AOS Semiconductor Product Reliability Report AOD4102/AOD4102L, rev B Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Feb27, 2007 1 This AOS product reliability report summarizes the qualification result for AOD4102. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AOD4102 passes AOS quality and reliability requirements. The released product will be categorized by the process family and be monitored on a quarterly basis for continuously improving the product quality. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation Quality Assurance Information I. Product Description: The AOD4102 uses advanced trench technology and design to provide excellent RDS(ON) with low gate charge. This device is suitable for use in PWM, load switching and general purpose applications. Standard product AOD4102 is Pb-free (meets ROHS & Sony 259 specifications). Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Symbol Maximum Units Drain-Source Voltage VDS 30 V Gate-Source Voltage VGS ±20 V Continuous Drain Current TA=25°C 12 A ID 12 Pulsed Drain Current IDM 30 Avalanche Current Repetitive avalanche energy L=0.3mH C IAR 10 A EAR 15 mJ TA=100°C TA=25°C Power Dissipation TA=100°C TA=25°C Power Dissipation 21 PD 4.2 PDSM Thermal Characteristics Parameter Maximum Junction-toAmbient Maximum Junction-toAmbient Maximum Junction-to-Lead W 2.7 TA=70°C Junction and Storage Temperature Range W 10 TJ, TSTG -55 to 175 Symbol T ≤ 10s SteadyState SteadyState RθJA RθJL °C Typ Max Units 20 30 °C/W 50 60 °C/W 4.5 7 °C/W 2 II. Die / Package Information: Process Package Type Lead Frame Die Attach Bond wire Mold Material Filler % (Spherical/Flake) Flammability Rating Backside Metallization Moisture Level AOD4102 AOD4102L (Green Compound) Standard sub-micron Low voltage N channel process 3 leads TO252 Copper Soft solder Au 1.3mils and Al 8mils Epoxy resin with silica filler 90/10 UL-94 V-0 Ti / Ni / Ag Up to Level 1 * Standard sub-micron Low voltage N channel process 3 leads TO252 Copper Soft solder Au 1.3mils and Al 8mils Epoxy resin with silica filler 100/0 UL-94 V-0 Ti / Ni / Ag Up to Level 1* Note * based on info provided by assembler and mold compound supplier III. Result of Reliability Stress for AOD4102 (Standard) & AOD4102L (Green) Test Item Test Condition Time Point Lot Attribution Total Sample size Solder Reflow Precondition Standard: 1hr PCT+3 cycle reflow@260°c Green: 168hr 85°c /85%RH +3 cycle reflow@260°c Temp = 150°c , Vgs=100% of Vgsmax 0hr Standard: 26 lots Green: 3 lots 4675pcs HTGB 168 / 500 hrs 1000 hrs 1 lot (Note A*) HTRB Temp = 150°c , Vds=80% of Vdsmax 168 / 500 hrs 1000 hrs 1 lot (Note A*) HAST Pressure Pot Temperature Cycle 130 +/- 2°c , 85%RH, 33.3 psi, Vgs = 80% of Vgs max 100 hrs 121°c , 29.7psi, 100%RH 96 hrs -65°c to 150°c , air to air 250 / 500 cycles Standard : 26 lots Green: 3 lots (Note B**) Standard : 25 lots Green: 3 lots (Note B**) Standard : 25 lots Green: 3 lots (Note B**) 82pcs Number of Failures 0 0 77+5 pcs / lot 82pcs 0 77+5 pcs / lot 1595pcs 0 50+5 pcs / lot 1540pcs 0 50+5 pcs / lot 1540pcs 0 50+5 pcs / lot 3 III. Result of Reliability Stress for AOD4102 (Standard) & AOD4102L (Green) Continues DPA Internal Vision Cross-section X-ray CSAM NA 5 5 5 5 5 5 0 NA 5 5 0 Bond Integrity Room Temp 150°c bake 150°c bake 0hr 250hr 500hr 40 40 40 40 wires 40 wires 40 wires 0 Solderability 230°c 5 sec 15 15 leads 0 Die shear 150°c 0hr 10 10 0 Note A: The HTGB and HTRB reliability data presents total of available AOD4102 and AOD4102L burn-in data up to the published date. Note B: The pressure pot, temperature cycle and HAST reliability data for AOD4102 and AOD4102L comes from the AOS generic package qualification data. IV. Reliability Evaluation FIT rate (per billion): 21.6 MTTF = 5284 years In general, 500 hrs of HTGB, 150 deg C accelerated stress testing is equivalent to 15 years of lifetime at 55 deg C operating conditions (by applying the Arrhenius equation with an activation energy of 0.7eV and 60% of upper confidence level on the failure rate calculation). AOS reliability group also routinely monitors the product reliability up to 1000 hr at and performs the necessary failure analysis on the units failed for reliability test(s). The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AOD4102). Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. 2 9 9 Failure Rate = Chi x 10 / [2 (N) (H) (Af)] = 1.83 x 10 9 7 MTTF = 10 / FIT = 4.62 x 10 hrs = 5284 years / [2 (164) (1000) (258)] = 21.6 Chi² = Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)] Acceleration Factor ratio list: Af 55 deg C 70 deg C 85 deg C 100 deg C 115 deg C 130 deg C 150 deg C 258 87 32 13 5.64 2.59 1 Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16 Tj u =The use junction temperature in degree (Kelvin), K = C+273.16 k = Boltzmann’s constant, 8.617164 X 10-5eV / K 4 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 25 ppm Quality Sample Plan: conform to Mil-Std-105D 5