ISL75051SEH Neutron Test Report

Test Report 027
Neutron Testing of the ISL75051SEH Low Dropout
Regulator
Introduction
TABLE 1. PIN ASSIGNMENT
This report summarizes results of 1MeV equivalent neutron
testing of the ISL75051SEH low dropout voltage linear
regulator (LDO). The test was conducted in order to determine
the sensitivity of the part to Displacement Damage (DD)
caused by neutron or proton environments. Neutron fluences
ranged from 2 x 1012 n/cm2 to 1 x 1014 n/cm2. This project
was carried out in collaboration with VPT, Inc. (Blacksburg, VA),
whose support is gratefully acknowledged.
Reference Documents
For more information about the ISL75051SEH, refer to the
following documentation.
• ISL75051SEH datasheet
• Standard Microcircuit Drawing (SMD): 5962-11212
• MIL-STD-883 test method 1017
Part Description
The ISL75051SEH is a radiation hardened low voltage, high
current single output low dropout linear voltage regulator
(LDO) specified for a 3.0A output current. The device operates
over an input voltage range of 2.2V to 5.5V and is capable of
providing output voltages of 0.8V to 4V, with the output voltage
adjusted by an external resistor divider network. The ENABLE
feature allows the part to be placed into a low quiescent
current shutdown mode.
The ISL75051SEH Overcurrent Protection (OCP) pin allows the
short-circuit output current limit threshold to be programmed
with an external resistor. The BiCMOS design consumes
significantly lower quiescent current as a function of load in
comparison to bipolar LDOs, which results in higher efficiency
and the ability to consider packages with smaller footprints.
The quiescent current of the part was traded off against a
highly competitive load transient response, resulting in a
superior total AC regulation band for an LDO in this category.
The ISL75051SEH is implemented in the 0.6µm P6 BiCMOS
power management process. This process is in volume
production under MIL-PRF-38535 certification and is used for
a wide range of commercial power management devices.
Table 1 shows a pin assignment for the part.
TERMINAL
NUMBER
TERMINAL
SYMBOL
TERMINAL
NUMBER
TERMINAL
SYMBOL
1
GND
10
EN
2
VOUT
11
OCP
3
VOUT
12
VIN
4
VOUT
13
VIN
5
VOUT
14
VIN
6
VOUT
15
VIN
7
VOUT
16
VIN
8
ADJ
17
VIN
9
BYP
18
PG
The ISL75051SEH is specified for a total dose (TID) tolerance
of 100krad(Si) at a high (50-300rad(Si)/s) dose rate and at
50krad(Si) at a low (< 0.01rad(Si)/s) dose rate, as specified in
MIL-STD-883 test method 1019. The part is acceptance tested
on a wafer-by-wafer basis at low dose rate to 50krad(Si) and at
high dose rate to 100krad(Si).
The ISL75051SEH is also SEE tolerant to a Linear Energy
Transfer (LET) value of 86.4MeV•cm2/mg. Single-Event
Transients (SET) have evolved into a major issue in power
management parts driving voltage-sensitive loads, and the
part provides superior performance in this environment.
Specifications for radiation hardened QML devices are
controlled by the Defense Logistics Agency (DLA) in Columbus,
OH. The SMD is the controlling document and must be cited
when ordering.
Test Description
Irradiation Facilities
Neutron irradiation was performed by the VPT team at the
University of Massachusetts Lowell Fast Neutron Irradiation
(FNI) facility, which provides a controlled 1MeV equivalent
neutron flux. Parts were tested in an unbiased configuration
with all leads shorted together in accordance with TM 1017 of
MIL-STD-883. As neutron irradiation activates many of the
heavier elements found in a packaged integrated circuit, the
parts exposed at the higher neutron levels required (as
expected) some ‘cooldown’ time before being shipped back to
Intersil (Palm Bay, FL) for electrical testing.
Test Fixturing
No formal irradiation test fixturing was involved, as these DD
tests are ‘bag tests’ in the sense that the parts are irradiated in
an electrically inactive state with all leads shorted together.
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Test Report 027
Characterization Equipment and Procedures
Results
Electrical testing was performed before and after irradiation
using the Intersil production Automated Test Equipment (ATE). All
electrical testing was performed at room temperature.
Neutron testing of the ISL75051SEH is complete and the results
are reported in the balance of this report. It should be carefully
realized when interpreting the data that each neutron irradiation
was performed on a different five-unit sample; this is not total
dose testing, where the damage is cumulative over a number of
downpoints.
Experimental Matrix
Testing proceeded in general accordance with the guidelines of
MIL-STD-883 Test Method 1017. The experimental matrix
consisted of 5 samples irradiated at 2 x 1012 n/cm2, 5 irradiated
at 1 x 1013 n/cm2, 5 irradiated at 3 x 1013 n/cm2 and 5
irradiated at 1 x 1014 n/cm2. Two control units were used.
Attributes Data
Table 2 shows the attributes data.
ISL75051SEHF/PROTO samples were drawn from fabrication lot
WTP8WD (serial numbers 1 through 8) and from lot WXW7CAE
(serial numbers 9 through 20). Samples were packaged in the
standard hermetic 18 Ld ceramic flatpack production package,
code K18.E. Samples were screened to the SMD limits
over-temperature before the start of neutron testing.
TABLE 2. ISL75051SEH ATTRIBUTES DATA
PART
SERIAL
ISL75051SEH
SAMPLE
SIZE
1 through 5
ISL75051SEH
6 through 10
ISL75051SEH
11 through 15
ISL75051SEH
16 through 20
FLUENCE,
n/cm2
PASS
(Note 1)
FAIL
5
2 x 1012
5
0
All passed
5
1 x 1013
5
0
All passed
5
3 x 1013
5
0
All passed
5
1 x 1014
4
1
S/N 20 failed parametrically, adjusted
pin voltage at 1.8V out, 5.0VIN
NOTES
NOTE:
1. “Pass” indicates a sample that passes all SMD limits.
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Test Report 027
Variables Data
The plots in Figures 1 through 23 show data plots for key
parameters before and after irradiation to each level. The
reported parameters and their datasheet limits are shown in
Table 3 on page 15. The plots show the median of each
parameter as a function of neutron irradiation. We chose to plot
the median because of the small sample sizes (five per cell)
involved. We also show the applicable electrical limits taken from
the SMD; it should be carefully noted that these limits are
provided for guidance only as the ISL75051SEH is not specified
or guaranteed for the neutron environment. Intersil does not
design, qualify or guarantee its parts for the DD environment, but
has performed some limited neutron testing for customer
guidance.
Variables Data Plots
1.2
1
EN_IIL
ENABLE IIH AND IIL (µA)
0.8
EN_IIH
Spec limit
0.6
0.4
0.2
0
-0.2
1.00E+11
PRE-RAD
1.00 E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 1. ISL75051SEH enable low and enable high current as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2,
1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limit is 1.0µA maximum.
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Variables Data Plots (Continued)
1.5
ADJ_Ibias
Spec limit
1
ADJUST PIN BIAS CURRENT (µA)
Spec limit
0.5
0
-0.5
-1
-1.5
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 2. ISL75051SEH adjust pin bias current as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2,
3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are -1.0µA to 1.0µA.
1.4
ENABLE THRESHOLD, RISING (V)
1.2
1
0.8
ENThrRising2.2V
0.6
ENThrRising6V
Spec limit
Spec limit
0.4
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 3. ISL75051SEH rising enable threshold at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
0.6V to 1.2V.
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Variables Data Plots (Continued)
1
ENThrFalling2.2V
ENThrFalling_6V
Spec limit
ENABLE THRESHOLD, FALLING (V)
Spec limit
0.8
0.6
0.4
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 4. ISL75051SEH falling enable threshold at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012
n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.47V to
0.9V.
350
ENHyst2.2V
ENHyst6V
300
Spec limit
ENABLE HYSTERESIS (mV)
Spec limit
250
200
150
100
50
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 5. ISL75051SEH enable hysteresis at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
90.0mV to 318.0mV.
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Variables Data Plots (Continued)
500
ENDelay
Spec limit
Spec limit
ENABLE DELAY (µs)
400
300
200
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 6. ISL75051SEH enable delay as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2
and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 225.0µs to 450.0µs.
0.53
2.2V
OUTPUT VOLTAGE (V)
0.525
0.52
0.515
V.52V_VIN2.2_NL
V.52V_VIN2.2_3A
Spec limit
Spec limit
0.51
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 7. ISL75051SEH output voltage at 2.2V input voltage, 0.52V output voltage, no load and 3.0A output current, as a function of 1MeV equivalent
neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The
datasheet limits are 0.5122V to 0.5278V.
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Variables Data Plots (Continued)
0.53
3.6VIN
OUTPUT VOLTAGE (V)
0.525
0.52
0.515
V.52V_VIN3.6_NL
V.52V_VIN3.6_3A
Spec limit
Spec limit
0.51
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 8. ISL75051SEH output voltage at 3.6V input voltage, 0.52V output voltage, no load and 3.0A output current, as a function of 1MeV
equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell
was 5. The datasheet limits are 0.5122V to 0.5278V.
5.1
5.4VIN
OUTPUT VOLTAGE (V)
5.05
5
4.95
V5.0_VIN5.4V_NL
V5.0_VIN5.4V_3A
Spec limit
Spec limit
4.9
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 9. ISL75051SEH output voltage at 5.4V input voltage, 5.0V output voltage, no load and 3.0A output current, as a function of 1MeV
equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell
was 5. The datasheet limits are 4.925V to 5.075V.
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Variables Data Plots (Continued)
5.1
6.0VIN
OUTPUT VOLTAGE (V)
5.05
5
4.95
V5.0_Vin6.0V_NL
V5.0_Vin6.0V_3A
Spec limit
Spec limit
4.9
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 10. ISL75051SEH output voltage at 6.0V input voltage, 5.0V output voltage, no-load and 3.0A output current, as a function of 1MeV
equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell
was 5. The datasheet limits are 4.925V to 5.075V.
25
LineReg1.5V
LineReg1.8V
LineReg5.0V
LINE REGULATION (mV)
20
Spec limit 1.5V
Spec limit 1.8V
15
Spec limit 5.0V
10
5
0
PRE-RAD
PRE-RD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 11. ISL75051SEH line regulation at 1.5V, 1.8V and 5.0V output voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012
n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 8.0mV
maximum (1.5V), 10.5mV maximum (1.8V) and 20.0mV maximum (5.0V).
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Variables Data Plots (Continued)
25
LOAD REGULATION (mV)
20
15
LoadReg1.5V
LoadReg1.8V
LoadReg5.0V
Spec limit 1.5V
Spec limit 1.5V
Spec limit 1.8V
Spec limit 1.8V
Spec limit 5.0V
Spec limit 5.0V
10
5
0
-5
-10
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 12. ISL75051SEH load regulation at 1.5V, 1.8V and 5.0V output voltage as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
-4.0mV to -0.1mV (1.5V), -4.0mV to -0.05mV (1.8V) and -15.0mV to -0.05mV (5.0V).
0.545
Vbyp_VIN2.2
Vbyp_VIN6.0
0.535
Spec limit
BYPASS PIN VOLTAGE (V)
Spec limit
0.525
0.515
0.505
0.495
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 13. ISL75051SEH bypass pin voltage at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
0.5V to 0.54V.
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Variables Data Plots (Continued)
14
GROUND CURRENT (mA)
12
10
8
Ignd_V1.5_V IN2.2_NL
Ignd_V1.5_VIN2.2_3A
Spec limit_NL
Spec limit, 3A
6
4
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 14. ISL75051SEH ground current at 1.5V output voltage and 2.2V input voltage, no load and 3.0A load cases, as a function of 1MeV equivalent
neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The
datasheet limits are 12.0mA maximum (no load) and 13.0mA maximum (3.0A load).
20
GROUND CURRENT (mA)
18
16
14
12
Ignd_V5.0_Vin6.0V_NL
10
Ignd_V5.0_Vin6.0V_3A
8
Spec limit
6
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 15. ISL75051SEH ground current at 5.0V output voltage and 6.0V input voltage, no load and 3.0A load cases, as a function of 1MeV
equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell
was 5. The datasheet limits are 18.0mA (no load and 3.0A load).
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Variables Data Plots (Continued)
350
DROPOUT VOLTAGE (mV)
300
250
Vdropout_1A
Vdropout_2A
Vdropout_3A
Spec limit_1A
Spec limit_2A
Spec limit_3A
200
150
100
50
0
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 16. ISL75051SEH dropout voltage, 1.0A, 2.0A and 3.0A output current, as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
100.0mV maximum (1.0A), 200.0mV maximum (2.0A) and 300.0mV maximum (3.0A).
1.2
PG_Lkg
Spec limit
1
PGOOD LEAKAGE (µA)
0.8
0.6
0.4
0.2
0
-0.2
1.00E+11
PRE-RAD
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 17. ISL75051SEH PGOOD leakage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2,
3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits is 1.0µA maximum.
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Variables Data Plots (Continued)
450
PG_Vol_1ma
400
PG_Vol_6ma
Spec limit_1mA
350
Spec limit_6mA
PGOOD VOL (mV)
300
250
200
150
100
50
0
1.00E+11
PRE-RAD
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 18. ISL75051SEH PGOOD output low voltage at 1.0mA and 6.0mA as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
100.0mV maximum (1.0mA) and 400.0mV maximum (6.0mA).
PGOOD THRESHOLD (%)
95
PG_FallingThr_6V
PG_RisingThr_6V
Spec limit
Spec limit
Spec limit
Spec limit
90
85
80
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 19. ISL75051SEH PGOOD rising and falling threshold, 6.0V input voltage, as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
82% to 93% (falling) and 85% to 96% (rising).
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Variables Data Plots (Continued)
4.5
PG_HystVin_6.0V
PG_HystVin_2.2V
Spec limit
4
PGOOD HYSTERESIS (%)
Spec limit
3.5
3
2.5
2
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 20. ISL75051SEH PGOOD hysteresis at 2.2V and 6.0V input voltage, as a function of 1MeV equivalent neutron irradiation at
2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are
2.5% to 4.0%.
PGOOD THRESHOLD (%)
95
PG_FallingThr_2.2V
PG_RisingThr_2.2V
Spec limit
Spec limit
Spec limit
Spec limit
90
85
80
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 21. PGOOD rising and falling threshold, 2.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2,
1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The data sheet limits are 82% to 93% (falling)
and 85% to 96% (rising).
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Variables Data Plots (Continued)
10
CURRENT LIMIT (A)
8
Ilimit_5.11K_VIN_2.2V
Ilimit_511_VIN_2.2V
Spec limit_5.11K
Spec limit_5.11K
Spec limit_511ohm
Spec limit_511ohm
6
4
2
0
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE(n/cm2)
FIGURE 22. ISL75051SEH output current limit, 2.2V input voltage, 5.11kΩ and 511Ω set resistor cases as a function of 1MeV equivalent neutron
irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet
limits are 0.65A to 1.6A (5.11kΩ set resistor) and 4.6A to 7.5A (511Ω set resistor).
12
10
Ilimit_5.11K_Vin_6.0V
Ilimit_511_Vin_6.0V
Spec limit_5.11K
Spec limit_5.11K
Spec limit_511ohm
Spec limit_511ohm
CURRENT LIMIT (A)
8
6
4
2
0
PRE-RAD
1.00E+11
1.00E+12
1.00E+13
1.00E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 23. ISL75051SEH output current limit, 6.0V input voltage, 5.11kΩ and 511Ω set resistor cases, as a function of 1MeV equivalent neutron
irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet
limits are 0.5A to 1.7A (5.11kΩ set resistor) and 4.3A to 8.5A (511Ω set resistor).
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Conclusion
Appendices
This report summarizes the results of 1MeV equivalent neutron
testing of the ISL75051SEH low dropout voltage linear regulator.
The test was conducted in order to determine the sensitivity of
the part to displacement damage (DD) caused by neutron or
proton environments in space. Neutron fluences ranged from
2 x 1012 n/cm2 to 1 x 1014 n/cm2. This project was carried out
in collaboration with VPT, Inc. (Blacksburg, VA), and their support
is gratefully acknowledged.
Reported Parameters
The limits are from the SMD and are provided for guidance only
in Table 3 as the ISL75051SEH part is not designed or
guaranteed for the neutron environment. A number of
parameters are plotted in the same figure (i.e., Figure 1, on
page 3, which plots the neutron response of both the enable low
and enable High currents) in order to save space.
The part performed very well. The samples met all specifications
(Bin 1) after 2 x 1011 n/cm2, 1 x 1013 n/cm2 and 3 x 1013
n/cm2. ATE testing showed one parametric reject after 1 x 1014
n/cm2. The part marginally failed the adjust pin voltage at the
high end of the spec. The part may be usable to a neutron level of
3 x 1013 n/cm2.
TABLE 3. REPORTED PARAMETERS
FIGURE
NUMBER
PARAMETER
LIMIT, LOW
LIMIT, HIGH
UNITS
NOTES
1
Enable Low current
-
1.0
µA
1
Enable High current
-
1.0
µA
2
Adjust pin bias current
-1.0
1.0
µA
3
Enable threshold, rising
0.6
1.2
µA
4
Enable threshold, falling
0.47
0.9
µA
5
Enable hysteresis
90.0
318.0
mV
6
Enable delay
225.0
450.0
µs
7
Output voltage, 0.52V
0.5122
0.5278
V
No load, 2.2VIN
7
Output voltage, 0.52V
0.5122
0.5278
V
3.0A load, 2.2VIN
8
Output voltage, 0.52V
0.5122
0.5278
V
No load, 3.6VIN
8
Output voltage, 0.52V
0.5122
0.5278
V
3.0A load, 3.6VIN
9
Output voltage, 5.0V
4.925
5.075
V
No load, 5.4VIN
9
Output voltage, 5.0V
4.925
5.075
V
3.0A load, 5.4VIN
10
Output voltage, 5.0V
4.925
5.075
V
No load, 6.0VIN
10
Output voltage, 5.0V
4.925
5.075
V
3.0A load, 6.0VIN
11
Line regulation
-
8.0
mV
1.5VOUT
11
Line regulation
-
10.5
mV
1.8VOUT
11
Line regulation
-
20.0
mV
5.0VOUT
12
Load regulation
-4.0
-0.1
mV
1.5VOUT
12
Load regulation
-4.0
-0.05
mV
1.8VOUT
12
Load regulation
-15.0
-0.05
mV
5.0VOUT
13
Bypass pin voltage
0.5
0.54
V
14
Ground current, 1.5V
-
12.0
mA
No load, 2.2VIN
14
Ground current, 1.5V
-
13.0
mA
3.0A load, 2.2VIN
15
Ground current, 5.0V
-
18.0
mA
No load, 6.0VIN
15
Ground current, 5.0V
-
18.0
mA
3.0A load, 6.0VIN
16
Dropout voltage, 1.0A
-
100.0
mV
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TR027.0
April 14, 2016
Test Report 027
TABLE 3. REPORTED PARAMETERS (Continued)
FIGURE
NUMBER
PARAMETER
LIMIT, LOW
LIMIT, HIGH
UNITS
NOTES
16
Dropout voltage, 2.0A
-
200.0
mV
16
Dropout voltage, 3.0A
-
300.0
mV
17
PGOOD leakage
-
1.0
µA
18
PGOOD VOL
-
100
mV
1mA
18
PGOOD VOL
-
400
mV
6mA
19
PGOOD Rising threshold
85
96
%
6.0VIN
19
PGOOD Falling threshold
82
93
%
6.0VIN
20
PGOOD hysteresis
2.5
4.0
%
6.0V and 2.2VIN
21
PGOOD Rising threshold
85
96
V
2.2VIN
21
PGOOD Falling threshold
82
93
%
2.2VIN
22
Output current limit, 5.11kΩ
0.65
1.6
%
2.2VIN
22
Output current limit, 511Ω
4.6
7.5
A
2.2VIN
23
Output current limit, 5.11kΩ
0.5
1.7
A
6.0VIN
23
Output current limit, 511Ω
4.3
8.5
A
6.0VIN
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cautioned to verify that the document is current before proceeding.
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16
TR027.0
April 14, 2016