INTERSIL CD40193BMS

CD40192BMS
CD40193BMS
CMOS Presettable Up/Down Counters
(Dual Clock With Reset)
December 1992
Features
Description
• CD40192BMS - BCD Type
CD40192BMS Presettable BCD Up/Down Counter and the
CD40193BMS Presettable Binary Up/Down Counter each consist of 4 synchronously clocked, gated “D” type flip-flops connected as a counter. The inputs consist of 4 individual jam lines,
a PRESET ENABLE control, individual CLOCK UP and
CLOCK DOWN signals and a master RESET. Four buffered Q
signal outputs as well as CARRY and BORROW outputs for
multiple-stage counting schemes are provided.
• CD40193BMS - Binary Type
• High Voltage Type (20V Rating)
• Individual Clock Lines for Counting Up or Counting
Down
• Synchronous High-Speed Carry and Borrow Propagation Delays for Cascading
The counter is cleared so that all outputs are in a low state by a
high on the RESET line. A RESET is accomplished asynchronously with the clock. Each output is individually programmable
asynchronously with the clock to the level on the corresponding
jam input when the PRESET ENABLE control is low.
• Asynchronous Reset and Preset Capability
• Medium Speed Operation
- fCL = 8MHz (typ.) at 10V
• 5V, 10V and 15V Parametric Ratings
• Standardize Symmetrical Output Characteristics
• 100% Tested for Quiescent Current at 20V
• Maximum Input Current of 1µA at 18V Over Full Package Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package/Temperature Range)
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• Up/Down Difference Counting
The counter counts up one count on the positive clock edge of
the CLOCK UP signal provided the CLOCK DOWN line is high.
The counter counts down one count on the positive clock edge
of the CLOCK DOWN signal provided the CLOCK UP line is
high.
The CARRY and BORROW signals are high when the counter
is counting up or down. The CARRY signal goes low one-half
clock cycle after the counter reaches its maximum count in the
count-up mode. The BORROW signal goes low one-half clock
cycle after the counter reaches its minimum count in the countdown mode. Cascading of multiple packages is easily accomplished without the need for additional external circuitry by tying
the BORROW and CARRY outputs to the CLOCK DOWN and
CLOCK UP inputs, respectively, of the succeeding counter
package.
The CD40192BMS and CD40193BMS are supplied in these
16-lead outline packages:
• Multistage Ripple Counting
• Synchronous Frequency Dividers
• A/D and D/A Conversion
• Programmable Binary or BCD Counting
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
*H4W,
H1F
*H6P,
†H4X
* CD40192B Only
†CD40193B Only
†H6W
Functional Diagram
Pinout
CD40192BMS, CD40193BMS
TOP VIEW
J2
Q2
Q1
1
2
3
CLOCK DOWN 4
CLOCK UP
5
PRESET
ENABLE
16 VDD
J1
15 J1
J2
14 RESET
J3
J4
13 BORROW
CLOCK UP
12 CARRY
Q3
6
11 PRESET ENABLE
Q4
7
10 J3
VSS
8
9 J4
CLOCK DOWN
11
15
3
1
2
10
6
9
7
5
13
4
12
Q2
Q3
Q4
BORROW
CARRY
14
RESET
Q1
VDD = 16
VSS = 8
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-1419
File Number
3363
Specifications CD40192BMS, CD40193BMS
Absolute Maximum Ratings
Reliability Information
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC
Package Types D, F, K, H
Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265oC
At Distance 1/16 ± 1/32 Inch (1.59mm ± 0.79mm) from case for
10s Maximum
Thermal Resistance
θja
θjc
Ceramic DIP and FRIT Package . . . . . 80oC/W
20oC/W
Flatpack Package . . . . . . . . . . . . . . . . 70oC/W
20oC/W
Maximum Package Power Dissipation (PD) at +125oC
For TA = -55oC to +100oC (Package Type D, F, K) . . . . . . 500mW
For TA = +100oC to +125oC (Package Type D, F, K). . . . . . Derate
Linearity at 12mW/oC to 200mW
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS (NOTE 1)
VDD = 20V, VIN = VDD or GND
VDD = 18V, VIN = VDD or GND
Input Leakage Current
IIL
VIN = VDD or GND
VDD = 20V
VDD = 18V
Input Leakage Current
IIH
VIN = VDD or GND
VDD = 20V
VDD = 18V
Output Voltage
Output Voltage
VOL15
VOH15
VDD = 15V, No Load
VDD = 15V, No Load (Note 3)
LIMITS
GROUP A
SUBGROUPS
TEMPERATURE
MIN
MAX
UNITS
1
+25oC
-
10
µA
2
+125oC
-
1000
µA
3
-55oC
-
10
µA
1
+25oC
-100
-
nA
2
+125oC
-1000
-
nA
3
-55oC
-100
-
nA
1
+25oC
-
100
nA
2
+125oC
-
1000
nA
3
-55oC
-
100
nA
1, 2, 3
+25oC,
+125oC,
-55oC
-
50
mV
1, 2, 3
+25oC,
+125oC,
-55oC
14.95
-
V
Output Current (Sink)
IOL5
VDD = 5V, VOUT = 0.4V
1
+25oC
0.53
-
mA
Output Current (Sink)
IOL10
VDD = 10V, VOUT = 0.5V
1
+25oC
1.4
-
mA
1
+25oC
3.5
-
mA
1
+25oC
-
-0.53
mA
Output Current (Sink)
Output Current (Source)
IOL15
IOH5A
VDD = 15V, VOUT = 1.5V
VDD = 5V, VOUT = 4.6V
Output Current (Source)
IOH5B
VDD = 5V, VOUT = 2.5V
1
+25oC
-
-1.8
mA
Output Current (Source)
IOH10
VDD = 10V, VOUT = 9.5V
1
+25oC
-
-1.4
mA
1
+25oC
-
-3.5
mA
1
+25oC
-2.8
-0.7
V
VSS = 0V, IDD = 10µA
1
+25oC
0.7
2.8
V
VDD = 2.8V, VIN = VDD or GND
7
+25oC
VDD = 20V, VIN = VDD or GND
7
+25oC
VDD = 18V, VIN = VDD or GND
8A
+125oC
VDD = 3V, VIN = VDD or GND
8B
-55oC
Output Current (Source)
N Threshold Voltage
P Threshold Voltage
Functional
IOH15
VNTH
VPTH
F
VDD = 15V, VOUT = 13.5V
VDD = 10V, ISS = -10µA
VOH > VOL <
VDD/2 VDD/2
V
Input Voltage Low
(Note 2)
VIL
VDD = 5V, VOH > 4.5V, VOL < 0.5V
1, 2, 3
+25oC, +125oC, -55oC
-
1.5
V
Input Voltage High
(Note 2)
VIH
VDD = 5V, VOH > 4.5V, VOL < 0.5V
1, 2, 3
+25oC, +125oC, -55oC
3.5
-
V
Input Voltage Low
(Note 2)
VIL
VDD = 15V, VOH > 13.5V,
VOL < 1.5V
1, 2, 3
+25oC, +125oC, -55oC
-
4
V
Input Voltage High
(Note 2)
VIH
VDD = 15V, VOH > 13.5V,
VOL < 1.5V
1, 2, 3
+25oC, +125oC, -55oC
11
-
V
NOTES: 1. All voltages referenced to device GND, 100% testing being
implemented.
2. Go/No Go test with limits applied to inputs.
7-1420
3. For accuracy, voltage is measured differentially to VDD. Limit
is 0.050V max.
Specifications CD40192BMS, CD40193BMS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS (NOTES 1, 2)
Propagation Delay
Clock Up or Clock Down
to Q
TPHL1
TPLH1
VDD = 5V, VIN = VDD or GND
Propagation Delay
Reset to Q
TPHL2
VDD = 5V, VIN = VDD or GND
Propagation Delay
PE to Q
TPHL3
TPLH3
VDD = 5V, VIN = VDD or GND
VDD = 5V, VIN = VDD or GND
Propagation Delay
PE to Borrow or Carry
TPHL5
TPLH5
VDD = 5V, VIN = VDD or GND
Maximum Clock Input
Frequency
9
10, 11
TPHL4
TPLH4
Transition Time
9
10, 11
Propagation Delay
Clock Up to Carry, Clock
Down to Borrow
Propagation Delay
Reset to Borrow or Carry
GROUP A
SUBGROUPS TEMPERATURE
TPHL6
TPLH6
TTHL
TTLH
9
+125oC,
-55oC
+25oC
o
o
-
500
ns
-
675
ns
-
500
ns
-
675
ns
-
400
ns
-
540
ns
9
-
320
ns
-
432
ns
-
600
ns
-
810
ns
-
600
ns
-
810
ns
-
200
ns
-
270
ns
2
-
MHz
1.48
-
MHz
MIN
MAX
UNITS
µA
9
9
10, 11
VDD = 5V, VIN = VDD or GND
+25oC
UNITS
+25oC
9
10, 11
FCL
-55oC
MAX
+125 C, -55 C
10, 11
VDD = 5V, VIN = VDD or GND
+125oC,
MIN
10, 11
10, 11
VDD = 5V, VIN = VDD or GND
+25oC
LIMITS
9
10, 11
+125oC,
-55oC
+25oC
+125oC,
-55oC
o
+25 C
+125oC,
-55oC
+25oC
+125oC,
-55oC
+25oC
+125oC,
-55oC
NOTES:
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
2. -55oC and +125oC limits guaranteed, 100% testing being implemented.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
NOTES
VDD = 5V, VIN = VDD or GND
VDD = 10V, VIN = VDD or GND
VDD = 15V, VIN = VDD or GND
1, 2
1, 2
1, 2
TEMPERATURE
-55oC,
+25oC
-
5
+125oC
-
150
µA
-55oC, +25oC
-
10
µA
+125oC
-
300
µA
µA
-55oC,
+25oC
-
10
+125oC
-
600
µA
Output Voltage
VOL
VDD = 5V, No Load
1, 2
+25oC, +125oC,
-55oC
-
50
mV
Output Voltage
VOL
VDD = 10V, No Load
1, 2
+25oC, +125oC,
-55oC
-
50
mV
Output Voltage
VOH
VDD = 5V, No Load
1, 2
+25oC, +125oC,
-55oC
4.95
-
V
Output Voltage
VOH
VDD = 10V, No Load
1, 2
+25oC, +125oC,
-55oC
9.95
-
V
Output Current (Sink)
IOL5
VDD = 5V, VOUT = 0.4V
1, 2
+125oC
0.36
-
mA
-55oC
0.64
-
mA
+125oC
0.9
-
mA
-55oC
1.6
-
mA
+125oC
2.4
-
mA
-55oC
4.2
-
mA
Output Current (Sink)
Output Current (Sink)
IOL10
IOL15
VDD = 10V, VOUT = 0.5V
VDD = 15V, VOUT = 1.5V
7-1421
1, 2
1, 2
Specifications CD40192BMS, CD40193BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
SYMBOL
Output Current (Source)
IOH5A
Output Current (Source)
Output Current (Source)
Output Current (Source)
IOH5B
IOH10
IOH15
CONDITIONS
VDD = 5V, VOUT = 4.6V
VDD = 5V, VOUT = 2.5V
NOTES
TEMPERATURE
MIN
MAX
UNITS
1, 2
+125oC
-
-0.36
mA
-55oC
-
-0.64
mA
+125oC
-
-1.15
mA
-55oC
-
-2.0
mA
+125oC
-
-0.9
mA
-55oC
-
-1.6
mA
+125oC
-
-2.4
mA
-55oC
1, 2
VDD = 10V, VOUT = 9.5V
VDD =15V, VOUT = 13.5V
1, 2
1, 2
-
-4.2
mA
Input Voltage Low
VIL
VDD = 10V, VOH > 9V, VOL < 1V
1, 2
+25oC, +125oC,
-55oC
-
3
V
Input Voltage High
VIH
VDD = 10V, VOH > 9V, VOL < 1V
1, 2
+25oC, +125oC,
-55oC
7
-
V
1, 2, 3
+25oC
-
240
ns
Propagation Delay
Clock Up or Down to Q
TPHL1
TPLH1
VDD = 10V
VDD = 15V
1, 2, 3
+25oC
-
180
ns
Propagation Delay
Reset to Q
TPHL2
VDD = 10V
1, 2, 3
+25oC
-
240
ns
1, 2, 3
+25oC
-
180
ns
1, 2, 3
+25oC
-
200
ns
VDD = 15V
Propagation Delay
PE to Q
TPHL3
TPLH3
VDD = 15V
1, 2, 3
+25oC
-
140
ns
Propagation Delay
Clock Up to Carry, Clock
Down to Borrow
TPHL4
TPLH4
VDD = 10V
1, 2, 3
+25oC
-
160
ns
VDD = 15V
1, 2, 3
+25oC
-
120
ns
Propagation Delay
PE to Borrow or Carry
TPHL5
TPLH5
VDD = 10V
1, 2, 3
+25oC
-
300
ns
1, 2, 3
+25oC
-
220
ns
VDD = 10V
1, 2, 3
+25oC
-
300
ns
VDD = 15V
1, 2, 3
+25oC
-
220
ns
1, 2, 3
+25oC
-
100
ns
1, 2, 3
+25oC
-
80
ns
VDD = 5V
1, 2, 3, 4
+25oC
-
15
µs
VDD = 10V
1, 2, 3, 4
+25oC
-
15
µs
1, 2, 3, 4
+25oC
-
5
µs
1, 2, 3, 5
+25oC
-
80
ns
VDD = 10V
1, 2, 3, 5
+25oC
-
40
ns
VDD = 15V
1, 2, 3, 5
+25oC
-
30
ns
1, 2, 3
+25oC
-
480
ns
1, 2, 3
+25oC
-
300
ns
VDD = 15V
1, 2, 3
+25oC
-
260
ns
VDD = 5V
1, 2, 3
+25oC
-
240
ns
1, 2, 3
+25oC
-
170
ns
1, 2, 3
+25oC
-
140
ns
Propagation Delay
Reset to Borrow or Carry
Transition Time
Maximum Clock Rise and
Fall Time
TPHL6
TPLH6
TTHL1
TTLH1
TRCL
TFCL
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 15V
Minimum Removal Time
Reset or PE
Minimum Pulse Width
Reset
Minimum Pulse Width PE
TREM
TW
VDD = 5V
VDD = 5V
VDD = 10V
TW
VDD = 10V
VDD = 15V
7-1422
Specifications CD40192BMS, CD40193BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Minimum Clock Pulse
Width
SYMBOL
TW
CONDITIONS
VDD = 5V
VDD = 10V
VDD = 15V
NOTES
TEMPERATURE
MIN
MAX
UNITS
1, 2, 3
+25oC
-
180
ns
1, 2, 3
+25oC
-
90
ns
1, 2, 3
+25oC
-
60
ns
-
15
pF
-
7.5
pF
Input Capacitance
CIN
Reset
1, 2
+25oC
Input Capacitance
CIN
All Other Inputs
1, 2
+25oC
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized on
initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. If more than one unit is cascaded, TRCL should be made less than or equal to the sumof the transition time and the fixed propagation
delay of the output of the driving stage for the estimated capacitive load.
5. The time required for RESET or PRESET ENABLE control to be removed before clocking. See timing diagram defining TREM.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
VDD = 20V, VIN = VDD or GND
NOTES
TEMPERATURE
MIN
MAX
UNITS
1, 4
+25oC
-
25
µA
N Threshold Voltage
VNTH
VDD = 10V, ISS = -10µA
1, 4
+25oC
-2.8
-0.2
V
N Threshold Voltage
Delta
∆VTN
VDD = 10V, ISS = -10µA
1, 4
+25oC
-
±1
V
P Threshold Voltage
VTP
VSS = 0V, IDD = 10µA
1, 4
+25oC
0.2
2.8
V
P Threshold Voltage
Delta
∆VTP
VSS = 0V, IDD = 10µA
1, 4
+25oC
-
±1
V
1
+25oC
VOH >
VDD/2
VOL <
VDD/2
V
1, 2, 3, 4
+25oC
-
1.35 x
+25oC
Limit
ns
Functional
F
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL
TPLH
VDD = 5V
3. See Table 2 for +25oC limit.
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25oC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
IDD
± 1.0µA
Output Current (Sink)
IOL5
± 20% x Pre-Test Reading
IOH5A
± 20% x Pre-Test Reading
Output Current (Source)
7-1423
Specifications CD40192BMS, CD40193BMS
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
100% 5004
1, 7, 9, Deltas
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
CONFORMANCE GROUP
PDA (Note 1)
Interim Test 3 (Post Burn-In)
PDA (Note 1)
Final Test
Group B
IDD, IOL5, IOH5A
100% 5004
2, 3, 8A, 8B, 10, 11
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Sample 5005
1, 2, 3, 8A, 8B, 9
Group A
Group D
READ AND RECORD
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
Group E Subgroup 2
TEST
READ AND RECORD
MIL-STD-883
METHOD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
2, 3, 6, 7, 12, 13
4
-
PART NUMBER CD40192BMS, CD40193BMS
Static Burn-In 1
(Note 1)
2, 3, 6, 7, 12, 13
1, 4, 5, 8 - 11, 14,
15
16
Static Burn-In 2
(Note 1)
2, 3, 6, 7, 12, 13
8
1, 4, 5, 9 - 11,
14 - 16
Dynamic BurnIn (Note 1)
-
8, 14
1, 5, 9 - 11, 15, 16
2, 3, 6, 7, 12, 13
8
1, 4, 5, 9 - 11,
14 - 16
Irradiation
(Note 2)
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
7-1424
CD40192BMS, CD40193BMS
Logic Diagrams
*RESET
14
*PE
11
S1
*J1
R1
15
**
CONTROL LOGIC 1
S2
R2
**
S3
R3
1
10
9
*J2
*J3
*J4
**
S4
R4
**SAME AS CONTROL LOGIC 1
CARRY
12
S1
*CLOCK UP
S
5
S2
S
Q1
CL
*CLOCK DOWN
S
Q2
CL
S4
S
Q3
CL
Q1
4
S3
Q4
CL
Q2
Q3
Q4
R
R
R
R
R1
R2
R3
R4
13
BORROW
VDD
3
2
6
7
Q1
Q2
Q3
Q4
*ALL INPUTS PROTECTED BY
VSS
COS/MOS PROTECTION NETWORK
FIGURE 1. CD40192BMS LOGIC DIAGRAM (BCD)
7-1425
CD40192BMS, CD40193BMS
Logic Diagrams (Continued)
*RESET
14
*PE
11
S1
*J1
R1
15
**
CONTROL LOGIC 1
S2
R2
**
S3
R3
1
10
9
*J2
*J3
*J4
**
S4
R4
**SAME AS CONTROL LOGIC 1
VSS
CARRY
VDD
12
S1
*CLOCK UP
S
5
S2
S
Q1
CL
*CLOCK DOWN
S
Q2
CL
S4
S
Q3
CL
Q1
4
S3
Q4
CL
Q2
Q3
Q4
R
R
R
R
R1
R2
R3
R4
13
VDD
BORROW
VDD
VDD
3
2
6
7
Q1
Q2
Q3
Q4
*ALL INPUTS PROTECTED BY
VSS
COS/MOS PROTECTION NETWORK
FIGURE 2. CD40193BMS LOGIC DIAGRAM (BINARY)
7-1426
CD40192BMS, CD40193BMS
CL
CL
CL
CL
CL
S
R
S
p
p
Q
CL
n
=
R
n
CL
Q
Q
R
S
CL
CL
CL
p
p
n
n
CL
CL
Q
FIGURE 3. INTERNAL LOGIC OF FLIP-FLOP
TRUTH TABLE
CLOCK UP
CLOCK DOWN
PRESET ENABLE
RESET
ACTION
1
1
0
Count Up
1
1
0
No Count
1
1
0
Count Down
1
1
0
No Count
X
X
0
0
Preset
X
X
X
1
Reset
1 = High Level
0 = Low Level
X = Don’t Care
AMBIENT TEMPERATURE (TA) = +25oC
30
OUTPUT LOW (SINK) CURRENT (IOL) (mA)
OUTPUT LOW (SINK) CURRENT (IOL) (mA)
Typical Performance Characteristics
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
25
20
15
10V
10
5
5V
0
5
10
15
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
FIGURE 4. TYPICAL OUTPUT LOW (SINK) CURRENT
CHARACTERISTICS
AMBIENT TEMPERATURE (TA) = +25oC
15.0
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
12.5
10.0
10V
7.5
5.0
2.5
5V
0
5
10
15
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
FIGURE 5. MIMIMUM OUTPUT LOW (SINK) CURRENT
CHARACTERISTICS
7-1427
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
-15
-10
-5
AMBIENT TEMPERATURE (TA) = +25oC
AMBIENT TEMPERATURE (TA) = +25oC
0
GATE-TO-SOURCE VOLTAGE (VGS) = -5V
15.0
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
-5
12.5
10.0
-10V
10V
7.5
-10
5.0
-15V
2.5
-15
5V
0
5
10
15
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
FIGURE 7. MINIMUM OUTPUT HIGH (SOURCE) CURRENT
CHARACTERISTICS
PROPAGATION DELAY TIME (tPHL, tPLH) (ns)
FIGURE 6. TYPICAL OUTPUT HIGH (SOURCE) CURRENT
CHARACTERISTICS
AMBIENT TEMPERATURE (TA) = +25oC
TRANSITION TIME (tTHL, tTLH) (ns)
0
200
150
SUPPLY VOLTAGE (VDD) = 5V
100
10V
15V
50
0
0
20
400
AMBIENT TEMPERATURE (TA) = +25oC
350
300
SUPPLY VOLTAGE (VDD) = 5V
250
200
150
POWER DISSIPATION PER GATE (PD) (µW)
15V
50
10
0
FIGURE 8. TYPICAL TRANSITION TIME AS A FUNCTION OF
LOAD CAPACITANCE
30
50
70
20
40
60
80
LOAD CAPACITANCE (CL) (pF)
CL = 15pF
8
6
4
2
104 8
6
4
2
103
8
6
4
2
102
2 4 68
1
2 4 6 8
10
90
FIGURE 9. TYPICAL PROPAGATION DELAY TIME AS A
FUNCTION OF LOAD CAPACITANCE
AMBIENT TEMPERATURE (TA) = +25oC
CL = 50pF
8
6
4
2
105
10V
100
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
106
OUTPUT HIGH (SOURCE) CURRENT (IOH) (mA)
OUTPUT LOW (SINK) CURRENT (IOL) (mA)
CD40192BMS, CD40193BMS
2 4 68
2
4 68
2
103
104
102
INPUT FREQUENCY (fIN) (kHz)
FIGURE 10. DYNAMIC POWER DISSIPATION
7-1428
4 68
105
100
CD40192BMS, CD40193BMS
RESET
1
0
PE
1
0
1
0
J1
1
0
1
0
1
0
1
0
J2
1
0
J3
1
0
J3
1
0
J4
1
0
J4
1
0
CLK
UP
1
0
CLK
DN
1
0
J1
J2
CLK
UP
CLK
DN
RESET
PE
1
0
1
0
Q1
1
0
Q1
1
0
Q2
1
0
Q2
1
0
Q3
1
0
Q3
1
0
Q4
1
0
Q4
1
0
CARRY
1
0
CARRY
1
0
1
BORROW 0
COUNT
0
7
8 9 0 1
2
1 0 9 8
1
BORROW 0
COUNT
7
FIGURE 11. CD40192BMS TIMING DIAGRAM
0
13 14 15 0 1
2
FIGURE 12. CD40193BMS TIMING DIAGRAM
tWH
tWL
CLOCK
RESET
PRESET ENABLE
trem*
*RESET OR PRESET ENABLE
REMOVAL TIME
FIGURE 13. TIMING DIAGRAM DEFINING trem
J1 J2 J3 J4
CLOCK UP
CLOCK DOWN
J1 J2 J3 J4
CARRY
CD40192BMS
OR
CD40193BMS
1 0 15 14 13
BORROW
CLOCK UP
CLOCK DOWN
Q1 Q2 Q3 Q4
CD40192BMS
OR
CD40193BMS
Q1 Q2 Q3 Q4
RESET
PRESET
ENABLE
FIGURE 14. CASCADED COUNTER PACKAGES
7-1429
CARRY
BORROW
CD40192BMS, CD40193BMS
Chip Dimensions and Pad Layout
Dimensions and pad layout for the CD40192BMSH
(dimensions and pad layout for the CD40193BMSH
are identical).
Dimensions in parentheses are in millimeters
and are derived from the basic inch dimensions
as indicated. Grid graduations are in mils (10-3 inch)
METALLIZATION:
PASSIVATION:
Thickness: 11kÅ − 14kÅ,
AL.
10.4kÅ - 15.6kÅ, Silane
BOND PADS: 0.004 inches X 0.004 inches MIN
DIE THICKNESS: 0.0198 inches - 0.0218 inches
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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1430
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