DISCRETE SEMICONDUCTORS DATA SHEET BSP250 P-channel enhancement mode vertical D-MOS transistor Product specification Supersedes data of November 1994 File under Discrete Semiconductors, SC13b 1997 Jun 20 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 FEATURES PINNING - SOT223 • High-speed switching PIN SYMBOL • No secondary breakdown 1 g gate • Very low on-resistance. 2 d drain 3 s source 4 d drain APPLICATIONS DESCRIPTION • Low-loss motor and actuator drivers • Power switching. DESCRIPTION 4 handbook, halfpage d P-channel enhancement mode vertical D-MOS transistor in a SOT223 plastic SMD package. g CAUTION 1 The device is supplied in an antistatic package. The gate-source input must be protected against static discharge during transport or handling. 2 3 s Top view MAM121 Fig.1 Simplified outline and symbol. QUICK REFERENCE DATA SYMBOL PARAMETER VDS drain-source voltage (DC) VSD source-drain diode forward voltage CONDITIONS MIN. MAX. UNIT − −30 V IS = −1.25 A − −1.6 V VGSO gate-source voltage (DC) open drain − ±20 V VGSth gate-source threshold voltage ID = −1 mA; VDS = VGS −1 −2.8 V ID drain current (DC) − −3 A RDSon drain-source on-state resistance ID = −1 A; VGS = −10 V − 0.25 Ω Ptot total power dissipation Ts = 100 °C − 5 W 1997 Jun 20 2 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VDS drain-source voltage (DC) − −30 V VGSO gate-source voltage (DC) open drain − ±20 V ID drain current (DC) Ts ≤ 100 °C − −3 A IDM peak drain current note 1 − −12 A Ptot total power dissipation Ts = 100 °C − 5 W Tamb = 25 °C; note 2 − 1.65 W Tstg storage temperature −65 +150 °C Tj operating junction temperature − 150 °C Source-drain diode IS source current (DC) Ts ≤ 100 °C − −1.5 A ISM peak pulsed source current note 1 − −6 A Notes 1. Pulse width and duty cycle limited by maximum junction temperature. 2. Device mounted on an epoxy printed-circuit board, 40 × 40 × 1.5 mm; mounting pad for drain lead minimum 6 cm2. MLB885 2.0 MLB835 −102 handbook, halfpage handbook, halfpage Ptot (W) ID (A) 1.6 −10 (1) tp = 10 µs 1.2 −1 0.8 1 ms tp δ= T P DC −10−1 0.4 t tp −10−2 −10−1 0 0 50 100 150 200 Tamb (°C) T −1 −10 δ = 0.01. Soldering point temperature Ts = 100 °C. (1) RDSon limitation. Fig.2 Power derating curve. 1997 Jun 20 Fig.3 SOAR. 3 VDS (V) −102 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 THERMAL CHARACTERISTICS SYMBOL PARAMETER CONDITIONS Rth j-a thermal resistance from junction to ambient Rth j-s thermal resistance from junction to soldering point VALUE UNIT 75 K/W 10 K/W note 1 Note 1. Device mounted on an epoxy printed-circuit board, 40 × 40 × 1.5 mm; mounting pad for drain lead minimum 6 cm2. CHARACTERISTICS Tj = 25 °C unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT V(BR)DSS drain-source breakdown voltage VGS = 0; ID = −10 µA −30 − − V VGSth gate-source threshold voltage VGS = VDS ; ID = −1 mA −1 − −2.8 V IDSS drain-source leakage current VGS = 0; VDS = −24 V − − −100 nA IGSS gate leakage current VGS = ±20 V; VDS = 0 − − ±100 nA IDon on-state drain current VGS = −10 V; VDS = −1 V −3 − − A VGS = −4.5 V; VDS = −5 V −1 − − A VGS = −4.5 V; ID = −0.5 A − 0.33 0.4 Ω RDSon drain-source on-state resistance VGS = −10 V; ID = −1 A − 0.22 0.25 Ω yfs forward transfer admittance VDS = −20 V; ID = −1 A 1 2 − S Ciss input capacitance VGS = 0; VDS = −20 V; f = 1 MHz − 250 − pF Coss output capacitance VGS = 0; VDS = −20 V; f = 1 MHz − 140 − pF Crss reverse transfer capacitance VGS = 0; VDS = −20 V; f = 1 MHz − 50 − pF QG total gate charge VGS = −10 V; VDS = −15 V; ID = −2.3 A − 10 25 nC QGS gate-source charge VGS = −10 V; VDS = −15 V; ID = −2.3 A − 1 − nC QGD gate-drain charge VGS = −10 V; VDS = −15 V; ID = −2.3 A − 3 − nC Switching times ton turn-on time VGS = 0 to −10 V; VDD = −20 V; ID = −1 A; RL = 20 Ω − 20 80 ns toff turn-off time VGS = −10 to 0 V; VDD = −20 V; ID = −1 A; RL = 20 Ω − 50 140 ns − − −1.6 V − 150 200 ns Source-drain diode VSD source-drain diode forward voltage VGD = 0; IS = −1.25 A trr reverse recovery time 1997 Jun 20 IS = −1.25 A; di/dt = 100 A/µs 4 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 MBE144 600 MBE149 −12 handbook, halfpage handbook, halfpage V GS = ID −10 V (A) −10 C (pF) −7.5 V −6 V −8 400 −5 V −6 Ciss −4.5 V −4 200 −4 V Coss 0 −10 0 −20 −3.5 V −2 Crss −3 V −2.5 V VDS (V) 0 −30 −2 0 −4 −6 −8 −10 −12 V DS (V) VGS = 0. Tj = 25 °C. Tj = 25 °C. Fig.4 Capacitance as a function of drain source voltage; typical values. Fig.5 Output characteristics; typical values. MBE150 −16 MBE145 −10 handbook, halfpage handbook, halfpage ID (A) VGS (V) −8 −12 −6 −8 −4 −4 0 −2 0 −2 −4 −6 VGS (V) 0 −8 −4 −6 −8 −10 Qg (nC) VDD = −15 V. ID = −3 A. VDS = −10 V. Tj = 25 °C. Fig.7 Fig.6 Transfer characteristic, typical values. 1997 Jun 20 −2 0 5 Gate-source voltage as a function of total gate charge. Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 MBE148 −6 MDA218 104 handbook, halfpage handbook, halfpage IS (A) RDSon (mΩ) −4 (1)(2)(3) (4) (5) 103 (1) (2) (3) −2 0 −0.5 0 −1 −1.5 102 −2 −2.5 VSD (V) Source current as a function of source-drain diode forward voltage. MBE138 1.2 MBE146 k k 1.1 1.6 1.0 1.4 0.9 1.2 0.8 1.0 0.7 0.8 0.6 50 100 Tj (°C) 150 (1) (2) −50 0 50 100 Tj (°C) 150 R DSon at T j k = ---------------------------------------R DSon at 25 °C V GSth at T j k = ------------------------------------V GSth at 25°C Typical RDSon at: (1) ID = −1 A; VGS = −10 V. (2) ID = −0.5 A; VGS = −4.5 V. Typical VGSth at ID = −1 mA; VDS =VGS = VGSth. Fig.10 Temperature coefficient of gate-source threshold voltage. 1997 Jun 20 (4) ID = −3 A. (5) ID = −6 A. 1.8 handbook, halfpage 0 −8 −10 VGS (V) Drain-source on-state resistance as a function of gate-source voltage; typical values. handbook, halfpage −50 −6 (1) ID = −0.1 A. (2) ID = −0.5 A. (3) ID = −1 A. Fig.9 0.6 −4 −VDS ≥ −ID × RDSon; Tj = 25 °C. VGD = 0. (1) Tj = 150 °C. (2) Tj = 25 °C. (3) Tj = −55 °C. Fig.8 −2 0 Fig.11 Temperature coefficient of drain-source on-resistance. 6 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor 10 handbook, full pagewidth Rth j-s (K/W) BSP250 MBE147 δ= 0.75 0.5 0.33 0.2 0.1 1 0.05 0.02 tp δ= T P 0.01 0 t tp T 10−1 10−6 10−5 10−4 10−3 10−2 10−1 tp (s) 1 Fig.12 Transient thermal resistance from junction to soldering point as a function of pulse time; typical values. 1997 Jun 20 7 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 PACKAGE OUTLINE Plastic surface mounted package; collector pad for good heat transfer; 4 leads D SOT223 E B A X c y HE v M A b1 4 Q A A1 1 2 3 Lp bp e1 w M B detail X e 0 2 4 mm scale DIMENSIONS (mm are the original dimensions) UNIT A A1 bp b1 c D E e e1 HE Lp Q v w y mm 1.8 1.5 0.10 0.01 0.80 0.60 3.1 2.9 0.32 0.22 6.7 6.3 3.7 3.3 4.6 2.3 7.3 6.7 1.1 0.7 0.95 0.85 0.2 0.1 0.1 OUTLINE VERSION REFERENCES IEC JEDEC EIAJ ISSUE DATE 96-11-11 97-02-28 SOT223 1997 Jun 20 EUROPEAN PROJECTION 8 Philips Semiconductors Product specification P-channel enhancement mode vertical D-MOS transistor BSP250 DEFINITIONS Data Sheet Status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. 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