolation (OFF-state)
charge injection
74LVC1G3157_Q100
Product data sheet
Min
Typ
Max
Unit
VCC = 1.65 V
-
0.260
-
%
VCC = 2.3 V
-
0.078
-
%
VCC = 3.0 V
-
0.078
-
%
VCC = 4.5 V
-
0.078
-
%
VCC = 1.65 V
-
200
-
MHz
VCC = 2.3 V
-
300
-
MHz
VCC = 3.0 V
-
300
-
MHz
VCC = 4.5 V
-
300
-
MHz
VCC = 1.65 V
-
42
-
dB
VCC = 2.3 V
-
42
-
dB
VCC = 3.0 V
-
40
-
dB
VCC = 4.5 V
-
40
-
dB
VCC = 1.8 V
-
3.3
-
pC
VCC = 2.5 V
-
4.1
-
pC
VCC = 3.3 V
-
5.0
-
pC
VCC = 4.5 V
-
6.4
-
pC
VCC = 5.5 V
-
7.5
-
pC
RL = 50 ; see Figure 18
RL = 50 ; CL = 5 pF; fi = 10 MHz;
see Figure 19
CL = 0.1 nF; Vgen = 0 V; Rgen = 0 ;
fi = 1 MHz; RL = 1 M; see Figure 20
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
13 of 21
74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
11.3 Test circuits
9&&
9,/RU9,+
IL
—)
9&&
6
<
=
<
5/
—)
VZLWFK
6
9,/
9,+
'
&/
ȍ
VZLWFK
*1'
DDF
Fig 17. Test circuit for measuring total harmonic distortion
9&&
9,/RU9,+
'&ELDV P9
IL
—)
6
< =
< VZLWFK
6
9,/
9,+
VZLWFK
5/
ȍ
G%
*1'
DDD
To obtain 0 dBm level at input, adjust fi voltage. Increase fi frequency until dB meter reads 3 dB.
Fig 18. Test circuit for measuring the frequency response when switch is in ON-state
9&&
9&&
9&&
5/
9,/RU9,+
IL
—)
5/
6
<
=
<
VZLWFK
&/
ȍ
VZLWFK
6
9,+
9,/
G%
*1'
DDF
To obtain 0 dBm level at input, adjust fi voltage
Fig 19. Test circuit for measuring isolation (OFF-state)
74LVC1G3157_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
14 of 21
74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
9&&
*
6
< =
< VZLWFK
5JHQ
9,
5/
&/
92
9JHQ
*1'
DDD
a. Test circuit
ORJLF
6 RII
LQSXW
RQ
92
RII
ǻ92
DDF
b. Input and output pulse definitions
Qinj = VO  CL.
VO = output voltage variation.
Rgen = generator resistance.
Vgen = generator voltage.
Fig 20. Test circuit for measuring charge injection
74LVC1G3157_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
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74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
12. Package outline
3ODVWLFVXUIDFHPRXQWHGSDFNDJHOHDGV
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Fig 21. Package outline SOT363 (SC-88)
74LVC1G3157_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
16 of 21
74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
3ODVWLFVXUIDFHPRXQWHGSDFNDJH7623OHDGV
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Fig 22. Package outline SOT457 (SC-74)
74LVC1G3157_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
17 of 21
74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
13. Abbreviations
Table 13.
Abbreviations
Acronym
Description
CMOS
Complementary Metal Oxide Semiconductor
TTL
Transistor-Transistor Logic
HBM
Human Body Model
ESD
ElectroStatic Discharge
MM
Machine Model
MIL
Military
DUT
Device Under Test
14. Revision history
Table 14.
Revision history
Document ID
Release date
74LVC1G3157_Q100 v.3 20160531
Modifications:
•
•
•
•
Product data sheet
Supersedes
-
74LVC1G3157_Q100 v.2
Table 12 and Figure 18: Condition and test circuit for f(-3dB) revised.
Figure 20: Test circuit for charge injection revised.
Product data sheet
-
74LVC1G3157_Q100 v.1
Type number 74LVC1G3157GM-Q100 has been removed.
74LVC1G3157_Q100 v.1 20130219
74LVC1G3157_Q100
Change notice
Product data sheet
Table 9: Minimum and maximum values enable and disable times revised.
74LVC1G3157_Q100 v.2 20130410
Modifications:
Data sheet status
Product data sheet
-
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
-
© NXP Semiconductors N.V. 2016. All rights reserved.
18 of 21
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NXP Semiconductors
2-channel analog multiplexer/demultiplexer
15. Legal information
15.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
74LVC1G3157_Q100
Product data sheet
Suitability for use in automotive applications — This NXP
Semiconductors product has been qualified for use in automotive
applications. Unless otherwise agreed in writing, the product is not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer's own
risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
19 of 21
74LVC1G3157-Q100
NXP Semiconductors
2-channel analog multiplexer/demultiplexer
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
15.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
74LVC1G3157_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
20 of 21
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74LVC1G3157-Q100
2-channel analog multiplexer/demultiplexer
17. Contents
1
2
3
4
5
6
6.1
6.2
7
8
9
10
10.1
10.2
10.3
11
11.1
11.2
11.3
12
13
14
15
15.1
15.2
15.3
15.4
16
17
General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
Pinning information . . . . . . . . . . . . . . . . . . . . . . 3
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
Functional description . . . . . . . . . . . . . . . . . . . 3
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
Recommended operating conditions. . . . . . . . 4
Static characteristics. . . . . . . . . . . . . . . . . . . . . 5
Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
ON resistance . . . . . . . . . . . . . . . . . . . . . . . . . . 7
ON resistance test circuit and graphs. . . . . . . . 8
Dynamic characteristics . . . . . . . . . . . . . . . . . 10
Waveforms and test circuits . . . . . . . . . . . . . . 11
Additional dynamic characteristics . . . . . . . . . 13
Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 16
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 18
Legal information. . . . . . . . . . . . . . . . . . . . . . . 19
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 19
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Contact information. . . . . . . . . . . . . . . . . . . . . 20
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP Semiconductors N.V. 2016.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 31 May 2016
Document identifier: 74LVC1G3157_Q100